Wafer anti-vibration bracket pressing measurement fixture

Abstract

A wafer anti-vibration bracket pressing and measuring fixture is used to measure a bracket and obtain a height difference between a cantilever end of the bracket and a bottom surface. The fixture includes a base, a measuring stage, and a measuring element. An upper surface of the base is recessed downwards to form a receiving groove. The receiving groove has a reference surface. The bracket is placed into the receiving groove with its bottom surface contacting the reference surface, and the cantilever end of the bracket is exposed on the upper surface. The measuring stage has a lower surface that matches the upper surface. The measuring element is fixed to the measuring stage and has a measuring rod protruding from the lower surface and positioned directly opposite the cantilever end. By placing the measuring stage on the base, the measuring rod can press against the cantilever end, thus obtaining the height difference between the cantilever end and the bottom surface.

Claims

1. A wafer anti-vibration bracket pressing and measuring fixture, used to measure a bracket and obtain a height difference between a cantilever end of the bracket and a bottom surface, the wafer anti-vibration bracket pressing and measuring fixture comprising: A base, the upper surface of which is recessed downward to form a receiving groove, the receiving groove having a reference surface, the bracket being inserted into the receiving groove with its bottom surface contacting the reference surface and the cantilever end exposed on the upper surface; a measuring stage having a lower surface matching the upper surface; and a measuring element fixed to the measuring stage and having a measuring rod protruding from the lower surface and positioned directly opposite the cantilever end, the measuring rod being used to measure the height difference between the cantilever end and the bottom surface by contacting the cantilever end.

2. The wafer anti-vibration support pressing measurement fixture as described in claim 1, wherein the lower surface of the measurement stage is provided with at least one protrusion, and the upper surface is provided with at least one groove whose number, position and size match the at least one protrusion.

3. The wafer anti-vibration support pressing measurement fixture as described in claim 2, wherein the measuring stage is rectangular and the lower surface has four corners, and the at least one protrusion consists of three protrusions, which are respectively located at three of the four corners.

4. The wafer anti-vibration support pressing measurement fixture as described in claim 1, further comprising a standard plate having a block inserted into the receiving groove and a protrusion formed on the block for the measuring rod to contact and measure values.

5. The wafer anti-vibration support pressing measurement fixture as described in claim 1, wherein the measuring element passes through the measuring stage and is secured by a bolt that passes laterally through the measuring stage.

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