Auxiliary fixture for replacing probes of an electrical test socket used for integrated circuit components

Abstract

This invention relates to an auxiliary fixture for replacing probes on electrical test sockets of integrated circuit components. It primarily provides a test platform on which an electrical test socket is mounted. An X-axis optical indicator and a Y-axis optical indicator project their light onto the location of a failed probe on the test platform, based on the coordinates of the failed probe. This assists quality control personnel in reducing the time required to locate failed probes on numerous and densely packed electrical test sockets, thereby improving the efficiency of replacing failed probes.

Claims

1. An auxiliary fixture for changing probes on an electrical test socket for integrated circuit elements, comprising: A test stand has two mutually orthogonal first sides and a second side, and a setting area for a power supply test socket; an X-axis optical indicator is slidably disposed on the first side of the test stand, and moves to a zero position on the X-axis of the first side of the test stand, so that its light is projected onto the X-axis coordinate of the starting probe coordinate position of the power supply test socket; and a Y-axis optical indicator is slidably disposed on the second side of the test stand, and moves to a zero position on the Y-axis of the second side of the test stand, so that its light is projected onto the Y-axis coordinate of the starting probe coordinate position of the power supply test socket; wherein the X-axis optical indicator and the Y-axis optical indicator are slid relative to the first side and the second side of the test stand, respectively, according to the coordinate position of a failed probe of the power supply test socket, so that their light is projected onto the position of the failed probe of the power supply test socket located in the setting area.

2. The probe replacement auxiliary fixture as described in claim 1, wherein: The X-axis optical indicator is further provided with a first distance calculation and display to display the X-axis coordinate position of the failed probe; and the Y-axis optical indicator is further provided with a second distance calculation and display to display the Y-axis coordinate position of the failed probe.

3. The probe replacement auxiliary fixture as described in claim 1, wherein the test stand is provided with at least one positioning post in the setting area for fixing the electrical test stand.

4. The probe replacement auxiliary fixture as described in claim 2, wherein: The test stand has at least one positioning post in the setting area to fix the electrical test stand; the X-axis optical indicator moves to an X-axis zero position on a first side of the test stand, and its light is projected onto the X-axis coordinate of the starting probe coordinate position of the electrical test stand, and the first distance calculation and display shows a zero display; and the Y-axis optical indicator moves to a Y-axis zero position on a second side of the test stand, and its light is projected onto the Y-axis coordinate of the starting probe coordinate position of the electrical test stand, and the second distance calculation and display shows a zero display.

5. The probe replacement auxiliary fixture as described in any one of claims 1 to 4, wherein: The first and second sides of the test platform are respectively provided with two slide rails; the X-axis optical indicator and the Y-axis optical indicator each include: an upper housing; a lower housing, which is assembled to the upper housing and clamps the corresponding slide rail therein for movement on the slide rail; and a visible light emitter, which is fixed in the upper housing and the lower housing.

6. The probe replacement auxiliary fixture as described in claim 1, wherein: The test stage further includes: a substrate having two mutually orthogonal first sides and a second side; a first slide plate slidably disposed on the substrate and sliding along a direction parallel to the second side; and a second slide plate slidably disposed on the first slide plate and sliding along a direction parallel to the first side, wherein the second slide plate includes the mounting area; an X-axis optical indicator fixed outside the first side of the substrate; and a Y-axis optical indicator fixed outside the second side of the substrate.

7. The probe replacement auxiliary fixture as described in claim 6 further comprises: a first distance calculation and display fixed on the second slide for displaying the X-axis coordinate position of the failed probe; and a second distance calculation and display fixed on the first slide for displaying the Y-axis coordinate position of the failed probe.

8. The probe replacement auxiliary fixture as described in claim 6, wherein: The first slide moves to a zero position on the X-axis of the first side of the substrate, and its light is projected onto the X-axis coordinate of the starting probe coordinate position of the electrical test socket; and the second slide moves to a zero position on the Y-axis of the second side of the substrate, and its light is projected onto the Y-axis coordinate of the starting probe coordinate position of the electrical test socket.

9. The probe replacement auxiliary fixture as described in claim 7, wherein: The first slide moves to a zero position on the X-axis of the first side of the substrate, and its light is projected onto the X-axis coordinate of the starting probe coordinate position of the electrical test socket, and the first distance calculation and display shows a zero position; and the second slide moves to a zero position on the Y-axis of the second side of the substrate, and its light is projected onto the Y-axis coordinate of the starting probe coordinate position of the electrical test socket, and the second distance calculation and display shows a zero position.

10. The probe replacement auxiliary fixture as described in any one of claims 6 to 9, wherein: Two fixing seats are respectively provided on the first side and the second side of the substrate. Each fixing seat has two opposing support plates, and each support plate has a vertical elongated slot. The X-axis optical indicator passes through the two vertical elongated slots of one of the fixing seats with two pivots respectively, and pivots and moves vertically relative to the two support plates. The Y-axis optical indicator passes through the two vertical elongated slots of the other fixing seat with two pivots respectively, and pivots and moves vertically relative to the two support plates.

11. The probe replacement auxiliary fixture as described in claim 10, wherein: The substrate has a recessed first elongated groove, and a slider is provided in the first elongated groove; wherein multiple balls are provided between two opposite sides of the slider and two opposite sides of the first elongated groove; the first slide is fixed on the slider to move on the substrate in a direction parallel to the second side; and the second slide has a recessed second elongated groove, allowing a portion of the first slide to protrude into the second elongated groove, with multiple balls provided between two opposite sides of the protruding portion of the first slide and two opposite sides of the second elongated groove, so that the second slide can move on the first slide in a direction parallel to the second side.

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