Electronic device
Patent Information
- Application Number
- TW113121178
- Authority / Receiving Office
- TW · TW
- Patent Type
- Patents
- Current Assignee / Owner
- Filing Date
- 2024-06-07
- Publication Date
- 2026-09-21
- Estimated Expiration
- 2044-06-06
AI Technical Summary
Traditional connection structures in electronic devices are prone to cracking or delamination due to differences in thermal expansion coefficients between materials and low adhesion, leading to structural instability.
An electronic device with a connection structure featuring a first pad electrically connected to a conductive pad, a second pad, and a polymer surrounding both, where the first pad has inclined edges and arcuate edges to disperse stress and improve adhesion, reducing the risk of cracking and delamination.
The solution enhances adhesion and reduces stress concentration, minimizing the risk of structural failure in electronic devices by dispersing thermal stress and improving the connection integrity.
Smart Images

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Abstract
Citation Information
Patent Citations
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