Internal force-balanced electronic component testing system and equipmnet

Abstract

An internal force balancing electronic component testing system includes testing equipment and a controller. The testing equipment comprises a lifting substrate, a force generating device, a force transmission arm, a test base module, and a locking assembly. The force generating device is connected to the lifting substrate, the force transmission arm is connected to the force generating device, and the locking assembly is used to releasably lock the force transmission arm to the test base module. When the force transmission arm is locked to the test base module, the controller controls the force generating device to apply a force to the electronic component. The reaction force corresponding to this force is transmitted back to the force generating device via the test base module, the locking assembly, and the force transmission arm, thereby forming a closed force loop. The controller controls the test base module to test the electronic component, and the lifting substrate is isolated in the closed force loop and is not affected by the force and reaction force.

Claims

1. An internal force balancing electronic component testing device, comprising: A lifting device, comprising a lifting base plate; A thrust generating device is slidably connected to the lifting base plate; Multiple force transmission arms are connected to the thrust generating device; a test mount module is adapted to accommodate an electronic component under test; multiple mounting members are disposed on the thrust generating device and pass through the lifting base plate; wherein, in response to the movement of the thrust generating device, one end of each mounting member is selectively engaged with the lifting base plate; and a locking assembly is adapted to releasably lock the force transmission arms to the test mount module; wherein, in response to the force transmission arms being engaged with the test mount module, the thrust generating device applies a force to the electronic component under test, and a reaction force corresponding to the force is transmitted back to the thrust generating device via the test mount module, the locking assembly, and the force transmission arms, thereby forming a closed force loop; and the lifting base plate is isolated from the closed force loop and is not affected by the force and the reaction force.

2. The electronic component testing equipment as described in claim 1 further includes: A pressure probe is disposed between the test base module and the thrust generating device; wherein, when the thrust generating device applies the force to the electronic component under test, the thrust generating device does not abut against the lifting substrate and the pressure probe.

3. The electronic component testing equipment as described in claim 2, wherein, The locking assembly includes a hook portion and a fastening portion. One of the hook portion and the fastening portion is disposed on the force transmission arms, and the other is disposed on a test base plate of the test base module. The hook portion has a release position and a fastening position. In response to the lifting base plate being controlled to approach the test base module, the hook portion is driven to move from the release position to the fastening position to fasten with the fastening portion, and the force transmission arms are locked to the test base module.

4. The electronic component testing equipment as described in claim 3, wherein, The latching part includes multiple lever arm latches, which are pivotally connected to the force transmission arms respectively, and the fastening part is disposed on the test base plate; each force transmission arm includes a connecting block. The lifting device further includes: a plurality of drive rods disposed on the lifting base plate and passing through the connecting block of the force transmission arms; and a plurality of push blocks connected to the drive rods and abutting against the force arm hooks; wherein the drive rods push the push blocks to drive the force arm hooks to move from the release position to the engagement position.

5. The electronic component testing equipment as described in claim 4, wherein, The locking assembly further includes at least one reset member, and each lever arm hook includes a lateral pivot portion and a longitudinal hook portion; wherein, the lateral pivot portion of each lever arm hook is pivotally connected to the corresponding force transmission arm, and the at least one reset member is disposed between the longitudinal hook portion of the corresponding lever arm hook and the corresponding force transmission arm.

6. The electronic component testing equipment as described in claim 3, wherein, The latching part includes multiple seat plate latches, which are pivotally connected to the test seat plate. The fastening part is provided at one end of each force transmission arm. The pressure probe presses against the seat plate latches to move each seat plate latch from the release position to the fastening position.

7. The electronic component testing equipment as described in claim 6, wherein, The test base plate includes multiple fixing blocks and multiple spreading springs, and is provided with multiple mounting slots; each fixing block is disposed on a corresponding mounting slot; each base plate hook includes a transverse pushing part and a longitudinal fastening part, wherein the transverse pushing part is located in the corresponding mounting slot and is pivotally connected to the test base plate; the two ends of each spreading spring are respectively connected to the longitudinal fastening part of the corresponding base plate hook and the fixing block; and when each base plate hook is in the release position, one end of the transverse pushing part protrudes outward from the test base plate.

8. The electronic component testing equipment as described in claim 3, wherein, The latch includes multiple locking arms, which are pivotally connected to the force transmission arms, and the fastening part is disposed on the test base plate; The lifting device further includes: a plurality of push blocks disposed on the lifting base plate; and a plurality of drive rods passing through the lifting base plate and the push blocks, and connected to the force transmission arms; wherein the push blocks move along the drive rods and press against the locking arms to drive the locking arms to move from the release position to the locking position.

9. The electronic component testing equipment as described in claim 1 further includes a plurality of latching sensors disposed on the force transmission arms; wherein, In response to the force transmission arms locking onto the test base module, the locking sensors send a locking signal.

10. An internal force balancing electronic component testing system, comprising: An electronic component testing device includes: a lifting device comprising a lifting base plate; a force generating device slidably connected to the lifting base plate; a plurality of force transmission arms connected to the force generating device; a test socket module adapted to accommodate an electronic component under test; a plurality of mounting members disposed on the force generating device and passing through the lifting base plate; wherein, in response to movement of the force generating device, one end of each mounting member is selectively engaged with the lifting base plate; and a locking assembly adapted to releasably lock the force transmission arms to the test socket module; and a controller electrically connected to the lifting device, the force generating device, and the test socket module; wherein, in response to the force transmission arms being engaged with the test socket module, the controller controls the force generating device to apply a force to the electronic component under test, and a reaction force corresponding to the force is transmitted back to the force generating device via the test socket module, the locking assembly, and the force transmission arms, thereby forming a closed force loop; The lifting base plate is isolated from the closed force loop and is not affected by the action force and the reaction force; and the controller controls the test base module to test the electronic component under test.

11. The electronic component testing system as described in claim 10 further includes: A pressure probe is disposed between the test base module and the thrust generating device; wherein, when the thrust generating device applies the force to the electronic component under test, the thrust generating device does not abut against the lifting substrate and the pressure probe.

12. The electronic component testing system as described in claim 11, wherein, The locking assembly includes a hook portion and a fastening portion. One of the hook portion and the fastening portion is disposed on the force transmission arms, and the other is disposed on a test base plate of the test base module. The hook portion has a release position and a fastening position. In response to the lifting base plate approaching the test base plate, the hook portion is driven to move from the release position to the fastening position to fasten with the fastening portion.

13. The electronic component testing system as described in claim 12, wherein, The latching part includes multiple lever arm latches, which are pivotally connected to the force transmission arms respectively, and the fastening part is disposed on the test base plate; each force transmission arm includes a connecting block. The lifting device further includes: a plurality of drive rods disposed on the lifting base plate and passing through the connecting block of the force transmission arms; and a plurality of push blocks connected to the drive rods and abutting against the force arm hooks; wherein the drive rods push the push blocks to drive the force arm hooks to move from the release position to the engagement position.

14. The electronic component testing system as described in claim 12, wherein, The latching part includes multiple seat plate latches, which are pivotally connected to the test seat plate. The fastening part is disposed at one end of each force transmission arm. The pressure probe presses against the seat plate latches to move each seat plate latch from the release position to the fastening position. The test seat plate includes multiple fixing blocks and multiple spreading springs, and is provided with multiple mounting slots. Each fixing block is disposed on a corresponding mounting slot. Each seat plate latch includes a transverse pushing part and a longitudinal fastening part. The transverse pushing part is located in the corresponding mounting slot and is pivotally connected to the test seat plate. The two ends of each spreading spring are respectively connected to the longitudinal fastening part of the corresponding seat plate latch and the fixing block. When each seat plate latch is in the release position, one end of the transverse pushing part protrudes outward from the test seat plate.

15. The electronic component testing system as described in claim 12, wherein, The latch includes multiple locking arms, which are pivotally connected to the force transmission arms, and the fastening part is disposed on the test base plate; The lifting device further includes: a plurality of push blocks disposed on the lifting base plate; and a plurality of drive rods passing through the lifting base plate and the push blocks, and connected to the force transmission arms; wherein the push blocks move along the drive rods and press against the locking arms to drive the locking arms to move from the release position to the locking position.

16. The electronic component testing system as described in claim 11 further includes a plurality of latching sensors disposed on the force transmission arms and electrically connected to the controller; wherein, In response to the force transmission arms locking onto the test base module, the locking sensors send a locking signal to the controller.

17. The electronic component testing system as described in claim 12 further includes: A pressure valve is connected to the thrust generating device; wherein the controller controls the pressure valve to input a fluid into a pressure chamber of the thrust generating device, the fluid drives the thrust generating device to expand and deform, and an upper surface of the thrust generating device moves toward the lifting base plate without abutting the lifting base plate.

18. The electronic component testing system as described in claim 17, wherein, When the electronic component under test completes the test, the controller controls the pressure valve to depressurize the pressure chamber of the thrust generating device; and in response to the lifting base moving away from the test base module, the latch is driven to move from the engaging position to the releasing position so as to be released from the engaging position.

Images