Electronic apparatus, managing application test method and non-transitory computer-readable recording medium comprising a computer program for performing the method

Abstract

This invention provides an application testing management method for electronic devices. The application testing management method includes the following steps: obtaining first test plan related information, which includes at least one test case related information and at least one parameter related information for executing the test; obtaining execution setting information, which corresponds to the first test plan and includes target application related information; performing tests on the target application based on the first test plan related information and the execution setting information; and providing the test execution result information.

Description

Technical Field

[0001] The present invention relates to an electronic device and a control method thereof, which are used to provide a user interface to generate, edit, and manage parameter combinations required for testing application programs, thereby making it easier for users to test application programs. Prior Art

[0002] Before releasing an application program, developers need to perform various tests on the application program to ensure that the application program meets the required functions, performance, usability, and stability. Also, after releasing the application program, when additional functions are developed or previous functions are changed, developers need to perform tests again according to the addition or change of functions to determine whether the functions, performance, usability, stability, etc. of the application program have changed. Therefore, developers need to perform multiple tests on the application program before providing an application program to users.

[0003] However, to perform tests on an application program, various parameters need to be set. When developers manually set various parameters, there is a problem of wasting a lot of time and manpower.

[0004] For related content, reference can be made to prior art documents such as KR 10-2022-0049334 A. Summary of the Invention

[0005] [Problems to be Solved by the Invention] The disclosed embodiments aim to provide an electronic device and an application program test management method thereof. Specifically, the object of the present invention is to provide an electronic device and a control method thereof, which are used to provide a user interface to generate, edit, and manage parameter combinations required for testing application programs, thereby making it easier for users to test application programs.

[0006] The technical problems to be realized in this embodiment are not limited to the above technical problems, and other technical problems can be derived from the following embodiments. [Technical Means for Solving the Problems]

[0007] One aspect of the present invention provides an application program test management method, which includes the following steps: obtaining information related to a first test plan, the information related to the first test plan including at least one piece of information related to a test case and at least one piece of information related to a parameter for executing the test; obtaining execution setting information, the execution setting information corresponding to the above-mentioned first test plan and including information related to a target application program; performing a test on the above-mentioned target application program based on the above-mentioned information related to the first test plan and the above-mentioned execution setting information; and providing information on the execution result of the above-mentioned test.

[0008] Furthermore, in an embodiment of the present invention, an application program test management method is provided, which further includes the following steps: providing a list of a plurality of test plans including the above-mentioned first test plan.

[0009] Furthermore, in an embodiment of the present invention, an application program test management method is provided, wherein the above-mentioned at least one piece of information related to a test case includes information related to a repository, and at least one test script corresponding to the above-mentioned at least one test case is stored in the repository.

[0010] Furthermore, in an embodiment of the present invention, an application program test management method is provided, wherein the above-mentioned at least one test case includes at least one of the following test cases: a test case related to a shopping cart page; a test case related to a checkout page; a test case related to a membership information page; a test case related to a product list page; a test case related to a product detailed information page; and a test case related to a search result page.

[0011] Furthermore, in an embodiment of the present invention, an application program test management method is provided, wherein the above-mentioned at least one piece of information related to a parameter includes at least one of the following information: information for distinguishing the above-mentioned first test plan; information on the number of times of re-executing the test in the case of a failure in the execution of the above-mentioned test; information on a server for obtaining first test data; information on a server for deriving second test data; and test-related setting information for a control group and an experimental group.

[0012] Furthermore, in an embodiment of the present invention, an application program test management method is provided, wherein the information for distinguishing the above-mentioned first test plan includes at least one of the following information: information related to the name of the above-mentioned first test plan; information on a user's annotation of the above-mentioned first test plan; information on the type of the test target of the above-mentioned first test plan; and information on the category to which the above-mentioned first test plan belongs.

[0013] Also, in an embodiment of the present invention, a method for application program test management is provided, wherein the information for distinguishing the above-mentioned first test plan is provided together with a list of a plurality of test plans including the above-mentioned first test plan.

[0014] Also, in an embodiment of the present invention, a method for application program test management is provided, wherein the server-related information for obtaining the first test data or the server-related information for deriving the second test data includes: server-related information used when providing actual services; and mock server-related information used when conducting tests.

[0015] Also, in an embodiment of the present invention, a method for application program test management is provided, wherein the step of conducting tests on the above-mentioned target application program includes the following steps: changing the request for the server used when providing actual services to a request for the mock server used when conducting tests.

[0016] Also, in an embodiment of the present invention, a method for application program test management is provided, wherein the test-related setting information for the control group and the experimental group includes the following information: information for covering the user account used when conducting tests with the control group account or the experimental group account based on the identifier of the terminal or the membership information.

[0017] Also, in an embodiment of the present invention, a method for application program test management is provided, wherein the above-mentioned execution setting information includes at least one of the following information: test equipment-related information; test-related setting information for the control group and the experimental group; version-related information of the above-mentioned target application program; server-related information for obtaining the first test data; and server-related information for deriving the second test data.

[0018] Also, in an embodiment of the present invention, a method for application program test management is provided, which further includes the following steps: determining the information related to the second test plan selected as the editing target in the above-mentioned list of a plurality of test plans; determining user input, where the user input modifies at least one of the test case-related information and the parameter-related information of the above-mentioned second test plan; and generating a third test plan based on the above-mentioned user input.

[0019] Also, in an embodiment of the present invention, a method for application program test management is provided, which further includes the following steps: confirming the mock server-related information used when conducting tests in the above-mentioned at least one parameter-related information; and confirming whether the above-mentioned mock server is online or offline.

[0020] Also, in an embodiment of the present invention, there is provided an application program test management method, which further includes the following steps: when the simulation server is online, testing the target application program according to the first test plan; when the simulation server is offline, providing an error message.

[0021] Also, in an embodiment of the present invention, there is provided an application program test management method, which further includes the following steps: confirming at least one user account among one or more user accounts used during the test that is unrestricted in use; and setting in such a way as to restrict the use of the at least one user account for other tests.

[0022] Also, in an embodiment of the present invention, there is provided an application program test management method, wherein the step of testing the target application program includes the following steps: based on at least one piece of test case related information, calling a page function library and a page object library.

[0023] Another aspect of the present invention provides an electronic device, which includes: a communication unit; a memory; and a controller; the controller is as follows: obtaining first test plan related information, the first test plan related information including at least one piece of test case related information and at least one piece of parameter related information for executing the test; obtaining execution setting information, the execution setting information corresponding to the first test plan and including target application program related information; based on the first test plan related information and the execution setting information, testing the target application program; and providing information on the execution result of the test.

[0024] Another aspect of the present invention provides a computer-readable non-transitory recording medium, which records a program for implementing a method to be run by an electronic device.

[0025] Specific matters of other embodiments will become clearer through the following detailed description and the accompanying drawings. [Effects of the Invention]

[0026] According to the disclosed embodiments, one or more of the following effects can be expected.

[0027] According to the embodiments of this specification, by automatically executing application program tests and quickly providing feedback to developers, there is a technical effect of improving the efficiency of test execution.

[0028] Moreover, according to the embodiments of this specification, it has the technical effects of eliminating a large amount of repetitive rework of manual implementation of tests and saving human resources.

[0029] Moreover, according to the embodiments of this specification, it has the technical effect of being able to conveniently implement application tests in other environments using the same functions and the same test data.

[0030] Moreover, according to the embodiments of this specification, it has the technical effect of being able to conveniently implement application tests on various types of operating systems or various types of devices.

[0031] The effects of the present invention are not limited to the effects described above. For those of ordinary skill in the art, other effects not mentioned can be more clearly understood from the description of the claims. Brief Description of the Drawings

[0032] FIG. 1 shows a system according to an embodiment. FIGS. 2A to 2D show user interfaces provided by an electronic device according to an embodiment. FIGS. 3A to 3B show user interfaces provided by an electronic device according to an embodiment. FIGS. 4A to 4D show user interfaces provided by an electronic device according to an embodiment. FIGS. 5A to 5F show user interfaces provided by an electronic device according to an embodiment. FIGS. 6A to 6G show user interfaces provided by an electronic device according to an embodiment. FIG. 7 is a schematic diagram for explaining the process of managing application tests by an electronic device according to an embodiment. FIG. 8 is a schematic diagram for explaining the process of managing application tests by an electronic device according to an embodiment. FIG. 9 is a schematic diagram for explaining the process of managing application tests by an electronic device according to an embodiment. FIG. 10 is a schematic diagram for explaining the process of managing application tests by an electronic device according to an embodiment. FIG. 11 is a flowchart of a method for managing application tests of an electronic device according to an embodiment. FIG. 12 is a block diagram of an electronic device according to an embodiment. Embodiments

[0033] In view of the functions in the present invention, the terms used in the embodiments are as far as possible the general terms widely used at present. However, they may change according to the intentions or cases of those skilled in the art, the emergence of new technologies, etc. Also, in specific cases, there are terms arbitrarily selected by the applicant. In such cases, the meanings thereof are described in detail in the corresponding description part. Therefore, the terms used in the present invention are not simply the names of the terms, but should be defined based on the meanings of the terms and the entire content in the present invention.

[0034] Throughout the specification, when a certain part is described as "including" a certain component, unless there is a particularly contrary description, it means that other components can be further included, rather than excluding other components.

[0035] The expression "at least one of a, b, and c" described throughout the specification may include "a alone", "b alone", "c alone", "a and b", "a and c", "b and c", or "all of a, b, and c".

[0036] The "terminal" mentioned below can be implemented by a computer or a portable terminal that can be connected to a server or other terminals through a network. Here, the computer includes, for example, a notebook computer equipped with a web browser, a desktop computer, a laptop computer, etc. The portable terminal, for example, as a wireless communication device that guarantees portability and mobility, may include all kinds of handheld wireless communication devices such as terminals based on IMT (International Mobile Telecommunication), CDMA (Code Division Multiple Access), W-CDMA (W-Code Division Multiple Access, Wideband Code Division Multiple Access), LTE (Long Term Evolution), etc., smartphones, tablet computers, etc.

[0037] Hereinafter, with reference to the accompanying drawings, embodiments of the present invention will be described in detail so that those of ordinary skill in the technical field to which the present invention pertains can easily implement it. However, the present invention can be implemented in various different forms and is not limited to the embodiments described herein.

[0038] Hereinafter, with reference to the accompanying drawings, embodiments of the present invention will be described in detail.

[0039] FIG. 1 shows a system according to an embodiment.

[0040] Referring to FIG. 1, the system may include at least one of the electronic device 100, one or more terminals 120, 140, 160, and the network 180. In addition, the system shown in FIG. 1 only illustrates the components related to this embodiment. Therefore, those of ordinary skill in the art related to this embodiment can understand that, in addition to the components shown in FIG. 1, other general components may also be included.

[0041] The electronic device 100 is a device configured to provide various information. The electronic device 100 can provide the configured information through a web page or an application screen, or can also provide the information in the form of a web page or an application screen displayed on the provided terminal.

[0042] According to an embodiment, the electronic device 100 can provide a service to facilitate users to test applications. For example, the electronic device 100 can provide a user interface (UI) to the user to generate and manage a test plan, which may include information related to test cases selected by the user based on input and information related to parameters for executing the test. Also, the electronic device 100 can execute a test on the application according to the test plan selected by the user and provide the user with the execution result information of the test.

[0043] One or more terminals 120, 140, 160 are terminals used by users. Users can use their respective terminals 120, 140, 160 to access the services provided through the network 180. For example, one or more terminals 120, 140, 160 can obtain user input to set test cases and parameters for executing the test, and send a request to the electronic device 100 to generate a test plan according to the obtained input. Alternatively, one or more terminals 120, 140, 160 can obtain user input to select a test plan and set a target application, and send a request to the electronic device 100 to execute a test according to the obtained input.

[0044] One or more terminals 120, 140, 160 and the electronic device 100 can communicate with each other in the network 180. The network 180 can include a Local Area Network (LAN), a Wide Area Network (WAN), a Value Added Network (VAN), a mobile radio communication network, a satellite communication network, and combinations thereof. It is a comprehensive data communication network that enables smooth communication between the network components shown in FIG. 1, including a wired Internet, a wireless Internet, and a mobile wireless communication network. Wireless communication can include, for example, a Wireless Local Area Network (Wi-Fi), Bluetooth, Bluetooth low energy, Zigbee, Wi-Fi Direct (WFD), ultra wideband (UWB), infrared data association (IrDA), Near Field Communication (NFC), etc., but is not limited thereto.

[0045] FIGS. 2A to 2D illustrate a user interface 200 provided by the electronic device 100 according to an embodiment.

[0046] Referring to FIGS. 2A to 2D, according to an embodiment, the electronic device 100 can provide a user interface (UI) 200 to the user through a user terminal, which includes a list of one or more test plans. For example, the user can generate, edit, or manage a test plan by selecting various icons corresponding to the test plan. Alternatively, the user can test an application based on the test case-related information and parameter-related information included in each test plan.

[0047] At this time, a test plan can represent a set of setting information related to application testing. For example, a test plan can include test case-related information and parameter-related information for executing the test. The test cases and parameters included in the test plan will be described in detail with reference to FIGS. 4A to 4D and FIGS. 5A to 5F, respectively.

[0048] According to an embodiment, the user interface 200 may include areas for displaying and managing various information related to one or more test plans. For example, the user interface 200 may include an area for displaying information for identifying one or more test plans, an area for displaying icons for executing tests according to one or more test plans, or an area for displaying the status of one or more test plans, etc. However, the areas shown in FIG. 2 are an embodiment and may be changed or omitted based on user input, etc.

[0049] According to an embodiment, the user interface 200 may include an area 220 for selecting one or more test plans. For example, the user can more conveniently manage test plans by selecting check boxes corresponding to each plan among the one or more test plans included in the area 220.

[0050] According to an embodiment, the user interface 200 may include an area 225 for controlling and managing one or more test plans. For example, as icons for controlling and managing one or more test plans, a "View" icon, a "Copy" icon, a "Delete" icon, a "Device" icon, or a "Rerun" icon may be displayed in the area 225. Also, a bar indicating the status of one or more test plans may be displayed in the area 225.

[0051] According to an embodiment, when the user selects the "View" icon displayed in the area 225, the electronic device 100 may provide information related to the repository storing the test scripts included in the test plan corresponding to the selected "View" icon, information related to test cases, and information related to the parameters for executing the test. For example, when the user selects the "View" icon corresponding to the first test plan 202, the electronic device 100 may provide a screen that displays information related to the repository storing the test scripts included in the first test plan 202, information related to test cases, and information related to the parameters for executing the test, etc.

[0052] According to an embodiment, when the user selects the "Copy" icon displayed in the area 225, the electronic device 100 may generate a test plan that includes the same setting information as the setting information included in the test plan corresponding to the selected "Copy" icon. For example, when the user selects the "Copy" icon corresponding to the second test plan 204, the electronic device 100 may provide a pop-up window that displays the setting information included in the second test plan 204, and obtain user input to generate a new test plan that includes the setting information displayed in the pop-up window. Then, the electronic device 100 may generate a test plan that includes the same setting information as the setting information included in the second test plan 204, and add it to the list.

[0053] According to an embodiment, when the "Delete" icon displayed in the user selection area 225 is selected, the electronic device 100 may delete the test plan corresponding to the selected "Delete" icon. For example, when the user selects the "Delete" icon corresponding to the 5th test plan 210, the electronic device 100 may provide a pop-up window asking whether to delete the 5th test plan 210 from the list. At this time, when the application is being tested according to the test plan selected by the user, the electronic device 100 may provide a pop-up window, prompting that the application is being tested according to the test plan and asking whether to delete the test plan from the list.

[0054] According to an embodiment, when the "Device" icon displayed in the user selection area 225 is selected, the electronic device 100 may provide information related to the test device of the test plan corresponding to the selected "Device" icon. For example, when the user selects the "Device" icon corresponding to the 4th test plan 208, the electronic device 100 may provide information related to the test device of the 4th test plan 208.

[0055] According to an embodiment, when the "Rerun" icon displayed in the user selection area 225 is selected, the electronic device 100 may perform the application test again according to the test plan corresponding to the selected "Rerun" icon. For example, when the test of the application according to the 3rd test plan 206 fails, for the 3rd test plan 206, the electronic device 100 may display the "Rerun" icon in the area 225 instead of the "Device" icon. Then, when the user selects the "Rerun" icon corresponding to the 3rd test plan 206, the electronic device 100 may perform the application test again according to the 3rd test plan 206.

[0056] According to an embodiment, the column displayed in the area 225 may represent the status of the corresponding test plan. For example, for the 1st test plan 202, when the application test is successfully performed, a "Checked" icon may be displayed in the column; for the 2nd test plan 204, when the test plan is successfully generated, 100% may be displayed in the column. Or, for the 3rd test plan 206 and the 4th test plan 208, when the application test is being performed or the test plan is being generated, the degree of progress that has been performed or generated may be displayed in the column; for the 5th test plan 210, when the test plan has not been generated, 0% may be displayed in the column.

[0057] According to an embodiment, the user interface 200 may include an area 230 that displays icons for performing application tests according to a test plan. For example, when the user selects the "Run" icon corresponding to the 1st test plan 202, the electronic device 100 may provide a pop-up window for setting execution setting information. At this time, the execution setting information may include application-related information that is the test target, version-related information of the target application, or test equipment-related information, etc. The relevant content will be described in detail with reference to FIGS. 6a to 6g.

[0058] According to an embodiment, the user interface 200 may include an area 235 that displays the name of the test plan. For example, in the area 235, BBBB may be displayed as the name of the 2nd test plan 204, and LLLL may be displayed as the name of the 5th test plan 210. At this time, the name of the test plan is information input by the user when generating the test plan to more easily distinguish the test plan, and may include, but is not limited to, the type of page to be tested by the test plan or the type of operating system of the target device, etc.

[0059] According to an embodiment, the user interface 200 may include an area 240 that displays the user's annotation for the test plan. For example, App automation-app release may be displayed in the area 240 as the user's annotation for the 3rd test plan 206, and test_2 may be displayed as the user's annotation for the 4th test plan 208. At this time, the user's annotation for the test plan is information input by the user when generating the test plan to more easily distinguish the test plan, and may include, but is not limited to, the type of test to be performed by the test plan or the type of operating system of the target device, etc.

[0060] According to an embodiment, the user interface 200 may include an area 245 that displays information related to at least one user identifier for performing application tests according to each test plan in one or more test plans. For example, the 1st user may be displayed in the area 245 as the user identifier for performing application tests according to the 1st test plan 202. Or, the 7th user may be displayed in the area 245 as the user identifier for performing application tests according to the 5th test plan 210.

[0061] According to one embodiment, the user interface 200 may include an area 250 that displays time-related information on the implementation of application tests according to each test plan in one or more test plans. For example, the area 250 may display 2020-06-15 T13:11:25 as the time for implementing the application test according to the second test plan 204. Alternatively, the area 245 may display 2022-06-13 T06:12:13 as the time for implementing the application test according to the third test plan 206.

[0062] According to one embodiment, the user interface 200 may include an area 255 that provides information on the implementation results of application tests according to one or more test plans. For example, when the user selects the "View" icon corresponding to the first test plan 202, the electronic device 100 may provide information on the implementation results of the test equipment according to the first test plan 202.

[0063] According to one embodiment, the user interface 200 may include an area 260 that provides information on the implementation results of control group and experimental group tests according to one or more test plans. For example, when the user selects the "AB report" icon corresponding to the first test plan 202, the electronic device 100 may provide information on the implementation results of the control group and experimental group tests according to the first test plan 202.

[0064] According to one embodiment, the user interface 200 may include an area 265 that displays options for retrieving or filtering test plans according to the type of test objective. For example, when the user selects the downward icon in the area 265 or moves the cursor into the area 265, the electronic device 100 may provide a drop-down menu or list that includes a list of the types of test objectives of the test plans. Then, the electronic device 100 may obtain user input for selecting a type of test objective from the list and display the selected type of test objective in the area 265.

[0065] Referring to FIG. 2b, according to one embodiment, the electronic device 100 may provide a drop-down menu 285 that includes a list of the types of test objectives of the test plans. Then, the electronic device 100 may obtain user input for selecting "All" and display the selected "All" in the area 265. The types of test objectives of the test plans will be described in detail with reference to FIG. 5b.

[0066] According to an embodiment, the user interface 200 may include an area 270 for retrieving or filtering test plans according to the categories to which the test plans belong. For example, when the user selects the down icon within the area 270 or moves the cursor into the area 270, the electronic device 100 may provide a drop-down menu or a drop-down list that includes a list of the categories to which the test plans belong. Then, the electronic device 100 may obtain user input for one of the categories in the selection list and display the selected category in the area 270.

[0067] Referring to FIG. 2c, according to an embodiment, the electronic device 100 may provide a drop-down menu 290 that includes a list of the categories to which the test plans belong. Then, the electronic device 100 may obtain user input for selecting "Settlement" and display the selected "Settlement" in the area 270. The categories to which the test plans belong will be described in detail with reference to FIG. 5c.

[0068] According to an embodiment, the electronic device 100 may provide a list of test plans corresponding to the type of test target selected in the area 265 and the category to which the test plan selected in the area 270 belongs. Referring to FIG. 2d, after obtaining user input for selecting "All" as the type of test target and selecting "Settlement" as the category to which the test target belongs, the electronic device 100 may provide a list of test plans corresponding to "All" and "Settlement".

[0069] According to an embodiment, the user interface 200 may include an area 275 for generating a new test plan. For example, when the user selects the "New" icon within the area 275, the electronic device 100 may provide a pop-up window for inputting a plurality of setting information. The electronic device 100 may receive user input for the setting information displayed in the pop-up window and generate a test plan according to the received input, and add it to the list. The relevant content will be described in detail with reference to FIGS. 3a to 5f.

[0070] According to an embodiment, the user interface 200 may include an area 280 for retrieving a specific test plan. For example, when the user inputs the name of the test plan to be retrieved or user-related information for performing an application test according to the test plan into the area 280, the electronic device 100 may provide a test plan corresponding to the input search term.

[0071] In addition, the number and positions of the regions as described above, the representation methods shown in the regions, the types of user interface components, and specific examples of the setting information included in the test plan are only one embodiment, and the present invention can be implemented by examples different from those described above, which is obvious to those of ordinary skill in the technical field to which the present invention pertains.

[0072] FIGS. 3A to 3B illustrate a user interface 300 provided by the electronic device 100 according to an embodiment.

[0073] FIGS. 3A to 3B illustrate a user interface 300 for setting or changing a repository for storing test scripts according to an embodiment. For example, when obtaining user input for selecting a "New" icon, "View" icon, or "Copy" icon in the user interface 200 or user input for selecting the "Previous" icon 460 in the user interface 400, the electronic device 100 may display the user interface 300 and receive user input for selecting or inputting a repository for storing test scripts. Then, the electronic device 100 may generate a test plan or change the stored setting information based on the user input. In addition, although a pop-up window is shown as the user interface 300 for setting or changing a repository for storing test scripts in FIGS. 3A to 3B, the present invention is not limited thereto, and the user interface 300 of the present invention can be implemented in various forms such as a modal window.

[0074] According to an embodiment, the user interface 300 may include a region 320 for selecting a repository for storing test scripts. For example, when the user selects a down arrow icon within the region 320 or moves the cursor into the region 320, the electronic device 100 may provide a drop-down menu or a drop-down list including a list of repositories for storing test scripts. Then, the electronic device 100 may obtain user input for selecting one of the repositories in the list and display the selected repository in the region 320.

[0075] Referring to FIG. 3B, the electronic device 100 may provide a drop-down menu 360 including a list of repositories for storing test scripts. Then, the electronic device 100 may obtain user input for selecting the 1st Git repository and app-ui, and display the 1st Git repository / app-ui in the region 320. At this time, the 1st Git repository may represent a Git repository for storing test scripts, and rebuild, native, cart, checkout, test, and app-ui may represent branches for storing test scripts.

[0076] According to one embodiment, the user interface 300 may include an area 340 for copying the repository storing the test script. For example, when the user selects the downward icon within the area 340 or moves the cursor into the area 340, the electronic device 100 may provide a drop-down menu or a drop-down list, which includes a list of used repositories or stored repositories. Then, the electronic device 100 may obtain the user input of selecting one repository from the selection list and display the selected repository in the area 340.

[0077] According to one embodiment, after obtaining the user input of selecting the "Next" icon 380, the electronic device 100 may display a user interface for setting or changing the test case based on the obtained input. For example, after obtaining the user input of selecting the "Next" icon 380, the electronic device 100 may display the user interfaces 400 in FIGS. 4a to 4d.

[0078] FIGS. 4a to 4d show the user interface 400 provided by the electronic device 100 according to one embodiment.

[0079] FIGS. 4a to 4d show the user interface 400 for setting or changing the test case according to one embodiment. For example, when obtaining the user input of selecting the "New", "View", or "Copy" icon in the user interface 200 or the user input of selecting the "Next" icon 380 in the user interface 300 or the user input of selecting the "Previous" icon 594 in the user interface 500, the electronic device 100 may display the user interface 400 and receive the user selection or the input for selecting the test case. Then, the electronic device 100 may generate a test plan or change the stored setting information based on the user input. In addition, although a pop-up window is shown as the user interface 400 for setting or changing the test case in FIGS. 4a to 4d, it is not limited thereto, and the user interface 400 of the present invention may be implemented in various forms such as a modal window.

[0080] At this time, a test case can be a test script written to test the service of an application as a test target, the type of a page of the application, or a user interface component or object existing in the page. For example, the test case can include a test case related to a delivery service or a test case related to a streaming media service. Or, the test case can include a test case related to a shopping cart page, a test case related to a checkout page, a test case related to a membership information page, a test case related to a product list page, a test case related to a product detailed information page, or a test case related to a search result page. The test case can include test cases related to various objects existing in a specific page.

[0081] According to an embodiment, a user can select a corresponding test case according to the service of the application to be tested by the user, the type of the application page, or a user interface component or object existing in the page, etc. For example, in the case of a version update of the application, the user can select all test cases. Or, in the case of an update of the shopping cart page of the application, the user can select a test case related to the shopping cart page.

[0082] According to an embodiment, the user interface 400 can include an area 420 for retrieving or filtering test cases. For example, when the user inputs the name of the test case to be retrieved, etc. in the area 420, the electronic device 100 can provide a test case corresponding to the input search term.

[0083] According to an embodiment, the user interface 400 can include an area 440 for selecting test cases. For example, referring to FIGS. 4a to 4d, the electronic device 100 can display a list of various test cases in the area 440. Then, the electronic device 100 can obtain user input for the user to select a test case corresponding to the service, page, or target to be tested, etc.

[0084] According to an embodiment, after the electronic device 100 obtains user input for selecting the "previous" icon 460, it can display a user interface for setting or changing a repository for storing a test script based on the obtained input. For example, after the electronic device 100 obtains user input for selecting the "previous" icon 460, it can display the user interface 300 of FIGS. 3a to 3b.

[0085] According to an embodiment, after the electronic device 100 obtains the user input for selecting the "Next" icon 480, it may display a user interface for setting or changing the parameters for performing a test based on the obtained input. For example, after the electronic device 100 obtains the user input for selecting the "Next" icon 480, it may display the user interfaces 500 in FIGS. 5a to 5f.

[0086] FIGS. 5a to 5f show the user interfaces 500 provided by the electronic device 100 according to an embodiment.

[0087] FIGS. 5a to 5f show the user interfaces 500 for setting or changing the parameters for performing a test according to an embodiment. For example, when the electronic device 100 obtains the user input for selecting the "New", "View", or "Copy" icon in the user interface 200 or the user input for selecting the "Next" icon 480 in the user interface 400, it may display the user interface 500 and receive the user selection or input for the parameters for performing a test. Then, the electronic device 100 may generate a test plan or change the stored setting information based on the user input. In addition, although a pop-up window is shown as the user interface 500 for setting or changing the parameters for performing a test in FIGS. 5a to 5f, it is not limited thereto, and the user interface 500 of the present invention may be implemented in various forms such as a modal window.

[0088] At this time, the parameters for performing a test may include various types of parameters that need to be set according to the test plan. For example, the parameters for performing a test may include: information for distinguishing the above-mentioned first test plan; information related to the number of times of re-performing the test when the above-mentioned test implementation fails; server-related information for obtaining the first test data; server-related information for deriving the second test data; and control group and experimental group test-related setting information.

[0089] According to an embodiment, the user interface 500 may include an area 502 for setting the name of the test plan. For example, when the user desires to generate a new test plan, the user may input, in the area 502, the type of page to be tested by the test plan or the type of the operating system of the target device, etc., so as to more easily distinguish the test plan. In addition, the name of the test plan input in the area 502 may be displayed in the area 235 of the user interfaces 200 in FIGS. 2a to 2d.

[0090] According to an embodiment, the user interface 500 may include an area 504 for setting the user's annotation for the test plan. For example, when the user desires to generate a new test plan, the user may input in the area 504 the types of tests to be implemented by the test plan or the operating system of the target device, etc., so as to more easily distinguish the test plans. In addition, the user's annotation for the test plan input in the area 504 may be displayed in the area 240 of the user interface 200 in FIGS. 2a to 2d.

[0091] According to an embodiment, the user interface 500 may include an area 506 for setting the type of test target. For example, when the user selects the downward icon within the area 506 or moves the cursor into the area 506, the electronic device 100 may provide a drop-down menu or a drop-down list, which includes a list of the types of test targets of the test plan. Then, the electronic device 100 may obtain the user input for selecting the type of test target from the list and display the selected type of test target in the area 506.

[0092] Referring to FIG. 5b, the electronic device 100 may provide a drop-down menu 508, which includes a list of the types of test targets of the test plan. Then, the electronic device 100 may obtain the user input for selecting the UI and display the selected UI in the area 506.

[0093] At this time, the type of test target is a parameter set for facilitating the user to distinguish or retrieve the test plan, and may include an API (application programming interface), a UI (user interface), or all of the API and the UI. However, this is only an embodiment, and the type of test target may be set differently from the above or changed based on the user input.

[0094] According to an embodiment, the user interface 500 may include an area 510 for setting the category to which the test plan belongs. For example, when the user selects the downward icon within the area 510 or moves the cursor into the area 510, the electronic device 100 may provide a drop-down menu or a drop-down list, which includes a list of the categories to which the test plan belongs. Then, the electronic device 100 may obtain the user input for selecting one of the categories from the list and display the selected category in the area 510.

[0095] Referring to FIG. 5c, according to an embodiment, the electronic device 100 can provide a drop-down menu 512, which includes a list of categories to which the test plan belongs. Then, the electronic device 100 can obtain user input for selecting "App-release", and display the selected "App-release" in the area 510.

[0096] At this time, the category to which the test plan belongs is a parameter set to facilitate the user to distinguish or retrieve the test plan, and can include Checkout, Cart, App release, Order, or Other. However, this is only an example, and it can be set differently from the above, or changed based on user input.

[0097] For example, the user can select the "Edit" icon corresponding to each category to change the category name, or select the "New" icon 514 to add a new category to the list. Referring to FIG. 5d, when the electronic device 100 obtains user input for selecting the "New" icon 514, the electronic device 100 can display a pop-up window 516 for inputting a new category.

[0098] According to an embodiment, the type of test target set in the area 506 and the category to which the test plan belongs set in the area 510 can be used to filter the test plan, as described above with respect to FIGS. 2b to 2d. For example, for a specific test plan, when the type of test target is set to UI and the category to which the test plan belongs is set to App-release, after the electronic device 100 obtains user input for selecting UI as the type of test target and user input for selecting App-release as the category to which the test target belongs, the electronic device 100 can provide a list containing the test plan.

[0099] According to an embodiment, the user interface 500 can include an area 518 for setting whether to upload the result information of the test performed according to the test plan. For example, the electronic device 100 can display a toggle switch in the area 518 as a user interface component for setting whether to upload the result information of the test performed according to the test plan. When the user enables the toggle switch, the result information of the test performed according to the test plan can be uploaded to the database; when the user disables the toggle switch, the result information of the test performed according to the test plan can not be uploaded to the database.

[0100] According to an embodiment, the user interface 500 may include an area 520 for setting email-related parameters. For example, the electronic device 100 may display a toggle switch in the area 520 as a user interface component for setting whether to provide email-related parameters.

[0101] According to an embodiment, the user interface 500 may include an area 522 for setting message notification-related parameters. For example, the electronic device 100 may display a toggle switch in the area 522 as a user interface component for setting whether to provide test plan-related information as a message notification.

[0102] According to an embodiment, the user interface 500 may include an area 524 for setting logging-related parameters. For example, the electronic device 100 may display a toggle switch in the area 524 as a user interface component for setting whether to provide test plan-related logging.

[0103] According to an embodiment, the user interface 500 may include an area 526 for setting the number of times to retest in the event of a test failure when implementing a test according to a test plan. For example, when the user selects the down icon in the area 526 or moves the cursor into the area 526, the electronic device 100 may provide a drop-down menu or list that includes a list of the number of retest times. Then, the electronic device 100 may obtain user input of one of the number of retest times in the selection list and display the selected number of retest times in the area 526.

[0104] Referring to FIG. 5e, the electronic device 100 may provide a drop-down menu 528 that includes a list of the number of times to retest in the event of a test failure when implementing a test according to a test plan. When the user selects "None", even if the test implemented according to the test plan fails, the electronic device 100 will not retest. Alternatively, when the user selects "Once", "Twice", or "Thrice", when the test implemented according to the test plan fails, the electronic device 100 will retest at most once, twice, or three times.

[0105] According to an embodiment, the user interface 500 may include an area 530 for setting the function level related to the test plan. For example, when the user selects the down icon in the area 530 or moves the cursor into the area 530, the electronic device 100 may provide a drop-down menu or list that includes a list of function levels. Then, the electronic device 100 may obtain user input of one of the function levels in the selection list and display the selected function level in the area 530.

[0106] According to an embodiment, the user interface 500 may include an area 532 for setting the number of test runners. For example, the user may input the number of test runners to be used when performing application testing according to the test plan in the area 532.

[0107] According to an embodiment, the user interface 500 may include an area 534 for setting the scope related to the test plan. For example, the user may input the scope of the application testing according to the test plan in the area 534.

[0108] According to an embodiment, the user interface 500 may include an area 536 for setting the operating system corresponding to the application when performing application testing according to the test plan. For example, when the user selects the downward icon in the area 536 or moves the cursor into the area 536, the electronic device 100 may provide a drop-down menu or a drop-down list, which includes a list of operating systems corresponding to the target application. Then, the electronic device 100 may obtain the user input of selecting one of the operating systems in the list and display the selected operating system in the area 536. At this time, the operating system corresponding to the application may include, but is not limited to, Android or iOS.

[0109] According to an embodiment, the user interface 500 may include an area 538 for setting the test devices to be used when performing application testing according to the test plan. For example, when the user selects the downward icon in the area 538 or moves the cursor into the area 538, the electronic device 100 may provide a drop-down menu or a drop-down list, which includes a list of available test devices. Then, the electronic device 100 may obtain the user input of selecting one or more test devices from the list and display the selected test devices in the area 538.

[0110] According to an embodiment, the user interface 500 may include an area 540 for setting whether to copy the test plan. For example, the electronic device 100 may display a toggle switch in the area 540 as a user interface component for setting whether to copy the test plan. When the user enables the toggle switch, the test plan is copied; when the user disables the toggle switch, the test plan is not copied.

[0111] According to an embodiment, the user interface 500 may include an area 542 for setting manufacturing-related parameters. For example, the electronic device 100 may display a toggle switch in the area 542 as a user interface component for setting manufacturing-related parameters.

[0112] According to an embodiment, the user interface 500 may include an area 550 for setting the server for obtaining test data. Specifically, the user interface 500 may include an area 552 for setting the server used when providing actual services, and an area 554 for setting the mock server used when conducting tests. At this time, the electronic device 100 may change the request for obtaining data of the server used when providing actual services to a request for obtaining data of the mock server used when conducting tests.

[0113] For example, when the user selects the downward icon in the area 552 or moves the cursor into the area 552, the electronic device 100 may provide a drop-down menu or a drop-down list that includes a list of servers used when providing actual services. Then, the electronic device 100 may obtain the user input of selecting one server from the list and display the selected test target server in the area 552.

[0114] Alternatively, when the user selects the downward icon in the area 554 or moves the cursor into the area 554, the electronic device 100 may provide a drop-down menu or a drop-down list that includes a list of mock servers used when conducting tests. Then, the electronic device 100 may obtain the user input of selecting one server from the list and display the selected test target server in the area 554.

[0115] According to an embodiment, the user interface 500 may include an area 558 for displaying the pair of the server used when providing actual services and the mock server used when conducting tests. For example, after the electronic device 100 obtains the user input of selecting the first actual server as the server used when providing actual services and the user input of selecting the first mock server as the mock server used when conducting tests, when obtaining the user input of selecting the "Add" icon 556, the electronic device 100 adds the pair of the first actual server and the first mock server to the list and displays it in the area 558.

[0116] According to an embodiment, the user interface 500 may include an area 560 for deleting the pair of the server used when providing actual services and the mock server used when conducting tests. For example, when the user selects the "Delete" icon in the area 560, the electronic device 100 may remove the pair of the server used when providing actual services and the mock server used when conducting tests corresponding to the selected "Delete" icon from the list and delete it from the area 558.

[0117] According to an embodiment, the user interface 500 may include an area 570 for setting the server for exporting test data. Specifically, the user interface 500 may include an area 572 for setting the server used when providing actual services, and an area 574 for setting the simulated server used when conducting tests. At this time, the electronic device 100 may change the request for exporting data of the server used when providing actual services to a request for exporting data of the simulated server used when conducting tests.

[0118] For example, when the user selects the down icon in the area 572 or moves the cursor into the area 572, the electronic device 100 may provide a drop-down menu or list including the list of servers used when providing actual services. Then, the electronic device 100 may obtain the user input for selecting one server from the list and display the selected test target server in the area 572.

[0119] Alternatively, when the user selects the down icon in the area 574 or moves the cursor into the area 574, the electronic device 100 may provide a drop-down menu or list including the list of simulated servers used when conducting tests. Then, the electronic device 100 may obtain the user input for selecting one server from the list and display the selected test target server in the area 574.

[0120] According to an embodiment, the user interface 500 may include an area 578 for displaying the pair of the server used when providing actual services and the simulated server used when conducting tests. For example, after the electronic device 100 obtains the user input for selecting the 4th actual server as the server used when providing actual services and the user input for selecting the 4th simulated server as the simulated server used when conducting tests, when obtaining the user input for selecting the "Add" icon 576, the 4th actual server and the 4th simulated server pair are added to the list and displayed in the area 578.

[0121] According to an embodiment, the user interface 500 may include an area 580 for deleting the pair of the server used when providing actual services and the simulated server used when conducting tests. For example, when the user selects the "Delete" icon in the area 580, the electronic device 100 may remove the pair of the server used when providing actual services and the simulated server used when conducting tests corresponding to the selected "Delete" icon from the list and delete it from the area 578.

[0122] According to one embodiment, the user interface 500 may include an area 590 for setting parameters related to the control group and experimental group tests. For example, the following information may be input in the area 590: the user account to be used when performing the test by overriding with the control group account or experimental group account based on the identifier or membership information of the terminal. At this time, the user may input the identifier or membership information of one or more terminals to be overridden with the control group account or experimental group account in the area 590, or may not input any information.

[0123] According to one embodiment, the user interface 500 may include an area 592 for setting the time to perform the application test according to the test plan. For example, when the user selects the down icon or moves the cursor into the area 592, the electronic device 100 may provide a drop-down menu or list including icons for setting the start time of the test or the test execution interval, etc.

[0124] Referring to FIG. 5f, the user may set the start time of the application test according to the test plan to UTC+8 10:10 and UTC+8 14:00.

[0125] According to one embodiment, after the electronic device 100 obtains the user input for selecting the "Previous" icon 594, it may display a user interface for setting or changing the test case from the test script based on the obtained input. For example, after the electronic device 100 obtains the user input for selecting the "Previous" icon 594, it may display the user interface 400 shown in FIGS. 4a to 4d.

[0126] According to one embodiment, after the electronic device 100 obtains the user input for selecting the "Save" icon 596, it may generate a test plan based on the obtained input. For example, after the electronic device 100 obtains the user input for selecting the "Save" icon 596, it may generate a test plan according to the set information of the user input and add it to the list of test plans shown in FIGS. 2a to 2d.

[0127] FIGS. 6a to 6g show a user interface 600 provided by the electronic device 100 according to one embodiment.

[0128] FIGs. 6a to 6g show a user interface 600 for setting or changing execution setting information of an application test according to an embodiment. For example, when the user selects the "Run" icon in the user interface 200, the electronic device 100 may display the user interface 600 and receive user input for selecting or inputting execution setting information of the test. Then, the electronic device 100 may perform the application test based on the user input. In addition, although a pop-up window is shown as the user interface 600 for setting or changing execution setting information of the application test in FIGS. 6a to 6g, the present invention is not limited thereto, and the user interface 600 of the present invention may be implemented in various forms such as a modal window.

[0129] At this time, the execution setting information of the application test may include various parameters that need to be set according to the application test. For example, it may include test device-related information, control group and experimental group test-related setting information, target application version-related information, server-related information for obtaining test data, or server-related information for exporting test data, etc.

[0130] According to an embodiment, the user interface 600 may include an area 602 for setting control group and experimental group test-related parameters. For example, the following information is input in the area 602: the user account used when performing the test by covering with a control group account or an experimental group account based on the identifier or membership information of the terminal. At this time, the user may input the identifier or membership information of one or more terminals covered with the control group account or the experimental group account in the area 602, or may not input any information.

[0131] According to an embodiment, the user interface 600 may include an area 604 for setting the operating system corresponding to the application when performing the application test according to the test plan. For example, when the user selects the down icon in the area 604 or moves the cursor into the area 604, the electronic device 100 may provide a drop-down menu or a drop-down list including a list of operating systems corresponding to the target application. Then, the electronic device 100 may obtain the user input of an operating system in the selection list and display the selected operating system in the area 604. At this time, the operating system corresponding to the application may include, but is not limited to, Android or iOS.

[0132] According to one embodiment, the user interface 600 may include an area 606 for selecting an application to be a test target. Specifically, the user interface 600 may include an area 608 for selecting a build type of the application to be a test target. For example, when the user selects the downward icon in the area 608 or moves the cursor into the area 608, the electronic device 100 may provide a drop-down menu or a drop-down list that includes a list of build types. Then, the electronic device 100 may obtain user input for selecting one of the build types in the selection list and display the selected build type in the area 608.

[0133] Referring to FIG. 6b, the electronic device 100 may provide a drop-down menu 610 that includes a list of build types of the application. Then, the electronic device 100 may obtain user input for selecting a build type and display the selected build type in the area 608.

[0134] Referring to FIG. 6c, when the electronic device 100 receives user input for selecting a release build from the list of build types of the application, the electronic device 100 may display an area 612 for selecting an application to be a test target. For example, when the user selects the downward icon in the area 612 or moves the cursor into the area 608, the electronic device 100 may provide a drop-down menu or a drop-down list 614 that includes a list of applications. Then, the electronic device 100 may obtain user input for selecting one of the applications in the selection list and display the selected build type in the area 612.

[0135] Referring to FIG. 6d, when the electronic device 100 receives user input for selecting a dev build from the list of build types of the application, the electronic device 100 may display an area 616 for selecting a developer. For example, when the user selects the downward icon in the area 616 or moves the cursor into the area 616, the electronic device 100 may provide a drop-down menu or a drop-down list 618 that includes a list of developers. Then, the electronic device 100 may obtain user input for selecting one of the developers in the selection list and display the selected developer in the area 616.

[0136] Referring to FIG. 6e, when the electronic device 100 receives user input to select a development build from the list of build types of the application, the electronic device 100 may display an area 620 for selecting a branch to store the application-related script. For example, when the user selects the down icon within the area 620 or moves the cursor into the area 620, the electronic device 100 may provide a drop-down menu or a drop-down list 622 that includes a list of branches. Then, the electronic device 100 may obtain user input to select one of the branches in the list and display the selected branch in the area 620.

[0137] Referring to FIG. 6f, when the electronic device 100 receives user input to select a development build from the list of build types of the application, the electronic device 100 may display an area 624 for selecting an application as a test target. For example, when the user selects the down icon within the area 624 or moves the cursor into the area 624, the electronic device 100 may provide a drop-down menu or a drop-down list 626 that includes a list of applications. Then, the electronic device 100 may obtain user input to select one of the applications in the list and display the selected build type in the area 624.

[0138] Referring to FIG. 6g, when the electronic device 100 receives user input to select an app url from the list of build types of the application, the electronic device 100 may display an area 628 for inputting an application as a test target. For example, the user may input the url address of the script related to the application stored as a test target in the area 628.

[0139] In addition, when the user does not select an application as a test target in the area 606, the electronic device 100 may perform a test on the application currently existing in the server.

[0140] According to an embodiment, the user interface 600 may include an area 630 for setting a test device to be used when performing an application test according to a test plan. For example, when the user selects the down icon within the area 630 or moves the cursor into the area 630, the electronic device 100 may provide a drop-down menu or a drop-down list that includes a list of available test devices. Then, the electronic device 100 may obtain user input to select one or more test devices from the list and display the selected test devices in the area 630.

[0141] According to an embodiment, the user interface 600 may include an area 632 for setting whether to copy a test plan. For example, the electronic device 100 may display a toggle switch in the area 632 as a user interface component for setting whether to copy a test plan. When the user enables the toggle switch, the test plan is copied; when the user disables the toggle switch, the test plan is not copied.

[0142] According to an embodiment, the user interface 600 may include an area 634 for setting manufacturing-related parameters. For example, the electronic device 100 may display a toggle switch in the area 634 as a user interface component for setting manufacturing-related parameters.

[0143] According to an embodiment, the user interface 600 may include an area 640 for setting the server for obtaining test data. Specifically, the user interface 600 may include an area 642 for setting the server used when providing actual services, and an area 644 for setting the mock server used when performing tests. At this time, the electronic device 100 may change a request for obtaining data from the server used when providing actual services to a request for obtaining data from the mock server used when performing tests.

[0144] For example, when the user selects the downward icon in the area 642 or moves the cursor into the area 642, the electronic device 100 may provide a drop-down menu or list that includes a list of servers used when providing actual services. Then, the electronic device 100 may obtain user input for selecting one of the servers in the list and display the selected test target server in the area 642.

[0145] Alternatively, when the user selects the downward icon in the area 644 or moves the cursor into the area 644, the electronic device 100 may provide a drop-down menu or list that includes a list of mock servers used when performing tests. Then, the electronic device 100 may obtain user input for selecting one of the servers in the list and display the selected test target server in the area 644.

[0146] According to an embodiment, the user interface 600 may include an area 648 for displaying pairs of a server used when providing an actual service and a simulated server used when performing a test. For example, after the electronic device 100 obtains user input selecting the 7th actual server as the server used when providing an actual service and user input selecting the 7th simulated server as the simulated server used when performing a test, when obtaining user input selecting the "Add" icon 646, the 7th actual server and the 7th simulated server pair are added to the list and displayed in the area 648.

[0147] According to an embodiment, the user interface 600 may include an area 650 for deleting pairs of a server used when providing an actual service and a simulated server used when performing a test. For example, when the user selects the "Delete" icon within the area 650, the electronic device 100 may remove from the list the pair of the server used when providing an actual service and the simulated server used when performing a test corresponding to the selected "Delete" icon, and delete it from the area 648.

[0148] According to an embodiment, the user interface 600 may include an area 660 for setting the server for exporting test data. Specifically, the user interface 600 may include an area 662 for setting the server used when providing an actual service, and an area 664 for setting the simulated server used when performing a test. At this time, the electronic device 100 may change a request for exporting data of the server used when providing an actual service to a request for exporting data of the simulated server used when performing a test.

[0149] For example, when the user selects the down icon within the area 662 or moves the cursor into the area 662, the electronic device 100 may provide a drop-down menu or a drop-down list including a list of servers used when providing an actual service. Then, the electronic device 100 may obtain user input selecting one of the servers in the list, and display the selected server for the test target in the area 662.

[0150] Alternatively, when the user selects the down icon within the area 664 or moves the cursor into the area 664, the electronic device 100 may provide a drop-down menu or a drop-down list including a list of simulated servers used when performing a test. Then, the electronic device 100 may obtain user input selecting one of the servers in the list, and display the selected server for the test target in the area 664.

[0151] According to an embodiment, the user interface 600 may include an area 668 for displaying pairs of a server used when providing an actual service and a simulated server used when performing a test. For example, after the electronic device 100 obtains a user input for selecting the 10th actual server as the server used when providing an actual service and a user input for selecting the 10th simulated server as the simulated server used when performing a test, when obtaining a user input for selecting the "Add" icon 666, the 10th actual server and the 10th simulated server pair are added to the list and displayed in the area 668.

[0152] According to an embodiment, the user interface 600 may include an area 670 for deleting pairs of a server used when providing an actual service and a simulated server used when performing a test. For example, when the user selects the "Delete" icon within the area 670, the electronic device 100 may remove from the list the pair of the server used when providing an actual service and the simulated server used when performing a test corresponding to the selected "Delete" icon, and delete it from the area 668.

[0153] According to an embodiment, after the electronic device 100 obtains a user input for selecting the "Cancel" icon 680, it may close the user interface 600. Alternatively, after the electronic device 100 obtains a user input for selecting the "Run" icon 682, it may perform an application test based on the input execution setting information.

[0154] FIG. 7 is a schematic diagram for explaining a process of managing an application test by the electronic device 100 according to an embodiment.

[0155] In step S700, according to an embodiment, the electronic device 100 may determine simulated server related information. Specifically, before performing an application test, the electronic device 100 may determine simulated server related information set according to the server for importing test data or the server for exporting test data. For example, the electronic device 100 may determine the simulated server used when performing a test input in the area 554 or area 574 of FIG. 5a, or the simulated server used when performing a test input in the area 644 or area 664 of FIG. 6a.

[0156] In step S720, according to an embodiment, the electronic device 100 can determine whether the simulation server is online. For example, before performing an application test, the electronic device 100 can determine whether the simulation server set according to the server for importing test data or the server for exporting test data is online. When all simulation servers are online, the electronic device 100 can execute step S740. When at least one simulation server is offline, the electronic device 100 can execute step S780.

[0157] In step S740, according to an embodiment, the electronic device 100 can perform a test on a target application according to a test plan. For example, the electronic device 100 can perform a test on the target application according to the setting information and execution setting information included in the test plan.

[0158] In step S760, when all simulation servers are online, after performing the application test, the electronic device 100 can解除 one or more settings. For example, the electronic device 100 can stop the appium server,解除 the settings related to the user account used during the test,解除 the settings for the simulation server used during the test. Or, the electronic device 100 can解除 the proxy setting, or解除 the setting of covering the user account used during the test with the control group account or the experimental group account.

[0159] In step S780, when at least one simulation server is offline, the electronic device 100 can provide an error message. For example, the electronic device 100 can provide an error message indicating that the test cannot be performed because at least one simulation server is offline.

[0160] Figure 8 is a schematic diagram for explaining the process of managing an application test by the electronic device 100 according to an embodiment.

[0161] In step S800, according to an embodiment, the electronic device 100 can determine one or more user accounts used during the test. For example, the electronic device 100 can determine one or more user accounts that can be used during the test from the user account pool.

[0162] It should be noted that the Chinese character "解除" in the original text seems to be an incorrect or incomplete expression. I have translated it as "解除" as it is, but it might need to be further verified and corrected in the actual context.In step S820, the electronic device 100 can determine whether the user account is restricted. For example, the electronic device 100 can determine one or more user accounts with unrestricted use from among the one or more determined user accounts. At this time, the restricted use of the user account may mean that a specific user locks the user account to prevent other users from using it in order to use the user account to perform application testing.

[0163] In step S840, the electronic device 100 can disable the restricted user accounts. For example, the electronic device 100 can disable one or more restricted user accounts.

[0164] In step S860, the electronic device 100 can be set in a way that restricts the user account for other tests. For example, the electronic device 100 can lock at least one user account to prevent other users from using at least one user account that has been determined to have unrestricted use.

[0165] In step S880, the electronic device 100 can perform a test using the user account. For example, the electronic device 100 can perform a test using the user account that is set to be restricted for other tests.

[0166] FIG. 9 is a schematic diagram for explaining the process of managing application testing by the electronic device 100 according to an embodiment.

[0167] According to an embodiment, when performing an application test according to a test plan, the electronic device 100 can perform the application test according to a test script corresponding to the test case 900 included in the test plan. At this time, the electronic device 100 can perform the application test based on a three-layer architecture.

[0168] For example, the electronic device 100 can call the page function library 920 based on the test case 900. Also, the electronic device 100 can call the object behavior library 940 or the page object library 960 based on the page function library 920.

[0169] According to an embodiment, the page function library 920 can include functions that can be reused based on the page, and the page can be a call to the object repository for object operations. Also, the page object library 960 can be reflected in the page library element definition.

[0170] According to an embodiment, when the electronic device 100 calls the object behavior library 940 based on the page function library 920, tools or frameworks such as appium 980, PIL 982, adb utils 984, redis 986, pytest 988, mitm proxy 990, or autoRunner 992 may be used. At this time, mitm proxy 990 may refer to a tool for setting proxy-related parameters, and autoRunner 992 may refer to a framework for executing tests on multiple devices.

[0171] FIG. 10 is a schematic diagram for explaining the process of managing application testing by the electronic device 100 according to an embodiment.

[0172] In step S1000, according to an embodiment, the electronic device 100 may determine whether the used framework is autoRunner. For example, the electronic device 100 may determine the attributes for generating execution setting information by determining whether the used framework is autoRunner or pytest, and reflect the page library to the actual object repository based on the operating system-related information included in the execution setting information.

[0173] In step S1020, according to an embodiment, the electronic device 100 may determine the test plan. For example, when it is determined that the used framework is autoRunner, the electronic device 100 may determine the test plan.

[0174] In step S1040, according to an embodiment, the electronic device 100 may perform application testing according to the test plan. For example, the electronic device 100 may perform testing on the target application according to the setting information and execution setting information included in the determined test plan.

[0175] In step S1060, according to an embodiment, the electronic device 100 may control the appium server and record the appium server log. For example, the electronic device 100 may control the appium server for automatic start, automatic stop, and automatic error handling (re-enabling), and record the appium server log during this period. Also, the electronic device 100 may record adb (Android Debug Bridge) through a daemon process and filter conflict / anr (Application Not Responding) errors into the local log file of other daemon processes.

[0176] FIG. 11 is a flowchart showing a method for managing application testing of an electronic device according to an embodiment. For repeated content, reference may be made to the above description.

[0177] In step S1100, the electronic device can obtain the first test plan related information including at least one test case related information and at least one parameter related information for executing the test.

[0178] According to an embodiment, at least one test case related information may include repository related information, in which at least one test script corresponding to at least one test case is stored.

[0179] According to an embodiment, at least one test case may include at least one of the following test cases: a test case related to the shopping cart page; a test case related to the checkout page; a test case related to the member information page; a test case related to the product list page; a test case related to the product detailed information page; and a test case related to the search result page.

[0180] According to an embodiment, at least one parameter related information may include at least one of the following information: information for distinguishing the first test plan; information related to the number of times of re-executing the test in case of failure in the execution of the above test; server related information for obtaining the first test data; server related information for deriving the second test data; and control group and experimental group test related setting information.

[0181] According to an embodiment, the information for distinguishing the first test plan may include at least one of the following information: information related to the name of the first test plan; information related to the user's annotation of the first test plan; information related to the type of the test objective of the first test plan; and information related to the category to which the first test plan belongs.

[0182] According to an embodiment, the information for distinguishing the first test plan may be provided together with a list of a plurality of test plans including the first test plan.

[0183] According to an embodiment, the server related information for obtaining the first test data or the server related information for deriving the second test data may include: server related information used when providing actual services; and mock server related information used when executing the test.

[0184] According to an embodiment, the test-related setting information of the control group and the experimental group may include the following information: the user account used when performing the test by covering the control group account or the experimental group account based on the identifier of the terminal or the membership information.

[0185] In step S1120, the electronic device may obtain execution setting information, which corresponds to the first test plan and includes target application-related information.

[0186] According to an embodiment, the execution setting information may include at least one of the following information: test equipment-related information; test-related setting information of the control group and the experimental group; version-related information of the above target application; server-related information for obtaining the first test data; and server-related information for deriving the second test data.

[0187] In step S1140, the electronic device may perform a test on the target application based on the first test plan-related information and the execution setting information.

[0188] According to an embodiment, when the electronic device performs a test on the target application, it may change the request for the server used when providing actual services to a request for the simulated server used when performing the test.

[0189] According to an embodiment, when the electronic device performs a test on the target application, it may call the page function library and the page object library based on at least one test case-related information.

[0190] In step S1160, the electronic device may provide the execution result information of the test.

[0191] According to an embodiment, the electronic device may provide a list of multiple test plans including the first test plan.

[0192] According to an embodiment, the electronic device may determine the second test plan-related information selected as the editing target in the list of multiple test plans; determine the user input, where the user input modifies at least one of the test case-related information and the parameter-related information of the second test plan; and generate a third test plan based on the user input.

[0193] According to an embodiment, the electronic device may confirm the simulated server-related information used when performing the test in at least one parameter-related information; and confirm whether the simulated server is online or offline.

[0194] According to an embodiment, when the simulation server is online, the electronic device may perform tests on a target application according to a first test plan, and provide an error message when the simulation server is offline.

[0195] According to an embodiment, the electronic device may confirm at least one user account among one or more user accounts used when performing tests and which is unrestricted in use; and configure in such a way as to restrict at least one user account for other tests.

[0196] FIG. 12 shows a block diagram of an electronic device 100 according to an embodiment.

[0197] According to an embodiment, the electronic device 100 may include a communication device 1220, a memory 1240, and a controller 1260. The electronic device 100 shown in FIG. 12 only illustrates the components related to this embodiment. Therefore, those of ordinary skill in the art related to this embodiment can understand that, in addition to the components shown in FIG. 12, other general components may also be included. The electronic device 100 may include the server-related content as described above, and the repeated content will not be elaborated. In an embodiment, the communication unit may include one or more transceivers. Also, in an embodiment, the controller may include one or more processors.

[0198] The communication unit 1220 is a device for performing wired or wireless communication and can communicate with external electronic devices. The external electronic device may be a terminal or a server. In addition, the communication technology used by the communication unit 1220 may include GSM (Global System for Mobile communication), CDMA (Code Division Multi Access), LTE (Long Term Evolution), 5G, WLAN (Wireless LAN), Wi-Fi (Wireless-Fidelity), Bluetooth™, RFID (Radio Frequency Identification), infrared communication (Infrared Data Association, IrDA), ZigBee, NFC (Near Field Communication), etc.

[0199] The controller 1260 can control the overall operation of the electronic device 100, and process data and signals. The controller 1260 can be composed of at least one hardware unit. Also, the controller 1260 can operate through more than one software module, and the software module is generated by executing the code stored in the memory 1240. The controller 1260 can include a processor and a memory, and the processor can execute the code stored in the memory to control the overall operation of the electronic device 100 and process data and signals. Also, in an embodiment, the controller 1260 can include at least one processor.

[0200] The controller 1260 can be as follows: obtain the information related to the first test plan, which includes at least one piece of information related to a test case and at least one piece of information related to a parameter for executing the test; obtain the execution setting information, which corresponds to the first test plan and includes the information related to the target application; perform a test on the target application based on the information related to the first test plan and the execution setting information; and provide the information on the execution result of the test.

[0201] The electronic device according to the above-described embodiment can include a processor, a memory for storing and executing program data, a permanent storage such as a disk drive, a communication port for communicating with an external device, and a user interface device such as a touch panel, a key, a button, etc. The method implemented by a software module or an algorithm can be stored as computer-readable code or program instructions that can be executed on the above-mentioned processor on a computer-readable recording medium. Here, the computer-readable recording medium includes magnetic storage media (such as ROM (read-only memory), RAM (random-access memory), floppy disks, hard disks, etc.) and optical-readable media (such as CD-ROM (compact disc read only memory), digital versatile disc (DVD), etc.). The computer-readable recording medium can be distributed in a networked computer system so as to store and execute the computer-readable code in a distributed manner. The medium can be read by a computer, stored in the memory, and executed by the processor.

[0202] This embodiment can be represented by a functional block structure and various processing steps. These functional blocks can be implemented by various hardware and / or software configurations that perform specific functions. For example, an embodiment can employ an integrated circuit configuration capable of performing various functions under the control of one or more microprocessors or other control devices, such as memories, processors, logic, look-up tables, etc. Similar to the way components can be implemented by software programming or software elements, this embodiment can also be implemented using programming or scripting languages such as C, C++, Java, assembler, etc., including various algorithms implemented in combinations of data structures, processes, routines, or other programming constructs. The functional aspects can be implemented by algorithms executed on one or more processors. Also, this embodiment can adopt prior art for electronic configuration, signal processing, and / or data processing. Terms such as "mechanism", "element", "means", and "configuration" can be used broadly and are not limited to mechanical and physical configurations. The above terms can be associated with a processor and include the meaning of a series of routines.

[0203] The above embodiment is an example, and other embodiments can also be realized within the scope of the following invention patent application.

[0204] 100: Electronic device 120, 140, 160: Terminal 180: Network 200: User interface 202: First test plan 204: Second test plan 206: Third test plan 208: Fourth test plan 210: Fifth test plan 220: Region 225: Region 230: Region 235: Region 240: Region 245: Region 250: Region 255: Region 260: Region 265: Region 270: Region 275: Region 280: Region 285: Drop-down menu 290: Drop-down menu 300: User Interface 320: Area 340: Area 360: Drop-down Menu 380: "Next" Icon 400: User Interface 420: Area 440: Area 500: User Interface 502: Area 504: Area 506: Area 508: Drop-down Menu 510: Area 512: Drop-down Menu 514: "New" Icon 516: Pop-up Window 518: Area 520: Area 522: Area 524: Area 526: Area 528: Drop-down Menu 530: Area 532: Area 534: Area 536: Area 538: Area 540: Area 542: Area 550: Area 552: Area 554: Area 556: "Add" Icon 558: Area 560: Area 570: Area 572: Area 574: Area 576: "Add" Icon 578: Area 580: Area 590: Area 592: Area 594: "Previous" Icon 596: "Save" Icon 600 User Interface 602: Area 604: Area 606: Area 608: Area 610: Drop-down menu 612: Area 614: Drop-down list 616: Area 618: Drop-down list 620: Area 622: Drop-down list 624: Area 626: Drop-down list 630: Area 632: Area 634: Area 640: Area 642: Area 644: Area 646: "Add" icon 648: Area 650: Area 660: Area 662: Area 664: Area 666: "Add" icon 668: Area 670: Area 680: "Cancel" icon 682: "Run" icon S700: Step S720: Step S740: Step S760: Step S780: Step

Claims

1. An application test management method, performed via an electronic device, comprising the following steps: obtaining first test plan related information, the first test plan related information including at least one test case related information and at least one parameter related information for performing the test; obtaining execution setting information, the execution setting information corresponding to the first test plan and including target application related information; performing a test on the target application based on the first test plan related information and the execution setting information; and providing the test execution result information; wherein the at least one parameter related information includes server related information for obtaining first test data; wherein the server related information for obtaining the first test data includes server related information used when providing actual service and simulated server related information used when performing the test; wherein performing a test on the target application includes changing the request for obtaining the first test data of the server used when providing the actual service to a request for obtaining the first test data of the simulated server used when performing the test; The information related to at least one of the above parameters includes at least one of the following: information for distinguishing the first test plan; information on the number of times the test will be re-run if the test fails; server-related information for exporting the second test data; and control group and experimental group test-related settings information; wherein the control group and experimental group test-related settings information includes the following: information for overwriting the user account used during the test with the control group account or experimental group account based on the terminal identifier or member information.

2. The application test management method as described in Request 1 further includes the following steps: providing a list of multiple test plans including the first test plan mentioned above.

3. The application test management method as described in Request 1, wherein the information related to at least one test case includes information related to a repository, wherein the repository stores at least one test script corresponding to the at least one test case.

4. As per Request Item 1's application test management method, the aforementioned at least one test case includes at least one of the following test cases: test cases related to the shopping cart page; test cases related to the checkout page; test cases related to the member information page; test cases related to the product list page; test cases related to the product details page; and test cases related to the search results page.

5. The application test management method as described in Request Item 1, wherein the information used to distinguish the aforementioned first test plan includes at least one of the following: information related to the name of the aforementioned first test plan; information related to user annotations of the aforementioned first test plan; information related to the type of test objective of the aforementioned first test plan; and information related to the category to which the aforementioned first test plan belongs.

6. The application test management method as described in Request 1, wherein the information used to distinguish the aforementioned first test plan is provided together with a list of multiple test plans including the aforementioned first test plan.

7. The application test management method as described in Request 1, wherein the execution setting information includes at least one of the following: test equipment related information; control group and experimental group test related setting information; version related information of the target application; the server related information used to obtain the first test data; and server related information used to export the second test data.

8. The application test management method as described in Request 2 further includes the following steps: determining the information related to the second test plan selected as the editing target from the list of the plurality of test plans; determining user input, wherein the user input is to modify at least one of the test case information related to the second test plan and the parameter information related to the second test plan; and generating the third test plan based on the user input.

9. The application test management method as described in Request 1 further includes the following steps: confirming the above-mentioned information related to the above-mentioned simulation server in at least one of the above-mentioned parameter-related information; and confirming whether the above-mentioned simulation server is online or offline.

10. The application test management method as described in Request 9 further includes the following steps: when the simulated server is online, testing the target application according to the first test plan; and when the simulated server is offline, providing an error message.

11. The application test management method as described in Request 1 further includes the following steps: identifying at least one user account among the more than one user accounts used during testing that is not subject to usage restrictions; and setting up a method to restrict the use of the aforementioned at least one user account for other tests.

12. The application test management method as described in Request 1, wherein the steps for testing the aforementioned target application include the following steps: Based on at least one test case related information, calling the page function library and the page object library.

13. A non-transitory computer-readable recording medium recording a program for performing the method as described in claim 1 on a computer.

14. An electronic device comprising: Communications Department; Memory; and controller; The controller described above performs the following functions: It obtains information related to a first test plan, including at least one test case and at least one parameter for executing the test; it obtains execution configuration information corresponding to the first test plan and including target application information; based on the first test plan and execution configuration information, it performs a test on the target application and provides test result information; wherein the at least one parameter information includes server-related information for obtaining the first test data; wherein the server-related information for obtaining the first test data includes information related to the server used when providing actual service and information related to the simulated server used when performing the test; wherein, when testing the target application, the controller is configured to change the request for obtaining the first test data from the server used when providing the actual service to a request for obtaining the first test data from the simulated server used when performing the test; wherein the at least one parameter information includes at least one of the following: information for distinguishing the first test plan. Information on the number of times the test will be repeated if the above test fails; server-related information for exporting the second test data; and control group and experimental group test-related settings information; wherein the control group and experimental group test-related settings information includes the following information: information used to overwrite the user account used during the test with the control group account or experimental group account based on the terminal identifier or member information.

15. An application test management method, performed via an electronic device, comprising the following steps: obtaining first test plan related information, the first test plan related information including at least one test case related information and at least one parameter related information for performing the test; obtaining execution setting information, the execution setting information corresponding to the first test plan and including target application related information; performing a test on the target application based on the first test plan related information and the execution setting information; and providing the test execution result information; wherein the at least one parameter related information includes server related information for exporting second test data; wherein the server related information for exporting the second test data includes server related information used when providing actual services and simulated server related information used when performing the test; wherein performing a test on the target application includes changing the request to export the second test data for the server used when providing the actual services to a request to export the second test data for the simulated server used when performing the test. The information related to at least one of the above parameters includes at least one of the following: information for distinguishing the first test plan; information on the number of times the test will be re-run if the test fails; server-related information for exporting the second test data; and control group and experimental group test-related settings information; wherein the control group and experimental group test-related settings information includes the following: information for overwriting the user account used during the test with the control group account or experimental group account based on the terminal identifier or member information.

16. A non-transitory computer-readable recording medium recording a program for performing the method as described in claim 15 on a computer.

17. An electronic device comprising: Communications Department; Memory; and controller; The controller described above performs the following functions: It obtains information related to a first test plan, including at least one test case and at least one parameter for executing the test; it obtains execution setting information corresponding to the first test plan and including target application information; based on the first test plan and the execution setting information, it performs a test on the target application and provides test result information; wherein the at least one parameter includes server-related information for exporting second test data; wherein the server-related information for exporting the second test data includes information related to the server used when providing actual service and information related to the simulated server used when performing the test; wherein, when testing the target application, the controller is configured to change the request to export the second test data from the server used when providing actual service to a request to export the second test data from the simulated server used when performing the test; wherein the at least one parameter includes at least one of the following: information for distinguishing the first test plan. Information on the number of times the test will be repeated if the above test fails; server-related information for exporting the second test data; and control group and experimental group test-related settings information; wherein the control group and experimental group test-related settings information includes the following information: information used to overwrite the user account used during the test with the control group account or experimental group account based on the terminal identifier or member information.

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