Internal standard method for surface enhanced raman scattering substrate and the substrate used thereof

Abstract

This invention provides an internal standard method for a surface-enhanced Raman scattering (SERS) substrate and the substrate used therein. The SERS substrate utilizes independent characteristic peaks of the substrate as internal standards to detect analytes. The steps of the internal standard method for the SERS substrate include: irradiating the SERS substrate with a detection beam and receiving the signal through a spectrometer to generate a first Raman spectrum, which is then transmitted to a computing unit; dropping the analyte onto the SERS substrate; irradiating the analyte with the detection beam and receiving the signal through a spectrometer to generate a second Raman spectrum, which is then transmitted to the computing unit; and the computing unit using the first Raman spectrum to perform signal correction on the second Raman spectrum, making the correction signal of the second Raman spectrum equal to the correction signal of the first Raman spectrum.

Claims

1. A method for using an internal standard on a surface-enhanced Raman scattering (SERS) substrate, comprising detecting a analyte using an SERS substrate with internal standard function, the SERS substrate further comprising: an anodized aluminum substrate having a nanoporous structure; and a metal thin film disposed on the anodized aluminum substrate; the method comprising the steps of: illuminating the SERS substrate with internal standard function with a detection beam and receiving the detection beam through a spectrometer; the spectrometer generating a first Raman spectrum using the detection beam and transmitting the first Raman spectrum to a computing unit, the first Raman spectrum including a first Raman correction peak corresponding to a wavenumber of an aluminum alloy; dropping the analyte onto the SERS substrate with internal standard function; illuminating the analyte with the detection beam and receiving the detection beam through the spectrometer; The spectrometer generates a second Raman spectrum using the detection beam and transmits it to the computing unit. The second Raman spectrum includes a second Raman correction peak and a third Raman peak. The second Raman correction peak corresponds to the wavenumber of the aluminum alloy, and the third Raman peak corresponds to the wavenumber of the analyte. The computing unit uses the intensity of a first Raman correction peak, which is the same as the intensity of a second Raman correction peak, as an internal standard to correct the second Raman spectrum. The wavenumber of the aluminum alloy is at a different position than that of the test object.

2. The internal standard method for a surface-enhanced Raman scattering substrate as described in claim 1, wherein in the steps of generating a second Raman spectrum using the detection beam in the spectrometer and transmitting the second Raman spectrum to the computing unit, the second Raman spectrum including a second Raman correction peak and a third Raman peak, the second Raman correction peak corresponding to the wavenumber of the aluminum alloy and the third Raman peak corresponding to the wavenumber of the analyte, the wavenumber of the aluminum alloy being below 230 cm⁻¹ and the wavenumber of the analyte being above 230 cm⁻¹.

3. The internal standard method for a surface-enhanced Raman scattering substrate as described in claim 1, wherein the material of the metal thin film is silver, gold, platinum, aluminum, or copper.

4. The internal standard method for a surface-enhanced Raman scattering substrate as described in claim 3, wherein when the material of the metal thin film is silver, the surface-enhanced Raman scattering substrate with internal standard function further comprises: a monolayer film disposed on the metal thin film, wherein the material of the monolayer film is 4-aminothiophenol (4-ATP) or spermine.

5. The internal standard method for a surface-enhanced Raman scattering substrate as described in claim 3, wherein when the material of the metal thin film is gold, the surface-enhanced Raman scattering substrate with internal standard function further comprises: a monolayer film disposed on the metal thin film, wherein the material of the monolayer film is 4-mercaptobenzoic acid or spermine.

6. A surface-enhanced Raman scattering substrate with internal standard function, comprising: an anodic aluminum oxide substrate having a nanoporous structure; a metal thin film disposed on the anodic aluminum oxide substrate, the metal thin film being made of silver or gold; and a monolayer film disposed on the metal thin film, the monolayer film being made of 4-aminothiophenol (4-ATP); wherein, This surface-enhanced Raman scattering substrate with internal standard function is used to detect at least one nitrofuran antibiotic.

7. A surface-enhanced Raman scattering substrate with internal standard function, comprising: an anodic aluminum oxide substrate having a nanoporous structure; a metal thin film disposed on the anodic aluminum oxide substrate, the metal thin film material being silver or gold; and a monolayer film disposed on the metal thin film, the monolayer film material being spermine; wherein, The surface-enhanced Raman scattering substrate with internal standard function is used to detect at least one arsenic-containing compound.

8. A surface-enhanced Raman scattering substrate with internal standard function, comprising: an anodic aluminum oxide substrate having a nanoporous structure; a metal thin film disposed on the anodic aluminum oxide substrate, the metal thin film being made of silver or gold; and a monolayer film disposed on the metal thin film, the monolayer film being made of 4-mercaptobenzoic acid; wherein, This surface-enhanced Raman scattering substrate with internal standard function is used to detect at least one nitrofuran antibiotic.

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