Simulated fingerprint reference test strip

TWM687824UActive Publication Date: 2026-09-21CENTRAL POLICE UNIVERSITY
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Patent Information

Application Number
TW115205290
Authority / Receiving Office
TW · TW
Patent Type
Utility models
Current Assignee / Owner
Filing Date
2026-06-09
Publication Date
2026-09-21
Estimated Expiration
2036-06-08

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Abstract

A simulated fingerprint reference test strip includes a substrate and a deposition structure. The deposition structure is formed on the substrate by applying an artificial secretion to the substrate and then drying it. It includes a distribution outline corresponding to a simulated fingerprint, which is then processed by a fingerprint enhancement reagent to reveal the corresponding simulated fingerprint pattern. This provides a standardized reference test strip suitable for testing and comparing the development effects and sensitivity of different fingerprint enhancement reagents, and for observing the development of simulated fingerprint patterns at different magnifications and under different deposition density conditions, thereby helping to improve the reproducibility of fingerprint enhancement reagent test results.
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Claims

1. A simulated fingerprint reference test strip, comprising: One substrate; And a deposition structure formed on the substrate, the deposition structure being formed by the output of artificial secretions to the substrate and then dried, and including a distribution outline corresponding to a simulated fingerprint for fingerprint enhancement reagent to display the corresponding simulated fingerprint pattern.

2. The simulated fingerprint reference test strip as described in claim 1, wherein, The substrate can be any one of certificate paper, kraft paper, carbonless copy paper, check paper, newsprint, and photographic paper.

3. The simulated fingerprint reference test strip as described in claim 1, wherein, The surface of the substrate defines a detection information area, a pattern magnification control area, and a sensitivity area, and the deposition structure is correspondingly disposed in the pattern magnification control area and the sensitivity area.

4. The simulated fingerprint reference test strip as described in claim 3, wherein, The deposition structure located within the sensitivity region comprises multiple deposition regions, each with a different deposition density, to test the sensitivity of a fingerprint enhancement reagent.

5. The simulated fingerprint reference test strip as described in claim 3, wherein, The deposition structure set within the pattern magnification comparison area includes a deposition area corresponding to the original scale pattern and at least one deposition area corresponding to the magnification pattern, so that simulated fingerprint patterns at different magnifications can be displayed after the fingerprint enhancement reagent is applied.

6. The simulated fingerprint reference test strip as described in claim 5, wherein, The at least one magnification pattern includes one or a combination of two, three, four, and five magnification patterns.

7. The simulated fingerprint reference test strip as described in claim 1, wherein, The deposited structure is formed on the surface of the substrate and extends at least partially into the interior of the substrate.

8. The simulated fingerprint reference test strip as described in claim 1, wherein, The substrate is rectangular in shape, and the ratio of the long side to the short side of the substrate is between 3 and 5.