Edge processing system for amorphous transparent materials

TWM688489UActive Publication Date: 2026-10-11刘松哲 +1
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Patent Information

Application Number
TW115205384
Authority / Receiving Office
TW · TW
Patent Type
Utility models
Current Assignee / Owner
Filing Date
2026-06-11
Publication Date
2026-10-11
Estimated Expiration
2036-06-10

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    Figure TWG2TB001916080_001
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    Figure TWG2TB001916080_002
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    Figure TWG2TB001916080_003
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Abstract

This disclosure provides an edge processing system for amorphous transparent materials, comprising a laser unit, a measurement unit, an angle calculation unit, and an adjustment unit. The laser unit emits a laser beam that passes through an incident medium to the target processing surface. The measurement unit measures the angle between the processing surface and a reference plane, as well as the incident angle of the beam. Based on optical boundary conditions, the angle calculation unit, combined with the included angle, incident angle, and optical property parameters of the material and medium, determines the propagation path direction of the beam within the material and calculates its deviation angle from the processing surface, thereby calculating the optimal incident angle that minimizes the absolute value of the deviation angle within a feasible range. The adjustment unit adjusts the laser unit accordingly, bringing the internal energy propagation direction closer to the target processing surface.
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Claims

1. An edge processing system for amorphous transparent materials, used for processing an amorphous transparent material, the edge processing system comprising: a laser unit that emits a laser beam, the laser beam passing through an incident medium and outputting to a target processing surface of the amorphous transparent material; and a measurement unit that measures an angle between the target processing surface of the amorphous transparent material and a reference plane, and an incident angle between the laser beam and the target processing surface; An angle calculation unit, based on the optical boundary conditions of the amorphous transparent material and in conjunction with the included angle value, the incident angle value, the optical characteristic parameters of the amorphous transparent material, and the optical characteristic parameters of the incident medium, determines the direction of an internal propagation path of the laser beam entering the amorphous transparent material, calculates an deviation angle between the internal propagation path and the target processing surface, and calculates an optimal incident angle that minimizes the absolute value of the deviation angle within a feasible incident angle range; and an adjustment unit, which adjusts the laser unit so that the incident angle of the laser beam is equal to the optimal incident angle, so as to process the target processing surface of the amorphous transparent material and make the energy propagation direction inside the amorphous transparent material approach the target processing surface.

2. The edge processing system for amorphous transparent materials as described in claim 1, wherein, The angle calculation unit calculates the refraction angle of the internal propagation path through a calculation formula (1) and calculates the deviation angle using a calculation formula (2). The calculation formula (1) is: and the calculation formula (2) is: where is the refractive index of the incident medium, is the incident angle, is the refractive index of the amorphous transparent material, is the refraction angle, is the deviation angle, and is the included angle.

3. The edge processing system for amorphous transparent materials as described in claim 1, wherein, The angle calculation unit calculates the refractive index of the amorphous transparent material through a calculation formula (3). The calculation formula (3) is: where is the corrected refractive index of the amorphous transparent material, is the linear refractive index of the amorphous transparent material, is the nonlinear Kerr coefficient of the amorphous transparent material, and I is the local laser intensity.

4. The edge processing system for amorphous transparent materials as described in claim 1, wherein, The angle calculation unit calculates an angle matching ratio using a calculation formula (4), which is: , where is the angle matching ratio, is the refractive index of the amorphous transparent material, is the refractive index of the incident medium, and is the included angle; When the angle matching ratio is less than or equal to 1, the angle calculation unit calculates the optimal incident angle using a calculation formula (5) to make the deviation angle zero, which is: , where is the optimal incident angle, and is the angle matching ratio; When the angle matching ratio is greater than 1, the angle calculation unit performs a numerical search within the feasible incident angle range using a calculation formula (6) to obtain the optimal incident angle, where the feasible incident angle range is: , where is the maximum value of the incident angle, and the calculation formula (6) is: .

5. The edge processing system for amorphous transparent materials as described in claim 4 further includes an evaluation unit that calculates a penetration depth coefficient by a calculation formula (7) and an energy limitation efficiency by a calculation formula (8), and confirms whether the penetration depth coefficient is less than or equal to a preset critical penetration coefficient. The calculation formula (7) is: , and the calculation formula (8) is: , where is the penetration depth coefficient and is the energy limitation efficiency.

6. The edge processing system for amorphous transparent materials as described in claim 5, wherein, The preset critical penetration coefficient is between 0.05 and 0.

2.

7. The edge processing system for amorphous transparent materials as described in claim 5 further includes a prediction unit that receives the optimal incident angle, the penetration depth coefficient, the complex laser parameters of the laser beam, and the complex material property parameters. The prediction unit calculates a damage index using a calculation formula (9), which is: , where, Here, is the damage index, is the geometric factor; M is the material damage sensitivity factor; Φ is the penetration energy flux factor that includes the penetration depth coefficient; and P is the pulse accumulation factor.