X-ray inspection apparatus

TWM688740UActive Publication Date: 2026-10-21DELTA ELECTRONICS INC(CN)
View PDF 0 Cites 0 Cited by

Patent Information

Application Number
TW115203874
Authority / Receiving Office
TW · TW
Patent Type
Utility models
Current Assignee / Owner
Priority Date
2025-11-18
Filing Date
2026-04-30
Publication Date
2026-10-21
Estimated Expiration
2036-04-29

Smart Images

  • Figure TWG2TB001917693_001
    Figure TWG2TB001917693_001
  • Figure TWG2TB001917693_002
    Figure TWG2TB001917693_002
  • Figure TWG2TB001917693_003
    Figure TWG2TB001917693_003
Patent Text Reader

Abstract

The X-ray inspection equipment includes a hollow rotating platform, an X-ray tube, a detector, and a transport device. The hollow rotating platform is configured to hold the sample and rotate it. The X-ray tube is positioned above the hollow rotating platform and is configured to emit an X-ray beam that irradiates the sample. The detector is positioned below the hollow rotating platform and is configured to receive the X-ray beam passing through the sample. The transport device carries the hollow rotating platform and is configured to move it.
Need to check novelty before this filing date? Find Prior Art

Claims

1. An X-ray inspection device, comprising: a hollow rotating platform configured to hold a sample and to rotate the sample; an X-ray tube positioned above the hollow rotating platform and configured to emit an X-ray beam irradiating the sample; a detector positioned below the hollow rotating platform and configured to receive the X-ray beam passing through the sample; and a transport device carrying the hollow rotating platform and configured to move the hollow rotating platform.

2. The X-ray inspection apparatus as claimed in claim 1, wherein the X-ray tube has a tilt angle and the X-ray beam is a tilted beam.

3. The X-ray inspection apparatus as claimed in claim 1, wherein the hollow rotating platform is configured to rotate ±360 degrees.

4. The X-ray inspection apparatus as claimed in claim 1, wherein the transport device is configured to move the hollow rotating platform along a first horizontal direction, a second horizontal direction, and a vertical direction that are perpendicular to each other via a linear motor.

5. The X-ray inspection device as claimed in claim 1 further comprises: a slide rail, wherein the detector is slidably disposed on the slide rail, and the slide rail is configured to control the receiving angle of the detector.

6. The X-ray inspection apparatus as claimed in claim 1, further comprising: a collimator surrounding the X-ray tube, wherein the collimator includes an opening for controlling the irradiation range of the X-ray beam.

7. The X-ray inspection apparatus as claimed in claim 1 further comprises: a conveyor belt mounted on the hollow rotating platform, wherein the conveyor belt is configured to transport the sample onto the hollow rotating platform.

8. The X-ray inspection equipment as claimed in claim 7 further comprises: a feed lifting and transport device connected to the conveyor belt and configured to transport the sample to the hollow rotating platform.

9. The X-ray inspection equipment as claimed in claim 7 further comprises: a discharge lifting and conveying device connected to the conveyor belt and configured to transport the sample away from the hollow rotating platform.

10. The X-ray inspection device as claimed in claim 1 further comprises: a sample fixing mechanism, including a stop cylinder, a side push cylinder and a clamping cylinder, wherein the sample fixing mechanism is configured to fix the sample on the hollow rotating platform.