A packaged test socket with probe alignment and positioning

Abstract

This invention discloses a packaged test socket with probe alignment and positioning, comprising: an upper body having a plurality of probe configuration sections; a lower body assembled with the upper body, the lower body having a plurality of corresponding holes, each corresponding hole corresponding to a probe configuration section; a plurality of probes respectively configured in each probe configuration section of the upper body; and a alignment sheet sandwiched between the upper body and the lower body, the alignment sheet having a plurality of alignment holes, each alignment hole for each probe to pass through; wherein the alignment sheet restricts the arrangement position of each probe by each alignment hole, so that each probe corresponds to the plurality of corresponding holes of the lower body, and each probe passes through each corresponding hole of the lower body. This improves the situation in conventional packaged test sockets where, during the manufacturing process, process errors, assembly process, or external force, the probes are easily misaligned or tilted, which can cause the probes to collide with the lower body, resulting in bending, deformation, or damage to the probes.

Claims

1. A packaged test socket with probe alignment and positioning, comprising: An upper body has a plurality of probe configuration sections; a lower body is combined with the upper body and has a plurality of corresponding holes, each corresponding to a probe configuration section; a plurality of probes are respectively configured in each probe configuration section of the upper body; and a guide plate is sandwiched between the upper body and the lower body, and the guide plate has a plurality of guide holes, each guide hole for each probe to pass through; wherein, the guide plate restricts the arrangement position of each probe by means of each guide hole, so that each probe corresponds to the plurality of corresponding holes of the lower body, and each probe passes through the corresponding holes of the lower body.

2. The packaged test fixture with probe alignment and positioning as described in claim 1, wherein at least one of the fixtures has an insulating colloid in each probe configuration portion or in each corresponding hole, and each probe is inserted into the insulating colloid.

3. The packaged test fixture with probe alignment and positioning as described in claim 1, wherein each alignment hole of the alignment plate is coaxially configured with each probe configuration portion of the upper body and each corresponding hole of the lower body.

4. The packaged test socket with probe alignment and positioning as described in claim 1, wherein the alignment plate is formed of an insulating material.

5. The packaged test fixture with probe alignment and positioning as described in claim 1, wherein the thickness of the alignment plate is less than the thickness of the lower body and the upper body.

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