Sample analyzer

Abstract

NOT VISIBLE DUE TO STATUS OF PATENT

Description

SAMPLE ANALYZER FIELD

[0001] The present invention relates to a sample analyser. Certain embodiments ofthe present invention relate to a sample analyser for on-line analysis of material obtainedfrom a drill hole.

[0002] Furthermore, the present invention relates to a method of operating a sampleanalyser. BACKGROUND

[0003] Mining companies typically collect drill chips samples during drilling foranalysis of the material present in the mine blasthole bench. When drilling a hole, asubstantial amount of material is being brought to the surface and the materialcharacteristics present in the bench may vary depending on the depth. Typically, material samples are collected manually after the drilling is done from the drill chips heap around the drilled hole.

[0004] There are different factors driving mining companies to improve the gradecontrol to become more accurate than using conventional mining methods. For example,grade control should become more accurate, as orebodies are becoming more and moreheterogenous and at the same time ore grades are becoming lower than in the past. Further,inaccurate grade control leads to waste rock dilution and ore losses affecting economicalresults. Furthermore, waste rock dilution increases energy used in crushing and grinding,which on global scale is estimated to be 7% of global energy consumption, and thus amajor CO2 emission source. Manual collection of drill cutting samples during and afterdrilling for analysis in a laboratory is a major health hazard in mining and miningcompanies are very concerned regarding safety of the mining personnel. Additionaly,automisation plays an important role in modern mining, particlularly robotized machinessuch as autonomous drilling machines are being developed in order to avoid that peoplemove around rotary blasthole drills and to further save costs due to automatic processing.

[0005] In view of the foregoing, it would be beneficial to provide an on-site sampleanalyser capable of automatically analysing material from the drill hole to obtaindistribution of the ore characteristics at each hole (location X, location Y, depth Z) to get a3D map of the blast bench to optimize its blasting and exploitation of the ore. Therefore, it would be beneficial to provide a system and method for automatic analysing of material obtained from a drill hole. In particular, the drill cuttings analysis should be automated so that there is no need of people working in the proximity of a rotary blasthole drill while collecting samples from drill cuttings. SUMMARY OF THE INVENTION

[0006] The invention is defined by the features of the independent claims. Somespecific embodiments are defined in the dependent claims.

[0007] According to a first aspect of the present invention, there is provided asample analyser comprising a rotatable sample carrier in the form of a disc, wherein therotatable sample carrier is rotatable around an axis of rotation in an operating direction, astationary perimeter wall, wherein the rotatable sample carrier is arranged within theperimeter wall, a feeding system, wherein the feeding system is arranged to feed samplematerial onto the rotatable sample carrier, a limiter, wherein the limiter is arranged abovethe rotatable sample carrier and spaced apart from the rotatable sample carrier at adistance, at least one sensor for analysing a sample material layer, and a guide wallarranged above the sample carrier and extending from the perimeter wall radially inwards,thus forming a passage for the sample material layer between a part of the perimeter walland the guide wall towards an exit formed by an opening in the perimeter wall.

[0008] Various embodiments of the first aspect may comprise at least one featurefrom the following bulleted list: ^the guide wall extends from the edge of the perimeter wall towards the centre of therotatable sample carrier ^the guide wall is curved^ the limiter extends from the perimeter wall towards the centre of the rotatablesample carrier^ the limiter extends from the perimeter wall to an end of the guide wall^ the limiter is arranged parallel to and spaced apart from the rotatable sample carrierat a distance in the range between 0.5 cm to 5 cm^ the limiter is arranged in the operating direction after the feeding system^ the limiter is capable of levelling the sample material layer^ the at least one sensor is an x-ray sensor, an infra-red sensor, an optical sensor, aspectrometer, an image capturing sensor, a PGNAA sensor, a Raman sensor, aLIBS sensor, or a LIF sensor^ the at least one sensor is arranged in the operating direction after the limiter^ the sample analyser further comprises a laser sensor capable of detecting presenceof a sample material layer and / or measuring a thickness of the sample materiallayer levelled by the limiter^ the laser sensor is arranged in the operating direction after the limiter or after the atleast one sensor^ the feeding system comprises a housing having a first compartment and a secondcompartment arranged below the first compartment, an inlet for guiding samplematerial into the first compartment, a first movable door arranged between the firstcompartment and the second compartment, and a second movable door arranged ata lower end of the second compartment, thus providing a second exit for loadingsample material present in the second compartment onto the sample carrier^ the feeding system comprises a third movable door providing a third exit forguiding sample material present in the second compartment out of the second compartment, thus bypassing the sample carrier^ the first movable door is linearly movable^ the second movable door is linearly movable^ the third movable door is linearly movable or hinged to the housing and rotatablearound an axis of rotation^ the sample analyser comprises a processing unit^ the processing unit comprises a processor^ the processing unit comprises a memory^ the processing unit comprises a transmitter configured to wirelessly transmit data^ the processing unit comprises a receiver configured to wirelessly receive data^ the processing unit comprises a user interface

[0009] According to a second aspect of the present invention, there is provided amethod comprising rotating a rotatable sample carrier in the form of a disc around an axisof rotation in an operating direction, wherein the rotatable sample carrier is arranged withina stationary perimeter wall, feeding sample material onto the rotatable sample carrier,arranging a limiter above the rotatable sample carrier, wherein the limiter is spaced apartfrom the rotatable sample carrier at a distance, analysing a sample material layer by at leastone sensor, and providing a guide wall arranged above the sample carrier and extendingfrom the perimeter wall radially inwards, thus forming a passage for the sample materiallayer between a part of the perimeter wall and the guide wall towards an exit formed by anopening in the perimeter wall.

[0010] Various embodiments of the second aspect may comprise at least one featurefrom the following bulleted list: ^the method comprising adjusting the distance between the limiter and the samplecarrier ^the method comprising analysing the sample material layer by an x-ray sensor, aninfra-red sensor, an optical sensor, a spectrometer, an image capturing sensor, aPGNAA sensor, a Raman sensor, a LIBS sensor, or a LIF sensor^ the method comprising detecting presence of a sample material layer and / ormeasuring a thickness of the sample material layer levelled by the limiter by a lasersensor

[0011] According to a third aspect of the present invention, there is provided asample analyser comprising a rotatable sample carrier in the form of a drum, wherein therotatable sample carrier is rotatable around an axis of rotation in an operating direction, afeeding system, wherein the feeding system is arranged to feed sample material onto alateral surface of the drum, and at least one sensor for analysing a sample material layerdistributed on a part of the lateral surface of the drum.

[0012] Various embodiments of the third aspect may comprise at least one featurefrom the following bulleted list: ^the at least one sensor is arranged in the operating direction after the feeding system^ the drum comprises a plurality of indentations distributed around the lateral surfaceof the drum ^each of the indentations is concave^ the sample analyser further comprises a cleaning system capable of cleaning thelateral surface during operation^ the cleaning system is arranged in the operating direction after the at least onesensor ^the cleaning system comprises a unit utilizing pressurized air^ the unit is arranged within the drum or outside the drum^ the cleaning system comprises a plurality of bristles and / or brushes mechanicallyconnected with the lateral surface of the drum^ the cleaning system comprises at least one nozzle capable of ejecting water towardsthe lateral surface of the drum^ the at least one nozzle is arranged within the drum or outside the drum^ the at least one sensor is an x-ray sensor, an infra-red sensor, an optical sensor, aspectrometer, an image capturing sensor, a PGNAA sensor, a Raman sensor, aLIBS sensor, or a LIF sensor ^the sample analyser further comprises a laser sensor capable of detecting presenceof a sample material layer and / or measuring a thickness of the sample materiallayer ^at least a part of the lateral surface is made of a flexible material^ least a part of the lateral surface is made of fabric or plastic^ a material of the lateral surface is permeable to air and / or water^ the lateral surface is permeable to water and serves as a water filter^ the sample analyser comprises a piping system connected to the drum and capableof guiding water out of the drum^ the sample analyser comprises a processing unit^ the processing unit comprises a processor^ the processing unit comprises a memory^ the processing unit comprises a transmitter configured to wirelessly transmit data^ the processing unit comprises a receiver configured to wirelessly receive data^ the processing unit comprises a user interface

[0013] Considerable advantages are obtained by certain embodiments of theinvention. An on-site sample analyser capable of automatically analysing material from thedrill hole to obtain distribution of the ore characteristics at each hole (location X, locationY, depth Z) to get a 3D map of the blast bench to optimize its blasting and exploitation ofthe ore is provided. In addition to analysis data (AWD – Analysis While Drilling)described above, drill rig operating parameters can be added into the same analysis filesynchronized with this analysis by depth. Such drill operating parameters include but arenot limited to drill rod penetration or torque generally referred as MWD (Measure WhileDrilling) data. The benefit to combine analysis and MWD data is to further characterizeore parameters such as rock hardness or grindability, which parameters are calculated byusing combined data from the AWD and MWD methods. In other words, a system andmethod for automatic analysing of material obtained from a drill hole are provided. Inparticular, the drill cuttings analysis can be automated such that there is no need of peopleworking in the proximity of a rotary blasthole drill while collecting samples from drillcuttings to be analysed in a laboratory.BRIEF DESCRIPTION OF THE DRAWINGS

[0014] FIGURE 1 illustrates a schematic view of a sample analyser in accordancewith at least some embodiments of the present invention,

[0015] FIGURE 2 illustrates a schematic view of another sample analyser inaccordance with at least some embodiments of the present invention,

[0016] FIGURE 3 illustrates a schematic view of a further sample analyser inaccordance with at least some embodiments of the present invention, and

[0017] FIGURE 4 illustrates a schematic view of a processing unit of a sampleanalyser in accordance with at least some embodiments of the present invention. EMBODIMENTS

[0018] In this document, the term sample analyser 1 refers to on-line analyticalequipment, which is able to automatically analyse samples of material collected from adrill hole while a rotary blasthole drill is drilling the hole and a drill bit is penetrating intothe ground / a rock. The sample analyser 1 comprises a sample carrier 3 and at least onesensor 8. The sample material is typically automatically transported to the sample carrier 3from the drill hole. An on-line analytical method is selected for each application and mayinclude one or more analytical methods. Examples of analytical methods are XRF,PGNAA (Prompt Gamma Neutron Activation Analysis), IR (infra-red), Ramanspectroscopy, Libs (Laser induced breakdown spectroscopy), LIF (Laser InducedFluorescence spectroscopy)) and similar methods used in analysis of physical samplescommon in the mining industry. The sample analyser 1 may be configured to receive acontinuous or step-wise flow of drill chips from the drill hole for analysis purposes. A timeinterval between the analysis of different samples from different drill bit depths may be, for example, in the range between 5 s and 15 s or longer. Information of an analysed sample may be associated with a drill bit depth, a position information and other drillingparameters (Measure While Drilling data) at centimeter accuracy. Obtained results atcentimeter accuracy can be used to calculate an average analysis result for 1 meter or forone foot or any other depth in the drill hole. The results can be used to obtain geological mine maps, for example 3D maps.

[0019] In FIGURE 1 a schematic view of a sample analyser in accordance with atleast some embodiments of the present invention is illustrated. The sample analyser 1comprises a rotatable sample carrier 3 in the form of a disc. The rotatable sample carrier 3is rotatable around an axis of rotation in an operating direction as indicated by arrow A.The rotatable sample carrier 3 is rotatable around a vertical or substantially vertical axis ofrotation. The term vertical axis of rotation means an axis which is parallel to a gravityvector or a normal to the Earth´s surface. The term substantially vertical axis means an axiswhich is substantially parallel to a gravity vector or a normal to the Earth´s surface

[0020] In the shown embodiment, the operating direction is in clockwise direction.Rotation typically takes place by driving the sample carrier 3 with a motor. The uppersurface 11 of the sample carrier 3 is typically planar and arranged in a horizontal plane.The sample carrier 3 is typically made of metal, a metal alloy or plastic material. A coatinglayer may be applied on the upper surface 11. The coating layer may be, for example,plastic or Teflon®.

[0021] The sample analyser 1 further comprises a stationary perimeter wall 4. Therotatable sample carrier 3 is arranged within the perimeter wall 4. The stationary perimeterwall 4 extends above the upper surface 11 to avoid sample material to fall from the samplecarrier 3 during its rotation. For example, the perimeter wall 4 may extend 1 cm – 5 cmabove the upper surface 11. The perimeter wall 4 is typically made of metal, a metal alloyor plastic material.

[0022] The sample analyser 1 furthermore comprises a feeding system 2. Thefeeding system 2 is arranged to feed sample material obtained from a drill hole onto therotatable sample carrier 3. The feeding system 1 may be a conveyor such as a screwconveyor or a belt conveyor, a slide or a device capable of loading sample material ontothe sample carrier 3 as shown in connection with FIGURE 2, for instance.

[0023] The sample analyser 1 yet further comprises a limiter 7. The limiter 7 isarranged in the operating direction after the feeding system 2. The limiter 7 may, forexample, extend from the perimeter wall 4 radially inwards. The limiter 7 may extend fromthe perimeter wall 4 towards the centre of the rotatable sample carrier 3, for instance. Thelimiter 7 is arranged above the rotatable sample carrier 3 and spaced apart from therotatable sample carrier 3 at a distance. The limiter 7 typically has a lower surface arrangedparallel to the upper surface 11 of the sample carrier 3. The limiter 7 may, for example,comprise a rod or a flat bar. The distance between the lower surface of the limiter 7 and theupper surface 11 of the sample carrier 3 may be 0.5 cm – 5 cm, for instance. According tocertain embodiments, the distance between the lower surface of the limiter 7 and the uppersurface 11 of the sample carrier 3 is adjustable. As a consequence, sample material fedonto the sample carrier 3 by the feeding system 2 can be distributed on the sample carrier 3in the form of a sample material layer having a specific thickness defined by the distancebetween the lower surface of the limiter 7 and the upper surface 11 of the sample carrier 3.In other words, the limiter 7 is capable of levelling the sample material layer 9. The limiter7 is typically made of metal, a metal alloy or plastic material.

[0024] The sample analyser 1 even further comprises at least one sensor 8 foranalysing the sample material layer 9. The at least one sensor 8 is typically arranged in theoperating direction after the limiter 7. The at least one sensor 8 may be an x-ray sensor, aninfra-red sensor, an optical sensor, a spectrometer, an image capturing sensor, a PGNAAsensor, a Raman sensor, a LIBS sensor, or a LIF sensor, for instance.

[0025] Additionally, the sample analyser 1 comprises a guide wall 6 arranged abovethe sample carrier 3. The guide wall 6 may, for example, extend from the perimeter wall 4radially inwards. Thus, a passage for the sample material layer 9 is formed between a partof the perimeter wall 4 and the guide wall 6 towards a first exit 5 formed by an opening inthe perimeter wall 4. The guide wall 6 may, for example, extend from the edge of theperimeter wall 4 provided by the opening towards the centre of the rotatable sample carrier3. As shown, the guide wall 6 may be curved, for instance. In other words, one purpose ofthe guide wall 6 is to guide the sample material layer 9 towards the first exit 5 afteranalysis of the sample material layer 9. Another purpose of the guide wall 6 is to scrapesample material of the sample material layer 9 from the upper surface 11 of the disc toprovide a clean or substantially clean upper surface 11 for subsequent sample materialanalysis. A distance between the upper surface 11 of the disc and a lower surface of theguide wall 6 is typically 1 mm or less. The guide wall 6 is typically made of metal, a metalalloy or plastic material.

[0026] According to certain embodiments, the limiter 7 may, for example, extendfrom the perimeter wall 4 to an end 10 of the guide wall 6.

[0027] According to certain embodiments, the sample analyser 1 further comprises alaser sensor capable of detecting presence of a sample material layer and / or measuring athickness of the material layer levelled by the limiter 7. The laser sensor is arranged in theoperating direction after the limiter 7 or after the sensor 8.

[0028] Additionally, the sample analyser 1 may comprise a processing unit 25 comprising aprocessor 26 as shown in FIGURE 4. The processor 26 may comprise, for example, a single- ormulti-core processor. A single-core processor comprises one processing core and a multi-core processor comprises more than one processing core. The processor 26 may furthercomprise more than one processor. A processing core may comprise, for example, a Cortex-A8 processing core manufactured by ARM Holdings or a Steamroller processingcore produced by Advanced Micro Devices Corporation. Processor 26 may comprise atleast one Qualcomm Snapdragon and / or Intel Atom processor. Processor 26 may be meansfor performing method steps in sample analyser 1. Processor 26 may be configured, at leastin part by computer instructions, to perform actions.

[0029] Further, the processing unit 25 may comprise at least one memory 27.Memory 27 may comprise random-access memory and / or permanent memory as shown inFIGURE 4. Memory 27 may comprise at least one RAM chip. Memory 27 may be at leastin part accessible to processor 26. Memory 27 may be at least in part comprised inprocessor 26. Memory 27 may be means for storing information. Memory 27 maycomprise computer instructions that processor 26 is configured to execute. When computerinstructions configured to cause processor 26 to perform certain actions stored in memory27, and sample analyser 1 overall is configured to run under the direction of processor 26using computer instructions from memory 27, processor 26 and / or its at least oneprocessing core may be considered to be configured to perform said certain actions.Memory 27 may be at least in part external to sample analyser 1 but accessible to sampleanalyser 1. Data received from the at least one sensor 8 of the sample analyser 1 may be,for example, stored in the memory 27.

[0030] The sample analyser 1 may further comprise at least one laser sensor 28capable of detecting presence of a sample material layer 9 and / or a thickness of a samplematerial layer 9 as shown in FIGURE 4. Based on the received signals, the at least onesensor 8 may be utilized for analysis of the sample material layer 9.

[0031] Furthermore, the processing unit 25 may comprise a transmitter 29 fortransmitting data as shown in FIGURE 3. The transmitter 29 may be configured to transmitinformation in accordance with at least one communication standard. The transmitter 29may comprise more than one transmitter. The transmitter 29 may be configured to operatein accordance with global system for mobile communication, GSM, wideband code division multiple access, WCDMA, 5G, long term evolution, LTE, IS-95, wireless local area network, WLAN, Ethernet and / or worldwide interoperability for microwave access,WiMAX, standards, for example. Data obtained from the at least one sensor 8 or thesample analyser 1 or analysis results may be, for example, transmitted to a node such as aserver, a cloud-based server, a tablet computer or a smartphone by means of the transmitter29. The node may be located directly on the rotary blasthole drill, elsewhere in the mine orexternal to the mine.

[0032] Additionally, the processing unit 25 may furthermore comprise a receiver 30 forreceiving data as shown in FIGURE 4. The receiver 30 may be configured to receiveinformation in accordance with at least one communication standard. The receiver 30 maycomprise more than one receiver. The receiver 30 may be configured to operate inaccordance with global system for mobile communication, GSM, wideband code division multiple access, WCDMA, 5G, long term evolution, LTE, IS-95, wireless local area network, WLAN, Ethernet and / or worldwide interoperability for microwave access,WiMAX, standards, for example. Data received by the receiver 30, for example computerprogram code, may be stored in the memory 27. The receiver 30 may be configured toreceive signals from an external positioning system, for example a GPS (GlobalPositioning System) satellite signal. Data obtained from the at least one sensor 8 or thesample analyser 1 or analysis results may be associated with positioning data receivedfrom the external positioning system.

[0033] Yet further, the processing unit 25 may comprise a user interface 31. Theuser interface 31 may be a touchscreen, a keyboard or a plurality of buttons, for instance.Functionalities of the sample analyser 1 may be controlled by a user utilizing the userinterface 31.

[0034] The processing unit 25 or parts thereof may be integrated into a rotaryblasthole drill operating computer in order to synchronize drill chips sampling and analysiswith the rotary blasthole drill operation. The sample analyser 1 may be mechanicallyintegrated with the rotary blasthole drill, by its electrical system, by hydraulics, bypressurized air system. The processing unit 25 may have programs stored in the memory27 for communication with the rotary blasthole drill operating computer in order to receiveMWD data, including but not limited to depth of the drill bit, torque of drilling, etc.

[0035] In FIGURE 2 a schematic view of another sample analyser 1 in accordancewith at least some embodiments of the present invention is illustrated. The sample analyser1 comprises the features shown and described in connection with FIGURE 1.

[0036] The feeding system 2 of the shown embodiment comprises a housing 12having a first compartment 15 and a second compartment 16. The second compartment 16is arranged below the first compartment 15. An inlet 32 for guiding sample material in theform of dry or substantially dry drill dust obtained from a drill hole into the firstcompartment 15 is further provided.

[0037] The feeding system 2 comprises a first movable door 17 arranged betweenthe first compartment 15 and the second compartment 16. The first movable door 17 maybe, for example, linearly movable in order to load the second compartment 16 with asample material charge.

[0038] Further, the feeding system 2 comprises a second movable door 18 arrangedat a lower end 13 of the second compartment 16 above the sample carrier 3. The secondmovable door 18 may be, for example, linearly movable in order to load the samplematerial present in the second compartment 16 onto the sample carrier 3. In other words, asecond exit 14 for loading the sample material present in the second compartment 16 ontothe sample carrier 3 is provided.

[0039] Additionally, the feeding system 2 may comprise a third movable door 19providing a third exit 20 for guiding sample material present in the second compartment 16out of the second compartment 16, thus bypassing the sample carrier 3. The third movabledoor 19 may be linearly movable or hinged to the housing 12 and rotatable around an axisof rotation.

[0040] In FIGURE 3 a schematic view of a further sample analyser in accordancewith at least some embodiments of the present invention is illustrated. The sample analyser1 comprises a rotatable sample carrier 3 in the form of a drum 21. The rotatable samplecarrier 3 is rotatable around an axis of rotation in an operating direction A. The rotatablesample carrier 3 is rotatable around a horizontal or substantially horizontal axis of rotation.The term horizontal axis of rotation means an axis which is perpendicular to a gravityvector or a normal to the Earth´s surface. The term substantially horizontal axis means anaxis which is substantially perpendicular to a gravity vector or a normal to the Earth´ssurface. According to certain embodiments, the drum 21 may comprise a plurality ofindentations distributed around the lateral surface 22 of the drum 21. Each of theindentations may be concave, for instance.

[0041] The sample analyser 1 further comprises a feeding system 2. The feedingsystem 2 is arranged to feed sample material onto a lateral surface 22 of the drum 21. Thefeeding system 1 may be a conveyor such as a screw conveyor or a belt conveyor, a slideor a device capable of loading sample material onto the sample carrier 3. The feedingsystem 2 is arranged to feed sample material onto an upper part of the drum 21.

[0042] Furthermore, the sample analyser 1 comprises at least one sensor 8 foranalysing a sample material layer 9 distributed on a part of the lateral surface 22 of thedrum 21. The at least one sensor 8 is arranged in the operating direction A after the feedingsystem 2. In other words, the at least one sensor 8 is arranged to analyse the samplematerial prior to falling from the drum 21 caused by rotation of the drum 21 and gravity.The at least one sensor 8 may be an x-ray sensor, an infra-red sensor, an optical sensor, aspectrometer, an image capturing sensor, a PGNAA sensor, a Raman sensor, a LIBSsensor, or a LIF sensor, for instance.

[0043] According to certain embodiments, the sample analyser 1 may furthercomprises a cleaning system 23 capable of cleaning the lateral surface 22 during operation,i.e. during rotation of the drum 21. The cleaning system 23 is arranged in the operatingdirection A after the at least one sensor 8. Cleaning of the lateral surface 22 by the cleaningsystem 23 typically takes place after the sample material has fallen from the lateral surface22 due to rotation of the drum and gravity. Typically, cleaning of the lateral surface 22takes place in the third or fourth quadrant of the drum 21 as shown in FIGURE 3. Thecleaning system 23 may comprise a unit utilizing pressurized air 24 to remove samplematerial which has accumulated on or sticks to the lateral surface 22. When air is blowntowards the lateral surface 22 from the outside of the drum 21, fast percussive actioncauses the lateral surface 22 to be emptied and cleaned. Instead or in addition, the cleaningsystem 23 may comprise a plurality of bristles and / or brushes mechanically connected withthe lateral surface 22 of the drum 21. Instead or in addition, the cleaning system 23 maycomprise at least one nozzle capable of ejecting water towards the lateral surface 22 of thedrum 21.

[0044] According to certain embodiments, the lateral surface 22 of the drum 21 maybe perforated or permeable to water and / or air and the cleaning system 23 may be arrangedwithin the drum 21. In such a case, the cleaning system 23 may be capable of ejectingwater and / or pressurized air through the lateral surface 22 in order to separate samplematerial from the lateral surface 22. When air is blown from inside the drum 21 towardsthe lateral surface 22, fast percussive action causes the lateral surface 22 to be emptied andcleaned.

[0045] According to certain embodiments, the lateral surface 22 is capable offiltering excess water. For example, the drum 21 may comprise a plurality of concaveindentations distributed around the lateral surface of the drum and a material of the lateralsurface 22 is flexible as well as permeable to water and air. As a consequence, excesswater can be filtered by the lateral surface 22. In such a case, the collected water can beguided out of the drum 21 via a piping system connected to the drum 21. Additionally,contaminations or material present in the filter formed by the lateral surface 22 can beback-washed or removed by ejecting water through the lateral surface 22.

[0046] Additionally, the sample analyser 1 may comprise a processing unit 25 comprising aprocessor 26 as shown in FIGURE 4. The processor 26 may comprise, for example, a single- ormulti-core processor. A single-core processor comprises one processing core and a multi-core processor comprises more than one processing core. The processor 26 may furthercomprise more than one processor. A processing core may comprise, for example, a Cortex-A8 processing core manufactured by ARM Holdings or a Steamroller processingcore produced by Advanced Micro Devices Corporation. Processor 26 may comprise atleast one Qualcomm Snapdragon and / or Intel Atom processor. Processor 26 may be meansfor performing method steps in sample analyser 1. Processor 26 may be configured, at leastin part by computer instructions, to perform actions.

[0047] Further, the processing unit 25 may comprise at least one memory 27.Memory 27 may comprise random-access memory and / or permanent memory as shown inFIGURE 4. Memory 27 may comprise at least one RAM chip. Memory 27 may be at leastin part accessible to processor 26. Memory 27 may be at least in part comprised inprocessor 26. Memory 27 may be means for storing information. Memory 27 maycomprise computer instructions that processor 26 is configured to execute. When computerinstructions configured to cause processor 26 to perform certain actions stored in memory27, and sample analyser 1 overall is configured to run under the direction of processor 26using computer instructions from memory 27, processor 26 and / or its at least oneprocessing core may be considered to be configured to perform said certain actions.Memory 27 may be at least in part external to sample analyser 1 but accessible to sampleanalyser 1. Data received from the at least one sensor 8 of the sample analyser 1 may be,for example, stored in the memory 27.

[0048] The sample analyser 1 may further comprise at least one laser sensor 28capable of detecting presence of a sample material layer 9 and / or a thickness of a samplematerial layer 9 as shown in FIGURE 4. Based on the received signals, the at least onesensor 8 may be utilized for analysis of the sample material layer 9.

[0049] Furthermore, the processing unit 25 may comprise a transmitter 29 fortransmitting data as shown in FIGURE 4. The transmitter 29 may be configured to transmitinformation in accordance with at least one communication standard. The transmitter 29may comprise more than one transmitter. The transmitter 29 may be configured to operatein accordance with global system for mobile communication, GSM, wideband code division multiple access, WCDMA, 5G, long term evolution, LTE, IS-95, wireless local area network, WLAN, Ethernet and / or worldwide interoperability for microwave access,WiMAX, standards, for example. Data obtained from the at least one sensor 8 or thesample analyser 1 or analysis results may be, for example, transmitted to a node such as aserver, a cloud-based server, a tablet computer or a smartphone by means of the transmitter29. The node may be located directly on the rotary blasthole drill, elsewhere in the mine orexternal to the mine.

[0050] Additionally, the processing unit 25 may furthermore comprise a receiver 30 forreceiving data as shown in FIGURE 4. The receiver 30 may be configured to receiveinformation in accordance with at least one communication standard. The receiver 30 maycomprise more than one receiver. The receiver 30 may be configured to operate inaccordance with global system for mobile communication, GSM, wideband code division multiple access, WCDMA, 5G, long term evolution, LTE, IS-95, wireless local area network, WLAN, Ethernet and / or worldwide interoperability for microwave access,WiMAX, standards, for example. Data received by the receiver 30, for example computerprogram code, may be stored in the memory 27. The receiver 30 may be configured toreceive signals from an external positioning system, for example a GPS (GlobalPositioning System) satellite signal. Data obtained from the at least one sensor 8 or thesample analyser 1 or analysis results may be associated with positioning data receivedfrom the external positioning system.

[0051] Yet further, the processing unit 25 may comprise a user interface 31 as shownin FIGURE 4. The user interface 31 may be a touchscreen, a keyboard or a plurality ofbuttons, for instance. Functionalities of the sample analyser 1 may be controlled by a userutilizing the user interface 31.

[0052] The processing unit 25 or parts thereof may be integrated into a rotaryblasthole drill operating computer in order to synchronize drill chips sampling and analysiswith the rotary blasthole drill operation. The sample analyser 1 may be mechanicallyintegrated with the rotary blasthole drill, by its electrical system, by hydraulics, bypressurized air system. The processing unit 25 may have programs stored in the memory27 for communication with the rotary blasthole drill operating computer in order to receiveMWD data, including but not limited to depth of the drill bit, torque of drilling, etc.

[0053] It is to be understood that the embodiments of the invention disclosed are notlimited to the particular structures, process steps, or materials disclosed herein, but are extended to equivalents thereof as would be recognized by those ordinarily skilled in the relevant arts. It should also be understood that terminology employed herein is used for the purpose of describing particular embodiments only and is not intended to be limiting.

[0054] Reference throughout this specification to one embodiment or anembodiment means that a particular feature, structure, or characteristic described inconnection with the embodiment is included in at least one embodiment of the present invention. Thus, appearances of the phrases “in one embodiment” or “in an embodiment”in various places throughout this specification are not necessarily all referring to the sameembodiment. Where reference is made to a numerical value using a term such as, forexample, about or substantially, the exact numerical value is also disclosed.

[0055] As used herein, a plurality of items, structural elements, compositionalelements, and / or materials may be presented in a common list for convenience. However,these lists should be construed as though each member of the list is individually identifiedas a separate and unique member. Thus, no individual member of such list should beconstrued as a de facto equivalent of any other member of the same list solely based on their presentation in a common group without indications to the contrary. In addition, various embodiments and example of the present invention may be referred to herein along with alternatives for the various components thereof. It is understood that such embodiments, examples, and alternatives are not to be construed as de facto equivalents ofone another, but are to be considered as separate and autonomous representations of the present invention.

[0056] Furthermore, the described features, structures, or characteristics may becombined in any suitable manner in one or more embodiments. In the description,numerous specific details are provided, such as examples of lengths, widths, shapes, etc.,to provide a thorough understanding of embodiments of the invention. One skilled in the relevant art will recognize, however, that the invention can be practiced without one ormore of the specific details, or with other methods, components, materials, etc. In otherinstances, well-known structures, materials, or operations are not shown or described in detail to avoid obscuring aspects of the invention.

[0057] While the forgoing examples are illustrative of the principles of the presentinvention in one or more particular applications, it will be apparent to those of ordinary skill in the art that numerous modifications in form, usage and details of implementationcan be made without the exercise of inventive faculty, and without departing from theprinciples and concepts of the invention. Accordingly, it is not intended that the invention be limited, except as by the claims set forth below.

[0058] The verbs “to comprise” and “to include” are used in this document as openlimitations that neither exclude nor require the existence of also un-recited features. Thefeatures recited in depending claims are mutually freely combinable unless otherwiseexplicitly stated. Furthermore, it is to be understood that the use of "a" or "an", that is, asingular form, throughout this document does not exclude a plurality. INDUSTRIAL APPLICABILITY

[0059] At least some embodiments of the present invention find industrialapplication in material analysis. In particular, at least some embodiments of the presentinvention find industrial application in the mining industry in on-line analysis of materialobtained from a drill hole.REFERENCE SIGNS LIST1 sample analyser2 feeding system3 sample carrier4 perimeter wall5 first exit6 guide wall7 limiter8 sensor9 sample material layer10 end of guide wall11 upper surface12 housing13 lower end of housing14 second exit15 first compartment16 second compartment17 first movable door18 second movable door19 third movable door20 third exit21 drum22 lateral surface23 cleaning system24 pressurized air25 processing unit26 processor27 memory28 laser sensor29 transmitter30 receiver31 user interface32 inletA operating directionM motor

Claims

CLAIMS:

1. A sample analyser (1) comprising: ^a rotatable sample carrier (3) in the form of a disc, wherein the rotatable samplecarrier (3) is rotatable around an axis of rotation in an operating direction (A),^ a stationary perimeter wall (4), wherein the rotatable sample carrier (3) is arrangedwithin the perimeter wall (4), ^a feeding system (2), wherein the feeding system (2) is arranged to feed samplematerial onto the rotatable sample carrier (3), ^a limiter (7), wherein the limiter is arranged above the rotatable sample carrier (3)and spaced apart from the rotatable sample carrier (3) at a distance, ^at least one sensor (8) for analysing a sample material layer (9), and^ a guide wall (6) arranged above the sample carrier (3) and extending from theperimeter wall (4) radially inwards, thus forming a passage for the sample materiallayer (9) between a part of the perimeter wall (4) and the guide wall (6) towards a first exit (5) formed by an opening in the perimeter wall (4).

2. The sample analyser (1) according to claim 1, wherein the guide wall (6) extends fromthe edge of the perimeter wall (4) towards the centre of the rotatable sample carrier (3).

3. The sample analyser (1) according to claim 1 or 2, wherein the guide wall (6) is curved.

4. The sample analyser (1) according to any one of claims 1 – 3, wherein the limiter (7)extends from the perimeter wall (4) towards the centre of the rotatable sample carrier (3).

5. The sample analyser (1) according to any one of claims 1 – 4, wherein the limiter (7)extends from the perimeter wall (4) to an end (10) of the guide wall (6).

6. The sample analyser (1) according to any one of claims 1 – 5, wherein the limiter (7) isarranged parallel to and spaced apart from the rotatable sample carrier (3) at a distance inthe range between 1 cm to 5 cm.

7. The sample analyser (1) according to any one of claims 1 – 6, wherein the limiter (7) isarranged in the operating direction (A) after the feeding system (2).

8. The sample analyser (1) according to any one of claims 1 – 7, wherein the limiter (7) iscapable of levelling the sample material layer (9).

9. The sample analyser (1) according to any one of claims 1 – 8, wherein the at least onesensor (8) is an x-ray sensor, an infra-red sensor, an optical sensor, a spectrometer, animage capturing sensor, a PGNAA sensor, a Raman sensor, a LIBS sensor, or a LIF sensor.

10. The sample analyser (1) according to any one of claims 1 – 9, wherein the at least onesensor (8) is arranged in the operating direction (A) after the limiter (7).

11. The sample analyser (1) according to any one of claims 1 – 10, wherein the sampleanalyser (1) further comprises a laser sensor capable of detecting presence of a samplematerial layer (9) and / or measuring a thickness of the sample material layer (9) levelled bythe limiter (7).

12. The sample analyser (1) according to claim 11, wherein the laser sensor is arranged inthe operating direction (A) after the limiter (7) or after the at least one sensor (8).

13. The sample analyser (1) according to any one of claims 1 – 12, wherein the feedingsystem (2) comprises:o a housing (12) comprising a first compartment (15) and a secondcompartment (16) arranged below the first compartment (15),o an inlet (32) for guiding sample material into the first compartment (15),o a first movable door (17) arranged between the first compartment (15) andthe second compartment (16), ando a second movable door (18) arranged at a lower end (13) of the secondcompartment (16), thus providing a second exit (14) for loading samplematerial present in the second compartment (16) onto the sample carrier (3).

14. The sample analyser (1) according to claim 13, wherein the feeding system (2)comprises a third movable door (19) providing a third exit (20) for guiding sample materialpresent in the second compartment (16) out of the second compartment (16), thusbypassing the sample carrier (3).

15. The sample analyser (1) according to claim 13 or 14, wherein the first movable door(17) is linearly movable.

16. The sample analyser (1) according to any one of claims 13 – 15, wherein the secondmovable door (18) is linearly movable.

17. The sample analyser (1) according to any one of claims 13 – 16, wherein the thirdmovable door (19) is linearly movable or hinged to the housing (12) and rotatable aroundan axis of rotation.

18. A method of operating a sample analyser (1), the method comprising:^ rotating a rotatable sample carrier (3) in the form of a disc around an axis ofrotation in an operating direction, wherein the rotatable sample carrier (3) isarranged within a stationary perimeter wall (4),^ feeding sample material onto the rotatable sample carrier (3),^ arranging a limiter (7) above the rotatable sample carrier (3), wherein the limiter (7)is spaced apart from the rotatable sample carrier (3) at a distance,^ analysing a sample material layer (9) by at least one sensor (8), and^ providing a guide wall (6) arranged above the sample carrier (3) and extendingfrom the perimeter wall (4) radially inwards, thus forming a passage for the samplematerial layer (9) between a part of the perimeter wall (4) and the guide wall (6) towards a first exit (5) formed by an opening in the perimeter wall (4).

19. The method according to claim 18, the method comprising adjusting the distancebetween the limiter (7) and the sample carrier (3).

20. The method according to claim 18 or 19, the method comprising analysing the samplematerial layer (9) by an x-ray sensor, an infra-red sensor, an optical sensor, a spectrometer,an image capturing sensor, a PGNAA sensor, a Raman sensor, a LIBS sensor, or a LIFsensor.

21. The method according to any one of claims 18 – 20, the method comprising detectingpresence of a sample material layer and / or measuring a thickness of the sample materiallayer levelled by the limiter (7) by a laser sensor.

22. A sample analyser (1) comprising:^ a rotatable sample carrier (3) in the form of a drum (21), wherein the rotatablesample carrier (3) is rotatable around an axis of rotation in an operating direction (A), ^a feeding system (2), wherein the feeding system (2) is arranged to feed samplematerial onto a lateral surface (22) of the drum (21),^ at least one sensor (8) for analysing a sample material layer (9) distributed on a partof the lateral surface (22) of the drum (21).

23. The sample analyser (1) according to claim 22, wherein the at least one sensor (8) isarranged in the operating direction (A) after the feeding system (2).

24. The sample analyser (1) according to claim 22 or 23, wherein the drum (21) comprisesa plurality of indentations distributed around the lateral surface (22) of the drum (21).

25. The sample analyser (1) according to claim 24, wherein each of the indentations isconcave.

26. The sample analyser (1) according to any one of claims 23 – 25, wherein the sampleanalyser (1) further comprises a cleaning system (23) capable of cleaning the lateralsurface (22) during operation.

27. The sample analyser (1) according to claim 26, wherein the cleaning system (23) isarranged in the operating direction (A) after the at least one sensor (8).

28. The sample analyser (1) according to claim 26 or 27, wherein the cleaning system (23)comprises a unit utilizing pressurized air (24).

29. The sample analyser (1) according to any one of claims 26 – 28, wherein the cleaningsystem (23) comprises a plurality of bristles and / or brushes mechanically connected withthe lateral surface (22) of the drum (21).

30. The sample analyser (1) according to any one of claims 26 – 29, wherein the cleaningsystem (23) comprises at least one nozzle capable of ejecting water towards the lateralsurface (22) of the drum (21).

31. The sample analyser (1) according to any one of claims 22 – 30, wherein the at leastone sensor is an x-ray sensor, an infra-red sensor, an optical sensor, a spectrometer, animage capturing sensor, a PGNAA sensor, a Raman sensor, a LIBS sensor, or a LIF sensor.

32. The sample analyser (1) according to any one of claims 22 – 31, wherein the sampleanalyser (1) further comprises a laser sensor capable of detecting presence of a samplematerial layer (9) and / or measuring a thickness of the sample material layer (9).

33. The sample analyser (1) according to any one of claims 22 – 32, wherein at least a partof the lateral surface (22) is made of a flexible material.

34. The sample analyser (1) according to any one of claims 22 – 33, wherein at least a partof the lateral surface (22) is made of fabric or plastic.

35. The sample analyser (1) according to any one of claims 22 – 34, wherein a material ofthe lateral surface is permeable to air and / or water.

36. The sample analyser (1) according to any one of claims 22 – 34, wherein the lateralsurface (22) is permeable to water and serves as a water filter.

37. The sample analyser (1) according to claim 36, wherein the sample analyser (1)comprises a piping system connected to the drum (21) and capable of guiding water out ofthe drum (21).

38. The sample analyser (1) according to claim 28, wherein the unit is arranged within thedrum (21) or outside the drum (21).

39. The sample analyser (1) according to claim 30, wherein the at least one nozzle isarranged within the drum (21) or outside the drum (21).