Test device and arrangement with this

AT525517B1Active Publication Date: 2026-10-15RAINER GAGGL DIPL ING DR

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Patent Information

Application Number: AT2021050817
Authority / Receiving Office: AT · AT
Patent Type: Patents
Current Assignee / Owner
Filing Date: 2021-10-13
Publication Date: 2026-10-15
Estimated Expiration: 2041-10-13

Application Information

Patent Timeline

13 Oct 2021

Application

AT2021050817

15 Oct 2026

Publication

AT525517B1

IPC: G01R31/26

CPC: G01R31/2601; G01R31/2831; G01R31/2886; G01R1/0433

Inventors: Rainer GAGGL Dipl.Ing. Dr.; Sebastian SALBRECHTER Dr.

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Abstract

A test device (1) for individual chips (4) with a test head (17) equipped with (test) needles (3) has contacts (10) arranged next to the test head (17). An arrangement for testing individual chips (4) comprises a test device (1) and a holder (5) for the chip (4) on which the contacts (10) rest.

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