Method and system for indirectly measuring the probability of a defect occurring in a test object

Abstract

The invention relates to a computer-implemented method (100) for indirectly measuring the probability of a defect occurring in a test specimen of a type of technical equipment, preferably batteries (2) or vehicles (3), comprising the following steps: a) measuring state data in a plurality of technical equipment of the type, wherein the state data include whether the defect has occurred; b) measuring (101) operating data of the plurality of technical equipment of the type and of the test specimen, wherein the operating data include value profiles of time-resolved measurement parameters and characterize an operating behavior and environment of a respective technical equipment from field operation, wherein the operating data of those technical equipment in which the defect has occurred are marked as defective according to the result of the measurement in step a);c) Generating (102) features by processing at least a part 15 of the operating data by means of mathematical operations and / or by selecting data ranges from the operating data; d) Selecting (103) features relevant to the defect from the generated features by means of a chain of feature selection methods; e) Training a probabilistic classification algorithm using the selected relevant features and the respective associated state 20 data, generating a classifier (1); and f) Generating (203) output data, comprising a probability for the occurrence of the defect in the device under test, by applying the classifier (1) to input data based on the operating data of the device under test.