Goniometer with a positioning support and method of use
The goniometer addresses sample positioning challenges by using a controller for continuous corrections and a support stage with multiple positioning portions, enhancing accuracy and reducing wear and power connection issues, ensuring reliable operation.
Patent Information
- Authority / Receiving Office
- AU · AU
- Patent Type
- Applications
- Current Assignee / Owner
- HAUPTMAN WOODWARD MEDICAL RESEARCH INSTITUTE INC
- Filing Date
- 2024-11-22
- Publication Date
- 2026-07-09
AI Technical Summary
Current goniometers face challenges with sample positioning accuracy due to gravitational forces and wear of positioning stages, especially when using high-energy X-ray sources, leading to increased complexity and cost, and power delivery issues during component movement.
A goniometer design with a sample positioner and measuring portion support that includes a controller for continuous positional corrections, a slip ring device to prevent torque on power connections, and a support stage with multiple positioning portions to maintain sample centering during rotation, using electromagnets and inductive couplers to stabilize the sample.
Enhances sample positioning accuracy to within micrometers, reduces wear and complexity, and prevents power connection damage, thereby improving operational reliability and reducing downtime.
Smart Images
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Abstract
Description
CROSS-REFERENCE TO RELATED APPLICATION
[0001] This application claims the benefit and priority of U.S. Provisional Patent Application No. 63 / 602,048, filed on November 22, 2023, which is incorporated by reference as if disclosed herein in its entirety. TECHNOLOGICAL FIELD
[0002] This invention relates generally to the field of goniometers and specifically is directed to a goniometer with improved sample alignment capabilities including being configured for continuous adjustment of the measuring portion of the goniometer during a measuring process to maintain proper sample position relative to the measuring portion. BACKGROUND
[0003] Goniometers are instruments used to rotate samples in a radiation beam, such as an X-ray beamline or a synchrotron beamline, and collect diffraction data for sample analysis. In the field of X-ray crystallography, goniometers are used to position a crystal sample, and rotate the sample to measure angles between faces of the crystal sample. The goniometer includes a rotation device used to rotate a sample about a rotational axis Z and an XY or positioning stage positioned on the face of the rotation device that moves the sample along X and Y axes, respectively. In some goniometers, the Z axis is oriented along the vertical axis to enable gravitational forces to aid in positioning of the sample. However, for experiments using very high energy X-ray sources that generate polarized radiation, it is beneficial that the Z axis of the goniometer be oriented horizontally. Such a configuration results in the gravitational forces pulling on the positioning stage of the goniometer, which can affect the position of the sample as the sample is being rotated. This leads to difficulty in accurately positioning the sample to within a few micrometers. In some instances, an air bearing counterbalancing device is used to control the movement of the positioning stage, which enables centering of the sample prior to rotation of the sample about the Z axis. However, the components of the positioning stages currently used quickly degrade or wear, which decreases performance and increases the risk of non-compliance. The amount of wear is a function of the number of uses. In other words, goniometers experiencing high sample throughput may require replacement of the positioning stage after a short period of time, in some instances after only a few years of use. Moreover, adjustment of the positioning stage using the air bearing counterbalancing device increases the complexity of the goniometer as well as the overall cost of operation and repair.
[0004] Furthermore, power delivery to components of the goniometer may be challenging when powered components move with regard to each other and the connections delivering power form the power source. Torque imparted on these connections can wear them out in a short period of time, which can lead to downtime and expensive repairs and / or replacement.
[0005] These are just some of the problems associated with currently used goniometers. SUMMARY Aspects of the present disclosure are directed to embodiments of a goniometer that includes a measuring portion, a sample holder configured to hold a sample to be measured by the measuring portion, and a sample positioner coupled to the sample holder and configured to position the sample relative to the measuring portion, the sample positioner comprising a rotational positioner connected to the sample holder and configured to rotate the sample form a first position to an nth position. The goniometer further includes a measuring portion support structured to support the measuring portion. In some embodiments, the measuring portion support includes a first positioning portion configured to position the measuring portion along a first plane, and a second positioning portion configured to position the measuring portion along a second plane that intersects the first plane at a non-normal angle. In some embodiments, the goniometer includes a controller in communication with the sample positioner and the measuring portion support. The controller receives positional information from the sample positioner as the sample is rotated from the first position to the nth position and determines a plurality of positional corrections for at least the first positioning portion based on the received positional information. At least the first positioning portion is continuously moved along the first plane in response to the plurality of positional corrections provided by the controller in order to keep the sample centered during the measurement process as the sample is rotated by the sample positioner.
[0006] In some embodiments of the goniometer, the sample holder further comprises at least one of: (i) a magnet; and (ii) a mechanical retainer. In some embodiments, the goniometer includes one or more connections configured to couple one or more components of the goniometer to a power source, and a slip ring device configured to prevent torque forces from being imparted onto the one or more connections due to rotation of the sample positioner. In some embodiments, the slip ring device includes a stationary portion and a moving portion structured to rotate relative to the stationary portion. Tn some embodiments, the one or more connections include a stationary connection coupled to the stationary portion of the slip ring device. In some embodiments, the one or more connections include a moving connection coupled to the moving portion of the slip ring device and configured to rotate relative to the stationary connection. In some embodiments of the goniometer the second plane is a horizontal plane. Some embodiments of the goniometer further include a third positioning portion configured to position the measuring portion along a third plane that is parallel to the second plane. In some embodiments, the goniometer further includes a radiation detector configured to detect radiation reflecting from the sample. In some embodiments of the goniometer, the sample holder further includes an electromagnet that is configured to generate electromagnetic forces to inhibit movement of the sample relative to the sample holder. In some embodiments, the goniometer includes an inductive coupler that is configured to inhibit imparting a torque force on the electrical connections delivering power to the sample holder. In some embodiments, the sample holder is configured to position the sample away from the measuring portion. In some embodiments, the sample holder is configured to position the sample away from the measuring portion to inhibit the measuring portion from casting a radiation shadow on a radiation detector.
[0007] Aspects of the present disclosure are directed to embodiments of a sample measuring system including a goniometer that includes a measuring portion, a sample holder configured to hold a sample to be measured by the measuring portion, and a sample positioner coupled to the sample holder and configured to position the sample relative to the measuring portion, the sample positioner comprising a rotational positioner connected to the sample holder. The goniometer further includes a measuring portion support structured to support the measuring portion. In some embodiments, the measuring portion support includes a first positioning portion configured to position the measuring portion along a first plane, and a second positioning portion configured to position the measuring portion along a second plane that intersects the first plane at a non-normal angle. In some embodiments, the goniometer includes a controller in communication with the sample positioner and the measuring portion support. The controller receives positional information from the sample positioner as the sample is rotated from the first position to the nth position and determines a plurality of positional corrections for at least the first positioning portion based on the received positional information. At least the first positioning portion is continuously moved along the first plane in response to the plurality of positional corrections provided by the controller in order to keep the sample centered during the measurement process as the sample is rotated by the sample positioner. In some embodiments, the system further includes a radiation detector configured to detect radiation reflected from the sample.
[0008] In some embodiments, the sample measuring system further includes a radiation source configured to emit radiation onto the sample. In some embodiments of the sample measuring system, the sample holder is configured to position the sample away from the measuring portion to inhibit the measuring portion from casting a radiation shadow on the radiation detector. In some embodiments of the sample measuring system, the sample holder further comprises at least one of: (i) a magnet; and (ii) a mechanical retainer. In some embodiments the sample measuring system, the sample holder comprises an inductive coupler configured to inhibit the movement of the sample relative to the sample holder as the sample holder is rotated by the rotational positioner and without rotation of electrical connections powering the inductive coupler.
[0009] In some embodiments of the sample measuring system, the sample holder further includes an electromagnet that is configured to generate electromagnetic forces to inhibit movement of the sample relative to the sample holder. In some embodiments, the goniometer includes an inductive coupler. In some embodiments, the inductive coupler is configured to inhibit a torque force being imparted on the electrical connections powering the sample holder resulting from rotation of the sample positioner. In some embodiments, of the sample measuring system, the sample holder is configured to position the sample away from the measuring portion.
[0010] Aspects of the present disclosure are directed to embodiments of a support stage for a measuring portion of a goniometer. In some embodiments, the support stage includes a first positioning portion configured to move the measuring portion along a first plane, a second positioning portion configured to move the measuring portion along a second plane, and a third positioning portion configured to move the measuring portion along a third plane. In some embodiments, the second plane and the third plane are parallel to each other, and the first plane intersects the second plane and the third plane at a non-normal angle.
[0011] In some embodiments of the support stage, the second plane is a horizontal plane. In some embodiments of the support stage, at least the first portion is configured to continuously move along the first plane during a measurement process in response to control signals provided by a controller.
[0012] Aspects of the present disclosure are directed to embodiments of a method of measuring a sample using a goniometer with a support stage including securing a sample in a sample holder of the goniometer, moving the positioning support to center the sample for a first measurement in a measurement process, and rotating the sample positioner at a predetermined frequency of rotation to rotate the sample from a first measuring position to an nth measuring position. In some embodiments, the method further includes determining a positional correction for the positioning support by the controller for each of the first measuring position to the nth measuring position and transmitting each positional correction to the positioning support as the sample is rotated. In some embodiments, the method further includes continuously repositioning the positioning support in response to the received positional corrections to keep the sample centered during the measurement process.
[0013] In some embodiments of the method, the continuously repositioning of the positioning support occurs along a first plane and a second plane that intersects the first plane at a non-normal angle. In some embodiments, the method further includes securing the sample in the sample holder using an electromagnet. BRIEF DESCRIPTION OF THE DRAWINGS
[0014] A more particular description of the invention briefly summarized above may be had by reference to the embodiments, some of which are illustrated in the accompanying drawings. It is to be noted, however, that the appended drawings illustrate only typical embodiments of this invention and are therefore not to be considered limiting of its scope, for the invention may admit to other equally effective embodiments. Thus, for further understanding of the nature and objects of the invention, references can be made to the following detailed description, read in connection with the drawings.
[0015] FIG. 1 schematically illustrates a side perspective view of an embodiment of a goniometer with a n embodiment of a support stage according to the disclosure.
[0016] FIG. 2A schematically illustrates a longitudinal sectional view of an embodiment of the goniometer and support stage according to aspects of the disclosure.
[0017] FIG. 2B schematically illustrates a longitudinal sectional view of an embodiment of the goniometer and support stage with an embodiment of a slip ring device according to aspects of the invention.
[0018] FIG. 2C schematically illustrates a side view of an embodiment of the goniometer and support stage with a n embodiment of a slip ring device according to aspects of the invention.
[0019] FIG. 3 schematically illustrates an embodiment of a system for measuring a sample, where the system includes an embodiment of the goniometer and support stage according to aspects of the disclosure.
[0020] FIG. 4 schematically illustrates a close-up top view of the embodiment of FIG. 3, according to aspects of the disclosure.
[0021] FIG. 5 schematically illustrates a close-up bottom view of the embodiment of FIG. 3, according to aspects of the disclosure.
[0022] FIG. 6 schematically illustrates an embodiment of a controller according to aspects of the disclosure.
[0023] FIG. 7 illustrates a flow chart of an embodiment of a method for measuring a sample according to aspects of the disclosure. DETAILED DESCRIPTION
[0024] The following discussion relates to various embodiments of a goniometer. It will be understood that the herein described versions are examples that embody certain inventive concepts as detailed herein. To that end, other variations and modifications will be readily apparent to those of sufficient skill. In addition, certain terms are used throughout this discussion in order to provide a suitable frame of reference with regard to the accompanying drawings. These terms such as “upper”, “lower”, “forward”, “rearward”, “interior”, “exterior”, “front”, “back”, “top”, “bottom”, “inner”, “outer”, “first”, “second”, and the like are not intended to limit these concepts, except where so specifically indicated. The terms “about” or “approximately” as used herein may refer to a range of 80%-125% of the claimed or disclosed value. With regard to the drawings, their purpose is to depict salient features of embodiments of the goniometer and are not specifically provided to scale.
[0025] Referring to FIGS. 1 and 2A, an embodiment of a goniometer 100 is shown according to aspects of the disclosure. In some embodiments, the goniometer 100 includes a measuring portion 120 or measuring device, a sample holder 130 configured to hold a sample 135, a sample positioner 140 coupled to the sample holder 130 and a measuring portion support 150, support stage or positioning support structured to support the measuring portion 120. In some embodiments, the measuring portion support 150 may be a separate component from the goniometer 100. In some embodiments, the sample positioner 140 includes a rotating device 142 or a rotating stage that is driven to rotate the sample about a rotational axis RA. In some embodiments, the measuring portion support 150 includes a first positioning support portion or a first positioning portion 160 configured to position the measuring portion 120 along a first plane Pl and a second positioning support portion or a second positioning portion 170 configured to position the measuring portion 120 along a second plane P2 that intersects the first plane Pl. In some embodiments, the second plane P2 is a horizontal plane. In some embodiments, the first plane Pl is different than the second plane P2 and intersects the second plane P2 at a non-normal angle or an angle that is not 90°. In some embodiments, the first plane Pl and the second plane P2 intersect at an angle that is less than 90°. In some embodiments, the measuring portion support 150 includes a third positioning support portion or a third positioning portion 180 configured to position the measuring portion 120 along a third plane P3. In some embodiments, the third plane P3 is different from the first plane Pl and the second plane P2. In some embodiments, the third plane P3 is parallel to the second plane P2. In some embodiments, the third plane P3 is a horizontal plane. In some embodiments, the first positioning portion 160, the second positioning portion 170, and the third positioning portion 180 each include two or more components that are displaced relative to each other to initiate the movement along the first, second, and third planes Pl, P2, P3, respectively.
[0026] In some embodiments, the sample holder 130 is positioned away from the measuring device 120. In some embodiments, the sample positioner 140 is located between the sample holder 130 and the measuring device 120. The sample holder 130 may include any known structures / devices that may be used to hold samples / sample fixtures for measurement by the goniometer including, but not limited to, magnets, which include permanent magnets and electromagnets, and mechanical holders, such as mechanical grippers or mechanical retainers, or any combination thereof. In some embodiments, the structures / devices that may be used to hold samples / sample fixtures require connection to a power supply or a power source. In some embodiments, the sample holder 130 includes an electromagnet electrically coupled to a power supply or power source 190 and that is configured to generate electromagnetic forces to inhibit movement of the sample 135 relative to the sample holder 130. In some embodiments, the sample holder 130 includes a mechanical retainer electrically coupled to a power supply or power source 190 and that is configured to exert a force on the sample 135 to hold the sample 135 in a desired position. In some embodiments, the goniometer 100 includes an inductive coupler 134, such as shown in the embodiment of FIG. 2A, which is configured to facilitate the delivery of power to the sample holder 130. For example, power would be required to operate an electromagnet and / or may be required to operate mechanical holders. In some embodiments, the inductive coupler 134 includes at least two portions 134a, 134b separated by an induction interface 134c. In some embodiments the first portion 134a is configured to be positioned toward the end 131 of the sample holder 130 that holds the sample 135, and the second portion 134b is connected to one or more connections 136 that couple to a power source 190. In some embodiments, the induction interface 134c comprises a gap between the first portion 134a and the second portion 134b. In some embodiments, the inductive coupler 134 is configured to inhibit a torque force being imparted on the connections 136 that couple to the power source 190 due to movement of the sample positioner 140. This further prevents damage to the connections 136 as well as reducing wear of said connections 136. The power source 190 may be any known source of energy that is capable of providing a power input to one or more components of the goniometer 100 to enable operation of the one or more components.
[0027] In some embodiments, the goniometer includes a slip ring device 144 as shown in FIGS. 2B and 2C, which also facilitates in delivering power to the sample holder 130 and may be used as an alternative to the inductive coupler 134. In an embodiment, the slip ring device 144 is coupled to a rotary stage 146 (surrounded by box) that is separate from the rotating device 142 of the sample positioner 140. The second stage 146 is configured to track the motion of the rotating device 142 at all times after power on. As shown in the embodiment of FIG. 2B, the slip ring device 144 includes a stationary portion 144a, which is coupled to connection or cable 136a and keeps connection 136a remain stationary so that it may couple to a power source / controller 190 / 230. The slip ring device 144 further includes a moving portion 144b that rotates relative to the stationary portion 144a and is coupled to connection or cable 136b. The moving portion 144b rotates to coincide with rotation of the rotating device 142, which leads to rotation of the connection 136b. The slip ring device 144 enables a transfer of energy, for example an electrical current, between the stationary connection 136a and the rotating connection 136b without physical contact between the stationary connection 136a and the rotating connection 136b. In this manner no torque forces are imparted on the connections 136a, 136b, which could lead to damage to the connections 136a, 136b. Moreover, there are no wear components and no error sources that can degrade rotational performance over time, which further decreases future downtime. In some embodiments, at least a portion of the rotating connection 136b is suspended between the rotating device 142 and the moving portion 144b of the slip ring device 144. The only connection between the rotating device 142 and the rotary stage 146 axis are the connections 136a, 136b suspended in air between the rotating device 142 and the rotary stage 146.
[0028] In some embodiments, the slip ring device 144 may be at least partially surrounded by a housing 145. In some embodiments, to install the slip ring device 144, the slip ring device 144 may be coupled to the rotating connection 136b and inserted into an interior space 105 of the goniometer 100. In some embodiments, the slip ring device 144 may be secured within the interior space 105 using one or more fasteners 147.
[0029] In some embodiments, the goniometer is part of a system 200 as shown in FIGS. 3-5, that includes a radiation source 210, such as an X-ray beam that emits radiation 212 onto the sample 135, and a radiation detector 220 configured to detect radiation 214 being reflected from the sample 135. In some embodiments of the system 200, the radiation detector 220 is configured to detect radiation 214 reflected from the sample 135, and the sample holder 130 is structured to position the sample 135 away from the measuring portion 120 to inhibit the measuring portion 120 from casting a radiation shadow on the radiation detector 220. Casting a radiation shadow on the radiation detector 220 may detrimentally affect the accuracy of the radiation detector 220. The distance of the radiation detector 220 from the sample 135 depends on the type of experiment being conducted. Referring to FIGS. 4 and 5, the location of the measuring portion support 150 enables the sample holder 130 to be positioned close to the radiation detector 220 without the radiation detector 220 colliding with the measuring portion 120. In some embodiments, the sample 135 is positioned about 25 mm from the radiation detector 220. In some embodiments, the sample is positioned less than 25 mm from the radiation detector 220. In some embodiments, the sample 135 is positioned at least 25 mm from the radiation detector 220. In some embodiments, the system 200 further includes a controller 230 in communication with one or more components of the goniometer 100 and configured to control movement of the sample positioner 140 and movement of the measuring portion support 150. In some embodiments, the controller 230 is in electrical communication with the one or more components of the goniometer 100. As schematically shown in FIG. 6, the controller 230 may include one or more processing units 232, one or more memory units and / or recording units 234, input-output (I / O) circuitry 236, and a user interface (UI) 238. As shown in FIG. 7, the components of the controller 230 may be in communication with each other and able to transmit and receive information between them. The one or more processing units 232 may be configured to perform operations of the controller 230 and, in particular, operations of controlling a sample measurement process including controlling movement of the sample positioner 140 and the measuring portion support 150 to position the sample 135 for measurement by the measuring portion 120. The one or more memory units 234 may be configured to store information related to operations of the controller 230 including, but not limited to, measurement programs and sample measurement values The I / O circuitry may be configured to couple the controller 230 to other computing devices, printing devices (not shown) and / or to a network (not shown). The user interface 238 is configured to provide a user access to the controller 230 and, may thus include user input devices (e g., keyboard, mouse, keypad, touch sensitive display, etc.) and / or user output devices (e.g., display, monitor, screen, etc.).
[0030] Aspects of operating embodiments of the goniometer in conjunction with embodiments of the disclosed positioning stage 150 will now be described with reference to FIGS. 1-7. The method of operation 300 begins at operation 302 when the sample 135 is positioned or mounted on the sample holder 130. In some embodiments, the sample 135 is mounted at a tip of the sample holder 130. At operation 304, the controller transmits command signals to the positioning support 150. In some embodiments, the command signals include signals directed to a movement of the first, second and third positioning support portion 160, 170, 180 to center or otherwise properly position the sample 135 for the first measurement in a sample measurement process. At operation 306, the controller transmits control signals to begin rotating the sample positioner 140 at a predetermined frequency of rotation from a first measuring position to an nth measuring position. The rotation of the sample positioner 140 results in rotation of the sample holder 130 and, therefore rotation of the sample 135.
[0031] When the sample 135 is mounted to the sample holder 130, the sample 135 is not aligned with the horizontal axis and instead will be angularly positioned relative to the horizontal axis. This means that the center of the sample 135 will move or precess as the sample 135 is rotated during the measurement process. Accordingly, the positioning support 150 must continuously be repositioned to center the sample 135 so that the orientation of its axis of rotation RA does not precess when the sample 135 is rotated. At operation 308, as the sample 135 is rotated from a first measuring position to the nth measuring position, a positional correction is determined for at least the first positioning support portion 160 by the controller for each measuring position and transmitted as command signals to the first positioning portion 160 as the sample 135 is rotated. At operation 310, at least the first positioning support portion 160 is continuously repositioned along the first plane Pl in response to the received command signals as the sample 135 is rotated from the first measuring position to the nth measuring position. The continuous repositioning of at least the first positioning support portion 160 along the first plane Pl acts to keep the sample 135 centered during the measurement process. The measuring process may then end at operation 312 after measurement at the nth measuring position.
[0032] The disclosed positioning support 150 is not positioned on the sample holder 130 or the rotating device 142, but instead is structured to support the measuring portion 120 and move the entire measuring portion 120 to center the sample 135. In some embodiments, the configuration of the positioning support 150 drastically reduces wear of positioning support 150 components, as well as decreases the overall complexity of the goniometer 100. In some embodiments, the wear of positioning support 150 components may be eliminated. Many of the goniometers currently used are oriented such that the RA axis is vertical so that the gravitational force can assist in positioning of the sample. However, for experiments using very high energy X-ray sources that generate polarized radiation, it is beneficial that the RA axis be oriented horizontally. In these settings, the gravitational force pulls on the positioning stage, which can affect the position of the sample as the sample is being positioned within a few micrometers during sample rotation. Advantageously, the location of the positioning stage 150 in the disclosed goniometer 100 enables the RA axis to be horizontally oriented without experiencing the same effects of the gravitational force. This means that the position of the sample 135 is maintained to within a micrometer or less as the sample 135 is rotated.
[0033] While the present invention has been particularly shown and described with reference to certain exemplary embodiments, it will be understood by one skilled in the art that various changes in detail may be effected therein without departing from the spirit and scope of the invention that can be supported by the written description and drawings. Further, where exemplary embodiments are described with reference to a certain number of elements, it will be understood that the exemplary embodiments can be practiced utilizing either less than or more than the certain number of elements.
Claims
1. A goniometer comprising:a measuring portion;a sample holder configured to hold a sample to be measured by the measuring portion;a sample positioner coupled to the sample holder and configured to rotate the sample relative to the measuring portion from a first position to an nth position during a measuring process;a measuring portion support structured to support the measuring portion and comprising,a first positioning portion configured to position the measuring portion along a firstplane, anda second positioning portion configured to position the measuring portion along asecond plane that intersects the first plane at a non-normal angle; anda controller in communication with the sample positioner and the measuring portion support,wherein the controller receives positional information from the sample positioner as the sample is rotated from the first position to the nth position and determines a plurality of positional corrections for at least the first positioning portion based on the received positional information,wherein at least the first positioning portion continuously moves along the first plane in response to the plurality of positional corrections provided by the controller in order to keep the sample centered during the measurement process as the sample is rotated by the sample positioner.
2. The goniometer of claim 1, wherein the sample holder further comprises at least one of: (i) a magnet; and (ii) a mechanical retainer.
3. The goniometer of claim 1, wherein the second plane is a horizontal plane.
4. The goniometer of claim 1, further comprising a third positioning portion configured toposition the measuring portion along a third plane that is parallel to the second plane.
5. The goniometer of claim 1, wherein the sample holder further comprises an electromagnet that is configured to generate electromagnetic forces to inhibit movement of the sample relative to the sample holder.
6. The goniometer of claim 1, further comprising:one or more connections configured to couple one or more components of the goniometer to a power source; andan inductive coupler configured to prevent torque forces from being imparted onto the one or more connections due to a rotation of the sample positioner.
7. The goniometer of claim 1, further comprising:one or more connections configured to couple one or more components of the goniometer to a power source; anda slip ring device configured to prevent torque forces from being imparted onto the one or more connections due to a rotation of the sample positioner.
8. The goniometer of claim 7, wherein the slip ring device includes a stationary portion and a moving portion structured to rotate relative to the stationary portion, wherein the one or more connections include a stationary connection coupled to the stationary portion of the slip ring device and a moving connection coupled to the moving portion of the slip ring device and configured to rotate relative to the stationary connection.
9. A sample measuring system comprising:the goniometer of claim 1; anda radiation detector configured to detect radiation reflected from the sample.
10. The sample measuring system of claim 9, further comprising a radiation source configured to emit radiation onto the sample.
11. The sample measuring system of claim 9, wherein the sample holder is configured to position the sample away from the measuring portion to inhibit the measuring portion from casting a radiation shadow on the radiation detector.
12. The sample measuring system of claim 9, wherein the sample holder further comprises at least one of (i) a magnet; and (ii) a mechanical retainer.
13. The sample measuring system of claim 9, further comprising:one or more connections configured to couple one or more components of the goniometer to a power source; andan inductive coupler configured to prevent torque forces from being imparted onto the one or more connections due to a rotation of the sample positioner.
14. The sample measuring system of claim 9, further comprising:one or more connections configured to couple one or more components of the goniometer to a power source; anda slip ring device configured to prevent torque forces from being imparted onto the one or more connections due to a rotation of the sample positioner.
15. A support stage for a measuring portion of a goniometer, comprising:a first positioning portion configured to move the measuring portion along a first plane;a second positioning portion configured to move the measuring portion along a second plane; anda third positioning portion configured to move the measuring portion along a third plane,wherein the second plane and the third plane are parallel to each other,wherein the first plane intersects the second plane and the third plane at a non-normal angle.
16. The support stage of claim 15, wherein the second plane is a horizontal plane.
17. The support stage of claim 15, wherein at least the first positioning portion is configured to continuously move along the second plane during a measurement process in response to control signals provided by a controller.
18. A method of measuring a sample using a goniometer, the method comprising:securing a sample in a sample holder of the goniometer;moving a positioning support to center the sample for a first measurement in a measurement process;rotating a sample positioner at a predetermined frequency of rotation to rotate the sample from a first measuring position to an nth measuring position;determining, via a controller, a positional correction for the positioning support for each of the first measuring position to the nth measuring position; andtransmitting each positional correction to the positioning support as the sample is rotated;continuously repositioning the positioning support in response to the received positional corrections, wherein the continuous repositioning keeps the sample centered during the measurement process.
19. The method of claim 18, wherein the continuously repositioning of the positioning support occurs along a first plane and a second plane that intersects the first plane at a non-normal angle.
20. The method of claim 18, further comprising securing the sample in the sample holder using an electromagnet.