Systems and methods for predicting manufacturing process risks

Abstract

The present disclosure provides system, methods, and computer program products for predicting and detecting anomalies in a subsystem of a system. An example method may comprise (a) determining a first plurality of tags that are indicative of an operational performance of the subsystem. The tags can be obtained from (i) a plurality of sensors in the subsystem and (ii) a plurality of sensors in the system that are not in the subsystem. The method may further comprise (b) processing measured values of the first plurality of tags using an autoencoder trained on historical values of the first plurality of tags to generate estimated values of the first plurality of tags; (c) determining whether a difference between the measured values and estimated values meets a threshold; and (d) transmitting an alert that indicates that the subsystem is predicted to experience an anomaly if the difference meets the threshold. threshold. 20 26 21 07 30 29 J ul 2 02 6 A B S T R A C T O F T H E D I S C L O S U R E 2 0 2 6 2 1 0 7 3 0 2 9 J u l 2 0 2 6

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