DEVICE FOR PROTECTION AGAINST EXCEEDING THE SAFE OPERATING AREA
Patent Information
- Application Number
- BE2025005024
- Authority / Receiving Office
- BE · BE
- Patent Type
- Patents
- Current Assignee / Owner
- Filing Date
- 2025-01-13
- Publication Date
- 2026-08-24
- Estimated Expiration
- 2045-01-13
Abstract
Description
BE2025 / 5024 2 ofsuchadrivercircuitwouldbeexpandedandoptimizedcomparedtoconventionalcircuitsof similararea. Theproblemforwhichthepresentinventionoffersasolution,isillustratedbytheFigures1a-1b, whichshowrespectivelyacircuitschematicpriorartdrivercircuitandtheevolutionwithtimeof5 thevoltageonthedifferentnodesinsaidpriorartdrivercircuit.Moreprecisely,thedrivercircuitof Figure1aisoneofthesmallestimplementationsofastackeddriverarchitecture,whereintwo switchingdevicesS1andS2areconnectedinseriessothatthevoltageisdistributedoverthetwo switchingdevices.InthespecificimplementationofFigure1a,theswitchingdevicestaketheform ofanNMOStransistor,whereinthefirsttransistorS1iscoupledbetweenarailterminaldenotedby10 RAIL,andanodedenotedbyMID,whereasthesecondtransistorS2iscoupledbetweenthenode MIDandanoutputterminaldenotedbyPAD.ThegateofthefirsttransistorS1iscoupledtoan inputterminalTX,whereasthegateofthesecondtransistoriscoupledtoaprotectionterminalPROT whichdeliversafixedDC-voltagetosaidgate.InthesimpleimplementationofFigure1a,thetwo transistorsS1andS2haveidenticalmaximumtoleratedvoltagevaluesVmax.Therailterminaliskept15 at0V,andfixedDC-voltagevaluedeliveredtothegateofthesecondtransistorS2bytheprotection terminalPROTischosenequalorclosetoVmax. Figure1bshowstheevolutionovertimeofthevoltagesVpad(thevoltageontheoutputterminal PAD)andVmid(thevoltageonthenodeMID),whenattimet=0bothtransistorsS1andS2areina switchedoffstateandtheoutputterminaliskeptatavoltageofabouttwicethevalueVmax,whereas20 atapointintimet1bothtransistorsareactivated.SaidactivationcausesboththevoltagesVpadand Vmidtodropto0V,yetsaidvoltagedropproceedsmuchmorerapidlyforVmidthanforVpadsince theloadcapacitanceconnectedtotheoutputterminalPADistypicallymanytimeslargerthanthe capacitanceconnectedtothenodeMID.Indeed,theformermaycompriseexternalcapacitances whereasthelatteronlyconsistofon-chipcapacitances.Asaresult,thevoltageoverthesecond25 transistorS2,whichyieldsthedifferencebetweenVpadandVmid,increasesfromavalueclosetoVmax attimet1toamaximalvalueexceedingVmaxatthepointintimewhenVmidreaches0V.TheSOA conditionsarethusexceededsincethesecondtransistorS2experiencesavoltagebeyondits maximumtoleratedvoltagevalue,therebycreatingasevereriskofdamageordegradationtosaid secondtransistor.30 AnaïvewaytobypassthisproblemwouldbetoincreasethecapacitiveloadofthenodeMIDto approximatelymatchthecapacitiveloadoftheoutputterminal,forexamplebycouplingthenode MIDtoanexternalcapacitiveelement.Assuch,itsdischargeprocesswouldproceedslower,ideally atthesamepaceasthedischargeoftheoutputterminal.Inthatcase,thelower-lyingofthetwo35 voltagegraphsinFigure1bwouldbealteredtobecomelesssteep,ideallyparalleltothehigher-lying 2025 / 5024 BE2025 / 5024 3 voltagegraph,andthevoltageoverthesecondtransistorS2,definedastheverticaldistancebetween thetwographs,wouldatanypointintimeremainbelowthemaximumvalueVmax.However,such anexternalcapacitiveelementrepresentsanundesirableoff-chipconnectiontotheMIDnode,and correspondswithanundesirablyincreasedsurfacearea,notablysincetheoutputterminaltypically correspondswithaverylargecapacitance.Moreover,theloadcapacitanceoftheoutputterminal5 mightvarysignificantlywithtime,makingitimpossibleforthedrivertosuitablycontrolsaid capacitanceandthusrenderingthisnaïvesolutioninfeasible.Finally,drivercircuitswhichallowfor arapiddischargearegenerallypreferableoverslowlydischargingcircuitslikethenaïvelyproposed circuitwithanadditionalexternalcapacitiveelement. 10 Analternativesolutiontothisproblem,knownfromthepriorart,hasbeendescribede.g.inB. Serneelsetal,“AHigh-VoltageOutputDriverinaStandard2.5V0.25µmCMOSTechnology”, 2004IEEEInternationalSolid-StateCircuitsConference,SanFransico,2004(DOI: 10.1109 / ISSCC.2004.1332636).Herein,Figure7.8.2showsacircuitschematicofadrivercircuit withthreeNMOStransistorsconnectedinseries.ComparedtothecircuitofFigure1a,notonlya15 thirdNMOStransistor,butalsoelaborateadditionalcircuitrycoupledtosaidthirdtransistorwas added.Saidadditionalcircuitryisneededforthethirdtransistor,whichcannolongerbebiasedby aDCvoltage,tosensethevoltageontheoutputterminal.However,suchadditionalcircuitrycomes attheexpenseofnotonlyaddingsurfacearea,butalsonegativelyimpactingtheimpedanceofthe outputterminalandreducingthemaximumachievableswitchingspeedofthedrivercircuit.20 SUMMARY TheobjectofembodimentsoftheinventionistoprovideadrivercircuitwithincreasedSafe OperationArea(SOA)comparedtoconventionalcircuitsofsimilararea,whilstreducingtheabove-25 describeddisadvantagesofexistingtechnologies. Accordingtoafirstaspect,adrivercircuitisprovided,comprisingarailterminal,aninputterminal, anoutputterminal,afirstswitchingdevicewithacontrolportcoupledtotheinputterminal,asecond switchingdeviceconfiguredtowithstandafirstmaximumvoltage,andathirdswitchingdevice30 configuredtowithstandasecondmaximumvoltage.Herein,therailterminalmayforexamplebea groundterminal,apowerterminal,aVSSterminaloraVDDterminal.Thefirstswitchingdeviceis coupledbetweentherailterminalandafirstnode,thesecondswitchingdeviceiscoupledbetween thefirstnodeandasecondnode,andthethirdswitchingdeviceiscoupledbetweenthesecondnode andtheoutputterminal.Thedrivercircuitfurthercomprisesabypasscircuitwhichiscoupled35 betweentheoutputterminalandthesecondnodeinparallelwiththethirdswitchingdevice,and 2025 / 5024 BE2025 / 5024 4 whichisconfiguredtolimitboththevoltageoverthesecondswitchingdeviceandthevoltageover thethirdswitchingdevice,inparticularsothatthevoltageoverthesecondswitchingdevicedoes notexceedthefirstmaximumvoltageandthevoltageoverthethirdswitchingdevicedoesnotexceed thesecondmaximumvoltage,duringactivationofthefirstswitchingdevice. 5 SuchadrivercircuithasincreasedSafeOperationArea(SOA)comparedtoconventionalcircuitsof similararea,inthesensethatthecircuitisconfiguredtoswitchvoltagelevelswhichexceedthe maximumtoleratedvoltagevaluesoftheindividualcomponentdevices,whilstguaranteeingthat noneofthesecomponentdevicesexceedsitsmaximumtoleratedvoltage.Herein,bymaximum toleratedvoltageofadeviceitismeantthemaximalvaluethevoltageoverthedevicemayattain10 withoutriskofdamageordegradationofthedeviceand / oroftheotherdevicesoftheintegrated circuit,and / orwithoutriskofunreliabledevicefunctionality.Saidfirstmaximumvoltageandsecond maximumvoltagethusrefertothemaximumtoleratedvoltageofthesecondandthirdswitching devicerespectively. SaidincreaseoftheSOAisachievedinthefollowingway.Sincethethreeswitchingdevicesare15 mutuallycoupledinthedescribeddrivercircuit,theyareoperatedtogether,inthesensethatwhen thefirstswitchingdeviceswitchesonandthusstartstoconduct,thisforcesthesecondswitching device,andeventuallyalsothirdswitchingdevice,tosubsequentlyswitchonaswell.Asaresult,a decenton-stateisachievedwhereinallswitchingdevicesareclosed,whereaswhenthefirst switchingdeviceswitchesoff,acurrentcannolongerflowfromthesecondorthirdswitchingdevice20 sothatallswitchingdevicesaredeactivatedandanoff-stateisattained.However,duringactivation ofthefirstswitchingdevice,whenthedrivercircuitswitchesfromtheoff-statetotheon-state,the switchingdeviceclosesttotheoutputterminal,i.e.thethirdswitchingdevice,riskstoexperiencea voltagethatexceedsitsmaximumtoleratedvoltagevalueduetothefactthattheoutputterminal dischargesmuchmoreslowlythanthefirstnodeduetoitshigherloadcapacitance.SuchaSOA25 overshootispreventedbythebypasscircuit.Indeed,thisbypasscircuitiscoupledbetweentheoutput terminalandthesecondnodeinparallelwiththethirdswitchingdevice,andthusprovidesaparallel currentpathforthedischargecurrentfromtheoutputterminaltoflowtothesecondnode.Compared toconventionaldrivercircuitswiththreeswitchingdeviceswhichlacksuchabypasscircuit,this thushastheadvantagethatsaiddischargecurrentisnolongerforcedsolelythroughthethird30 switchingdevice,butmayalso,orevenprimarily,runthroughthebypasscircuit.Thisprovidesfor amoreevendistributionofsaiddischargecurrent,andthusofthecorrespondingvoltagedrop, betweenthesecondandthirdswitchingdevice.Herein,thebypasscircuitistunedsuchthatthe voltagedropoverthethirdswitchingdeviceontheonehandisnotsohighthatthethirdswitching deviceexceedsitsmaximumtoleratedvoltagevalue(thesecondmaximumvoltage)andthusitsSOA35 boundaries,butontheotherhandisalsosufficientlyhighforthevoltagedropoverthesecond 2025 / 5024 BE2025 / 5024 5 switchingdevicenottoexceedthefirstmaximumvoltage.Asaresult,noneoftheswitchingdevices exceedsitsSOAboundariesduringthetransitionfromoff-statetoon-state,andthussafeoperation isguaranteed,evenwhenthevoltagebetweentheoutputterminalandtherailterminalduringthe off-statepriortosaidtransitionexceededtheindividualmaximumtoleratedvoltagevalues.Inother words,thebypasscircuithastheeffectofenablingtoincreasetherobustnessonthedrivercircuit5 withouttherebyriskingdamageordegradationoftheconstituentcircuitdevicesand / or malfunctioningofthedrivercircuit. Assuch,thedescribeddrivercircuitsaccommodatesfortheneed,asreferredtoabove,fordriver circuitsconfiguredtoswitchvoltagelevelswhichexceedthemaximumtoleratedvoltagevaluesof theindividualconstituentdeviceswithoutovershootingitsSafeOperationArea.Manypotential10 applicationsarise.Forexample,suchadrivercircuitallowstoreconcileoutdatedprotocolsinvolving highvoltagerangeswithnewertechnologiesthatindividuallydonotsupportsuchvoltageranges. Furthermore,physicalconstraintssuchasminimumvoltagesrequiredforlight-emittingdiodesmight necessitateexceedingatechnology'smaximumtoleratedvoltage.Evenincaseswherealternative deviceswithsufficientvoltagetoleranceitexist,itmaybebeneficialtosticktodeviceswithlower15 voltagetolerance,duetoapplicationrequirementsorfunctionaladvantagesofthelowervoltage tolerantdevices.Forinstance,despitetheirlowervoltagetolerance,coretransistorsmaybe preferableoverthickgatetransistors,sincetheyperformbetterconcerningspeedandradiation hardness.Similarly,employinglower-voltageratedtransistorsmaybeastrategyforavoidingthe additionalmasksandincreasedcostsassociatedwithhighervoltagedevices,likedoublediffusion20 MOS(DMOS)transistors.Thecommondenominatorbetweenthesedifferentpotentialapplications istheadditionalflexibilitygainedbyenablingtheimplementationofdrivercircuitswhereinhigh voltagesareexpectedtoarise,withtransistorsorotherdevicesconfiguredforoperationonlyatlower voltages. Theproposeddrivercircuitsavoidorreducethedisadvantagesassociatedwiththepriorartsolutions25 mentionedabove,namelytheundesirablyslowdischargeandhighsurfaceareaassociatedwith couplingthefirstnodetoanexternalcapacitance,andthedetrimentalimpactonswitchingspeed, outputterminalimpedanceandrequiredsurfaceareaassociatedwithcouplingthethirdswitching devicetoadditionalcircuitryconfiguredfortrackingtheoutputterminalvoltage.Inparticular,the describeddrivercircuitmaybeimplementedwithasmallnumberofconstituentdevices,andthus30 withlowsurfacearea(siliconarea).Moreover,duringtheoff-statethedrivercircuitisreducedtoa simplestackedarchitectureofthefirstandsecondswitchingdevices,liketheoneofthepriorart circuitofFigure1a,andthushasthesamefunctionaladvantagesassuchasimplestack.Indeed, whenallswitchingdevicesareswitchedoff,thebypasscircuitprovidesanimpedanceparalleltothe thirdswitchingdevice,whichislowerthantheimpedanceofanopenswitch,sothatthesecondnode35 2025 / 5024 BE2025 / 5024 6 isnormallychargeduptothesamevoltagevalueastheoutputterminal,whilenocurrentcanrun throughtheopenthirdswitchingdevice. Inapreferredembodiment,thedrivercircuitfurthercomprisesaprotectionterminal,whereinthe secondswitchingdevicehasacontrolportwhichiscoupledtotheprotectionterminalandthethird5 switchingdevicehasacontrolportwhichiscoupledtotheprotectionterminal. WhensuchaprotectionterminaliscoupledtoafixedDCvoltagesource,saidprotectionterminal mayservetomaintainboththecontrolportofthesecondswitchingdeviceandthecontrolportof thethirdswitchingdeviceatafixedDCvoltage.Thishastheadvantagethatnoadditionalbiasing10 circuitryisneededtokeepthecontrolportvoltageofthethirdswitchingdeviceconstant,inthesense thatoneandthesameterminalmaybeusedtocontrolboththecontrolportofthesecondswitching deviceandthecontrolportofthethirdswitchingdevice. Inapreferredembodiment,thebypasscircuitisconfiguredtoconductacurrentwhenthevoltage15 oversaidbypasscircuitexceedsathresholdvoltage. Indeed,atthebeginningofthetransitionfromoff-statetoon-state,whenthefirstandsecond switchingdeviceshavejustswitchedon,suchabypasscircuitoffersapathwayforthehighdischarge currentscorrespondingwiththedischargeoftheloadcapacitanceoftheoutputterminal,toflow20 towardsthesecondnode.Herein,saidthresholdvoltageispreferablytunedtoavaluebelowthe initialoutputterminalvoltage,i.e.belowthevalueofthevoltagebetweentheoutputterminaland therailterminalduringoff-state.Thisensuresthatduringthedropofthevoltageontheoutput terminaloversaidthresholdvoltage,saiddischargecurrentmayrunfromtheoutputterminaltothe secondnodethroughthebypasscircuit,orthroughboththebypasscircuitandthethirdswitching25 device.Theextenttowhichthisdischargecurrentisdividedoverthebypasscircuitandthethird switchingdevicethendependsontheirrelativeconductivities. Inembodimentswhereinthebypasscircuithasathresholdvoltage,thebypasscircuitispreferably configuredtohaveafirstconductivitywhichishigherthantheconductivityofthethirdswitching30 device,whenthevoltageoverthebypasscircuitishigherthanthethresholdvoltage,andtohavea secondconductivitywhichislowerthanthefirstconductivity,whenthevoltageoverthebypass circuitislowerthanthethresholdvoltage. Forexample,thebypasscircuitmaybeconfiguredhavealowimpedanceandalowresistancewhen thevoltageoverthebypasscircuitishigherthanthethresholdvoltage,andtohaveahighimpedance35 andahighresistancewhenthevoltageoverthebypasscircuitislowerthanthethresholdvoltage. 2025 / 5024 BE2025 / 5024 7 Forexample,thebypasscircuitmaybeavoltagetriggeredortransienttriggeredelectrostatic discharge(ESD)clamp,suchasasiliconcontrolledrectifier(SCR)ESDclamp. Assuch,thedischargeofthesecondnodemaybesubdividedintoarapidfirstphaseandaslow secondphase.Indeed,atthebeginningofthetransitionfromoff-statetoon-state,whenthefirstand5 secondswitchingdeviceshavejustswitchedon,ahighdischargecurrentisforcedtopassthrough boththebypasscircuitandthethirdswitchingdevice,resultinginadropofthevoltageontheoutput terminalfromahighinitialvaluethatexceedsthethresholdvoltage,ultimatelytowardsthevoltage oftherailterminalwhichiskeptat0V.Duringthefirstphasewhereintheoutputterminalvoltage decreasesfromsaidinitialvaluetowardsthedifferencebetweensaidinitialvalueandthethreshold10 voltage,thebypasscircuitinsuchanembodimentwillhaveafirstconductivity,i.e.ahigher conductivitythanthethirdswitchingdevice,orequivalentlyaloweradmittancethanthethird switchingdevice.Consequently,saiddischargecurrentisrapidlyconductedthroughthebypass circuit,whileonlyasmallfractionofsaidcurrentpassesthroughthethirdswitchingdevice.Once theoutputterminalvoltageislowenoughforthebypasscircuitvoltagetoreachthevalueofits15 thresholdvoltage,asecondphaseisinitiatedwhereinthebypasscircuithasasecondconductivity whichislowerthanthefirstconductivity,forexampleasecondconductivitywhichislowerthanthe conductivityofthethirdswitchingdevice.Thismeansthattheremainingdischargecurrentwill conducttoasmallerextentthroughthebypasscircuit,andwillforexamplemainlyconductthrough thethirdswitchingdevice,withonlyasmallfractionofsaidcurrentpassingthroughthebypass20 circuit,sothatsaidsecondconductingphasewillbeslowerthantherapidfirstphase.Eventually, theoutputterminalvoltagewillstagnateat0Vwhenitsloadcapacitancehascompletelydischarged. Inanadvantageousembodiment,eachofthefirstswitchingdevice,thesecondswitchingdeviceand thethirdswitchingdevicecomprisesatransistor,preferablyaMOStransistor,andeachcontrolport25 isformedbythegateorbaseofthetransistor. Indeed,transistorsmayserveasswitchingdevicesinadrivercircuit,inthattheymaybetriggered toswitchon,andthusattainanactivatedstate,whenasufficientvoltagesurgeisdeliveredtotheir gateorbase,andtoswitchoff,andthusattainadeactivatedstate,whenthereceivedgateorbase30 voltageceasestosuffice.Notethatifaprotectionterminalasdescribedispresentinsuchan embodiment,whichprotectionterminaliscoupledtoafixedDCvoltagesource,thisallowsto maintainthegateorbasevoltagesofboththesecondandthirdswitchingdeviceatafixedDC voltage. 35 2025 / 5024 BE2025 / 5024 8 Inanexemplaryembodiment,eachofthefirstswitchingdevice,thesecondswitchingdeviceand thethirdswitchingdeviceisaMOStransistor,andtheoutputterminaliscoupledtothedrainofthe thirdswitchingdevice,thesecondnodeiscoupledbetweenthesourceofthethirdswitchingdevice andthedrainofthesecondswitchingdevice,thefirstnodeiscoupledbetweenthesourceofthe secondswitchingdeviceandthedrainofthefirstswitchingdevice,thesourceofthefirstswitching5 deviceiscoupledtotherailterminal,andthebypasscircuitiscoupledbetweenthedrainofthethird switchingdeviceandthesecondnode. Suchamutualcouplingofthedifferentdevicesallowsforasimpleimplementationwithfew constituentsandlowsurfacearea.Inparticular,thethreeswitchingdevicesmaysimplybeconnected10 inseries,resultinginastackeddriverarchitecturewhereinduringthetransitionfromoff-statetoon- state,thevoltageisdividedoverthethreetransistorsthatserveasswitchingdevices.Still,as explainedaboveinreferencetothepriorartcircuitofFigure1a,aconventionalstackeddrive architecturewhichlacksthedescribedbypasscircuitfailstomaintaineachtransistorinitsSOA conditionswhentheinitialvoltagebetweentheoutputterminalandtherailterminal,priortosaid15 transition,exceedsthemaximumtoleratedvoltagesoftheindividualtransistors.However,instacked driverarchitecturesprovidedwithasuitablytunedbypasscircuit,theSOAboundariesofthesecond andthirdswitchingdevicesarenotexceededduringsaidtransition,evenwhentheinitialvoltage dropbetweentheoutputterminalandthefirstnodeexceededthefirstandsecondmaximumvoltage, sincesaidvoltagedropisthensuitablydistributedoverthesecondandthirdswitchingdevice.20 Preferably,thebypasscircuitcomprisesatleastonediode. Indeed,adiodeisaprimeexampleofadevicewithathresholdvoltage,inthesensethatits exponentialcurrent-voltagecharacteristichastheeffectthatforvoltagesexceedingitsthreshold25 voltage,thediode’sresistanceisnegligible,whereasforvoltagesbelowsaidthresholdvoltage,the diode’sresistanceisvirtuallyinfinite.Asaresult,diodesconductveryfastabovetheirthreshold voltage,andalmostdonotconductbelowtheirthresholdvoltage.Whenthebypasscircuitthus comprisesatleastonediode,thetransitionfromoff-statetoon-stateproceedsasfollows. Thetransitionfromoff-statetoon-stateisinitiatedwhentheinputterminalswitchesonthefirst30 switchingdevice,causingthevoltageonthefirstnodetodrop.Consequently,thesecondswitching deviceisalsoswitchedon,therebygivingrisetoavoltagedroponthesecondnodeandcausingthe diodetostartconducting.Duringthisfirstphaseofthetransition,thefirstandsecondswitching devicearethusclosedwhilethethirdswitchingdeviceremainsopen,andthedischargecurrent associatedwiththedischargeoftheloadcapacitanceoftheoutputterminalrunssolelythroughthe35 bypasscircuit,whereinthediodeconductssaidcurrentveryrapidly,anddoesnotrunatallthrough 2025 / 5024 BE2025 / 5024 9 thethirdswitchingdevice.Assuch,theoutputterminalvoltagedecreasesrapidlyfromitsinitial valuetoavaluelowenoughforthediodecircuitvoltagetoreachitsthresholdvoltage.Oncesaid voltagereachesthediodethresholdvoltage,thediodesubstantiallyceasestoconduct,therebygiving risetoasecondphasewhereintheremainingdischargecurrentissubstantiallyforcedthroughthe thirdswitchingdevice,whichisthustriggeredtoswitchon.Inthissecondphase,thecircuitno5 longerbenefitsfromthehighdiodeconductivityabovethresholdvoltage,sothatthedischarge proceedsmuchmoreslowlyduringsaidsecondphase. Itshouldbenotedthatthebypasscircuitmayalsoconsistofastringorstackofdiodes,inwhich casetheroleofthethresholdvoltageofthebypasscircuitisplayedbythesumofthethreshold voltagesofthedifferentdiodes.10 Inafirstpreferredembodimentwhereinthebypasscircuitcomprisesatleastonediode,thethird switchingdeviceisanNMOStransistor,andadiodeoftheatleastonediodehasananodewhichis coupledtotheoutputterminal,andhasacathodewhichiscoupledtothesecondnode. Inanalternative,secondpreferredembodimentwhereinthebypasscircuitcomprisesatleastone15 diode,thethirdswitchingdeviceisaPMOStransistor,andadiodeoftheatleastonediodehasan anodewhichiscoupledtothesecondnode,andhasacathodewhichiscoupledtotheoutputterminal. Whenadiodeiscoupledtothesecondnodeandtotheoutputterminalinthisway,itisforward biasedduringthetransitionfromoff-statetoon-stateandthusallowstoconductacurrentfromthe20 outputterminaltothesecondnode(whenthebypassedthirdswitchingdeviceisanNMOStransistor) respectivelyfromthesecondnodetotheoutputterminal(whenthebypassedthirdswitchingdevice isaPMOStransistorandthecurrentdirectionisthusreversed),therebycontributingtothedischarge oftheloadcapacitanceoftheoutputterminal. 25 Inanexemplaryembodimentwhereinthebypasscircuitcomprisesatleastonediode,thedriver circuitcomprisesanelectrostaticdischarge(ESD)clampcoupledbetweentheoutputterminaland therailterminal,andadiodeoftheatleastonediodefunctionsalsoasadiode,forexampleaholding diode,oftheelectrostaticdischargeclamp. 30 SuchembodimentsarebeneficialforapplicationswhereinanESDclampbetweentheoutput terminalandtherailterminalisrequired,irrespectiveofthepurposeofincreasingtheSafeOperation Area.Indeed,forsuchapplications,thepresentedembodimenthastheadvantagethatnoadditional diodeisneededfortheimplementationofthebypasscircuit:onemaysimplyre-useadiodeofthe ESDclamp,forexampletheholdingdiodeoftheESDclamp,as(partof)thebypasscircuit.This35 2025 / 5024 BE2025 / 5024 10 hastheadvantagethatnoadditionalsurfacearea(siliconarea)isconsumedfortheimplementation ofthebypasscircuit. Inanexemplaryembodiment,thebypasscircuitcomprisesaresistiveelement.Forexample,the bypasscircuitmayconsistofaresistiveelement,ormaycomprisebotharesistiveelementanda5 diode.Indeed,aresistiveelementmayhelptoachievethesamepurposeasadiodewhencoupled betweentheoutputterminalandthesecondnodeinparallelwiththethirdswitchingdevice,inthat itwillcreateaparallelpathwayforthedischargecurrentfromtheoutputterminaltothesecondnode, whichistherebynotentirelyforcedthroughtheotherwisevulnerablethirdswitchingdevice.When suitablytuned,sucharesistiveelementmaythushavetheeffectofsuitablydividingthevoltagedrop10 overthesecondandthirdswitchingdeviceswithoutsurpassingtheirrespectiveSOAboundaries. Forexample,thebypasscircuitmaycompriseorconsistofaMOStransistorconfiguredtohavea lowconductivitywhenthevoltageoversaidMOStransistorislowerthanacertainthresholdvoltage, andtohaveahighconductivitywhenthevoltageoversaidMOStransistorishigherthansaid thresholdvoltage.15 Otherexamplesofbypasscircuitssolelyconsistingofresistiveelementsandnotcomprisingdiodes, maynothaveathresholdvoltage,andconsequentlymaynotgiverisetodischargepatternswitha firstrapidphaseandasecondslowphaseliketheonedescribedaboveforbypasscircuitswitha diode,butratherexhibitamoregradualevolutionofthevoltageonthesecondnodewithtime. Inanadvantageousembodimentwithaprotectionterminal,thedrivercircuitfurthercomprisesa20 voltagelimitingcircuitwhichiscoupledbetweenthefirstnodeandtheprotectionterminal,and whichisconfiguredtolimitthevoltagebetweentheprotectionterminalandthefirstnode,wherein thevoltagelimitingcircuitpreferablycomprisesadiodeoraMOStransistor. Indeed,suchavoltagelimitingcircuitguaranteesagoodcontrolofthefirstnodeduringtheoff-state25 andduringthetransitionformon-statetooff-state,byallowingexcessivecurrentwhichriskstobuild uponthefirstnodewhenthefirstandsecondswitchingdevicesswitchoff,todischargethrough saidvoltagelimitingcircuittowardstheprotectionterminal.Therebythevoltagebetweenthefirst nodeandtheprotectionterminalissuitablycontrolled,andmoreoverthevoltageoverthefirst switchingdeviceislimited,inparticularsothatitdoesnotexceedthemaximumtoleratedvoltage30 ofsaidfirstswitchingdevice.Herein,itmaybepreferabletoimplementsaidvoltagelimitingcircuit withaforwardbiaseddiode,sincesuchadiodehasexcellentconductivityandthusallowsforarapid discharge,aslongasthevoltageitexperiences,exceedsitsthresholdvoltages. Nosuchadditionalvoltagelimitingcircuitryisneededforbiasingthesecondnode,sinceawell- controlledbiasingofthesecondnodeisalreadyensuredbythebypasscircuit.35 2025 / 5024 BE2025 / 5024 11 Inafirstexemplaryembodimentwithavoltagelimitingcircuit,thesecondswitchingdeviceisan NMOStransistorandthevoltagelimitingcircuitcomprisesadiode,withananodewhichiscoupled tothefirstnode,andwithacathodewhichiscoupledtotheprotectionterminal. Inanalternative,secondexemplaryembodimentwithavoltagelimitingcircuit,thesecondswitching deviceisaPMOStransistorandthevoltagelimitingcircuitcomprisesadiode,withananodewhich5 iscoupledtotheprotectionterminal,andwithacathodewhichiscoupledtothefirstnode. Indeed,whenadiodeiscoupledtothefirstnodeandtotheprotectionterminalinthisway,itis forwardbiasedduringthetransitionfromon-statetooff-stateandthusallowstoconductacurrent fromthefirstnodetotheprotectionterminal(whenthesecondswitchingdeviceisanNMOS transistor)respectivelyfromtheprotectionterminaltothefirstnode(whenthesecondswitching10 deviceisaPMOStransistorandthecurrentdirectionisthusreversed),therebycontributingtothe dischargeofthefirstnodeandthuslimitingthevoltagebetweenthefirstnodeandtheprotection terminal. Inathirdexemplaryembodimentwithavoltagelimitingcircuit,thesecondswitchingdeviceisan15 NMOStransistorandthevoltagelimitingcircuitcomprisesaPMOStransistorwhichhasasource, adrain,agateandabulk,whereinthesourceand / orthebulkofsaidPMOStransistoriscoupledto theprotectionterminal,thedrainofsaidPMOStransistoriscoupledtothefirstnodeandthegateof saidPMOStransistoriscoupledtoacontrolcircuit. Inanalternative,fourthexemplaryembodimentwithavoltagelimitingcircuit,thesecondswitching20 deviceisaPMOStransistorandthevoltagelimitingcircuitcomprisesanNMOStransistorwhich hasasource,adrain,agateandabulk,whereinthesourceand / orthebulkofsaidNMOStransistor iscoupledtotheprotectionterminal,thedrainofsaidNMOStransistoriscoupledtothefirstnode andthegateofsaidNMOStransistoriscoupledtoacontrolcircuit. Insaidthirdandfourthexemplaryembodiment,thePMOSorNMOStransistorinthevoltage25 limitingcircuitmayforexamplehaveitsgatecoupledtotheinputterminal,and / ormayhaveits sourceand / orbulkcoupledtothegateofthesecondswitchingdevice. Inanadvantageousembodiment,thebypasscircuitisconfiguredandconnectedtocreatean additionalcurrentpathbetweentheoutputterminalandtherailterminal,and / ortocreatean30 additionalcurrentpathbetweentheoutputterminalandthefirstnode. Suchanadditionalcurrentpathbetweentheoutputterminalandtherailterminalhastheadvantage thatthedischargecurrentassociatedwiththedischargeoftheloadcapacitanceoftheoutputterminal isnolongerforcedtopassinitsentiretythroughtheswitchingdevices.Rather,acertainfractionof35 saiddischargecurrentmaybeconductedbysaidadditionalcurrentpath,whereastheremaining 2025 / 5024 BE2025 / 5024 12 fractionpassesthroughtheswitchingdevices.Asaresult,thedischargingprocessoftheload capacitanceoftheoutputterminalisbeingspedup,leadingtolowerimbalancesbetweenthefirst andthesecondswitchingdevice. Asimilareffectmaybeattributedtoanadditionalcurrentpathbetweentheoutputterminalandthe firstnode,inthatitallowsforacertainfractionofsaiddischargecurrenttopassthroughthefirst5 switchingdevicebutnotthroughthesecondandthirdswitchingdevice,therebydistributingtheload capacitance,tobedischargedduringthetransitionfromoff-statetoon-state,moreevenlybetween theswitchingdevices.Comparedtoembodimentswithanadditionalcurrentpathtowardstherail terminal,embodimentswithanadditionalcurrentpathtowardsthefirstnodehavetheeffectof slowingdownthedischargeprocess.Indeed,contrarytotheformerembodiments,thelatter10 embodimentsforcethefractionofsaiddischargecurrentthatdoesnotpassthroughthesecondand thirdswitchingdevice,tostillpassthroughthefirstswitchingdeviceinsteadofpassingdirectlyto therailterminal.Assuch,thedischargeprocessisstillbeingspedupcomparedtoembodimentswith noadditionalcurrentpaths,yetisslowerthanthedischargeprocessforembodimentswithan additionalcurrentpathtowardstherailterminal.Onemayalsocombinebothtypesofadditional15 currentpaths. Inanexemplaryembodimentwithanadditionalcurrentpathbetweentheoutputterminalandthe railterminaland / orwithanadditionalcurrentpathbetweentheoutputterminalandthefirstnode, thebypasscircuitcomprisesabipolartransistorhavingacollectorcoupledtotherailterminalorto20 thefirstnode,anemittercoupledtotheoutputterminalandabasecoupledtothesecondnode. Indeed,suchaconfigurationallowsafractionofthedischargecurrentassociatedwiththedischarge oftheloadcapacitanceoftheoutputterminal,torunfromtheoutputterminalviathebaseofthe bipolartransistortothecollectorofthebipolartransistorandinthiswaytoeithertherailterminal orthefirstnode,dependingonwhichofthesesaidcollectoriscoupledto.Inanexemplary25 embodiment,thebypasscircuitmaycompriseastringorstackofseveralbipolartransistors,wherein forexampleafirstbipolartransistormayhaveacollectorcoupledtotherailterminal,whereasa secondbipolartransistormayhaveacollectorcoupledtothefirstnode.Thereby,bothanadditional currentpathfromtheoutputterminaltotherailterminal,andanadditionalcurrentpathfromthe outputterminaltothefirstnode,arebeingcreated.30 Inanexemplaryembodiment,thedrivercircuitfurthercomprisesoneormoreswitchingdevices coupledbetweenthefirstnodeandthesecondswitchingdevice. Infact,thefirstswitchingdevicemaybereplacedbyanystackorseriesconnectionofswitching devices,whereinsaidstackmayhavearbitrarylength,withoutsignificantlycompromisingthe35 bypasscircuit’seffectofexpandingthedrivercircuit’sSafeOperationArea(SOA). 2025 / 5024 BE2025 / 5024 13 Inanexemplaryembodiment,thedrivercircuitfurthercomprisesoneormoreswitchingdevices coupledbetweenthethirdswitchingdeviceandtheoutputterminal. Insuchembodiments,thedrivercircuitcomprisesastackorseriesconnectionofswitchingdevices, whereinthebypasscircuitisthuscoupledinparallelwithaswitchingdevicewhichisnotnecessarily5 directlyconnectedtotheoutputterminal,andwhichdoesnotnecessarilylieclosesttotheoutput terminalcomparedtotheotherswitchingdevicesinthestack.Embodimentswhereintheswitching devicebypassedbythebypasscircuitistheswitchingdeviceclosesttotheoutputterminalare generallypreferred,forthereasonthatitissaidswitchingdeviceclosesttotheoutputterminalwhich isthemostvulnerableagainstSOAovershoot.Nevertheless,incertainsituationsitmaybedesirable10 tocouplethebypasscircuitinparallelwithadifferentswitchingdevicewhichisnotclosesttothe outputterminal,forexampleinthesituationwhensaidswitchingdeviceiscoupledtoahighly capacitivenode,forexampletoanodewhichiscoupledtoahighexternalcapacitance. 15 BRIEFDESCRIPTIONOFTHEFIGURES Theaccompanyingdrawingsareusedtoillustratepresentlypreferrednon-limitingexemplary embodimentsofdevicesofthepresentinvention.Theaboveandotheradvantagesofthefeatures andobjectsoftheinventionwillbecomemoreapparent,andtheinventionwillbebetterunderstood20 fromthefollowingdetaileddescriptionwhenreadinconjunctionwiththeaccompanyingdrawings, inwhich: Figure1aisacircuitschematicofaconventionaldrivercircuitwithastackeddriverarchitecture; Figure1bisagraphoftheevolutionwithtimeofthevoltageontheoutputterminalandthevoltage onaparticularnode,inthedrivercircuitofFigure1a;25 Figure2aisacircuitschematicofadrivercircuitaccordingtoafirstembodiment; Figure2bisagraphoftheevolutionwithtimeofthevoltageontheoutputterminal,thevoltageon afirstnodeandthevoltageonasecondnode,inthedrivercircuitofFigure2a; Figure3isacircuitschematicofadrivercircuitaccordingtoasecondembodiment; Figure4aisacircuitschematicofthedrivercircuitofFigure3,whereineachswitchingdeviceisan30 NMOStransistor; Figure4bisacircuitschematicofadrivercircuitaccordingtoathirdembodiment,whereineach switchingdeviceisaPMOStransistor; Figure5aisacircuitschematicofadrivercircuitaccordingtoafourthembodiment; Figure5bisacircuitschematicofadrivercircuitaccordingtoafifthembodiment;35 2025 / 5024 BE2025 / 5024 14 Figure6aisacircuitschematicofthedrivercircuitofFigure5a,whereinthebypasscircuitisa diode; Figure6bisacircuitschematicofthedrivercircuitofFigure5b,whereinthebypasscircuitisa diode; Figure6cisacircuitschematicofthedrivercircuitofFigure5a,whereinthebypasscircuitisa5 diode,forexampletheholdingdiode,ofanESDclamp; Figures7a-7earecircuitschematicsofadrivercircuitaccordingtoembodimentswithanadditional currentpath; Figures8aand8barecircuitschematicsofadrivercircuitaccordingtoembodimentswithfour switchingdevicesandonebypasscircuit,respectivelywithfiveswitchingdevicesandtwobypass10 circuits. DETAILEDDESCRIPTIONOFEMBODIMENTS Inthefollowingdescriptions,commonnumericaldesignationsmaybeusedforsimilar,15 correspondingpartsacrossmultiplefigures. Figure2ashowsacircuitschematicofadrivercircuitaccordingtoageneralembodiment,consisting ofarailterminalRAIL,aninputterminalTX,anoutputterminalPAD,afirstswitchingdeviceS1 withacontrolportG1coupledtotheinputterminalTX,asecondswitchingdeviceS2andathird20 switchingdeviceS2bis.Herein,thesecondswitchingdeviceS2mayormaynothaveacontrolport, andisconfiguredtowithstandafirstmaximumvoltageV1,andthethirdswitchingdeviceS2bis mayormaynothaveacontrolport,andisconfiguredtowithstandasecondmaximumvoltageV2. Therailterminalmayforexamplebeagroundterminal,apowerterminal,aVSSterminaloraVDD terminal.25 Thefirst,secondandthirdswitchingdevicesareconnectedinseries,inthatthefirstswitchingdevice S1isconnectedbetweentherailterminalRAILandafirstnodeN1,thesecondswitchingdeviceS2 isconnectedbetweenthefirstnodeN1andasecondnodeN2,andthethirdswitchingdeviceS2bis isconnectedbetweenthesecondnodeN2andtheoutputterminalPAD.Thedrivercircuitfurther comprisesabypasscircuit100whichisconnectedbetweentheoutputterminalPADandthesecond30 nodeN2inparallelwiththethirdswitchingdeviceS2bis,andwhichisconfiguredtolimitboththe voltageoverthesecondswitchingdeviceS2andthevoltageoverthethirdswitchingdeviceS2bis, inparticularsothatthevoltageoverthesecondswitchingdeviceS2doesnotexceedthefirst maximumvoltageV1andthevoltageoverthethirdswitchingdeviceS2bisdoesnotexceedthe secondmaximumvoltageV2,duringactivationofthefirstswitchingdeviceS1.Theswitching35 devicesS1,S2andS2bis,aswellasthebypasscircuit100,arerepresentedasarectangularboxto 2025 / 5024 BE2025 / 5024 15 emphasizethatFigure2arepresentsageneralembodiment,inthatmanydifferentimplementations ofsaidswitchingdevicesS1,S2,S2bisandsaidbypasscircuit100maybechosen.Figures4a,5a and6arepresentafewsuchchoices. ItmaybecleartothereaderthattheembodimentofFigure2amustnotbeconsideredaslimitedto5 thesimpleseriesconnectionspresented,butmayratheralsocompriseothercomponentsanddevices, suchasresistorsordiodes,whichmaybeaddedtothedescribeddrivercircuit,alongtheshown currentpathsoralongadditionalcurrentpathsthatmaybeaddedtothecircuit,withoutsignificantly alteringitsfunctionality. 10 IntheembodimentofFigure2a,thethreeswitchingdevicesS1,S2andS2bisareconnectedinseries, sothattheyareoperatedtogetherinthesensethatwhenthefirstswitchingdeviceS1switcheson andthusstartstoconduct,thisforcesthesecondswitchingdeviceS2,andeventuallyalsothird switchingdeviceS2bis,tosubsequentlyswitchonaswell.Asaresult,adecenton-stateisachieved whereinallswitchingdevicesareclosed,whereaswhenthefirstswitchingdeviceS1switchesoff,a15 currentcannolongerflowfromthesecondorthirdswitchingdevicesothatallswitchingdevices aredeactivatedandanoff-stateisattained.However,duringactivationofthefirstswitchingdevice S1,whenthedrivercircuitswitchesfromtheoff-statetotheon-state,theswitchingdeviceclosest totheoutputterminal,i.e.thethirdswitchingdeviceS2bis,riskstoexperienceavoltagethatexceeds itsmaximumtoleratedvoltagevalueV2duetothefactthattheoutputterminalPADdischarges20 muchmoreslowlythanthefirstnodeN1duetoitshigherloadcapacitance.SuchaSOAovershoot ispreventedbythebypasscircuit100.Indeed,thisbypasscircuit100iscoupledbetweentheoutput terminalPADandthesecondnodeN2inparallelwiththethirdswitchingdeviceS2bis,andthus providesaparallelcurrentpathforthedischargecurrentfromtheoutputterminalPADtoflowto thesecondnodeN2.Comparedtoconventionaldrivercircuitswiththreeswitchingdeviceswhich25 lacksuchabypasscircuit,thisthushastheadvantagethatsaiddischargecurrentisnolongerforced solelythroughthethirdswitchingdeviceS2bis,butmayalso,orevenprimarily,runthroughthe bypasscircuit100.Thisprovidesforamoreevendistributionofsaiddischargecurrent,andthusof thecorrespondingvoltagedrop,betweenthesecondswitchingdeviceS2andthirdswitchingdevice S2bis.Herein,thebypasscircuit100istunedsuchthatthevoltagedropoverthethirdswitching30 deviceS2bisontheonehandisnotsohighthatthethirdswitchingdeviceS2bisexceedsits maximumtoleratedvoltagevalue(thesecondmaximumvoltageV2)andthusitsSOAboundaries, butontheotherhandisalsosufficientlyhighforthevoltagedropoverthesecondswitchingdevice S2nottoexceedthefirstmaximumvoltageV1.Asaresult,noneoftheswitchingdevicesexceeds itsSOAboundariesduringthetransitionfromoff-statetoon-state,andthussafeoperationis35 guaranteed,evenwhenthevoltagebetweentheoutputterminalPADandtherailterminalRAIL 2025 / 5024 BE2025 / 5024 16 duringtheoff-statepriortosaidtransitionexceededtheindividualmaximumtoleratedvoltage values. Indeed,letusassumeforsimplicitythatthemaximumtoleratedvoltagevaluesofthesecond switchingdeviceS2andthethirdswitchingdeviceS2bis,whichwehavecalledthefirstmaximum5 voltageV1andthesecondmaximumvoltageV2respectively,areequal.Letusdenotesaid maximumtoleratedvoltagebyVmax.Assumemoreoverthatduringtheoff-state,thevoltageonthe outputterminalPADyieldsapproximatelytwicethevalueofthefirstmaximumvoltageVmax,and thatthefirstnodeN1iskeptatafixedDCvoltageequaltoorslightlylowerthansaidfirstmaximum voltageVmax.Thelattermayforexamplebeachievedbycouplingacontrolportofthesecond10 switchingdeviceS2toafixedDCvoltagesource,aswillbeexplainedbelowinreferencetoFigure 3. Figure2brepresentstheevolutionwithtimeofthevoltageontheoutputterminalPAD,denotedby Vpad,ofthevoltageonthefirstnodeN1,denotedbyVN1,andofthevoltageonthesecondnodeN2,denotedbyVN2,whenattimet=0allswitchingdevicesareswitchedoff,yetattimet1thefirst15 switchingdeviceS1isbeingactivated.Herein,thevoltageVN1playstheroleofthevoltageVmidin thepriorartreferenceofFigure1b. Asexplainedabove,VN1andVpadremainconstantatrespectivelyVmaxandtwotimesVmaxpriorto theactivation,i.e.upuntilthepointintimet1.Byvirtueofthebypasscircuit100,thesecondnode N2iskeptatthesamevoltageastheoutputterminalPADduringtheoff-state.Indeed,whenall20 switchingdevicesareswitchedoff,thebypasscircuit100providesanimpedanceparalleltothethird switchingdeviceS2bis,whichislowerthantheimpedanceofanopenswitch,sothatthesecond nodeN2ischargeduptothesamevoltagevalueastheoutputterminalPAD,whilenocurrentcan runthroughtheopenthirdswitchingdeviceS2bis.Therefore,upuntilthepointintimet1,thesecond nodeN2alsoremainsataconstantvoltageoftwotimesthevalueVmax.25 Whenatthepointintimet1thefirstswitchingdeviceS1isswitchedonduetothesignalitreceives fromtheinputterminalTX,thevoltageonthefirstnodeN1startstodrop,ascurrentmaynowrun fromthefirstnodeN1viathefirstswitchingdeviceS1towardstherailterminalRAIL.Thistriggers thesecondswitchingdeviceS2toswitchonaswell.LikeinthepriorartcircuitofFigures1a-1b, thevoltageontheoutputterminalPADdecreasesaswellwithtime,yetmuchslowerthanthevoltage30 onthefirstnodeN1sincetheoutputterminalPADcorrespondswithamuchhigherloadcapacitance. ThevoltageonthesecondnodeN2experiencesadecreaseaswell,subdividedinarapidfirstphase andaslowsecondphase.Duringsaidrapidfirstphase,thedischargecurrentfromtheoutputterminal PADtothesecondnodeN2ismainlyforcedtopassthroughthebypasscircuit100,whichforsuch highvoltagevalueshasamuchhigherconductivitythanthethirdswitchingdeviceS2bis.Said35 dischargecurrentisthusrapidlyconductedthroughthebypasscircuit100,causingthevoltageon 2025 / 5024 BE2025 / 5024 17 thesecondnodeN2todropalmostinstantaneouslytoacertaincriticalvaluebelowitsinitialvalue oftwotimesVmax.Saidcriticalvaluecorrespondswithathresholdvoltagevalueforthebypass circuit100,inthesensethatsaidbypasscircuit100almostceasestoconductwhensaidvoltageis reached.Forexample,ifthebypasscircuit100consistsofastackofdiodes,saidvaluecorresponds withthesumoftherespectivediodethresholdvoltages.Sincethedischargecurrentcanthen5 substantiallynolongerpassthroughthebypasscircuit100,thethirdswitchingdeviceS2bisis triggeredtoswitchonandconductsaiddischargecurrent,whilethebypasscircuitconductsvery poorlyorevendoesnotconductatall.Thiscorrespondswithasecond,slowdischargephase, whereinthesecondnodeN2dischargesatthesamepaceastheoutputterminalPAD,whichismuch slowerthanthedischargepaceofthefirstnodeN1.Atacertainpointintimet2,thefirstnodeN110 attainstherailterminalvoltage(0V),whilethesecondnodeN2andtheoutputterminalPADhave notyetreachedsaidvalue.Atthattime,thevoltageoverthesecondswitchingdeviceS2,which correspondstothedifferencebetweenthevoltagesVN2andVN1,attainsitshighestvalue. Nevertheless,saidsecondswitchingdeviceS2doesnotsurpassitsSOAboundaries,sincethebypass circuit100ofFigure2aistunedinsuchawaythatVN2hassufficientlydecreasedduringtherapid15 firstphasethatatthepointintimet2,VN2doesnotexceedthemaximumtoleratedvoltageVmax.On theotherhand,VN2hasnotdecreasedtoomucheitherduringsaidrapidfirstphase,andinparticular hasdecreasedbylessthanthevalueVmax,sothatthedifferencebetweenthevoltagesVpadandVN2, whichyieldsthevoltageoverthethirdswitchingdeviceS2bis,doesnotexceedVmaxeither. Consequently,eachofthedifferentswitchingdevicesremainswithinitsSOAconditionsduringthe20 transitionfromoff-statetoon-state,eventhoughtheinitialvoltagevaluebetweentheoutputterminal PADandtherailterminalRAILwastwiceashighastheindividualmaximumtoleratedvoltages. Saidtuningofthebypasscircuit100correspondstosuitablychoosinghowtoimplementthebypass circuit100,infunctionofthemaximumtoleratedvoltagevaluesofthedifferentswitchingdevices. Forexample,whenthebypasscircuit100consistsofastackofdiodes,thenumberofdiodesinsaid25 stackischoseninsuchawaythatthesumofthediodethresholdvoltagesliesbelowthesecond maximumvoltageV2,yetishighenoughforthevoltageoverthesecondswitchingdeviceS2to remainbelowthefirstmaximumvoltageV1. Otherimplementationsofthebypasscircuit100,forexamplewithresistiveelementsinsteadof diodes,arepossibleaswell.Forexample,thebypasscircuit100maycompriseorconsistofaMOS30 transistorwhichisconfiguredtohavealowconductivitywhenthevoltageoversaidMOStransistor islowerthanacertainthresholdvoltage,andtohaveahighconductivitywhenthevoltageoversaid MOStransistorishigherthansaidthresholdvoltage.Otherembodimentsmaynotexperiencesuch aseeminglyinstantaneousvoltagedropasintherapidphaseinFigure2b,butwillrathershowa muchmoregradualdecreaseofVN2towards0V.35 2025 / 5024 BE2025 / 5024 18 Inthedescribedembodiment,themaximumtoleratedvoltagesofthesecondswitchingdeviceS2 andthirdswitchingdeviceS2bis,i.e.thevaluesV1andV2,wereidentical.Forexample,switching devicescorrespondingwithrecenttransistortechnologiestypicallyhavemaximumtoleratedvoltage valuesofforexample0.9V,or1.8V,or2.5VHowever,inotherembodimentsthesevaluesV1and V2maybesignificantlydistinct.Inparticular,thecircuitdoesnotneedtobeimplementedwiththree5 identicalswitchingdevices,butmaybeimplementedwithforexampleonehigh-voltage-MOS transistorandtwolow-voltage-MOStransistors.Generally,thedescribedbypasscircuit100,when suitablytuned,managestoprotectthecircuitagainstSOAovershoot,whentheoff-statevoltage betweentheoutputterminalPADandtherailterminalRAILdoesnotexceedthesumofthe maximumtoleratedvoltageofthefirstswitchingdeviceS1andthemaximumtoleratedvoltageof10 thesecondswitchingdeviceS2,soforexamplewhensaidoff-statevoltagedoesnotexceed1.8V, incaseallswitchingdevicesS1,S2andS2bisare0.9V-transistors,whensaidoff-statevoltagedoes notexceed3.6V,incaseallswitchingdevicesS1,S2andS2bisare1.8V-transistors,andwhensaid off-statevoltagedoesnotexceed5V,incaseallswitchingdevicesS1,S2andS2bisare2.5V- transistors.15 Figure3showsacircuitschematicofadrivercircuitaccordingtoageneralembodiment.In comparisonwiththeembodimentofFigure2a,aprotectionterminalPROThasbeenadded,the secondswitchingdeviceS2hasbeenequippedwithacontrolportG2,thethirdswitchingdevice S2bishasbeenequippedwithacontrolportG2bis,andbothcontrolportsG2andG2bisare20 connectedtotheprotectionterminalPROT.Herein,theswitchingdevicesS1,S2andS2bis,aswell asthebypasscircuit100,arerepresentedasarectangularboxtoemphasizethatFigure3represents ageneralembodiment,inthatmanydifferentimplementationsofsaidswitchingdevicesS1,S2, S2bisandsaidbypasscircuit100maybechosen. WhensuchaprotectionterminalPROTiscoupledtoafixedDCvoltagesource,saidprotection25 terminalPROTmayservetomaintainboththecontrolportG2ofthesecondswitchingdeviceS2 andthecontrolportG2bisofthethirdswitchingdeviceS2bisatafixedDCvoltage.Thishasthe advantagethatnoadditionalbiasingcircuitryisneededtokeepthecontrolportvoltageofthethird switchingdeviceS2bisconstant,inthesensethatoneandthesameterminalmaybeusedforbiasing boththecontrolportG2ofthesecondswitchingdeviceS2andthecontrolportG2bisofthethird30 switchingdeviceS2bis. Figure4ashowsacircuitschematicofadrivercircuitaccordingtoanadvantageousembodiment.In comparisonwiththegeneralembodimentofFigure3,eachofthefirstswitchingdeviceS1,the secondswitchingdeviceS2andthethirdswitchingdeviceS2bishasbeenimplementedasanNMOS35 transistor,andtheirrespectivecontrolportsG1,G2andG2biscorrespondwiththegatesofsaid 2025 / 5024 BE2025 / 5024 19 transistors.TheembodimentofFigure4acanbeobtaineduponmodifyingthepriorartcircuitof Figure1abyaddinganNMOStransistorS2bisasathirdswitchingdeviceinseriesbetweenthe secondswitchingdeviceS2andtheoutputterminalPAD,couplingthegateofthesaidthirdNMOS transistorS2bistotheprotectionterminalPROT,andaddingabypasscircuit100betweentheoutput terminalPADandthesecondswitchingdeviceinparallelwiththethirdswitchingdeviceS2bis,5 whereinsaidbypasscircuit100isconfiguredtolimitboththevoltageoverthesecondswitching deviceS2andthevoltageoverthethirdswitchingdeviceS2bis,inparticularsothatthevoltageover thesecondswitchingdeviceS2doesnotexceedthefirstmaximumvoltageV1andthevoltageover thethirdswitchingdeviceS2bisdoesnotexceedthesecondmaximumvoltageV2,duringactivation ofthefirstswitchingdeviceS1.Notethatthebypasscircuit100isstillrepresentedasarectangular10 boxtoemphasizethatmanydifferentimplementationsofsaidbypasscircuit100maybechosen. Atransistorformsanaturalchoiceofswitchingdeviceinadrivercircuit,inthattheymaybe triggeredtoswitchon,andthusattainanactivatedstate,whenasufficientvoltagesurgeisdelivered totheirgateorbase,andtoswitchoff,andthusattainadeactivatedstate,whenthereceivedgateor15 basevoltageceasestosuffice.SimilarlyasintheembodimentofFigure3,theprotectionterminal PROTmaybecoupledtoafixedDCvoltagesourcesoastomaintainafixedDCvoltageonthegate G2ofthesecondswitchingdeviceS2aswellasonthegateG2bisofthethirdswitchingdevice S2bis. NotethatthecircuitofFigure4ahasasimpleimplementationwithfewconstituentsandthuslow20 surfacearea. Herein,thefirst,secondandthirdswitchingdevicemaygenerallybeofcomparabledimensions, unlessthefixedDCvoltagedeliveredtotheprotectionterminalPROTissignificantlylow,inwhich casethefirstswitchingdeviceS1mayhaveslightlysmallerdimensionsthanthesecondswitching deviceS2andthethirdswitchingdeviceS2bis.25 Figure4bshowsacircuitschematicofthedrivercircuitthatformstheanalogofthecircuitofFigure 4a,whereineachoftheswitchingdevicesS1,S2andS2bisisnowaPMOStransistorinsteadofan NMOStransistor.TheskilledpersonunderstandsthatcomparedtoFigure4a,theorderofthe differentcomponentshasbeenreversedinordertomaintaintheconventionthatthecurrentruns30 fromthetoptothebottomofthefigure.However,thefunctionalityoftheembodimentofFigure4b isanalogoustothatofFigure4a. Figure5ashowsacircuitschematicofadrivercircuitaccordingtoanadvantageousembodiment. SaidembodimentcorrespondswiththeembodimentofFigure4awhereinavoltagelimitingcircuit35 200hasbeenaddedbetweenthefirstnodeN1andtheprotectionterminalPROT.Moreprecisely,in 2025 / 5024 BE2025 / 5024 20 theembodimentofFigure5asaidvoltagelimitingcircuit200consistsofadiode201,withananode whichiscoupledtothefirstnodeN1,andwithacathodewhichiscoupledtotheprotectionterminal PROT.Figure5bshowsacircuitschematicofthedrivercircuitthatformstheanalogofthecircuit ofFigure5a,whereineachoftheswitchingdevicesS1,S2andS2bisisnowaPMOStransistor insteadofanNMOStransistor.Herein,thevoltagelimitingcircuit200betweenthefirstnodeN15 andtheprotectionterminalPROTconsistsofadiode201,withananodewhichiscoupledtothe protectionterminalPROT,andwithacathodewhichiscoupledtothefirstnodeN1. Suchavoltagelimitingcircuit200guaranteesawell-controlledbiasingofthefirstnodeN1during theoff-stateandduringthetransitionformon-statetooff-state,byallowingexcessivecurrentwhich riskstobuilduponthefirstnodeN1whenthefirstswitchingdeviceS1andthesecondswitching10 deviceS2switchoff,todischargethroughsaidvoltagelimitingcircuit200towardstheprotection terminalPROT.TherebythevoltagebetweenthefirstnodeN1andtheprotectionterminalPROTis suitablycontrolled,andmoreoverthevoltageoverthefirstswitchingdeviceislimited,inparticular sothatitdoesnotexceedthemaximumtoleratedvoltageofsaidfirstswitchingdevice.Herein,said voltagelimitingcircuit200isimplementedwithaforwardbiaseddiode201,sincesuchadiodehas15 excellentconductivityandthusallowsforarapiddischarge,aslongasthevoltageitexperiences, exceedsitsthresholdvoltages. OtherexamplesofavoltagelimitingcircuitincludevoltagelimitingcircuitscomprisingaMOS transistor202.Forexample,whenthesecondswitchingdeviceS2isanNMOStransistor,thevoltage limitingcircuit200maycompriseaPMOStransistor202whichhasasource,adrain,agateanda20 bulk,whereinthesourceand / orthebulkofsaidPMOStransistor202iscoupledtotheprotection terminalPROT,thedrainofsaidPMOStransistor202iscoupledtothefirstnodeN1andthegate ofsaidPMOStransistor202iscoupledtoacontrolcircuit,forexampletotheinputterminalTX. Alternatively,whenthesecondswitchingdeviceS2isaPMOStransistor,thevoltagelimitingcircuit 200maycompriseanNMOStransistor202whichhasasource,adrain,agateandabulk,wherein25 thesourceand / orthebulkofsaidNMOStransistor202iscoupledtotheprotectionterminalPROT, thedrainofsaidNMOStransistor202iscoupledtothefirstnodeN1andthegateofsaidNMOS transistor202iscoupledtoacontrolcircuit,forexampletotheinputterminalTX. NosuchadditionalvoltagelimitingcircuitryisneededforbiasingthesecondnodeN2,sinceawell- controlledbiasingofthesecondnodeN2isalreadyensuredbythebypasscircuit100.30 Figure6ashowsacircuitschematicofadrivercircuitaccordingtoapreferredembodiment,which correspondswiththeembodimentofFigure5awhereinthebypasscircuit100ischosentobeasingle diode101.Figure6bshowsacircuitschematicofthedrivercircuitthatformstheanalogofthe circuitofFigure6a,whereineachoftheswitchingdevicesS1,S2andS2bisisnowaPMOS35 transistorinsteadofanNMOStransistor. 2025 / 5024 BE2025 / 5024 21 Itispreferabletoimplementthebypasscircuit100withadiode101,asadiodeisaprimeexample ofadevicewithathresholdvoltage,inthesensethatitsexponentialcurrent-voltagecharacteristic hastheeffectthatforvoltagesexceedingitsthresholdvoltage,thediode’sresistanceisnegligible, whereasforvoltagesbelowsaidthresholdvoltage,thediode’sresistanceisvirtuallyinfinite.Asa result,diodesconductveryfastabovetheirthresholdvoltage,andalmostdonotconductbelowtheir5 thresholdvoltage.Whenthebypasscircuit100thuscomprisesatleastonediode101,thetransition fromoff-statetoon-stateproceedsasfollows. Thetransitionfromoff-statetoon-stateisinitiatedwhentheinputterminalTXswitchesonthefirst switchingdeviceS1,causingthevoltageonthefirstnodeN1todrop.Consequently,thesecond switchingdeviceS2isalsoswitchedon,therebygivingrisetoavoltagedroponthesecondnodeN210 andcausingthediode101tostartconducting.Duringthisfirstphaseofthetransition,thefirst switchingdeviceS1andsecondswitchingdeviceS2arethusclosedwhilethethirdswitchingdevice S2bisremainsopen,andthedischargecurrentassociatedwiththedischargeoftheloadcapacitance oftheoutputterminalPADrunssolelythroughthebypasscircuit100,whereinthediode101 conductssaidcurrentveryrapidly,anddoesnotrunatallthroughthethirdswitchingdeviceS2bis.15 Assuch,theoutputterminalvoltagedecreasesrapidlyfromitsinitialvaluetoavaluelowenough forthediodevoltagetoreachitsthresholdvoltage.Oncesaidvoltagereachesthediodethreshold voltage,thediode101substantiallyceasestoconduct,therebygivingrisetoasecondphasewherein theremainingdischargecurrentissubstantiallyforcedthroughthethirdswitchingdeviceS2bis, whichisthustriggeredtoswitchon.Inthissecondphase,thecircuitnolongerbenefitsfromthe20 highdiodeconductivityabovethresholdvoltage,sothatthedischargeproceedsmuchmoreslowly duringsaidsecondphase. Itshouldbenotedthatthebypasscircuit100mayalsoconsistofastringorstackofdiodes101,in whichcasetheroleofthethresholdvoltageofthebypasscircuitisplayedbythesumofthethreshold voltagesofthedifferentdiodes101.Typicaldiodethresholdvoltagevaluesrangefrom0.5Vto0.925 V,forexample0.7V.Thementionedtuningofthebypasscircuit100thenamountstochoosingthe numberofdiodes101inthestackinsuchawaythatsaidsumofdiodethresholdvoltagesliesbelow themaximumtoleratedvoltageV2ofthethirdswitchingdeviceS2bis,yetisstillhighenoughfor thevoltagedropoverthesecondswitchingdeviceS2duringtransitionfromoff-statetoon-state,doesnotexceedthemaximumtoleratedvoltageV1ofthesecondswitchingdeviceS2.30 Suchastackofdiodeshastheadvantagethatcomparedtoasinglediode101,itisgenerally configuredtowithstandahighervoltagedrop.Ontheotherhand,thehigherthenumberofdiodes implementedinthebypasscircuit100,thehigheralsotherequired(silicon)surfacearea.Therefore, itispreferabletoimplementthebypasscircuit100withthesmallestnumberofdiodes101suchthat theabove-mentionedcriterionregardingthevoltagesdropsduringthetransition,isfulfilled.35 2025 / 5024 BE2025 / 5024 22 Otherexamplesofbypasscircuits100includebypasscircuitscomprisingresistiveelements,suchas MOStransistorswhichareconfiguredtohavealowconductivitywhenthevoltageoversaidMOS transistorislowerthanacertainthresholdvoltage,andtohaveahighconductivitywhenthevoltage oversaidMOStransistorishigherthansaidthresholdvoltage.Forexample,thebypasscircuit100 maycompriseorconsistofaMOStransistorwhosegateiscoupledwithitssource,suchthatits5 conductivityisessentiallyzerowhenthevoltageoversaidMOStransistorliesbelowathreshold voltage,andisveryhighwhenthevoltageoversaidMOStransistorliesabovesaidthresholdvoltage. Figure6cshowsacircuitschematicofadrivercircuitaccordingtoapreferredembodiment,which correspondswiththeembodimentofFigure6a,modifiedinthatthediode101thatconstitutesthe10 bypasscircuit100isnotastand-alonediode,butratherformspartofanESDclamp120.Indeed,the drivercircuitofFigure6cisequippedwithanESDclamp120coupledbetweentheoutputterminal PADandtherailterminalRAIL,saidESDclamp120consistingofadiode101,forexamplea holdingdiode,andoneormoreclampingdevices110,whereinsaiddiode101iscoupledbetween theoutputterminalPADandthesecondnodeN2inparallelwiththethirdswitchingdeviceS2bis,15 soastoserveasthebypasscircuit100. SuchembodimentsarebeneficialforapplicationswhereinanESDclamp120betweentheoutput terminalPADandtherailterminalRAILisrequired,irrespectiveofthepurposeofincreasingthe SafeOperationArea.Indeed,forsuchapplications,theembodimentofFigure6chastheadvantage thatnoadditionaldiodeisneededfortheimplementationofthebypasscircuit100:onemaysimply20 re-useadiodeoftheESDclamp120,forexampletheholdingdiode101oftheESDclamp120,as (partof)thebypasscircuit100.Thishastheadvantagethatnoadditionalsurfacearea(siliconarea) isconsumedfortheimplementationofthebypasscircuit100. Figures7a-7eshowcircuitschematicsofadvantageousembodimentsofadrivercircuit,wherein25 additionalcurrentpaths300,310havebeenaddedbetweentheoutputterminalPADandrespectively therailterminalRAIL(Figure7a),thefirstnodeN1(Figure7b),andboththerailterminalRAIL andthefirstnodeN1(Figure7c).Moreprecisely,inFigures7a-7b,comparedtotheembodimentof Figure2a,thebypasscircuit100isequippedwithoneadditionalterminal,whichisconnectedto respectivelytherailterminalRAILandthefirstnodeN1,therebyformingrespectivelytheadditional30 currentpath300andtheadditionalcurrentpath310.InthedrivercircuitofFigure7c,twosuch additionalterminalshavebeenadded,oneofwhichiscoupledwiththerailterminalRAILviathe additionalcurrentpath300,whereastheotheroneiscoupledwiththefirstnodeN1viatheadditional currentpath310. 35 2025 / 5024 BE2025 / 5024 23 Suchanadditionalcurrentpath300betweentheoutputterminalPADandtherailterminalRAIL hastheadvantagethatthedischargecurrentassociatedwiththedischargeoftheloadcapacitanceof theoutputterminalPADisnolongerforcedtopassinitsentiretythroughtheswitchingdevicesS1, S2andS2bis.Rather,acertainfractionofsaiddischargecurrentmaybeconductedbysaidadditional currentpath300,whereastheremainingfractionpassesthroughtheswitchingdevicesS1,S2and5 S2bis.Asaresult,thedischargingprocessoftheloadcapacitanceoftheoutputterminalPADis beingspedup,leadingtolowerimbalancesbetweenthefirstswitchingdeviceS1andthesecond switchingdeviceS2. Asimilareffectmaybeattributedtoanadditionalcurrentpath310betweentheoutputterminalPAD andthefirstnodeN1,inthatitallowsforacertainfractionofsaiddischargecurrenttopassthrough10 thefirstswitchingdeviceS1butnotthroughthesecondswitchingdeviceS2andthethirdswitching deviceS2bis,therebydistributingtheloadcapacitance,tobedischargedduringthetransitionfrom off-statetoon-state,moreevenlybetweentheswitchingdevices.Comparedtoembodimentswithan additionalcurrentpath300towardstherailterminalRAIL,embodimentswithanadditionalcurrent path310towardsthefirstnodeN1havetheeffectofslowingdownthedischargeprocess.Indeed,15 contrarytotheformerembodiments,thelatterembodimentsforcethefractionofsaiddischarge currentthatdoesnotpassthroughthesecondswitchingdeviceS2andthirdswitchingdeviceS2bis, tostillpassthroughthefirstswitchingdeviceS1insteadofpassingdirectlytotherailterminalRAIL. Assuch,thedischargeprocessisstillbeingspedupcomparedtoembodimentswithnoadditional currentpaths,yetisslowerthanthedischargeprocessforembodimentswithanadditionalcurrent20 path300towardstherailterminalRAIL.Onemayalsocombinebothtypesofadditionalcurrent paths300and310,asinFigure7c. Figure7dshowsanexemplaryembodimentwithanadditionalcurrentpath300betweentheoutput terminalPADandtherailterminalRAIL,whereinthebypasscircuit100comprisesabipolar25 transistorhavingacollectorcoupledtotherailterminalRAIL,anemittercoupledtotheoutput terminalPADandabasecoupledtothesecondnodeN2.Similarly,Figure7eshowsanexemplary embodimentwithanadditionalcurrentpath310betweentheoutputterminalPADandthefirstnode N1,whereinthebypasscircuit100comprisesabipolartransistorhavingacollectorcoupledtothe firstnodeN1,anemittercoupledtotheoutputterminalPADandabasecoupledtothesecondnode30 N2. Whenthefirst,secondandthirdswitchingdevicesS1,S2andS2bisareallNMOStransistors,said bipolartransistormaybeaPNPtransistor,asisthecaseinFigures7dand7e.Whensaidswitching devicesareallPMOStransistors,likeintheembodimentofFigures4band5b,anadditionalcurrent path300or310maycompriseanNPNbipolartransistor.Indeed,aconfigurationasinFigures7d-35 7eallowsafractionofthedischargecurrentassociatedwiththedischargeoftheloadcapacitanceof 2025 / 5024 BE2025 / 5024 24 theoutputterminalPAD,torunfromtheoutputterminalPADviathebaseofthebipolartransistor tothecollectorofthebipolartransistorandinthiswaytoeithertherailterminalRAIL(Figure7d) orthefirstnodeN1(Figure7e),dependingonwhichofthesesaidcollectoriscoupledto. Inanexemplaryembodiment,thebypasscircuit100maycompriseastringorstackofseveralbipolar transistors,whereinforexampleafirstbipolartransistormayhaveacollectorcoupledtotherail5 terminalRAIL,whereasasecondbipolartransistormayhaveacollectorcoupledtothefirstnode N1.Thereby,bothanadditionalcurrentpath300fromtheoutputterminalPADtotherailterminal RAIL,andanadditionalcurrentpath310fromtheoutputterminalPADtothefirstnodeN1,are beingcreated,therebyforminganimplementationoftheembodimentofFigure7c. 10 Finally,thedrivercircuitmayfurthercompriseoneormoreswitchingdevicescoupledbetweenthe firstnode(N1)andthesecondswitchingdevice,suchasinFigure8a,and / ormayfurthercomprise oneormoreswitchingdevices(S3,S3bis)coupledbetweenthethirdswitchingdevice(S2bis)and theoutputterminal(PAD),suchasinFigure8b. Moreprecisely,Figure8ashowsacircuitschematicofadrivercircuitaccordingtoanembodiment,15 whereinfourswitchingdeviceshavebeenimplemented.ComparedtotheembodimentofFigure2a, theprotectionterminal,secondnode,andsecondandthirdswitchingdevicehavebeenrenamedto PROT3,N3,S3andS3bis,anintermediatenodeN2hasbeenadded,whichiscoupledtothesource ofthesecondswitchingdeviceS3,anintermediateswitchingdeviceS2,intheformofanNMOS transistor,hasbeenaddedbetweenthefirstnodeN1andtheintermediatenodeN2,andthegateof20 theintermediateswitchingdeviceS2iscoupledtoanintermediateprotectionterminalPROT2. Similarly,Figure8bshowsacircuitschematicofadrivercircuitaccordingtoanembodiment,whereinfiveswitchingdeviceshavebeenimplemented.Moreprecisely,comparedtothe embodimentofFigure2a,afirstadditionalswitchingdeviceS3,asecondadditionalswitchingdevice S3bis,anadditionalprotectionterminalPROT3andanadditionalbypasscircuit100’havebeen25 added,whichareconnectedinastackbetweentheoutputterminalPADandthesecondswitching deviceS2bis,inthesamewayasthestackofthesecondandthirdswitchingdevicesS2,S2bis,the protectionterminalPROT2andthebypasscircuit100,iscoupledbetweentheformerstackandthe firstnode. 30 Saidembodimentsshowthattheobjectoftheinventionisalsoimplementableindrivercircuits which,irrespectiveoftheinvention,arealreadyequippedwithastackofmorethantwoswitching devices.Insuchcircuits,abypasscircuit100or100’canservetoreducethenumberofswitching devicesinthestackbyonedevice,andthusalsoreducetheassociatedcomplexityandsizeofthe biasingcircuitry,inthesensethatinsteadofimplementinganadditionalswitchingdeviceinorder35 tosufficientlydividethevoltagedropcorrespondingwiththedischargeoftheoutputterminalPAD, 2025 / 5024 BE2025 / 5024 25 abypasscircuit100or100’isaddedandcoupledinparallelwiththeswitchingdeviceclosesttothe outputterminalPAD. Insuchstackeddrivercircuits,abypasscircuit100maybeimplementedateverydistinguishable “block”oftwoswitchingdevices,inthesamewayasinFigures2a-7e.However,suchabypass circuit100willbemostusefulandhavethebiggestimpactwhenimplementedattheblockclosest5 totheoutputterminalPAD.Indeed,sincetheoutputterminalPADistheterminalwiththelargest loadcapacitancethatneedstobedischarged,itistheswitchingdeviceclosesttosaidoutputterminal PADwhichisatthehighestriskofexceedingitsSOAconditions. Insuchalargestackedcircuit,thefunctionalityofthebypasscircuit100,100’isanalogoustothat ofthebypasscircuit100intheembodimentsofFigures2a-7e,inthatthebypasscircuit(s)guarantee10 thatallconstituentswitchingdevicesremainwithinSOAconditionswhentheoff-statevoltage betweentheoutputterminalPADandtherailterminalRAILisnohigherthanthesumofthe maximumtoleratedvoltagesofthefirstswitchingdeviceS1,theintermediateswitchingdeviceS2 andthesecondswitchingdeviceS3(Figure8a),respectivelythesumofthemaximumtolerated voltagesofthefirstswitchingdeviceS1,thesecondswitchingdeviceS2andthefirstadditional15 switchingdeviceS3(Figure8b). However,itshouldbenotedthatinsuchlargestackedcircuits,itisnolongerpossibletokeepall switchingdevicesatafixedDCgatevoltage.Indeed,whiletheprotectionterminalPROT2farthest fromtheoutputterminalPADmaybestillbecoupledtoafixedDCvoltagesource,therebykeeping theintermediateswitchingdeviceS2(Figure8a)respectivelythesecondandthirdswitchingdevices20 S2andS2bis(Figure8b),whicharecoupledtotheprotectionterminalPROT2,atafixedDCgate voltageV0,thisisnolongerpossiblefortheprotectionterminalPROT3closesttotheoutputterminal PAD,andthusfortheswitchingdevicesS3andS3biswhicharecoupledtoPROT3.Instead,the latterprotectionterminalPROT3maybecoupledtoavoltagesourcewhichswitchesbetweentwo DCvoltagesVAandVBdependingonthevalueofthevoltageontheoutputterminalPAD.For25 example,saidvoltagesourcemaydeliverafirstDCvoltageVAwhenthevoltageontheoutput terminalPADishigh,andasecond,higherDCvoltageVBwhenthevoltageontheoutputterminal PADislow.WhenallswitchingdevicesinthestackhavethesamemaximumtoleratedvoltageVmax, e.g.1.8V,thevoltageV0ontheprotectionterminalPROT2farthestfromtheoutputterminalPAD maybeequaloressentiallyequaltoVmax,andthevoltagesVAandVBbetweenwhichtheprotection30 terminalPROT3closesttotheoutputterminalPADisconfiguredtoswitch,maybeequalor essentiallyequaltorespectivelyVmaxandtwotimesVmax,i.e.forexample1.8Vand3.6V. ThesecondandthirdswitchingdevicesS3andS3bis(Figure8a),respectivelythefirstadditional andsecondadditionalswitchingdevicesS3andS3bis,
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Single-gate-oxide power inverter and electrostatic discharge protection circuit
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