Image brightness correction method and electrode inspection apparatus using the same

Description

1 / 25 IMAGE BRIGHTNESS CORRECTION METHOD AND ELECTRODE INSPECTION APPARATUS USING THE SAME FIELD OF TECHNIQUE

[0001] This application claims priority and benefit of Korean Patent Application Number 10-2023-0181389, filed with the Korean Intellectual Property Office on December 14, 2023, the entire content of which is incorporated herein by reference.

[0002] The present invention relates to a method for correcting image brightness and to an electrode inspection apparatus that uses the method and, more specifically, to a method for correcting the brightness of electrode images during a battery electrode manufacturing process and to an electrode inspection apparatus that uses the method. BACKGROUND OF THE INVENTION

[0003] Secondary batteries, capable of recharging and reuse, can be used as a power source for small devices such as mobile phones, tablet PCs and vacuum cleaners, and also used as a power source for medium and large devices such as personal mobility, automobiles and an energy storage system (ESS) for smart grids. Secondary batteries can be used in the form of an array, such as a battery module in which a plurality of battery cells are connected in series and parallel, or a battery pack in which battery modules are connected in series and parallel, according to system requirements.

[0004] Batteries can be manufactured through processes that include an electrode preparation process, an assembly process, and an activation / inspection process, and defect inspection can be performed on manufactured battery cells or on the results of each process using inspection equipment. Image-based inspection can be one of the widely used techniques among Petition 870250088095, dated 09 / 29 / 2025, page 23 / 53 2 / 25 Defect Inspection Methods. Image inspection can be performed by obtaining images of parts and semi-finished products during a manufacturing process using an optical system, and by detecting defects using a detection algorithm.

[0005] In this regard, during an electrode cutting process performed in the electrode preparation process, the cutting width and the presence or absence of defects on the electrode surface are important factors that affect product quality, and image quality inspection can be performed. Here, the brightness of the image in the image inspection can be directly related to the inspection quality.

[0006] However, the brightness of the electrode inspection image may fluctuate to the degree where normal inspection is impossible due to changes in raw materials or process conditions. In this case, all relevant manufacturing facilities must be stopped and the operator must adjust the brightness of the inspection image to within a standard range suitable for inspection by adjusting the lighting intensity or camera exposure value. Consequently, not only may production rates decrease and production costs increase due to equipment downtime, but problems such as over-inspection and leakage of defects due to manual work may also occur. DETAILED DESCRIPTION OF THE INVENTION TECHNICAL PROBLEM

[0007] To avoid one or more problems of the relevant technique, embodiments of the present invention provide a method for correcting the brightness of electrode images during an electrode preparation process.

[0008] To avoid one or more problems of the relative technique, the mo Petition 870250088095, dated 09 / 29 / 2025, page 24 / 53 3 / 25 of the present invention also provide an electrode inspection apparatus using the image brightness correction method. Technical Solution

[0009] In order to achieve the objective of the present invention, a method for correcting image brightness may include acquiring a plurality of appearance images of a target object captured at different brightness levels; extracting one or more target inspection areas within each image; comparing the brightness of one or more target inspection areas with a brightness threshold which is determined for each target inspection area; and calculating a brightness correction value by reflecting a target brightness onto the brightness of each target inspection area based on the comparison result.

[0010] The brightness of each target inspection area can be determined for an average brightness of the pixels within the target inspection area.

[0011] Comparing the brightness of one or more target inspection areas with the brightness limit which is determined for each target inspection area may include comparing the average brightness of the target inspection area with a lower brightness limit value and an upper brightness limit value determined for the corresponding target inspection area.

[0012] Calculating a brightness correction value reflecting the target brightness to the brightness of each target inspection area based on the comparison result may include calculating the brightness correction value based on a difference value between the average brightness and the target brightness when the average brightness of the target inspection area is outside a range of the lower limit brightness value to the upper limit brightness value.

[0013] Calculating the brightness correction value based on the difference value between the average brightness and the target brightness may include calculating a camera exposure time adjustment value calculated by multiplying the difference between the average brightness and the target brightness by a control constant. Petition 870250088095, dated 09 / 29 / 2025, page 25 / 53 4 / 25

[0014] Calculating the brightness correction value based on the difference between the average brightness and the target brightness may include, if an image includes a plurality of target inspection areas and the brightness correction values ​​calculated for the plurality of target inspection areas are different from each other, calculating a camera exposure time adjustment value by multiplying the largest value among the brightness correction values ​​by a control constant.

[0015] The method may also include providing the calculated exposure time adjustment value from the camera to an imaging device.

[0016] The target object may include an electrode in an electrode preparation process of a battery manufacturing process.

[0017] One or more target areas for inspection may include one or more of a coated region, an uncoated region, and an insulating area of ​​an electrode, which are distinguished according to the properties of the corresponding area.

[0018] The plurality of images captured with different brightness levels may include a first image captured with a first brightness level and a second image captured with a second brightness level, and the second brightness level is different from the first brightness level.

[0019] A defect inspection of the target object in a battery manufacturing process can be performed using the target inspection area from which the brightness is corrected.

[0020] According to another embodiment of the present invention, an apparatus for inspecting an electrode during an electrode preparation process may include at least one processor; and a memory configured to store at least one instruction executed by the at least one processor, wherein the at least one instruction may include an instruction to receive a plurality of images of the appearance of a target object captured at different levels of Petition 870250088095, dated 09 / 29 / 2025, page 26 / 53 5 / 25 brightness of an imaging device; an instruction to extract one or more target inspection areas within each image; an instruction to compare the brightness of the one or more target inspection areas with a brightness threshold which is determined for each target inspection area; and an instruction to calculate a brightness correction value reflecting a target brightness to the brightness of each target inspection area based on the comparison result.

[0021] The brightness of each target inspection area can be determined for an average brightness of pixels within the target inspection area.

[0022] The instruction to compare the brightness of one or more target inspection areas with a brightness limit which is determined for each target inspection area may include an instruction to compare the average brightness of the target inspection area with a lower brightness limit value and an upper brightness limit value determined for the corresponding target inspection area.

[0023] The instruction to calculate a glare correction value reflecting a target glare to the glare of each target inspection area based on the comparison result may include an instruction to calculate the glare correction value based on a difference value between the average glare and the target glare when the average glare of the target inspection area is outside a range of the lower glare limit value to the upper glare limit value.

[0024] The instruction to calculate the brightness correction value based on a difference value between the average brightness and the target brightness may include an instruction to calculate a camera exposure time adjustment value calculated by multiplying the difference between the average brightness and the target brightness by a control constant.

[0025] The instruction to calculate the brightness correction value based on a difference value between the average brightness and the target brightness may include an instruction for, if an image includes a plurality of Petition 870250088095, dated 09 / 29 / 2025, page 27 / 53 If 6 / 25 target inspection areas and the brightness correction values ​​calculated for the plurality of target inspection areas are different from each other, calculate a camera exposure time adjustment value by multiplying the largest value among the brightness correction values ​​by a control constant.

[0026] At least one instruction may also include an instruction to provide the calculated camera exposure time adjustment value to the imaging device.

[0027] One or more target areas for inspection may include one or more of a coated region, an uncoated region, and an insulating area of ​​an electrode, which are distinguished according to the properties of the corresponding area.

[0028] The plurality of images captured with different brightness levels may include a first image captured with a first brightness level and a second image captured with a second brightness level, and the second brightness level is different from the first brightness level.

[0029] Meanwhile, at least one instruction may still include an instruction to perform a defect inspection of the target object during a battery manufacturing process, using the target inspection area from which brightness is corrected. ADVANTAGEOUS EFFECTS

[0030] According to the embodiments of the present invention described above, the brightness of an inspection image can be automatically corrected in real time in a battery electrode image inspection, thereby achieving quantification and automation of image quality management.

[0031] Furthermore, electrode inspection can be performed without stopping the manufacturing equipment, according to the embodiments of the present invention described above, and thus, damage due to equipment downtime can be avoided. Petition 870250088095, dated 09 / 29 / 2025, page 28 / 53 7 / 25

[0032] Furthermore, the risk of over-inspection and under-inspection due to human error in existing manual work can be eliminated. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] Figure 1 is a schematic diagram of a battery manufacturing process to which the present invention can be applied.

[0034] Figure 2 is a conceptual diagram of a cutting process to which the present invention can be applied.

[0035] Figures 3A and 3B illustrate examples of target inspection areas of an electrode inspection apparatus, according to the embodiments of the present invention.

[0036] Figure 4 is a schematic flowchart of an image brightness correction method, according to the embodiments of the present invention.

[0037] Figure 5 is a table showing the inspection items in each image, according to the embodiments of the present invention.

[0038] Figure 6 is a table that presents the items to be detected through each image inspection, according to the modalities of the present invention.

[0039] Figure 7 shows the detection items in each image inspection, which are displayed in a real image, according to the embodiments of the present invention.

[0040] Figure 8 shows an example of a brightness correction method for an image that has low brightness, according to the embodiments of the present invention.

[0041] Figure 9 is a block diagram of an electrode inspection apparatus, according to the embodiments of the present invention. BEST WAYS TO IMPLEMENT THE INVENTION

[0042] The present invention can be modified in various ways and have various embodiments, and specific embodiments thereof are Petition 870250088095, dated 09 / 29 / 2025, p. 29 / 53 8 / 25 shown by way of example in the drawings and will be described in detail below. It should be understood, however, that there is no intention to limit the present invention to specific embodiments, but rather, the present invention is to cover all modifications, equivalents and alternatives that fall within the spirit and technical scope of the present invention. Equal reference numbers refer to identical elements throughout the description of the figures.

[0043] It will be understood that, although terms such as first, second, A, B and the like may be used herein to describe various elements, these elements should not be limited by these terms. These terms are only used to distinguish one element from another. For example, a first element may be called a second element and, similarly, a second element may be called a first element, without departing from the scope of the present invention. As used herein, the term and / or includes combinations of a plurality of associated listed items or any one of the plurality of associated listed items.

[0044] It will be understood that when an element is referred to as being coupled or connected to another element, it may be directly coupled or connected to the other element, or an intervening element may be present. In contrast, when an element is referred to as being directly coupled or connected to another element, there is no intervening element present.

[0045] The terms used herein are for the purpose of describing specific embodiments only and are not intended to limit the present invention. As used herein, the singular forms a, an and the are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will further be understood that the terms comprise, including, include, and / or having, Petition 870250088095, dated 09 / 29 / 2025, p. 30 / 53 9 / 25 when used here, specify the presence of declared features, integers, steps, operations, constitutional elements, components and / or combinations thereof, but do not preclude the presence or addition of one or more other features, integers, steps, operations, constitutional elements, components and / or combinations thereof.

[0046] Unless otherwise defined, all terms used herein, including technical and scientific terms, have the same meanings commonly understood by one skilled in the art to which the present invention pertains. It shall further be understood that terms, such as those defined in commonly used dictionaries, shall be interpreted as having meanings that are consistent with their meanings in the context of the relevant art and shall not be interpreted in an idealized or overly formal sense, unless expressly so defined herein.

[0047] Hereafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings.

[0048] Figure 1 is a schematic diagram of a battery manufacturing process to which the present invention can be applied.

[0049] The battery can be manufactured through an electrode preparation process S10, an assembly process S20, and an activation / inspection process S30. The battery, completed through these processes, can be shipped in the form of a battery pack (or battery module), including a plurality of battery cells connected in series. The battery pack can be connected to a load via a positive and a negative terminal and can perform charge / discharge operations. Battery packs can be configured to be connected in series / parallel, according to the requirements of a system to which the battery is applied. Petition 870250088095, dated 09 / 29 / 2025, page 31 / 53 10 / 25

[0050] More specifically, the electrode preparation process S10 can proceed in the following order: a 'mixing process' to mix the raw materials, a 'coating process' to apply the mixed paste to a sheet and dry it, a 'roller pressing process' to compress the electrode to reduce its thickness, a 'cutting process' to cut the electrode to a predefined width, and a 'notching process' to create a tab in the electrode.

[0051] Here, the cutting process is a process of cutting the electrode according to the size of the battery, after the electrode has been finely spread by the roller pressing process, which is a process of cutting the electrode vertically using a cutter according to the specifications of the designed battery. The blade for the cutting process may vary depending on the size of the battery cell to be manufactured.

[0052] The S20 assembly process is a process of assembling the positive and negative plates manufactured through the electrode preparation process, along with a separator, to make a finished cell. The manufacturing order of the assembly process may differ depending on the type of battery (cylindrical, pouch, prismatic), and the technologies applied by each manufacturer may also differ.

[0053] In addition, the S30 activation / inspection process is a process of activating electrical energy and verifying stability. The activation process can be performed by repeating aging and charging / discharging. In the 'aging' process, the battery is stored at room temperature with a certain temperature and humidity, so that the electrolyte permeates the positive and negative electrodes. When the electrolyte is dispersed within the battery and the movement of ions between the positive and negative electrodes becomes smooth, the battery is partially charged to activate the cell. Here, lithium ions move to the negative electrode and the electrolyte is decomposed, forming a Petition 870250088095, dated 09 / 29 / 2025, page 32 / 53 11 / 25 thin solid ion-conducting film, called 'Solid Electrolyte Interface (SEI)', on a surface of the negative electrode.

[0054] Subsequently, the battery that has gone through the activation process is tested for charging capacity and goes through a screening process for defective batteries before being shipped.

[0055] The image brightness correction method, according to the present invention, can be applied to an electrode preparation process, specifically to a cutting process, during the battery manufacturing process.

[0056] Figure 2 is a conceptual diagram of a cutting process to which the present invention can be applied.

[0057] The cutting process can be performed on a jumbo roll, which is a form in which a finely spread electrode, which is discharged through a roll pressing process, is wound. An electrode sheet, onto which the electrode active material is applied and dried, is wound in a roll form on the jumbo roll. Here, it is preferable to understand that the electrode sheet onto which the electrode active material is applied and dried is a coated electrode sheet onto which a coating process is completed.

[0058] The electrode (positive electrode plate or negative electrode plate) to be inspected during a battery cutting process according to the embodiments of the present invention is configured to include an active material coated region in which a paste of active material is coated onto a thin film of aluminum or copper, an uncoated region, and an insulating area in which an insulating material is attached or coated.

[0059] For a cutting process, an electrode sheet wound on a roll form is unwound by rotation. Referring to Figure 2, the jumbo roll 10 is unwound by rotation of the unwinding roll U, and the unwound electrode is cut by a cutting device equipped Petition 870250088095, dated 09 / 29 / 2025, p. 33 / 53 12 / 25 for each cutting track in the return process, to form a plurality of unit electrode plates. Each of the plurality of unit electrode plates is wound by a rewinder. The rewinder may include a cylindrical winding core C for winding the unit electrode plates.

[0060] As shown in Figure 2, as the cutting process progresses, a unit electrode roll P; (also known as a pancake) can be produced for each cutting track. Meanwhile, the cutting process may include not only a first cutting process to cut the jumbo roll into a plurality of unit electrode sheets, but also a second cutting process to further cut a unit electrode sheet to form a plurality of subunit electrode sheets, in which case a subunit electrode roll may be formed as a result of the cutting process.

[0061] Figure 3A and Figure 3B illustrate examples of target inspection areas of an electrode inspection apparatus according to the embodiments of the present invention.

[0062] The electrode being an inspection target of the electrode inspection apparatus according to the embodiments of the present invention may be a positive electrode or a negative electrode. Figure 3A illustrates an example of a positive electrode for a stacked electrode array and Figure 3B illustrates an example of a positive electrode for a jelly-roll type electrode array.

[0063] Referring to Figure 3A, the positive electrode 100 may include a positive electrode current collector 110 and a positive electrode tab 120 projecting from the positive electrode current collector 110. An insulating region 130 may be formed at a boundary between a positive electrode mixture application region (or coated region) 111, in which a positive electrode mixture 140 is applied, and a Petition 870250088095, dated 09 / 29 / 2025, page 34 / 53 13 / 25 uncoated positive electrode region 112, in which a positive electrode mixture 140 is not applied, in the positive electrode current collector 110. The positive electrode tab 120, in which the positive electrode mixture is not applied, can also be considered as part of the uncoated positive electrode region. In the example of Figure 3A, the insulating region 130 can be formed in the entire uncoated positive electrode region 112, but the insulating region can be formed only in a part of the uncoated positive electrode region of the positive electrode current collector.

[0064] Furthermore, the positive electrode 200 illustrated in Figure 3B can be a positive electrode for a jelly-roll type electrode assembly. The insulating region 230 can be formed at the boundary between the coated positive electrode region 211, where the positive electrode mixture 240 is applied, and the uncoated region 212, where the positive electrode mixture 240 is not applied, on the current collector (aluminum foil), and a positive electrode tab 220 can be attached in an upward protruding form to the end of the uncoated region 212.

[0065] In Figures 3A and 3B, the insulating region 130, 230 can prevent a short circuit due to contact between the positive and negative electrodes, thereby improving the safety of the secondary battery.

[0066] The target inspection area according to the embodiments of the present invention may include one or more areas included in an electrode placed under an electrode preparation process of the battery manufacturing process. More specifically, the target inspection area according to the embodiments of the present invention may include one or more regions, among a coated region, an uncoated region and an insulating region of the electrode, which are classified according to the properties of the regions. When images of the coated region, Petition 870250088095, dated 09 / 29 / 2025, page 35 / 53 14 / 25 of the uncoated region and the insulating region of the electrode are analyzed; the brightness of each region may appear different due to the properties of the regions.

[0067] Figure 4 is a schematic flowchart of an image brightness correction method according to embodiments of the present invention.

[0068] The image brightness correction method according to the embodiments of the present invention can be performed by an electrode inspection apparatus according to the embodiments of the present invention. The electrode inspection apparatus may include or be connected to an image generation device (image capture device), i.e., an optical system, and an image of an inspection target may be acquired by the image generation device.

[0069] Referring to Figure 4, the electrode inspection apparatus can acquire a plurality of images of the appearance of an inspection target object captured at different brightness levels by an image-generating device, i.e., an S310 camera. According to embodiments of the present invention, the inspection target object can be an electrode (positive electrode or negative electrode) in an electrode preparation process of a battery manufacturing process.

[0070] Here, the plurality of images captured at different brightness levels may include a first image captured at a first brightness level and a second image captured at a second brightness level. The reason for capturing the same target object at different brightness levels is that the brightness levels suitable for identification and analysis are different depending on the characteristics of the plurality of target inspection areas included in the target object. Therefore, a detection factor to be analyzed and detected through the first image and a detection factor to be Petition 870250088095, dated 09 / 29 / 2025, page 36 / 53 15 / 25 analyzed and detected through the second image may be different.

[0071] For example, when the first image is a relatively bright image and the second image is a relatively dark image, a coated region and an uncoated region can be extracted as target inspection areas in the first image. Furthermore, an insulating region and an uncoated region can be extracted as target inspection areas in the second image.

[0072] The electrode inspection apparatus can extract one or more target inspection areas from the acquired S320 image. Here, the target inspection area (Region of Interest: ROI) represents an area where the actual inspection will be performed on the inspection image. According to embodiments of the present invention, the target inspection area may include one or more areas between a coated region, an uncoated region, and an insulating region of the electrode.

[0073] The electrode inspection device can also calculate the brightness of each extracted S330 inspection target area. More specifically, the brightness of the coated region, the brightness of the uncoated region, and the brightness of the insulating region on the electrode can be calculated, respectively. Here, the brightness of each inspection area can be calculated as an average value by converting the image to grayscale and calculating the brightness values ​​of all pixels included in the corresponding inspection area.

[0074] The electrode inspection apparatus can determine whether the calculated brightness of each inspection target area is within the brightness limit range defined for each inspection target area S340. The brightness limit range determined for each inspection target area can be defined by an upper limit and a lower limit. The brightness limit range will be described in detail with reference to Figures 5 and 6 below. Petition 870250088095, dated 09 / 29 / 2025, page 37 / 53 16 / 25

[0075] The electrode inspection device can calculate a brightness correction value by reflecting the target brightness to the brightness of the inspection target area based on the comparison result with a brightness limit S350. In other words, if the average brightness of the inspection target area is outside the range of the lower limit to the upper brightness limit, the electrode inspection device can calculate a brightness correction value based on a difference value between the average brightness of the inspection target area and the target brightness.

[0076] The calculated brightness correction value can be transmitted to the S360 imaging device and can be used for the next generation of images of the inspection target object.

[0077] Figure 5 is a table showing the inspection items in each image, according to the embodiments of the present invention.

[0078] The first image according to embodiments of the present invention may be an image that has a first brightness, and the second image may be an image that has a second brightness. The second brightness has a different brightness from the first brightness and may have a lower brightness than the first brightness. In other words, the first image and the second image are images of the same object captured with different brightness levels.

[0079] In the table in Figure 5, the first image may be a relatively bright image and the second image may be a relatively dark image.

[0080] In the first image according to the embodiments of the present invention, the coated region and the uncoated region can be extracted as target inspection areas. Furthermore, the insulating region and the uncoated region can be extracted as target inspection areas in the second image.

[0081] In each image, the lower brightness limit (LCL) and the limit Petition 870250088095, dated 09 / 29 / 2025, pp. 38 / 53 A maximum brightness of 17 / 25 (UCL) for the target inspection area can be set. In other words, in the first image, the lower brightness limit (LCL) of the coated region is set to 90 and the upper brightness limit (UCL) of the coated region is set to 110, while the lower brightness limit (LCL) of the uncoated region is set to 250 and the upper brightness limit (UCL) of the uncoated region is set to 255. In the first image, the target brightness of the coated part is set to 100 and the target brightness of the uncoated region is set to 255.

[0082] Meanwhile, in the second image, the lower brightness limit (LCL) of the insulating region is set to 40 and the upper brightness limit (UCL) of the insulating region is set to 60, while the lower brightness limit (LCL) of the uncoated region is set to 130 and the upper brightness limit (UCL) of the uncoated region is set to 230.In the second image, the target brightness of the insulating region is set to 50, and the target brightness of the uncoated region is set to 180.

[0083] For the same uncoated region, the upper brightness limit (UCL), the lower brightness limit (LCL), and the target brightness are set differently in the first image and the second image, because the overall brightness of the first image and the overall brightness of the second image are set differently.

[0084] Figure 6 is a table that presents the items to be detected through each image inspection, according to the modalities of the present invention.

[0085] Referring to Figure 6, the items to be detected through the first image in embodiments of the present invention may include a second cutting edge to measure a second cutting width and surface defects of a coated region and an uncoated region. Furthermore, the items to be detected through the second image may include a first cutting edge to measure a first cutting width, a boundary between the coated region and the uncoated region. Petition 870250088095, dated 09 / 29 / 2025, page 39 / 53 18 / 25 coated, an edge of an insulating region and a surface defect of the insulating region.

[0086] Here, the electrode cutting process can be configured to include a first cut and a second cut. Meanwhile, the first cutting process can be understood as a process of cutting a jumbo roll into a plurality of unit electrode sheets (e.g., four unit electrode sheets), and the second cutting process can be understood as a further cutting process of a unit electrode sheet to form a plurality of subunit electrode sheets.

[0087] Figure 7 shows the detection items in each image inspection which are displayed in a real image according to the embodiments of the present invention.

[0088] In Figure 7, the first image 71 and the second image 72 are images acquired by photographing the same target object at different brightness levels. The first image 71 is brighter than the second image 72 and is suitable for detecting surface defects in the coated region and surface defects in the uncoated region. Meanwhile, the second image 72 is darker than the first image and is suitable for detecting the boundary between the coated and uncoated regions, the edge of the insulating region, and surface defects in the insulating region.

[0089] Figure 8 shows an example of a brightness correction method for an image that has relatively low brightness, according to embodiments of the present invention.

[0090] The brightness correction method in Figure 8 shows an operational sequence of the brightness correction method applied to a relatively bright image among multiple images acquired at different brightnesses for the same target object, and can be understood as a flowchart showing some steps of the entire method. Petition 870250088095, dated 09 / 29 / 2025, pages 40 / 53 19 / 25 Figure 4 in more detail for a specific image. In other words, some steps of the method illustrated in Figure 8 may overlap with some steps of the brightness correction method illustrated in Figure 4.

[0091] The image brightness correction method according to the embodiments of the present invention can be performed by the electrode inspection apparatus according to the embodiments of the present invention. The electrode inspection apparatus may include an image generation device, for example, an optical system, or it may be connected to the optical system, and images of the inspection target may be acquired by the image generation device.

[0092] As mentioned above, the target inspection areas for relatively bright images are the coated region and the uncoated region, according to the embodiments of the present invention.

[0093] In other words, the electrode inspection device can extract a coated region and an uncoated region, which are the target inspection areas, from the acquired image, and calculate a brightness value for each area S331. The calculated brightness value of the uncoated region can be compared with the upper brightness limit (UCL) and lower brightness limit (LCL) of the uncoated region, and the calculated brightness value of the coated region can be compared with the upper brightness limit (UCL) and lower brightness limit (LCL) of the coated region S341. If the brightness value of each area is within the defined standard range (appropriate range determined) (Yes in S341), the brightness value control procedure is not necessary, so the procedure can be terminated.

[0094] On the other hand, if the gloss value of the uncoated region or the gloss value of the coated region is outside the standard range, it is determined whether the gloss value of the uncoated region is outside the standard range S342 or whether the gloss value of the coated region is outside the standard range S343. Petition 870250088095, dated 09 / 29 / 2025, pp. 41 / 53 20 / 25

[0095] If the gloss value of the uncoated region is not within the standard range (Not in S342), the gloss correction value of the uncoated region can be determined according to a difference between the current gloss value of the uncoated region and the target gloss value of the uncoated region S351. More specifically, (target gloss value of the uncoated region - current gloss value of the uncoated region) can be determined as the gloss correction value of the uncoated region. Here, if the current gloss value of the uncoated region exceeds the upper limit value of the uncoated region, the gloss correction value becomes a negative value. Conversely, if the current gloss value of the uncoated region is less than the lower limit value of the uncoated region, the gloss correction value becomes a positive value.Meanwhile, if the brightness value of the uncoated region is within the standard range (Yes in S342), the brightness correction value of the uncoated region is set to 0 in S352.

[0096] Subsequently, if the gloss value of the coated region is not within the standard range (No in S343), the gloss correction value of the coated region can be defined according to the difference between the current gloss value of the coated region and the target gloss value of the coated region S353. More specifically, (target gloss value of the coated region - current gloss value of the coated region) is defined as the gloss correction value. If the current gloss value of the coated region exceeds the upper limit value of the coated region, the gloss correction value becomes a negative value, and conversely, if the current gloss value of the coated region is less than the lower limit value of the coated region, the gloss correction value becomes a positive value. On the other hand, if the gloss value of the coated region is within the standard range (Yes in S343), the gloss correction value of the coated region is defined as 0 S354. Petition 870250088095, dated 09 / 29 / 2025, pp. 42 / 53 21 / 25

[0097] Thus, a camera exposure time adjustment value can be calculated based on the brightness correction value of the uncoated region and the brightness correction value of the coated region (S360). More specifically, the camera exposure time adjustment value can be calculated by multiplying the larger of the brightness correction value of the uncoated region and the brightness correction value of the coated region by a control constant. Here, the control constant can be a constant to compensate for the difference in the unit of expression between the brightness correction value and the exposure time adjustment value. Meanwhile, if the correction value is a negative value, the value with the larger absolute value is selected and multiplied by the control constant, and the selected camera exposure time adjustment value is calculated.

[0098] The calculated camera exposure time adjustment value can be provided to a camera, and the camera can adjust the brightness of the image to be captured by applying the exposure time adjustment value to the next capture of the target object. Here, the total amount of light received by a camera sensor can be expressed as the product of the exposure time and the area receiving light. Therefore, if the camera exposure time is increased, the brightness of the image can also be increased.

[0099] Meanwhile, steps S331 to S360 of the image brightness correction method described in Figure 8 above can be repeatedly performed until the image brightness of each target area satisfies an appropriate range, i.e., a defined standard range.

[0100] Figure 9 is a block diagram of an electrode inspection apparatus according to embodiments of the present invention.

[0101] An electrode inspection apparatus 900 according to embodiments of the present invention may be a device for inspecting an electrode under an electrode preparation process of a Petition 870250088095, dated 09 / 29 / 2025, pages 43 / 53 22 / 25 battery manufacturing process and may include at least one 910 processor, a 920 memory configured to store at least one instruction executed by the processor, and a 930 transceiver connected to a network and performing communication.

[0102] An electrode inspection apparatus according to embodiments of the present invention may be connected to an imaging device configured to capture the external appearance of a target object or may include such an imaging device.

[0103] Herein, at least one instruction may include an instruction to receive a plurality of images of the appearance of a target object captured at different brightness levels from an imaging device; an instruction to extract one or more target inspection areas within each image; an instruction to compare the brightness of the one or more target inspection areas with a brightness threshold which is determined for each target inspection area; and an instruction to calculate a brightness correction value reflecting a target brightness to the brightness of each target inspection area based on the comparison result.

[0104] The brightness of each target inspection area can be determined for an average brightness of pixels within the target inspection area.

[0105] The instruction to compare the brightness of one or more target inspection areas with a brightness limit which is determined for each target inspection area may include an instruction to compare the average brightness of the target inspection area with a lower brightness limit value and an upper brightness limit value determined for the corresponding target inspection area.

[0106] The instruction to calculate a glare correction value reflecting a target glare to the glare of each target inspection area based on the comparison result may include an instruction to calculate the glare correction value based on a difference value. Petition 870250088095, dated 09 / 29 / 2025, pp. 44 / 53 23 / 25 between the average brightness and the target brightness when the average brightness of the target inspection area is outside a range from the lower brightness limit value to the upper brightness limit value.

[0107] The instruction to calculate the brightness correction value based on a difference value between the average brightness and the target brightness may include an instruction to calculate a camera exposure time adjustment value calculated by multiplying the difference between the average brightness and the target brightness by a control constant.

[0108] The instruction to calculate the brightness correction value based on a difference value between the average brightness and the target brightness may include an instruction that, if an image includes a plurality of target inspection areas and the brightness correction values ​​calculated for the plurality of target inspection areas are different from each other, to calculate a camera exposure time adjustment value by multiplying the largest value among the brightness correction values ​​by a control constant.

[0109] At least one instruction may also include an instruction to provide the calculated camera exposure time adjustment value to the imaging device.

[0110] One or more target areas for inspection may include one or more of a coated region, an uncoated region, and an insulating area of ​​an electrode, which are distinguished according to the properties of the corresponding area.

[0111] The plurality of images captured with different brightness levels may include a first image captured with a first brightness level and a second image captured with a second brightness level, and the second brightness level is different from the first brightness level.

[0112] Meanwhile, at least one instruction may still include an instruction to perform a defect inspection of the target object during a battery manufacturing process, using the target area of Petition 870250088095, dated 09 / 29 / 2025, pages 45 / 53 24 / 25 inspection where the brightness is corrected.

[0113] The electrode inspection apparatus 900 may also include an input interface device 940, an output interface device 950, a storage device 960, etc. The respective components included in the electrode inspection apparatus 900 may be connected by a bus 970 and communicate with each other.

[0114] The storage device 960 can store a plurality of images captured by the image generation device and at least one image produced at each stage of the inspection method, according to the embodiments of the present invention. The images stored in the storage device 960 can be provided to at least one processor 910, when necessary, during the execution of the method, according to the embodiments of the present invention.

[0115] Here, the 910 processor may mean a central processing unit (CPU), a graphics processing unit (GPU), or a dedicated processor on which the methods according to the embodiments of the present invention are performed. The memory (or storage device) may be configured as at least one volatile storage medium and one non-volatile storage medium. For example, the memory may include at least one read-only memory (ROM) and random access memory (RAM).

[0116] The operations of the method according to the embodiments of the present invention can be implemented as a computer-readable program or code on a computer-readable recording medium. The computer-readable recording medium includes all types of recording devices in which data readable by a computer system is stored. Furthermore, the recording medium Petition 870250088095, dated 09 / 29 / 2025, pages 46 / 53 A computer-readable 25 / 25 file can be distributed across a networked computer system to store and execute computer-readable programs or code in a distributed manner.

[0117] Although some aspects of the invention have been described in the context of the apparatus, this may also represent a description according to a corresponding method, wherein a block or apparatus corresponds to a method step or feature of a method step. Similarly, aspects described in the context of a method may also represent a feature of a corresponding block or item or of a corresponding apparatus. Some or all of the method steps may be performed by (or using) a hardware device, such as, for example, a microprocessor, a programmable computer, or an electronic circuit. In some embodiments, one or more of the most important method steps may be performed by such an apparatus.

[0118] In the above, the present invention has been described with reference to the exemplary embodiment of the present invention, but those skilled in the art may appreciate that the present invention can be variously corrected and altered within the scope, without departing from the spirit and area of ​​the present invention described in the appended claims. Petition 870250088095, dated 09 / 29 / 2025, pp. 47 / 53

Claims

1 / 5 CLAIMS 1. A method for correcting image brightness, characterized in that it comprises: acquiring a plurality of images of the appearance of a target object captured at different brightness levels, respectively; extracting one or more target inspection areas within each image; comparing brightnesses of one or more target inspection areas with a brightness threshold which is predetermined for each target inspection area; and calculating a brightness correction value by comparing a target brightness with the brightness of each target inspection area based on a comparison result.

2. A method according to claim 1, characterized in that the brightness of each target inspection area is an average brightness of pixels within the target inspection area.

3. Method, according to claim 2, characterized in that the comparison of the brightness of one or more target inspection areas with the brightness limit includes: comparing the average brightness of the target inspection area with a lower brightness limit value and an upper brightness limit value for the corresponding target inspection area.

4. Method according to claim 3, characterized in that the calculation of the glare correction value by comparing the target glare with the glare of each target inspection area includes: calculating the glare correction value based on a difference value between the average glare and the target glare when the average glare of the target inspection area is outside a range of the lower glare limit value to the upper glare limit value. Petition 870250088095, dated 09 / 29 / 2025, p. 48 / 53 2 / 5 5. Method, according to claim 4, characterized in that the calculation of the brightness correction value based on the difference value between the average brightness and the target brightness includes: calculating a camera exposure time adjustment value by multiplying the difference value by a control constant.

6. Method according to claim 4, characterized in that the calculation of the brightness correction value based on the difference value between the average brightness and the target brightness includes: if an image includes a plurality of target inspection areas and the brightness correction values ​​calculated for the plurality of target inspection areas are different from each other, calculate a camera exposure time adjustment value by multiplying the largest value of the brightness correction values ​​by a control constant.

7. Method according to claim 6, characterized in that it further includes providing the camera exposure time adjustment value to an image-generating device.

8. Method according to claim 1, characterized in that the target object includes an electrode in an electrode preparation process of a battery manufacturing process.

9. Method according to claim 1, characterized in that the one or more target inspection areas include one or more coated regions, an uncoated region, or an insulating area of ​​an electrode.

10. Method according to claim 1, characterized in that the plurality of images includes a first image captured with a first brightness and a second image captured with a second brightness, wherein the second brightness is different from the first brightness. Petition 870250088095, dated 09 / 29 / 2025, p. 49 / 53 3 / 5 11. Method, according to claim 1, characterized in that it further comprises performing a defect inspection of the target object in a battery manufacturing process using one or more target inspection areas.

12. Apparatus for inspecting an electrode during an electrode preparation process of a battery manufacturing process, the apparatus characterized in that it comprises: at least one processor; and a memory configured to store at least one instruction executed by the at least one processor, wherein the at least one instruction includes: an instruction to receive a plurality of images of the appearance of a target object captured at different brightness levels from an imaging device, respectively; an instruction to extract one or more target inspection areas within each image; an instruction to compare the brightness of the one or more target inspection areas with a brightness threshold which is predetermined for each target inspection area; and an instruction to calculate a brightness correction value by comparing a target brightness with the brightness of each target inspection area based on a comparison result.

13. Apparatus, according to claim 12, characterized in that the brightness of each target inspection area is an average brightness of pixels within the target inspection area.

14. Apparatus, according to claim 13, characterized in that the instruction for comparing the brightness of one or more target inspection areas with a brightness limit includes: an instruction for comparing the average brightness of the target inspection area with a lower brightness limit value and an upper brightness limit value for the corresponding target inspection area.

15. Apparatus, according to claim 14, characterized in that the instruction for calculating the glare correction value by comparing the target glare with the glare of each target inspection area based on the comparison result includes: an instruction for calculating the glare correction value based on a difference value between the average glare and the target glare when the average glare of the target inspection area is outside a range of the lower limit value of glare to the upper limit value of glare.

16. Apparatus, according to claim 15, characterized in that the instruction for calculating the brightness correction value based on a difference value between the average brightness and the target brightness includes: an instruction for calculating a camera exposure time adjustment value by multiplying the difference value by a control constant.

17. Apparatus, according to claim 15, characterized in that the instruction for calculating the brightness correction value based on a difference value between the average brightness and the target brightness includes: an instruction for, if an image includes a plurality of target inspection areas and the brightness correction values ​​calculated for the plurality of target inspection areas are different from each other, calculating a camera exposure time adjustment value by multiplying the largest value of the brightness correction values ​​by a control constant.

18. Apparatus according to claim 17, characterized in that at least one instruction further includes: an instruction for providing the camera exposure time adjustment value to the image-generating device. Petition 870250088095, dated 09 / 29 / 2025, pp. 51 / 53 5 / 5 19. Apparatus, according to claim 12, characterized in that the one or more target areas for inspection include one or more coated regions, an uncoated region, or an insulating area of ​​an electrode.

20. Apparatus, according to claim 12, characterized in that the plurality of images includes a first image captured with a first brightness and a second image captured with a second brightness, wherein the second brightness is different from the first brightness.

21. Apparatus, according to claim 12, characterized in that at least one instruction further includes: an instruction to perform a defect inspection on the target object during a battery manufacturing process using one or more target inspection areas. Petition 870250088095, dated 09 / 29 / 2025, pp. 52 / 53

Images