High energy photon systems and methods for element detection

Abstract

A system for analyzing samples and detecting materials is disclosed. The system includes a high energy photon emission assembly that is configured to emit source photons having respective energies above the absorption energy of a material of interest, such as the K lines of gold, along an emission axis. A sample container is configured to receive a core or rock sample, wherein the sample container is positioned to receive the source photons from the high energy' photon emission assembly.

Description

HIGH ENERGY PHOTON SYSTEMS AND METHODS FOR ELEMENT DETECTIONCROSS-REFERENCE TO RELATED APPLICATIONS

[0001] This application claims priority to and the benefit of the filing date of U.S. Provisional Patent Application No. 63 / 560,515, filed March 1, 2024, the entirety of which is hereby incorporated by reference herein.FIELD

[0002] The present disclosure relates to systems and methods for analyzing material samples and, more particularly, to systems and methods for analyzing material samples using high energy photons.BACKGROUND

[0003] Typically, analysis of core or rock (or other material) samples requires shipping of the samples to a distant laboratory, where the samples are cut and then either crushed or scanned in a controlled environment by specially trained personnel. This analysis process is frequently associated with lengthy sample handling times, delays caused by limited access to the laboratory or limited trained personnel, and delays caused by detailed analysis and reporting. Consequently, from the time the core sample is obtained, it often takes months to complete the analysis of a core or rock sample. Thus, the core or rock analysis process is not integrated into the conventional drilling workflow process. Rather, it is a separate process that frequently encounters extensive delays.

[0004] Additionally, existing systems for analyzing core or rock samples typically require extensive user training and certification before the systems can be used. Further, although comparative core analysis methods rely on the objective consistency of the location of sample points, existing core analysis systems make it nearly impossible to repeat sampling from a consistent location. Still further, existing portable core analysis systems lack appropriate methods and sufficient precision to produce meaningful data, whereas larger, more powerful core analysis systems require installation in laboratories with controlled environments, where only trained technicians are authorized to work.

[0005] Still further, gold is particularly difficult to detect and ty pically requires extensive laboratory7analysis and destructive testing, thereby allowing no efficient means fordetermining its presence in a material sample. Further, the conventional manual processes for detecting gold are subject to human error.

[0006] Thus, there is a need for systems and methods that address one or more of the deficiencies of known systems and methods for analyzing core or rock samples. For example, there is a need for material analysis systems and methods that are integral to the overall drilling workflow process and designed for operation by a member of the drilling team. As another example, there is a need for fully integrated, autonomous material analysis systems and methods that provide repeatable, location-identified, quantifiable sample data that can be produced in a time window (e.g., within minutes or hours) that is far less than that required to complete conventional material sample analysis. As yet another example, there is a need for a system and a method for detecting gold (or other elements) in a material (e.g., core or rock) sample or in a wall of a formation or in an underground drive, pit bench, or stockpile. Still further, there is a need to detect gold in waste throughout the steps of mining and refining (e.g., during bulk sorting, feed tracking, and tailings discharge) to ensure process optimization.SUMMARY

[0007] Described herein, in various aspects, is a system for analyzing samples and detecting materials. The system includes a high energy photon emission assembly that is configured to emit source photons along an emission axis. The high energy photon emission assembly includes a tube assembly. The tube assembly includes a target material and a cathode. The tube assembly is configured to emit electrons having respective energies of at least 150 keV at the target material from the cathode. A sample container is configured to receive a core or rock sample, wherein the sample container is positioned to receive the source photons from the high energy photon emission assembly.

[0008] Also disclosed herein is a method including the steps of bombarding a target material with electrons having energies of at least 150 keV; emitting a beam of photons at a core or rock sample; and receiving, by a photon detector, photons from the core or rock sample.

[0009] Also disclosed herein is a filter including a plurality of materials. The plurality of materials include a first filter material configured to provide characteristic K-lines and a second filter material, wherein the second filter material having an absorption edge of a lower energy than the characteristic K-lines of the first filter material.DESCRIPTION OF THE DRAWINGS

[0010] FIG. 1A is a rear perspective view of a core analysis system as disclosed herein. FIG. IB is a top view of the core analysis system of FIG. 1A. FIG. 1C is a front perspective view of the core analysis system of FIG. 1A.

[0011] FIG. 2A is a top view of an exemplary material analysis system as disclosed herein. FIG. 2B is a side perspective view of the material analysis system of FIG. 2A. FIG. 2C is a left side elevational view of the material analysis system of FIG. 2A. FIG. 2D is a front elevational view of the material analysis system of FIG. 2A. FIG. 2E is a cross- sectional view of the material analysis system of FIG. 2A, taken at line A-A depicted in FIG. 2D.

[0012] FIG. 3 is a schematic diagram depicting electrical communication between a material analysis assembly, a central database, and consumers as disclosed herein.

[0013] FIG. 4 is a schematic diagram depicting the flow of material samples through an exemplary material analysis sy stem as disclosed herein.

[0014] FIG. 5 is a schematic diagram depicting an exemplary data network arrangement for use with the material analysis system as disclosed herein.

[0015] FIG. 6A is a schematic diagram depicting the communication between components of an exemplary material analysis system as disclosed herein. FIG. 6B is a schematic diagram depicting the communication between the processing components of an exemplary material analysis system and various actuators positioned throughout the system.

[0016] FIGS. 7A-7B are images of exemplary displays of core sample segments on a core box as disclosed herein. As shown, a system operator can use a human machine interface to select or ‘‘tag” portions of the material sample segments for exclusion from analysis as further disclosed herein.

[0017] FIGS. 8A-8B are left and right perspective views of an exemplary trailer for enclosing and transporting an analysis assembly as disclosed herein.

[0018] FIG. 9A is a side perspective view of an exemplary verification assembly as disclosed herein, with the arm of the verification assembly positioned in an operative “presentation” position. FIG. 9B is a side perspective view of the verification assembly of FIG. 9A, with the arm of the verification assembly positioned in a rest position (and the actuator associated with the arm in an extended position). FIG. 9C is an end perspective viewof the arm and the cover of the verification assembly of FIG. 9 A as the arm approaches the cover (and prior to movement of the cover to enclose the receptacles of the arm).

[0019] FIG. 10A is an image depicting a stop projection and a locator pin of an exemplary tray adapter assembly as disclosed herein. FIG. 1 OB is an image depicting the placement of an adapter relative to the stop projection and the locator pin such that the locator pin extends through an alignment opening of the adapter.

[0020] FIG. 11 A is a top plan view of an exemplary adapter as disclosed herein. FIG.1 IB is a side elevational view of a longitudinal edge of the adapter of FIG. 11A. FIG. HC is a side elevational view of a transverse edge of the adapter of FIG. 11 A. As shown, each edge of the adapter can be folded inwardly toward an interior portion of the adapter.

[0021] FIG. 12A is an image depicting an exemplary adapter extending across two spaced input rollers as further disclosed herein. FIG. 12B is an image depicting a container (e.g., core tray) positioned within an exemplary adapter as disclosed herein.

[0022] FIG. 13 A is a perspective view of an exemplary analysis assembly having a tray centering subassembly as disclosed herein. FIG. 13B is a perspective view of the tray centering subassembly of FIG. 13 A. As shown, the tray centering subassembly can comprise first and second guides that are activated by respective actuators.

[0023] FIGS. 14A-14C show the progression of movement of a guide of the tray centering subassembly as a material container (e.g., core tray) (shown in phantom line) approaches the tray centering subassembly. More particularly, FIG. 14A depicts the tray in an elevated position and the guide in a lowered position, FIG. 14B depicts the tray in a lowered position and the guide in a raised position (to effect engagement between the guide and the tray), and FIG. 14C depicts the tray in the elevated position and the guide in the raised position.

[0024] FIG. 15 illustrates a schematic diagram of an exemplary material analysis system in accordance with embodiments disclosed herein.

[0025] FIG. 16 illustrates a schematic diagram of an exemplary material analysis system in accordance with embodiments disclosed herein.

[0026] FIG. 17 illustrates a schematic diagram of an exemplary material analysis system in accordance with embodiments disclosed herein.

[0027] FIG. 18 illustrates a schematic diagram of an exemplary material analysis system in accordance with embodiments disclosed herein.

[0028] FIG. 19 illustrates an exemplary plot of photon counts per second, corresponding to emissions and absorption edges for different materials of an exemplary filter.

[0029] FIG. 20 illustrates X-ray spectra for an exemplary sample.

[0030] FIG. 21 A illustrates a schematic diagram of an exemplary material analysis system in accordance with embodiments disclosed herein, the material analysis system having a secondary target. FIG. 21B illustrates a schematic diagram of an exemplary' material analysis system in accordance with embodiments disclosed herein, the material analysis system being free of a secondary' target.

[0031] FIG. 22 A illustrates a schematic diagram of an exemplary' material analysis system in accordance with embodiments disclosed herein, the material analysis system having a secondary target. FIG. 22B illustrates a schematic diagram of an exemplary’ material analysis system in accordance with embodiments disclosed herein, the material analysis system being free of a secondary target.

[0032] FIG. 23 illustrates a schematic diagram of an exemplary high energy photon source in accordance with embodiments disclosed herein.

[0033] FIG. 24 illustrates a schematic diagram of an exemplary' material analysis system that is configured for use within a borehole.

[0034] FIG. 25 illustrates a schematic diagram of an exemplary’ material analysis system that is configured to move material samples along a conveyor.

[0035] FIG. 26 is a schematic diagram of an exemplary’ material analysis system that is positioned with respect to a material refining process for analyzing a slurry comprising a material sample therein.

[0036] FIG. 27 is a schematic diagram of an exemplary material analysis system in accordance with embodiments disclosed herein.

[0037] FIG. 28 is a schematic diagram of an exemplary material analysis system having a plurality of detectors that are spaced circumferentially around a container for holding a core or rock sample (e.g., pulp)DETAILED DESCRIPTION

[0038] The present invention now will be described more fully hereinafter with reference to the accompanying drawings, in which some, but not all embodiments of the invention are shown. Indeed, this invention may be embodied in many different forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will satisfy applicable legal requirements. Like numbers refer to like elements throughout. It is to be understood that this invention is not limited to the particular methodology and protocols described, as such may vary. It is also to be understood that the terminology used herein is for the purpose of describing particular embodiments only, and is not intended to limit the scope of the present invention.

[0039] Many modifications and other embodiments of the invention set forth herein will come to mind to one skilled in the art to which the invention pertains having the benefit of the teachings presented in the foregoing description and the associated draw ings. Therefore, it is to be understood that the invention is not to be limited to the specific embodiments disclosed and that modifications and other embodiments are intended to be included within the scope of the appended claims. Although specific terms are employed herein, they are used in a generic and descriptive sense only and not for purposes of limitation.

[0040] As used herein the singular forms “a,” “an,” and “the” can optionally include plural referents unless the context clearly dictates otherwise. For example, use of the term “a sample” can represent disclosure of embodiments in which only a single such sample is provided, as well as embodiments in which a plurality of such samples are provided.

[0041] All technical and scientific terms used herein have the same meaning as commonly understood to one of ordinary skill in the art to which this invention belongs unless clearly indicated otherwise.

[0042] Ranges can be expressed herein as from “about” one particular value, and / or to “about” another particular value. When such a range is expressed, another aspect includes from the one particular value and / or to the other particular value. Similarly, when values are expressed as approximations, by use of the antecedent “about,” it will be understood that the particular value forms another aspect. It will be further understood that the endpoints of each of the ranges are significant both in relation to the other endpoint, and independently of the other endpoint. Optionally, in some aspects, when values are approximated by use of the antecedent “about,” it is contemplated that values within up to 15%, up to 10%, up to 5%, orup to 1 % (above or below) of the particularly stated value can be included within the scope of those aspects. Similarly, in some optional aspects, when values are approximated by use of the terms "approximately.” “substantially;’ or “generally,” it is contemplated that values within up to 15%, up to 10%, up to 5%, or up to 1% (above or below) of the particular value can be included within the scope of those aspects. When used with respect to an identified property or circumstance, “substantially” or “generally” can refer to a degree of deviation that is sufficiently small so as to not measurably detract from the identified property or circumstance, and the exact degree of deviation allowable may in some cases depend on the specific context. When used with respect to an angular relationship (such as, perpendicular or parallel), the terms “about,” “approximately,” “substantially,” and “generally” can encompass angular values within up to 15 degrees, up to 10 degrees, up to 5 degrees, or up to 1 degree (above or below) of the particular angular value.

[0043] As used herein, the terms “optional” or “optionally” mean that the subsequently described event or circumstance may or may not occur, and that the description includes instances where said event or circumstance occurs and instances where it does not.

[0044] The word “or” as used herein means any one member of a particular list and, unless the context indicates otherwise, in alternative aspects, can include any combination of members of that list.

[0045] The term “substantially perpendicular” is meant to indicate that elements (e.g., axes) are perpendicular within a given plane or oriented at an angle of less than 15 degrees (optionally, less than 10 degrees) from being perpendicular to each other within the given plane.

[0046] The terms “core box” and “core tray” are used interchangeably herein.

[0047] As used herein “X-ray” and “X-rays” should be understood to be associated with photons that are not limited to a particular upper energy limit. Therefore, “X-rays” can include photons having energies that are sometimes associated with gamma rays.

[0048] As used herein, “high energy photons” includes photons in and above the X-ray spectrum.

[0049] The following description supplies specific details in order to provide a thorough understanding. Nevertheless, the skilled artisan would understand that the apparatus and associated methods of using the apparatus can be implemented and used without employing these specific details. Indeed, the apparatus and associated methods can be placed intopractice by modifying the illustrated apparatus and associated methods and can be used in conjunction with any other apparatus and techniques conventionally used in the industry.Detection of Gold or Other Specific Elements within a Material Sample or Formation

[0050] Disclosed herein and with reference to FIGS. 15-18, is a high energy photon system 100 ("‘system 100”) that is configured to analyze material samples (e.g.. core or rock samples). In optional embodiments, the high energy photon system 100 can be embodied as, or form a subassembly of, a material analysis system 10, as described with reference to FIGS. 1A-14. In various other aspects, the high energy' photon system 100 can be embodied as, or form a subassembly of, various material analysis systems, including, for example, those shown and described with further reference to FIGS. 24-26.

[0051] In some aspects, the high energy photon system 100 can comprise a high energyphoton emission assembly 200 that is configured to emit source photons 201 along an emission axis 205. The system 100 can further comprise a sample container 90 that is configured to receive a core or rock sample 640. The sample container 90 can be configured support the core or rock sample(s) 640 in a position along the emission axis 205 to receive the source photons 201 from the high energy photon emission assembly 200. In various aspects, the core or rock sample can be a full core sample, a half core sample, or core or rock chunks. In additional aspects, the sample container 90 can be a container (e.g., ajar or canister) that is configured to receive pulp, dirt, rock, or the like therein. Such a container can optionally comprise polymer.

[0052] Referring also to FIG. 23, the high energy photon emission assembly 200 can comprise a tube assembly 202. The tube assembly 202 can have a vacuum therein. The tube assembly 202 can comprise a target material 204 (e.g., a primary target). A cathode (excitation source 206) can be configured to bombard the primary- target yvith electrons 208 to cause the primary- target to emit primary target photons along a first axis 203. In optional aspects, the photons from the primary target can be incident on the sample. That is, the primary' target is the only target, and the first axis is the emission axis 205. In other aspects, and as detailed further herein, the high energy photon emission assembly 200 can comprise a secondary- target that emits photons along the emission axis 205. In some aspects, the target material 204 can comprise copper. Optionally, the target material can comprise a cover material having a greater density than copper. In this way, depletion of the target material 204 can be inhibited. In some aspects, the cover material can comprise tungsten. In otheraspects, the target material can comprise depleted uranium or another heavy metal, as further disclosed herein. It is further contemplated that a radioactive source can be used as the high energy photon emission assembly instead of (or in addition to) a tube assembly 202. For example, a radioactive isotope can emit photons at or above a desired energy level for providing the high energy photons disclosed herein.

[0053] In some exemplary aspects, the tube assembly 202 can be configured to emit electrons having respective energies of at least 150 keV at the target material 204 from the cathode of the tube assembly 202. In some aspects, the tube assembly 200 can be configured to emit electrons having respective energies above 160 keV, or above 170 keV, or above 180 keV, or above 190 keV, or above 200 keV, or above 210 keV, or above 220 keV, or above 230 keV, or above 240 keV, or above 250 keV, or above 260 keV. In various aspects, the tube assembly 200 can be configured to emit electrons at the target material 204 having respective energies from 150 keV to 500 keV. or from 180 keV to 300 keV, or from 200 to 260 keV. It is contemplated that the electrons emitted can be monoenergetic at a selected energy. That is, in some aspects, the energies of the electrons are not distributed and varying across various energies within the range, but instead all electrons have substantially the same selected energy, with the selected energy’ being within the foregoing ranges.

[0054] The target material, when bombarded w ith electrons having a particular energy, can emit photons therefrom, the photons having respective energies at or below the energies of the electrons bombarding the target material 204. The photons emitted can have energies distributed across a spectrum. It is contemplated that the energy of the electrons emitted by the cathode of the tube assembly can determine the distribution of energies of the photons. It is contemplated that photons at or above a threshold energy can be used to detect certain material. For example, as further described herein, photons having energies above about 80 keV (e.g., from about 78 keV to about 81 keV, or about 80.7 keV, or at or above 80.725 keV) can interact with the K-shell electrons of gold to create signals for detecting the gold. The characteristic absorption edge of gold is 80.725 keV, so photons at or above the characteristic absorption edge can be indicative of gold. Accordingly, the tube assembly 202 can be tuned to provide a sufficient number of photons above the threshold.

[0055] Although exemplary embodiments describe detection of gold, it should be understood that the system 100 can be used to detect various other elements. For example, the system 100 can be used to detect any element having an atomic number from 59-103 (e.g., rare earth elements). Optionally, in these aspects, the system can be configured todetect the element of interest. For example, a particular element can be targeted for detection using the systems and methods described herein. In aspects in which the system 100 is configured to target a particular material for detection, the tube assembly 202 can be configured to generate sufficient numbers of photons with respective energies sufficient to exceed the binding energy7of K-shell electrons of the material targeted for detection, thereby permitting detection of photons having energies characteristic of the material targeted for detection when said material is present in a sample.

[0056] The system 10 can further comprise a photon detector 46 that is configured to produce an output in response to detection of photons 642 released by the core or rock sample, such as, for example, fluorescence and / or backscatter. The photon detector 46 can be, for example, a low-gold photon detector or no-gold detector (i.e., a detector that is free of gold). This can be advantageous for detecting gold. Conventionally, photon detectors use gold to serve as various components. However, gold in the detector can provide false signals indicative of gold in the core or rock sample. The low gold detector can comprise elements that are free of gold. For example, the low- or no-gold detector can be free of a gold header and can be free of gold wires. In some aspects, the only gold present in the low-gold detector can be in a circuit board of the detector. In some aspects, the photon detector 46 can be a silicon drift detector. In other aspects, the detector 46 can be a Cd-Te detector. In other aspects, the detector 46 can be a germanium detector. It is contemplated that the Cd-Te detector can advantageously detect higher concentrations of a particular material of interest (e.g., above 10 parts per million (ppm)), while also permitting detection at or below 1 ppm. In contrast, germanium can be particularly sensitive to detecting certain photons, but can saturate at relatively low levels, inhibiting detection of higher concentrations of the material of interest.

[0057] In additional aspects, and with reference to FIG. 28, the system 10 can comprise a plurality7of detectors 46. Optionally, the detectors 46 can be positioned circumferentially about the core or rock sample. For example, the detectors 46 can be positioned circumferentially about, and radially outwardly of, the emission axis 205. Optionally, the detectors 46 can be equally circumferentially spaced. In other aspects, the detectors 46 can be unequally circumferentially spaced. In various optional aspects, the plurality7of detectors 46 of the system can comprise from two detectors 46 to sixteen detectors. However, a system having more than sixteen detectors is further contemplated.

[0058] The photon detector 46 can be configured to receive photons 642 along a detector axis 643. The detector axis 643 can be oriented at a first angle a relative to the emission axis 205. In some exemplary aspects, the first angle a can be from 60 degrees to 120 degrees. For example, with reference to FIG. 21, the first angle a can be from about 80 to about 100 degrees, or about 90 degrees. In other aspects, and with reference to FIGS. 22A-22B, the first angle a can be from 30 degrees to 45 degrees. Optionally, in these aspects, the first angle a can be from about 36 degrees to about 42 degrees. It is further contemplated that the position of the detector relative to the material can be selected based on the type of detector. For example, a silicon drift detector can be particularly effective with a first angle a from 80 degrees to 100 degrees; a CdTe detector can be particularly effective at an acute angle (e g., from about 30 degrees to about 45 degrees. As should be understood, the emission axis 205 and the detector axis 643 need not be defined at an exact median relative to all photon travel. Rather, the emission axis can be positioned within the flow of photons, extending along a general direction of travel of a significant portion of the photons emitted from the high energy photon emission assembly 200. The detector axis 643 can be perpendicular to an aperture of the detector 46. It is further contemplated that multiple detectors can be used to increase detection of photons and, therefore increase signal associated with a material of interest. This can be particularly advantageous when the material of interest is not evenly distributed within the sample, as the signal can vary between detectors at different positions relative to the sample for unevenly distribution of the material of interest. Further, a plurality of detectors can be used to identify a location of a material of interest (e.g., gold) in a sample.

[0059] In some aspects, the detector axis 643 can intersect the emission axis 205. Optionally, in these aspects, the sample container 90 can be configured to support the core or rock sample so that the detector axis 643 intersects the emission axis 205 within an interior of the core or rock sample 640. For example, an intersection between the detector axis 643 and the emission axis 205 can be within the core or rock sample 640 and spaced from the closest exterior surface of the core or rock sample 640 by at least 5 mm. For example, in some aspects, the intersection can be spaced from the closest exterior surface of a core sample by at least 1 / 3 of the diameter of the core sample. In other aspects, the intersection between the detector axis 643 and the emission axis 205 can be at the surface of the sample. In other aspects, the intersection between the detector axis 643 and the emission axis 205 can be within 5 mm of the surface of the material, or within 4 mm of the surface of the material, or within 3 mm of the surface of the material, or within 2 mm of the surface of the material, orwithin 1 mm of the surface of the material. For example, in some aspects, the intersection between the detector axis 643 and the emission axis 205 can be from 0 to 1 mm below the surface of the sample. In some aspects, the sample container 90 can be configured to support the core or rock sample 640 so that the detector axis 643 intersects the emission axis 205 at or proximate to an axial center 641 of the core or rock sample (e.g., within 1 cm of the axial center 641). In some aspects, the axial center can be defined as a centroid of a cross section of the core or rock sample 640 taken in a plane that includes the detector axis 643 and the emission axis 205.

[0060] Referring to FIG. 17, the system 100 can comprise a detector filter 660 positioned between the core or rock sample 640 and the detector 46. The detector filter 660 can be configured to attenuate photons under a predetermined threshold. For example, the detector filter 660 can attenuate photons under 50 keV, or under 40 keV, or under 30 keV. In some aspects, the detector filter 660 can comprise copper and / or aluminum. In further aspects, the detector filter 660 can comprise a material having a density of zinc or less than the elemental density of zinc. In some aspects, the detector filter 660 can comprise copper and aluminum. The detector filter 660 can absorb photons having energies below a predetermined threshold (e.g., about 30keV). In further aspects, the system 100 need not include a detector filter.

[0061] Referring to FIGS. 22A-22B, the system 100 can comprise a copper housing 670. A portion of the copper housing can be between the high energy photon emission assembly 200 and the sample container 90. The copper housing 670 can define a window 672. The detector axis 643 can extend through the window 672. In some aspects, the filter 660 can be positioned over the window 672.

[0062] In some aspects, a sleeve 674 can surround the photon detector 660. In exemplary aspects, the sleeve 674 can comprise lead. Additionally or alternatively, the sleeve 674 can comprise a lead equivalent as is known in the art. For example, the lead equivalent can comprise a polymer (e.g., optionally, polycarbonate) impregnated with heavy metal. In this way, the sleeve 674 can provide shielding similar to lead but while omitting lead.

[0063] Referring to FIGS. 22A-22B, a backstop 680 can be positioned along the emission axis so that the core or rock sample 640 is between the backstop 680 and the high energy' photon emission assembly 200. In some aspects, the backstop 680 can comprise copper. In optional aspects, the sample container 90 can comprise the backstop. In some optional aspects, the backstop 680 can further comprise a backstop target material 682. The backstoptarget material 682 is positioned so that, when the core or rock sample 640 is received within the sample container 90, the backstop target material 682 is positioned between the core or rock sample and the copper of the backstop. The backstop target material 682 can be configured to direct photons to the core or rock sample that cause the sample to emit additional photons for detection by the detector. In some aspects, the backstop target material 682 can comprise uranium. In some optional aspects, the system 100 can further comprise a safety backstop comprising lead. The safety backstop can be provided where the copper backstop is insufficient to fully block the beam.

[0064] The high energy photon emission assembly 200 can comprises a collimator 220. In some aspects, the collimator 220 can comprise copper. In further aspects, the collimator 220 can consist of, or consist essentially of, copper. In some aspects, the collimator 220 can be between the primary' target 204 (FIG. 23) and the core or rock sample 640. In some aspects, the collimator 220 can define a bore (e.g., a cylindrical bore) having a radial dimension (e g., diameter) and an axial length. In some aspects, the axial length of the bore of the collimator 220 can be greater than the radial dimension of the bore. Referring to FIG. 21, optionally, in aspects in which the high energy photon emission assembly 200 comprises a primary’ target 602 and a secondary’ target 606, the collimator 220 can be positioned between primary target and the secondary target. In some aspects, the filter 610 can be positioned axially between the tube assembly 202 and the collimator 220.

[0065] Referring to FIGS. 22A-22B, the system 100 can comprise a nose filter 690 between the tube assembly 202 and the core or rock sample 640. For example, in aspects in which the high energy photon emission assembly comprises a primary' target and a secondary' target, the nose filter can be positioned between the primary target and the secondary target (e.g., between the collimator and the secondary target, in aspects in which a collimator is provided). In aspects in w ich a secondary target is omitted, the nose filter 690 can be positioned betw een the collimator 220 and the core or rock sample 640. It is contemplated that the nose filter can be selected based on a desired material to be detected. For example, the nose filter 690 can be selected based on the K4ine of the material to be detected.

[0066] In some aspects, the secondary target 606 can be encapsulated within a light metal casing 692. For example, the light metal casing 692 can comprise aluminum.

[0067] In some aspects, it can be advantageous to position the high energy photon emission assembly 200 yvithin a predetermined distance from the core or rock sample 640.Accordingly, the sample container 90 and the high energy photon emission assembly 200 can be positioned relative to each other so that when the sample container has a core or rock sample therein, the core or rock sample is within the predetermined distance. For example, in aspects, in which the high energy photon emission assembly comprises a secondary target 606, the secondary' target can define a distal end of the high energy photon emission assembly, and the distal end of the high energy photon emission assembly can be within the predetermined distance of the core or rock sample. In aspects in which the high energy’ photon emission assembly comprises only a primary' target, the collimator can define the distal end of the high energy7photon emission assembly, and the distal end can be within the predetermined distance of the core or rock sample. In some aspects, the predetermined distance between the high energy photon emission assembly and the core or rock sample can be less than 25 cm, or less than 20 cm, or less than, 10 cm, or less than 5 cm, or less than 4 cm, or less than 3 cm, or less than 2 cm, or less than 1 cm.

[0068] In some aspects, it can be advantageous to position the photon detector 46 within a predetermined distance, d (FIG. 21 A), from the core or rock sample 640. For example, the sample container 90 and the photon detector 46 can be positioned relative to each other so that, when the sample container 90 has a core or rock sample 640 therein, the predetermined distance between the photon detector and the core or rock sample can be less than 5 cm, or less than 4 cm, or less than 3 cm, or less than 2 cm, or less than 1 cm, or less than ! cm. Optionally, the detector 46 can be positioned at least a predetermined distance from the core or rock sample 640. In this way, background signal can be reduced, thereby reducing noise captured by7the detector. For example, optionally, the sample container 90 and the photon detector 46 can be positioned relative to each other so that, when the sample container 90 has a core or rock sample 640 therein, the predetermined distance between the photon detector and the core or rock sample is at least 1 cm, or at least 1.5 cm, or at least 2 cm, or at least 2.5 cm. or at least 3 cm. In some aspects, the sample container 90 and the photon detector 46 can be positioned relative to each other so that, when the sample container 90 has a core or rock sample 640 therein, the predetermined distance between the photon detector and the core or rock sample is between about 1 cm and about 10 cm, or between about 1 cm and about 5 cm or between about 2 cm and about 5 cm, or between about 2 cm and about 4 cm.

[0069] In some aspects, the system 100 can comprise a vessel 700 containing water therein. The vessel can be positioned along the emission axis 205 so that the source photons pass through the water. For example, the vessel 700 can be positioned between the distal endof the high energy7photon emission assembly and the sample. In aspects in which the high energy photon emission assembly comprises a secondary target 606, the vessel can be positioned between the primary target and the secondary target.

[0070] In some aspects, the system 100 can comprise a crystal 720. The crystal 720 can be positioned along the emission axis 205 so that the source photons pass through the water. For example, the crystal can be positioned between the distal end of the high energy photon emission assembly and the sample. In aspects in which the high energy photon emission assembly comprises a secondary target, the crystal can be positioned between the primary target and the secondary target. In various aspects, the crystal 720 can comprise pyrite, hematite, mica, quartz, tourmaline, selenite, fluorite, or gy psum.

[0071] In some aspects, a cover 710 formed by a material that is transparent to photons within a desired energy' can be positioned between the sample container and the detector. In some aspects, the cover 710 can comprise aluminum. Aluminum can be sufficiently transparent to photons indicative of gold present in a sample. In particular, photons indicative of gold present in a sample can be higher energy than that which interact with aluminum, so the photons pass through the aluminum unmodified. Additionally, or alternatively, the cover 710 can comprise copper. In some aspects, copper can provide optimal transmission of certain spectra without emitting photons that mask signal photons indicative of the material of interest from the core or rock sample. In this way. the detector 46 can be protected from damage due to contact with a core or rock sample without compromising operation of the detector. For example, in some aspects, the core or rock sample and the material sample and the detector can be movable relative to each other. Optionally, in these aspects, the high energy photon emission assembly 200 and the detector 46 can be provided as a detection assembly that is movable relative to the container 90 (FIG. 15). In further aspects, and with reference to FIG. 25, the sample container 90 can be provide as a conveyor 312 that carries the core or rock sample relative to the detector. The cover 710 can prevent damage to the detector 46. In some aspects, the detector(s) 46 can be encased in the cover 710. For example, in these aspects, an assembly can comprise one or a plurality detectors formed within an aluminum casing. Optionally, in further aspects, the cover 710 can be positioned between the detection assembly (comprising the high energy photon emission assembly 200 and the detector 46) and the core or rock sample so that the cover 710 protects both the high energy7photon emission assembly 200 and the detector 46.

[0072] One implementation of the system 100 is portrayed in FIG. 15. A high energyphoton emission assembly 200 (e.g.. a high-energy X-ray tube) can emit source photons 201 with energies ranging from 0 to 260 keV. The source photons can pass through a beam filter 610 which can consist of one material or comprise multiple materials. Photons surviving attenuation by the beam filter 610 interact with the core or rock sample (the analyte). Photons leaving the core or rock sample (e.g., backscatter and / or fluorescence) pass through the detector filter before being intercepted by a photon detector 46. Results are processed on a computing device 80 in communication with the photon detector 46. The beam filter 610 can be positioned upstream of (closer to the tube assembly 202 than) the collimator 220 (FIG. 22 A), downstream of the collimator, or the beam filter 610 can be divided into separate portions, with a first portion being upstream of the collimator and a second portion being downstream of the collimator (FIG. 2 IB).

[0073] A detailed look at one implementation can be seen in FIG. 16. The high energy photon emission assembly 200 (e g., a high-energy X-ray tube) emits a beam of high-energy X-rays and / or gamma rays through a beam filter 610. The high-energy X-rays and / or gamma rays interact with a first beam filter material 612a that absorbs those photons but also send characteristic K, L. and M lines identifying its composition. These are passed to a second beam filter material 612b, the material being selected based on said material having an absorption edge that falls at a lower energy than the characteristic K-lines of the previous first beam filter material 612a. This limits fluorescence of the second beam filter material 612b, while attenuating the K or L lines of the first beam filter 612a. The third beam filter material 612c. in turn, formed of a material selected based on its material having an absorption edge that has a lower energy than the K-lines of the material of the previous second beam filter 612b. This same absorption pattern can be chosen for the following two beam filter materials 612d.e. In further aspects, beam filter materials 612d,e can also be provided for attenuation alone. Further, it is contemplated that the filter materials can be provided in one or multiple layers. For example, the first and second filter materials can optionally be arranged so that a first layer of the second filter material 612b is positioned between two layers of the first filter material 612a. It is contemplated that such an arrangement can further reduce photon energies outside of a desired energy. The heavily modified beam then excites elements in the sample 640 whose spectrum is captured by the detector(s) 46.

[0074] In still further aspects, the beam filter 610 can comprise an arrangement of materials selected based on material density. That is, the arrangement of the differentmaterials relative to each other can be selected based on the respective densities of the different materials.

[0075] Another exemplary embodiment can be seen in FIG. 17. In the embodiment illustrated in FIG. 17, the high energy photon emission assembly 200 (e.g., a high-energy X- ray tube) sends a photon beam to the sample 640. Optionally, said photon beam can be unfiltered and provided directly to the sample from the high energy photon emission assembly 200. Spectrum from the sample then enters a first filter material 662a of the postsample beam (detector) filter 660. The material of composition of the first filter material 662a sends characteristic K, L, and M lines. The characteristic K, L, and M lines enter a second filter material 662b formed of a material selected based on said material having an absorption edge that falls at a lower energy7than the characteristic K-lines of the previous first filter material 662a composition. This limits fluorescence of the second filter material 662b, while attenuating the K or L lines of the first filter material 662a. The third filter material 662c in turn has material selected based on said material having an absorption edge that has a lower energy than the K-lines of the previous filter material 662b. This same absorption pattern can be chosen for the following two filters 662d,e. In further aspects, filters 662d,e can also be provided for attenuation alone. The heavily modified beam then is captured by the photon detector 46.

[0076] Another embodiment of the system 100 can be seen in FIG. 18. As in FIG. 16, the beam can first pass through the beam filter 610, comprising filter materials 612a-612e. The heavily modified beam then excites elements in the sample 640. The emitted spectrum is passed through a post-sample (detector) filter 660. This post-sample beam (detector) filter 660 reduces counts for lower energies while minimally affecting those for higher energies. The resulting heavily modified spectrum is passed to the photon detector 46.

[0077] A detailed look at the filter mechanism can be seen in FIG. 19. The filter is composed of 3 materials with composition reflected by Kai emissions of element 1 (801), element 2 (802), and element 3 (803), respectively. Each of these elements has a absorption profile represented by absorption edge 1 (804), absorption edge 2 (805), and absorption edge 3 (806). The filter components are selected on the basis of matching absorption edges and fluorescence sequentially. Filter element 3 (803) is selected because its absorption edge (806) traverses the Kai emission of element 2 (802), whose absorption edge (805) in turn traverses the Kai emissions of element 1 (801). Note that the absorption edge of the highest-Z filter component (804) can have an absorption edge not covered by another material, though thiscan be addressed in some embodiments by selecting a tube anode material. For simplicity, Ka2 lines were omitted from this schematic.

[0078] A particular embodiment of an excitation mechanism as disclosed herein can be understood with reference to FIG. 20. As shown, an X-ray spectrum (811) is secondarily excited by a high-energy secondary target 606 (FIGS. 21, 27) with characteristic Kai and Ka2 lines (812). The analyte in the sample also has characteristic Kai and Ka2 lines (813). As with all elements, these lines have specific absorption edges, represented here for the secondary target (814) and the analyte (815). The X-ray beam is designed to maximize photon counts on the absorption edge of the secondary target (814), which leads to increased fluorescence of that secondary target (812). The characteristic Kai and Ka2 lines of that secondary7target (812) are on the absorption edge of the K-lines for the analyte (815), which leads to heightened expression of the analyte’s characteristic Kai and Ka2 lines (813). Note that this implementation can take place with the filter design shown in FIG. 19. which uses a similar high-energy redistribution principle to attenuate background signature of X-rays, again using the principle of overlapping absorption edges and characteristic fluorescence lines.

[0079] In some aspects, the high energy' photon emission assembly can comprise only a primary target. That is, the high energy photon emission assembly can be free of a secondarytarget. The high energy photon emission assembly can be configured to cause the primary target to emit photons along the emission axis to the sample container. Optionally, in these aspects, the primary target can comprise copper.

[0080] In other aspects, and with reference to FIG. 27, a secondary target can be positioned along the first axis. The secondary' target can be configured to emit secondary' target photons along the emission axis in response to being bombarded by the primary target photons. In some aspects, the secondary target can comprise an element with an atomic number above 89. For example, in some aspects, the secondary' target can comprise uranium (e.g., depleted uranium).

[0081] It is contemplated that bombarding a target material (e.g., a uranium target material) with electrons (or photons) of sufficient energy' (e.g., energy' sufficient to exceed the binding energy of the K-electron - optionally, 120 KeV) can cause the target material (e.g., the uranium target material) to emit photons. The photons emitted from the target material can be sufficiently energetic to exceed the binding energy of a K-shell electron of an elementof interest, such as. for example gold (Au). Optionally, the photons emitted from the target material can be narrowly distributed around a predetermined energy (e.g., with a high concentration of the energy distribution in a desired energy range). For example, when gold is the element of interest, it is contemplated that the photons emitted from the target material (e.g., a uranium target material) can be distributed to have energies around 114 KeV. It is further contemplated that the element of interest (e.g., gold), when excited by the photons from the target material, can fluoresce with photons that are unique to the element of interest (e.g., at and just above 80.725 KeV photons, in the case of gold). Thus, this photon energy can act as a signature to permit identification of the presence of the element of interest (e.g., gold) in a material sample or formation. Accordingly, systems and methods disclosed herein can be used to generate photons with a high concentration of the photons in a desired energy range (e.g., about 114 keV) and detect signature photon emissions of elements of interest (e.g., gold) that are present within material samples (such as core or rock samples obtained from a formation) or within the material of a formation. Although photons of specific energies are schematically depicted in the figures, it should be understood that the present disclosure encompasses the generation, emission, and / or fluorescence of photons at other energies. Similarly, although gold is disclosed as a particular element of interest, it is contemplated that the disclosed systems and methods can be specifically tuned (for example, through the selection of particular target materials or particular filter materials) to detect other elements of interest. Also, while the material samples are generally described herein as being obtained from soil, rock, and other formation materials where core, rock, or soil samples are typically collected, it is contemplated that the material samples can be obtained from any source.

[0082] It is contemplated that depleted uranium (U-238) can be desirable as the target material (e.g., the secondary target material) to use for its stabi li ty. However, in various aspects, any uranium isotopes or combinations of uranium isotopes can be used as a target material. Accordingly, in various optional aspects, it is contemplated that the target material can comprise any isotopes of uranium and uranium in any compound, gaseous liquid or solid or in combination with any other material that contains, is covered in or in contact with uranium. However, as further disclosed herein, various embodiments can include or exclude heavy metal (e.g., depleted uranium) targets.

[0083] Optionally, the target material 204 can comprise depleted uranium (U-238). An excitation source 206 such as, for example, a filament (optionally, a tungsten filament excitedvia electrical current), can be configured to deliver electrons 208 to the target material 204. In various optional aspects, the target material 104 can consist of. or consist essentially of, uranium (optionally, consisting of, or consisting essentially of, depleted uranium). Thus, in some aspects, the high energy photon emission assembly 200 can comprise the target material 204, and the excitation source 206. The excitation source 206 can be configured to emit electrons 208 at a selected energy. In some optional aspects, the selected energy can be 120 KeV. or about 120 KeV. or at least 120 KeV, or between 115 KeV and 150 KeV, or between 118 KeV and 150 KeV. The electrons 208 can cause the target material 204 to emit photons 210. In exemplary aspects, it is contemplated that the high energy photon emission assembly 200 can define a conduit or other pathway that focuses photons 210 from the target material 204 toward the sample 640.

[0084] As further described herein, when the target material 204 comprises depleted uranium, it is contemplated that the emitted photons 210 can be monoenergetic (e.g.. 114 KeV) photons that cause an element of interest (e.g., gold) to fluoresce with photons that are unique to the element of interest (e.g., at or above 80.725 KeV photons, in the case of gold). It is further contemplated that the element of interest (e.g., gold), when exposed to photons 210 emitted from the target material 204, can create further photon responses (e.g.. backscatter) 642 that can be detected to indicate the presence of the element of interest (e.g., gold).

[0085] In further aspects, it is contemplated that the uranium target can be used to detect other elements, such as, for example, mercury or platinum. For example, the X-ray photons that the uranium target emits under stimulation from the excitation source 106 can cause various elements to cause a unique photon response (e.g., fluorescence and / or backscatter 642).

[0086] In further aspects, it is contemplated that target materials other than uranium can be used. It is contemplated that the target material 204 can be selected to emit a particular energy that can be suitable for detecting particular elements. That is, X-ray photons 210 emitted from stimulation of the K-shell photon of the target material 204 can be of an energylevel that causes certain target elements (e.g., gold, platinum, osmium, mercury, etc.) to generate unique photon responses 642. The unique photon responses 642 can be based on the energy ranges (e.g., binding energy of K-shell electron) of the target material. For example, it is contemplated that thorium can be used as the target material. In some optional aspects, thorium can emit X-rays of an energy that can be suitable for detecting particular elements,such as, for example, optionally, osmium, iridium, or platinum. In further aspects, americium, californium or other heavy elements (e.g.. optionally, any element having an atomic number above 89, such as an atomic number above 89 and less than 99 (from 90-98)) can be used as the target material 204. The excitation energy of the excitation source 206 can be selected, at least in part, based on the energy7of the K-shell electron of the target material 204.

[0087] In various optional aspects, the high energy photon emission assembly 200 can be a transmission-type X-ray emission source as is known in the art. In further optional aspects, the high energy7photon emission assembly 200 can be a reflection-type X-ray emission source as is known in the art. In still further optional aspects, the high energy7photon emission assembly 200 can be a rod anode-type X-ray emission source as is known in the art. In optional aspects, the high energy photon emission assembly 200 can be configured to permit selective removal and replacement of the target material 204.

[0088] As shown in FIG. 15. photon detector 46 can optionally comprise a fluorescence sensor, a backscattered electron detector, or combinations thereof. In use, it is understood that the element detection assembly 46 can receive and / or detect the photons and / or backscatter 642 that are produced by the sample material 640 upon exposure of the sample material to the photons 210 emitted by the high energy photon emission assembly 200. In further aspects, it is contemplated that the element detection assembly 46 can be communicatively coupled to a computing device 80, such as, for example and without limitation, a processor, a controller (e.g., a microcontroller), a computer, a tablet, a smart phone, and the like. In these aspects, the element detection assembly 46 can be configured to provide one or more outputs to the computing device 80 in response to detection of photons and / or backscatter 642 that is indicative of a presence of an element of interest (e.g., gold) within a material sample 640. In still further aspects, the material analysis system 10 can further comprise a remote computing device 680 that is capable of being communicatively coupled to the computing device 80. In exemplary aspects, the remote computing device 680 can comprise a computer, a tablet, a smartphone, and the like. In these aspects, it is contemplated that the remote computing device 680 can comprise or be in communication with a database comprising information related to photon and / or backscatter signatures of particular elements. It is further contemplated that the remote computing device 680 can be configured to compare data received from computing device 80 (and indicative of detected photons and / or backscatter 642) with data stored in the database. Based on the comparison.the remote computing device 680 can provide an output that is indicative of the results of the comparison. For example, in some aspects, the comparison by the remote computing device can indicate the presence of an element of interest within the sample 640. In these aspects, the output from the remote computing device can comprise at least one of: a visual output (e.g., text, graphics, a light, or combinations thereof) to a display associated with the remote computing device; an update to the database to include information concerning the particular material sample (including the element of interest detected within the material sample); or a signal to the computing device 80 indicative of the result of the comparison. In further aspects, it is contemplated that remote users (e.g., system operators or customers) can use additional remote computing devices to communicate with remote computing device 680 and access the information stored in the database.

[0089] Optionally, in various aspects, it is contemplated that the computing device 80 and the remote computing device 680 can be provided with respective wireless transceivers (e.g., WiFi, Bluetooth, or RF-based transceivers) that are configured to permit selective wireless communication between the two computing devices. In one configuration, computing device 80 can comprise a memory that stores recorded data from the element detection assembly 46 and transmits the data to the remote computing device 680 at a selected time, such as when the computing device 80 is connected to a network shared with the remote computing device 680. For example, if the computing device 80 is deployed within a borehole or is otherwise disconnected from a network during data collection, the computing device 80 can be configured to transfer data to the remote computing device upon return to a surface or otherwise establishing connection with a network shared with the remote computing device 680. In another configuration, computing device 80 can comprise a removable storage device that can be removed and communicatively coupled to the remote computing device 680 to permit transfer of data.

[0090] Optionally, in further aspects, it is contemplated that the computing device 80 can comprise or be in communication with a memory that stores information related to photon and / or backscatter signatures of particular elements, thereby allowing the computing device 80 to compare the photons and / or backscatter 642 with information within the memory. In these aspects, it is contemplated that the computing device 80 can provide an output (optionally, through a display, a light, or other indicator) indicative of the presence of an element of interest within the sample 640 without the need for communicating with a remote computing device 680.

[0091] Referring also to FIG. 17, an element detection assembly 46 (e.g., a photon detector), as further disclosed herein, can be configured to detect XRF from a material (e.g., a sample, or a portion of a formation) that is subjected to photon radiation from the high energy photon emission assembly 200. The element detection assembly 46 (e.g., photon detector) can be configured to produce an output in response to detection of photons released by the material (e.g., a core or rock sample or portion of a formation (optionally, an intact portion of a formation)). It is contemplated that detection of photons of a particular energy (e.g., 78 KeV photons) fluorescing from the material (e.g., sample or formation) can indicate presence of an element of interest (e.g., gold) therein. Accordingly, a computing device 80, as disclosed herein in communication with the element detection assembly 46 (e.g., fluorescence sensor) can be configured to provide an output indicative of the detection of the element of interest (e.g., gold) by the element detection assembly (e.g., fluorescence sensor). The output can optionally be, for example, a visual output, an audible output, or a data output that can be stored in memory of the computing device 80.

[0092] The system can further comprise other sensors for simultaneous or sequential material analysis. For example, the system can include sensors to detect X-ray transmission (XRT).Exemplary X-ray System with Heavy Metal Secondary Target

[0093] In exemplary aspects, rather than providing a single target, it is contemplated that the high energy’ photon emission assembly 200 can comprise multiple target materials and at least one filter that filters out certain energy levels and cooperates with the target materials to direct photons of a particular energy to a sample. An example of such a high energy photon emission assembly 200 is described below.

[0094] Referring to FIG. 27, the high energy photon emission assembly 200 can comprise a high energy' photon emission assembly 600, which can comprise a primary target 604 and a secondary target 606. The excitation source can comprise a cathode 602 that is configured to bombard the primary target 604 (e.g., an anode) with electrons. The primary target 604 can be configured to emit photons at the secondary target 606 to excite photons of a desired energy’. The photons of the desired energy’ from the secondary’ target (secondary target photons) can be directed to a sample 640 (optionally, a core or rock sample). The secondary target 606 can comprise a heavy element (e.g., uranium). In further aspects, americium, californium or other heavy elements (e.g., optionally, any element having an atomic numberabove 89, such as an atomic number above 89 and less than 99 (from 90-98)) can be used as the secondary’ target 606.

[0095] In various aspects, a beam filter 610 can be positioned between the primary target 604 and the secondary target 606. The beam filter 610 can be configured to filter certain energy levels or ranges. For example, the beam filter 610 can be configured to filter high energy (e.g., optionally, above 120 KeV). In some aspects, the beam filter 610 can comprise a single elemental material. In further aspects, the beam filter 610 can comprise a plurality of materials (e.g., elements). For example, the plurality of materials can be arranged in a plurality of layers. For example, the beam filter 610 can comprise at least a first material 612 and a second material 614. In some aspects, first material and second material can have different absorption properties. For example, the first material can be configured to absorb energy within a first range, and the second material can be configured to absorb energy within a second range that is different than (e.g., greater than, less than, and / or. optionally, overlapping) the first energy range. As can be understood, absorption of energy within a range can refer to absorbing a significant percentage of photons (e.g., at least 30%, at least 50%, at least 75%) within said range. Accordingly, the beam filter 610 can be configured to permit a select band of photon energy therethrough.

[0096] A second filter 616 can be positioned on a side of the secondary target 606 opposite the primary target 604. The second filter 616 can be configured to absorb scatter photons from the secondary’ target.

[0097] In some optional aspects, the cathode 602 can deliver electrons to the primary target 604 (e g., the anode) having energy levels above 160 KeV (e.g., from 160 KeV to about 300 KeV).

[0098] In various aspects, the primary’ target 604 (e.g., anode) can comprise copper. However, it is contemplated that other materials or combinations of materials can be used as the primary target 604. The primary target 604 can emit primary target photons at the secondary target, wherein at least a portion of the primary target photons have respective energies of 120 KeV, or about 120 KeV, or at least 120 KeV, or between 98 KeV and 160 KeV, or between 98 KeV and 150 KeV.

[0099] In some aspects, photons from the primary’ target (primary target photons) can travel along a first axis 620 toward the secondary' target. Optionally, in these aspects, it is contemplated that the high energy photon emission assembly can define a conduit that at leastpartially encloses the beam filter 610 and focuses photons from the primary' target along the first axis 620 toward the secondary’ target. For example, the conduit can have a circumference and a length along the first axis 620, and only photons that are oriented to remain within the circumference of the conduit along the length of the conduit can pass through the first filter and reach the secondary' target (if they are not filtered out by the first filter). In some aspects, the secondary target 606 can be oriented at an angle relative to the first axis 620 so that photons excited from the secondary target 606 (secondary target photons) are emitted generally along a second axis 622 that is oriented at a predetermined angle 0 (optionally, between 10 degrees and 60 degrees) relative to the first axis 620. In some aspects, the secondary target 606 can comprise a planar or generally planar sheet or film having an incident surface facing the primary target 604 and an opposed back surface. The incident surface of the planar or generally planar sheet or film can be angularly offset from perpendicular to the first axis 620 by’ the predetermined angle 0, and photons from the secondary' target 606 can be emitted perpendicularly to the opposed back surface of the planar or generally planar sheet or film.

[0100] A shield 630 or other beam dump can be positioned so that photons from the primary target 604 that pass through the secondary target 606 can be incident upon the shield. Thus, the shield can act as a beam dump that absorbs and / or diffuses stray photons from the primary target 604. In these aspects, the shield 630 can be positioned so that the secondary target 606 is between the primary' target and the shield.

[0101] As further disclosed herein, the photons from the secondary’ target 606 can be incident upon the sample 640. In some optional aspects, the photons from the secondary' target 606 (secondary target photons) can have an energy of about 98. 12 KeV. In further optional aspects, the photons from the secondary target 606 can have an energy from about 98. 12 KeV to about 120 KeV.

[0102] A detector 46 (e g., photon sensor or other photodetector) can receive photons from the sample material. Data from the detector 46 can be analyzed to detect presence of a certain material or certain materials. For example, scattered photons and / or fluorescence 642 can create a signature that is indicative of said certain material(s). As further disclosed herein, a computing device 80, 680 can determine a presence of elements of interest within the sample based upon information provided by the detector 46 in response to detecting the photons and / or fluorescence 642.

[0103] The high energy' photon emission assembly 600 can be configured for use in any of the material analysis systems disclosed herein. For example, the high energy photon emission assembly 600 can be used in the material analysis system as described with reference to FIGS. 1 A-15, in a downhole tool (FIG. 24), proximate to a conveyor along which material samples travel (FIG. 25), proximate to a processing (e.g., ore processing) line (FIG. 26), or in any other system suitable for analyzing materials. More generally, it is contemplated that the disclosed high energy photon emission assembly 600 can be employed in any application where it is desirable to determine a presence of particular elements of interest within a material sample.Exemplary Analysis Systems

[0104] In optional aspects, the high energy photon emission assembly 200 can be integrated into a system for analyzing core or rock samples as further disclosed herein with reference to FIGS. 1 A- 14. In other aspects, it is contemplated that the high energy photon system disclosed herein can be adapted for various uses and for use in various environments. For example, referring to FIG. 24, in some embodiments, the system 100 can be positioned within a borehole 302 in order to analyze the walls of a borehole, for purposes of detecting the presence of a material of interest (e.g., gold) within the material of the formation within which the borehole is formed. In an exemplary embodiment, the system 100 can be a sub of a drill string. For example, the system 100 can comprise a housing 304 that can be coupled (e.g., threadedly coupled) to a drill string 306, optionally, proximal of a drill bit 308. The system 100 can comprise a high energy photon emission assembly 200 that is configured to emit high energy photons at the borehole wall and an element detection assembly 46 (e.g., a fluorescence detector) that is configured to receive fluorescent photons from the borehole wall. Thus, the borehole wall can be a material sample 310 that the system scans. In various other aspects, the system 100 can be deployed into a borehole via wireline or any suitable means. In still further aspects, the system 100 can be embodied as a probe. Accordingly, in some optimal aspects, the system can be positioned within or distal of a drill bit. As shown, in some optional aspects, computing device 80 can be provided within the housing 304.

[0105] In further aspects and with reference to FIG. 25, the system 100 can be positioned with respect to a conveyor 312 (e.g., a belt conveyor) so that the system 100 can analyze material samples 640 (e.g., crushed ore, core chips, cuttings, rock, or dirt) on the conveyor 312. Optionally, the high energy photon emission assembly 200 can be configured to emit the source photons in a fan configuration so that the source photons are incident upon an areaextending transverse to the emission axis. For example, shielding of the high energy photon emission assembly 200 can provide emission in particular configurations (e.g., in directions that are free of shielding). In other aspects, the high energy photon emission assembly 200 can emit photons in any desired shape, including, but not limited to cylindrical or conical configurations. In some aspects, the system 100 can comprise a plurality' of detectors 46. For example, the plurality of detectors 46 can be positioned along and an axis that is transverse to the movement of the conveyor 312. In this way, the detectors can collectively detect across a larger area than a single detector. The detectors can be positioned above the conveyor, below the conveyor, or in any desired position relative to the conveyor (and core or rock sample).

[0106] In still further aspects, the system 100 can be configured to analyze a material sample within a bucket of an excavator, in a dump truck, or on the ground. That is, the system 100 need not require a core box or core tray. Further, it is contemplated that any material sample (e.g., whole core, half core, crushed ore, core chips, cuttings, rock, or dirt) can be analyzed using the system 100 disclosed herein.

[0107] In still further aspects and with reference to FIG. 26, the system 100 can be used for tracking concentrations of an element of interest (e.g., gold) at various stages of processing (e.g., ore processing). For example, the system 100 can be used to analyze slurries or tailings. In some aspects, the system 100 can be positioned with respect to a float and leach tank 320 or pipeline 322 in order to analyze the material therein. Optionally and as illustrated, the system 100 can be positioned along a pipeline 322 at an outlet 324 of the float and leach tank 320. In further aspects, a respective system 100 can be placed at a process input, a process output, and at one or more intermediate stages along the pipeline 322 to detect quantities of the element of interest (e.g., gold) at various stages (e.g., positioned at an inflow and / or outflow of pipelines conducting slurry' at various stages of ore processing). In this way, the system 100 can analyze processes for consistency and detect improper processing. For example, data from the system(s) 100 (provided to computing device 80 and / or a remote computing device) can enable analysis of variability in feed gold concentration, effectiveness of processing steps, and / or determine overall effectiveness of the entire process (e.g., using at least one measurement of gold concentration in the discharge). Optionally, the processing can be adjusted to respond to variability in feed gold concentration based at least in part on changes in detected gold concentrations at various stages of processing. In further optional aspects, the discharged material can be diverted for reprocessing, for example, if the gold concentration exceeds a threshold (e.g., if a computingdevice determines that such a threshold is exceeded, the computing device can modify a flow of material within the processing system using actuators positioned within the processing system).

[0108] In further aspects, the system 100 can be configured to analyze the material within an excavator shovel or within a truck bed. For example, the system 100 can be embedded within the truck bed or excavator shovel. In yet further aspects, the system 100 can be adapted for use with a handheld or tabletop system so that an operator can analyze sample material (e.g., crushed samples). In various other aspects, the system can be integrated into deployable units that can scan pit floors, walls, underground mines, and the like. Said deployable units can be autonomous or operator guided drones. In further aspects, the system can be integrated into conventional mining equipment. Further embodiments can include probes capable of penetrating stockpiles of material, as well as embodiments that are configured to detect gold in surficial materials such as soils, gravels and sands.Methods of Use of the High Energy Devices and Material Analysis Systems

[0109] In various aspects, a method can comprise activating the high energy photon emission assembly 200 to deliver high energy photon (e.g., X-ray and / or gamma ray) radiation to a material sample to be analyzed (e.g., a core or rock sample or a portion of a formation). Optionally, the material can be positioned at a selected imaging location (e.g., a sample analysis area 42, an example of which is shown in FIG. 4) prior to activation of the high energy photon emission assembly 200. The high energy photon emission assembly and / or the detector 46 can optionally be moved relative to the material to maintain a predetermined spacing. Optionally, the high energy photon emission assembly can be configured to move both vertically and horizontally to thereby adjust spacing from the sample and permit analysis of a full sample without the need for moving the sample during imaging. The material can optionally be positioned within a container. The high energy photon device can direct electrons to the target material (e g., uranium) at a selected energy that can be sufficient to exceed the binding energy of the K-shell electron (e.g., optionally, at least 114 KeV, at least 120KeV, 120 KeV, or about 120 KeV). The method can further comprise detecting photons released by the material (e.g., core or rock sample or portion of the formation) with the element detection subassembly 46 (e.g., a fluorescence sensor) and using the element detection subassembly to provide an output (e.g., to a processor of computing device 80) in response to detection of the photons released by the material. A computing device (e.g., computing device 80 or a remote computing device 680) comprising a processor can be usedto provide an output indicative of a presence of an element of interest (e.g., gold) within the material based on the detected photons released by the material.

[0110] In some aspects, the core analysis system 10 (FIGS. 1A-14C) can be configured to capture the topography of the core or rock sample. For example, the core analysis system 10 can comprise a Light Detection and Ranging (LiDAR) system, the LiDAR system comprising at least one laser, a receiver, and a computing device that is configured to determine distance based on the time delay between emission of the laser and reflection of light from the laser into the receiver. More generally, the core analysis system 10 can comprise a topography measuring device for determining topography of the core or rock sample. The topography measuring device can comprise a laser scanner that is configured to capture surface topography as the sample is moved relative to the laser scanner. In other aspects, further contact and non-contact topographical measuring devices are contemplated. Using the topography of the core or rock sample, the core analysis system 10 can effect relative movement between the detector 46 (or the high energy photon emission assembly 200 and the detector) and the core or rock sample to maintain a consistent spacing therebetween. In some aspects, feedback from LiDAR or other topography measuring device can be used to obtain a ridgeline, as described in detail in International Patent Application WO2011146014, which is hereby incorporated by reference herein, and the high energy photon emission assembly 200 and the detector can follow the ridgeline to generate an optimal signal.

[0111] In use, it is contemplated that the disclosed high energy photon sources can provide fully integrated, autonomous material analysis systems and methods that generate repeatable, location-identified, quantifiable sample data that can be produced in a time window (e.g., within minutes or hours). It is further contemplated that the disclosed systems and methods can provide a platform approach for detecting gold (or other elements) in a material (e.g., core or rock) sample or in a wall of a formation or in an underground drive, pit bench, or stockpile. In still further aspects, it is contemplated that the disclosed systems and methods can be used to detect gold (or other elements) in waste throughout the steps of mining and refining (e.g., during bulk sorting, feed tracking, and tailings discharge) to ensure process optimization. Can reduce waste.

[0112] Importantly, it is contemplated that the disclosed systems and methods can permit detection of elements of interest within a material sample (e.g., a core or rock sample) without the need for processing or treating the material sample before the high energy photon source is activated. That is, in use, it is contemplated that a material sample can be removedfrom a formation (or other starting location) and placed directly into the material analysis system for analysis, without the need for treatment or processing of the material sample, which can delay and complicate the analysis process.Core or Rock Sample Analysis Systems

[0113] Disclosed herein, in various aspects and with reference to FIGS. 1A-14C are exemplary embodiments of a material analysis system 10 that are configured to provide qualitative analysis of materials (e.g., drilled core or rock samples) using a high-specification high energy (e.g., X-ray Fluorescence (XRF)) system. In use, it is contemplated that the disclosed systems and methods can scan material (e g., drilled core) at required spatial intervals and within a reasonable time to permit desired on-site workflow while also providing meaningful chemo-stratigraphical data, which can be used by geologists and other personnel to interpret the region of drilling for additional drill targets. It is further contemplated that the analysis described herein can be completed by a member of the drilling team (e.g., a driller’s assistant) in between core sampling sequences (e.g.. sample pulls). Thus, it is contemplated that the disclosed system can be readily and selectively deployed in in the field and operate in at least a partially autonomous (optionally, fully autonomous) manner. In contrast to existing core analysis systems, the disclosed systems and methods can provide site-specific matrix calibration and permit the tailoring of photon settings to energies of interest (corresponding to elements of interest). Additionally, it is contemplated that the use of helium gas as disclosed herein can reduce X-ray attenuation, particularly for light elements (Na-Ti). More generally, it is contemplated that the disclosed system can function in an automated fashion to permit real-time acquisition of data without impacting drilling workflow.

[0114] Embodiments disclosed herein are directed to novel methods for detection using high energy photons. It is contemplated that, in addition to said novel methods, the material analysis system 10 can use XRF scanning as described in U.S. Patent No. 10,800,315, which is incorporated by reference herein for all purposes.

[0115] Although generally disclosed herein as core or rock analysis systems and methods, it is contemplated that the disclosed systems and methods can be used to analyze other material samples, such as, for example and without limitation, chips produced during reverse circulation drilling operations, borehole walls, mud or dirt in an excavator or truck bed, etc., or material at any stage of a refining process (e.g., material slurry at beginning, intermediate.or final stages of ore refining). Accordingly, the term core or rock samples as disclosed herein can be understood to include any material sample, and the apparatuses and principles herein can be applicable to detecting a material of interest (e.g., gold) in any material sample.

[0116] In exemplary aspects, and with reference to FIGS. 1 A-2D, 4, and 6. a core analysis system 10 can comprise an analysis assembly 30. The analysis assembly 30 can comprise a frame 32 and a plurality of components as further disclosed herein. One or more of the components of the analy sis assembly can be supported by and / or secured to the frame 32 as shown in FIGS. 1A-2E. Optionally, in some aspects, the analysis assembly 30 (e.g., at least the frame 32 of the analysis assembly) can be secured to a trailer 20 using conventional means, including fasteners such as bolts, screws, clamps, and the like. In these aspects, it is contemplated that the trailer 20 can comprise conventional means for securing the trailer to a piece of drilling equipment, such as drill rig, or to a support vehicle, such as a truck, tractor, and the like. Exemplary means for securing the trailer include a hitch, one or more bolts, one or more pins, one or more arms, and the like. It is contemplated that the trailer 20 can be selectively detachable from the drilling equipment or vehicle. Thus, in use, it is contemplated that the trailer 20 can be detached from the drilling equipment or vehicle. Alternatively, it is contemplated that the trailer 20 can be permanently secured to the drilling equipment or vehicle to form a unitary or monolithic structure. In exemplary aspects, the trailer can comprise one or more front panels 22, one or more side panels 24, one or more rear panels (not shown), and one or more roof panels. In these aspects, it is contemplated that the panels can enclose the analysis assembly 30 during transport. Prior to use of the analysis assembly 30. it is contemplated that at least one side panel 24 can be removed or opened to provide access to the sample handling subassembly or user interface as further disclosed herein. Optionally, it is contemplated that at least one panel 24 on each opposing side of the trailer can be removed or opened. In some exemplary aspects, at least one panel 24 on each side of the trailer can comprise a door 26 (e.g., a slide door) that can be selectively opened or closed. Additionally, or alternatively, it is contemplated that at least a portion of at least one panel can be hingedly coupled to the frame of the trailer to permit selective opening of the panel.

[0117] Although the disclosed analysis assembly 30 is preferably secured to the trailer 20, it is contemplated that the analysis assembly 30 can also be used separately from a trailer. For example, it is contemplated that the analysis assembly 30 (e.g., at least the frame 32 of the analysis assembly) can be secured or mounted at a particular fixed location, such as alaboratory' setting or other location where core or rock samples are routinely received or delivered.

[0118] In one aspect the analysis assembly 30 can comprise a material analysis subassembly 40 and. optionally, a sample handling subassembly 50. In this aspect, the material analysis subassembly 40 can define a sample analysis area 42 (FIG. 4). When provided, the sample handling subassembly 50 can be configured to selectively deliver one or more core or rock samples to the sample analysis area. Accordingly, in some aspects, at least a portion of the sample handling subassembly 50 can serve as a sample handing assembly that can be configured to support a core or rock sample in the sample analysis area 42, also referred to as an imaging location. It is further contemplated that at least a portion of the sample handling subassembly 50 can be configured to deliver the core or rock sample to the imaging location.

[0119] In further aspects, it is contemplated that the sample handling subassembly 50 can be omitted. In these aspects, it is contemplated that at least one panel of the trailer can define an opening or be configured for selective opening to permit access to the sample analysis area 42. Thus, in use, a system operator can insert the core or rock sample within the sample analysis area, and imaging and analysis of the sample can commence. After imaging and / or analysis of the sample is complete, the core or rock sample can be retrieved through the opening of the trailer.

[0120] In exemplary aspects, the material analysis subassembly 40 can comprise a high energy photon emission assembly 200 and a photon detector 46. In these aspects, the high energy photon emission assembly 200 can be configured to deliver radiation to core or rock samples positioned within the sample analysis area 42, and the photon sensor 46 can be configured to detect X-ray fluorescence in response to the radiation delivered to the core or rock samples by the high energy photon emission assembly 200. Optionally, the material analysis subassembly 40 can comprise a housing 49 that receives at least a portion of the high energy photon emission assembly 200 and, optionally, at least a portion of the photon sensor 46. The housing 49 can also include a distal aperture 45 and a window (not shown), such as a beryllium window as is known the art. which can be positioned between the aperture 45 and the photon sensor 46 relative to a vertical axis 51. In exemplary aspects, it is contemplated that the material analysis subassembly 40 can comprise an XRF spectrometer / analyzer as is known in the art. Optionally, in these aspects, the material analysis subassembly 40 can comprise a silicon drift detector (SDD)-based XRF spectrometer / analyzer. In further aspects,the photon sensor 46 can comprise a Cd-Te detector or a Ge detector. In exemplary aspects, the aperture 45 of the housing 49 of the material analysis subassembly 40 can receive (and deliver) high energy photons from the high energy photons source to a core sample and then receive reflected X-rays for acquiring XRF spectra (and using the photon sensor 46 as further disclosed herein. Optionally, in these aspects, the material analysis subassembly can further comprise a proximity sensor 47 positioned within the sample analysis area 42 for detecting the presence of a core sample in an operative position within the sample analysis area that is suitable for detecting photons (e.g., X-ray fluorescence and / or backscatter) as further disclosed herein. Upon detecting the core sample in the operative position, the proximity sensor 47 can provide a signal to a processor 80 (as further disclosed herein) that is indicative of the presence of the core sample in the operative position. In response, the processor 80 can be configured to initiate movement and activation of the components of the material analysis subassembly 40 to acquire XRF spectra for the sample. For example, the memory 85 can store instructions that, when executed, cause the X-ray device to direct electrons 207 to the target material 204 at a selected energy (e.g., at least 114 KeV, 120 KeV, or about 120 KeV). Alternatively, rather than relying on the proximity sensor, the processor 80 can be configured to initiate the acquisition sequence as part of the standard movement sequence of the various actuators disclosed herein (e.g., using a PLC as further disclosed herein). In exemplary aspects, as the acquisition cycle begins, actuators 192 that are coupled to the material analysis subassembly 40 can be configured to effect movement of the housing 49 until the aperture 45 (and the high energy photon source, the photon sensor, and the window) is positioned at a selected orientation relative to the sample (for example, in alignment relative to the vertical axis 51). Optionally, the actuators 192 can be configured to effect downward movement of the material analysis subassembly 40 until the portions of a housing 49 of the assembly surrounding the aperture 45 contact the sample. Following acquisition of XRF spectra for the sample, the actuators can be configured to lift the housing 49 relative to the sample, and the housing (and aperture 45) can be translated laterally (relative to the first or second axes 52, 54) to align the aperture 45 with a second sample within the sample analysis area 42. If all samples within the sample analysis area 42 have been analyzed using the material analysis subassembly 40, then the housing 49 (and aperture 45) can remain in a raised "rest" position while the sample handling subassembly 50, in response to instructions from the processor 80, initiates movement of the samples away from the sample analysis area 42 (e.g., toward the rear of the trailer). The material analysis subassembly 40 can comprise one or more filters that are specifically tuned for the element of interest (e.g.. gold). In thisway, photon responses from materials / elements other than the element of interest can be removed to allow the photon responses of the element of interest to be more easily detected. In this way, the material analysis subassembly 40 can be tuned to detect select materials. For example, optionally, the filters can be selected to facilitate detection of lithium, gold, thorium, or any element that is lighter than thorium. Optionally, a collimator can direct photons from the high energy photon emission assembly 200 to the core samples or rock sample. Optionally, a collimator can direct photons from the core or rock sample to the photon sensor 46. Accordingly, in various aspects, the material analysis subassembly 40 can comprise one or a plurality of collimators.

[0121] It is further contemplated that other sensors, such as backscatter sensors, can be configured to additional photon responses from the core or rock sample in response to exposure to the high energy photons from the high energy photon emission assembly 200.

[0122] In further exemplary aspects, it is contemplated that the material analysis subassembly 40 can comprise software drivers to permit communication with other components of the system as further disclosed herein. Optionally, in these aspects, the software drivers can be configured to monitor a connection status with a processor as further disclosed herein (e.g., by monitoring an material analysis subassembly broadcast packet sent periodically by the processing components). It is contemplated that the high energy photon source can be controllable according to known protocols. In exemplary aspects, the voltage, amperage, or filter characteristics of the high energy photon source can be selectively controllable. It is contemplated that the filter of the high energy photon source can be a film of known concentrations of elements that can be selectively adjusted. In use, it is contemplated that the voltage, amperage, and filter characteristics can be selectively adjusted to modify the emitted high energy photon spectrum.

[0123] In further exemplary aspects, it is contemplated that the high energy photon emission assembly 200 and the detector (photon sensor) 46 can be placed as close as possible to the core sample. Optionally, in these aspects, it is contemplated that the high energy photon emission assembly 200, the detector (photon sensor) 46, and the window can be positioned or configured to contact (or be positioned proximate to) a core sample. Optionally, in additional exemplary aspects, it is contemplated that the high energy photon emission assembly 200 and the photon sensor 46 can be oriented and positioned such that the emitted high energy photons follow a tangential path relative to the face of the core sample (at a central position on the core sample). In exemplary aspects, it is contemplated that the atleast one of the high energy photon emission assembly 200, the window, and the photon sensor 46 can be at least partially received within the aperture 45 of the housing 49. In additional aspects, the high energy photon emission assembly 200 and / or the detector (photon sensor) 46 can be spaced by a minimum predetermined distance from the sample.

[0124] In further aspects, the sample handling subassembly 50 can be configured to selectively advance one or more core samples between a sample loading location and a sample unloading location. In these aspects, the material analysis subassembly 40 can be positioned between the sample loading location and the sample unloading location.

[0125] In additional aspects, the sample handling subassembly can be configured to selectively advance the one or more core samples relative to a first axis 52 between the sample loading location and the sample unloading location. In these aspects, the material analysis subassembly 40 can be positioned between the sample loading location and the sample unloading location relative to the first axis 52. In other aspects, the sample analysis area 42 of the material analysis subassembly 40 can be spaced from the first axis 52 relative to a second axis 54. In these aspects, it is contemplated that the sample handling subassembly 50 can be configured to selectively advance the one or more core samples relative to the second axis 54 to deliver the one or more core samples to the sample analysis area 42 of the material analysis subassembly 40. Optionally, in further aspects, within a plane 56 containing the first and second axes 52, 54, the second axis 54 can be perpendicular or substantially perpendicular to the first axis 52.

[0126] As mentioned above, in further aspects, the core analysis system 10 can further comprise a processor 80 that is communicatively coupled to the material analysis subassembly 40. In these aspects, for each delivery7of radiation to core samples positioned within the sample analysis area 42, the processor 80 can be configured to receive at least one output from the photon sensor 46. It is contemplated that the at least one output can be indicative of the measured XRF of the core samples positioned within the sample analysis area 42. In exemplary aspects, the processor 80 can be communicatively coupled to a memory785. Although referred to herein as the processor 80, it is contemplated that the processor 80 can be embodied as a plurality of processors. For example, one or more controllers (e.g., controllers 80a,b,c,d,e can each comprise one or more processors 80 and a respective memory785.

[0127] In exemplary aspects, the core analysis system 10 can further comprise at least one container 90 configured to receive one or more core samples. In these aspects, the sample handling subassembly 50 can be configured to selectively deliver the at least one container to the sample analysis area 42 of the material analysis subassembly 40. In further exemplary aspects, each container 90 can comprise indicia 92 of at least one characteristic of the one or more core samples positioned within the container. In these aspects, it is contemplated that the core analysis system 10 can further comprise an input imaging assembly 100 that is communicatively coupled to the processor 80 and configured to detect the indicia 92 of each container 90. Optionally, in some aspects, the input imaging assembly 100 can be positioned proximate the sample loading location. Optionally, in some aspects, the indicia of each container can comprise at least one bar code, such as, for example and without limitation, a one-dimensional barcode or a two-dimensional barcode that uses QR codes. In these aspects, it is contemplated that the input imaging assembly 100 can comprise a bar code scanner. Optionally, in some aspects, the indicia of each container can comprise a radiofrequency identification (RFID) tag, such as, for example and without limitation, a close-proximity READ / WRITE card with a capacity to store at least 2 KB of data. In these aspects, it is contemplated that the input imaging assembly 100 can comprise an RFID scanner. Optionally, in further aspects, the indicia of each container can comprise standard characters (text, numbers, symbols, etc.) that are printed on or applied to the container. In these aspects, it is contemplated that the input imaging assembly 100 can comprise a camera assembly that has conventional camera hardware and image capture software for completing optical character recognition (OCR) processing of the characters positioned on the container. In use, it is contemplated that the system operator can use the user interface further disclosed herein to associate the core images produced by the camera assembly with a corresponding core sample.

[0128] In addition to detecting the indicia 92 of each container 90, the input imaging assembly 100 can acquire core images that can be used for initial processing by a system operator. Optionally, it is contemplated that the system can be configured to operate in a “Teach” mode in which the system operator uses the user interface to select areas of interest on the core images acquired by the input imaging assembly 100 to accomplish one or more of the following: (1) “Exclusion” Tagging, which excludes selected scan points while calculating or determining site sample points and point depth (i.e., appending depth), thereby addressing situations in which portions of the core samples are unscannable or otherwisedeficient; (2) “Inclusion” Tagging, which selects points for a scan; or (3) “Void” Tagging, which excludes selected scan points and sample points (i.e.. non-appending depth), thereby addressing situations in which the core samples include voids or core blocks. It is contemplated that the “Teach” mode can employ calculations that are performed by the application to assign the X and Y pixels inside the bounding lines to a corresponding depth (in mm). It is further contemplated that the “Teach” mode can allow for addressing a variety of different core sample conditions while maintaining quality and accuracy in depth series data. In use, it is contemplated that the operator can manipulate the selected zones using a touchscreen, stylus, or mouse, with the selected zone being depicted on the display of the human machine interface. Exemplary images of a “Teach” mode display are provided in FIGS. 7A-7B. After completing the “Teach” mode cycle, the container-specific tagging can be used to correlate data obtained during downstream analysis and processing as disclosed herein with corresponding depths that are of interest to the system operator.

[0129] Optionally, the at least one container 90 can be a core box or core tray with an upper surface that defines at least one receiving portion 95 for supporting and receiving a portion of respective drill cores during the core analysis process disclosed herein. In exemplary aspects, each core box 90 can comprise a plurality of receiving portions 95. In these aspects, it is contemplated that the plurality of receiving portions of each core box can range from about two receiving portions to about eight receiving portions. In further exemplary aspects, each receiving portion of a core box can define a diameter that is complementary’ to the size of a core sample obtained using coring rods of a particular size (e.g., HQ coring rods, PQ coring rods. BQ coring rods, NQ coring rods, and the like). In these aspects, it is contemplated that each core box can be shaped for use with core samples obtained from a corresponding coring rod.

[0130] In some exemplary aspects, it is contemplated that the core analysis system 10 can include a plurality’ of core boxes that are designed for use with a variety of different coring rod sizes. That is, it is contemplated that at least one of the core boxes can have a receiving portion with a diameter that is different than the diameter of the receiving portion of at least one other core box of the system. For example, in some exemplary aspects, the system 10 can comprise at least one core box that is configured for use with an HQ coring rod and that defines one or more receiving portions having a diameter ranging from about 60 to about 70 mm (and, more preferably, being about 65 mm). In some exemplary aspects, the system 10 can comprise at least one core box that is configured for use with a PQ coring rod and thatdefines one or more receiving portions having a diameter ranging from about 80 to about 90 mm (and, more preferably, being about 86.5 mm. In some exemplary’ aspects, the system 10 can comprise at least one core box that is configured for use with a BQ coring rod and that defines one or more receiving portions having a diameter ranging from about 35 to about 45 mm (and, more preferably, being about 38 mm). In some exemplary’ aspects, the system 10 can comprise at least one core box that is configured for use with an NQ coring rod and that defines one or more receiving portions having a diameter ranging from about 50 to about 60 mm (and, more preferably, being about 52.5 mm).

[0131] In exemplary aspects, it is contemplated that a plurality of core boxes provided with the system can have a consistent length (relative to a longitudinal axis of the core box) and a consistent width while having a vary ing height depending upon the size (e.g., diameter) of the receiving portions defined in the core box. Optionally, in these aspects, it is contemplated that the length of each core box can range from about 1,000 mm to about 1,200 mm and more preferably, from about 1,050 mm to about 1,100 mm, while the width of each core box can range from about 300 mm to about 500 mm and more preferably, from about 350 mm to about 400 mm. In exemplary' aspects, it is contemplated that core boxes configured for use with HQ coring rods can have a height ranging from about 70 mm to about 90 mm and more preferably, ranging from about 75 mm to about 85 mm. It is further contemplated that core boxes configured for use with PQ coring rods can have a height ranging from about 90 mm to about 120 mm and more preferably, ranging from about 100 mm to about 110 mm. It is further contemplated that core boxes configured for use with BQ coring rods can have a height ranging from about 50 mm to about 70 mm and more preferably, ranging from about 55 mm to about 65 mm. It is still further contemplated that core boxes configured for use with NQ coring rods can have a height ranging from about 55 mm to about 85 mm and more preferably, ranging from about 65 mm to about 75 mm.

[0132] Optionally, in exemplary’ aspects, it is further contemplated that each of the receiving portions defined in the core box can be generally aligned with or parallel to the longitudinal axis of the core box, with the diameter of the receiving portions determining the maximum number of receiving portions that can be defined within a given core box. For example, it is contemplated that core boxes configured for use with HQ coring rods can optionally have from three to five receiving portions that are spaced apart relative to the width of the core box, with the receiving portions of such core boxes being configured to receive, in combination, from about 3 m to about 5 m (in total combined length) of coresample segments. It is further contemplated that core boxes configured for use with PQ coring rods can optionally have from two to four receiving portions that are spaced apart relative to the width of the core box, with the receiving portions of such core boxes being configured to receive, in combination, from about 2 m to about 4 m (in total combined length) of core sample segments. It is further contemplated that core boxes configured for use with BQ coring rods can optionally have from six to eight receiving portions that are spaced apart relative to the width of the core box, with the receiving portions of such core boxes being configured to receive, in combination, from about 6 m to about 8 m (in total combined length) of core sample segments. It is further contemplated that core boxes configured for use with NQ coring rods can have from four to six receiving portions that are spaced apart relative to the width of the core box, with the receiving portions of such core boxes being configured to receive, in combination, from about 4 m to about 6 m (in total combined length) of core sample segments.

[0133] In exemplary aspects, the core boxes can comprise plastic. Optionally, in some exemplary aspects, the core boxes can comprise DISCOVERER® Series 2 and 3 core sample trays manufactured by Yandina Plastics Mining Products / Total Plastics Solutions (Kunda Park, Queensland, Australia). Optionally, in other exemplar}’ aspects, the core boxes can comprise CORITE core trays manufactured by Strength International (Keswick, South Australia). Optionally, in still further exemplary aspects, the core boxes can comprise IMP ALA core trays (series 1, 2, 3, or 4) by Impala Plastics (Maddington, Western Australia).

[0134] Optionally, in exemplar7aspects, the analysis system can comprise gripping elements that secure the core boxes to the sample handling subassembly 50 to permit axial movement of the core boxes as disclosed herein. In exemplary aspects, the gripping elements can be secured to portions of the sample handling subassembly 50 such that movement of the sample handling subassembly effects a corresponding movement of the gripping elements (and a core box engaged by the gripping elements). Optionally, it is contemplated that the gripping elements can be provided as part of an intermediate section 68b of the sample handling subassembly (as further disclosed herein) to ensure that each core box remains securely positioned in desired locations relative to the material analysis subassembly 40 as the core box translates relative to axis 54. In these aspects, it is further contemplated that the gripping elements can be configured for selective, releasable engagement with a core box such that the core box can be selectively secured into place on the sample handling subassembly and then disengaged from the sample handling subassembly at an appropriatetime (e.g., at the conclusion of a cycle through the material analysis subassembly). It is contemplated that the gripping elements can comprise any conventional fastener, such as, for example and without limitation, bolts, screws, ties, projections, hooks, latches, loops, and the like, while each core box can comprise complementary engagement portions that are configured to receive or effect engagement with a portion of corresponding gripping elements. Optionally, it is contemplated that the gripping elements can be selectively moveable from a disengaged position to an engaged position, in either a manual or an automated manner (e.g., by activating an actuator under processor control). In further exemplary aspects, it is contemplated that the gripping elements can comprise a plurality of guides that can be configured to apply pressure to (e.g., apply a clamping force to) outer portions of the core box to secure the core box in a desired location and orientation.

[0135] As further disclosed herein, the disclosed analysis system can comprise mechanisms that prepare the core samples for analysis. These mechanisms can include, for example and without limitation, clearing mechanisms, drying mechanisms, and wetting mechanisms. In further aspects, the analysis system can comprise mechanisms for imaging the core samples under both dry and wet conditions. As further disclosed herein, it is contemplated that the system can provide selectable and fully automated and repeatable analysis intervals, automated data collection, and remote delivery of the completed sample analysis. A database as disclosed herein can permit storage of data corresponding to or indicative of a particular sample container (e.g., core box), a drill hole location, a sample collection date and time, calibration, sample depth, temperature, or Rh scatter intensity. In further exemplary aspects, and as disclosed herein, the system can permit remote uploading and file retrieval using a cloud-based server. The software can also permit replication of both industrial process controller (IPC) and industrial data concentrator (IDC) databases to an external USB storage option. This can then be uploaded by other (standard) means to the cloud-based server. This option can be useful in remote situations where the trailer (and the analysis assembly) is not within access of a WAN (wide area network) authentication / access service.

[0136] In further exemplary aspects, and with reference to FIGS. 1 A-2E and 4, the core analysis system 10 can further comprise a drying assembly 110 positioned between the sample loading location and the sample analysis area 42 of the material analysis subassembly 40. Optionally, in exemplary aspects, the drying assembly 110 can comprise a high-velocity air knife drying system as is known in the art. Optionally, as shown in FIG. 4, in exemplaryaspects, the drying assembly 110 can be placed in an elevated position proximate an entrance to the sample analysis area 42. In use. it is contemplated that the drying assembly 110 can ensure that the core samples are dry and clean before they are scanned by the material analysis subassembly. In exemplary aspects, it is contemplated that the processor 80 can be communicatively coupled to the dry ing assembly 110. It is further contemplated that the processor 80 can be configured to selectively activate and deactivate the drying assembly. In further exemplary aspects, the processor 80 can be configured to activate the drying assembly such that the drying assembly operates at a selected fixed speed and at a selected fixed temperature output. Optionally, in still further exemplary7aspects, the processor 80 can be configured to selectively control activation of the sample handling subassembly to advance the core samples through the drying assembly 110 at a desired speed that is optimal for drying of the core samples.

[0137] In additional aspects, and with reference to FIG. 4, the material analysis subassembly can comprise a dry-core imaging assembly 48. In these aspects, it is contemplated that the dry-core imaging assembly 48 can be configured to produce an image of core samples received within the sample analysis area 42, preferably after drying of the core samples by the drying assembly 110. Optionally, in exemplary aspects, the processor 80 can be configured to selectively activate the dry-core imaging assembly 48 to produce an image of dry core samples within the sample analysis area 42, prior to activation of the X- Ray source.

[0138] In other aspects, and with reference to FIG. 4, the material analysis subassembly can further comprise an XRF imaging assembly 190 that is positioned to image the core samples (and their containers) after the core samples are positioned in a desired location for activation of the X-Ray source and XRF detection. It is contemplated that the images produced by the XRF imaging assembly 190 can be stored and used to determine the specific location of the core samples when XRF was detected.

[0139] In further aspects, and with reference to FIGS. 1 A-2D and 4, the core analysis system 10 can comprise a wetting assembly 120 positioned between the sample analysis area 42 and the sample unloading location. Optionally, in these aspects, the wetting assembly 120 can comprise a water spray mechanism as is known in the art. It is contemplated that the wetting assembly 120 can apply water (or other liquid) to the core samples to prepare the core samples for high-resolution wet imaging as further disclosed herein. In exemplary7aspects, it is contemplated that the processor 80 can be communicatively coupled to the wettingassembly 120. It is further contemplated that the processor 80 can be configured to selectively activate the wetting assembly 120. Optionally, in exemplary aspects, it is contemplated that the processor 80 can be configured to activate the wetting assembly 120 such that the wetting assembly produces a desired fixed water flow rate. Optionally, in still further exemplary aspects, the processor 80 can be configured to selectively control activation of the sample handling subassembly to advance the core samples through the wetting assembly 120 at a desired speed that is optimal for wetting of the core samples. In exemplary aspects, the wetting assembly 120 can comprise at least one arm and at least one nozzle positioned in fluid communication with a conduit defined within the at least one arm. In these aspects, it is contemplated that the conduit can be positioned in fluid communication with a fluid source (e.g., a pump) that is configured to pump fluid to the wetting assembly 120 in response to instructions received from the processor 80.

[0140] Optionally, in exemplary aspects, and with reference to FIG. 4, the core analysis system 10 can comprise a wet-core imaging assembly 130 positioned between the wetting assembly 120 and the sample unloading location. In these aspects, it is contemplated that the processor 80 can be communicatively coupled to the wet-core imaging assembly 130. It is further contemplated that the processor 80 can be configured to selectively activate the wetcore imaging assembly 130. In use, it is contemplated that the wet-core imaging assembly can be activated to record an image of the core samples after wetting of the core samples by the wetting assembly 120 as further disclosed herein.

[0141] In exemplary aspects, the input imaging assembly 100, the dry-core imaging assembly 48, the XRF imaging assembly 190, and the wet-core imaging assembly 130 can each comprise a respective camera assembly, such as. for example and without limitation, an IP camera. Exemplary IP cameras that are suitable for this application include LIFECAM web cameras manufactured by7Microsoft Corporation (Redmond, Washington). As further disclosed herein, the camera of the input imaging assembly 100 can be used to acquire an image of a core box that allows the system operator to tag" core images using an HMI (user interface) as further disclosed herein. As further disclosed herein, the camera of the dry-core imaging assembly 48 can be used to acquire an image of a dry core box, with the image being stored in a database as described herein. As further disclosed herein, the camera of the XRF imaging assembly 190 can be used to acquire an image of a location where XRF measurements are performed, with the image being stored in the database as described herein. As further disclosed herein, the camera of the wet-core imaging assembly 130 can be used toacquire an image of a core box after the core box has been wetted by the wetting assembly 120, with the image being stored in a database as described herein. As shown in FIGS. 1 A- 2D, it is contemplated that cameras of the input imaging assembly 100, the dry-core imaging assembly 48, and the wet-core imaging assembly 130 can be mounted to the frame 32 at respective locations above the core box movement pathway. As shown in FIG. 2E, it is contemplated that the camera of the XRF imaging assembly 190 can be positioned within the sample analysis area (optionally, within or coupled to housing 49). In further exemplary aspects, the disclosed IP cameras can be controlled through Ethernet connection using a trailer control network (“TrailerControlNef ’) as disclosed herein and shown in FIG. 5.

[0142] In exemplary aspects, and with reference to FIGS. 1 A-2E, 4 and 4, the sample handling subassembly 50 can comprise input and output sections 58, 62. Optionally, in these aspects, the input and output sections 58, 62 can comprise respective roller assemblies 60, 64, which can be positioned in communication with respective intermediate sample handling sections as further disclosed herein. It is contemplated that each of the roller assemblies 60, 64 can be configured to receive a single container 90 (e.g., a single core box) or an adapter 440 as further disclosed herein. Optionally, in exemplary aspects, the roller assemblies 60, 64 can have operative widths that are at least slightly greater than the longitudinal lengths of the containers 90 (e.g., core boxes). In some aspects, as shown in FIGS. 1A-1C, the roller assemblies 60, 64 can each have a single roller that defines the entire w idth of the roller assembly. Alternatively, in other aspects, as shown in FIGS. 2A-2D, the roller assemblies 60, 64 can each have a pair of spaced roller arrays 61. 65 that cooperate to define the width of the roller assembly. In use, it can be advantageous to first and second spaced roller arrays 61, 65 positioned at the input and output sections of the sample handling subassembly 50. For example, it is contemplated that the use of two spaced roller assemblies 61 can reduce the total weight of the system (compared to a single continuous roller assembly of the same width). It is further contemplated that the use of two spaced roller assemblies can reduce the chance of breaking or disengagement of the pins used to hold the roller assemblies in a transport (e.g., folded) position.

[0143] Optionally, it is contemplated that the input section 58 can define the sample loading location. Optionally, it is contemplated that the output section 62 can define the sample unloading location. In additional aspects, the sample handling subassembly 50 can further comprise a plurality of intermediate sections 66 positioned between the input and output sections 58, 62. In further aspects, the sample handling subassembly 50 can furthercomprise a drive mechanism 70 configured to power movement of the intermediate sections. In exemplary aspects, each intermediate section 66 can comprise at least one actuator and a plurality of rollers, one or more conveyor belts, or combinations thereof.

[0144] In exemplary aspects, it is contemplated that the drive mechanism 70 can comprise a plurality of actuators that are operatively coupled to portions or sections of the sample handling subassembly 50 to selectively control movement of core samples and their containers relative to a plurality of axes. Optionally, it is contemplated that the drive mechanism 70 can be configured to control movement of the core samples and containers relative to the first and second axes 52, 54 and the vertical axis 51 (FIG. 2E) as further disclosed herein. In exemplary aspects, and with reference to FIG. 6B, the plurality of actuators can comprise at least one actuator 72a that is configured to effect movement of the core container relative to the first axis 52, at least one actuator 72b that is configured to effect movement of the core container relative to the second axis 54, and at least one actuator 72c that is configured to effect movement of the core container relative to the vertical axis 51 that is perpendicular or substantially perpendicular to the first and second axes 52, 54. Optionally, the first actuator 72b can comprise a belt conveyor. Optionally, the second actuator 72b can comprise a hydraulic or pneumatic piston or motorized sled that moves at least a portion of (optionally all of) the intermediate section 68b relative to the second axis 54. In further exemplary aspects, the actuators of the drive mechanism 70 can comprise linear actuators, such as for example and without limitation, electrical actuators, mechanical actuators, electro-mechanical actuators, hydraulic actuators, pneumatic actuators, and combinations thereof. However, depending upon the arrangement of each sample handling section, it is contemplated that the drive mechanism 70 can further comprise at least one rotational actuator.

[0145] In further exemplary aspects, as further disclosed herein and depicted in FIGS. 1A-2D and 4, the plurality7of intermediate sections 66 can comprise at least one intermediate section 68a, 68c configured to advance the one or more core samples relative to the first axis 52 and at least one intermediate section 68b configured to advance the one or more core samples relative to the second axis 54. In these aspects, and as shown in FIGS. 1 A-2D, the first intermediate section 68a can comprise at least one conveyor belt that is operatively coupled to an actuator 72a to permit selective movement of a core sample relative to the first axis. In these aspects, it is contemplated that the first intermediate section 68a of the sample handling subassembly can be configured to deliver the core box (containing the core sample)to the second intermediate section 68b of the sample handling subassembly. Upon delivery' of the core box to the second intermediate section 68b, an actuator 72c can selectively raise and lower the core box to permit engagement or coupling between the core box and at least one linear actuator 72b as disclosed herein. Upon coupling between the core box and the linear actuator 72b, the linear actuator can be configured to effect axial movement of the core box relative to the second axis 54, with the core box being supported by rollers positioned within the intermediate sample handling section 68b. In exemplary aspects, and with reference to FIG. 4, the intermediate sample handling section 68b can extend through the sample analysis area 42, and the linear actuator 72b can move the core box about and between three distinct locations along the second axis 54, including an initial position (labeledL‘3” in FIG. 4) before the core box is delivered to the analysis area, an intermediate imaging position on an opposing side of the material analysis subassembly 40 (after the core box passes through the material analysis subassembly, labeled “4” in FIG. 4), and an analysis position (within the material analysis subassembly, labeled “5” in FIG. 4). Although disclosed herein as comprising at least one linear actuator 72b, it is contemplated that the intermediate sample handling section 68b can comprise, in addition or alternatively, a plurality of vertically oriented rollers that engage edge portions of the core box (or adapter as disclosed herein) and are driven by one or more rotational actuators to effect movement of the core box along the second axis 54. After the imaging / analysis process within the material analysis subassembly is completed, the actuator 72b can return the core box to its initial position (labeled '‘3”). It is contemplated that the intermediate sample handling section 68b can further comprise at least one linear actuator 72a that is coupled to at least one conveyor belt and configured to advance the core box to the third intermediate sample handling section 68c, which in turn, can have at least one linear actuator 72a that is coupled to at least one conveyor belt and configured to effect movement of the core box to the output roller assembly. In exemplary aspects, as shown in FIGS. 2A-2B, the conveyor belts of the first and third sample handling sections 68a, 68c can be staggered relative to the conveyor belts of the second sample handling section 68b.

[0146] Optionally, in exemplary aspects, the sample handling subassembly can further comprise a stop plate that is positioned at a distal end of the output section (e g., roller assembly 64). In these aspects, the stop plate can extend across at least a portion of the operative width of the output section to prevent the containers 90 (e.g., core boxes) from advancing beyond the distal end of the output section and falling from the conveyorassembly. In further exemplary aspects, it is contemplated that the core analysis system 10 can comprise a sensor configured to detect the presence of a container (e.g., core box) within the output section. In these aspects, it is contemplated that box sensor can be a conventional proximity sensor or encoder as is known in the art. In further aspects, it is contemplated that the box sensor can be communicatively coupled to the processor 80, and the processor can be configured to selectively control activation or stopping of the drive mechanism 70 of the sample handling subassembly.

[0147] In operation, the drive mechanism 70 can drive axial movement of a first container (core box) from the input section (e.g., roller conveyor 60) onto a first intermediate sample handling section 68a (e.g., roller). As further disclosed herein, after the first container (core box) is positioned on the first intermediate sample handling section 68a (e.g., roller), it is contemplated that the input imaging assembly 100 (e.g., camera assembly) can be activated to identify the core samples within the first container and permit setup of the system parameters. In exemplary aspects, the drive mechanism 70 can drive movement of the container from the first intermediate sample handling section 68a (e.g., roller) to the second intermediate sample handling section 68b. Optionally , it is contemplated that the drive mechanism 70 can comprise a lifting actuator (or other lifting mechanism) that is configured to pull the container upwardly from the first intermediate sample handling section 68a to place the container in a staging position in which the container can be clamped or otherwise coupled to at least one actuator of the drive mechanism 70 that is configured to effect axial movement of the container relative to the second axis 54 to control entry and positioning of the container within the sample analysis area 42. As further disclosed herein, it is contemplated that the drive mechanism can comprise additional actuators that are configured to move the container relative to at least one of the first axis 52 and the vertical axis 51. In further aspects, after completion of the XRF scanning process, the drive assembly 70 can be operated to return the container to the initial position on the second intermediate sample handling section 68b. In another exemplary aspect, the third intermediate sample handling section 68c can be powered by the drive assembly to pull the container from the second intermediate sample handling section 68b through the wetting assembly and into a desired position under imaging assembly 130 to permit wet imaging of the core samples. After the wet image is captured, the powered belt conveyor at the third intermediate sample handling section 68c can be configured to push the container onto the output section (e.g., rollerconveyor 64), where the container can optionally rest against a stop plate as further disclosed herein until it is removed by a system operator.

[0148] In exemplary aspects, and with reference to FIGS. 10A-12B, the system 10 can further comprise a tray adapter assembly 400. In these aspects, the tray adapter assembly 400 can allow the system to be compatible with different types and sizes of containers (e.g., different types and sizes of plastic core trays). The adapter assembly 400 can comprise an adapter 440 comprising a steel plate having inwardly folded longitudinal and transverse walls 442, 444 and defining at least one alignment opening 446 extending through the thickness of the plate. Optionally, the adapter 440 can comprise at least two openings that are positioned proximate opposing comers of one end of the plate. In use, it is contemplated that the adapter 440 can be used with any core container (e.g., core tray) that is compatible with the disclosed system, with the folded edges allowing different trays to fit and convey within the system. It is contemplated that actuator and data acquisition controls on each respective type of core box can be controlled and set by the methods engineer through use of the software or databases disclosed herein.

[0149] In use, the adapter 440 can be positioned at the input section 58 (e.g., the roller assembly 60) of the sample handling subassembly, and the core box can be positioned on the adapter, with the longitudinal and transverse edges of the adapter surrounding the core box. Due to the folded construction of the longitudinal and transverse edges, it is contemplated that the edges can be biased toward a center portion of the adapter such that, in a resting position (before receipt of core box), the edges define a minimum diameter of the adapter. Upon receipt of a core box, the edges can be configured to deform in an outer direction as necessary’ to accommodate the operative dimensions of the core box. In exemplary aspects, w hen the adapter is positioned at the input section 58, it is contemplated that the longitudinal edges of the adapter can be oriented perpendicular or substantially perpendicular to the first axis 52 (and parallel or substantially parallel to the second axis 54). This general orientation can be maintained as the adapter is advanced along the first axis by the drive mechanism 70 as disclosed herein.

[0150] As shown in FIGS. 10A-10B, the tray adapter assembly 400 can further comprise at least one stop projection 410 and at least one locator pin 420 that are secured to, coupled to, or integrally formed with a linear actuator 72b that is configured to effect movement of the adapter 440 (and the core tray on the adapter) relative to the second axis 54 as disclosed herein. In use, the locator pin 420 can be received within and through an alignment openingof the adapter 440 when the adapter (and the core tray) is received by the second intermediate sample handling section 68b. In these aspects, the lift actuator 72c can selectively raise and then lower the adapter 440 such that the locator pin 420 passes through and projects upwardly relative to a corresponding alignment opening 446, and a comer portion of the adapter 440 is positioned between the locator pin and the stop projection 410 to thereby secure the adapter in place. Optionally, in exemplary aspects, the tray adapter assembly 400 can comprise first and second stop projections 410 and first and second locator pins 420, with the first pin being received through a first opening of the adapter and the second pin being received through a second opening of the adapter positioned on an opposing side of the adapter relative to the first axis 52. In further aspects, the adapter assembly can further comprise a proximity sensor 430 that is configured to detect placement of the adapter tray over the locator pin 420 such that the adapter is securely engaged by the locator pin and the stop projection 410. After the processor 80 receives confirmation of proper positioning of the adapter 440 from the proximity sensor 430, the system can proceed with advancement of the adapter 440 (and the core box 90) relative to the second axis as further disclosed herein, and further processing can proceed as further disclosed herein.

[0151] In further exemplary aspects, and with reference to FIGS. 13A-14C, the system 10 can comprise a tray centering assembly 500 that can be positioned to cooperate with the second intermediate sample handling section 68b, which as further disclosed herein, can comprise a lifting table for permitting vertical movement of an adapter and core box. In use, the tray centering assembly 500 can ensure that the adapter 440 (and the core boxes on the adapter) is consistently and precisely oriented relative to the second axis 54. It is further contemplated that the centering of the adapter 440 can help ensure alignment between the locator pins 420 of the adapter assembly 400 and the alignment openings 446 of the adapter 440. In exemplary aspects, the tray centering assembly 500 can comprise first and second guides 510, 520 that are positioned on opposing sides of the intermediate sample handling section 68b relative to the first axis 52. Each guide 510, 520 can be operatively coupled to a respective actuator 512, 522 that is configured to pivot the guide from a lowered, disengaged position to a raised, engaged position (to contact the longitudinal edges of the adapter (and / or portions of the core box) and adjust the orientation of the adapter and core box as needed to continue further processing. It is contemplated that, in response to a signal from the processor 80 that the adapter (and core box) is being lowered, the actuators 512, 522 can be configured to effect movement of the guides from the lowered position to the raised position.Upon engagement between the guides and the adapter, the adapter and the core box can be properly aligned relative to the second axis 54, and thereby prevent undesired contact or alignment defects and make the system more robust, reliable, and repeatable. After proper alignment of the adapter and core box are established, the actuator 72c, using the lifting table, can raise the adapter to an operative height at which the adapter can be axially advanced relative to the second axis 54. It is contemplated that the guides can be positioned sufficiently below the raised position of the adapter such that the guides do not interfere with movement of the adapter and core box relative to the second axis 54. In use, it is contemplated that the centering process can be performed in an automated fashion as part of the typical lowering process for the adapter and core box. In exemplar}' aspects, this automation can be driven by the PLC 80b disclosed herein.

[0152] In still further exemplary aspects, and with reference to FIGS. 3-6A, the core analysis system 10 can further comprise a first wireless transmitter-receiver 140 communicatively coupled to the processor 80. In still further exemplary aspects, the core analysis system 10 can further comprise a database 150. In still further exemplary aspects, the core analysis system 10 can further comprise a second wireless transmitter-receiver 160 communicatively coupled to the database 150. In these aspects, it is contemplated that the second wireless transmitter-receiver 160 can be configured to receive information from the first wireless transmitter-receiver 140 and to transmit information from the database 150 to the first wireless transmitter-receiver 140. Optionally, in exemplary' aspects and as shown in FIG. 3, it is contemplated that the database can be selectively remotely accessible to consumers 200.

[0153] In still further exemplary aspects, and with reference to FIGS. 1A-2D and 4, the core analysis system 10 can further comprise a user interface 170. In these aspects, it is contemplated that the processor 80 can be communicatively coupled to the user interface 170 and configured to receive one or more inputs from the user interface. It is further contemplated that the user interface 170 can comprise a display that is configured to present information to a system user related to the core sample analysis and the performance of the system. In exemplary aspects, the user interface 170 can comprise a single human-machine interface that is installed on an outer portion of the trailer. In these aspects, it is contemplated that the user interface 170 can be shaped such that it can be protected by a cover during transport operations. It is further contemplated that the user interface 170 can be weatherresistant such that it can be used in a variety of weather conditions. In exemplary' aspects, theuser interface 170 can be touchscreen-enabled and natively support a desired screen resolution (e.g., 1280x1024 resolution with 4:3 Aspect ratio). In these aspects, it is contemplated that the user interface 170 can comprise a display that permits data input and display via textual references and drop down lists rather than input of coded values to make for a more user-friendly interface. Optionally, it is further contemplated that the user interface 170 can provide point-and-click options and / or automated data entry' to minimize typing and / or keyboard entry.

[0154] In exemplary aspects, it is contemplated that the user interface 170 can be provided as a component of a computer workstation. However, in other aspects, it is contemplated that the user interface 170 can be provided as a portion of a remote computing device, such as a smartphone, tablet, personal data assistant (PDA), or laptop computer.

[0155] In further exemplary aspects, and with reference to FIG. 4, it is contemplated that the core analysis system 10 can comprise a power source 184 that is configured to supply electrical power to other components of the system. Optionally, in these aspects, the power source 184 can comprise a landline electrical supply, an on-board generator, and a battery- backed uninterruptable power supply (UPS). In these aspects, it is contemplated that the electrical supply can accept a commercial electric supply while providing load-side circuit protection. It is further contemplated that the electrical supply can transform a commercial electrical input (e.g.. 230 V at 50 Hz) into a desired output (e.g., 24 VDC at 160 Amps) with appropriate load-side circuit protection. It is contemplated that the on-board generator can have a local generator control panel that enables starting, control, and operation of the generator. Optionally, the generator can include a monitoring device that is configured to produce an alarm or an output signal that indicates the generator has stopped working or is not functioning correctly. It is contemplated that the battery-backed uninterruptable power supply can supply power to the processing components of the system. In use, it is contemplated that power can be provided to the imaging and camera assemblies for a selected period of time (e.g., at least 30 minutes) before a shutdown command is signaled to their corresponding processing components. When the uninterruptable power supply is supplying power to the processing components, it is contemplated that the control functions of the processing components can be halted.

[0156] In further exemplary aspects, and with reference to FIG. 4, it is contemplated that the core analysis system 10 can comprise an HVAC unit 180 that is configured to maintain the temperature within the sample analysis area 42 at a desired level, as may be stipulated bymanufacturers of the components of the material analysis subassembly 40. Optionally, it is contemplated that the HVAC unit can be configured to maintain the temperature within the sample analysis area 42 at a temperature ranging from about 20°C to about 24°C under normal operating conditions. In exemplary aspects, it is contemplated that the HVAC unit can be powered from the domestic electrical supply to the trailer, which may be derived from a landline power source or an onboard generator as further disclosed herein. In use, it is contemplated that digital XRF imaging equipment can be sensitive to ambient temperature variation, and rapid changes in temperature and extremes of temperature can severely damage digital detectors. Accordingly, it is contemplated that temperature control within the sample analysis area 42 (particularly within the photon sensor enclosure) is critical to obtaining accurate data and protecting the system components. In exemplary aspects, the core analysis system 10 can further comprise an environmental monitoring device that logs temperature variations within the sample analysis area 42 or, more particularly, within the photon sensor enclosure.

[0157] In still further exemplary aspects, and with reference to FIG. 4, it is contemplated that the core analysis system 10 can comprise a gas (e.g., Helium) supply source 182 that is configured to supply gas to the material analysis subassembly 40. Optionally, in these aspects, the gas supply source can be an onboard Helium supply subsystem that is configured to provide a dry helium cover gas to the XRF instrument (e.g., X-ray source). In use, it is contemplated that the processor 80 can be configured to selectively initiate and cease delivery of gas to the XRF instrument. Optionally, in exemplary aspects, the gas supply source 182 can comprise a 2-stage bottle regulator that reduces bottle pressure from above 2,000 psi to about 60 psi (+ / - 10 psi). In further aspects, the gas supply source 182 can optionally comprise a pressure switch on an outlet side of the bottle regulator that delivers a signal to the processor 80 when the pressure falls below a selected level, such as for example and without limitation, 50 psi. In still further aspects, it is contemplated that the core analysis system 10 can comprise an instrument regulator that is configured to reduce the pressure at the outlet side of the 2-stage regulator pressure to 1 psi (+ / - 5 psi). In still further exemplary aspects, the gas supply source 182 can comprise an instrument flow control device that enables flow from the outlet side of the instrument regulator to the XRF instrument. In these aspects, it is contemplated that the instrument flow control device can be communicatively coupled to the processor 80 such that the processor can selectively control a rate of gas flow between the outlet of the instrument regulator and the inlet of the XRF instrument. Optionally, it iscontemplated that the rate of gas flow can range from about 0.0 Liters per minute (LPM) to about 1.0 LPM.

[0158] In use, the disclosed core analysis system can provide on-site analysis and data collection capabilities for drill core samples. Optionally, in exemplary aspects, it is contemplated that a plurality of core analysis systems can be operated in parallel from distinct locations, with respective data sets from each core analysis system delivered to a centralized server system for further analysis as disclosed herein.

[0159] In use, it is contemplated that the disclosed core analysis systems can reduce the costs associated with processing assays, including costs conventionally associated with sample preparation, sample handling, sample tracking, and data processing. It is further contemplated that the disclosed core analysis systems can provide improved data quality in comparison to existing core analysis systems. More particularly, it is contemplated that the disclosed core analysis systems can preserve heterogeneity7and objectivity7while also associating time and depth data with each core sample and providing systematic collection and linking of data sets. It is further contemplated that the disclosed core analysis systems can provide an increase in the speed of decisions by drilling system operators or remote customers. More particularly, it is contemplated that the disclosed core analysis systems can provide near real-time access to core data via a centralized database, which can be accessed by any networked computing device (optionally, computing devices, from multiple users or customers). In exemplary aspects, as further disclosed herein, the processor 80 can be configured to provide customizable threshold notifications associated with various core parameters to system users or customers.

[0160] In exemplary7aspects, and with reference to FIGS. 4-6B, the processor 80 can comprise a processing assembly comprising a plurality of processing components. Optionally, in these aspects, the processor 80 can be embodied as a plurality of processors. For example, the processor 80 can be embodied as a processor of at least one industrial process controller (IPC) 80a and a processor of at least one programmable logic controller (PLC) 80b. In exemplary7aspects, the IPC can be an industrial grade computer, and the system operator can interface with the IPC through the user interface 170 disclosed herein. In exemplary aspects, it is contemplated that the IPC can be configured to perform a variety7of functions, including one or more of the following: monitoring for loss of power and halting control functions when a power loss is detected; controlling system restart using operator confirmation after reestablishing power; signaling a shutdown command to an industrial dataconcentrator (IDC) when the UPS indicates backup power is exhausted; performing a shutdown when the UPS indicates backup power is exhausted; interfacing with the PLC byoperating as a Modbus Master, which enables communication among many devices connected to the same network; monitoring activation of the PLC over industrial network communications (Modbus) to determine if communications are established and operating; halting control functions when a PLC communications loss is detected; processing logic to indicate activation or readiness of the IPC over industrial network communications (Modbus); reading / writing status data to one or more PLC Modbus Slave registers during cycle operations; interfacing with three (3)-axis motion controllers 80c, 80d, 80e (e.g., X-, Y- , and Z-axis controllers) of the sample handling subassembly by operating as a Modbus Slave; monitoring a Modbus connection with each axis motion controller and halting control functions when a communications loss is detected; reading and writing values into an interface block used by Modbus that reads and writes from each Axis Motion Controller; interfacing with an operator through the user interface 170 to indicate status of the system; interfacing with an operator through the user interface 170 to collect and authenticate login credentials and set application privileges; interfacing with the operator through the user interface 170 to collect information required by the system during setup operations; interfacing with the XRF Instrument to query, configure, and command the unit during cycle operations; interfacing with the image files captured by the imaging assemblies during cycle operations; processing images to extract and parse OCR data from image files during cycle operations; interfacing with the central database to retrieve information required by the system during startup, setup, and cycle operations; interfacing with the memory 85 to store information collected by the system during startup, setup, and cycle operations; interfacing with the memory 85 to transfer information collected by the system during cycle operations to the IDC; interfacing with the memory 85 to perform database maintenance functions; and processing XRF data using calibration files stored in the memory 85.

[0161] In exemplary aspects, the PLC of the processor 80 can comprise an Allen-Bradley MicroLogix 1400 Small Programmable Logic Controller. Optionally, the PLC can be configured to provide input / output control to the core analysis system 10. In exemplary aspects, the PLC can comprise one or more of the following: 24VDC inputs, relay outputs, an expansion PNP output chassis, a 10 / 100 EtherNet / IP Port. EtherNet / IP Messaging. DNP3 over IP, and Modbus TCP / IP as are known in the art. In further exemplary aspects, the PLC can operate as a Modbus Slave and host Bit and Word registers to support required interfaceswith the Modbus Master (IPC). In further exemplary aspects, the PLC can comprise an axis control system that is configured to provide multi-axis (e.g., three-axis) control of the movement of the components of the core analysis system. In exemplary aspects, the axis control system can comprise three Festo CMMO-ST Motion controllers that are configured to provide axis control for a Trailer Core Scanner module as shown in FIG. 5.Data Networks

[0162] In exemplary aspects, and with reference to FIGS. 5-6, two data networks can be installed and configured inside the core analysis system. A first data network, shown as the TrailerControlNET in FIG. 5, can provide network services for automation components. It is contemplated that the TrailerControlNET can be isolated from other networks to ensure security and deterministic performance attributes needed by control networks. A second data network, shown as the TrailerDataNET in FIG. 5, can supply a data netw ork required to push large data sets from the IPC to the IDC at designated cycle points. The IPC can use the TrailerDataNET network to retrieve calibration and setup files delivered to the IDC by a system engineer. In use, it is contemplated that remote access connections to the IPC and IDC also pass over the TrailerDataNET.

[0163] In exemplary aspects, the core analysis system can further comprise a CorporateServiceNET network that provides VPN access from the Network Router on the TrailerDataNET to a WAN authentication / access service.

[0164] Optionally, in exemplary7aspects, the IDC can be an industrial grade computer configured to operate as a ‘‘Data Concentrator” node on the TrailerDataNet. In use, it is contemplated that the operator does not directly interface with the IDC through the local user interface 170 but can monitor logs that show transfer of core data from the IPC to the IDC. In use, it is further contemplated that the database used on the IDC can bridge data from each remote XRF Trailer system into a centralized data warehouse.Core Analysis Methods

[0165] In use, and as further disclosed herein, the core analysis system 10 can be used to perform a core analysis method. In one aspect, a core analysis method can comprise positioning the trailer in a selected position relative to a drill location. In this aspect, and as further disclosed herein, the analysis assembly can be secured to the trailer. In another aspect, the core analysis method can further comprise positioning one or more core samples on the sample handling subassembly. In an additional aspect, the core analysis method cancomprise activating the sample handling subassembly to selectively deliver the one or more core samples to the sample analysis area of the material analysis subassembly. In a further aspect the core analysis method can comprise activating the material analysis subassembly while the one or more core samples are positioned in the sample analysis area.

[0166] In exemplary aspects, and as further disclosed herein, when the material analysis subassembly comprises an X-ray source and a photon sensor, the X-ray source can deliver radiation to the one or more core samples positioned within the sample analysis area. In these aspects, the core analysis method can comprise using the photon sensor to detect X-ray fluorescence in response to the radiation delivered to the core samples by the X-ray source.

[0167] In further exemplary aspects, the core analysis method can comprise using the sample handling subassembly to selectively advance the one or more core samples between the sample loading location and the sample unloading location. In these aspects, the material analysis subassembly can be positioned between the sample loading location and the sample unloading location.

[0168] In still further exemplary aspects, the core analysis method can comprise using the sample handling subassembly to selectively advance the one or more core samples relative to the first axis between the sample loading location and the sample unloading location. In these aspects, and as further disclosed herein, the material analysis subassembly can be positioned between the sample loading location and the sample unloading location relative to the first axis.

[0169] In still further exemplary aspects, and as further disclosed herein, the sample analysis area of the material analysis subassembly can be spaced from the first axis relative to a second axis. In these aspects, the core analysis method can comprise using the sample handling subassembly to selectively advance the one or more core samples relative to the second axis to deliver the one or more core samples to the sample analysis area of the material analysis subassembly.

[0170] In further exemplary aspects, the core analysis method can further comprise, for each delivery of radiation to core samples positioned within the sample analysis area, using the processor to receive at least one output from the photon sensor. In these aspects, and as further disclosed herein, the at least one output can be indicative of the measured XRF of the core samples positioned within the sample analysis area.

[0171] In further exemplary aspects, the core analysis method can comprise positioning one or more core samples within a container. In these aspects, the core analysis method can further comprise selectively delivering the at least one container to the sample analysis area of the material analysis subassembly. Optionally, in additional aspects, each container can comprise indicia of at least one characteristic of the one or more core samples positioned within the container, and the method further comprises using an input imaging assembly to detect the indicia of each container, wherein the input imaging assembly is communicatively coupled to the processor. Optionally, in some aspects and as further disclosed herein, the input imaging assemlby can be positioned proximate the sample loading location.

[0172] In still further exemplary aspects, the core analysis method can further comprise using a dry ing assembly to dry' the one or more core samples. In these aspects, and as further disclosed herein, the drying assembly can be positioned between the sample loading location and the sample analysis area of the material analysis subassembly. In additional aspects, when the processor is communicatively coupled to the drying assembly as disclosed herein, the core analysis method can further comprise using the processor to selectively activate the drying assembly to dry the one or more samples.

[0173] In still further exemplary' aspects, when the material analysis subassembly comprises a first imaging assembly as further disclosed herein, the core analy sis method can further comprise using the first imaging assembly to produce an image of core samples received within the sample analysis area. In additional aspects, the core analysis method can comprise using the processor to selectively activate the first imaging assembly to produce an image of core samples within the sample analysis area.

[0174] In still further exemplary' aspects, the core analysis method can further comprise using a wetting assembly to wet the one or more samples. Optionally, in these aspects, the wetting assembly can be positioned between the sample analysis area and the sample unloading location. In additional aspects, when the processor is communicatively coupled to the wetting assembly as further disclosed herein, the core analysis method can comprise using the processor to selectively activate the wetting assembly. Optionally, in further aspects, the core analysis method can further comprise using a second imaging assembly to produce an image of the one or more core samples following wetting of the one or more core samples. In these aspects, and as further disclosed herein, it is contemplated that the second imaging assembly can be positioned between the wetting assembly and the sample unloading location. In exemplary aspects, and as further disclosed herein, when the processor is communicativelycoupled to the second imaging assembly, the core analysis method can comprise using the processor to selectively activate the second imaging assembly.

[0175] In still further exemplary aspects, the core analysis method can further comprise using the drive mechanism of the sample handling subassembly to power (and effect) movement of the intermediate sections of the sample handling subassembly. Optionally, in these aspects, using the drive mechanism to power movement of the intermediate sections can comprise: using at least one intermediate section to advance the one or more core samples relative to the first axis; and using at least one intermediate section to advance the one or more core samples relative to the second axis.

[0176] In still further exemplary aspects, and as further disclosed herein, the core analysis method can further comprise using the second wireless transmitter-receiver to receive information from the first wireless transmitter-receiver and to transmit information from the database to the first wireless transmitter-receiver.

[0177] In still further exemplary7aspects, and as further disclosed herein, the core analysis method can further comprise selectively accessing the database from at least one remote location.

[0178] In still further exemplary aspects, and as further disclosed herein, the core analysis method can further comprise using the user interface to receive one or more inputs from a user.

[0179] In use, it is contemplated that the processing elements of the disclosed core analysis methods can accomplish one or more of the following tasks: managing the orderly startup and shutdown of control and data collection functions; collecting system setup information from the operator using the user interface (e.g., touch-panel interface); controlling the movement of containers (e.g., core boxes) into and out of the system; identifying containers (e.g., core boxes) along with attributes associated with the contents of the containers; associating containers (e.g., core boxes) to images, XRF results, and instrument status information collected by the data acquisition components of the system; transmitting data sets to a central database using wireless networks; providing diagnostics to assist rapid detection and correction of upset conditions and failed components of the system; and controlling and monitoring trailer utilities (Pow er, HVAC, Helium Supply).

[0180] In exemplary aspects, it is contemplated that the disclosed systems and methods can permit processing of core samples in an automated or semi-automated manner. Forexample, in some optional aspects, automatic analysis cycles can be processed for a core sample container (e.g., core box) in the following sequence. First, a core container can be manually positioned by an operator at the input section (e.g., roller conveyor 60). Second, if the first intermediate sample handling section is empty, the core container can be indexed into the first intermediate sample handling section. With the core container positioned on the first intermediate sample handling section, the input imaging assembly 100 can be triggered to capture a core container image. The core container image can be presented to the operator through the user interface, and the operator can use the user interface to provide one or more of the following pieces of information: drill site project name (optionally, from drop-dow n list); core depth (at Reference 0 on the core container); and depth information associated with selected scan areas on the obtained image. After this information is collected, the operator can initiate the processing sequence (e.g., by clicking or selecting a '‘Process Core Box” button or equivalent.

[0181] Prior to use of the disclosed systems and methods (e.g., during commissioning), it is contemplated that the following data can be associated with each type of core container (e.g., core box) to be used with the core analysis system. Thus, when the system operator selects a particular core container type, the following data can be referenced during operation of the system: core length (maximum length of an individual row of core); number of core segments (number of core segments in a core container); core X-axis starting position; core X-axis ending position; core Y-axis segment position (taught for each segment in core container); core Z-axis slow position; and core Z-axis max position. Upon entry of this information, the information can be inserted into a log table within the memory 85. and the profile of each core container type can be selectively accessed for each core container that is passed through the system.

[0182] When processing begins, a record can be inserted into the memory with the operator-supplied information. If the second intermediate sample handling section 68b is empty, then the processor can initiate indexing of the core container onto the second intermediate sample handling section 68b. The processor can then activate the drying assembly, and upon detection of the core container on the second intermediate sample handling section 68b, the core container can be clamped such that the core container is coupled to the actuators of the drive assembly 70 that advance the core container within the sample analysis area. The processor can initiate movement of the core container into the sample analysis area relative to the first axis at a speed that is configured for optimal drying.As the core container exits the drying assembly and enters the core sample analysis area, the processor receives a signal indicative of the presence of the core container within the sample analysis area (e.g., through a proximity switch, encoder, or other sensor), and the processor can then activate imaging assembly 48 to capture a dry core sample image. The acquired image can then be provided to the memory and associated with the core container record. The processor can then send a signal that initiates the cycle of the material analysis subassembly. The processor can be configured to activate a first actuator to move the photon sensor and X-Ray source relative to the first axis 52 to an operative position proximate a first sample segment. The processor can be configured to then activate a second actuator to move the core container to a sampling location relative to the X-Ray source and photon sensor. The processor can then activate imaging of the sample location using imaging assembly 190. If the particular analysis method employed requires helium, then the processor can be configured to activate flow of helium into the sample analysis area. With the core container in the sample location, the processor can be configured to activate an actuator to effect downward movement of the photon sensor and other analysis components relative to the vertical axis 51 until the core is contacted (or nearly contacted). Upon contact, the processor can initiate an assay with associated filter, energy, and duration parameters. The transmitted live spectrum can be collected and processed into a display. When the assay is completed, the processor can deactivate helium flow. RAW spectrum data can be requested, processed with the specified calibrations, and stored into the memory along with the sample image. Next, the actuator(s) can return the photon sensor and other processing components to its initial (home) position. The sequence of movement relative to the first, second, and vertical axes can be repeated for each sample segment on the core container until all sample segments are processed.

[0183] After processing is completed, all core container data can be sent to the IDC as further disclosed herein. The processor can then send a signal to prepare the system for unloading of the core container. The processor can cause the core container to be returned to the second intermediate sample handling section, and the processor can receive a signal (from a sensor as disclosed herein) that is indicative of the presence of the core container at the second intermediate sample handling section. Upon receipt of a signal indicative of the presence of the core container, the processor can activate the wetting assembly 120 and initiate movement of the core container through the wetting assembly (from the second intermediate sample handling section to the third intermediate sample handling section 68c).The wetting assembly can then be deactivated, and the imaging assembly 130 can be triggered to capture a wet core sample image. The image can then be inserted into the memory and associated with the core container record. If the output section (roller conveyor 64) is empty, then the processor can cause indexing of the core container to the output section.

[0184] Thus, in use, the core analysis process can be fully automated from the point where the core container is loaded at the input section 58 to the point where the core container is retrieved at the output section 62. In exemplary aspects, it is contemplated that the system operator can input a depth range (“Depth From”, “Depth To”) and scan interval that are determined and disclosed to the drilling team. As further disclosed herein, the “field ready” automated scanner can be compatible with PQ, HQ, NQ and BQ core containers, which can be provided with drill rigs that make use of the XRF technology disclosed herein.

[0185] To monitor instrument drift, it is contemplated that variations of XRF concentrations of internationally recognized standards to that of refined laboratory methods can be monitored. In exemplary aspects, a variety of recognized standard core compositions can be used. It is contemplated that quality assurance / quality control protocols can be employed on a regular basis and constant with depth. In exemplary' aspects, the standard core compositions can comprise any site matrix that is matched to required standards for a particular client. In these aspects, the standard core compositions can further comprise any reference standards used to create an empirical calibration as further disclosed herein.Optionally, the standard core compositions can be provided as pressed pellets that are formed by pressing pulverized rock material (at pm sizes) under pressure (e.g., 20 tonnes (metric tons)) to produce a solid briquette.

[0186] In exemplary aspects, and with reference to FIGS. 9A-9C. a verification assembly 300 can be used to preserve the quality of data obtained by the system. In use, and as further described herein, the verification assembly 300 can be operated automatically with the material analysis subassembly at regular intervals determined by a methods engineer. It is contemplated that the verification assembly 300 can be used as part of a formulated “Quality Control / Quality Assurance” program implemented on each project in an attempt to preserve data integrity. It is further contemplated that the data related to the analysis of “standard” trays (e.g., elemental concentration, name, location relative to the XRF detection assembly) can be recorded and associated with the verification assembly 300 in data tables for further processing and analysis. In exemplary aspects, the verification assembly 300 can beconfigured to periodically analyze a selection of one or more pellet samples (e.g., from one pellet up to six pellets) using the material analysis subassembly 40. The presentation of these pellets can be controlled by the database and software programs disclosed herein. Although the process can be selectively run in response to a manual input through the user interface, it is contemplated that the verification process can be scripted into an “Analysis Method’' that includes the X-ray parameters, Project Metadata, and Machine parameters (e.g., Scan spacing), which can be linked through a “standards” table in the database. It is contemplated that the “standards” table can associate data for a particular “standard” sample with specific instruments, analysis methods, and other site characteristics. The disclosed verification method can optionally be initiated using the PLC 80b and the Trailer Services bloc in the network topology further disclosed herein. In use. the processor 80 can compare the parameters recorded during a given verification process to “standards” data or previously measured parameters to evaluate accuracy, precision, instrument drift, and contamination of the analysis assembly.

[0187] In use, the verification method can be a part of the normal use of the system, between box runs (normal operation scanning trays). In exemplary aspects, at least one pressed pellet (e.g, at least one 6 x 32 mm pressed pellet) can be positioned within receptacles 312 (optionally, axially aligned receptacles) of an arm 310 of the verification assembly 300. As used herein, the term “pellet” refers to “standard” material compositions, which can optionally comprise pulverized rock (80% passing grains less than 75um) pressed into a small circular briquette to produce a sample that is representative of rock density for material analysis purposes. Each receptacle 312 can be in communication wi th a biased spring such that biases the pellets away from the receptacle (opposite the direction of gravity). Optionally, the receptacles 312 can be provided with an acrylic backing. In use, the receptacles ensure the pellet makes contact with the XMS apparatus by applying a reactionary force against the XMS pressing (due to gravity).

[0188] The arm 310 can have a proximal end 314 that is pivotally coupled to a pin / proj ection 322 of a support bar 320. The pin / proj ection 322 can extend upwardly from the support bar 320, and the arm 310 can pivot relative to a rotational axis that extends through the pin / proj ection and is parallel to the vertical axis 51 (FIG. 2E). The arm 310 can be operatively coupled to an actuator 330 (e.g., a linear actuator) that is configured to effect pivotal movement of the arm about and between an operative “presentation” position and a rest position. As shown in FIGS. 9A-9B, it is contemplated that the actuator 330 can beretracted to pivot the arm 310 in the operative “presentation” position in which the photon sensor can contact (or be positioned proximate) the receptacles 312. With the arm 310 in the “presentation” position, the pellets within the arm 310 can be individually and sequentially scanned as further disclosed herein. It is contemplated that the scans of the pellets can be performed at predetermined time intervals in accordance with the disclosed automated methods. In use, it is contemplated that the proximity sensor 47 of the material analysis subassembly 40 can be configured to detect the presence of the arm 310 in the “presentation” position, at which point scanning of the pellets can be initiated.

[0189] After scanning of pellets is completed, the actuator 330 can be extended to pivot the arm 310 away from the operative position until reaching the rest position. In exemplary aspects, the verification assembly 300 can comprise a cover 340 that is configured for movement about and between a closed position and an open position. In the closed position, the cover 340 can be configured for placement over the receptacles 312 of the arm 310 when the arm is in the rest position. In operation, when the arm 310 reaches the rest position, the arm can press against a spring-loaded flange, which effects movement of the cover from the open position to the closed position. Alternatively (or additionally), a proximity sensor 342 can detect the presence of the arm 310 in the rest position, and in response to receipt of a signal from the processor 80 indicating the presence of the arm 310 in the rest position, a cover actuator 344 can effect movement of the cover 340 from the open position to the closed position, thereby enclosing the receptacles 312. Optionally, the cover 340 can be pivotally coupled to a portion of the frame 32, such as through a mount as shown in FIG. 9C.

[0190] In exemplary aspects, the pellets can reflect matrix-matched standards, such as certified reference materials (CRMs) or other reference materials used during calibration of the analysis assembly 30, thereby permitting monitoring of accuracy and instrument drift. In exemplary aspects, one of the pellets can comprise a silica blank that can be used for monitoring of contamination. Verification data can be stored in the database (e.g., a SQL database) and exported as part of Quality Assurance / Quality Control summary reports separate from the data recorded during regular core sample analysis. It is contemplated that the program can be modular, allowing for use of the verification process in accordance with the wants and needs of the customer.

[0191] In exemplary aspects, the pellets can reflect matrix-matched standards, such as certified reference materials (CRMs) or other reference materials used during calibration of the analysis assembly 30, thereby permitting monitoring of accuracy and instrument drift. Inexemplary aspects, one of the pellets can comprise a silica blank that can be used for monitoring of contamination. Verification data can be stored in the database (e.g., a SQL database) and exported as part of Quality Assurance / Quality Control summary reports separate from the data recorded during regular core sample analysis. It is contemplated that the program can be modular, allowing for use of the verification process in accordance with the wants and needs of the customer.

[0192] In operation, it is contemplated that disclosed verification methods can provide for monitoring of accuracy, precision, instrument drift, and contamination of the system to ensure that quality assurance / quality control standards are met. During use, the processor 80 can initiate the verification method and present at least one pressed pellet sample to the photon sensor. This is done at periodic intervals set by the Methods Engineer. When verification is initiated, during normal operation, it is contemplated that the HMI user interface can display a message such as "‘Verification In Progress.'’ Next, the actuator 330 can retract, thereby presenting the pressed pellets to the sensor. As shown in FIG. 9A, the arm 310 can be in line with the XMS opening 45 when in the presented position. The proximity sensor 47 (or a separate proximity sensor within the sample analysis area) detects this, and the actuator 192 of the material analysis subassembly 40 can lower the XMS housing 49 in a “Slow” speed to the arm 310, with the spring-loaded pellets pressing against the sensor and / or the housing, to a preset end point. The XMS assembly can then acquire XRF spectra from the pellet(s) and store data / meta data in appropriate tables. The actuators 192 can then lift the XMS housing and move the XMS housing along the first axis 52 to the next pellet (if any, up to 6 pellets). The total number of pellets will depend upon the number of pellets required for the particular QA / QC program. The analysis process can be repeated for each respective pellet. After all pellets are scanned, the actuator 330 can be extended to return the arm 310 to the rest position as shown in FIG. 9C, thereby effecting movement of the cover from the open position to the closed position, in which the pellets are protected contamination, damage and loss of the verification “Pellets” as further defined herein.During the transport of the analysis assembly 30, it is contemplated that the set of pellets can be provided as a verification slide that can be transported separately from the XMS assembly (e.g., in a pelican case), thereby eliminating any possibility of lost pellets, pellets being in the incorrect location for purposes of verification, and damage during transport. After the spectra acquisition data / parameters are recorded for the pellets, the processor can be configured to compare the recorded data / parameters to “standards” data / parameters or to previouslyrecorded data / parameters for the pellets, and the processor can use this comparison to determine the accuracy, precision, instrument drift, and contamination of the analysis assembly.

[0193] Optionally, the disclosed system can provide a continuous scanning method (Drag Mode) as an alternative to the stop and start '‘Spot Scan’’ method disclosed herein. When a continuous scanning method is used, a selected row of core within a core box can be scanned in a continuous manner without halting the photon acquisition process. The acquired data will therefore be representative of a full scanned meter (or other distance) of core rather than a series of single spot scans. To help perform the continuous scanning method, it is contemplated that the disclosed system can be provided with an ultrasonic transducer (UT) sensor that feeds a digital signal of “height” to allow for loop control of the Z axis to account for vary ing core heights. In addition, it is contemplated that a Z-axis actuator can be modified to be a “slow” or more precise actuator to permit maintenance of a precise gap between the core face and the instrument face.

[0194] All publications and patent applications mentioned in the specification are indicative of the level of those skilled in the art to which this invention pertains. All publications and patent applications are herein incorporated by reference to the same extent as if each individual publication or patent application was specifically and individually indicated to be incorporated by reference.EXEMPLARY ASPECTS

[0195] In view of the described products, systems, and methods and variations thereof, herein below are described certain more particularly described aspects of the invention. These particularly recited aspects should not however be interpreted to have any limiting effect on any different claims containing different or more general teachings described herein, or that the “particular” aspects are somehow limited in some way other than the inherent meanings of the language literally used therein.

[0196] Aspect 1: A system comprising: a high energy' photon emission assembly that is configured to emit source photons along an emission axis, wherein the high energy photon emission assembly comprises a tube assembly, wherein the tube assembly comprises: a target material; and a cathode,wherein the tube assembly is configured to emit electrons having respective energies of at least 150 keV at the target material from the cathode; and a sample container that is configured to receive a core or rock sample, wherein the sample container is positioned to receive the source photons from the high energy photon emission assembly.

[0197] Aspect 2: The system of aspect 1, further comprising at least one photon detector that is configured to produce an output in response to detection of photons released by the core or rock sample.

[0198] Aspect 3: The system of aspect 2, wherein a first photon detector of the at least one photon detector is configured to receive photons along a detector axis, wherein the detector axis is oriented at a first angle relative to the emission axis, wherein the first angle is from 60 degrees to 120 degrees.

[0199] Aspect 4: The system of aspect 3, wherein the first angle is about 90 degrees.

[0200] Aspect 5: The system of aspect 2, wherein a first photon detector of the at least one photon detector is configured to receive photons along a detector axis, wherein the detector axis is oriented at a first angle relative to the emission axis, wherein the first angle is from 30 degrees to 45 degrees.

[0201] Aspect 6: The system of aspect 5, wherein the first angle is from about 36 degrees to about 42 degrees.

[0202] Aspect 7: The system of aspect 2, further comprising a copper housing, wherein a portion of the copper housing is positioned between the high energy photon emission assembly and a first photon detector of the at least one photon detector, wherein the copper housing defines a window, wherein the detector axis extends through the window.

[0203] Aspect 8: The system of aspect 7, further comprising a detector filter over the window.

[0204] Aspect 9: The system of aspect 8, wherein the detector filter comprises zinc or a material having a lower elemental density than zinc.

[0205] Aspect 10: The system of aspect 9, wherein the detector filter comprises copper and aluminum.

[0206] Aspect 11 : The system of aspect 8, wherein the detector filter is configured to attenuate photons having respective energies below 50 keV.

[0207] Aspect 12: The system of aspect 8. wherein the detector filter is configured to attenuate photons having respective energies below 30 keV.

[0208] Aspect 13: The system of aspect 3. wherein the detector axis intersects the emission axis.

[0209] Aspect 14: The system of aspect 13, wherein the sample container is configured to support the core or rock sample so that the detector axis intersects the emission axis within an interior of the core or rock sample.

[0210] Aspect 15: The system of aspect 14, wherein the sample container is configured to support the core or rock sample so that the detector axis intersects the emission axis at or proximate to an axial center of the core or rock sample.

[0211] Aspect 16: The system of aspect 1, further comprising a sleeve that surrounds the at least one photon detector, wherein the sleeve comprises lead or lead equivalent.

[0212] Aspect 17: The system of aspect 1, wherein a first photon detector of the at least one photon detector is a low gold photon detector.

[0213] Aspect 18: The system of aspect 1. further comprising a backstop positioned along the emission axis so that the core or rock sample is between the backstop and the high energy photon emission assembly, wherein the backstop comprises copper.

[0214] Aspect 19: The system of aspect 18, wherein the sample container comprises the backstop.

[0215] Aspect 20: The system of aspect 18. wherein the backstop further comprises a backstop target material, wherein the backstop target material is positioned so that, when the core or rock sample is received within the sample container, the backstop target material is positioned between the core or rock sample and the copper of the backstop.

[0216] Aspect 21 : The system of any one of aspects 18-20, wherein the backstop target material comprises uranium.

[0217] Aspect 22: The system of aspect 1. further comprising a beam filter between the target material and the container, wherein the beam filter comprises a plurality of materials, the plurality of materials comprising: a first filter material configured to provide characteristic K-lines; anda second filter material, wherein the second filter material having an absorption edge of a lower energy than the characteristic K-lines of the first filter material.

[0218] Aspect 23: The system of any one of the preceding aspects, wherein the high energy photon emission assembly comprises a copper collimator.

[0219] Aspect 24: The system of aspect 23, wherein the target material is a primary target, wherein the tube assembly is configured to emit electrons at the primary target to cause the primary target to emit primary target photons along a first axis, wherein the high energy photon emission assembly further comprises a secondary target positioned along the first axis, wherein secondary target is configured to emit secondary target photons along the emission axis in response to being bombarded by the primary target photons, wherein the secondary target comprises an element with an atomic number above 89, wherein the collimator is positioned between the primary target and the secondary target.

[0220] Aspect 25: The system of aspect 24, further comprising a nose filter positioned between the copper collimator and the secondary' target.

[0221] Aspect 26: The system of aspect 22, wherein the high energy' photon emission assembly comprises a copper collimator, wherein the beam filter is positioned axially between the copper collimator and the tube assembly.

[0222] Aspect 27: The system of aspect any one of the preceding aspects, further comprising a copper housing, wherein a portion of the copper housing is positioned between the high energy photon emission assembly and the detector.

[0223] Aspect 28: The system of any one of aspects 2-27, wherein the sample container is positioned so that, when the sample container has a core or rock sample therein, the at least one photon detector is spaced from the core or rock sample by a spacing from about 1 cm to about 5 cm along the detector axis.

[0224] Aspect 29: The system of aspect 28, wherein the sample container is positioned so that, when the sample container has a core or rock sample therein, the at least one photon detector is spaced from the core or rock sample by a spacing from about 2 cm to about 4 cm along the detector axis.

[0225] Aspect 30: The system of any one of the preceding aspects, wherein the high energy photon emission assembly has an emission end, wherein the sample container is positioned sothat, when the sample container has a core or rock sample therein, the high energy7photon emission assembly is within 10 cm of the emission end of the core or rock sample.

[0226] Aspect 31 : The system of aspect 30, wherein the sample container is positioned so that, when the sample container has a core or rock sample therein, the high energy photon emission assembly is within 1 cm of the core or rock sample.

[0227] Aspect 32: The system of any one of the preceding aspects, further comprising a vessel containing water therein, wherein the vessel is positioned along the emission axis between the target material and the container.

[0228] Aspect 33: The system of any one of the preceding aspects, further comprising a crystal positioned along the emission axis between the target material and the container.

[0229] Aspect 24: The system of any one of the preceding aspects, wherein the target material is a primary target, wherein the tube assembly is configured to emit electrons at the primary7target to cause the primary target to emit primary target photons along a first axis, wherein the high energy photon emission assembly further comprises a secondary target positioned along the first axis, wherein secondary target is configured to emit secondary target photons along the emission axis in response to being bombarded by the primary target photons, wherein the secondary target comprises an element with an atomic number above 89.

[0230] Aspect 35: The system of aspect 34, wherein the secondary target comprises uranium.

[0231] Aspect 36: The system of aspect 34, wherein the secondary target is encapsulated within a light metal casing.

[0232] Aspect 37: The system of aspect 36, wherein the light metal casing comprises aluminum.

[0233] Aspect 38: The system of aspect 35, wherein the sample container is positioned so that, when the sample container has a core or rock sample therein, the secondary target is within 2 cm of the core or rock sample.

[0234] Aspect 39: The system of aspect 38, wherein the sample container is positioned so that, when the sample container has a core or rock sample therein, the secondary7target is within 1 cm of the core or rock sample.

[0235] Aspect 40: The system of any one of the preceding aspects, wherein the high energy7photon emission assembly comprises only a primary7target, wherein the high energy photonemission assembly is configured to cause the primary target to emit photons along the emission axis to the sample container.

[0236] Aspect 41 : The system of any one of the preceding aspects, further comprising a cover between the sample container and the detector, wherein the cover comprises aluminum or copper.

[0237] Aspect 42: The system of any one of the preceding aspects, wherein the tube assembly is configured to emit electrons having respective energies of at least 150 keV at the target material from the cathode having energies from 200 keV to 500 keV.

[0238] Aspect 43: The system of any one of the preceding aspects, wherein the sample container comprises a belt that is configured to cany' the core or rock sample across the emission axis.

[0239] Aspect 44: The system of any one of the preceding aspects, wherein sample container comprises a conveyor.

[0240] Aspect 45: The system of any one of the preceding aspects, wherein the high energy photon emission assembly is configured to emit the source photons in a fan configuration so that the source photons are incident upon an area transverse to the emission axis.

[0241] Aspect 46: The system of any one of the preceding aspects, wherein the high energy photon emission assembly is configured to emit the source photons in a cylindrical configuration.

[0242] Aspect 47 : A method comprising: using the system of any one of the preceding aspects.

[0243] Aspect 48: A method comprising: bombarding a target material with electrons having energies of at least 150 keV; emitting a beam of photons at a core or rock sample; and receiving, by a photon detector, photons from the core or rock sample.

[0244] Aspect 49: The method of aspect 48. wherein the electrons have energies from 200 keV to 500 keV.

[0245] Aspect 50: The method of aspect 48, further comprising filtering a first beam to form the beam of photons.

[0246] Aspect 51 : The method of aspect 50, wherein filtering the first beam comprises filtering the first beam using a plurality of filter materials.

[0247] Aspect 52: The method of aspect 50, wherein the plurality of filter materials comprise a first filter material and a second filter material, wherein the first beam is incident upon the first filter material before passing to the second filter material, wherein the first filter material provides characteristic K-lines, wherein the second filter material provides an absorption edge having a lower energy than the characteristic K-lines of the first filter material.

[0248] Aspect 53: The method of aspect 49, further comprising filtering the photons from the core or rock sample using a plurality of filter materials.

[0249] Aspect 54: The method of aspect 53, wherein the plurality of filter materials comprise a first filter material and a second filter material, wherein the photons from the core or rock sample are first incident upon the first filter material before passing to the second filter material, wherein the first filter material provides characteristic K-lines, wherein the second filter material provides an absorption edge having a lower energy than the characteristic K- lines of the first filter material.

[0250] Aspect 55: A filter comprising: a plurality of materials, the plurality of materials comprising: a first filter material configured to provide characteristic K-lines; and a second filter material, wherein the second filter material having an absorption edge of a lower energy than the characteristic K-lines of the first filter material.

[0251] Although the foregoing invention has been described in some detail by way of illustration and example for purposes of clarity of understanding, certain changes and modifications may be practiced within the scope of the appended claims.

Claims

What is claimed is:

1. A system comprising: a high energy photon emission assembly that is configured to emit source photons along an emission axis, wherein the high energy photon emission assembly comprises a tube assembly, wherein the tube assembly comprises: a target material; and a cathode, wherein the tube assembly is configured to emit electrons having respective energies of at least 150 keV at the target material from the cathode; and a sample container that is configured to receive a core or rock sample, wherein the sample container is positioned to receive the source photons from the high energy photon emission assembly.

2. The system of claim 1, further comprising at least one photon detector that is configured to produce an output in response to detection of photons released by the core or rock sample.

3. The system of claim 2, wherein a first photon detector of the at least one photon detector is configured to receive photons along a detector axis, wherein the detector axis is oriented at a first angle relative to the emission axis, wherein the first angle is from 60 degrees to 120 degrees.

4. The system of claim 3, wherein the first angle is about 90 degrees.

5. The system of claim 2, wherein a first photon detector of the at least one photon detector is configured to receive photons along a detector axis, wherein the detector axis is oriented at a first angle relative to the emission axis, wherein the first angle is from 30 degrees to 45 degrees.

6. The system of claim 5, wherein the first angle is from about 36 degrees to about 42 degrees.

7. The system of claim 2, further comprising a copper housing, wherein a portion of the copper housing is positioned between the high energy photon emission assembly and a first photon detector of the at least one photon detector, wherein the copper housing defines a window, wherein the detector axis extends through the window.

8. The system of claim 7, further comprising a detector filter over the window.

9. The system of claim 8, wherein the detector filter comprises zinc or a material having a lower elemental density than zinc.

10. The system of claim 9, wherein the detector filter comprises copper and aluminum.

11. The system of claim 8, wherein the detector filter is configured to attenuate photons having respective energies below 50 keV.

12. The system of claim 8, wherein the detector filter is configured to attenuate photons having respective energies below 30 keV.

13. The system of claim 3, wherein the detector axis intersects the emission axis.

14. The system of claim 13, wherein the sample container is configured to support the core or rock sample so that the detector axis intersects the emission axis within an interior of the core or rock sample.

15. The system of claim 14, wherein the sample container is configured to support the core or rock sample so that the detector axis intersects the emission axis at or proximate to an axial center of the core or rock sample.

16. The system of claim 2, further comprising a sleeve that surrounds the at least one photon detector, wherein the sleeve comprises lead or lead equivalent.

17. The system of claim 2, wherein a first photon detector of the at least one photon detector is a low gold photon detector.

18. The system of claim 1, further comprising a backstop positioned along the emission axis so that the core or rock sample is between the backstop and the high energy photon emission assembly, wherein the backstop comprises copper.

19. The system of claim 18, wherein the sample container comprises the backstop.

20. The system of claim 18, wherein the backstop further comprises a backstop target material, wherein the backstop target material is positioned so that, when the core or rock sample is received within the sample container, the backstop target material is positioned between the core or rock sample and the copper of the backstop.

21. The system of claim 18, wherein the backstop target material comprises uranium.

22. The system of any one of the preceding claims, further comprising a beam filter between the target material and the container, wherein the beam filter comprises a plurality of materials, the plurality7of materials comprising:a first filter material configured to provide characteristic K-lines; and a second filter material, wherein the second filter material having an absorption edge of a lower energy than the characteristic K-lines of the first filter material.

23. The system of any one of claims 1-21, wherein the high energy photon emission assembly comprises a copper collimator.

24. The system of claim 23, wherein the target material is a primary target, wherein the tube assembly is configured to emit electrons at the primary target to cause the primary target to emit primary target photons along a first axis, wherein the high energy photon emission assembly further comprises a secondary target positioned along the first axis, wherein secondary target is configured to emit secondary target photons along the emission axis in response to being bombarded by the primary target photons, wherein the secondary target comprises an element with an atomic number above 89, wherein the collimator is positioned between the primary target and the secondary target.

25. The system of claim 24, further comprising a nose filter positioned between the copper collimator and the secondary' target.

26. The system of claim 22, wherein the high energy' photon emission assembly comprises a copper collimator, wherein the beam filter is positioned axially between the copper collimator and the tube assembly.

27. The system of any one of claims 1-21, further comprising a copper housing, wherein a portion of the copper housing is positioned between the high energy’ photon emission assembly' and the detector.

28. The system of any one of claims 2-21, wherein the sample container is positioned so that, when the sample container has a core or rock sample therein, the at least one photon detector is spaced from the core or rock sample by a spacing from about 1 cm to about 5 cm along the detector axis.

29. The system of claim 28, wherein the sample container is positioned so that, when the sample container has a core or rock sample therein, the at least one photon detector is spaced from the core or rock sample by a spacing from about 2 cm to about 4 cm along the detector axis.

30. The system of any one of claims 1-21, wherein the high energy photon emission assembly has an emission end. wherein the sample container is positioned so that, when the sample container has a core or rock sample therein, the high energy photon emission assembly is within 10 cm of the emission end of the core or rock sample.

31. The system of claim 30, wherein the sample container is positioned so that, when the sample container has a core or rock sample therein, the high energy photon emission assembly is within 1 cm of the core or rock sample.

32. The system of any one of claims 1-21, further comprising a vessel containing water therein, wherein the vessel is positioned along the emission axis between the target material and the container.

33. The system of any one of claims 1-21, further comprising a crystal positioned along the emission axis between the target material and the container.

34. The system of any one of claims 1-21, wherein the target material is a primary target, wherein the tube assembly is configured to emit electrons at the primary target to cause the primary target to emit primary target photons along a first axis, wherein the high energy photon emission assembly further comprises a secondary target positioned along the first axis, wherein secondary target is configured to emit secondary target photons along the emission axis in response to being bombarded by the primary target photons, wherein the secondary target comprises an element with an atomic number above 89.

35. The system of claim 34, wherein the secondary target comprises uranium.

36. The system of claim 34, wherein the secondary target is encapsulated within a light metal casing.

37. The system of claim 36, wherein the light metal casing comprises aluminum.

38. The system of claim 35, wherein the sample container is positioned so that, when the sample container has a core or rock sample therein, the secondary target is within 2 cm of the core or rock sample.

39. The system of claim 38, wherein the sample container is positioned so that, when the sample container has a core or rock sample therein, the secondary' target is within 1 cm of the core or rock sample.

40. The system of any one of claims 1-21, wherein the high energy photon emission assembly comprises only a primary target, wherein the high energy photon emissionassembly is configured to cause the primary target to emit photons along the emission axis to the sample container.

41. The system of any one of claims 1-21, further comprising a cover between the sample container and the detector, wherein the cover comprises aluminum or copper.

42. The system of any one of claims 1-21, wherein the tube assembly is configured to emit electrons having respective energies of at least 150 keV at the target material from the cathode having energies from 200 keV to 500 keV.

43. The system of any one of claims 1-21, wherein the sample container comprises a belt that is configured to carry the core or rock sample across the emission axis.

44. The system of any one of claims 1 -21 , wherein sample container comprises a conveyor.

45. The system of any one of claims 1-21, wherein the high energy photon emission assembly is configured to emit the source photons in a fan configuration so that the source photons are incident upon an area transverse to the emission axis.

46. The system of any one of claims 1-21, wherein the high energy photon emission assembly is configured to emit the source photons in a cylindrical configuration.

47. A method comprising: using the sy stem of any one of claims 1-21.

48. A method comprising: bombarding a target material with electrons having energies of at least 150 keV; emitting a beam of photons at a core or rock sample; and receiving, by a photon detector, photons from the core or rock sample.

49. The method of claim 48, wherein the electrons have energies from 200 keV to 500 keV.

50. The method of claim 48, further comprising filtering a first beam to form the beam of photons.

51. The method of claim 50, wherein filtering the first beam comprises filtering the first beam using a plurality of filter materials.

52. The method of claim 50, wherein the plurality of filter materials comprise a first filter material and a second filter material, wherein the first beam is incident upon the first filtermaterial before passing to the second filter material, wherein the first filter material provides characteristic K-lines, wherein the second filter material provides an absorption edge having a lower energy than the charactenstic K-lines of the first filter material.

53. The method of any one of claims 49-53, further comprising filtering the photons from the core or rock sample using a plurality of filter materials.

54. The method of claim 53. wherein the plurality of filter materials comprise a first filter material and a second filter material, wherein the photons from the core or rock sample are first incident upon the first filter material before passing to the second filter material, wherein the first filter material provides characteristic K-lines, wherein the second filter material provides an absorption edge having a lower energy than the characteristic K-lines of the first filter material.

55. A filter comprising: a plurality’ of materials, the plurality of materials comprising: a first filter material configured to provide characteristic K-lines; and a second filter material, wherein the second filter material having an absorption edge of a lower energy than the characteristic K-lines of the first filter material.