A low temperature sample holder for transmission electron microscope

CN111048385BActive Publication Date: 2025-02-18HEFEI INSTITUTE OF PHYSICAL SCIENCE CHINESE ACADEMY OF SCIENCES +1
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Patent Information

Application Number
CN201911346769.8
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2019-12-24
Publication Date
2025-02-18
Estimated Expiration
2039-12-24

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Abstract

The invention discloses a transmission electron microscope low-temperature sample rod, comprising a dewar, a low-temperature guide rod, a probe outer rod, and a sample stage, wherein the dewar comprises a dewar inner tank for storing liquid nitrogen, a dewar outer tank sleeved outside the dewar inner tank and forming a vacuum interlayer, a valve cover with an open top for sealing the vacuum interlayer, and a micro-evacuation valve, wherein the dewar inner tank has a temperature-conducting sleeve inserted from the tank wall into its inner cavity and forming a seal, the dewar outer tank has an integrally formed exhaust boss and an external boss with an inner cavity, the micro-evacuation valve is sealingly connected to the exhaust boss, the low-temperature guide rod is inserted into the temperature-conducting sleeve from the inner cavity of the external boss, and a sealing structure is provided on the low-temperature guide rod for sealing the leakage gap on the dewar outer tank. The transmission electron microscope low-temperature sample rod of the invention has good low-temperature thermal insulation performance and efficient low-temperature conductivity performance, and can be used as a development basis for sample rods with other functions.
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Citation Information

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