一种参数检测方法及装置
By obtaining parameter values from the application server and using a parameter baseline library for detection, the problem of being unable to locate configuration file differences in existing technologies is solved, achieving accurate location and efficient detection of parameter differences.
CN111339747BActive Publication Date: 2026-07-17WEBANK (CHINA)
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- WEBANK (CHINA)
- Filing Date
- 2020-02-13
- Publication Date
- 2026-07-17
AI Technical Summary
Technical Problem
Existing technology cannot pinpoint differences in configuration files, making it impossible to accurately identify potential fault points in new versions of applications.
Method used
By obtaining the parameter values of the parameters to be detected in the application server and determining the corresponding parameter baselines from the parameter baseline library, the parameter values are detected using the parameter baselines, thereby locating the parameter differences in the configuration file.
Benefits of technology
It enables accurate location of parameter differences in configuration files, improves the flexibility and efficiency of detection, reduces system memory usage, and enhances the accuracy and applicability of detection.
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Abstract
本发明实施例公开了一种参数检测方法及装置，获取待检测参数在任一应用服务器中的参数值，从参数基线库中确定出待检测参数对应的参数基线，并使用待检测参数对应的参数基线对参数值进行检测，以得到待检测参数在应用服务器下的检测结果；其中，待检测参数对应的参数基线包括待检测参数在各个检测范围下的预期参数值，各个检测范围基于待检测参数的基线类型确定。通过将待检测参数作为检测的基本单元，可以准确地定位出在应用服务器中的参数值存在差异的参数，从而灵活性较好；且，通过设置参数基线库，使得在检测时能够直接从参数基线库中取出对应的参数基线完成检测，提高检测的效率。
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