Storage device testing method and apparatus, television, and storage medium

Abstract

The application discloses a storage device testing method for a television, and comprises the following steps: performing stability testing on a to-be-tested storage device to obtain a stability testing result; performing read-write speed testing on the to-be-tested storage device to obtain a performance testing result; performing aging testing on the to-be-tested storage device to obtain an aging testing result; performing power-off reliability testing on the to-be-tested storage device to obtain a reliability testing result; and obtaining the testing result based on the stability testing result, the performance testing result, the aging testing result and the power-off reliability testing result. The application further discloses a storage device testing device, a television and a computer readable storage medium. The storage device testing method improves the accuracy of storage device testing.

Description

Technical Field

[0001] This invention relates to the field of storage technology, and in particular to a storage device testing method, apparatus, television set, and computer-readable storage medium. Background Technology

[0002] EMMC (embedded MultiMediaCard) is an embedded storage device. Due to its high reliability, EMMC is widely used in various smart devices.

[0003] With changes in the supply chain and the upgrading of television sets, television manufacturers often replace the eMMC (electromagnetic mediator) in their televisions. Before replacing the eMMC device in a television, it is necessary to configure the parameters of the new eMMC according to the eMMC device's datasheet, conduct comprehensive testing of the new eMMC chip, and only after verifying that the new eMMC is problem-free can it be put into trial production.

[0004] Currently, EMMC compatibility testing involves using instruments to test the quality and timing of the EMMC signal to be used, obtaining test results, and determining whether the EMMC to be used is qualified based on the test results.

[0005] However, the accuracy of the test results obtained using existing testing methods for the EMMC to be used is low. Summary of the Invention

[0006] The main objective of this invention is to provide a storage device testing method, apparatus, television set, and computer-readable storage medium, aiming to solve the technical problem that the accuracy of test results for EMMCs to be used is low when using existing testing methods.

[0007] To achieve the above objectives, the present invention proposes a storage device testing method for a television set, the method comprising the following steps:

[0008] Perform stability tests on the storage device under test to obtain stability test results;

[0009] The read and write speeds of the storage device under test are tested to obtain performance test results.

[0010] An aging test is performed on the storage device under test to obtain the aging test results;

[0011] A power-down reliability test is performed on the storage device under test to obtain the reliability test results;

[0012] The test results are obtained based on the stability test results, the performance test results, the aging test results, and the power-down reliability test results.

[0013] Optionally, the step of performing stability testing on the storage device under test to obtain stability test results includes:

[0014] Upon obtaining the target multimedia file, the target multimedia file is stored in the storage device to be detected;

[0015] When the target multimedia file is in playback state and data is written to the storage device to be detected using a writing script, the playback state of the target multimedia file and the writing speed of the storage device to be detected are obtained.

[0016] The stability test results are obtained based on the writing speed and the playback status.

[0017] Optionally, before the step of obtaining the playback status of the target multimedia file and the write speed of the storage device under test when the target multimedia file is in playback state and data is written to the storage device under test using a writing script, the method further includes:

[0018] Turn off the infrared remote control function of the television.

[0019] Optionally, the step of performing read / write speed tests on the storage device under test to obtain performance test results includes:

[0020] Obtain the preset storage space of the data partition of the storage device to be tested;

[0021] Based on the preset storage space, determine the number of valid blocks;

[0022] Based on the number of effective blocks, configure a preset write speed test script and a preset read speed test script to obtain the write speed test script and read speed test script;

[0023] The write speed test script is used to test the storage device under test to obtain the write speed test results;

[0024] The read speed test script is used to test the storage device under test to obtain the read speed test results;

[0025] The performance test results are obtained based on the read speed test results and the write speed test results.

[0026] Optionally, the step of testing the storage device under test using the read speed test script to obtain read speed test results includes:

[0027] After the television is restarted, the read speed test script is used to test the storage device under test to obtain the read speed test results.

[0028] Optionally, the step of performing an aging test on the storage device under test to obtain aging test results includes:

[0029] When the television is in a low-temperature environment, the storage device under test is tested for a preset duration using an aging test script to obtain the first sub-aging test result.

[0030] When the television is in a high-temperature environment, the storage device under test is tested for the preset duration using the aging test script to obtain the second sub-aging test result.

[0031] When the television is in a temperature cycling environment, the storage device under test is tested for the preset duration using the aging test script to obtain the third sub-aging test result.

[0032] The aging test results are obtained based on the first sub-aging test results, the second sub-aging test results, and the third sub-aging test results.

[0033] Optionally, the step of performing a power-down reliability test on the storage device under test to obtain reliability test results includes:

[0034] When writing data to the storage device under test, disconnect the storage device under test from the power supply;

[0035] Reconnect the storage device under test to the power supply;

[0036] Detect descriptive information of the data in the storage device under test;

[0037] Based on the described information, the power failure reliability test results are obtained.

[0038] Furthermore, to achieve the above objectives, the present invention also proposes a storage device testing apparatus for a television set, the apparatus comprising:

[0039] The first test module is used to perform stability tests on the storage device under test in order to obtain stability test results.

[0040] The second testing module is used to perform read and write speed tests on the storage device under test in order to obtain performance test results.

[0041] The third testing module is used to perform an aging test on the storage device under test in order to obtain the aging test results.

[0042] The fourth testing module is used to perform a power-down reliability test on the storage device under test in order to obtain the reliability test results.

[0043] The module is used to obtain the test results based on the stability test results, the performance test results, the aging test results, and the power-down reliability test results.

[0044] Furthermore, to achieve the above objectives, the present invention also proposes a television set, the television set comprising: a memory, a processor, and a storage device test program stored on the memory and running on the processor, wherein the storage device test program, when executed by the processor, implements the steps of the storage device test method as described in any of the preceding claims.

[0045] Furthermore, to achieve the above objectives, the present invention also proposes a computer-readable storage medium storing a storage device test program, which, when executed by a processor, implements the steps of the storage device test method as described in any of the preceding claims.

[0046] This invention proposes a storage device testing method for a television set. The method involves: performing a stability test on the storage device under test to obtain stability test results; performing a read / write speed test on the storage device under test to obtain performance test results; performing an aging test on the storage device under test to obtain aging test results; performing a power-down reliability test on the storage device under test to obtain reliability test results; and obtaining the final test result based on the stability test results, performance test results, aging test results, and power-down reliability test results.

[0047] Existing testing methods only provide signal commands and timing information for the storage device under test. The limited number of test items and incomplete information result in low accuracy. In contrast, the storage device testing method of this invention, based on stability test results, performance test results, aging test results, and power-loss reliability test results, obtains the test results. This method involves multiple test items, providing more comprehensive information and thus higher accuracy. Therefore, the storage device testing method of this invention improves the accuracy of storage device testing. Attached Figure Description

[0048] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.

[0049] Figure 1This is a schematic diagram of the structure of a television set in the hardware operating environment involved in the embodiments of the present invention;

[0050] Figure 2 This is a flowchart illustrating the first embodiment of the storage device testing method of the present invention;

[0051] Figure 3 This is a structural block diagram of the first embodiment of the storage device testing apparatus of the present invention.

[0052] The realization of the objective, functional features and advantages of the present invention will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0053] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of them. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0054] Reference Figure 1 , Figure 1 This is a schematic diagram of the structure of a television set in the hardware operating environment involved in the embodiments of the present invention.

[0055] Typically, a television set includes: at least one processor 301, a memory 302, and a storage device test program stored on the memory and executable on the processor, the storage device test program being configured to implement the steps of the storage device test method as described above.

[0056] Processor 301 may include one or more processing cores, such as a quad-core processor or an octa-core processor. Processor 301 may be implemented using at least one hardware form of DSP (Digital Signal Processing), FPGA (Field-Programmable Gate Array), or PLA (Programmable Logic Array). Processor 301 may also include a main processor and a coprocessor. The main processor, also known as a CPU (Central Processing Unit), is used to process data in the wake-up state; the coprocessor is a low-power processor used to process data in the standby state. In some embodiments, processor 301 may integrate a GPU (Graphics Processing Unit), which is responsible for rendering and drawing the content required to be displayed on the screen. Processor 301 may also include an AI (Artificial Intelligence) processor, which handles operations related to storage device testing methods, enabling the storage device testing method model to train and learn autonomously, improving efficiency and accuracy.

[0057] The memory 302 may include one or more computer-readable storage media, which may be non-transitory. The memory 302 may also include high-speed random access memory and non-volatile memory, such as one or more disk storage devices or flash memory devices. In some embodiments, the non-transitory computer-readable storage media in the memory 302 are used to store at least one instruction, which is executed by the processor 301 to implement the storage device testing method provided in the method embodiments of this application.

[0058] In some embodiments, the terminal may also optionally include a communication interface 303 and at least one peripheral device. The processor 301, memory 302, and communication interface 303 can be connected via a bus or signal line. Each peripheral device can be connected to the communication interface 303 via a bus, signal line, or circuit board. Specifically, the peripheral device includes at least one of a radio frequency circuit 304, a display screen 305, and a power supply 306.

[0059] The communication interface 303 can be used to connect at least one I / O (Input / Output) related peripheral device to the processor 301 and the memory 302. In some embodiments, the processor 301, the memory 302, and the communication interface 303 are integrated on the same chip or circuit board; in some other embodiments, any one or two of the processor 301, the memory 302, and the communication interface 303 can be implemented on separate chips or circuit boards, which is not limited in this embodiment.

[0060] The radio frequency (RF) circuit 304 is used to receive and transmit RF (Radio Frequency) signals, also known as electromagnetic signals. The RF circuit 304 communicates with communication networks and other communication devices via electromagnetic signals. The RF circuit 304 converts electrical signals into electromagnetic signals for transmission, or converts received electromagnetic signals back into electrical signals. Optionally, the RF circuit 304 includes: an antenna system, an RF transceiver, one or more amplifiers, a tuner, an oscillator, a digital signal processor, a codec chipset, a user identity module card, etc. The RF circuit 304 can communicate with other terminals through at least one wireless communication protocol. This wireless communication protocol includes, but is not limited to: metropolitan area networks (MANs), various generations of mobile communication networks (2G, 3G, 4G, and 5G), wireless local area networks (WLANs), and / or WiFi (Wireless Fidelity) networks. In some embodiments, the RF circuit 304 may also include circuitry related to NFC (Near Field Communication), which is not limited in this application.

[0061] Display screen 305 is used to display a UI (User Interface). This UI may include graphics, text, icons, videos, and any combination thereof. When display screen 305 is a touch display screen, it also has the ability to collect touch signals on or above its surface. These touch signals can be input as control signals to processor 301 for processing. In this case, display screen 305 can also be used to provide virtual buttons and / or a virtual keyboard, also known as soft buttons and / or a soft keyboard. In some embodiments, display screen 305 can be a single screen, the front panel of an electronic device; in other embodiments, display screen 305 can be at least two screens, respectively disposed on different surfaces of the electronic device or in a folded design; in still other embodiments, display screen 305 can be a flexible display screen, disposed on a curved or folded surface of the electronic device. Furthermore, display screen 305 can also be configured as a non-rectangular, irregular shape, i.e., a non-rectangular screen. Display screen 305 can be made of materials such as LCD (Liquid Crystal Display) or OLED (Organic Light-Emitting Diode).

[0062] Power supply 306 is used to supply power to various components in an electronic device. Power supply 306 can be AC ​​power, DC power, a disposable battery, or a rechargeable battery. When power supply 306 includes a rechargeable battery, the rechargeable battery can support wired or wireless charging. The rechargeable battery can also be used to support fast charging technology.

[0063] Those skilled in the art will understand that Figure 1 The structure shown does not constitute a limitation on the television set and may include more or fewer components than shown, or combine certain components, or have different component arrangements.

[0064] Furthermore, embodiments of the present invention also propose a computer-readable storage medium storing a storage device test program, which, when executed by a processor, implements the steps of the storage device test method described above. Therefore, further details will not be repeated here. Additionally, the beneficial effects of using the same method will not be repeated. For technical details not disclosed in the embodiments of the computer-readable storage medium involved in this application, please refer to the description of the method embodiments of this application. For example, program instructions can be deployed to execute on a television set, or on multiple television sets located in one location, or on multiple television sets distributed in multiple locations and interconnected via a communication network.

[0065] Those skilled in the art will understand that all or part of the processes in the above embodiments can be implemented by a computer program instructing related hardware. The program can be stored in a computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. The computer-readable storage medium can be a magnetic disk, optical disk, read-only memory (ROM), or random access memory (RAM), etc.

[0066] Based on the above hardware structure, an embodiment of the storage device testing method of the present invention is proposed.

[0067] Reference Figure 2 , Figure 2 This is a flowchart illustrating the first embodiment of the storage device testing method of the present invention. The method is used in a television set and includes the following steps:

[0068] Step S11: Perform a stability test on the storage device to be tested to obtain the stability test results.

[0069] It should be noted that the subject of this invention is a television set, which is equipped with a storage device testing program. When the television set executes the storage device testing program, it implements the storage device testing method of this invention. The storage device to be tested in this invention refers to the eMMC (electromagnetic membrane device) to be tested.

[0070] Typically, EMMCs of the same brand and model have identical specifications, so only a portion needs to be sampled for testing. Usually, the EMMC to be tested is installed in a television set, and the television sets execute the storage device testing method of this invention to perform the testing of the EMMC.

[0071] Specifically, the step of performing a stability test on the storage device under test to obtain a stability test result includes: when a target multimedia file is acquired, storing the target multimedia file in the storage device under test; when the target multimedia file is in playback mode and data is written to the storage device under test using a writing script, acquiring the playback status of the target multimedia file and the writing speed of the storage device under test; and obtaining the stability test result based on the writing speed and the playback status.

[0072] It should be noted that the target multimedia file of the present invention is usually a video file. That is, when playing a video file stored on the storage device to be tested, a writing script is used to write data to the storage device to be tested, and the playback status of the target multimedia file and the writing speed of the storage device to be tested are obtained.

[0073] In practical application, first, create a new script file named `emmc_write.sh` in the ` / data` directory, named `touch / data / emmc_write.sh`; then, modify the file permissions using the command `chmod 777 / data / emmc_write.sh`; finally, modify the `emmc_write.sh` script file as follows:

[0074] count = 0, the number of tests is 0.

[0075] echo "start EMMC write test..............." repeats "Start EMMC write test..............."

[0076] while [$count! = 5000] When the cumulative number of tests = 5000

[0077] do

[0078] Let count = count + 1 (number of tests + 1)

[0079] echo "EMMC write count>>>>>>>>>>>>$count"

[0080] `dd if= / dev / zero of= / data / data / 1bs=1024000count=25000` clears ` / data / data`.

[0081] sync

[0082] done

[0083] echo "EMMC write test pass............."

[0084] Next, the video file was copied to the ` / storage / emulated / 0 / ` directory. ` / storage / emulated / 0 / ` is a virtual SD card partition; it's not an actual SD card mounted to the TV, but rather a virtual SD card partition created using the eMMC's data partition. Then, the video file was played on a loop in the local media settings. To avoid interference during the test, the TV's infrared function was disabled using the command `stop android_ir_user`, followed by the execution of the script `emmc_write.sh`. This was run 5000 times, during which the video playback was checked for normality (image and sound, any stuttering), and the write speed of the eMMC under test was assessed for significant differences. These results were used to obtain the stability test results for the eMMC under test.

[0085] When the video plays normally and the write speed difference of the EMMC under test is not significant, the stability test result of the EMMC under test is good stability (or qualified stability, etc.).

[0086] Step S12: Perform read / write speed tests on the storage device under test to obtain performance test results.

[0087] Specifically, the step of performing read / write speed tests on the storage device under test to obtain performance test results includes: obtaining a preset storage space for the data partition of the storage device under test; determining the number of valid blocks based on the preset storage space; configuring a preset write speed test script and a preset read speed test script based on the number of valid blocks to obtain the write speed test script and read speed test script; testing the storage device under test using the write speed test script to obtain write speed test results; testing the storage device under test using the read speed test script to obtain read speed test results; and obtaining the performance test results based on the read speed test results and the write speed test results. The step of testing the storage device under test using the read speed test script to obtain read speed test results includes: testing the storage device under test using the read speed test script after the television is restarted to obtain read speed test results.

[0088] In practical applications, the df command is used to view the size of the data partition (the size of the preset storage space) of the storage device to be tested. Then, the count value of the read and write commands is modified so that the value of bs multiplied by the count value is close to the size of the data partition. For example, for a 32G EMMC, the data partition is about 25G. Use the following command to test the write speed and record the write speed (the value of count changes with the partition size; for example, if the data partition size is 25G, the count value is 25000; if the data partition size is 50G, the count value is 50000. The count value needs to be used to configure the preset read speed test script and the preset write speed test script. Alternatively, the preset read speed test script and the preset write speed test script in this application can be replaced by test commands with similar functions). The command is: `dd if= / dev / zero of= / data / data / 1bs=1024000 count=25000` (This command is a write operation, clearing / data / data). Then, restart the TV and use the following command to test the read speed and record the read speed (the value of count changes with the partition size). The command is: `dd of= / dev / null if= / data / data / 1bs=1024000 count=25000`. Generally, when conducting read and write performance tests, the write performance test should be performed first. After restarting the TV, the read test should be performed. The file size for reading and writing should be as large as possible, ideally close to the size of the eMMC data partition, so that the test data is more accurate.

[0089] Step S13: Perform an aging test on the storage device to be tested to obtain the aging test results.

[0090] Specifically, when the television is in a low-temperature environment, the storage device under test is tested for a preset duration using an aging test script to obtain a first sub-aging test result; when the television is in a high-temperature environment, the storage device under test is tested for the preset duration using the same aging test script to obtain a second sub-aging test result; when the television is in a temperature cycling environment, the storage device under test is tested for the preset duration using the same aging test script to obtain a third sub-aging test result; and based on the first sub-aging test result, the second sub-aging test result, and the third sub-aging test result, the final aging test result is obtained.

[0091] It should be noted that aging tests on the storage devices under test involve low-temperature environments, high-temperature environments, and temperature cycling environments. The high-temperature environment can be 90 degrees Celsius, the low-temperature environment can be -35 degrees Celsius, and the temperature cycling environment can be determined by the user based on actual needs; specific parameters are not limited in this invention. Additionally, the preset duration can be 7 days.

[0092] In practical applications, create an mmc.sh script and modify it as follows:

[0093] sleep 10

[0094] count = 1

[0095] while true

[0096] do

[0097] echo".write.............$count"

[0098] sync

[0099] dd of= / data / mmc_test if= / dev / block / mmcblk0p8

[0100] sync

[0101] count = $(($count+1))

[0102] echo "..read...........$count"

[0103] sync

[0104] dd if= / dev / block / mmcblk0p8 of= / dev / ram1

[0105] sync

[0106] count = $(($count+1))

[0107] rm / data / mmc_test

[0108] Next, change the execution permissions of the mmc.sh script using `chmod 777 / data / mmc.sh`. Then, place the TV in a temperature-controlled chamber at the set temperature for aging tests (high-temperature environment, low-temperature environment, and temperature cycling environment). Execute the mmc.sh script and save a log file to obtain the aging test results. If no EMMC errors or TV system malfunctions occur during the test, the aging test result indicates that the storage device under test has passed the aging test.

[0109] Step S14: Perform a power-off reliability test on the storage device under test to obtain the reliability test results.

[0110] Specifically, the step of performing a power-down reliability test on the storage device under test to obtain a reliability test result includes: disconnecting the storage device under test from the power supply when writing data to the storage device under test; reconnecting the storage device under test from the power supply; detecting the description information of the data in the storage device under test; and obtaining the power-down reliability test result based on the description information.

[0111] It should be noted that the description information refers to the data integrity description in the storage device under test. That is, when the description information indicates that the data is complete, the power-down reliability test result of the storage device under test is good (or the power-down reliability test of the storage device under test is qualified); when the description information indicates that the data is incomplete, the power-down reliability test result of the storage device under test is poor (or the power-down reliability test of the storage device under test is unqualified).

[0112] In practical applications, add the following macro definition to the file device / Hisilicon / bigfish / sdk / source / boot / fastboot / include / configs / s5.h. This macro definition enables the EMMC power-down reliability test: #define CONFIG_EMMC_HW_TEST. After modification, recompile the bootloader, burn the generated fastboot-burn.bin file, and connect the TV's serial port to the computer. After restarting the TV, it will automatically enter the EMMC power-down reliability test cycle of 5000 times.

[0113] Log information must be saved during the test. The test takes a long time; after the test stops, please ensure that you do not turn the power on and off repeatedly, otherwise you may not be able to see the final test results. If "err: EMMC test fail" is printed after the test stops, or if the test stops before completing 5000 cycles, the test is considered unsuccessful. After completing 5000 cycles, "EMMC test complete, no error." will be printed, indicating that the test is successful.

[0114] In addition, error conditions (unexpected situations, read, write and erase operations on a block-by-block basis) include two types: CRC and illegal command, if the CRC check of a command sent to a device at a certain address is incorrect, the command will not be executed and there will be no response; and time-out conditions, the timeout period for read, write and erase operations, which is generally 10 times the typical time. The timeout period for each type of operation is specified in the EMMC specification.

[0115] Step S15: Based on the stability test results, the performance test results, the aging test results, and the power-down reliability test results, obtain the test results.

[0116] The test results mentioned above are integrated to obtain the final test results, which include the test results corresponding to the four items mentioned above.

[0117] If all four test results are qualified, the final test result is also qualified; if at least one of the four test results is unqualified, the final test result is unqualified. The test result will include specific information on the qualified and unqualified items.

[0118] This invention proposes a storage device testing method for a television set. The method involves: performing a stability test on the storage device under test to obtain stability test results; performing a read / write speed test on the storage device under test to obtain performance test results; performing an aging test on the storage device under test to obtain aging test results; performing a power-down reliability test on the storage device under test to obtain reliability test results; and obtaining the final test result based on the stability test results, performance test results, aging test results, and power-down reliability test results.

[0119] Existing testing methods only provide signal commands and timing information for the storage device under test. The limited number of test items and incomplete information result in low accuracy. In contrast, the storage device testing method of this invention, based on stability test results, performance test results, aging test results, and power-loss reliability test results, obtains the test results. This method involves multiple test items, providing more comprehensive information and thus higher accuracy. Therefore, the storage device testing method of this invention improves the accuracy of storage device testing.

[0120] Reference Figure 3 , Figure 3 This is a structural block diagram of a first embodiment of the storage device testing apparatus of the present invention. The apparatus is used in a television set and includes:

[0121] The first test module 10 is used to perform stability tests on the storage device under test in order to obtain stability test results.

[0122] The second test module 20 is used to perform read and write speed tests on the storage device under test in order to obtain performance test results.

[0123] The third test module 30 is used to perform an aging test on the storage device under test in order to obtain the aging test results.

[0124] The fourth test module 40 is used to perform a power-down reliability test on the storage device under test in order to obtain the reliability test results.

[0125] The module 50 is used to obtain the test results based on the stability test results, the performance test results, the aging test results, and the power-down reliability test results.

[0126] The above description is merely an optional embodiment of the present invention and does not limit the patent scope of the present invention. Any equivalent structural transformations made using the contents of the present invention's specification and drawings under the inventive concept of the present invention, or direct / indirect applications in other related technical fields, are included within the patent protection scope of the present invention.

Claims

1. A method for testing a storage device, characterized in that, For use in a television set, the method includes the following steps: Perform stability tests on the storage device under test to obtain stability test results; The read and write speeds of the storage device under test are tested to obtain performance test results. An aging test is performed on the storage device under test to obtain the aging test results; A power-down reliability test is performed on the storage device under test to obtain the reliability test results; The test results are obtained based on the stability test results, the performance test results, the aging test results, and the reliability test results. The stability test performed on the storage device under test to obtain the stability test results specifically includes: Upon obtaining the target multimedia file, the target multimedia file is stored in the storage device to be detected; Turn off the infrared remote control function of the television; When the target multimedia file is in playback state and data is written to the storage device under test using a writing script, the playback state of the target multimedia file and the writing speed of the storage device under test are obtained. The stability test results are obtained based on the writing speed and the playback status.

2. The method as described in claim 1, characterized in that, The step of performing read / write speed tests on the storage device under test to obtain performance test results includes: Obtain the preset storage space of the data partition of the storage device to be tested; Based on the preset storage space, determine the number of valid blocks; Based on the number of effective blocks, configure a preset write speed test script and a preset read speed test script to obtain the write speed test script and the read speed test script. The write speed test script is used to test the storage device under test to obtain the write speed test results; The read speed test script is used to test the storage device under test to obtain the read speed test results; The performance test results are obtained based on the read speed test results and the write speed test results.

3. The method as described in claim 2, characterized in that, The step of testing the storage device under test using the read speed test script to obtain read speed test results includes: After the television is restarted, the read speed test script is used to test the storage device under test to obtain the read speed test results.

4. The method as described in claim 3, characterized in that, The step of performing an aging test on the storage device under test to obtain aging test results includes: When the television is in a low-temperature environment, the storage device under test is tested for a preset duration using an aging test script to obtain the first sub-aging test result. When the television is in a high-temperature environment, the storage device under test is tested for the preset duration using the aging test script to obtain the second sub-aging test result. When the television is in a temperature cycling environment, the storage device under test is tested for the preset duration using the aging test script to obtain the third sub-aging test result. The aging test results are obtained based on the first sub-aging test results, the second sub-aging test results, and the third sub-aging test results.

5. The method as described in claim 4, characterized in that, The step of performing a power-down reliability test on the storage device under test to obtain reliability test results includes: When writing data to the storage device under test, disconnect the storage device under test from the power supply; Reconnect the storage device under test to the power supply; Detect descriptive information of the data in the storage device under test; Based on the described information, the reliability test results are obtained.

6. A storage device testing apparatus, characterized in that, For use in a television set, the device includes: The first testing module is used to perform stability testing on the storage device under test to obtain stability test results. Specifically, when a target multimedia file is acquired, the module stores the target multimedia file in the storage device under test; disables the infrared remote control function of the television; when the target multimedia file is in playback mode and data is written to the storage device under test using a writing script, the module obtains the playback status of the target multimedia file and the writing speed of the storage device under test; and obtains the stability test results based on the writing speed and the playback status. The second testing module is used to perform read and write speed tests on the storage device under test in order to obtain performance test results. The third testing module is used to perform an aging test on the storage device under test in order to obtain the aging test results. The fourth testing module is used to perform a power-down reliability test on the storage device under test in order to obtain the reliability test results. The module is used to obtain the test results based on the stability test results, the performance test results, the aging test results, and the reliability test results.

7. A television set, characterized in that, The television set includes: a memory, a processor, and a storage device test program stored on the memory and running on the processor, wherein the storage device test program, when executed by the processor, implements the steps of the storage device test method as described in any one of claims 1 to 5.

8. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a storage device test program, which, when executed by a processor, implements the steps of the storage device test method as described in any one of claims 1 to 5.

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