图像测量系统、图像测量方法以及图像测量存储介质
By using a graphic light projection system and methods for capturing images at different focal lengths, the problem of simultaneously detecting two-dimensional and three-dimensional defects in existing technologies has been solved, achieving efficient and low-cost detection results.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- FUKUOKA INSTITUTE OF TECHNOLOGY
- Filing Date
- 2021-04-25
- Publication Date
- 2026-07-17
AI Technical Summary
Existing technologies are difficult to simultaneously and efficiently detect two-dimensional and three-dimensional defects on the surface of objects with strong surface reflectivity, and the measurement time is long and the cost is high.
A graphic light projection system is used to capture two images of an object's surface at different focal lengths. By analyzing the changes in color intensity and graphic light in the images, two-dimensional and three-dimensional defects are detected respectively.
It enables efficient and low-cost detection of object surfaces with strong surface reflectivity, and can simultaneously detect two-dimensional and three-dimensional defects, simplifying the measurement process and reducing system complexity and cost.
Smart Images
Figure CN113640296B_ABST