Substrate-less semiconductor device assembly having multiple semiconductor devices and method for manufacturing the same

CN113838822BActive Publication Date: 2025-03-28MICRON TECHNOLOGY INC
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Patent Information

Application Number
CN202110623214.4
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Priority Date
2020-06-08
Filing Date
2021-06-04
Publication Date
2025-03-28
Estimated Expiration
2041-06-04

AI Technical Summary

Technical Problem

The prior art is difficult to effectively include multiple semiconductor dies in a single package, and the packaging process is complex and expensive.

Method used

By providing a semiconductor device assembly with an upper RDL and a lower RDL, each RDL is configured to be coupled to a corresponding die, the die is arranged back to back and electrically connected by an interconnect in the RDL.

Benefits of technology

The efficient inclusion of multiple semiconductor dies in a single package is achieved, simplifying the packaging process, reducing costs, and improving the overall performance of the package.

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Abstract

The present application relates to a substrate-less semiconductor device assembly having a plurality of semiconductor devices and a method for manufacturing the same. A semiconductor device assembly comprises: a first remote distribution layer (RDL), the first RDL comprising a lower outermost planar surface of the semiconductor device assembly; a first semiconductor die, the first semiconductor die being directly coupled to an upper surface of the first RDL through a first plurality of interconnects; a second RDL, the second RDL comprising an upper outermost planar surface of the semiconductor device assembly opposite to the lower outermost planar surface; a second semiconductor die, the second semiconductor die being directly coupled to a lower surface of the second RDL through a second plurality of interconnects; a packaging material, the packaging material being disposed between the first RDL and the second RDL and at least partially packaging the first semiconductor die and the second semiconductor die; and a third plurality of interconnects, the third plurality of interconnects extending completely between and directly coupled to the upper surface of the first RDL and the lower surface of the second RDL.
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