A waveform data detection method, device and storage medium
By modeling and automatically detecting the oscilloscope waveform data, the efficiency and stability problems of manual capture and analysis of waveform data are solved, and automated testing is realized, which improves the stability and reproducibility of the test results.
Patent Information
- Application Number
- CN202111587861.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2021-12-23
- Publication Date
- 2025-03-28
- Estimated Expiration
- 2041-12-23
AI Technical Summary
When measuring the SPI signal of a PC motherboard using an oscilloscope, engineers need to manually grab and amplify the waveform data, and due to signal quality problems and personal experience dependence, the test results are difficult to reproduce stably.
By modeling the first waveform data, the second waveform data is obtained and whether it meets the desired third waveform data. If it is matched, the cursor is determined based on the second waveform data, added to the first waveform data, and screenshots are taken to record the test results.
It realizes automated capture and analysis of waveform data, reduces dependence on personal experience, improves the stability and reproducibility of test results, and significantly reduces test time.