Material testing system

Abstract

According to embodiments of the present application, there is provided a material testing system, comprising: a material testing apparatus configured to receive an electrical power supply, wherein the material testing apparatus comprises: a guide arrangement; a sample holding arrangement configured for holding a sample; a force application arrangement configured for applying a force to the sample; a cross-carriage arranged to support at least a portion of one or both of the sample holding arrangement and the force application arrangement, wherein the cross-carriage is movable relative to the guide arrangement; wherein the material testing system comprises a three-phase switch mode power supply unit arranged to provide the electrical power supply to the material testing apparatus.

Description

Technical Field

[0001] This invention relates to a material testing system, and more specifically, to a power supply unit and material testing equipment within the material testing system. Background Technology

[0002] Materials testing equipment (sometimes also called structural testing machines) is used to test the physical properties of material samples. Materials testing machines use a sample holder to hold the material sample and a force application device to apply force through the sample holder to test the physical properties of the material sample. The force application device within the materials testing equipment can be actuated using a motor drive system that receives power from a power supply unit.

[0003] However, with the development of new materials and new applications for those materials, the need for more rigorous testing has increased. The output power from conventional power supply units may not be sufficient to perform such tests. Therefore, higher power supplies are required for motor drive systems.

[0004] A device is needed to provide sufficient power to high-power motor drive systems to achieve acceptable performance, while mitigating variable input voltage and minimizing inrush current. Summary of the Invention

[0005] According to the present invention, a material testing system is provided, comprising: a material testing device configured to receive a power supply, wherein the material testing device includes: a guiding device; a sample holding device configured to hold a sample; a force applying device configured to apply a force to the sample; and a lateral carrier head arranged to support at least a portion of one or both of the sample holding device and the force applying device, wherein the lateral carrier head is movable relative to the guiding device; wherein the material testing system includes a three-phase switch mode power supply unit arranged to provide a power supply to the material testing device.

[0006] Optionally, one or more blocking devices may be connected to the power output of a three-phase switch-mode power supply unit, wherein the blocking devices may be arranged to prevent current from flowing in a predetermined direction.

[0007] In some embodiments, one or more blocking devices may include at least one power diode, wherein the at least one power diode may be connected in series with the power output of a three-phase switch mode power supply unit.

[0008] Optionally, the system may include a power factor correction device connected to a three-phase switch-mode power supply unit.

[0009] In some embodiments, the power factor correction device may include a power factor correction circuit configured to perform active power factor correction.

[0010] Optionally, the three-phase switch-mode power supply unit may include a startup circuit configured to allow the current and voltage of the three-phase switch-mode power supply unit to increase to the operating current value and operating voltage value, respectively, within a predetermined time period when the three-phase switch-mode power supply unit is enabled.

[0011] Optionally, the three-phase switch mode power supply unit may include a power fault detection circuit configured to output an indication that the power output by the three-phase switch mode power supply unit exceeds the operating power value range.

[0012] Optionally, the three-phase switch-mode power supply unit can be configured to receive an input voltage of 50-700 volts.

[0013] Optionally, the three-phase switch-mode power supply unit includes an input configuration with three live phase paths.

[0014] Optionally, the material testing equipment may include: at least one motor drive system configured to operate at least one of a sample holding device, a force application device, and a transverse carrier.

[0015] In some embodiments, at least one motor drive system may include at least one brushless motor driver.

[0016] Optionally, the sample holding device is configured to be mechanically and / or pneumatically actuated.

[0017] Optionally, the force-applying device is configured to generate one or more of axial force and torsional force.

[0018] Optionally, the lateral carrier head is movable relative to the guide device and includes a clamping device configured to apply a releasable clamping force to the guide device to hold the lateral carrier head in a position relative to the guide device.

[0019] According to an embodiment of the present invention, a three-phase switch-mode power supply unit is provided, which is configured for use in a system according to any of the above systems.

[0020] According to an embodiment of the present invention, a material testing device is provided, which is configured for use in a system according to any of the above systems. Attached Figure Description

[0021] One or more examples will now be described by way of example only, with reference to the accompanying drawings, wherein:

[0022] Figure 1 Examples of systems according to embodiments of the present invention are shown;

[0023] Figure 2 A three-phase switch-mode power supply unit according to an embodiment of the present invention is shown; and

[0024] Figure 3 A material testing apparatus according to an embodiment of the present invention is shown. Detailed Implementation

[0025] Typically, the problem of providing higher power supplies for motor drive systems is solved by generating the required power using a bridge rectifier that acts directly on the AC mains. This setup has several drawbacks. First, the motor drive is directly sensitive to changes in the voltage supply, which can be transmitted as noise in the machine's performance. Second, the bridge rectifier produces an abnormally poor power factor, distorting the power network and potentially increasing the cost of the power supplier. Costs can be further increased by attempts to improve the power factor, including updating all wiring, terminals, and connectors in the facility and installing large passive factor correction devices (e.g., large capacitors). The fact that 3-phase power can vary from country to country due to the modifications required to manufacture for each different 3-phase power supply further increases costs. Furthermore, to cope with variations in the supply voltage, transformers are needed to gradually increase or decrease the voltage to a known fixed level suitable for the system. The transformers must be manually wired to the correct local supply voltage and current, introducing the possibility of errors; transformers are prone to generating noise and harmonics in the voltage and current waveforms; and transformers require large inrush currents when started, meaning the power supply must be able to handle inrush currents up to 50 times the operating current of the device. To handle such downfalls, the system may need to include large chokes, filters, and / or other such components to meet regulatory requirements. Furthermore, transformers used in high-power motor drive systems would be very large, heavy, and expensive, making them unsuitable for use in facilities. Embodiments of the present invention aim to alleviate at least some of the above-mentioned problems.

[0026] Figure 1 A material testing system, generally indicated by reference numeral 10, is illustrated according to an embodiment of the present invention. The material testing system includes a three-phase switch-mode power supply unit 200 and a material testing device 100. The material testing device 100 is configured to receive a power supply, and the three-phase switch-mode power supply unit 200 is arranged to provide power to the material testing device 100. In some embodiments, the material testing system may include more than one three-phase switch-mode power supply unit 200 and / or more than one material testing device 200. Figure 2 The three-phase switch-mode power supply unit 200 will be discussed in more detail. This will be combined with... Figure 3 The material testing apparatus 100 will be discussed in more detail. The three-phase switch-mode power supply unit 200 and the material testing apparatus 100 may be directly electrically connected to each other. In some embodiments, auxiliary components may be included in the material testing system 10 and may be electrically connected to the three-phase switch-mode power supply unit 200 and / or the material testing apparatus 100. In some embodiments, the auxiliary components may include at least one user interface device, a control module, and / or a communication module. Furthermore, it should be understood that the material testing system 10 may include other auxiliary components.

[0027] In some embodiments, the material testing system 10 may include a user interface device as an auxiliary component. The user interface device may be configured to enable a user to control components of the material testing system 10. For example, activating the material testing equipment 100 to begin testing a sample. In some embodiments, the user interface device may be included in the material testing system 10 and may be configured to display data related to the testing of the sample being tested by the material testing system 10. However, it should be understood that the user interface device may be configured to perform other operations.

[0028] In some embodiments, the materials testing system 10 may include a control module as an auxiliary component. The control module may be configured to control the operation of the components of the materials testing system 10. The control module may be configured to receive signals representing user input from a user interface and to send signals corresponding to the user input to the corresponding components. However, it should be understood that the control module may be configured to perform other operations.

[0029] In some embodiments, the materials testing system 10 may include a communication module as an auxiliary component. The communication module may be configured to communicate with another component of the materials testing system 10. The communication module may also be configured to communicate with electronic devices external to the materials testing system 10. For example, the communication module may output test result data of the sample to a personal electronic device (e.g., a PC or printer) that the user may possess. However, it should be understood that the communication module may be configured to perform other operations.

[0030] In some embodiments, auxiliary components may be included in the material testing equipment 100 and / or the three-phase switch-mode power supply 200.

[0031] In some embodiments, the material testing system 10 may be formed within a single housing so that all components are housed within a single housing. In other embodiments, the material testing system 10 may be located within multiple housings, i.e., in some embodiments each component has a corresponding housing to house all components. However, it should be understood that other arrangements of the material testing system 10 may be included.

[0032] Figure 2 A three-phase switch-mode power supply unit, generally indicated by reference numeral 200, according to an embodiment of the present invention, is illustrated. Advantageously, the use of the three-phase switch-mode power supply unit allows the materials testing system 10 to operate over a wide range of input voltages without adjustment or reconfiguration, and therefore the system 10 can be used in many countries around the world with different power supply voltages without requiring different modifications for each country. In some embodiments, the three-phase switch-mode power supply unit 200 can be configured to receive an input voltage of 50-700 volts. In some embodiments, the three-phase switch-mode power supply unit 200 can be configured to receive an input voltage of 130-600 volts. In some embodiments, the three-phase switch-mode power supply unit 200 can be configured to receive an input voltage of 180-480 volts. Furthermore, the use of the three-phase switch-mode power supply unit 200 eliminates the need for large chokes, filters, and / or other such components in the materials testing system 10.

[0033] The three-phase switch-mode power supply unit 200 may be a three-phase switch-mode power supply unit including three live-wire phase paths but excluding a fourth neutral path, generally referred to as "3P". The three-phase switch-mode power supply unit 200 may also be a three-phase switch-mode power supply unit including three live-wire phase paths and a fourth neutral path, generally referred to as "3P+N". In some embodiments, the three-phase switch-mode power supply unit 200 may be configured in a "3P" configuration. Advantageously, since a neutral path is not common in the installation space of the material testing system 10 (laboratory or industrial space, as a non-limiting example), using a "3P" configuration allows the material testing system 10, including the three-phase switch-mode power supply unit 200, to be installed in a large amount of installation space without adapting its power supply. The three-phase switch-mode power supply unit is arranged to receive three-phase AC power at input 216, for example, from the public mains power grid (in... Figure 2 The three-phase switching mode power supply unit 200 may be used to receive three-phase AC power, convert the received three-phase AC power into a constant DC output, and supply the constant DC output to the material testing equipment 100 so that the material testing equipment can accurately test the characteristics of the selected sample. For example, in Figure 1In this embodiment, the line connecting the three-phase switch-mode power supply unit 200 to the material testing equipment 100 can carry DC power supply. In some embodiments, the constant DC output of the three-phase switch-mode power supply unit 200 can be input to at least one motor drive system 50 of the material testing equipment 100. The at least one motor drive system 50 can convert the received DC input into AC power, which can be supplied to at least one motor included in the material testing equipment 100.

[0034] In some embodiments, the three-phase switch-mode power supply unit 200 may be formed from a single housing. In some embodiments, the three-phase switch-mode power supply unit 200 may include at least one output terminal 214. In some embodiments, the three-phase switch-mode power supply unit 200 may be formed from two or more housings. In some embodiments, the three-phase switch-mode power supply unit 200 may include one or more three-phase switch-mode power supply units disclosed herein. In some embodiments, the three-phase switch-mode power supply unit 200 may include at least one of the following: diodes, thyristors, transistors, or converters. The three-phase switch-mode power supply unit 200 may include at least one of the following: half-wave, full-wave, uncontrolled, and fully controlled circuits arranged to convert AC input to DC output. In some embodiments, the three-phase switch-mode power supply unit 200 may also include one or more of the following: at least one blocking device 202, at least one overvoltage protection device 204, at least one power factor correction device 206, at least one startup circuit 208, and at least one power fault detection circuit 210. In some embodiments, one or more of at least one blocking device 202, at least one overvoltage protection device 204, at least one power factor correction device 206, at least one starting circuit 208, and at least one power fault detection circuit 210 may be electrically connected inside the three-phase switch mode power supply unit housing 212 or externally to the output terminals of the three-phase switch mode power supply unit 200. Figure 2In the diagram, at least one blocking device 202 is shown externally connected in series to the power output 214 of the three-phase switch-mode power supply unit, and at least one or more of the overvoltage protection device 204, power factor correction device 206, startup circuit 208, and power fault detection circuit 210 are shown electrically connected inside the housing 212 of the three-phase switch-mode power supply unit 200. However, it should be understood that the three-phase switch-mode power supply unit 200 may include other components and their arrangements. For example, the three-phase switch-mode power supply unit 200 may include an output regulation circuit arranged to regulate the output of the three-phase switch-mode power supply unit 200 such that the output voltage and / or output current are advantageously independent of any changes in the input (i.e., the material testing system 10 is unaffected if there is a change in the AC input). As a further example, the three-phase switch-mode power supply unit 200 may include a "soft-start" function that allows the three-phase switch-mode power supply unit 200 to start and minimize sudden "surge" currents, thereby limiting potential energy source or energy supply problems caused by high surge currents. Typically, implementing such functionality in a non-switching mode power supply unit configuration can be difficult and significantly increases the size and cost of the design, thus further highlighting the advantages of the present invention.

[0035] At least one overvoltage protection device 204 may be configured to activate when the voltage of the three-phase switch-mode power supply unit 200 exceeds a predetermined level. The overvoltage protection device 204 may be an overvoltage protection circuit, an overvoltage protection device, or an overvoltage protection module. In some embodiments, when activated, the overvoltage protection device 204 is configured to use discrete components, integrated circuits, and / or mechanical devices to reduce excessive voltage. However, it should be understood that other components and their arrangements may be included in the overvoltage protection device 204. In some embodiments, when activated, the overvoltage protection device 204 may be configured to shut down the three-phase switch-mode power supply unit 200 to protect the material testing equipment 100. In some embodiments, when activated, the overvoltage protection device 204 may also be configured to prevent the three-phase switch-mode power supply unit 200 from outputting electrical power. In some embodiments, when the overvoltage protection device 204 is activated, the three-phase switch-mode power supply unit 200 may output an error code to the user interface of the material testing system. In some embodiments, when the overvoltage protection device 204 is enabled, the three-phase switch mode power supply unit 200 may output an error code to an indicator included in the three-phase switch mode power supply unit 200.

[0036] At least one blocking device 202 may be connected to the output 214 of the three-phase switch-mode power supply unit 200. The blocking device 202 may be a blocking circuit, a blocking device, or a blocking module. During operation of the materials testing system 10, the three-phase switch-mode power supply unit 200 is required to output current to at least one motor drive system included in the materials testing equipment 100 for a short period of time, followed by a period of zero current output (e.g., the current demand may have a square wave profile). This current demand profile may be encountered, for example, when power is supplied to the force application device 140 to apply maximum force to the sample 130 for a period of time and then the power supply is stopped. In this case, regenerative energy generated by the motor coupling through at least one corresponding motor drive system may cause current to flow back from the materials testing equipment 100 to the three-phase switch-mode power supply unit 200. In some embodiments, the voltage of the three-phase switch-mode power supply unit 200 may increase due to the backflow current when regenerative energy is generated. In some embodiments, the voltage of the three-phase switch-mode power supply unit 200 may rise above a predetermined level and trigger an overvoltage protection device 204, causing the three-phase switch-mode power supply unit 200 to shut down or clamp the excessive voltage. In some embodiments, at least one blocking device 202 may be connected to the power output 214 of the three-phase switch-mode power supply unit 200 to potentially enable the overvoltage protection device 204 by preventing regenerative current from flowing into the three-phase switch-mode power supply unit 200. The blocking device 202 may prevent current from flowing in a selected direction. In some embodiments, at least one blocking device 202 may include at least one power diode connected in series with the power output of the three-phase switch-mode power supply unit 200 to prevent regenerative current from flowing into the three-phase switch-mode power supply unit 200. In some embodiments, at least one blocking device 202 may be used in combination with at least one or more capacitors to prevent regenerative current from flowing into the three-phase switch-mode power supply unit 200. Advantageously, when regenerative energy is generated during the operation of the material testing equipment 100, damage to components of the three-phase switch mode power supply unit 200 and / or triggering of the overvoltage protection device 204 can be prevented by preventing regenerative current from flowing into the three-phase switch mode power supply unit 200.

[0037] Power factor correction device 206 can be configured to increase the amount of useful power provided by three-phase switch-mode power supply unit 200. Power factor correction device 206 can be a power factor correction circuit, a power factor correction device, or a power factor correction module. Power factor correction device 206 can improve the phase alignment of the output voltage and output current of three-phase switch-mode power supply unit 200. In some embodiments, power correction device 206 may include a power correction circuit configured to perform active power factor correction. In some embodiments, the power correction circuit configured to perform active power factor correction may include one or more of at least a control circuit, at least one diode, at least one filter, at least one resistor, at least one capacitor, and at least one inductor. However, it should be understood that other components and their arrangements may be included in power correction device 206. Advantageously, by using power correction device 206 configured to perform active power factor correction, the input voltage can be boosted, allowing the material testing system 10 to operate with a wide range of input voltages without requiring changes to its design or multiple modifications to the transformer or wiring scheme. The active power factor correction allows for the very efficient use of power supplies, which means that larger material testing systems can be installed and operated from smaller power outlets.

[0038] The startup circuit 208 can be configured to mitigate large inrush currents when activating the three-phase switch-mode power supply unit 200 from a lower power state, such as a completely deactivated state. When activating the three-phase switch-mode power supply unit from a deactivated state, some components may require an initial current many times greater than the current drawn by the components when operating at full power. For example, if the three-phase switch-mode power supply unit 200 includes a large capacitor, the large capacitor may be substantially or completely discharged when the three-phase switch-mode power supply unit 200 is in a deactivated state. Therefore, when the three-phase switch-mode power supply unit 200 is activated, the large capacitor may act as or present as a short-circuit until charge begins to accumulate in the large capacitor, requiring a large inrush current and potentially damaging the three-phase switch-mode power supply unit 200 and components within the material testing system 10. In some embodiments, the startup circuit 208 can be configured to allow the current and voltage of the three-phase switch-mode power supply unit 200 to increase to their operating current and operating voltage values, respectively, over a period of time when the three-phase switch-mode power supply unit 200 is activated. When the three-phase switch-mode power supply unit 200 is activated without the start-up circuit 208, this period can be longer than the normal power-on period. Advantageously, by controlling the activation of the three-phase switch-mode power supply unit 200 and gradually increasing the current and voltage of the three-phase switch-mode power supply unit 200 over a period of time, the start-up circuit 208 can allow inrush current to be limited to a safe value, thereby protecting components included in the three-phase switch-mode power supply unit 200 and the material testing system 10. In some embodiments, this process can be referred to as a “soft” start.

[0039] In some embodiments, inrush current can be limited by a startup circuit 208 configured to introduce a resistor into the constituent circuitry of the three-phase switch-mode power supply unit 200. In some embodiments, the startup circuit 208 may introduce the resistor for a predetermined time period. In some embodiments, the startup circuit 208 may monitor voltage accumulation on a selected component and introduce the resistor until the measured accumulated voltage equals the operating voltage accumulation level. In some embodiments, the startup circuit 208 may be connected to a user interface device included in the material testing system 10, configured to output an alarm to the user regarding the voltage accumulation level, such as to a display, and to enable the user to control the startup circuit 208 via the user interface device. However, it should be understood that the startup circuit 208 may include other components and their arrangement.

[0040] The power fault detection circuit 210 can be configured to monitor the power output of the three-phase switch-mode power supply unit 200. The three-phase switch-mode power supply unit 200 can be configured to provide a pre-specified power value and high-voltage DC power. As a non-limiting example, the three-phase switch-mode power supply unit 200 can be rated to provide up to 20kW of power at a voltage of 300-400VDC. Components of the three-phase switch-mode power supply unit 200 may fail, and the three-phase switch-mode power supply unit 200 may be unable to provide the required operating power or voltage to the material testing equipment 100 due to the failure. In some embodiments, the power fault detection circuit 210 can be configured to output an indication that the power output of the three-phase switch-mode power supply unit 200 exceeds the operating power value range. In some embodiments, the power fault detection circuit 210 can output this indication as a power fault indication, wherein the power fault indication is output to the user interface of the material testing system. The power fault detection circuit 210 can also display the power fault indication on the three-phase switch-mode power supply unit 200. However, it should be understood that other components and their arrangement may be included in the power fault detection circuit 210.

[0041] Figure 3 A material testing apparatus, generally indicated by reference numeral 100, is shown according to an embodiment of the present invention. The material testing apparatus includes a guiding device 110, a sample holding device 120, a force application device 140, and a transverse carrier head 150.

[0042] The material testing equipment 100 is configured to receive a power supply provided by a three-phase switch-mode power supply unit 200. In some embodiments, the material testing equipment 100 may include at least one motor drive system 50. Figure 1The motor drive system is arranged to receive power supply as input from the three-phase switch mode power supply unit 200. In some embodiments, at least one motor drive system may be located outside or within the material testing equipment 100. In some embodiments, at least one motor drive system is configured to operate at least one of the sample holding device 120, the force application device 140, and the transverse carrier 150. In some embodiments, at least one motor drive system may be configured to receive DC output as input from the three-phase switch mode power supply unit 200 and provide AC power to at least one motor included within the material testing equipment 100 to facilitate its actuation. In some embodiments, at least one motor may be included within at least one of the sample holding device 120, the force application device 140, and the transverse carrier 150 to facilitate its actuation. In some embodiments, at least one motor drive system may include at least one brushless motor driver. In some embodiments, at least one motor drive system may be at least one corresponding motor drive system configured to operate at least one of the sample holding device 120, the force application device 140, and the transverse carrier 150. In some embodiments, at least one of the sample holding device 120, the force application device 140, and the transverse carrier 150 may each include at least one corresponding motor drive system.

[0043] The guiding device 110 may be a guide member arranged to support the transverse carrier 150 and guide the transverse carrier 150 relative to the guide member 110. The transverse carrier 150 may be fixed relative to the guide member 110. The guide member 110 may be supported by the base 105 of the material testing equipment 100. Figure 3 In the illustrated embodiment, guide 110 includes two pillars extending vertically from base 105, the two pillars being laterally separated by a distance less than the width of the transverse carrier 150. It should be appreciated that guide 110 can be adjusted according to force requirements and / or the shape and size of material testing equipment 100. For example, guide 110 may include a single pillar. In the illustrated embodiment, each guide has a generally circular cross-section; however, it should be understood that other cross-sectional shapes of the guiding device are conceivable.

[0044] The lateral carrier 150 is movable relative to the guide 110. The lateral carrier 150 can move relative to the guide 110 via translational movement. This movement of the lateral carrier 150 relative to the guide 110 can be referred to as a lateral carrier lifting operation, because the lateral carrier 150 is lifted to allow the sample 130 to be inserted into or removed from the material testing equipment 100 and to accommodate test samples of different sizes. The movement of the lateral carrier 150 relative to the guide 110 allows the position of the sample holding device 120 to be adjusted according to the size of the sample 130. Figure 3 In one embodiment, the lateral carrier 150 is arranged to move along the two supports of the guide 110 using translational motion. The lateral carrier 150 is arranged to move relative to the guide 110 along a first direction and an opposite second direction, which can be upward and downward directions along the guide 110, respectively. However, it should be appreciated that other configurations of the lateral carrier and the guide are contemplated. For example, the guide 110 may be arranged horizontally, and the lateral carrier 150 may move to the left and right relative to the guide 110.

[0045] The transverse carrier 150 is arranged to support at least a portion of one or both of the sample holding device 120 and the force application device 140. Advantageously, using the transverse carrier 150 as a support for other components of the material testing equipment 100 results in a compact device.

[0046] exist Figure 3 In the illustrated embodiment, the force application device 140 is supported by the transverse carrier 150 because the force application device 140 is located on the transverse carrier 150. Further, the upper portion of the sample holding device 120 is supported by the transverse carrier 150, wherein the upper portion is suspended below the transverse carrier 150. The transverse carrier 150 can be adjusted according to force requirements and / or the shape and size of the material testing equipment 100.

[0047] In some embodiments, the lateral carrier 150 may include a clamping device 160. The clamping device 160 may be configured to apply a releasable clamping force to the guide 110 to hold the lateral carrier 150 at a position relative to the guide 110. The clamping device 160 may be a manual clamping device. When manually operated, the clamping device 160 is configured to apply a releasable clamping force corresponding to user operation. That is, during manual operation, the clamping device 160 secures the lateral carrier 150 to the guide 110 by manually applying a clamping force. In some embodiments, the clamping device 160 may include a handle for applying the clamping force during user operation.

[0048] The clamping device 160 can be an automatic clamping device. As understood from the term "automatic," the automatic clamping device can be configured to automatically apply a releasable clamping force to the guide 110. That is, the automatic clamping device secures the lateral carrier 150 to the guide 110 without requiring manual application of clamping force. In some embodiments, the lateral carrier 150 may include an actuator configured to facilitate the application of a releasable clamping force to the guide. The lateral carrier 150 may include at least one motor to facilitate actuation of the clamping device 160. In some embodiments, at least one motor of the lateral carrier 150 may receive electrical power from at least one motor drive system to actuate the clamping device 160. Advantageously, the automatic clamping device enables the application of large clamping forces to secure the lateral carrier 150 to the guide 110 without the use of a long handle, which would require a long handle if the clamping force were applied based on user operation. Therefore, the clamping of the transverse carrier 150 to the guide 110 can withstand the large forces generated during the test by the force applied by the force application device and / or the sample 130 on the transverse carrier 150.

[0049] In some embodiments where the clamping device operates automatically, the clamping device 160 can be arranged to maintain the clamping force even when no electrical power is supplied to the clamping device 160. As a result, the lateral carrier head 150 is also secured to the guide 110 even when no electrical power is supplied to the clamping device 160. Advantageously, the automatic clamping device 160 is "fail-safe," meaning that the clamping device does not rely on a continuous power supply to maintain the clamping state.

[0050] As described above, the material testing apparatus 100 includes a sample holding device 120 and a force application device 140. The sample holding device 120 is used to hold the sample 130 to be tested. The sample holding device 120 may be a sample holding device arranged to clamp the sample 130 and may include multiple components such that the sample 130 is clamped when placed between the multiple components of the sample holding device 120. For example, the sample holding device 120 may include multiple clamps (e.g., claws) respectively arranged at opposite ends of the sample 130. In some embodiments, a pair of clamps are present. In some embodiments, the sample holding device 120 may be configured to be mechanically and / or pneumatically actuated. The sample holding device 120 may include at least one motor to facilitate actuation of the sample holding device 120. In some embodiments, at least one motor of the sample holding device 120 may receive electrical power from at least one motor drive system to actuate the sample holding device 120.

[0051] The sample holding device 120 can be configured to withstand the maximum force applied to the sample by the material testing equipment 100. Therefore, the sample holding device 120 can be constructed or formed of a material such that it will not deform under a force less than or equal to the maximum force applied to the sample 130. Thus, the sample holding device 120 can be adjusted according to force requirements and / or the shape and size of the sample 130 to be tested. Depending on the type and magnitude of the force applied to the sample, the sample holding device 120 can be arranged horizontally or vertically. However, it should be appreciated that other structures and forms of sample holding devices are contemplated.

[0052] The force-applying device 140 is a force-applying apparatus for applying force to a sample 130 to test the physical properties of the sample 130. The force-applying device 140 can repeatedly apply force to the sample. In some embodiments, the force-applying device can be configured to apply one or more of axial force and torsional force. For example, the force-applying device 140 can apply a deformation force or test force to deform the sample 130 by one or more of tension, compression, or torsion. As an alternative to or addition to the deformation force, one or more of tension, compression, or torsion can be further applied. The force-applying device 140 can apply force via a sample holding device 120, wherein the force to be applied to the sample 130 is applied by moving the sample holding device 120. The force-applying device 140 can be arranged to apply force to one end of the sample 130 or to opposite ends of the sample 130. The force-applying device 140 can be adjusted according to force requirements and / or the shape and size of the material testing apparatus 100. For example, the force-applying device 140 may include an actuator. The actuator can be arranged to move at least one sample holding device 120 during use to apply force to the sample held therein. The force-applying device 140 may include at least one motor to facilitate actuation of the force-applying device 140. In some embodiments, at least one motor of the force-applying device 140 may receive electrical power from at least one motor drive system to actuate the force-applying device 140. However, it should be appreciated that other force-applying devices are contemplated for applying force.

[0053] It should be understood that embodiments of the present invention can be implemented in hardware, software, or a combination of hardware and software. Any such software can be stored in the form of volatile or non-volatile storage devices (such as storage devices like ROM, whether erasable or rewritable); or in the form of memory (such as RAM, memory chips, devices, or integrated circuits); or stored on optically or magnetically readable media (such as CDs, DVDs, disks, or magnetic tapes). It should be understood that the storage devices and storage media are embodiments of machine-readable storage devices suitable for storing one or more programs that, when run, implement embodiments of the present invention. Accordingly, embodiments provide a program and a machine-readable storage device storing such a program, the program comprising code for implementing the system or method as described in any of the preceding claims. Furthermore, embodiments of the present invention can be transmitted electronically via any medium (e.g., communication signals transmitted via wired or wireless connections), and such transmission is suitably covered by the embodiments.

[0054] Throughout the specification and claims, the words “comprising” and “including,” and variations thereof, mean “including, but not limited to,” and are not intended to (and do not) exclude other parts, additions, components, integrals, or steps. In the specification and claims of this document, the singular encompasses the plural unless the context requires otherwise. In particular, where the indefinite article is used, this application should be understood to consider both the plural and singular forms unless the context requires otherwise.

[0055] Features, integrals, properties, compounds, chemical portions, or groups described in connection with specific aspects, embodiments, or examples of the invention should be understood to be applicable to any other aspect, embodiment, or example described herein, unless incompatible therewith. All features disclosed in this application (including any appended claims, abstract, and drawings) and / or all steps of any method or process so disclosed may be combined in any combination, unless at least some of such features and / or steps are mutually exclusive. The invention is not limited to the details of any of the foregoing embodiments. The scope of the invention extends to any novel feature or any combination of novel features disclosed in these features of the present application (including any appended claims, abstract, and drawings), or to any novel step or any combination of novel steps in any method or process so disclosed.

[0056] Readers are directed to all articles and documents submitted concurrently with or prior to this document that are related to this application and open to public examination, the contents of which are incorporated herein by reference.

Claims

1. A material testing system (10), comprising: A material testing apparatus (100) configured to receive a power supply, wherein the material testing apparatus (100) comprises: Guiding device (110); A sample holding device (120) configured to hold a sample; Force application device (140), the force application device being configured to apply force to the sample; and A transverse carrier (150) is arranged to support at least a portion of one or both of the sample holding device (120) and the force application device (140), wherein the transverse carrier (150) is movable relative to the guide device (110). A three-phase switch-mode power supply unit (200) is arranged to provide the power supply to the material testing equipment (100); and One or more blocking devices (202) are connected to the power output (214) of the three-phase switch mode power supply unit (200), wherein the one or more blocking devices (202) are arranged to prevent regenerative current from flowing into the three-phase switch mode power supply unit (200).

2. The system (10) as claimed in claim 1, wherein, The one or more blocking devices (202) include at least one power diode, wherein the at least one power diode is connected in series with the power output (214) of the three-phase switch mode power supply unit (200).

3. The system (10) as claimed in claim 1, comprising a power factor correction device (206) connected to the three-phase switch mode power supply unit (200).

4. The system (10) as described in claim 3, wherein, The power factor correction device (206) includes a power factor correction circuit configured to perform active power factor correction.

5. The system (10) as claimed in claim 1, wherein, The three-phase switch mode power supply unit (200) includes a startup circuit (208) configured to allow the current and voltage of the three-phase switch mode power supply unit (200) to increase to the operating current value and operating voltage value respectively within a predetermined time period when the three-phase switch mode power supply unit (200) is enabled.

6. The system (10) as claimed in claim 1, wherein, The three-phase switch mode power supply unit (200) includes a power fault detection circuit (210) configured to output an indication that the power output by the three-phase switch mode power supply unit (200) exceeds the operating power value range.

7. The system (10) as claimed in claim 1, wherein, The three-phase switch-mode power supply unit (200) is configured to receive an input voltage of 50-700 volts.

8. The system (10) as claimed in claim 1, wherein, The three-phase switch mode power supply unit (200) includes an input configuration containing three live phase paths.

9. The system (10) as claimed in claim 1, wherein, The material testing equipment (100) includes: At least one motor drive system configured to operate at least one of the sample holding device (120), the force application device (140), and the transverse carrier head (150). The at least one motor drive system (50) is arranged to receive the power supply as input from the three-phase switch mode power supply unit (200).

10. The system (10) as claimed in claim 9, wherein, The at least one motor drive system includes at least one brushless motor driver.

11. The system (10) as claimed in claim 1, wherein, The sample holding device (120) is configured to be mechanically and / or pneumatically actuated.

12. The system (10) as claimed in claim 1, wherein, The transverse carrier (150) is movable relative to the guide device (110) and includes a clamping device (160) configured to apply a releasable clamping force to the guide device (110) to hold the transverse carrier (150) at a position relative to the guide device (110).

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