A sample analyzer and a sample analysis system

Abstract

The application provides a sample analyzer and a sample analysis system. The sample analyzer comprises: a sample feeder configured to transport a sample to a preset position, the sample feeder comprising a sample feeder storage unit configured to store sample feeder parameters; a sample analyzer device configured to perform an analysis operation on the sample at the preset position, the sample analyzer device comprising a parameter storage unit configured to store analysis device parameters and a processor; and the processor is configured to perform one or more programs to implement the following steps: obtaining the sample feeder parameters from the sample feeder storage unit and obtaining the analysis device parameters from the parameter storage unit; and controlling the sample analyzer device to perform the operation on the sample based on the sample feeder parameters and the analysis device parameters. According to the application, the sample feeder and the sample analyzer device are decoupled, so that any sample feeder can be combined with any sample analyzer device, thereby reducing the installation requirements, improving the installation and upgrading efficiency, and improving the flexibility of the instrument and the sample feeder.

Description

Technical Field

[0001] This application relates to the field of medical technology, and more specifically to sample analysis technology. Background Technology

[0002] When analyzing samples, they are typically transported to the analytical apparatus via an injector. Since both the injector and the analytical apparatus have inherent errors, precise control of the sample is required in practical applications based on these errors. In related technologies, the total error parameters of the injector and analytical apparatus are obtained during the commissioning phase and stored in the injector's main controller. This means that in actual use, the injector and analytical apparatus must be used according to the specifications established during commissioning, preventing compatibility with other injectors or analytical apparatuses. This significantly limits the flexibility of the entire sample analyzer and system, resulting in high installation requirements for the injector and analytical apparatus, reducing installation efficiency and overall sample analysis efficiency. Summary of the Invention

[0003] This application provides a sample analyzer and a sample analysis system to at least solve one of the above-mentioned problems.

[0004] According to a first aspect of this application, a sample analyzer is provided, the sample analyzer comprising:

[0005] An injector for transporting samples to a preset location, the injector including an injector storage unit for storing injector parameters;

[0006] A sample analysis device is used to analyze samples at the preset location. The sample analysis device includes a parameter storage unit for storing analysis device parameters and a processor.

[0007] When the processor executes one or more programs, it performs the following steps:

[0008] The injector parameters are obtained from the injector storage unit, and the analytical device parameters are obtained from the parameter storage unit;

[0009] Based on the injector parameters and the analysis device parameters, the sample analysis device is controlled to operate on the sample.

[0010] Optionally, controlling the sample analysis device to operate on the sample based on the injector parameters and the analysis device parameters includes:

[0011] Based on the injector error parameter in the injector parameters and the sampling movement parameter in the analysis device parameters, the movement distance of the sampling mechanism of the sample analysis device is obtained;

[0012] The sampling mechanism is controlled to move from its initial position by the specified distance to the preset position, and the sample is then manipulated.

[0013] Optionally, the parameter storage unit is also used to store the injector parameters as backup data.

[0014] Optionally, the processor is further configured to: compare whether the backup data is consistent with the injector parameters currently stored in the injector.

[0015] Optionally, the processor is further configured to: send the injector parameters to the injector when the backup data matches the injector parameters currently stored in the injector; or,

[0016] When the backup data is inconsistent with the injector parameters currently stored in the injector, an operation command is sent to the injector based on the operator's instructions.

[0017] Optionally, when the backup data is inconsistent with the injector parameters currently stored in the injector, an operation instruction is sent to the injector based on an operator instruction, including:

[0018] When the operator instruction instructs the injector storage unit to be replaced, the operation instruction includes the processor sending the injector parameters to the injector and storing them in the injector storage unit;

[0019] When the operator instruction instructs the injector to be replaced, the operation instruction includes the processor acquiring the injector parameters of the replaced injector and storing them in the parameter storage unit;

[0020] When the operator instruction instructs the parameter storage unit to be replaced, the operation instruction includes the processor retrieving the injector parameters from the injector storage unit and storing them in the replaced parameter storage unit.

[0021] Optionally, the processor is further configured to:

[0022] When the backup data is not present in the parameter storage unit, the injector parameters are acquired and stored in the parameter storage unit as the backup data; or,

[0023] When the injector parameter is not present in the injector, the backup data is sent to the injector storage unit and stored as the injector parameter.

[0024] According to a second aspect of this application, a sample analysis system is provided, comprising:

[0025] Multiple sample analyzers arranged in series, each of the sample analyzers comprising:

[0026] A sample injector is used to transport a sample to a preset location, and the sample injector includes a sample storage unit for storing sample injector parameters;

[0027] A sample analysis device is connected to the injector. The sample analysis device includes a controller and a parameter storage unit for storing the parameters of the analysis device. The controller is used to control the sample analysis device to operate on the sample at the preset position based on the injector parameters and the analysis device parameters.

[0028] A track, connected to the injector, is used to transport the sample to the injector;

[0029] The track control device is connected to the track and the injector and is used to control the operation of the track and the injector.

[0030] Optionally, the controller is used to control the sample analysis device to operate on the sample at the preset position based on the injector parameters and the analysis device parameters, including:

[0031] Based on the injector error parameter in the injector parameters and the sampling movement parameter in the analysis device parameters, the movement distance of the sampling mechanism of the sample analysis device is obtained;

[0032] The sampling mechanism is controlled to move from the initial position by the specified distance to the preset position, and the operation is performed on the sample.

[0033] Optionally, the orbital master control device is also used to: store the injector parameters as backup data.

[0034] Optionally, the orbital master control device is further configured to: acquire the currently stored injector parameters in the sample storage unit, and compare whether the currently stored injector parameters are consistent with the backup data.

[0035] Optionally, the track master control device is further used for:

[0036] When the currently stored injector parameters are consistent with the backup data, the orbital master control device sends the injector parameters to the injector;

[0037] or,

[0038] When the currently stored injector parameters are inconsistent with the backup data, the orbital master control device sends an operation command to the injector based on the operator's instructions.

[0039] Optionally, the orbital master control device sends the operation command to the sampler based on the operator's instructions, including:

[0040] When the operator instructs the injector storage unit to be replaced, the track master control device sends the injector parameters to the injector and stores them in the injector storage unit.

[0041] When the operator instructs the injector to be replaced, the operation instruction includes the track master control device acquiring the injector parameters of the replaced injector and storing them in the parameter storage unit;

[0042] When the operator instructs the track master control device to be replaced, the operation instruction includes the replaced track master control device obtaining the injector parameters from the injector storage unit and storing them in the replaced track master control device.

[0043] Optionally, the orbit master control device is further configured to: when the backup data is not present in the orbit master control device, acquire the injector parameters and store them in the orbit master control device as backup data; or,

[0044] When the injector parameter is not present in the injector, the backup data is sent to the injector storage unit and stored as the injector parameter.

[0045] According to the sample analyzer and system of the present application, by storing the injector parameters at the injector end and the analysis device parameters at the sample analysis device end, the decoupling between the injector and the sample analysis device is realized, so that any injector can be used in combination with any sample analysis device, reducing installation requirements and improving installation efficiency and the flexibility of instrument and injector matching. Attached Figure Description

[0046] The above and other objects, features, and advantages of this application will become more apparent from the more detailed description of the embodiments of this application in conjunction with the accompanying drawings. The accompanying drawings are used to provide a further understanding of the embodiments of this application and form part of the specification. They are used together with the embodiments of this application to explain this application and do not constitute a limitation thereof. In the accompanying drawings, the same reference numerals generally represent the same components or steps.

[0047] Figure 1 This is a schematic structural block diagram of a sample analyzer according to an embodiment of this application;

[0048] Figure 2 These are examples of injector error parameters according to embodiments of this application;

[0049] Figure 3 This is an example of the total error parameter between the sample analysis apparatus and the injector according to an embodiment of this application;

[0050] Figure 4 These are examples of operator instructions according to embodiments of this application;

[0051] Figure 5 This is a schematic structural block diagram of a sample analysis system according to an embodiment of this application;

[0052] Figure 6 This is yet another example of operator instructions according to embodiments of this application. Detailed Implementation

[0053] To make the objectives, technical solutions, and advantages of this application more apparent, exemplary embodiments according to this application will be described in detail below with reference to the accompanying drawings. Obviously, the described embodiments are merely some embodiments of this application, and not all embodiments of this application. It should be understood that this application is not limited to the exemplary embodiments described herein. Based on the embodiments of this application described herein, all other embodiments obtained by those skilled in the art without inventive effort should fall within the protection scope of this application.

[0054] In sample analysis techniques, when debugging the injector and sample analysis device, the actual distance between the sampling mechanism and the actual position where the sample is manipulated can be measured. Combined with the theoretical distance between the sampling mechanism and the theoretical position where the sample is manipulated, the difference C can be obtained. Since errors occur during the manufacturing and assembly of both injector A and sample analysis device B, there is an error between the sampling mechanism of sample analysis device B and its theoretical position. Similarly, there is an error between the actual position where the sample is moved by injector A and its theoretical position. Therefore, the difference C includes the errors from both sample analysis device B and injector A. In current applications, this difference C is stored in the sample analysis device. Because this difference C is only related to injector A and sample analysis device B, injector A and sample analysis device B associated with this difference C can only be used together. Sample analysis device B cannot be used with other injectors, which greatly limits the flexible use of the sample analyzer. Furthermore, the injector and sample analyzer must be installed in the correct order during the commissioning phase; incorrect installation will cause the sample analyzer to malfunction. All of these factors result in very high installation requirements for the sample analyzer and injector, significantly reducing both installation efficiency and sample analysis efficiency.

[0055] Based on the above considerations, embodiments of this application provide a sample analyzer. See also... Figure 1 , Figure 1 A schematic structural block diagram of a sample analyzer according to an embodiment of this application is shown. Figure 1 As shown, the sample analyzer 100 may include:

[0056] The injector 110 is used to transport samples to a preset position. The injector 110 includes an injector storage unit (not shown) for storing injector parameters.

[0057] The sample analysis device 120 is used to perform analysis operations on the sample at the preset location. The sample analysis device 120 includes a parameter storage unit 121 for storing analysis device parameters and a processor 122.

[0058] When the processor 122 executes one or more programs, it performs the following steps:

[0059] Step S110: Obtain the injector parameters from the injector storage unit and the analytical device parameters from the parameter storage unit 121;

[0060] Step S120: Based on the injector parameters and the analysis device parameters, control the sample analysis device 120 to operate on the sample.

[0061] In this system, the injector parameters are stored in the injector storage unit within the injector, while the analytical device parameters are stored in the parameter storage unit of the sample analysis device. This separate storage of injector and analytical device parameters decouples the two systems, allowing for the pairing of any sample analysis device with any injector in practical use. This enables convenient and rapid combination of the sample analysis device and injector without the need for re-adjustment, significantly improving the flexibility of instrument and injector pairing. Compared to traditional sample analyzers, the sample analyzer according to this embodiment is not limited to the pairing of sample analysis devices and injectors during the commissioning phase, making the use of the sample analyzer more flexible, convenient, and efficient. Furthermore, the sample analyzer according to this embodiment does not require installation according to the order of the commissioning phase, greatly reducing installation requirements and improving installation efficiency. It is suitable for a wide range of applications in any sample analysis situation.

[0062] Alternatively, the sample analyzer may include a blood analyzer or a smear preparation instrument.

[0063] Optionally, the operation may include sampling and / or mixing.

[0064] In some embodiments, the sampler storage unit or parameter storage unit may be volatile memory or non-volatile memory, or both. The non-volatile memory may be read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), ferromagnetic random access memory (FRAM), flash memory, magnetic surface memory, optical disc, or compact disc read-only memory (CD-ROM); the magnetic surface memory may be disk storage or magnetic tape storage. The volatile memory may be random access memory (RAM), which serves as an external cache. By way of example, but not limitation, many forms of RAM are available, such as Static Random Access Memory (SRAM), Synchronous Static Random Access Memory (SSRAM), Dynamic Random Access Memory (DRAM), Synchronous Dynamic Random Access Memory (SDRAM), Double Data Rate Synchronous Dynamic Random Access Memory (DDRSDRAM), Enhanced Synchronous Dynamic Random Access Memory (ESDRAM), SyncLink Dynamic Random Access Memory (SLDRAM), and Direct Rambus Random Access Memory (DRRAM).The memories described in the embodiments of this application are intended to include these and any other suitable types of memories.

[0065] In some embodiments, the processor may be implemented by software, hardware, firmware, or a combination thereof, and may use at least one of the following: circuit, single or multiple application-specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field-programmable gate arrays (FPGAs), central processing units (CPUs), controllers, microcontrollers, and microprocessors, so that the processor 120 can perform some or all of the steps or any combination of the steps in the various embodiments of this application.

[0066] In some embodiments, the sample analyzer may further include:

[0067] I / O interfaces can consist of serial interfaces such as USB, IEEE1394, or RS-232C; parallel interfaces such as SCSI, IDE, or IEEE1284; and analog signal interfaces composed of D / A converters and A / D converters. Input devices such as keyboards, mice, trackballs, click wheels, buttons, touchpads, touchscreens, or other control components can be connected to the I / O interfaces, allowing operators to directly input data.

[0068] In some embodiments, a display with display function, such as an LCD screen, touch screen, or LED display, can be connected to the I / O interface, and the sample analyzer can output the diagnostic data to the display for display.

[0069] In some embodiments, the sample analyzer may further include a communication module. The communication module may include an interface of any communication protocol. The communication interface communicates with the outside world via a network. The sample analyzer can transmit data with any device connected through the network via the communication interface using a certain communication protocol. It should be understood that the sample analyzer according to the embodiments of this application is not limited to the communication interface. Whether it is an interface of a currently known communication protocol or an interface of a communication protocol developed in the future, it can be used in the sample analyzer of the embodiments of this application to realize the function of communicating with the outside world via a network, and no limitation is made herein.

[0070] In some embodiments, the injector storage unit or parameter storage unit, the processor, the I / O interface, and the communication module can communicate via a bus. Of course, in addition to the bus, the injector storage unit or parameter storage unit, the processor, the I / O interface, and the communication module can also communicate via other means, such as wireless, etc., which are not limited here.

[0071] According to an embodiment of this application, in step S110, the sample analysis device obtains the injector parameters from the injector storage unit and the analysis device parameters from the parameter storage unit.

[0072] In some embodiments, the injector can transport the sample to a preset location.

[0073] Due to the existence of errors, the actual position where the sample is manipulated may not be exactly the same as the theoretical position. The preset position can be the actual position where the sampling mechanism in the sample analysis device manipulates the sample. That is, the preset position can be the actual position where the injector moves the sample. The injector moves the sample to the preset position, and the sampling mechanism of the sample analysis device moves to the preset position, and then the sample is manipulated accordingly. It should be understood that the step of the injector transporting the sample to the preset position can be before, simultaneously, or after the steps of the sample analysis device retrieving injector parameters from the injector's injector storage unit or retrieving analysis device parameters from the parameter storage unit 121, without any limitation.

[0074] Optionally, the injector parameters may include injector error parameters. These injector error parameters may be machining or assembly errors at the injector end.

[0075] In some embodiments, the injector parameters may also include other parameters required for the injector to move the sample to a preset position, such as analog optical coupler (DAC) parameters, injection adjustment steps, etc.

[0076] In some embodiments, the injector error parameter can be obtained based on the actual distance parameter from the reference position of the sample analysis device to the first position and the theoretical distance parameter.

[0077] The reference position of the sample analysis device can be any fixed position within the device that facilitates distance measurement. Specifically, see [link to documentation]. Figure 2 , Figure 2 An example of injector error parameters according to an embodiment of this application is shown. For example... Figure 2As shown, the reference position of the sample analysis device can be the position of the tooling front plate of the sample analyzer device. The theoretical distance from the reference position to the preset position (i.e., the actual position for sample operation) can be a known fixed value h. The actual distance D2 from the reference position to the preset position can be obtained through a specific tooling or ranging method (e.g., infrared ranging, vision-based ranging, etc.). Thus, the difference D2-h between the actual distance and the theoretical distance from the tooling front plate of the sample analysis device to the preset position can be obtained, which is the injector error parameter Δd2=D2-h. It is affected by the injection machine processing and assembly errors, and the injection error parameter is different between different injection machines.

[0078] Therefore, it can be seen that the injector's error parameters can be obtained independently of the sample analysis device. Thus, for any injector, the injector error parameters can be measured and stored in the injector's storage unit during the commissioning process with the sample analysis device. In this way, the injector error parameters can be directly retrieved from the storage unit during use, eliminating the need for re-commissioning and removing the restriction to using the sample analyzer and injector only during the commissioning phase. This makes the use of the sample analyzer more flexible, convenient, and efficient, reducing installation requirements and improving installation efficiency.

[0079] Optionally, the analytical device parameters may include device error parameters. These device error parameters may be machining or assembly errors at the sample analysis device end.

[0080] In some embodiments, the parameters of the analysis device may also include the number of motion adjustment steps of the sampling mechanism of the sample analysis device.

[0081] In some embodiments, the device error parameters can be obtained based on the injector error parameters and the total error parameters between the sample analysis device parameters and the injector.

[0082] In some embodiments, the total error parameter between the sample analysis device and the injector can be obtained based on the actual distance parameter and the theoretical distance parameter from the initial position to the preset position of the sampling mechanism of the sample analysis device.

[0083] Specifically, see Figure 3 , Figure 3 An example of the total error parameter between the sample analysis apparatus and the injector according to an embodiment of this application is shown. Figure 3As shown, the theoretical distance parameter for the sampling mechanism of the sample analysis device to move from its initial position to the preset position can be a known fixed value d0. The actual distance D from the initial position to the preset position of the sampling mechanism can be obtained through ranging methods (such as infrared ranging, vision-based ranging, etc.). Thus, the difference D-d0 between the actual distance and the theoretical distance can be obtained, which is the total error parameter Δd = D-d0 between the sample analyzer and the injector. This total error includes both the processing and assembly errors Δd1 and Δd2 at the sample analyzer end. Therefore, based on the injector error parameter Δd2 and the total error parameter Δd, the device error parameter Δd1 = Δd - Δd2 can be obtained.

[0084] In some embodiments, the analytical device parameters may include sampling movement parameters, wherein the sampling movement parameters include the sum of a theoretical distance parameter d0 for the sampling mechanism to move from its initial position to a preset position and a device error parameter Δd1, i.e., sampling movement parameter D1 = d0 + Δd1. Therefore, the analytical device parameters do not include the processing and assembly errors of the injector, thus achieving decoupling from the injector.

[0085] In some embodiments, sampling movement parameters may be stored in the device storage unit of the sample analysis apparatus.

[0086] In this way, the injector error parameters are stored at the injector end, and the analysis device parameters are stored at the sample analysis device end. This allows for the combined use of any injector and any sample analyzer without the need for re-adjustment and installation, reducing installation requirements and greatly improving the flexibility and efficiency of combining injectors and sample analysis devices.

[0087] According to an embodiment of this application, in step S120, controlling the sample analysis device to operate on the sample based on the injector parameters and the analysis device parameters includes:

[0088] Based on the injector error parameter in the injector parameters and the sampling movement parameter in the analysis device parameters, the movement distance of the sampling mechanism of the sample analysis device is obtained;

[0089] The sampling mechanism is controlled to move from its initial position by the specified distance to the preset position, and the sample is then manipulated.

[0090] In some embodiments, the movement distance includes the sum of the injector error parameter and the sampling movement parameter.

[0091] In some embodiments, the sample analysis apparatus may include a blood analysis apparatus or a smear preparation apparatus. Further, the sampling mechanism may be a sampling needle.

[0092] In some embodiments, combined with Figure 2 and Figure 3 When the sample analyzer analyzes a sample, the processor of the sample analysis device can obtain the injector parameters from the injector storage unit and send them to the injector to control the injector to transport the sample to a preset position based on the injector parameters. The processor of the sample analysis device also obtains the sampling movement parameter D1 from the device storage unit, and combines it with the injector parameters obtained from the injector storage unit to obtain the movement distance that the sampling mechanism needs to perform. That is, the movement distance of the sampling mechanism can be the sum of the injector error parameter Δd2 and the sampling movement parameter D1, i.e., D1+Δd2. Then, the sampling mechanism is controlled to move from its initial position to D1+Δd2 to the preset position where the injector delivers the sample. Then, the sampling mechanism performs corresponding operations on the sample, such as sampling and / or mixing.

[0093] During the use of a sample analyzer, the injector may malfunction, requiring the replacement of some components or the entire injector. In existing technologies, because the injector and sample analysis device are used in tandem, replacing the injector eliminates the total error parameters between it and the previous sample analysis device. This can cause the sample analyzer to become unusable, requiring readjustment of the injector's position for it to function properly, resulting in low efficiency.

[0094] Optionally, based on the above considerations, the parameter storage unit is also used to store the injector parameters as backup data.

[0095] Specifically, the injector parameters in the injector are backed up to the parameter storage unit of the sample analysis device. When the injector parameters stored in the injector are found to be inconsistent with the backup data stored in the sample analysis device, the two are synchronized to make them consistent. Therefore, even if some components or the entire injector are replaced, the current injector parameters and analysis device parameters can be obtained directly through the sample analysis device, without the need to adjust the relevant parameters of the injector with corresponding fixtures, which further improves the working efficiency of the sample analyzer.

[0096] In some embodiments, the processor of the sample analysis device is further configured to compare whether the backup data is consistent with the injector parameters currently stored in the injector.

[0097] Specifically, upon startup (power-on), the processor of the sample analyzer can acquire the injector parameters of the current injector and compare them with backup data stored in the parameter storage unit of the sample analyzer. If the injector parameters exist in the injector and the backup data exists in the parameter storage unit, and they match, it indicates that the injector has not changed. If they do not match, it indicates that at least some components of the injector have been replaced. In this case, the sample analyzer can alert the operator that at least some components of the injector have changed, for example, through sound and / or light. When the injector parameters are not present or the parameter storage unit of the sample analyzer does not contain backup data, the processor of the sample analyzer can directly send the backup data to the injector for storage as injector parameters or store the injector parameters in the sample analyzer as backup data to ensure synchronization between the injector parameters and backup data, which helps improve the upgrade efficiency of the sample analyzer.

[0098] In some embodiments, the processor of the sample analysis device is further configured to:

[0099] When the backup data is not present in the parameter storage unit, the injector parameters are acquired and stored in the parameter storage unit as the backup data; or,

[0100] When the injector parameter is not present in the injector, the backup data is sent to the injector storage unit and stored as the injector parameter.

[0101] Specifically, when the backup data is not present in the parameter storage unit of the sample analysis device, but the injector parameters are present in the injector, the processor of the sample analysis device can acquire the injector parameters and store them in the parameter storage unit as backup data; when the injector parameters are not present, but the backup data is present in the parameter storage unit of the sample analysis device, the processor of the sample analysis device sends the backup data in the parameter storage unit to the injector storage unit for storage as injector parameters.

[0102] In some embodiments, the processor of the sample analysis apparatus is further configured to: send the injector parameters to the injector when the backup data matches the injector parameters currently stored in the injector; or,

[0103] When the backup data is inconsistent with the injector parameters currently stored in the injector, an operation command is sent to the injector based on the operator's instructions.

[0104] Specifically, when the sample analysis device determines that the backup data is consistent with the injector parameters currently stored in the injector, it indicates that the injector has not changed and its movement can be directly controlled based on the injector parameters stored in the injector. In this case, the injector parameters can be sent to the injector, and the injector, upon receiving these parameters, will move accordingly to move the sample to a preset position. When the sample analysis device determines that the backup data is inconsistent with the injector parameters currently stored in the injector, the processor of the sample analysis device can perform corresponding operations according to the operator's instructions. See [link to relevant documentation]. Figure 4 , Figure 4 An example of operator instructions according to an embodiment of this application is shown. For example... Figure 4 As shown, if the operator is provided with corresponding options, each option corresponding to a different reason for data inconsistency, the operator can then select the appropriate option to issue the corresponding operator instruction based on the actual situation. The processor of the sample analysis device then sends the operation instruction to the injector according to the corresponding operator instruction.

[0105] In some embodiments, when the backup data is inconsistent with the injector parameters currently stored in the injector, an operation instruction is sent to the injector based on an operator instruction, including:

[0106] When the operator instruction instructs the injector storage unit to be replaced, the operation instruction includes the processor sending the injector parameters to the injector and storing them in the injector storage unit;

[0107] When the operator instruction instructs the injector to be replaced, the operation instruction includes the processor acquiring the injector parameters of the replaced injector and storing them in the parameter storage unit;

[0108] When the operator instruction instructs the parameter storage unit to be replaced, the operation instruction includes the processor retrieving the injector parameters from the injector storage unit and storing them in the replaced parameter storage unit.

[0109] When the operator selects to replace the injector storage unit (i.e., the operator instructs only to replace the injector storage unit), the execution components of the injector that perform sample delivery do not change. Therefore, the previous injector parameters can continue to be used. At this time, the sample analysis device only needs to send its stored backup data to the injector, and the injector can continue to work normally by storing the backup data as the injector parameters. At this time, the operator does not need to perform any other debugging work, which greatly reduces the operator's workload and improves the efficiency of the sample analyzer. When the operator selects to replace the injector, i.e., when the operator instructs the entire injector to be replaced, as mentioned earlier, the injector parameters can be measured independently without relying on the sample analyzer. In this case, the operator only needs to measure the replaced injector separately and store the replaced injector parameters in the injector storage unit of the replaced injector. The processor of the sample analyzer can retrieve the replaced injector parameters from the replaced injector storage unit and store them in the parameter storage unit for backup. When the replaced injector is needed, the replaced injector parameters are sent to the replaced injector. The replaced injector moves the sample to the corresponding preset position based on the replaced injector parameters. Since the moving distance of the sampling mechanism of the sample analyzer is based on the injector parameters, after replacing the injector, the moving distance of the sampling mechanism is obtained by using the replaced injector parameters. In this way, the sampling mechanism can accurately reach the replaced preset position by moving the replaced injector by the replaced moving distance. Compared to the traditional method, which eliminates the need to adjust the injector using a fixture based on the previous injector parameters, this method allows for accurate sample manipulation by directly utilizing the parameters of the replaced injector, thus improving the efficiency of sample analyzer installation and upgrades.

[0110] In the above embodiments, when the operator selects to replace the injector, that is, when the operator instructs the entire injector to be replaced, under the premise of meeting the working requirements, it is not necessary to measure the replaced injector to obtain the parameters of the replaced injector. Instead, the processor in the sample analysis device directly sends the backup data to the replaced injector and stores it as the injector parameters.

[0111] In practical applications, to improve sample testing efficiency, multiple sample analyzers can be connected in series to form a sample analysis system for performing one or more analytical operations on samples. The sample analysis system transports samples to the corresponding sample analyzers via a track, and then the sample analyzers' injectors transport the samples to a preset location for the appropriate operations. In current technologies, all parameters related to sample transport are stored in the track control unit. These parameters include the total parameters of multiple sample analyzers (including injectors and analysis devices) and track-related parameters. This means the track control unit must be used in conjunction with the corresponding sample analyzer; otherwise, the entire sample analysis system will malfunction. Furthermore, the entire sample analysis system must be installed according to the production and debugging sequence; incorrect installation order will also cause the system to malfunction. This significantly limits the flexible use of the entire sample analysis system, resulting in high installation requirements and reduced installation efficiency and flexibility in matching sample analyzers.

[0112] Based on the above considerations, a sample analysis system is provided according to an embodiment of this application. See also... Figure 5 , Figure 5 A schematic structural block diagram of a sample analysis system according to an embodiment of this application is shown. Figure 5 As shown, the sample analysis system 500 may include:

[0113] Multiple sample analyzers 510 arranged in series, each of the sample analyzers 510 comprising:

[0114] The injector 511 is used to transport the sample to a preset position, and the injector includes an injection storage unit for storing injector parameters;

[0115] A sample analyzer device 512 is connected to the injector 511. The sample analyzer device 512 includes a controller and a parameter storage unit for storing analysis device parameters. The controller is used to control the sample analyzer device to operate on the sample at the preset position based on the injector parameters and the analysis device parameters.

[0116] Track 520, connected to the injector 511, is used to transport the sample to the injector 511;

[0117] The track master control device 530 is connected to the track 520 and the sampler 511 and is used to control the operation of the track 520 and the sampler 511.

[0118] The system comprises a track control unit that transports the sample to the injector of the sample analyzer. The controller within the sample analyzer receives injector parameters from the injector's storage unit and sends them to the injector, controlling it to move the sample to a preset position. The controller also retrieves analytical device parameters from the parameter storage unit and, based on these parameters, controls the sample analyzer to operate on the sample at the preset position. Because the injector parameters are stored in the injector's storage unit and the analytical device parameters are stored in the sample analyzer's parameter storage unit (i.e., the injector and analytical device parameters are stored separately), this system not only decouples the injector and the sample analyzer, allowing for convenient and rapid pairing of any sample analyzer and injector without readjustment, but also decouples the sample analyzer from the track control unit, enabling pairing of any sample analyzer with any track control unit. Compared to traditional sample analysis systems, the sample analysis system according to the embodiments of this application does not require the limitation of using sample analyzers and injectors in the commissioning phase, nor does it require re-commissioning. This eliminates the need to sequentially assemble the injectors and sample analyzers, and the installation order of multiple sample analyzers, before commissioning. Multiple sample analyzers and injectors can be installed in parallel, improving production efficiency. Furthermore, the entire sample analysis system is more flexible, convenient, and efficient. It is suitable for a wide range of applications in sample analysis, such as automated systems for sample analysis and processing.

[0119] Optionally, the sample analyzer may include a blood analyzer or a smear preparation device. It should be understood that multiple sample analyzers in a sample analysis system can be of the same type or different types; for example, the sample analysis system may include a blood analyzer and a smear preparation device arranged in series. The number and type of sample analyzers in the sample analysis system can be configured as needed and are not limited herein.

[0120] Accordingly, each sample analyzer performs a corresponding operation on the sample. In some embodiments, the operation includes sampling and / or mixing.

[0121] Optionally, for each sample analyzer, the injector moves the sample to a preset position for each sample analyzer so that the corresponding sample analyzer device can operate on the sample at that preset position.

[0122] In some embodiments, at least a portion of the multiple sample analyzers in the sample analysis system may include sample analyzers according to embodiments of the present invention.

[0123] Similarly, in the sample analyzer of the sample analysis system, the preset position can be the actual position where the sampling mechanism of the sample analyzer operates on the sample. That is, the preset position can be the actual position where the injector moves the sample. The injector moves the sample to this preset position, and the sampling mechanism of the sample analyzer moves to this preset position, and then performs the corresponding operations on the sample. It should be understood that this step of the injector transporting the sample to the preset position can occur before, simultaneously with, or after the steps of the sample analyzer retrieving injector parameters from the injector's injector storage unit or retrieving analysis device parameters from the parameter storage unit; there are no restrictions on this.

[0124] In some embodiments, the controller is used to control the sample analyzer to operate on the sample at the preset position based on the injector parameters and the analysis device parameters, including:

[0125] Based on the injector error parameter in the injector parameters and the sampling movement parameter in the analysis device parameters, the movement distance of the sampling mechanism of the sample analyzer device is obtained;

[0126] The sampling mechanism is controlled to move from the initial position by the specified distance to the preset position, and the operation is performed on the sample.

[0127] In some embodiments, the movement distance includes the sum of the injector error parameter and the sampling movement parameter.

[0128] In some embodiments, the sample analysis apparatus may include a blood analysis apparatus or a smear preparation apparatus. Further, the sampling mechanism may be a sampling needle.

[0129] Specifically, similar to or the same as the sample analyzer in the embodiments of this application, when the sample analyzer analyzes the sample, the processor of the sample analyzer device can obtain the injector parameters from the injector storage unit and send them to the injector to control the injector to transport the sample to a preset position based on the injector parameters; the processor of the sample analyzer device also obtains the sampling movement parameter D1 from the device storage unit, and combines it with the injector parameters obtained from the injector storage unit to obtain the movement distance that the sampling mechanism needs to perform, that is, the movement distance of the sampling mechanism can be the sum of the injector error parameter Δd2 and the sampling movement parameter D1, i.e., D1+Δd2, and then controls the sampling mechanism to move from its initial position to D1+Δd2, to the preset position where the injector delivers the sample, and then the sampling mechanism performs corresponding operations on the sample, such as sampling and / or mixing.

[0130] It should be understood that the parameters of the injector and the analytical device parameters of the sample analyzer can be obtained through the relevant methods in the sample analyzer of the foregoing embodiments of this application (such as...). Figure 2 and Figure 3 The specific principles and processes are not repeated here.

[0131] Optionally, the track master control device may include a CPU, GPU, or other chips with computing capabilities. In practical applications, the processor can be implemented through software, hardware, firmware, or a combination thereof, and may be at least one of the following: circuit, single or multiple application-specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field-programmable gate arrays (FPGAs), central processing units (CPUs), controllers, microcontrollers, or microprocessors.

[0132] In practical applications, the injector and / or track control unit of the sample analyzer may malfunction, requiring the replacement of certain components of the injector, the injector itself, or the track control unit. In existing technologies, because the injector and sample analyzer unit, and multiple sample analyzers with the track control unit, need to be used in conjunction, replacing the injector and then using the same parameters as before can lead to an abnormal state in the entire sample analysis system. Only after recalibrating the replaced injector can it function properly, causing significant inconvenience to sample analysis and reducing installation and analysis efficiency.

[0133] Optionally, based on the above considerations, the orbital master control device can also be used to store the injector parameters as backup data.

[0134] The track master control device can correspond to multiple sample analyzers, storing the injector parameters of these multiple injectors as backup data. When the track master control device detects a discrepancy between the injector parameters stored in the injector and the corresponding backup data stored in the track master control device, it synchronizes the corresponding injector parameters and backup data to ensure consistency. Therefore, even if some components or the entire injector are replaced, the current injector parameters can be directly obtained through the track master control device, eliminating the need to adjust the injector parameters using appropriate fixtures, thus further improving the working efficiency of the sample analyzer.

[0135] In some embodiments, the sample analysis system may include a first sample analyzer and a second sample analyzer arranged in series. The first sample analyzer includes a first injector and a first sample analyzer device, and the first injector's injection storage unit stores first injector parameters. The second sample analyzer includes a second injector and a second sample analyzer device, and the second injector's injection storage unit stores second injector parameters. Accordingly, the track master control device may obtain and store the first injector parameters from the first injector's injection storage unit as first backup data, and obtain and store the second injector parameters from the second injector's injection storage unit as second backup data. The first backup data corresponds to the first sample analyzer (or the first injector), and the second backup data corresponds to the second sample analyzer (or the second injector). In some embodiments, the backup data may have a corresponding number for the sample analyzer or injector to indicate the correspondence between the backup data and the sample analyzer or injector.

[0136] In some embodiments, the orbital master control device is further configured to: obtain the currently stored injector parameters in the sample storage unit, and compare whether the currently stored injector parameters are consistent with the backup data.

[0137] Specifically, when the sample analyzer is started (i.e., powered on), the track master control device can obtain the current injector parameters in the sample analyzer's injector and compare them with the corresponding backup data stored in the track master control device. If they match, it indicates that neither the injector nor the track master control device has changed. If they do not match, it indicates that at least some components in the injector or the track master control device has been replaced. At this time, the track master control device can notify the operator that at least some components in the injector or the track master control device have changed, for example, by sound and / or light. When the track master control device confirms that there are no injector parameters in the sample analyzer's injector, or that it does not have backup data corresponding to the injector parameters, it can directly send the corresponding backup data to the injector for storage as injector parameters or store the injector parameters in the track master control device as backup data. This ensures synchronization between the injector parameters and the corresponding backup data in the injector and the track master control device, which is beneficial for improving the upgrade efficiency of the sample analysis system.

[0138] In some embodiments, the track master control device is further configured to:

[0139] When the backup data is not present in the orbital master control device, the corresponding injector parameters are acquired and stored in the orbital master control device as the backup data; or...

[0140] When the injector parameter is not present in the injector, the backup data is sent to the corresponding injector storage unit and stored as the injector parameter.

[0141] When comparing the injector parameters in the injector with the corresponding backup data stored in the main track control device, the main track control device may find that the injector does not contain injector parameters or does not have corresponding backup data. In this case, if the main track control device does not have the backup data but the injector contains injector parameters, the main track control device can obtain the injector parameters and store them as backup data; if the injector does not contain injector parameters but the main track control device contains backup data, the main track control device will send the backup data to the injector storage unit to store it as injector parameters.

[0142] In some embodiments, the track master control device is further configured to:

[0143] When the currently stored injector parameters are consistent with the backup data, the orbital master control device sends the injector parameters to the injector;

[0144] or,

[0145] When the currently stored injector parameters are inconsistent with the backup data, the orbital master control device sends the operation command to the injector based on the operator's instructions.

[0146] In some embodiments, the operator can indicate the cause of data inconsistency via operator instructions. Furthermore, the track master control device can also provide the operator with corresponding options, each corresponding to a different cause of data inconsistency. At this time, the operator can select the appropriate option to issue the operator instruction based on the actual situation. Specifically, see [link to documentation]. Figure 6 , Figure 6 Another example of operator instructions according to an embodiment of this application is shown. For example... Figure 6 As shown, operator commands can instruct the i-th sample analyzer or i-th injector (or the ID number of the sample analyzer or injector) in the sample analysis system to replace the injector storage unit, replace the injector, or replace the track master control device. After the operator selects according to the actual situation, the corresponding operator command is sent to the track master control device, which responds differently to different operator commands.

[0147] In some embodiments, the orbital master control device sends the operation command to the sampler based on operator instructions, including:

[0148] When the operator instructs the injector storage unit to be replaced, the operation instruction includes the track master control device sending the injector parameters to the injector and storing them in the injector storage unit;

[0149] When the operator instructs the injector to be replaced, the operation instruction includes the track master control device acquiring the injector parameters of the replaced injector and storing them in the parameter storage unit;

[0150] When the operator instructs the track master control device to be replaced, the operation instruction includes the replaced track master control device obtaining the injector parameters from the injector storage unit and storing them in the replaced track master control device.

[0151] If the operator instructs the sample storage unit to be replaced, but the injector remains unchanged, the injector parameters can be restored from the corresponding backup data stored in the orbital master control device. That is, after receiving the operator's instruction, the orbital master control device sends backup data to the injector in response to the operator's instruction. The corresponding injector receives the backup data and stores it locally as its injector parameters. If the operator instructs the injector to be replaced, the replaced injector will have the replaced injector parameters. Upon receiving the operator's instruction, the orbital master control device requests the replaced injector's parameters from the replaced injector in response to the operator's instruction and continues to back them up as backup data. If the operator instructs the orbital master control device to be replaced, the replaced orbital master control device, upon receiving the operator's instruction, requests multiple injector parameters from multiple injectors in response to the instruction and stores them accordingly as backup data. This allows for seamless replacement of injector components, injectors, or track control units without the need for adjusting injector parameters using fixtures or recalibrating the entire sample analysis system. Recovery can be achieved directly from the injector or its control unit, further enhancing the system's efficiency. Furthermore, when replacing multiple injectors or their components, multiple sample analyzers or injectors can operate in parallel, further improving production efficiency and the overall system's performance.

[0152] In the above embodiments, when the operator selects to replace the injector, that is, when the operator instructs the entire injector to be replaced, under the premise of meeting the working requirements, it is not necessary to measure the replaced injector to obtain the parameters of the replaced injector. Instead, the track master control device directly sends the corresponding backup data to the replaced injector and stores it as the injector parameters.

[0153] In some embodiments, taking the example of a sample analysis system including a first sample analyzer and a second sample analyzer arranged in series, the sample analysis system of this application will be described. The sample analysis system includes:

[0154] The first sample analyzer includes a first injector and a first sample analyzer device. The first injector is used to transport a sample to a first preset position and includes a first injection storage unit for storing injector parameters. The first sample analyzer device is connected to the first injector and includes a first controller and a first parameter storage unit for storing analyzer parameters. The first controller is used to control the first sample analyzer device to operate on the sample at the first preset position based on the first injector parameters and the first analyzer parameters.

[0155] The second sample analyzer includes a second injector and a second sample analyzer device. The second injector is used to transport the sample to a second preset position and includes a second injection storage unit for storing injector parameters. The second sample analyzer device is connected to the second injector and includes a second controller and a second parameter storage unit for storing analysis device parameters. The second controller is used to control the second sample analyzer device to operate on the sample at the second preset position based on the second injector parameters and the second analysis device parameters.

[0156] The track includes a first track connected to a first injector for transporting a sample to the first injector; and a second track connected between the first injector and the second injector for transporting a sample to the second injector.

[0157] The track control unit is connected to the track, the first sampler, and the second sampler, and is used to control the operation of the track, the first sampler, and the second sampler.

[0158] The track control device can control the first track to transport the sample to the first injector of the first sample analyzer based on the corresponding first track parameters. The first controller of the first sample analyzer obtains the first injector parameters from the first injector storage unit and sends them to the first injector to control the first injector to move the sample to the first preset position. The first controller also obtains the first analysis device parameters from the first parameter storage unit, and obtains the first moving distance of the first sampling mechanism of the first sample analyzer based on the first injector error parameter in the first injector parameters and the first sampling movement parameter in the first analysis device parameters. The controller controls the first sampling mechanism to move the first moving distance from its initial position to the first preset position and performs the first operation on the sample.

[0159] The first controller controls the sample that has undergone the first operation to move to the second track. The track master control device can control the second track to transport the sample to the second sample injector of the second sample analyzer based on the corresponding second track parameters.

[0160] The second controller of the second sample analyzer acquires the second injector parameters from the second injector storage unit and sends them to the second injector, controlling the second injector to move the sample to the second preset position. The second controller also acquires the second analysis device parameters from the second parameter storage unit, and based on the second injector error parameter in the second injector parameters and the second sampling movement parameter in the second analysis device parameters, obtains the second moving distance of the second sampling mechanism of the second sample analyzer device. The controller then controls the second sampling mechanism to move the second moving distance from its initial position to the second preset position and performs a second operation on the sample.

[0161] In some of the above embodiments, the track may further include a third track connected to the second sample analyzer, used to move the sample that has undergone the second operation to a designated location. The designated location may be a buffer location or a location where sample analysis ends; no limitation is made here.

[0162] In some of the above embodiments, since different samples require different analytical operations, some samples may not need to undergo the first operation. In this case, the track master control device can also control the first track and the second track to directly transport the sample to the second injector of the second sample analyzer based on the corresponding first track parameters and second track parameters, without going through the first operation of the first sample analyzer (i.e., skipping the first sample analyzer). Similarly, after the sample is transported to the second injector of the second sample analyzer, the second controller of the second sample analyzer obtains the second injector parameters from the second injector storage unit and sends them to the second injector, controlling the second injector to move the sample to the second preset position. The second controller also obtains the second analysis device parameters from the second parameter storage unit, and based on the second injector error parameter in the second injector parameters and the second sampling movement parameter in the second analysis device parameters, obtains the second moving distance of the second sampling mechanism of the second sample analyzer device. The controller controls the second sampling mechanism to move the second moving distance from its initial position to the second preset position and performs the second operation on the sample.

[0163] In some of the above embodiments, the track master control device can obtain the first sampler parameters from the sample storage unit of the first sampler and store them as first backup data; and obtain the second sampler parameters from the sample storage unit of the second sampler and store them as second backup data.

[0164] In some of the above embodiments, when the first (or second) sample analyzer is started (i.e., powered on), the track master control device acquires the current first (or second) injector parameters of the first (or second) injector of the first (or second) sample analyzer and compares them with the corresponding first (or second) backup data stored in the track master control device. If the two are consistent, the track master control device sends the first (or second) injector parameters to the first (or second) injector to control the first (or second) injector to transport the sample to the first (or second) preset position. If the two are inconsistent, the track master control device provides the operator with corresponding options, each option corresponding to a different reason for the data inconsistency. The operator selects the appropriate option according to the actual situation to issue operator instructions, including:

[0165] If the operator instructs the replacement of the first (or second) injection storage unit, the first (or second) injector parameters can be restored from the corresponding first (or second) backup data stored in the track master device. That is, after receiving the operator's instruction, the track master device sends the first (or second) backup data to the first (or second) injector in response to the operator's instruction. After receiving the first (or second) backup data, the corresponding first (or second) injector stores it locally as its first (or second) injector parameters.

[0166] If the operator instructs the replacement of the first (or second) injector, the new first (or second) injector will have new first (or second) injector parameters. After receiving the operator's instruction, the orbital master control device will request the new first (or second) injector parameters from the new first injector in response to the operator's instruction, and continue to back them up as the first (or second) backup data.

[0167] If the operator instructs the track master control device to be replaced, the replaced track master control device, upon receiving the operator's instruction, requests the first injector and the second injector parameters from the first injector and the second injector, and stores them as first backup data and second backup data accordingly.

[0168] In this way, after replacing any component of the injector, the injector itself, or the main control unit of the track, the sample analysis system does not require adjusting the corresponding parameters of the injector with fixtures, nor does it require re-tuning the entire sample analysis system. It can be directly restored from the injector or the injector main control unit, greatly reducing the workload of the operator and improving the efficiency of the sample analysis system. Furthermore, when replacing multiple injectors or components of injectors, multiple corresponding sample analyzers or multiple injectors can work in parallel, further improving production efficiency and the overall efficiency of the sample analysis system.

[0169] Therefore, the sample analysis device and system according to the embodiments of this application, by storing the injector parameters at the injector end and the analysis device parameters at the sample analyzer end, achieves decoupling between the injector and the sample analyzer, enabling any injector to be used in combination with any sample analyzer, reducing installation requirements and improving the flexibility of installation, instrument and injector matching.

[0170] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0171] In the several embodiments provided in this application, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another device, or some features may be ignored or not executed.

[0172] Numerous specific details are set forth in the specification provided herein. However, it will be understood that embodiments of this application may be practiced without these specific details. In some instances, well-known methods, structures, and techniques have not been shown in detail so as not to obscure the understanding of this specification.

[0173] Similarly, it should be understood that, in order to simplify this application and aid in understanding one or more aspects of the application, various features of this application may sometimes be grouped together in a single embodiment, figure, or description thereof in the description of exemplary embodiments of this application. However, this approach should not be construed as reflecting an intention that the claimed application requires more features than are expressly recited in each claim. Rather, as reflected in the corresponding claims, the point of application is that the corresponding technical problem can be solved with fewer features than all of a single disclosed embodiment. Therefore, the claims following the detailed description are hereby expressly incorporated into that detailed description, wherein each claim itself is a separate embodiment of this application.

[0174] Those skilled in the art will understand that, apart from the mutual exclusion of features, all features disclosed in this specification (including the accompanying claims, abstract, and drawings) and all processes or units of any method or apparatus so disclosed can be combined in any combination. Unless otherwise expressly stated, each feature disclosed in this specification (including the accompanying claims, abstract, and drawings) may be replaced by an alternative feature that serves the same, equivalent, or similar purpose.

[0175] Furthermore, those skilled in the art will understand that although some embodiments described herein include certain features but not others included in other embodiments, combinations of features from different embodiments are intended to be within the scope of this application and form different embodiments. For example, in the claims, any one of the claimed embodiments can be used in any combination.

[0176] It should be noted that the above embodiments are illustrative of this application and not restrictive, and that those skilled in the art can devise alternative embodiments without departing from the scope of the appended claims. In the claims, any reference signs placed between parentheses should not be construed as limiting the claims. The word "comprising" does not exclude the presence of elements or steps not listed in the claims. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements. This application can be implemented by means of hardware comprising several different elements and by means of a suitably programmed computer. In the unit claims enumerating several means, several of these means may be embodied by the same item of hardware. The use of the words first, second, and third, etc., does not indicate any order. These words can be interpreted as names.

[0177] The above description is merely a specific embodiment or illustration of the embodiments of this application. The scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. The scope of protection of this application shall be determined by the scope of the claims.

Claims

1. A sample analyzer, characterized in that, The sample analyzer includes: An injector is used to transport a sample to a preset position. The injector includes an injector storage unit for storing injector parameters, including injector error parameters. The injector error parameters are obtained based on the actual distance parameter from the reference position of the sample analysis device to the first position and the theoretical distance parameter. A sample analysis device is used to perform analysis operations on samples at the preset position. The sample analysis device includes a parameter storage unit for storing analysis device parameters and a processor. The analysis device parameters include sampling movement parameters, which are the sum of theoretical distance parameters for the sampling mechanism to move from its initial position to the preset position and device error parameters. When the processor executes one or more programs, it performs the following steps: The injector parameters are obtained from the injector storage unit, and the analytical device parameters are obtained from the parameter storage unit; Based on the injector parameters and the analytical device parameters, the sample analysis device is controlled to operate on the sample; the control of the sample analysis device to operate on the sample based on the injector parameters and the analytical device parameters includes: Based on the injector error parameters and the sampling movement parameters, the movement distance of the sampling mechanism of the sample analysis device is obtained; The sampling mechanism is controlled to move from its initial position by the specified distance to the preset position, and the sample is then manipulated.

2. The sample analyzer according to claim 1, characterized in that, The parameter storage unit is also used to store the injector parameters as backup data.

3. The sample analyzer according to claim 2, characterized in that, The processor is also configured to: compare whether the backup data is consistent with the injector parameters currently stored in the injector.

4. The sample analyzer according to claim 3, characterized in that, The processor is further configured to: send the injector parameters to the injector when the backup data matches the injector parameters currently stored in the injector; or, When the backup data is inconsistent with the injector parameters currently stored in the injector, an operation command is sent to the injector based on the operator's instructions.

5. The sample analyzer according to claim 4, characterized in that, When the backup data is inconsistent with the injector parameters currently stored in the injector, an operation instruction is sent to the injector based on operator instructions, including: When the operator instruction instructs the injector storage unit to be replaced, the operation instruction includes the processor sending the injector parameters to the injector and storing them in the injector storage unit; When the operator instruction instructs the injector to be replaced, the operation instruction includes the processor acquiring the injector parameters of the replaced injector and storing them in the parameter storage unit; When the operator instruction instructs the parameter storage unit to be replaced, the operation instruction includes the processor retrieving the injector parameters from the injector storage unit and storing them in the replaced parameter storage unit.

6. The sample analyzer according to claim 3, characterized in that, The processor is also used for: When the backup data is not present in the parameter storage unit, the injector parameters are acquired and stored in the parameter storage unit as the backup data; or, When the injector parameter is not present in the injector, the backup data is sent to the injector storage unit and stored as the injector parameter.

7. A sample analysis system, characterized in that, The system includes: Multiple sample analyzers arranged in series, each of the sample analyzers comprising: A sample injector is used to transport a sample to a preset position. The sample injector includes a sample injector storage unit for storing sample injector parameters, including sample injector error parameters. The sample injector error parameters are obtained based on the actual distance parameter from the reference position of the sample analysis device to the first position and the theoretical distance parameter. A sample analysis device is connected to the injector. The sample analysis device includes a controller and a parameter storage unit for storing analysis device parameters. The controller is used to control the sample analysis device to operate on the sample at the preset position based on the injector parameters and the analysis device parameters. The analysis device parameters include sampling movement parameters, which are the sum of a theoretical distance parameter for the sampling mechanism to move from its initial position to the preset position and a device error parameter. A track, connected to the injector, is used to transport the sample to the injector; A track control device, connected to the track and the injector, is used to control the operation of the track and the injector; The controller is used to control the sample analysis device to operate on the sample at the preset position based on the injector parameters and the analysis device parameters, including: Based on the injector error parameters and the sampling movement parameters, the movement distance of the sampling mechanism of the sample analysis device is obtained; The sampling mechanism is controlled to move from its initial position by the specified distance to the preset position, and the sample is then manipulated.

8. The system according to claim 7, characterized in that, The track master control device is also used to store the injector parameters as backup data.

9. The system according to claim 8, characterized in that, The track master control device is also used to: obtain the currently stored injector parameters in the injector storage unit, and compare whether the currently stored injector parameters are consistent with the backup data.

10. The system according to claim 9, characterized in that, The track control device is also used for: When the currently stored injector parameters are consistent with the backup data, the orbital master control device sends the injector parameters to the injector; or, When the currently stored injector parameters are inconsistent with the backup data, the orbital master control device sends an operation command to the injector based on the operator's instructions.

11. The system according to claim 10, characterized in that, The orbital master control device sends the operation instructions to the sampler based on the operator's instructions, including: When the operator instructs the injector storage unit to be replaced, the operation instruction includes the track master control device sending the injector parameters to the injector and storing them in the injector storage unit; When the operator instructs the injector to be replaced, the operation instruction includes the track master control device acquiring the injector parameters of the replaced injector and storing them in the parameter storage unit; When the operator instructs the track master control device to be replaced, the operation instruction includes the replaced track master control device obtaining the injector parameters from the injector storage unit and storing them in the replaced track master control device.

12. The system according to claim 9, characterized in that, The track control device is also used for: When the backup data is not present in the orbital master control device, the sampler parameters are acquired and stored in the orbital master control device as the backup data; or... When the injector parameter is not present in the injector, the backup data is sent to the injector storage unit and stored as the injector parameter.

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