Electrical field sensor array structure, voltage detection system and method

Abstract

The application relates to an electric field sensor array structure, a voltage detection system and a method. The electric field sensor array structure comprises: a first electric field sensor for measuring the electric field intensity of an environment; a second electric field sensor for measuring the electric field intensity of the environment; and a third electric field sensor for measuring the electric field intensity of the environment; wherein the first electric field sensor, the second electric field sensor and the third electric field sensor are respectively located at three vertices of the same equilateral triangle, and the first electric field sensor, the second electric field sensor and the third electric field sensor are arranged on the periphery of a to-be-measured conductor so that the to-be-measured conductor passes through the equilateral triangle; and a sensitive direction of each electric field sensor is parallel to the direction of a line connecting the point where the corresponding electric field sensor is located and the center of gravity of the equilateral triangle. When the electric field sensor array structure is used for measurement, there is no special requirement for the installation position, the electric field sensor array structure is easy to install, the line structure of the to-be-measured conductor does not need to be damaged, and the electric field sensor array structure is convenient to use.

Description

Technical Field

[0001] This application relates to the field of voltage detection technology, and in particular to an electric field sensor array structure, voltage detection system and method. Background Technology

[0002] As an essential input variable for power systems to achieve optimized operation, control, and protection functions, conductor potential is one of the common items that requires large-scale testing.

[0003] Currently, measuring conductor potential employs either access-based methods such as voltage transformers, Hall effect-based voltage sensors, or fiber optic voltage sensors, or non-access-based methods using MEMS-based electric field sensors. However, the former requires connection to the circuit under test, which is inconvenient to install, has high insulation requirements, and the voltage transformer carries a core or magnetic core, making it quite bulky. While the latter does not require connection to the circuit under test and does not have a core or magnetic core, the relative position of the electric field sensor and the conductor under test must be fixed during measurement, placing extremely high demands on installation and rendering it impractical. Summary of the Invention

[0004] Therefore, it is necessary to provide an electric field sensor array structure, voltage detection system, and method that can achieve non-contact measurement and has low installation requirements to address the above-mentioned technical problems.

[0005] In a first aspect, this application provides an electric field sensor array structure. The electric field sensor array structure includes:

[0006] The first electric field sensor is used to measure the electric field strength of the surrounding environment;

[0007] The second electric field sensor is used to measure the electric field strength of the surrounding environment;

[0008] The third electric field sensor is used to measure the electric field strength of the surrounding environment;

[0009] The first, second, and third electric field sensors are located at the three vertices of the same equilateral triangle, and are positioned around the conductor under test so that the conductor passes through the equilateral triangle. One sensitive direction of the first electric field sensor is parallel to the line connecting the point where the first electric field sensor is located and the centroid of the equilateral triangle; one sensitive direction of the second electric field sensor is parallel to the line connecting the point where the second electric field sensor is located and the centroid of the equilateral triangle; and one sensitive direction of the third electric field sensor is parallel to the line connecting the point where the third electric field sensor is located and the centroid of the equilateral triangle.

[0010] When the above-mentioned electric field sensor array structure is used to test the conductor under test, only the first electric field sensor T1, the second electric field sensor T2, and the third electric field sensor T3 need to be placed around the conductor under test. Therefore, there are no special requirements for the installation position of the electric field sensor array structure, making it highly practical. Moreover, it adopts a non-contact measurement method, which does not require damage to the circuit structure of the conductor under test, making it convenient to use. In addition, it does not require carrying an iron core or magnetic core, and its size and weight are relatively small and relatively light, making it easy to install.

[0011] In one embodiment, the electric field sensor further includes: a structure with a notch in the middle, wherein the first electric field sensor, the second electric field sensor and the third electric field sensor are disposed in the structure and are respectively located around the notch, and the structure is used to limit and fix the first electric field sensor, the second electric field sensor and the third electric field sensor so that the first electric field sensor, the second electric field sensor and the third electric field sensor are respectively located at the three vertices of the same equilateral triangle.

[0012] Secondly, this application provides a voltage detection system. The voltage detection system includes an electric field sensor array structure and a processing module as described above. The processing module is connected to the electric field sensor array structure and is used to acquire measurement data from the first, second, and third electric field sensors, as well as the distance between any one of the first, second, and third electric field sensors and the centroid of the equilateral triangle. It also acquires the radius of the conductor under test and the distance between the conductor under test and a preset zero-potential reference point, and calculates the potential difference of the conductor under test relative to the zero-potential reference point based on the acquired data.

[0013] The advantages of this voltage detection system over existing technologies are the same as those of the electric field sensor array structure mentioned above, and will not be repeated here.

[0014] In one embodiment, the voltage detection system further includes: an input module connected to the processing module, for receiving externally input data including the radius of the conductor under test and the distance between the conductor under test and a preset zero-potential reference point, and sending the received data to the processing module; or

[0015] The processing module includes an input unit that receives external input to obtain the radius of the conductor under test and the distance between the conductor under test and a preset zero potential reference point.

[0016] In one embodiment, the processing module includes:

[0017] The first processing unit is used to take the distance between any one of the first electric field sensor, the second electric field sensor, and the third electric field sensor and the centroid of the equilateral triangle as a first distance, and substitute the acquired measurement data and the first distance into a preset iterative relationship to obtain a target iterative relationship.

[0018] The second processing unit is used to obtain the initial value of the iteration variable, substitute the initial value of the iteration variable into the target iterative relation to perform iterative solution until the preset iteration exit condition is met, and obtain the final iteration variable.

[0019] The calculation unit is used to calculate the voltage of the wire under test by substituting the final obtained iterative variable, the second distance, and the radius of the wire under test into a preset measurement relationship, using the distance between the wire under test and the zero potential reference point as the second distance.

[0020] In one embodiment, the preset iterative relation is:

[0021] ;

[0022] in,

[0023] ,

[0024] ;

[0025] ;

[0026] In the above formula, This represents the measured value of the first electric field sensor. This represents the measured value of the second electric field sensor. This represents the measured value of the third electric field sensor. This represents the distance between any one of the first, second, and third electric field sensors and the centroid of the equilateral triangle. Indicates the number of iterations. This represents the distance between the intersection point of the conductor to be measured and the equilateral triangle, and the centroid of the equilateral triangle. The angle formed by the point where the first electric field sensor is located, the centroid of the equilateral triangle, and the intersection of the wire to be tested and the equilateral triangle is represented.

[0027] The preset measurement formula is:

[0028] , ;

[0029] in, This represents the potential on the surface of the conductor under test. This indicates the radius of the conductor to be measured. This indicates the distance between the conductor under test and the preset zero potential reference point.

[0030] Thirdly, this application provides a voltage detection method, the method comprising:

[0031] Provide the electric field sensor array structure as described above;

[0032] The electric field sensor array structure is placed around the conductor under test, so that the conductor under test passes through the electric field sensor array structure.

[0033] Acquire measurement data from the first electric field sensor, the second electric field sensor, and the third electric field sensor, as well as the distance between any one of the first electric field sensor, the second electric field sensor, and the third electric field sensor and the centroid of the equilateral triangle;

[0034] Obtain the radius of the conductor under test and the distance between the conductor under test and a preset zero potential reference point;

[0035] The potential difference between the conductor under test and the zero potential reference point is calculated based on the acquired data.

[0036] The advantages of this voltage detection method over existing technologies are the same as those of the voltage detection system described above, and will not be repeated here.

[0037] In one embodiment, obtaining the radius of the conductor under test and the distance between the conductor under test and a preset zero-potential reference point includes:

[0038] Receive external input to obtain the radius of the conductor under test and the distance between the conductor under test and a preset zero potential reference point.

[0039] In one embodiment, calculating the potential difference between the conductor under test and the zero-potential reference point based on the acquired data includes:

[0040] The distance between any one of the first electric field sensor, the second electric field sensor, and the third electric field sensor and the centroid of the equilateral triangle is taken as the first distance. The acquired measurement data and the first distance are substituted into a preset iterative relationship to obtain the target iterative relationship.

[0041] Obtain the initial value of the iteration variable, substitute the initial value of the iteration variable into the target iteration relation and iterate until the preset iteration exit condition is met, and obtain the final iteration variable;

[0042] Using the distance between the conductor under test and the zero potential reference point as the second distance, the final obtained iterative variable, the second distance, and the radius of the conductor under test are substituted into a preset measurement relationship to calculate the voltage of the conductor under test.

[0043] In one embodiment, the preset iterative relation is:

[0044] ;

[0045] in,

[0046] ,

[0047] ;

[0048] ;

[0049] In the above formula, This represents the measured value of the first electric field sensor. This represents the measured value of the second electric field sensor. This represents the measured value of the third electric field sensor. This represents the distance between any one of the first, second, and third electric field sensors and the centroid of the equilateral triangle. Indicates the number of iterations. This represents the distance between the intersection point of the conductor to be measured and the equilateral triangle, and the centroid of the equilateral triangle. The angle formed by the point where the first electric field sensor is located, the centroid of the equilateral triangle, and the intersection of the wire to be tested and the equilateral triangle is represented.

[0050] The preset measurement formula is:

[0051] , ;

[0052] in, This represents the potential on the surface of the conductor under test. This indicates the radius of the conductor to be measured. This indicates the distance between the conductor under test and the preset zero potential reference point. Attached Figure Description

[0053] Figure 1 This is a schematic diagram of the electric field sensor array structure in one embodiment;

[0054] Figure 2 This is a schematic diagram of the voltage detection system in one embodiment;

[0055] Figure 3 This is a schematic diagram of the voltage detection system in another embodiment;

[0056] Figure 4 This is an internal structure diagram of a computer device in one embodiment;

[0057] Figure 5 This is a schematic flowchart of a voltage detection method in one embodiment. Detailed Implementation

[0058] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0059] It is understood that the terms “first,” “second,” etc., used in this application may be used herein to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish one element from another.

[0060] Spatial relation terms such as “below,” “under,” “below,” “under,” “above,” “above,” etc., are used herein to describe the relationship between one element or feature shown in the figure and other elements or features. It should be understood that, in addition to the orientation shown in the figure, spatial relation terms also include different orientations of the device in use and operation. For example, if the device in the figure is flipped, the element or feature described as “below,” “under,” or “below” will be oriented “above” the other element or feature. Therefore, the exemplary terms “below” and “under” can include both above and below orientations. Furthermore, the device may also include other orientations (e.g., rotated 90 degrees or other orientations), and the spatial descriptive terms used herein will be interpreted accordingly.

[0061] It should be noted that when one element is considered to be "connected" to another element, it can be directly connected to the other element or connected to the other element through an intermediary element. Furthermore, in the following embodiments, "connection" should be understood as "electrical connection," "communication connection," etc., if there is transmission of electrical signals or data between the connected objects.

[0062] When used herein, the singular forms of “a,” “an,” and “the” may also include the plural forms unless the context clearly indicates otherwise. It should also be understood that the terms “comprising,” “including,” or “having,” etc., specify the presence of the stated feature, whole, step, operation, component, part, or combination thereof, but do not preclude the possibility of the presence or addition of one or more other features, wholes, steps, operations, components, parts, or combinations thereof.

[0063] In one embodiment, such as Figure 1 As shown, this application provides an electric field sensor array structure, which includes:

[0064] The first electric field sensor T1 is used to measure the electric field strength of the surrounding environment;

[0065] The second electric field sensor T2 is used to measure the electric field strength of the surrounding environment.

[0066] The third electric field sensor T3 is used to measure the electric field strength of the surrounding environment;

[0067] The first electric field sensor T1, the second electric field sensor T2, and the third electric field sensor T3 are located at the three vertices of the same equilateral triangle, and are positioned around the conductor to be tested so that the conductor passes through the equilateral triangle. One sensitive direction of the first electric field sensor T1 is parallel to the line connecting the point where the first electric field sensor T1 is located and the centroid O of the equilateral triangle. One sensitive direction of the second electric field sensor T2 is parallel to the line connecting the point where the second electric field sensor T2 is located and the centroid O of the equilateral triangle. One sensitive direction of the third electric field sensor T3 is parallel to the line connecting the point where the third electric field sensor T3 is located and the centroid O of the equilateral triangle.

[0068] When the above-mentioned electric field sensor array structure is used to test the conductor under test, only the first electric field sensor T1, the second electric field sensor T2, and the third electric field sensor T3 need to be placed around the conductor under test. Therefore, there are no special requirements for the installation position of the electric field sensor array structure, making it highly practical. Moreover, it adopts a non-contact measurement method, which does not require damage to the circuit structure of the conductor under test, making it convenient to use. In addition, it does not require carrying an iron core or magnetic core, and its size and weight are relatively small and relatively light, making it easy to install.

[0069] In applications, it can be understood that the distances between the first electric field sensor T1 and the second electric field sensor T2, the distances between the second electric field sensor T2 and the third electric field sensor T3, and the distances between the first electric field sensor T1 and the third electric field sensor T3 may not be exactly the same, and there may be certain differences between each pair. However, as long as the difference between the maximum and minimum distances is within the allowable range (determined according to the actual application scenario), it can be approximately considered that the first electric field sensor T1, the second electric field sensor T2, and the third electric field sensor T3 are located at the three vertices of the same equilateral triangle. Similarly, if the angle between one magnetic sensing direction of the electric field sensor and the direction of the line connecting the point where the electric field sensor is located and the centroid O of the equilateral triangle is within the allowable range (determined according to the actual application scenario), it can also be approximately considered that one magnetic sensing direction of the electric field sensor is parallel to the direction of the line connecting the point where the electric field sensor is located and the centroid O of the equilateral triangle.

[0070] In one embodiment, the first electric field sensor T1, the second electric field sensor T2, and the third electric field sensor T3 are all micro-electromechanical system (MEMS) electric field sensors. MEMS electric field sensors have the characteristics of miniaturization, integration, intelligence, low cost, and high efficiency. Using MEMS electric field sensors for the first electric field sensor T1, the second electric field sensor T2, and the third electric field sensor T3 is beneficial to reducing the size and cost of the electric field sensor array structure.

[0071] In one embodiment, the electric field sensor further includes: a structure with a notch in the middle, wherein the first electric field sensor, the second electric field sensor and the third electric field sensor are disposed in the structure and are respectively located around the notch, and the structure is used to limit and fix the first electric field sensor, the second electric field sensor and the third electric field sensor so that the first electric field sensor, the second electric field sensor and the third electric field sensor are respectively located at the three vertices of the same equilateral triangle.

[0072] Specifically, the structure is a robust and non-deformable structure, ensuring that the relative positions of the first electric field sensor T1, the second electric field sensor T2, and the third electric field sensor T3 remain relatively stable when mounted on the structure. Furthermore, by mounting the first electric field sensor T1, the second electric field sensor T2, and the third electric field sensor T3 on the structure, installation of the electric field sensor array only requires manipulation of the structure itself, thus reducing installation difficulty.

[0073] For example, the structure includes a printed circuit board, on which a first electric field sensor T1, a second electric field sensor T2 and a third electric field sensor T3 are respectively soldered. A notch is provided in the middle of the printed circuit board for the wire to be tested to pass through.

[0074] In one embodiment, such as Figure 2 and Figure 3 As shown, this application provides a voltage detection system, which includes an electric field sensor array structure and a processing module as described above. The processing module is connected to the electric field sensor array structure and is used to acquire measurement data from the first electric field sensor, the second electric field sensor, and the third electric field sensor, as well as the distance between any one of the first electric field sensor, the second electric field sensor, and the third electric field sensor and the centroid O of the equilateral triangle. It also acquires the radius of the conductor under test and the distance between the conductor under test and a preset zero potential reference point, and calculates the potential difference of the conductor under test relative to the zero potential reference point based on the acquired data.

[0075] Among them, such as Figure 2 As shown, the processing module can be an embedded system such as a microcontroller, DSP, or FPGA. The processing module is integrated with the electric field sensor array structure and is connected to the first electric field sensor T1, the second electric field sensor T2, and the third electric field sensor T3 to obtain the electric field strength measured by each sensor. Simultaneously, the voltage detection system also includes an input module connected to the processing module. This input module receives the radius of the conductor under test and the distance between the conductor under test and a preset zero-potential reference point from external input, and sends the received data to the processing module. The processing module calculates the potential difference between the conductor under test and the zero-potential reference point based on the acquired data, thereby measuring the potential of the conductor under test. The processing module includes a processing unit and a storage unit. The storage unit stores a computer program, and the processing unit executes this computer program to perform the following steps:

[0076] Acquire the measurement data of the first electric field sensor T1, the second electric field sensor T2, and the third electric field sensor T3, as well as the distance between any one of the first electric field sensor T1, the second electric field sensor T2, and the third electric field sensor T3 and the centroid O of the equilateral triangle;

[0077] Obtain the radius of the conductor under test and the distance between the conductor under test and a preset zero potential reference point;

[0078] The potential difference between the conductor under test and the zero potential reference point is calculated based on the acquired data.

[0079] The input module can be an independent computer device, such as a personal computer, laptop, smartphone, or tablet. The input module is wirelessly connected to the electric field sensor array structure. The user inputs the radius of the conductor under test and the distance between the conductor under test and a preset zero potential reference point through the input module, and sends them to the electric field sensor array structure. When the electric field sensor array structure obtains the potential difference between the conductor under test and the zero potential reference point, it sends the obtained potential difference to the input module and displays it.

[0080] The processing module can also be a standalone computer device, such as a personal computer, laptop, smartphone, or tablet. When the processing module is a standalone computer device, such as... Figure 3 As shown, the processing module is wirelessly connected to the electric field sensor array structure. The electric field sensor array structure transmits the electric field strength measured by each electric field sensor to the processing module via wireless communication. The distance between any one of the first electric field sensor T1, the second electric field sensor T2, and the third electric field sensor T3 and the centroid O of the equilateral triangle can be predetermined and stored in the processing module, allowing the processing module to directly obtain this distance. Simultaneously, the processing module includes an input unit. Through the input unit, the processing module receives external input to obtain the radius of the conductor under test and the distance between the conductor under test and a preset zero-potential reference point. Therefore, when the processing module receives the data transmitted by the electric field sensor array structure and the externally input radius of the conductor under test and the distance between the conductor under test and the preset zero-potential reference point, it can obtain the potential difference of the conductor under test relative to the zero-potential reference point based on the received data. Understandably, when the electric field sensor array structure includes a memory, the distance between any one of the first electric field sensor T1, the second electric field sensor T2, and the third electric field sensor T3 and the centroid O of the equilateral triangle can also be pre-stored in the memory. The electric field intensity measured by each electric field sensor in the electric field sensor array structure can also be stored in the memory. When the processing module is connected to the electric field sensor array structure, the electric field sensor array structure sends the pre-stored distance and the measured data to the processing module.

[0081] When the processing module is a standalone computer device, this computer device can be a terminal, and its internal structure diagram can be as follows: Figure 4As shown. The computer device includes a processor, memory, communication interface, display screen, and input device (i.e., the input unit mentioned above) connected via a system bus. The processor provides computing and control capabilities. The memory includes a non-volatile storage medium and internal memory. The non-volatile storage medium stores the operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage medium. The communication interface of the computer device is used for wireless communication with the electric field sensor array structure, which can be achieved through Wi-Fi, mobile cellular networks, NFC (Near Field Communication), or other technologies. When the computer program is executed by the processor, it performs the following steps:

[0082] Acquire the measurement data of the first electric field sensor T1, the second electric field sensor T2, and the third electric field sensor T3, as well as the distance between any one of the first electric field sensor T1, the second electric field sensor T2, and the third electric field sensor T3 and the centroid O of the equilateral triangle;

[0083] Obtain the radius of the conductor under test and the distance between the conductor under test and a preset zero potential reference point;

[0084] The potential difference between the conductor under test and the zero potential reference point is calculated based on the acquired data.

[0085] The display screen of the computer device can be an LCD screen or an e-ink screen. The input device of the computer device can be a touch layer covering the display screen, or buttons, trackballs or touchpads set on the casing of the computer device, or external keyboards, touchpads or mice, etc.

[0086] For example, the processing module is a smartphone including a Bluetooth module, and the electric field sensor array structure also includes a Bluetooth module. The processing module and the electric field sensor array are connected via Bluetooth. The electric field sensor array structure sends the measurement data and the distance between the first electric field sensor and the equilateral triangle to the mobile phone. The mobile phone processes the received data to obtain the voltage of the conductor under test and displays it.

[0087] In one embodiment, the processing module includes:

[0088] The first processing unit is used to take the distance between any one of the first electric field sensor, the second electric field sensor, and the third electric field sensor and the centroid O of the equilateral triangle as a first distance, and substitute the acquired measurement data and the first distance into a preset iterative relationship to obtain a target iterative relationship.

[0089] The second processing unit is used to obtain the initial value of the iteration variable, substitute the initial value of the iteration variable into the target iterative relation to perform iterative solution until the preset iteration exit condition is met, and obtain the final iteration variable.

[0090] The calculation unit is used to calculate the voltage of the wire under test by substituting the final obtained iterative variable, the second distance, and the radius of the wire under test into a preset measurement relationship, using the distance between the wire under test and the zero potential reference point as the second distance.

[0091] Wherein, the iteration variable is Based on the actual working environment, the conductor under test is usually located in Figure 2 Near point O, i.e. Based on this, the initial value of the iteration variable is set to... .

[0092] In one embodiment, the preset iterative relation is:

[0093] ;

[0094] in,

[0095] ,

[0096] ;

[0097] ;

[0098] In the above formula, This represents the measured value of the first electric field sensor. This represents the measured value from the second electric field sensor. This represents the measured value of the third electric field sensor. This represents the distance between any one of the first, second, and third electric field sensors and the centroid O of the equilateral triangle. Indicates the number of iterations. This represents the distance between the intersection point S of the conductor to be measured and the equilateral triangle, and the centroid O of the equilateral triangle. The angle is defined by the point where the first electric field sensor is located, the centroid O of the equilateral triangle, and the intersection S of the wire to be tested and the equilateral triangle.

[0099] Among them, a solution threshold can be set. As an iteration exit condition, an upper limit N for the number of iterations can also be set, and a solution threshold can also be set simultaneously. Both the upper limit of the number of iterations N and the upper limit of the number of iterations are used as the conditions for exiting the iteration, when the conditions are met. Alternatively, iteration may stop when the number of iterations n reaches N. Threshold The upper limit of the number of iterations N can be determined based on actual circumstances, such as by obtaining it through experiments based on actual operation. In this embodiment, 10 -3 , It can be set to 10 -3 10 -4 10 -5 etc., preferably 10 -4 The maximum number of iterations N is ≥ 7, and can be set to 8, 9, 10, 11, 12, etc., with 10 being the preferred number.

[0100] The preset measurement formula is:

[0101] , ;

[0102] in, This represents the potential on the surface of the conductor under test. This indicates the radius of the conductor to be measured. This represents the distance between the conductor under test and the preset zero-potential reference point. After iterative calculation using the methods described above, the following was obtained: and The value of is obtained by substituting the final iterative variable into the preset measurement relationship. The value of is the potential on the surface of the conductor under test, which is also the potential difference relative to the zero potential reference point.

[0103] In application, the process of obtaining the iterative relation is as follows:

[0104] Assuming the long straight conductor is uniformly charged with charge λ per unit length, according to Gauss's law, the electric field strength at a distance x from the line is:

[0105] (1)

[0106] Where ε0 represents the vacuum dielectric constant.

[0107] Select a point outside the conductor as the potential reference point. The distance between the zero potential reference point and the conductor is x0. Assuming the radius of the conductor is r, the surface potential of the conductor can be obtained by integrating from the potential reference point to the surface of the conductor:

[0108] (2)

[0109] Combining equations (1) and (2), the relationship between the surface potential of the conductor and the electric field strength can be obtained as follows:

[0110] (3)

[0111] like Figure 1 As shown, when the first electric field sensor T1, the second electric field sensor T2, and the third electric field sensor T3 are located at the three vertices of the same equilateral triangle, and the first electric field sensor T1, the second electric field sensor T2, and the third electric field sensor T3 are placed around the conductor to be tested so that the conductor to be tested passes through the equilateral triangle, one sensitive direction of the first electric field sensor T1 is parallel to the line connecting the point where the first electric field sensor T1 is located and the centroid O of the equilateral triangle, one sensitive direction of the second electric field sensor T2 is parallel to the line connecting the point where the second electric field sensor T2 is located and the centroid O of the equilateral triangle, and one sensitive direction of the third electric field sensor T3 is parallel to the line connecting the point where the third electric field sensor T3 is located and the centroid O of the equilateral triangle, and point S is the intersection point S of the conductor to be tested and the equilateral triangle, the electric field strength of the environment where each electric field sensor is located can be obtained according to formula (3):

[0112] (4)

[0113] (5)

[0114] (6)

[0115] Based on geometric relationships, we can obtain:

[0116] (7)

[0117] (8)

[0118] (9)

[0119] (10)

[0120] (11)

[0121] (12)

[0122] (13)

[0123] (14)

[0124] For ease of calculation, let Simplifying by combining (4) and (14), we get:

[0125] (15)

[0126] (16)

[0127] (17)

[0128] Further simplification:

[0129] (18)

[0130] (19)

[0131] From formula (18), we get:

[0132] (20)

[0133] From formula (19), we get:

[0134] (twenty one)

[0135] according to Substituting equation (20) into this equation, we get:

[0136] (twenty two)

[0137] Based on equation (22), we obtain:

[0138] (twenty three)

[0139] Combining equations (20) and (21), and transforming them, we get:

[0140] (twenty four)

[0141] Based on equations (23) and (24), let

[0142] (25)

[0143] (26)

[0144] Equations (25) and (26) contain two unknowns. and Here will and Treat it as a whole, remember ,make Solving based on Newton's iterative method:

[0145] First, construct the Jacobian matrix. ,

[0146] (27)

[0147] Depending on the actual working environment, the current-carrying wire is usually located at... Figure 2 Near point O, i.e. Therefore, set the initial point. Use the following iterative formula:

[0148] (28)

[0149] That is, the pre-defined iterative relationship.

[0150] After the processing module substitutes the acquired data into (28), there are only two unknowns. and Substitute the equation (28) into the solution and iterate until the iteration exit condition is met to obtain the final solution. and The processing module substitutes the relevant acquired data into equation (15) and finally obtains... and Substituting into equation (15), the solution can be obtained. The value of is the potential on the surface of the conductor under test, which is also the potential difference relative to the zero potential reference point.

[0151] Thirdly, such as Figure 5 As shown, this application provides a voltage detection method, the method comprising:

[0152] S501: Provides the electric field sensor array structure as described above;

[0153] S502: Place the electric field sensor array structure around the wire to be tested, so that the wire to be tested passes through the electric field sensor array structure;

[0154] S503: Obtain the measurement data of the first electric field sensor, the second electric field sensor and the third electric field sensor, as well as the distance between any one of the first electric field sensor, the second electric field sensor and the third electric field sensor and the centroid O of the equilateral triangle;

[0155] S504: Obtain the radius of the conductor under test and the distance between the conductor under test and the preset zero potential reference point;

[0156] S505: Calculate the potential difference between the conductor under test and the zero potential reference point based on the acquired data.

[0157] The advantages of this voltage detection method over existing technologies are the same as those of the voltage detection system described above, and will not be repeated here.

[0158] In one embodiment, obtaining the radius of the conductor under test and the distance between the conductor under test and a preset zero-potential reference point includes:

[0159] Receive external input to obtain the radius of the conductor under test and the distance between the conductor under test and a preset zero potential reference point.

[0160] In one embodiment, calculating the potential difference between the conductor under test and the zero-potential reference point based on the acquired data includes:

[0161] The distance between any one of the first electric field sensor, the second electric field sensor, and the third electric field sensor and the centroid O of the equilateral triangle is taken as the first distance. The acquired measurement data and the first distance are substituted into a preset iterative relationship to obtain the target iterative relationship.

[0162] Obtain the initial value of the iteration variable, substitute the initial value of the iteration variable into the target iteration relation and iterate until the preset iteration exit condition is met, and obtain the final iteration variable;

[0163] Using the distance between the conductor under test and the zero potential reference point as the second distance, the final obtained iterative variable, the second distance, and the radius of the conductor under test are substituted into a preset measurement relationship to calculate the voltage of the conductor under test.

[0164] In one embodiment, the preset iterative relation is:

[0165] ;

[0166] in,

[0167] ,

[0168] ;

[0169] ;

[0170] In the above formula, This represents the measured value of the first electric field sensor. This represents the measured value of the second electric field sensor. This represents the measured value of the third electric field sensor. This represents the distance between any one of the first, second, and third electric field sensors and the centroid O of the equilateral triangle. Indicates the number of iterations. This represents the distance between the intersection point S of the conductor to be measured and the equilateral triangle, and the centroid O of the equilateral triangle. The angle formed by the point where the first electric field sensor is located, the centroid O of the equilateral triangle, and the intersection point S of the wire to be tested and the equilateral triangle is represented.

[0171] The preset measurement formula is:

[0172] , ;

[0173] in, This represents the potential on the surface of the conductor under test. This indicates the radius of the conductor to be measured. This indicates the distance between the conductor under test and the preset zero potential reference point.

[0174] It should be understood that although the steps in the flowcharts of the embodiments described above are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the embodiments described above may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages of other steps.

[0175] Those skilled in the art will understand that all or part of the processes in the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium. When executed, the computer program can include the processes of the embodiments described above. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, etc., and are not limited to these.

[0176] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0177] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A voltage detection system, characterized in that, The voltage detection system includes: an electric field sensor array structure and a processing module; The electric field sensor array structure includes: The first electric field sensor is used to measure the electric field strength of the surrounding environment; The second electric field sensor is used to measure the electric field strength of the surrounding environment; The third electric field sensor is used to measure the electric field strength of the surrounding environment; The first electric field sensor, the second electric field sensor, and the third electric field sensor are respectively located at the three vertices of the same equilateral triangle, and are positioned around the conductor to be tested so that the conductor passes through the equilateral triangle. One sensitive direction of the first electric field sensor is parallel to the line connecting the point where the first electric field sensor is located and the centroid of the equilateral triangle; one sensitive direction of the second electric field sensor is parallel to the line connecting the point where the second electric field sensor is located and the centroid of the equilateral triangle; and one sensitive direction of the third electric field sensor is parallel to the line connecting the point where the third electric field sensor is located and the centroid of the equilateral triangle. The processing module is connected to the electric field sensor array structure and is used to acquire measurement data from the first, second, and third electric field sensors, as well as the distance between any one of the first, second, and third electric field sensors and the centroid of the equilateral triangle. It also acquires the radius of the conductor under test and the distance between the conductor under test and a preset zero-potential reference point, and calculates the potential difference of the conductor under test relative to the zero-potential reference point based on the acquired data. The processing module includes: The first processing unit is used to take the distance between any one of the first electric field sensor, the second electric field sensor, and the third electric field sensor and the centroid of the equilateral triangle as a first distance, and substitute the acquired measurement data and the first distance into a preset iterative relationship to obtain a target iterative relationship. The second processing unit is used to obtain the initial value of the iteration variable, substitute the initial value of the iteration variable into the target iterative relation to perform iterative solution until the preset iteration exit condition is met, and obtain the final iteration variable. The calculation unit is used to calculate the voltage of the wire under test by substituting the final obtained iterative variable, the second distance, and the radius of the wire under test into a preset measurement relationship, using the distance between the wire under test and the zero potential reference point as the second distance; The preset iterative relationship is as follows: ； in, ， ； ； In the above formula, This represents the measured value of the first electric field sensor. This represents the measured value from the second electric field sensor. This represents the measured value of the third electric field sensor. This represents the distance between any one of the first, second, and third electric field sensors and the centroid of the equilateral triangle. Indicates the number of iterations. This represents the distance between the intersection point of the conductor to be measured and the equilateral triangle, and the centroid of the equilateral triangle. The angle formed by the point where the first electric field sensor is located, the centroid of the equilateral triangle, and the intersection of the wire to be tested and the equilateral triangle is represented. The preset measurement relationship is as follows: ， ； In the above formula, This represents the potential on the surface of the conductor under test. This indicates the radius of the conductor to be measured. This indicates the distance between the conductor under test and the preset zero potential reference point.

2. The voltage detection system according to claim 1, characterized in that, The electric field sensor array structure further includes: a structure with a notch in the middle, in which the first electric field sensor, the second electric field sensor and the third electric field sensor are disposed and located on the periphery of the notch, and the structure is used to limit and fix the first electric field sensor, the second electric field sensor and the third electric field sensor so that the first electric field sensor, the second electric field sensor and the third electric field sensor are respectively located at the three vertices of the same equilateral triangle.

3. The voltage detection system according to claim 1, characterized in that, The voltage detection system further includes: an input module connected to the processing module, used to receive the radius of the conductor under test and the distance between the conductor under test and a preset zero potential reference point from an external input, and to send the received data to the processing module; or The processing module includes an input unit that receives external input to obtain the radius of the conductor under test and the distance between the conductor under test and a preset zero potential reference point.

4. A voltage detection method, characterized in that, The method includes: Provide a voltage detection system as described in any one of claims 1 to 3; The electric field sensor array structure is placed around the conductor under test, so that the conductor under test passes through the electric field sensor array structure. Acquire measurement data from the first electric field sensor, the second electric field sensor, and the third electric field sensor, as well as the distance between any one of the first electric field sensor, the second electric field sensor, and the third electric field sensor and the centroid of the equilateral triangle; Obtain the radius of the conductor under test and the distance between the conductor under test and a preset zero potential reference point; The potential difference between the conductor under test and the zero potential reference point is obtained based on the acquired data.

5. The method according to claim 4, characterized in that, Obtaining the radius of the conductor under test and the distance between the conductor under test and a preset zero-potential reference point includes: Receive external input to obtain the radius of the conductor under test and the distance between the conductor under test and a preset zero potential reference point.

6. The method according to claim 4 or 5, characterized in that, The step of calculating the potential difference between the conductor under test and the zero-potential reference point based on the acquired data includes: The distance between any one of the first electric field sensor, the second electric field sensor, and the third electric field sensor and the centroid of the equilateral triangle is taken as the first distance. The acquired measurement data and the first distance are substituted into a preset iterative relationship to obtain the target iterative relationship. Obtain the initial value of the iteration variable, substitute the initial value of the iteration variable into the target iteration relation and iterate until the preset iteration exit condition is met, and obtain the final iteration variable; Using the distance between the conductor under test and the zero potential reference point as the second distance, the final obtained iterative variable, the second distance, and the radius of the conductor under test are substituted into a preset measurement relationship to calculate the voltage of the conductor under test.

7. The method according to claim 6, characterized in that, The preset iterative relationship is: ； in, ， ； ； In the above formula, This represents the measured value of the first electric field sensor. This represents the measured value of the second electric field sensor. This represents the measured value of the third electric field sensor. This represents the distance between any one of the first, second, and third electric field sensors and the centroid of the equilateral triangle. Indicates the number of iterations. This represents the distance between the intersection point of the conductor to be measured and the equilateral triangle, and the centroid of the equilateral triangle. The angle formed by the point where the first electric field sensor is located, the centroid of the equilateral triangle, and the intersection of the wire to be tested and the equilateral triangle is represented. The preset measurement formula is: ， ； in, This represents the potential on the surface of the conductor under test. This indicates the radius of the conductor to be measured. This indicates the distance between the conductor under test and the preset zero potential reference point.

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