Control equipment for monitoring machines

Abstract

This invention relates to a control device for monitoring a machine and for monitoring the machine's emission performance, wherein the monitoring is based on a comparison of the relative position of a standard based on the machine's measured values ​​and / or operating values ​​relative to the machine's nominal value. The control device (1) for monitoring a machine (2) according to the invention is configured and set up to perform the following steps: - detecting (S10) the measured values ​​and / or operating values ​​of the machine (2), - determining a standard based on the detected measured values ​​and / or operating values ​​(S20), - comparing the standard with a nominal value (S30), wherein the nominal value represents the machine (2) in a normally functioning state, and determining (S31) the relative position of the standard with respect to the nominal value, and - determining the state of the machine (2) based on the result of the comparison and the determined relative position (S40).

Description

Technical Field

[0001] The present invention relates to a control device for monitoring a machine and for monitoring the machine’s emissions performance, wherein the monitoring is based on a comparison of the relative position of a standard based on the machine’s measured and / or operating values ​​with respect to the machine’s nominal values. Background Technology

[0002] A method for evaluating the robustness of at least one diagnostic function is known from DE10 2014 115 485 B4, wherein at least one eigenvalue is determined for at least one characteristic variable of the diagnostic function. Summary of the Invention

[0003] The control device for monitoring machines according to the present invention is configured and set up to perform the following steps:

[0004] -Detect the machine's measured values ​​and / or operating values.

[0005] - Calculate standards based on the detected measurements and / or operating values.

[0006] - Compare the standard value with the nominal value, which represents the machine's normal functional state, and determine the relative position of the standard value with respect to the nominal value.

[0007] - The machine's state is determined based on the comparison results and the determined relative position.

[0008] The control device determines the machine's state based on the comparison results and the relative position of the standard relative to the nominal value. In this way, the present invention achieves the following: it can improve the robustness of the determination, and thus improve the robustness of the monitoring.

[0009] The effectiveness of the monitoring is understood as robustness. Monitoring is not robust if it indicates the machine is functioning correctly despite a defect, or if it indicates a defect despite normal machine function. This is because detected measurements and / or operating values ​​are typically subject to fluctuations, and therefore the standards sought will also be subject to fluctuations. Monitoring is considered robust if, despite these fluctuations, it indicates the machine is functioning correctly.

[0010] The machine is preferably a vehicle, especially an internal combustion engine. However, in principle, the control device according to the invention can be used in machines where monitoring measured values ​​and / or operating values ​​are considered for the vehicle.

[0011] Variables describing the state of a machine are understood as measured values ​​and / or operating values. These could be, for example, efficiency, noise emissions and / or hazardous substance emissions, temperature, or pressure. Here, they are understood as measurements and calculations performed through a model or reads from a family of characteristic curves.

[0012] A standard derived from the machine's detected measurements and / or operating values ​​characterizes the machine's current state. This standard can correspond to the detected measurements and / or operating values. However, particularly if more than one measurement and / or operating value is detected, it is advantageous to convert the detected measurements and / or operating values ​​into a standard suitable for characterizing the machine. If the machine is in its nominal state, i.e., functionally normal, then the standard uses the nominal value.

[0013] The nominal value represents the machine's normal functional state. The nominal value is correlated with the machine's operating state. The further the machine deviates from its nominal state, the further the standard deviates from the nominal value.

[0014] Preferably, the control device is configured and set up to repeatedly perform the steps of detection, standard determination, comparison, and status determination.

[0015] By repeatedly performing the steps of detection, standard determination, comparison, and status determination, the present invention enables the monitoring of a machine over a period of time and / or for multiple monitoring processes.

[0016] Preferably, the steps of detection, standard determination, comparison, and status determination are performed continuously. Particularly preferably, the control device is used for so-called on-board diagnostics of the machine.

[0017] To ensure robustness of monitoring, control devices can determine, for example, the frequency or duration of repeated steps based on the relative position of the standard with respect to the nominal value. If the standard's relative position is far from the nominal value, steps are executed more frequently or for longer periods to obtain a definite result. Conversely, if the standard's relative position is close to the nominal value, fewer repetitions or shorter execution periods are sufficient to obtain a definite result.

[0018] Preferably, the control equipment is configured and set up to additionally consider defect values ​​during comparison and to determine the relative position of the standard with respect to the nominal value and with respect to the defect value. The defect value represents the defective state of the machine.

[0019] The control device determines the machine's state based on comparison results and the relative position of the standard with respect to the nominal value and the defect value. In this way, the present invention achieves the ability to assess the relative position of the machine's defective state and its functionally normal state according to the standard. This increases the effectiveness of the relative position and thus improves the robustness of monitoring.

[0020] Preferably, the control equipment is configured and set up to determine the defect measure based on the standard relative position and to take the determined defect measure into account when determining the machine state.

[0021] By considering specific defect measures when determining the machine status, the present invention achieves the goal of considering machine defect measures during monitoring.

[0022] Preferably, to determine the defect measurement, the control device maps the range between the nominal value and the defect value to a range between two defined values ​​A and B, preferably 0 and 1. The mapping function is particularly preferably continuous and monotonic. The nominal value is mapped to value A, and the defect value is mapped to value B. Examples of mapping functions are linear mappings or S-functions. The mapping function is relevant to the machine's operating state. Conversely, values ​​A and B are independent of the operating state.

[0023] The standard values ​​on the side of the nominal value that deviate from the defect value are mapped to values ​​less than or equal to A. The standard values ​​on the side of the defect value that deviate from the nominal value are mapped to values ​​greater than or equal to B. The same mapping function, extrapolation, or another function can be used for the mapping. However, the function is particularly preferably continuous and monotonic. Advantageously, the function is limited upwards and downwards and tends towards a limiting value for values ​​that deviate significantly from the nominal value and / or the defect value.

[0024] The values ​​determined by the mapping of the aforementioned standards can be considered as a defect measure of the machine. A defect measure below or close to A indicates that the machine is functioning normally, while a defect measure close to or above B indicates that the machine is defective. Defect measures between A and B are ambiguous, where the defect measure can indicate whether the machine is defective or functioning normally when determining the machine's status. The duration or number of repetitions for detection, standard determination, comparison, and status determination can also be adjusted based on the defect measure.

[0025] Preferably, the control device is configured and set up to determine the de-jittering speed based on the relative position of the standard, and to take the determined de-jittering speed into account when determining the machine state.

[0026] By considering the determined de-jitter speed when determining the machine state, the present invention achieves the following: the de-jitter speed can be used as a speed parameter when determining the state, thereby improving the robustness of the determination and, consequently, the robustness of the monitoring.

[0027] Preferably, the control device maps the defect measure to another value range defined by values ​​C, D, and E. Advantageously, C is less than D and D is less than E. For example, C corresponds to the value -1, D corresponds to the value 0, and E corresponds to the value 1. Here, the defect measure at a point close to A is mapped to C, the defect measure at a point defined between A and B is mapped to D, and the defect measure at a point close to B is mapped to E. The defined points particularly preferably correspond to limit values. If the mapped defect measure is between D and E, then it can be determined that the machine is defective; if the mapped defect measure is between C and D, then it can be determined that the machine is functioning normally.

[0028] Preferably, the mapping function is continuous and monotonic. Advantageously, the mapping function is limited for very large and very small values ​​of the defect measure and tends towards a lower limit and / or an upper limit.

[0029] The mapping of defect metrics, i.e., dejitter speed, can be used as a speed parameter for determining the machine state. This can be represented, for example, that at a high dejitter speed, a small number of definitive results are sufficient before the control device considers the result robust and determines the machine state, but at a low dejitter speed, many results are required. For instance, a negative dejitter speed can trigger the determination of a functionally normal state, while a positive dejitter speed can trigger the determination of a defective state.

[0030] When the defect measure between A and B is ambiguous, the dejittering speed is 0 or close to 0. Therefore, the calculation either does not terminate or continues for a very long time. This is consistent with the ambiguous result and resolves the problem of random results in this situation.

[0031] Preferably, the control device is configured and set up to determine the probability of the machine functioning normally and / or being defective based on the relative position of the standard, and to take the determined probability into account when determining the machine state.

[0032] The invention achieves the following by considering the determined probability when the control device determines the machine state: adjusting the duration or number of repetitions of the steps of detection, standard determination, comparison, and state determination according to the determined probability.

[0033] Preferably, to determine the first probability, the control device maps the defect measure to a range of values ​​equal to or slightly below 1 for defect measures below A, and equal to or slightly above 0 for values ​​above B. A monotonic transition occurs between A and B. The result of this mapping can be considered as the probability that the occurrence of a standard is less than the considered defect measure. Therefore, the mapping result indicates the probability that the machine is functioning correctly.

[0034] Furthermore, preferably, the control device determines a second probability, which represents the probability that the machine is defective. To this end, the control device maps a defect metric to a range of values ​​that are equal to or slightly higher than 0 for defect metrics below A, and equal to or slightly lower than 1 for values ​​above B. This mapping indicates the probability that the machine is defective.

[0035] To determine the state, the control device repeatedly performs the steps of detection, criterion determination, comparison, and state determination, calculating the first and second probability products by multiplying them separately by the calculated first and second probabilities. If one of these probability products falls below a first limit value, but the other remains above a second limit value, then the state determination process ends. These two limit values ​​can be related to the number of probabilities calculated.

[0036] The result of determining the machine state is derived from the relationship between the products of the first and second probabilities. If the product of the first probability is less than the product of the second probability, then the control device determines the defective state of the machine. Otherwise, the control device determines the normal functional state of the machine.

[0037] Particularly preferably, if the product of the two probabilities is lower than a second limit value and / or at least one probability product is lower than a third limit value, then the control device will abort the determination of the state without any results.

[0038] Alternatively, a maximum number of determined probabilities can be defined, and when said maximum number is reached, the control device aborts determining the state without result.

[0039] The control device for monitoring the emission performance of a machine according to the present invention is configured and set up to perform the following steps:

[0040] - Determine the first defect measure of the first component of the machine.

[0041] - Determine the first emission impact based on the determined first defect metric, and - Monitor the emission performance of the machine based on the first emission impact.

[0042] The control device monitors the machine's emissions performance based on a first emission impact. In this way, the present invention achieves the following: emissions performance is assessed while monitoring the function of a first component, i.e., determining a first defect measure. Therefore, the present invention has the advantage of assessing the emissions by determining the first emission impact during on-board diagnostics (OBD) of the machine, and taking this assessment into account when monitoring emissions performance.

[0043] In this context, the control device for monitoring emissions performance is particularly capable of being, according to the invention, a control device for monitoring a machine, which is configured and set up for monitoring emissions performance. Here, supplementarily or alternatively to the steps for monitoring a machine, the control device for monitoring a machine can perform steps for monitoring emissions performance.

[0044] Here, the defect measure is understood as a measure representing the degree of machine defect. Preferably, the control device for monitoring emissions performance is configured and set up to determine the first defect measure based on the relative position of a standard derived from the detected measurements and / or operating values ​​of the machine, as is the case with control devices for monitoring the machine. Particularly preferred is that the control device for monitoring the machine and the control device for monitoring emissions performance are configured as a single control device.

[0045] Here, emissions impact is understood as the effect of the condition of the first component on emissions performance. If the first component is in its nominal condition, then the emissions impact corresponds to the nominal emissions. Conversely, if the condition of the first component deviates from the nominal condition, then the defect measure no longer corresponds to the nominal value, and the emissions impact of the first component typically deviates from the nominal emissions.

[0046] Here, emissions performance is understood as emissions emitted by machines into the environment.

[0047] Monitoring here is understood as a comparison of emissions performance with expected or desired emissions performance. Expected or desired emissions performance can be derived, in particular, from emissions regulations. Emissions here are understood as emissions of hazardous substances, carbon dioxide, and noise. In particular, if the machine has emissions performance that deviates from the expected or desired performance due to a defect in a first component, monitoring can also include notifying the machine operator, imposing functional restrictions, or even automatically shutting down the machine.

[0048] Preferably, the control device determines the first emission impact based on a mapping of the first defect measure using a function. The mapping function can be, for example, a linear mapping or an S-function. In particular, the mapping function can be related to the machine's operating state.

[0049] Furthermore, preferably, the mapping function maps the smallest first defect measure to the emission impact corresponding to the nominal emissions. The mapping function maps the largest first defect measure to a value that, for example, is required by law to shut down or at least repair the machine because a prescribed limit has been reached or exceeded.

[0050] In particular, if the initial defect measure and the emission impact are disproportionate to each other—that is, for example, emissions increase as the defect measure increases and decreases—a more complex mapping function is needed. This mapping function, for example, has non-monotonic behavior, so that it can follow the increase in emission impact, for example, even when the defect measure decreases. If the defect measure can deviate from its nominal value in two directions, but only in one direction does it cause an increase in emission impact, then the mapping function is limited such that the defect measure is mapped to a value only in that direction, indicating that the machine causing the increased emission impact should be shut down or at least repaired.

[0051] Preferably, the control equipment is configured and set up to use statistical functions in determining the impact of the first emission.

[0052] The control device uses statistical functions to determine the impact of the first emission. In this way, the present invention achieves the goal of considering multiple first defect measures when determining the impact of the first emission. This reduces the significant fluctuations in the impact of the first emission because individual outliers of the first defect measures are reduced through statistical functions.

[0053] Here, the statistical function is preferably understood as the average or median of the first defect measure. The control device is here able to apply the statistical function to the first defect measure and determine the first emission impact based on, for example, the averaged first defect measure, or directly determine the first emission impact based on the first defect measure and apply the statistical function to the determined first emission impact.

[0054] Particularly preferably, the control device determines the first emission impact based on the average value of a first defect measure, wherein the control device averages the first defect measure over a de-jittering time period. The de-jittering time period is understood here as a time measure within which the control device classifies measurements as reliable or unreliable. The de-jittering time period can be limited to a preset time value or the number of data points. The de-jittering time period can be dynamically adjusted. If the measurement data is clearly reliable, the de-jittering time period can be shortened; however, if the measurement data is unclear, the de-jittering time period can be extended.

[0055] Preferably, the control equipment is configured and set up to take into account the nominal emissions of the machine when determining the impact of the first emission.

[0056] The invention achieves this by considering the machine’s nominal emissions when determining the first emission impact, and by doing so, not only by considering the emission impact in absolute terms, but also by considering the emission impact additively or multiplicatively.

[0057] The addition here means that the emission impact is added as a coefficient to the nominal emissions. Here, the smallest measure of defect corresponds, for example, to a coefficient of 0 for the emission impact.

[0058] Multiplication here means that the emission impact is multiplied by the nominal emission as a factor. Here, the smallest measure of defect would, for example, correspond to a factor of 1 for the emission impact.

[0059] Preferably, the control device is configured and set up to determine at least one additional emission impact and monitor the machine’s emission performance based on the first and at least one additional emission impact.

[0060] The control device determines emissions performance based on a first and at least one additional emissions effect. In this way, the invention enables the monitoring of the machine's emissions performance even if the machine includes more than one component and / or more than one type of emissions.

[0061] Preferably, in order to monitor multiple emission configurations and establish settings, the control device uses different mapping functions for different emissions, because defects in the first component can have different, or even opposite, effects on different emissions. By using different mapping functions, the control device can advantageously determine the corresponding emission impact for each emission based on the measure of the first defect.

[0062] Preferably, when there is more than one component to be monitored, the control device is configured and set up to determine at least one additional defect measure. The control device can then use at least one additional defect measure to determine the corresponding emission impact for one or more emissions to be monitored.

[0063] Particularly preferably, the control device is configured and set up to monitor multiple emissions from multiple components, using an individual mapping function for the corresponding emissions and determining a defect metric for each component. The individual mapping function for each emission can be different for each component to account for the fact that the effect of a defect metric of the first component on the observed emissions may differ from that of a defect metric of the second component.

[0064] In particular, the present invention enables an overall assessment of emissions even in the event of failure in multiple component parts. This is advantageous, for example, in situations where failure in a single component part does not cause an error message, but in combination it can cause exceeding of limits.

[0065] Other advantageous embodiments of the invention are described below. Attached Figure Description

[0066] Preferred embodiments are illustrated in detail with reference to the following figures. They are shown here:

[0067] Figure 1 An embodiment of a powertrain with control equipment is shown;

[0068] Figure 2 An embodiment of steps for determining the machine state, performed by a control device, is shown;

[0069] Figure 3 An embodiment for determining defect measurement and de-jitter speed is shown;

[0070] Figure 4 An embodiment for determining the first and second probabilities is shown;

[0071] Figure 5 An embodiment of steps performed by a control device for monitoring the emissions performance of a machine is shown;

[0072] Figure 6 An example is shown for determining the impact of the first, second, and third emissions. Detailed Implementation

[0073] Figure 1 A powertrain 2 for a vehicle is shown. The powertrain 2 includes an intake line 9, an internal combustion engine 3, an exhaust line 10, a first exhaust gas return line 11, and a second exhaust gas return line 12. Here, the intake line 9 is located upstream of the internal combustion engine 3. The exhaust line 10 is located downstream of the internal combustion engine 3 and includes an exhaust gas purification system 4.

[0074] The internal combustion engine 3 is configured as a turbocharged direct-injection diesel engine with four cylinders 13. For this purpose, the internal combustion engine 3 includes an exhaust gas turbocharger 14. The exhaust gas turbocharger 14 includes a compressor 15 disposed in the intake passage 9 and a turbine 16 disposed in the exhaust passage 10. The turbine 16 and the compressor 15 are coupled to each other such that the energy absorbed from the exhaust gas by the turbine 16 can be used by the compressor 15 to compress the fresh gas to an increased pressure level.

[0075] In order to introduce diesel fuel into cylinder 13, the internal combustion engine 3 includes an injection device 30. The injection device 30 includes an injector for each cylinder 13, an input line, and a fuel supply device.

[0076] The exhaust gas purification system 4 includes a diesel oxidation catalyst (DOC) 5, an SCR system, and an ammonia slip catalyst (ASK) 7. DOC 5 is designed to reduce emissions of carbon monoxide and unburned hydrocarbons.

[0077] The SCR system is located downstream of DOC5 and includes an SCR 13 catalyst 6, a metering unit 19, and a mixer 20. The metering unit 19 is configured to introduce ammonia (NH3) into the exhaust line 10 upstream of the SCR catalyst 6. The introduced ammonia is mixed with the exhaust gas in the mixer 20, which is located between the metering unit 19 and the SCR catalyst 6. The SCR catalyst 6 is configured to utilize ammonia to reduce NOx emissions.

[0078] To detect NOx emissions, NOx sensor 22 is installed downstream of exhaust gas reprocessing system 4.

[0079] The first exhaust gas return line 11 is located upstream of the exhaust gas purification system 4 and is configured to discharge exhaust gas upstream of the turbine 16 of the exhaust gas turbocharger 14 from the exhaust line 10 and deliver it to the intake line 9 downstream of the compressor 15 of the exhaust gas turbocharger 14. The second exhaust gas return line 12 is configured to discharge exhaust gas downstream of the DOC5 from the exhaust line 10 and deliver it upstream of the compressor 15 of the exhaust gas turbocharger 14 to the intake line 9. With the aid of the first exhaust gas return line 11 and the second exhaust gas return line 12, an optimal exhaust gas return rate can be provided for the operation of the internal combustion engine 3, and the internal combustion engine 3 can be operated as efficiently as possible.

[0080] The powertrain 2 includes a control device 1. The control device 1 is configured and established for executing control programs. The control programs include execution of... Figure 2 The commands for the steps shown in the image:

[0081] - Detect multiple measurement and operating values ​​of the S10 machine 2.

[0082] - The S20 standard is derived based on the detected measured and operational values.

[0083] - Compare the standard with the nominal value and the defect value (S30), where the nominal value represents the normal functional state of machine 2, and the defect value represents the defective state of machine 2, and determine (S31) the relative position of the standard with respect to the nominal value and the defect value.

[0084] - Determine the S32 defect measure based on the relative position of S31 determined by the aforementioned standard.

[0085] - Determine the de-jittering speed of S33 based on the determined defect metric S32, and

[0086] -The state of machine 2 in S40 is determined based on the results of comparison S30, the relative position of determined S31, the defect measurement of determined S32, and the de-jittering speed of determined S33.

[0087] The control device program is used here for on-board monitoring of the powertrain. To this end, the control device program continuously executes the steps of detection S10, standard determination S20, comparison S30, determination of the relative position of the standard S31, determination of defect measurement S32, determination of de-vibration speed S33, and determination of state S40.

[0088] The control equipment program detects information about the SCR catalyst 6, NOx emissions downstream of the exhaust gas reprocessing system 4, and the speed and load of the internal combustion engine 3 as measured and operating values. The speed and load are provided to the control equipment via a motor control unit, NOx emissions are measured by the NOx sensor 22, and the control equipment program determines the state of the SCR catalyst 6 by executing a model for calculating the aging, loading, and temperature of the SCR catalyst 6.

[0089] The control device program determines standard S20 based on the detected measured and operating values. To this end, the control device program compares the determined NOx emissions and the determined state of the SCR catalyst 6 with the expected values ​​of the determined revolutions per minute (RPM) and load. The expected values ​​are stored in a family of characteristic curves that are accessible to the control device program. Therefore, the determined standard S20 characterizes the extent to which the measured and operating values ​​correspond to the expected state of the powertrain 2.

[0090] The control device program includes a command S30 that compares the desired standard S20 with the nominal value and the defective value. The nominal value represents the normal functional state of powertrain 2, and the defective value represents the defective state of powertrain 2. If powertrain 2 is in its nominal state, then the desired standard S20 essentially corresponds to the nominal value. The further the powertrain deviates from its nominal state, i.e., the more defective it becomes, the further the desired standard S20 deviates from the nominal value and the closer it is to the defective value.

[0091] If the detected NOx emissions and the detected state of the SCR catalyst 6 correspond as closely as possible to the expected values ​​of the detected revolutions per minute (RPM) and the detected load, then the calculated standard S20 is closer to the nominal value than the defective value. If the detected NOx emissions and the detected state of the SCR catalyst 6 do not correspond to the expected values, then the calculated standard S20 is closer to the defective value than the nominal value. If only the NOx emissions or only the detected state of the SCR catalyst 6 corresponds to the expected values, then the calculated standard S20 may be relatively intermediate between the nominal value and the defective value. Therefore, it may not be clear whether the powertrain 2 is defective or functional.

[0092] To robustly determine the state of the S40 powertrain, the control device program therefore includes commands that consider the relative position of the standard, defect measurement, and de-jittering speed when determining state S40. To this end, the control device program first determines the relative position of the standard S31 by calculating the distance between the standard and the nominal and defect values.

[0093] To determine the S32 defect metric, the control device program includes commands that map the value range between the nominal value and the defect value to a value range between two defined values ​​A and B. Values ​​A and B are as follows: Figure 3 The upper part of the diagram shows 0 and 1. The control device program uses a linear function as the mapping function for the exemplary operating points of powertrain 2. The control device program uses other functions for some operating points. The nominal value NW is mapped to value A, while the defective value DW is mapped to value B.

[0094] The standard values ​​on the side of the nominal value that deviate from the defect value are mapped to values ​​less than A. The standard values ​​on the side of the defect value that deviate from the nominal value are mapped to values ​​greater than B. The control device program uses the same linear function for these mappings, although for some operating points the program uses a different function or extrapolation to map the standard. The linear function is constrained upwards and downwards, causing values ​​exceeding the nominal and limit values—i.e., values ​​less than A or greater than B—to tend towards the limit values.

[0095] The values ​​mapped by the standard correspond to a defect measure of powertrain 2. Mapped values ​​below or close to A indicate a functioning powertrain 2, while values ​​close to or above B indicate a defective powertrain 2. Values ​​between A and B are ambiguous.

[0096] To determine the S33 de-jittering speed, the control device program includes commands that map the determined defect measure of S32 to another value domain, such as in Figure 3 As shown in the lower diagram. The other value range is defined by three values ​​C, D, and E. Here, C is less than D, and D is less than E, i.e., C = -1, D = 0, and E = 1. Here, the defect measurement near point A is mapped to C, the defect measurement near a predetermined defect measurement between A and B is mapped to D, and the defect measurement near point B is mapped to E. The predetermined defect measurement corresponds to the following limit values, which define the boundary between a functional and defective powertrain 2.

[0097] The mapping function is continuous, but its slope is zero in the region of value D. For very large and very small values ​​of the defect measure, the function is constrained and tends towards the lower and upper limits.

[0098] The control device program uses the determined de-jittering speed of S33 as a parameter for determining the state of powertrain 2 in S40. When the de-jittering speed is high, i.e., close to 1 or -1, some definitive results are sufficient; when the de-jittering speed is low, i.e., close to 0, many results are needed before determining whether state S40 is considered robust. Here, a negative de-jittering speed corresponds to a functioning powertrain 2, and a positive de-jittering speed corresponds to a defective powertrain 2.

[0099] In the case of an ambiguous defect measure between A and B, the de-jittering speed is 0 or close to 0, and the state of powertrain 2 of S40 is obtained without termination or for a very long time. This is consistent with the ambiguous results and solves the problem of random results in this situation.

[0100] In an alternative embodiment, instead of the de-jittering speed, the control device program includes commands for calculating the first and second probability products, comparing the first and second probability products with first and second limit values, and determining the state of the S40 powertrain 2 based on the result of comparing the probability products with the limit values.

[0101] Therefore, the control device program, such as in Figure 4 The first mapping is performed as shown in the upper diagram, which maps the determined defect measure S32 to a value range from zero to one. Here, defect measures less than or equal to A are mapped to the value 1, while defect measures greater than or equal to B are mapped to the value 0. The S-function maps defect measures between A and B to values ​​between zero and one. The result of this mapping yields the probability that powertrain 2 is functioning correctly.

[0102] Control device program such as Figure 4 The second mapping is performed as shown in the lower diagram, which maps defect metrics to a range of values ​​from zero to one, such that defect metrics less than or equal to A are mapped to the value 0, defect metrics greater than or equal to B are mapped to the value 1, and defect metrics between A and B are mapped to values ​​between 0 and 1 by means of the S-function shown. The result of the second mapping yields the probability that powertrain 2 is defective.

[0103] To determine the state of powertrain 2 in S40, the control device program includes a command to calculate the product of first and second probabilities by multiplying the calculated first and second probabilities separately. The determination of the state of powertrain 2 ends when one of the two probability products is below a first limit value and the other probability product is simultaneously above a second limit value. The first and second limit values ​​are defined based on the number of the calculated first and second probabilities.

[0104] The control program determines the result of the S40 state from the relationship between these two probability products. If the second probability product is greater than the first probability product, the control program determines that the powertrain 2 is defective. If the first probability product is greater than the second probability product, the control program determines that the powertrain 2 is functioning normally.

[0105] If the product of these two probabilities is lower than the second limit and / or at least one probability product is lower than the third limit, then the process of determining state S40 is suspended without result and restarted. Additionally, a maximum number of probabilities is limited; when this number is reached, the control device program suspends the process of determining state S40 without result and restarts after a waiting period.

[0106] In an alternative embodiment, the control device 1 of the powertrain 2 is configured and set up for monitoring emissions performance. For this purpose, the control device 1 is configured and set up for executing control procedures. The control procedures include executing... Figure 5 The commands for the steps shown are:

[0107] - Detect multiple measurements and operating values ​​of the S100 powertrain 2.

[0108] - The first standard for S210 SDPF6 is determined based on the detected measurements and operating values.

[0109] -A second standard for S220 DOC5 is determined based on the detected measurements and operating values.

[0110] - Compare the first standard with the first nominal value and the first defect value, S310, where the first nominal value represents the normal functional state of the SDPF6, and the first defect value represents the defective state of the SDPF6, and determine the relative position of the first standard with the first nominal value and the first defect value, S410.

[0111] - Compare the second standard with the second nominal value and the second defect value (S320), where the second nominal value represents the normal functional state of DOC5, and the second defect value represents the defective state of DOC5, and determine (S420) the relative positions of the second standard with the second nominal value and the second defect value.

[0112] -Based on the relative position S410 determined by the first standard, the first defect measure of S510 SDPF6 is determined.

[0113] -Based on the relative position S420 determined by the second standard, the second defect measure S520 DOC5 is determined.

[0114] - Determine the first emission impact of S610 based on the determined first defect measure S510.

[0115] -The second emission impact of S620 is determined based on the identified first defect measure S510.

[0116] -The third emission impact of S630 is determined based on the identified second defect measure S520.

[0117] -The total emission impact of S700 is determined based on the identified first emission impact S610, second emission impact S620, and third emission impact S630, and

[0118] -Based on the total emissions impact, S700 monitors the emissions performance of the S800 powertrain 2.

[0119] The control device program here is used for on-board diagnostics in conjunction with the evaluation of powertrain 2's emissions. To this end, the control device program continuously performs the following steps: detecting S100, determining first and second standards S210 and S220, comparing S310 and S320, determining the relative positions of the first and second standards S410 and S420, determining first and second defect measures S510 and S520, determining the first, second, and third emission impacts of S610, S620, and S630, determining the total emission impact of S700, and monitoring the emission performance of powertrain 2 in S800, such as by... Figure 5 The dashed lines in the diagram indicate the sequence from step S800 to step S100.

[0120] The control equipment program detects information regarding DOC5, SDPF6, NOx emissions downstream of the exhaust gas reprocessing system 4, and the speed and load of the internal combustion engine 3 as measured and operating values. The speed and load are provided to the control equipment via a motor control unit, NOx emissions are measured by NOx sensor 22, and the control equipment program determines the state of DOC5 and SDPF6 by executing models for calculating aging, loading, and temperature.

[0121] The control device program derives a first standard, S210, based on the detected measured and operating values. To this end, the control device program compares the determined NOx emissions and the determined state of SDPF6 with the expected values ​​of the determined engine speed and load. The expected values ​​are stored in a family of characteristic curves accessible to the control device program. Similarly, the control device program derives a second standard, S220, based on information about DOC2. Therefore, the determined first standard and the determined second standards, S210 and S220, characterize the extent to which the measured and operating values ​​correspond to the expected state of SDPF6 or DOC5.

[0122] The control device program includes a command S310 to compare the obtained first standard S210 with a first nominal value and a first defect value. The first nominal value represents the normal functional state of the SDPF6, and the first defect value represents the defective state of the SDPF6. If the SDPF6 is in the nominal state, then the obtained first standard S210 substantially corresponds to the first nominal value. The further the SDPF6 deviates from the nominal state, i.e., the more defective it becomes, the further the obtained first standard S210 deviates from the first nominal value and the closer it is to the first defect value.

[0123] If the detected NOx emissions and the detected state of SDPF6 correspond as closely as possible to the expected values ​​of the detected revolutions and detected loads, then the calculated first standard S210 is closer to the first nominal value than the first defect value.

[0124] If the detected NOx emissions and the detected state of SDPF6 do not correspond to the expected values, then the calculated first criterion S210 is closer to the first defect value than the first nominal value. If only the detected NOx emissions or only the detected state of SDPF6 corresponds to the expected values, then the calculated first criterion S200 may be relatively centered between the first nominal value and the first defect value. Therefore, it is not possible to definitively determine whether the SDPF6 is defective or functional.

[0125] The control device program also includes a command S320 to compare the obtained second standard S220 with the second nominal value and the second defect value. The second nominal value represents the normal functional state of DOC5, and the second defect value represents the defective state of DOC5. If DOC5 is in the nominal state, then the obtained second standard S220 basically corresponds to the second nominal value. The further DOC5 deviates from the nominal state, that is, the more defective it becomes, the further the obtained second standard S220 is from the second nominal value and the closer it is to the second defect value.

[0126] Based on the degree to which the detected state of DOC5 corresponds to the expected value of the detected revolutions and load, the derived second standard S220 is closer to the second defect value or closer to the second nominal value.

[0127] To robustly determine the states of SDPF6 and DOC5, the control device program includes commands that consider the relative positions of the first or second standard, the first and second defect measurements, and the first and second de-jittering speeds when determining the states. To this end, the control device program first determines the relative positions of the first and second standards in S410 and S420 by calculating the distances of the first standard from the first nominal value and the first defect value, and calculating the distances of the second standard from the second nominal value and the second defect value.

[0128] To determine the first and second defect measurements of S510, the control device program includes a command that maps the value range between the first nominal value and the first defect value, and between the second nominal value and the second defect value, to the value range between values ​​A and B between the two defined values. Values ​​A and B are as follows: Figure 3The above diagram shows 0 and 1. The control device program uses a linear function as the mapping function for the exemplary operating point of powertrain 2. The control device program uses other functions for some operating points, and sometimes different functions, to determine the first and second defect values. The first and second nominal values ​​NW are mapped to value A, while the first and second defect values ​​DW are mapped to value B.

[0129] The values ​​of the first and second standards located on the side of the first or second nominal value NW that deviate from the first or second defective value DW are mapped to values ​​less than A. The values ​​of the first and second standards located on the side of the first or second defective value DW that deviate from the first or second nominal value NW are mapped to values ​​greater than B. For these mappings, the control device program uses the same linear function; the control device program uses different functions or extrapolation methods for some operating points to map the first and / or second standards. The linear function is here constrained upwards and downwards, such that values ​​exceeding the first or second nominal value and the first and second limit values, i.e., values ​​less than A or greater than B, tend towards the limit values.

[0130] The first standard's mapping value corresponds to the defect measure of SDPF6, i.e., the first defect measure, and the second standard's mapping value corresponds to the defect measure of DOC5, i.e., the second defect measure. Mapping values ​​below or close to A indicate that SDPF6 or DOC5 is functioning normally, while values ​​close to or above B indicate that SDPF6 or DOC5 is defective. Results between A and B are ambiguous.

[0131] To determine the first and second de-jitter speeds, the control device program includes processing the determined first defect measure and the determined second defect measure as shown in... Figure 3 The commands are mapped to another value range as shown in the lower diagram. This other value range is defined by three values ​​C, D, and E. Here, C is less than D, and D is less than E, i.e., C = -1, D = 0, and E = 1. Here, the first or second defect measure near point A is mapped to C, the first or second defect measure near a preset defect measure between A and B is mapped to D, and the first or second defect measure near point B is mapped to E. The preset defect measure corresponds to the following limit values, which are defined as the boundary between a functional and a defective SDPF6 or DOC5.

[0132] The mapping function is continuous, but its slope is zero in the region of value D. For very large and very small values ​​of the first or second defect measure, the function is constrained and tends towards the lower and upper limits.

[0133] The control device program uses the determined first and second dejitter speeds as parameters for determining the state of SDPF6 and DOC5. Before the determined state is considered robust, some definitive results are sufficient when the first or second dejitter speed is high (i.e., close to 1 or -1), while many results are required when the first or second dejitter speed is low (i.e., close to 0). Here, a negative first or second dejitter speed corresponds to a functional SDPF6 or DOC5, while a positive first or second dejitter speed corresponds to a defective SDPF6 or DOC5.

[0134] In cases where the first or second defect measure is ambiguous between A and B, the first or second dejitter rate is 0 or close to 0, and the state determination of SDPF6 or DOC5 never terminates or continues for a very long time. This is consistent with ambiguous results and addresses the problem of random results in such situations.

[0135] To determine the first, second, and third emission impacts of S610, S620, and S630 based on the determined first defect measure and the determined second defect measures S510, S520, the control device program includes mapping the determined first defect measure S510 to a value range defined by two additional pass values ​​F and G, as shown in... Figure 6 As shown in the upper and lower diagrams, the determined second defect measure S520 is mapped to another value range defined by values ​​F and G, as in Figure 6 As shown in the upper part of the diagram.

[0136] in this case, Figure 6 The upper part of the diagram corresponds to the first and third emission impacts, while Figure 6 The lower part of the diagram corresponds to the second emission impact. Here, the first emission impact describes the effect of the first defect measure S510 on NOx emissions, the second emission impact describes the effect of the first defect measure S510 on NH3 emissions, and the third emission impact describes the effect of the second defect measure S520 on HC emissions.

[0137] The control device program here performs the determination of the effects of the first, second, and third emissions S610, S620, and S630, such that the average values ​​of the first and second defect measures are first formed during the de-vibration time period. The de-vibration time period corresponds to a time period during which the determination of the state of SDPF6 or DOC5 based on the first or second de-vibration speed can be considered robust. Based on the averaged first defect measure and the averaged second defect measure, the control device program then determines the effects of the first, second, and third emissions S610, S620, and S630. The control device program here selects the operating point of the powertrain 2 based on the... Figure 3 and 6 The selected functions are shown in the figure, and different functions are used at least in part for the effects of the first and third emissions.

[0138] The control device program also includes commands to consider the first, second, and third nominal emissions of SDPF6 and DOC5 when determining the first, second, and third emission effects of S610, S620, and S630. This is additionally performed by the control device program to arrive at the first, second, and third emission effects as follows:

[0139] E1 = E 1，nominal +K1(D1), E2=E 2，nominal +K2(D1)und E3=E 3，nominal +K3(D2)

[0140] Among them, E1 is the first emission impact, E2 is the second emission impact, E3 is the third emission impact, and E... 1，nominal It is the first nominal emission of SDPF6, E 2，nominal It is the second nominal emission of SDPF6, E 3，nominal K1(D1) and K2(D1) are the coefficients related to the first defect measure D1 by the effects of the first and second emissions, while K3(D2) is the coefficient related to the second defect measure D2 by the effects of the third emissions.

[0141] The control equipment program includes commands to determine the total emission impact of powertrain 2 based on the first, second, and third emission impacts, and to monitor the emission performance of the powertrain based on the total emission impact.

[0142] To this end, the control equipment program first determines the linear and independent additive effects of the first, second, and third emissions:

[0143] E Ges =E Ges，nominal +∑K i ,

[0144] Where i = 1, 2, 3.

[0145] Based on the total emissions impact, the control device program monitors the emissions performance of the S700 powertrain 2 by comparing the total emissions impact with limits stored in the control device. If the emissions performance of powertrain 2 is within the nominal range based on the comparison, no intervention from the control device is required. Conversely, if the emissions performance of the powertrain is outside the nominal range, i.e., violating one or more limits, the control device controls the powertrain by altering its operation or instructing the vehicle operator to perform maintenance, repair, and / or at least inspection of the defective component, in this case, SDPF6 or DOC5. If the emissions performance deviates significantly from the limits, the control device shuts down powertrain 2 to prevent, for example, permanent damage to SDPF6, DOC5, or other components.

[0146] In an alternative embodiment not shown, the control device program includes the following commands:

[0147] - By means of E=E nominal ·∏F i A linear, uncorrelated multiplication, where F i It is a factor related to the measure of defects in the impact of emissions.

[0148] -Based on E = E(D1…,D n A common mapping of all defect measures, or

[0149] -Based on E = E(D1, ..., D) n ) or E = E nominal ·ΠF ij (D i D j The mapping performed by the paired interaction of two defect measures.

[0150] To determine the total emissions impact.

[0151] In particular, the advantage of determining the impact based on a common mapping and a mapping based on paired interactions is that it allows for the direct determination of the total emission impact based on the defect metric. Thus, it is not necessary to determine the individual emission impacts.

Claims

1. A control device (1) for monitoring a machine (2), wherein the control device (1) is configured and set up to perform the following steps: In step S10, the measured values ​​and / or operating values ​​of the machine (2) are detected. In step S20, a standard is derived based on the detected measured values ​​and / or operating values. In step S30, the standard is compared with a nominal value, wherein the nominal value represents the normal functional state of the machine (2), and in step S31, the relative position of the standard with respect to the nominal value is determined, and In step S40, the state of the machine (2) is determined based on the comparison result and the determined relative position. The control device (1) is configured and set up to additionally consider a defect value during step S30, wherein the defect value represents a defective state of the machine (2), and to determine the relative position of the standard with respect to the nominal value and with respect to the defect value in step S31. The control device (1) is configured and set up to determine the defect measure in step S32 based on the relative position of the standard, and to take into account the defect measure determined in step S32 when determining the state of the machine (2) in step S40. The control device (1) described therein is configured and set up to determine the defect measurement through the following step S32: The range between the nominal value and the defect value is mapped to a range defined by two values ​​A and B. Map the nominal value to the defined value A, and map the defect value to the defined value B, and The standard is mapped to a value less than or equal to A, greater than or equal to B, or to a value range between A and B based on its relative position, wherein the mapping of the standard corresponds to the defect measure of the machine (2), and the state of the machine (2) is determined in step S40 based on the defect measure determined in step S32.

2. The control device (1) for monitoring the machine (2) according to claim 1, wherein the control device (1) is configured and set up to repeatedly execute steps S10, S20, S30, S31 and S40.

3. The control device (1) for monitoring the machine (2) according to claim 1 or 2, wherein the control device (1) is configured and set up to determine the de-jittering speed in step S33 based on the relative position of the standard, and to take into account the de-jittering speed determined in step S33 when determining the state of the machine (2) in step S40.

4. The control device (1) for monitoring a machine (2) according to claim 1 or 2, wherein the control device (1) is configured and set up to determine the probability of the machine (2) being functional and / or defective based on the relative position of the standard, and the determined probability is taken into account when determining the state of the machine (2) in step S40.

5. The control device (1) for monitoring the machine (2) according to claim 1, wherein the control device (1) is configured and set up to determine the de-jittering speed by means of the following step S33, by mapping the defect measure determined in step S32 onto a value range defined by three values ​​C, D and E: Defect metrics corresponding to value A are mapped to value C, defect metrics corresponding to value B are mapped to value E, and preset defect metrics between values ​​A and B are mapped to value D. Defect metrics that do not correspond to values ​​A and B or preset defect metrics are mapped to values ​​less than C and greater than E, or to values ​​between C and E, where the mapping of defect metrics corresponds to the de-jittering speed. And the state of the machine (2) is determined in step S40 based on the de-jittering speed determined in step S33 and / or the defect measure determined in step S32.

6. The control device (1) for monitoring the machine (2) according to claim 1, wherein the control device (1) is configured and set up for performing step S30. Perform a first mapping of the defect measure to a value range from zero to one, wherein defect measures less than or equal to A are mapped to the value 1, defect measures greater than or equal to B are mapped to the value 0, and defect measures between A and B are mapped to values ​​between zero and one, such that the first mapping corresponds to a first probability that the machine (2) is functioning correctly. Perform a second mapping of the defect measure to a value range from zero to one, wherein defect measures less than or equal to A are mapped to the value 0, defect measures greater than or equal to B are mapped to the value 1, and defect measures between A and B are mapped to values ​​between zero and one, such that the second mapping corresponds to a second probability that the machine (2) is defective. The product of the first and second probabilities is obtained by repeatedly calculating the first and second probabilities and multiplying them separately. The product of the first and second probabilities is compared with the first and second limit values, and the state of the machine (2) is determined in step S40 based on the result of the comparison.

7. A control device (1) for monitoring a machine (2) according to any one of claims 1 to 6, wherein the control device (1) is configured and set up for monitoring the emission performance of the machine (2) and for performing the following steps: Determine the first defect measure of the first component of the machine (2). The first emission impact is determined based on the identified first defect metric, and The emission performance of the machine (2) is monitored based on the first emission impact.

8. The control device (1) for monitoring the machine (2) according to claim 7, wherein the control device (1) is configured and set up for using statistical functions in determining the first emission impact.

9. The control device (1) for monitoring a machine (2) according to claim 7 or 8, wherein the control device (1) is configured and set up to take into account the nominal emissions of the machine (2) when determining the first emission impact.

10. The control device (1) for monitoring a machine (2) according to claim 7 or 8, wherein the control device (1) is configured and set up to determine at least one additional emission impact and monitor the emission performance of the machine (2) based on the first emission impact and the at least one additional emission impact.

11. The control device (1) for monitoring a machine (2) according to claim 10, wherein the control device (1) is configured and set up to determine the total emission impact of the machine (2) based on the first emission impact and the at least one additional emission impact, and to monitor the emission performance of the machine (2) based on the total emission impact.

12. The control device (1) for monitoring the machine (2) according to claim 11, wherein the control device (1) is configured and provided for, The total emission impact is performed based on a linear and uncorrelated addition or multiplication of the first emission impact and the at least one other emission impact. The total emissions impact is determined based on the first defect metric and at least one additional defect metric, and / or The total emission impact is determined based on the paired interaction of the first defect metric and the at least one additional defect metric.

13. The control device (1) for monitoring the machine (2) according to claim 10, wherein the first emission impact and the at least one additional emission impact are determined based on a function, and the function is formulated in relation to the operating point.

14. The control device (1) for monitoring a machine (2) according to claim 7 or 8, wherein the control device (1) is configured and set up for determining a first defect measure and / or at least one additional defect measure of a first and / or at least one additional component by means of the following steps: Detect the measured values ​​and / or operating values ​​of the machine (2), Standards are derived based on the detected measurements and / or operational values. The standard is compared with the nominal value, where the nominal value represents the normal functional state of the machine (2). Determine the relative position of the standard with respect to the nominal value. The value range between the nominal value and the defect value of the first and / or at least one other component will be mapped to a value range defined by two values ​​A and B, wherein the defect value represents the defective state of the machine (2). Map the nominal value to the defined value A, and map the defect value to the defined value B, and The standard is mapped to a value less than or equal to A, greater than or equal to B, or between A and B, based on the relative position of the standard, wherein the mapping of the standard corresponds to the defect measure of the first and / or at least one other component.

15. The control device (1) for monitoring a machine (2) according to claim 7 or 8, wherein the control device (1) is configured and set up for controlling the machine (2) based on the monitored emissions performance.

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