A Simple CCD Full Well Test Method

Through the simple LED point testing method, the LED point light source is used to combine with ordinary imaging lenses to cover 3×3 cell areas, analyze the changes in DN value, and obtain the full well value in combination with the numerical calculation method, solving the problem of low full well test efficiency of existing CCD imaging circuits, and achieving efficient and accurate full well testing.

CN114584757BActive Publication Date: 2025-04-11HEFEI INSTITUTE OF PHYSICAL SCIENCE CHINESE ACADEMY OF SCIENCES
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Patent Information

Application Number
CN202111500957.9
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2021-12-09
Publication Date
2025-04-11
Estimated Expiration
2041-12-09

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Abstract

The invention discloses a simplified CCD full well test method, which comprises system construction: driving an LED to emit light through a voltage-adjustable power supply to obtain a point light source with different brightness; obtaining an LED image through an ordinary civilian lens; controlling the position of the LED in the CCD pixel through a two-dimensional displacement platform; and also comprises a data acquisition method: adjusting the position of the LED relative to the CCD to make the LED spot irradiation range about 9 pixels; obtaining the pixel that overflows first by analyzing the DN value of each pixel as the LED brightness increases; and obtaining the DN value growth inflection point of the pixel that overflows first by analyzing the DN value changes of the central pixel and the pixel that overflows first through nonlinear interpolation and curve fitting methods, the DN value of the central pixel corresponding to the point is the full well DN value, and the CCD pixel full well value can be calculated in combination with the system gain.
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