Quantum efficiency test fixture for perovskite solar cells

Abstract

The application discloses a kind of perovskite solar cell quantum efficiency test clamps, belong to solar cell test clamp technical field.It includes: base, it is equipped with first light hole;Fixed component is connected with base and has first storage area, when solar cell is placed in first storage area, the contact area of solar cell is erected on base and its illumination area covers first light hole;Positioning frame is connected with fixed component, positioning frame is equipped with second storage area, when circuit board is placed in second storage area, circuit board is contacted with each contact on the contact area of solar cell.In actual operation process, only solar cell is placed into first storage area, the position of solar cell can be fixed, the position of each contact of solar cell is same with the test position of standard tester at this time, ensure to have same irradiance, simple and convenient to operate, and the repeatability of test is good, and previous test result can be reproduced in multiple measurements.

Description

Technical Field

[0001] This invention belongs to the field of solar cell testing fixture technology, specifically relating to a perovskite solar cell quantum efficiency testing fixture. Background Technology

[0002] Perovskite solar cells are a novel type of optoelectronic device that has emerged in recent years. After just over a decade of development, their photoelectric efficiency has reached a level comparable to that of commercially available silicon-based and thin-film solar cells, making them a highly promising optoelectronic device. The characterization of their photoelectric performance mainly includes JV performance testing and quantum efficiency testing. Quantum efficiency testing characterizes the solar cell's response to the incident spectrum, primarily reflecting parameters such as the absorption start and cutoff wavelengths and the integrated current within the spectral range. It is an important method for characterizing photoelectric performance.

[0003] In current national standards, the quantum efficiency characterization of solar cells mainly involves comparing a calibrated standard detector with the sample under test. Driven by a monochromator, the electrical signal obtained under the same irradiance is detected, and the device's response at different wavelengths is calculated mathematically. During the comparison, to ensure that the irradiance of the sample under test and the detector are the same, the relative position of the test position of the sample and the detector must be the same. However, in current commercial quantum efficiency testing systems, the fixtures are generally matched to the size of silicon-based solar cells, and their relative positions are difficult to adjust and fix.

[0004] In other words, the lack of dedicated fixtures makes it difficult to accurately position perovskite solar cells during quantum efficiency testing. This makes it impossible to ensure that the perovskite solar cell and the tester are in the same test position, and consequently, to guarantee the same irradiance. This results in significant issues such as large deviations in test results and poor repeatability. Summary of the Invention

[0005] This invention addresses the aforementioned problems in existing technologies by proposing a perovskite solar cell quantum efficiency testing fixture that facilitates the fixation and precise positioning of perovskite solar cells.

[0006] This invention can be achieved through the following technical solutions: A quantum efficiency testing fixture for perovskite solar cells includes: The base has a first light-transmitting hole; A fixing component is connected to the base and has a first placement area for placing a solar cell. When the solar cell is placed in the first placement area, the contact area of ​​the solar cell is mounted on the base and its light-emitting area covers the first light-transmitting hole. A positioning frame, which is connected to the fixing component, is provided with a second placement area for placing the circuit board. When the circuit board is placed in the second placement area, the circuit board contacts each contact on the solar cell contact area.

[0007] As a further improvement of the present invention, the fixing component includes a buffer frame and a spring, the buffer frame being placed on the base and the two being connected by the spring.

[0008] As a further improvement of the present invention, the fixing component further includes a fixing bracket, which is sleeved on the buffer frame and connected to the base by fasteners. A cavity is formed between the fixing bracket and the base, and the buffer frame is movably disposed in the cavity.

[0009] As a further improvement of the present invention, the top surface of the buffer frame is provided with a limiting part, and the bottom of the fixed bracket is correspondingly formed with a blocking part, and the buffer frame can be moved until the limiting part and the blocking part abut against each other.

[0010] As a further improvement of the present invention, one end of the positioning frame is hinged to the fixed bracket to form a flip-top structure, and a locking structure is provided between the other end of the positioning frame and the fixed bracket.

[0011] As a further improvement of the present invention, the locking structure is configured as a spring buckle, and the positioning frame and the fixing bracket are respectively provided with a first positioning pin and a second positioning pin at the ends used to install the spring buckle.

[0012] As a further improvement of the present invention, the snap fastener is provided with a clamping part, a fastening part and a pressing part. The clamping part is sleeved on the first positioning pin, the fastening part is fastened to the second positioning pin, and the fastening part is separated from the second positioning pin by pressing the pressing part.

[0013] As a further improvement of the present invention, the end of the base away from the buffer frame is provided with a threaded opening for installing an external optical fiber attenuation device, and the threaded opening is connected to the first light-transmitting hole.

[0014] As a further improvement of the present invention, the positioning frame is provided with a second light-transmitting hole, which is connected to the first placement area.

[0015] Compared with the prior art, the present invention has the following beneficial effects: 1. In actual operation, simply place the perovskite solar cell in the first placement area to fix its position. At this time, the positions of each contact of the perovskite solar cell are the same as the test positions of the standard tester, ensuring the same irradiance. The operation is simple and convenient. When taking multiple measurements, simply place the perovskite solar cell in the first placement area and clamp it with the fixture to reproduce the previous test results. The repeatability of the test is good.

[0016] 2. After the perovskite solar cell is placed in the first storage area and the circuit board is placed in the second storage area, the clamp is secured. At this time, the circuit board is fixed on top of the perovskite solar cell. Since the spring always provides an upward elastic force to the buffer frame, this elastic force can slightly lift the buffer frame upward, thereby lifting the perovskite solar cell upward. This ensures that all contacts on the perovskite solar cell can contact the circuit board. On the one hand, this ensures the accurate positioning of the perovskite solar cell and the accuracy of the test results. On the other hand, it also ensures that the cell will not be damaged when the perovskite solar cell is placed multiple times.

[0017] 3. The size of the first storage area can be adapted to different perovskite solar cells for testing, improving the overall adaptability of the fixture during use.

[0018] 4. The bottom surface of the buffer frame is provided with a limiting part, while the top surface of the fixed bracket is correspondingly formed with a blocking part. The buffer frame can be lifted upward by spring force until the limiting part and the blocking part collide, thereby ensuring that the buffer frame is always located in the cavity, and thus ensuring that the perovskite solar panel will not be damaged after contacting the circuit board due to the buffer frame being lifted too much upward.

[0019] 5. After the perovskite solar cell and circuit board are placed, close the positioning frame and lock it with the locking structure. At this time, the circuit board and the perovskite solar cell are in contact, so the quantum efficiency of the perovskite solar cell can be tested. After the test is completed, simply open the locking structure and flip the positioning frame to take out the perovskite solar cell. This is more convenient and solves the problem of the relatively troublesome process of taking out and retesting perovskite solar cells. Attached Figure Description

[0020] Figure 1 This is a schematic diagram of the structure of a perovskite solar cell quantum efficiency testing fixture according to the present invention; Figure 2 This is the invention Figure 1 An explosion diagram; Figure 3 This is a schematic diagram of the structure of the buffer frame of the present invention; Figure 4 This is a schematic diagram of the positioning frame of the present invention; Figure 5 This is a schematic diagram of the base of the present invention; Figure 6 This is a schematic diagram of the perovskite solar cell structure of the present invention.

[0021] In the diagram, 100 is the base; 110 is the first light-transmitting hole; 120 is the threaded opening; 200 is the fixing component; 210 is the first storage area; 220 is the buffer frame; 221 is the clearance groove; 222 is the limiting part; 230 is the spring; 240 is the fixing bracket; 241 is the blocking part; 250 is the second positioning pin; 300 is the perovskite solar cell; 310 is the contact area; 320 is the illumination area; 400 is the positioning frame; 410 is the second storage area; 420 is the first positioning pin; 430 is the second light-transmitting hole; 500 is the circuit board; 600 is the spring clip; 610 is the clamping part; 620 is the fastening part; and 630 is the pressing part. Detailed Implementation

[0022] The following are specific embodiments of the present invention, which are described in conjunction with the accompanying drawings to further illustrate the technical methods of the present invention. However, the present invention is not limited to these embodiments.

[0023] like Figure 1-6 As shown, the present invention provides a quantum efficiency testing fixture for perovskite solar cells, comprising: The base 100 has a first light-transmitting hole 110. The light emitted from the external monochromator passes through the first light-transmitting hole 110 after passing through the attenuator and then illuminates the inside of the fixture.

[0024] The fixing component 200 is connected to the base 100 and has a first placement area 210 for placing the perovskite solar cell 300. When the perovskite solar cell 300 is placed in the first placement area 210, the contact area 310 of the perovskite solar cell 300 is mounted on the base 100 and its illumination area 320 covers the first light-transmitting hole 110. The light emitted from the external monochromator is irradiated by the attenuator and, after passing through the first light-transmitting hole 110, can irradiate the illumination area 320 of the perovskite solar cell 300. In actual operation, the perovskite solar cell 300 is simply placed in the first placement area 210, and its position is fixed. At this time, the positions of each contact of the perovskite solar cell 300 are the same as the test positions of the standard tester, ensuring the same irradiance. The operation is simple and convenient. When taking multiple measurements, the perovskite solar cell 300 can be placed in the first placement area 210 and clamped by the fixture to reproduce the previous test results. The repeatability of the test is good.

[0025] The positioning frame 400 is connected to the fixing component 200. The positioning frame 400 has a second placement area 410 for placing the circuit board 500. When the circuit board 500 is placed in the second placement area 410, the circuit board 500 contacts the contacts on the contact area 310 of the perovskite solar cell 300.

[0026] Preferably, the fixing component 200 includes a buffer frame 220 and a spring 230. The buffer frame 220 is placed on the base 100 and the two are connected by the spring 230. Specifically, when the perovskite solar cell 300 is placed in the first storage area 210 and the circuit board 500 is placed in the second storage area 410, the clamp is clamped. At this time, the circuit board 500 is fixed on the top of the perovskite solar cell 300. Since the spring 230 always provides an upward elastic force to the buffer frame 220, this elastic force can slightly lift the buffer frame 220 upward, so that the buffer frame 220 can lift the perovskite solar cell 300 upward, ensuring that each contact on the perovskite solar cell 300 can contact the circuit board 500. On the one hand, this ensures the accurate positioning of the perovskite solar cell 300 and the accuracy of the test results. On the other hand, it also ensures that the battery will not be damaged when the perovskite solar cell 300 is placed multiple times.

[0027] The method of using spring 230 to lift buffer frame 220 to ensure that each contact of perovskite solar cell 300 can contact circuit board 500 has a simple overall structure. In actual application, it is only necessary to place perovskite solar cell 300 and circuit board 500 in the designated position and clamp them. There is no need to add additional structures or manually tighten screws to ensure contact between the two, which makes the whole testing process simpler and more convenient while ensuring the accuracy of the test results.

[0028] Furthermore, the perovskite solar cell 300 is arranged in a rectangular structure, with contact areas 310 on both sides and a light-illuminating area 320 in the middle. When the perovskite solar cell 300 is placed in the first placement area 210, the contact areas 310 on both sides are supported on the buffer frame 220, and the light-illuminating area 320 in the middle is located at the first light-transmitting hole 110. In this embodiment, since different perovskite solar cells have different light-illuminating areas, it is only necessary to first place a mask plate with a corresponding size light-transmitting groove in the first placement area 210, and then cover the perovskite solar cell on the mask plate. The light emitted from the external monochromator can pass through the light-transmitting groove of the mask plate and then illuminate the light-illuminating area of ​​the perovskite solar cell. In other words, when it is necessary to test the quantum efficiency of a certain perovskite solar cell, only a corresponding mask plate needs to be selected, so that the entire test fixture can be applied to different perovskite solar cells, improving the adaptability of the test fixture.

[0029] In a further preferred embodiment, the buffer rack 220 is also provided with a relief groove 221. When it is necessary to pick up the perovskite solar cell, the tweezers can be inserted into the relief groove 221 to pick up the perovskite solar cell. Conversely, when placing the perovskite solar cell, the tweezers are also inserted into the relief groove 221, which improves the convenience of placing and picking up the perovskite solar cell.

[0030] Preferably, the fixing component 200 further includes a fixing bracket 240, which is sleeved on the buffer frame 220 and connected and fixed to the base 100 by fasteners. When the fixing bracket 240 is connected to the base 100, a cavity is formed between the two. The buffer frame 220 is movably disposed in the cavity, thereby ensuring that the buffer frame 220 can be lifted upward under the action of spring force, thereby ensuring good connection between the perovskite solar cell 300 and the circuit board 500.

[0031] In a further preferred embodiment, the top surface of the buffer frame 220 is provided with a limiting part 222, while the bottom of the fixed bracket 240 is correspondingly formed with a blocking part 241. The buffer frame 220 can be lifted upward by spring force until the limiting part 222 and the blocking part 241 abut against each other, thereby ensuring that the buffer frame 220 is always located in the cavity, and thus ensuring that the perovskite solar cell 300 panel will not be damaged after contacting the circuit board 500 due to the buffer frame 220 being lifted too much.

[0032] Preferably, one end of the positioning frame 400 is hinged to the fixed bracket 240 to form a flip-top structure, and the other end of the positioning frame 400 is provided with a locking structure between it and the fixed bracket 240. After the perovskite solar cell 300 and the circuit board 500 are placed, the positioning frame 400 is closed and locked by the locking structure. At this time, the circuit board 500 and the perovskite solar cell 300 are in contact, so the quantum efficiency of the perovskite solar cell 300 can be tested. After the test is completed, the perovskite solar cell 300 can be taken out simply by opening the locking structure and flipping the positioning frame 400. This is more convenient and solves the problem of the relatively troublesome process of taking out and retesting the perovskite solar cell 300.

[0033] Preferably, the locking structure is configured as a spring buckle 600, and the positioning frame 400 and the fixed bracket 240 are respectively provided with a first positioning pin 420 and a second positioning pin 250 at the end for mounting the spring buckle 600, with the first positioning pin 420 and the second positioning pin 250 arranged vertically.

[0034] Preferably, the snap fastener 600 has a clamping part 610, a fastening part 620, and a pressing part 630. The clamping part 610 is sleeved on the first positioning pin 420, the fastening part 620 is fastened to the second positioning pin 250, and the pressing part 630 is tilted upwards. When opening the positioning frame 400, it is only necessary to press the pressing part 630 downwards. Since the snap fastener 600 itself has a certain deformation capability, it can drive the fastening part 620 to tilt outwards and separate from the second positioning pin 250. At this time, the positioning frame 400 can be opened by flipping the cover. Conversely, when locking the positioning frame 400, it is only necessary to press the fastening part 620 inwards until the fastening part 620 is fastened to the second positioning pin 250. The entire locking and opening process of the positioning frame 400 is simple and convenient and can be completed with one hand.

[0035] Preferably, the end of the base 100 away from the buffer frame 220 is provided with a threaded opening 120 for installing an external optical fiber attenuation device. The threaded opening 120 is connected to the first light-transmitting hole 110, so that the light emitted from the external monochromator after passing through the attenuator can pass through the first light-transmitting hole 110 and illuminate the illumination area 320 of the perovskite solar cell 300.

[0036] Preferably, the positioning frame 400 is provided with a second light-transmitting hole 430, which is connected to the first placement area. That is, the attenuator can also shine light from the second light-emitting port on the positioning frame 400 onto the illumination area 320 of the perovskite solar cell 300 located in the first placement area. In this case, a through hole for light to pass through can be opened on the circuit board 500 accordingly. That is, light can pass through the circuit board 500 to illuminate the illumination area 320 of the perovskite solar cell 300. By setting the upper and lower light-transmitting holes, the fixture can select the appropriate light-transmitting hole to illuminate the perovskite solar cell 300 according to actual needs during testing, further improving the convenience of the fixture during use.

[0037] The technical means disclosed in this invention are not limited to those described above, but also include technical solutions composed of any combination of the above technical features. The above are specific embodiments of this invention. It should be noted that those skilled in the art can make various improvements and modifications without departing from the principle of this invention, and these improvements and modifications are also considered within the scope of protection of this invention.

[0038] It should be noted that all directional indications (such as up, down, left, right, front, back, etc.) in the embodiments of the present invention are only used to explain the relative positional relationship and movement of each component in a certain specific posture (as shown in the figure). If the specific posture changes, the directional indication will also change accordingly.

[0039] Furthermore, in this invention, descriptions involving terms such as "first," "second," and "a" are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this invention, "a plurality of" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0040] In this invention, unless otherwise explicitly specified and limited, the terms "connection," "fixed," etc., should be interpreted broadly. For example, "fixed" can mean a fixed connection, a detachable connection, or an integral part; it can mean a mechanical connection or an electrical connection; it can mean a direct connection or an indirect connection through an intermediate medium; it can mean the internal communication of two components or the interaction between two components, unless otherwise explicitly limited. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0041] Furthermore, the technical solutions of the various embodiments of the present invention can be combined with each other, but only if they are feasible for those skilled in the art. If the combination of technical solutions is contradictory or cannot be implemented, it should be considered that such combination of technical solutions does not exist and is not within the scope of protection claimed by the present invention.

Claims

1. A quantum efficiency testing fixture for perovskite solar cells, characterized in that, include: The base has a first light-transmitting hole; A fixing component is connected to the base and has a first placement area for placing a solar cell. When the solar cell is placed in the first placement area, the contact area of ​​the solar cell is mounted on the base and its light-emitting area covers the first light-transmitting hole. A positioning frame, which is connected to the fixing component, is provided with a second placement area for placing a circuit board. When the circuit board is placed in the second placement area, the circuit board contacts each contact on the solar cell contact area. The fixing component includes a buffer frame and a spring. The buffer frame is placed on the base and the two are connected by the spring. The spring is used to apply an upward elastic force to the buffer frame to hold the solar cell upward via the buffer frame, so that the contacts of the solar cell abut against the circuit board. The fixing component also includes a fixing bracket, which is sleeved on the buffer frame and connected to the base by fasteners. A cavity is formed between the fixing bracket and the base, and the buffer frame is movably disposed in the cavity. The top surface of the buffer frame is provided with a limiting part, while the bottom of the fixed bracket is correspondingly formed with a blocking part. The buffer frame can be moved until the limiting part and the blocking part abut against each other. One end of the positioning frame is hinged to the fixed bracket to form a flip-top structure, and a locking structure is provided between the other end of the positioning frame and the fixed bracket; The locking structure is configured as a spring buckle, and the positioning frame and the fixed bracket are respectively provided with a first positioning pin and a second positioning pin at the ends used to install the spring buckle.

2. The perovskite solar cell quantum efficiency testing fixture according to claim 1, characterized in that, The snap fastener has a clamping part, a fastening part, and a pressing part. The clamping part is sleeved on the first positioning pin, and the fastening part is fastened to the second positioning pin. The fastening part is separated from the second positioning pin by pressing the pressing part.

3. The perovskite solar cell quantum efficiency testing fixture according to claim 1, characterized in that, The base has a threaded opening at one end away from the buffer frame for mounting an external optical fiber attenuation device, and the threaded opening is connected to the first light-transmitting hole.

4. The perovskite solar cell quantum efficiency testing fixture according to claim 1, characterized in that, The positioning frame is provided with a second light-transmitting hole, which is connected to the first storage area.

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