Test device with parallel impedance to reduce measured input impedance and related apparatus, systems, and methods

CN114660364BActive Publication Date: 2026-06-05MICRON TECHNOLOGY INC

Patent Information

Authority / Receiving Office: CN · China
Patent Type: Patents(China)
Current Assignee / Owner: MICRON TECHNOLOGY INC
Filing Date: 2021-12-07
Publication Date: 2026-06-05

AI Technical Summary

Technical Problem

Before the test signal is provided to the device under test (DUT), existing technologies cannot effectively verify the test signal, which leads to a mismatch between the input impedance of the electrical measuring instrument and the input impedance of the DUT. This may cause the electrical measuring instrument to malfunction or be damaged, and at the same time, it is impossible to accurately measure the electrical signal of the DUT.

Method used

By introducing a parallel resistor into the test setup, the effective measurement input impedance of the electrical measuring instrument is reduced to match the circuit system impedance of the DUT. The parallel resistor is connected in parallel with the electrical measuring instrument, and the parallel resistor is selected to reduce the input impedance to be approximately the same as the circuit system impedance of the DUT.

Benefits of technology

Impedance matching between the electrical measuring instrument and the DUT circuit system is achieved, ensuring that the electrical measuring instrument can accurately measure the electrical signal of the DUT, avoiding failure or damage to the electrical measuring instrument, and ensuring the effective verification of the test signal.

✦ Generated by Eureka AI based on patent content.

Smart Images

Figure CN114660364B_ABST

Patent Text Reader

Abstract

Systems, apparatuses, and methods for a test device with a shunt impedance to reduce a measured input impedance are disclosed. An apparatus includes a test input, a measurement output, a reference voltage potential node, and a shunt resistor. The test input is configured to electrically connect to a signal output of a signal generator. The test input is configured to receive a test signal from the signal generator via the signal output. The measurement output is electrically connected to a measurement input of an electrical measurement instrument. The shunt resistor is electrically connected from the measurement output to the reference voltage potential node. A system includes the apparatus and the electrical measurement instrument. A method includes providing a test signal to a test device, verifying the test signal using an electrical measurement instrument, and providing the test signal to a device under test.

Need to check novelty before this filing date? Find Prior Art