Memory circuit and method of operation thereof
CN114927148BActive Publication Date: 2026-06-26TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
- Filing Date
- 2022-01-19
- Publication Date
- 2026-06-26
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Figure CN114927148B_ABST
Abstract
Embodiments of the present invention provide a memory circuit and a method of operating the same. The memory circuit includes a non-volatile memory cell, a sense amplifier connected to the non-volatile memory cell and configured to generate a first output signal, and a detection circuit connected to the sense amplifier and the non-volatile memory cell. The detection circuit is configured to latch the first output signal and interrupt a current path between the non-volatile memory cell and the sense amplifier.
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