缺陷检查方法及缺陷检查装置

By employing a specific angle configuration of polarizers and phase difference compensation plates in an optical film with protective and release films stacked on a linear polarizer, the problem of detecting uneven optical properties was solved, achieving high-precision defect detection.

CN115015281BActive Publication Date: 2026-07-17SUMITOMO CHEM CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
SUMITOMO CHEM CO LTD
Filing Date
2022-03-01
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

Existing technologies struggle to detect the unevenness of optical properties when protective and release films are stacked on a linear polarizing plate, and the detection accuracy is reduced due to the influence of birefringence.

Method used

A polarizer and a phase difference compensation plate are configured at a specific angle. The first polarizer, the phase difference compensation plate, the optical film, and the second polarizer are sequentially arranged through the optical axis of the optical film. The phase difference compensation plate is used to compensate for the birefringence of the stripping film and to detect defects in the optical film.

Benefits of technology

It can accurately detect the non-uniformity of optical properties of optical films, improve the accuracy and reliability of defect detection, and reduce the birefringence effect of protective films and release films.

✦ Generated by Eureka AI based on patent content.

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    Figure CN115015281B_ABST
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Abstract

提供缺陷检查方法及缺陷检查装置,在以在直线偏振板层叠有防护膜和剥离膜的光学膜为被检物的情况下,能检出直线偏振板光学特性不均。缺陷检查方法是以具有直线偏振板的光学膜为被检物的该直线偏振板的缺陷检查方法,该光学膜依次具有剥离膜、该直线偏振板和防护膜,该防护膜具有取向轴,且被层叠为使该取向轴与该直线偏振板的吸收轴所成角度为0°±30°的范围,该缺陷检查方法具有配置工序,沿光轴依次配置具有第1偏振片的第1滤光片、相位差补偿板、该光学膜以及具有第2偏振片的第2滤光片,且将该光学膜以使该剥离膜侧的表面与该相位差补偿板相面对的方向配置,且满足:(b1)该第2偏振片的吸收轴与该防护膜的该取向轴所成角度为90°±5°的范围内。
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