A semiconductor automatic detection device and a detection method

Abstract

The application provides a kind of semiconductor automatic detection device, including vibrating loading disc, discharging track and base, the discharging end of vibrating loading disc is fixed with discharging track, vibrating loading disc is close to the side of discharging track and is provided with base, the middle part of the upper surface of base is fixed with vertical rod symmetrically, the upper end of vertical rod is slidably connected with sliding sleeve, the side of two sliding sleeves is fixed with lifting frame, the inner wall of the side of lifting frame away from sliding sleeve is fixed with connecting plate symmetrically, the inner side of two connecting plates is equidistantly provided with a plurality of detection pressing plates, the side of detection pressing plate is equidistantly fixed with three conductive sheets;The application can achieve continuous conveying and detection of triode during triode detection, that is, triode can complete detection work during conveying process, compared with traditional triode performance detection device, triode does not need to stop for detection, thereby greatly improving the detection efficiency.

Description

Technical Field

[0001] This invention relates to the field of semiconductor testing equipment technology, and in particular to an automated semiconductor testing device and testing method. Background Technology

[0002] Both diodes and transistors are semiconductor devices. After production, transistors need to be aligned and inspected. The inspection usually includes appearance inspection and performance inspection. Appearance inspection uses a CCD industrial camera to take pictures of the appearance of the transistor and its pins to check for defects such as cracks, damage, or incorrect coding. Performance inspection is carried out by connecting the three pins of the transistor with conductive contacts, so that the conductive contacts are electrically connected to the transistor. The other end of the conductive contacts is electrically connected to a testing device, which can obtain the transistor's data to test its performance.

[0003] However, existing transistor performance testing equipment typically performs transistor testing intermittently. That is, after a transistor is fed to the conductive contact position, it stops moving, and then the conductive contact is pressed to make contact with the transistor's pins for performance testing. After the test is completed, the conductive contact is driven to separate, and the transistor is driven to leave the testing station, while the next transistor enters the testing station. This testing and feeding process prevents transistors from being continuously fed and tested, thus failing to improve the efficiency of the testing work.

[0004] Therefore, it is necessary to provide a new automated semiconductor testing device and method to solve the above-mentioned technical problems. Summary of the Invention

[0005] To address the aforementioned technical problems, this invention provides an automated semiconductor testing device and testing method.

[0006] This invention provides an automated semiconductor testing device, comprising a vibrating feeding tray, a discharging track, and a base. The discharging end of the vibrating feeding tray is fixed to the discharging track. A base is located on the side of the vibrating feeding tray near the discharging track. Uprights are symmetrically fixed to the center of the upper surface of the base. Sliding sleeves are slidably connected to the upper ends of the uprights. A lifting frame is fixed to one side of each of the two sliding sleeves. Connecting plates are symmetrically fixed to the inner wall of the lifting frame on the side away from the sliding sleeves. Several detection pressure plates are equidistantly arranged on the inner sides of the two connecting plates. Three conductive sheets are equidistantly fixed to one side of each detection pressure plate. A transmission mechanism for driving the several detection pressure plates to circulate and perform testing is rotatably connected between the two connecting plates via bearings. An L-shaped limiting plate is slidably connected to the side of the discharging track near the connecting plates via a sliding groove. A lifting mechanism for driving the L-shaped limiting plate and the lifting frame to rise and fall is fixed to the center of the upper surface of the base.

[0007] Preferably, the transmission mechanism includes a rotating shaft, a sprocket, a chain, a first motor, a sliding frame, a sliding bar, and a guide assembly. The two connecting plates are symmetrically connected by a rotating shaft via bearings. A sprocket is fixed in the middle of the rotating shaft. A chain is connected between the two sprockets. The first motor is fixed at one end of a connecting plate near the sliding sleeve above the discharge track. The end of a rotating shaft on the connecting plate corresponding to the first motor is fixed to the output end of the first motor. Sliding frames are symmetrically and equidistantly fixed on the outer wall of the chain. Sliding bars are symmetrically fixed on the side of the detection pressure plate near the sliding frame. The sliding bars are slidably connected to the inner wall of the sliding frame. A guide assembly is provided on the surface of the connecting plate.

[0008] Preferably, the guide assembly includes a guide groove, a clearance groove, and a drive column. The guide groove is provided on the surface of the connecting plate, and the clearance groove is provided on the side of the slide frame near the connecting plate. The drive column is fixed on the side of the slide bar near the clearance groove. The drive column is slidably connected to the inner wall of the clearance groove, and the end of the drive column away from the slide bar passes through the clearance groove and is slidably connected to the inner wall of the guide groove.

[0009] Preferably, the lifting mechanism includes a connecting block, a rotating rod, a second motor, a first cam, and a second cam. The connecting blocks are symmetrically fixed in the middle of the upper surface of the base. The rotating rod is rotatably connected between the two connecting blocks through a bearing. The second motor is fixed in the top of the base. The end of the rotating rod near the second motor is fixed to the output end of the second motor. The first cam is fixed in the middle of the rotating rod directly below the lifting frame. The first cam cooperates with the lifting frame. The end of the rotating rod away from the second motor is fixed in the second cam directly below the L-shaped limiting plate. The bottom of the L-shaped limiting plate is in contact with the surface of the second cam.

[0010] Preferably, the bottom of the base is symmetrically fixed with self-locking casters.

[0011] Preferably, a blocking block is symmetrically fixed in the middle of the upright, and the bottom of the sliding sleeve is in contact with the surface of the blocking block.

[0012] Preferably, both the first motor and the second motor are geared motors.

[0013] Preferably, the detection plate has equidistant grooves formed on the side away from the chain, the conductive sheet is fixed to the inner wall of the groove, and the thickness of the conductive sheet is less than the depth of the groove.

[0014] Preferably, a reinforcing ring is fixed to the upper surface of the base on the outside of the upright, and the upright is fixed to the inner wall of the reinforcing ring.

[0015] The present invention also provides a detection method, the method comprising the following steps:

[0016] 1) The transistors are placed into the vibrating feeding tray and arranged by the vibrating tray to be conveyed to the discharge track;

[0017] 2) After multiple transistors are arranged in sequence and blocked by the L-shaped limiting plate, the second motor is driven to rotate, causing the connecting plate to move down. The detection pressure plate in the middle presses the transistor pins, and then the L-shaped limiting plate descends to release the obstruction of the transistors.

[0018] 3) Perform testing on the drive transmission mechanism.

[0019] Compared with related technologies, the semiconductor automated testing device and testing method provided by the present invention have the following beneficial effects:

[0020] This invention enables uninterrupted transport and testing of transistors during transistor testing. The testing process can be completed while the transistor is being transported, unlike traditional transistor performance testing devices which eliminate the need for intermittent testing. This significantly improves testing efficiency. In operation, after the vibrating feeding tray transports the transistors to the L-shaped limiting plate, causing multiple transistors to contact and arrange themselves on the discharge track, the lifting mechanism moves the lifting frame downwards, causing the testing plate to press against the transistor pins. The testing process is then initiated by the transmission mechanism. Attached Figure Description

[0021] Figure 1 This is a schematic diagram of the overall structure of the present invention;

[0022] Figure 2 This is an enlarged view of point A in the present invention;

[0023] Figure 3 This is one of the schematic diagrams of the L-shaped limiting plate position structure of the present invention;

[0024] Figure 4 This is the second schematic diagram of the L-shaped limiting plate position structure of the present invention;

[0025] Figure 5 This is a schematic diagram of the transmission mechanism structure of the present invention;

[0026] Figure 6 This is an enlarged view of section B of the present invention;

[0027] Figure 7 This is a schematic diagram of the guide groove position structure of the present invention;

[0028] Figure 8 This is a schematic diagram of the drive column position structure of the present invention;

[0029] Figure 9 This is one of the schematic diagrams of the lifting mechanism structure of the present invention;

[0030] Figure 10 This is a second schematic diagram of the lifting mechanism structure of the present invention;

[0031] Figure 11 This is a schematic diagram of the detection method of the present invention.

[0032] The diagram shows the following components: 1. Vibrating feeder; 2. Discharge track; 3. Base; 4. Upright; 5. Sliding sleeve; 6. Lifting frame; 7. Connecting plate; 8. Detection pressure plate; 81. Embedded groove; 8a. Conductive sheet; 9. Transmission mechanism; 91. Rotating shaft; 92. Sprocket; 93. Chain; 94. First motor; 95. Sliding frame; 96. Sliding bar; 97. Guide assembly; 971. Guide groove; 972. Clearance groove; 973. Drive column; 10. L-shaped limit plate; 11. Lifting mechanism; 111. Connecting block; 112. Rotating rod; 113. Second motor; 114. First cam; 115. Second cam; 12. Self-locking caster wheel; 13. Blocking block; 14. Reinforcing ring. Detailed Implementation

[0033] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the invention.

[0034] The specific implementation of the present invention will be described in detail below with reference to specific embodiments.

[0035] Please see Figure 1 , Figure 2 , Figure 3 , Figure 4 and Figure 6 This invention provides an automated semiconductor testing device, comprising a vibrating feeding plate 1, a discharge track 2, and a base 3. The discharge end of the vibrating feeding plate 1 is fixed to the discharge track 2. The base 3 is disposed on the side of the vibrating feeding plate 1 near the discharge track 2. Uprights 4 are symmetrically fixed to the middle of the upper surface of the base 3. Sliding sleeves 5 are slidably connected to the upper end of the uprights 4. Lifting frames 6 are fixed to one side of the two sliding sleeves 5. Connecting plates 7 are symmetrically fixed to the inner wall of the lifting frame 6 away from the sliding sleeves 5. A plurality of detection pressure plates 8 are equidistantly disposed on the inner side of the two connecting plates 7. Three conductive sheets 8a are equidistantly fixed to one side of the detection pressure plates 8. A transmission mechanism 9 for driving the plurality of detection pressure plates 8 to circulate and perform testing is rotatably connected between the two connecting plates 7 via bearings. An L-shaped limiting plate 10 is slidably connected to the side of the discharge track 2 near the connecting plate 7 via a sliding groove. A lifting mechanism 11 for driving the L-shaped limiting plate 10 and the lifting frame 6 to rise and fall is fixed to the middle of the upper surface of the base 3.

[0036] During use, it can achieve uninterrupted delivery and testing of transistors, and the testing work is completed during the delivery process, which greatly improves the testing efficiency, saves testing time, and makes it convenient for enterprises to use.

[0037] Please see Figure 5, Figure 6 and Figure 7 The transmission mechanism 9 includes a rotating shaft 91, a sprocket 92, a chain 93, a first motor 94, a sliding frame 95, a sliding bar 96, and a guide assembly 97. The rotating shaft 91 is symmetrically connected between two connecting plates 7 via bearings. The sprocket 92 is fixed in the middle of the rotating shaft 91. The chain 93 is connected between the two sprockets 92. The first motor 94 is fixed at one end of a connecting plate 7 above the discharge track 2 near the sliding sleeve 5. The end of a rotating shaft 91 on the connecting plate 7 corresponding to the first motor 94 is fixed to the output end of the first motor 94. Sliding frames 95 are symmetrically and equidistantly fixed on the outer wall of the chain 93. Sliding bars 96 are symmetrically fixed on the side of the detection pressure plate 8 near the sliding frame 95. The sliding bars 96 are slidably connected to the inner wall of the sliding frame 95. The guide assembly 97 is provided on the surface of the connecting plate 7.

[0038] Please see Figure 6 , Figure 7 and Figure 8 The guide assembly 97 includes a guide groove 971, a clearance groove 972, and a drive column 973. The guide groove 971 is provided on the surface of the connecting plate 7. The clearance groove 972 is provided on the side of the slide frame 95 near the connecting plate 7. The drive column 973 is fixed on the side of the slide bar 96 near the clearance groove 972. The drive column 973 is slidably connected to the inner wall of the clearance groove 972, and the end of the drive column 973 away from the slide bar 96 passes through the clearance groove 972 and is slidably connected to the inner wall of the guide groove 971.

[0039] In operation, the transistors are continuously fed onto the discharge track 2 by the vibrating feeding plate 1. Blocked by the L-shaped limiting plate 10, multiple transistors are arranged between the L-shaped limiting plate 10 and the vibrating feeding plate 1 above the discharge track 2. Then, the lifting mechanism 11 operates, causing the lifting frame 6 to move downwards until it reaches its designated position. Simultaneously, the L-shaped limiting plate 10 descends, releasing the transistors from their restriction. Once in position, four detection plates 8, located in the middle between the two connecting plates 7, press down on the corresponding four transistors. The conductive plates 8a on the four detection plates 8 are pressed tightly against the pins of their respective transistors. This drives the first motor 94 to rotate, which in turn drives the rotating shaft 91 to rotate, and consequently, the sprocket 92 to rotate. This drives the chain 93, which in turn moves the detection plate 8. The movement of the detection plate 8 causes the transistor to slide on the side of the discharge track 2 away from the vibrating feed plate 1. Simultaneously, the chain 93 drives the transistor, and the guide groove 971 acts as a guide, allowing the detection plate 8 to move upward and separate from the transistor after completing the detection work on the transistor pins. The vibrating feed plate 1 continuously feeds transistors onto the discharge track 2, thus continuously performing transistor detection. Each time the detection stops, it is necessary to ensure that no transistors are fed onto the discharge track 2. At the same time, each time the first motor 94 stops rotating, it is necessary to ensure that there are always four detection plates 8 positioned in the lower middle position between the two connecting plates 7.

[0040] Please see Figure 9 and Figure 10 The lifting mechanism 11 includes a connecting block 111, a rotating rod 112, a second motor 113, a first cam 114, and a second cam 115. The connecting blocks 111 are symmetrically fixed in the middle of the upper surface of the base 3. The rotating rod 112 is rotatably connected between the two connecting blocks 111 through a bearing. The second motor 113 is fixed in the top of the base 3. The end of the rotating rod 112 near the second motor 113 is fixed to the output end of the second motor 113. The first cam 114 is fixed in the middle of the rotating rod 112 directly below the lifting frame 6. The first cam 114 cooperates with the lifting frame 6. The end of the rotating rod 112 away from the second motor 113 is fixed in the second cam 115 directly below the L-shaped limiting plate 10. The bottom of the L-shaped limiting plate 10 is in contact with the surface of the second cam 115.

[0041] After the inspection is completed and there are no transistors on the discharge track 2, the second motor 113 is driven to rotate 90 degrees in the opposite direction of the arrow on the first cam 114. This causes the first cam 114 to rotate and lift the lifting frame 6 upward. The second cam 115 also rotates and lifts the L-shaped limiting plate upward, so that the upper end of the L-shaped limiting plate 10 enters the inner side of the discharge track 2. It should be emphasized that during the process of the second motor 113 rotating 90 degrees, the L-shaped limiting plate 10 moves upward into place first, and then the lifting frame 6 moves upward.

[0042] During the testing process, after the transistors are arranged on the discharge track 2, the second motor 113 is driven to rotate 90 degrees in the direction indicated by the arrow on the first cam 114, causing the first cam 114 and the second cam 115 to rotate, thereby causing the lifting frame 6 and the L-shaped limiting plate 10 to descend. It should also be emphasized that during the 90-degree rotation of the second motor 113, the lifting frame 6 descends to its position first, and then the L-shaped limiting plate 10 descends to its position. This allows the testing pressure plate 8 to press down the four transistors located in the lower middle position between the two connecting plates 7 before the L-shaped limiting plate 10 releases its limiting function on the transistors.

[0043] Please see Figure 1 The bottom of the base 3 is symmetrically fixed with self-locking casters 12, which can facilitate the movement of the base 3.

[0044] Please see Figure 2 and Figure 9 A blocking block 13 is symmetrically fixed in the middle of the upright 4. The bottom of the sliding sleeve 5 is pressed against the surface of the blocking block 13, which can limit the downward movement of the lifting frame 6 and ensure that when it descends to the lowest position, the conductive sheet 8a can be pressed against the pin of the transistor.

[0045] Please see Figure 7 and Figure 9 Both the first motor 94 and the second motor 113 are geared motors, which can ensure stable operation of the detection work.

[0046] Please see Figure 6 An embedding groove 81 is formed at equal intervals on the side of the detection plate 8 away from the chain 93. The conductive sheet 8a is fixed to the inner wall of the embedding groove 81, and the thickness of the conductive sheet 8a is less than the depth of the embedding groove 81. After the detection plate 8 moves downward, the pins of the transistor can be embedded in the inner side of the embedding groove 81 and pressed tightly with the conductive sheet 8a, thereby ensuring that the pressed transistor can move synchronously during the horizontal movement of the detection plate 8.

[0047] Please see Figure 2 A reinforcing ring 14 is fixed on the upper surface of the base 3, which is located on the outside of the upright 4. The upright 4 is fixed to the inner wall of the reinforcing ring 14, which can improve the strength of the connection between the base 3 and the upright 4.

[0048] Please see Figure 11 The present invention also provides a detection method, the method comprising the following steps:

[0049] 1) The transistors are placed into the vibrating feeding tray 1 and arranged by the vibrating tray to be conveyed to the discharge track 2;

[0050] 2) After multiple transistors are arranged in sequence and blocked by the L-shaped limiting plate 10, the second motor 113 is driven to rotate, causing the connecting plate 7 to move down. The detection pressure plate 8 in the middle presses the transistor pins, and then the L-shaped limiting plate 10 descends to release the obstruction of the transistors.

[0051] 3) The drive transmission mechanism 9 is tested.

[0052] The circuits and controls involved in this invention are all existing technologies and will not be described in detail here.

[0053] The above description is merely an embodiment of the present invention and does not limit the patent scope of the present invention. Any equivalent structural or procedural transformations made based on the content of the present invention specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of the present invention.

Claims

1. A semiconductor automated testing device, comprising a vibrating feeding plate (1), a discharge track (2), and a base (3), wherein the discharge end of the vibrating feeding plate (1) is fixed with the discharge track (2), and the base (3) is provided on the side of the vibrating feeding plate (1) near the discharge track (2), characterized in that, A vertical rod (4) is symmetrically fixed in the middle of the upper surface of the base (3). A sliding sleeve (5) is slidably connected to the upper end of the vertical rod (4). A lifting frame (6) is fixed on one side of the two sliding sleeves (5). A connecting plate (7) is symmetrically fixed on the inner wall of the lifting frame (6) away from the sliding sleeve (5). Several detection pressure plates (8) are equidistantly arranged on the inner side of the two connecting plates (7). Three conductive sheets (8a) are equidistantly fixed on one side of the detection pressure plate (8). A transmission mechanism (9) for driving several detection pressure plates (8) to perform detection work is rotatably connected between the two connecting plates (7) through a bearing. An L-shaped limiting plate (10) is slidably connected to the side of the discharge track (2) near the connecting plate (7) through a sliding groove. A lifting mechanism (11) for driving the L-shaped limiting plate (10) and the lifting frame (6) to rise and fall is fixed in the middle of the upper surface of the base (3). The transmission mechanism (9) includes a rotating shaft (91), a sprocket (92), a chain (93), a first motor (94), a sliding frame (95), a sliding bar (96), and a guide assembly (97). The two connecting plates (7) are symmetrically connected by a rotating shaft (91) via bearings. A sprocket (92) is fixed in the middle of the rotating shaft (91), and a chain (93) is connected between the two sprockets (92). One end of a connecting plate (7) above the discharge track (2) near the sliding sleeve (5) is fixed. A first motor (94) is fixed. A rotating shaft (91) on the connecting plate (7) corresponding to the first motor (94) is fixed to the output end of the first motor (94) at one end. A sliding frame (95) is symmetrically and equidistantly fixed on the outer wall of the chain (93). A sliding strip (96) is symmetrically fixed on the side of the detection pressure plate (8) near the sliding frame (95). The sliding strip (96) is slidably connected to the inner wall of the sliding frame (95). A guide component (97) is provided on the surface of the connecting plate (7). The guide assembly (97) includes a guide groove (971), a clearance groove (972), and a drive column (973). The surface of the connecting plate (7) is provided with the guide groove (971). The sliding frame (95) is provided with a clearance groove (972) on the side near the connecting plate (7). The sliding bar (96) is fixed with a drive column (973) on the side near the clearance groove (972). The drive column (973) is slidably connected to the inner wall of the clearance groove (972), and the end of the drive column (973) away from the sliding bar (96) passes through the clearance groove (972) and is slidably connected to the inner wall of the guide groove (971). The lifting mechanism (11) includes a connecting block (111), a rotating rod (112), a second motor (113), a first cam (114), and a second cam (115). The connecting blocks (111) are symmetrically fixed in the middle of the upper surface of the base (3). The two connecting blocks (111) are rotatably connected by a bearing. The second motor (113) is fixed at the top of the base (3). The end of the rotating rod (112) near the second motor (113) is fixed to the output end of the second motor (113). The middle of the rotating rod (112) is fixed to the first cam (114) directly below the lifting frame (6). The first cam (114) cooperates with the lifting frame (6). The end of the rotating rod (112) away from the second motor (113) is fixed to the second cam (115) directly below the L-shaped limiting plate (10). The bottom of the L-shaped limiting plate (10) is in contact with the surface of the second cam (115).

2. The semiconductor automated testing device according to claim 1, characterized in that, The bottom of the base (3) is symmetrically fixed with self-locking casters (12).

3. The semiconductor automated testing device according to claim 1, characterized in that, The middle part of the upright (4) is symmetrically fixed with a blocking block (13), and the bottom of the sliding sleeve (5) is pressed against the surface of the blocking block (13).

4. The semiconductor automated testing device according to claim 1, characterized in that, Both the first motor (94) and the second motor (113) are geared motors.

5. The semiconductor automated testing device according to claim 1, characterized in that, The detection plate (8) has an equidistant groove (81) on the side away from the chain (93). The conductive sheet (8a) is fixed to the inner wall of the groove (81), and the thickness of the conductive sheet (8a) is less than the depth of the groove (81).

6. The semiconductor automated testing device according to claim 1, characterized in that, A reinforcing ring (14) is fixed on the upper surface of the base (3) outside the upright (4), and the upright (4) is fixed to the inner wall of the reinforcing ring (14).

7. A detection method using the semiconductor automated detection apparatus according to any one of claims 1-6, characterized in that, The method includes the following steps: 1) The transistors are placed into the vibrating feeding tray (1) and arranged by the vibrating tray to be fed onto the discharge track (2); 2) After multiple transistors are blocked by the L-shaped limiting plate (10) and arranged in sequence, the second motor (113) is driven to rotate, causing the connecting plate (7) to move down. The detection pressure plate (8) in the middle presses the transistor pins, and then the L-shaped limiting plate (10) descends to release the obstruction of the transistors. 3) The drive transmission mechanism (9) is tested.

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