A memory application test method, device and readable storage medium
CN115269360BActive Publication Date: 2026-07-07TENCENT TECHNOLOGY (SHENZHEN) CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- TENCENT TECHNOLOGY (SHENZHEN) CO LTD
- Filing Date
- 2021-04-29
- Publication Date
- 2026-07-07
AI Technical Summary
Technical Problem
Existing technologies for testing system memory are energy-intensive, time-consuming, and require the construction of numerous preconditions, resulting in low testing efficiency.
Method used
By acquiring the memory monitoring logs of the application under test, performing format conversion processing to generate tag data, and converting it into memory data according to a specific file format, memory leak data can be identified, thus avoiding the use of load testing methods.
Benefits of technology
It reduces testing energy costs, shortens test delivery time, and eliminates the need to configure preconditions for load testing.
✦ Generated by Eureka AI based on patent content.
Smart Images
Figure CN115269360B_ABST
Abstract
Embodiments of the present application provide a kind of application memory test method and related equipment, can reduce the test energy consumption cost when the application to be detected carries out memory test, shorten test delivery length.The method comprises: obtaining the memory monitoring log of the application to be detected, wherein the memory monitoring log belongs to target file format;According to the preset data structure, the data structure of memory monitoring log is adjusted, and N groups of label data are obtained, wherein each group of label data includes start identifier, end identifier and log code, start identifier is used to identify the start position of log code, and end identifier is used to identify the end position of log code;For each group of label data, according to target file format, format conversion processing is carried out to label data, and the memory data corresponding to each group of label data is obtained;According to the memory data corresponding to N groups of label data, the memory leak data of the application to be detected is determined.
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