芯片测试方法及相关设备
By using a long short-term memory network model to predict chip quality and dynamically adjust the testing process, the problems of high cost, low efficiency, and poor accuracy in traditional chip testing methods are solved, achieving more efficient and accurate chip testing.
CN115308562BActive Publication Date: 2026-07-17TENCENT TECHNOLOGY (SHENZHEN) CO LTD +1
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- TENCENT TECHNOLOGY (SHENZHEN) CO LTD
- Filing Date
- 2021-05-08
- Publication Date
- 2026-07-17
AI Technical Summary
Technical Problem
Traditional chip testing methods ignore the differences in chip process size, performance, and application, resulting in high testing costs, low efficiency, and poor accuracy.
Method used
A prediction model based on a long short-term memory network is adopted to predict quality using real-time data, recent data, and historical data samples. The testing process is dynamically adjusted, including modifying the test threshold range, content, and configuration conditions, to generate an adaptive testing process.
Benefits of technology
It improves the predictive accuracy of chip testing, reduces testing time and cost, and enhances testing efficiency and accuracy.
✦ Generated by Eureka AI based on patent content.
Smart Images
Figure CN115308562B_ABST
Abstract
本申请属于计算机技术领域，具体涉及一种芯片测试方法、芯片测试装置、计算机可读介质以及电子设备。该芯片测试方法包括：获取用于对芯片进行质量预测的预测模型；根据采集到的测试数据样本以及所述预测模型对当前测试流程进行流程修改，以生成针对待测芯片的适应性测试流程；根据所述适应性测试流程对所述待测芯片进行质量测试，以得到所述待测芯片的质量测试结果；根据所述待测芯片的质量测试结果更新所述测试数据样本，并根据所述待测芯片的质量测试结果更新所述预测模型。本申请可以减少芯片测试时间，降低芯片测试成本，提高芯片测试效率和测试精度。
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