Method, apparatus, device, and storage medium for monitoring a burn-in test

Abstract

The application discloses a kind of monitoring old exercise test method, device, equipment and storage medium, belong to chip test technical field, the method includes: receiving test data and verifying;The test data in the test data that is verified is parsed, obtains first matching information;Test equipment is matched out by the first matching information, and second matching information is obtained by the test equipment, and specific test piece is matched out by second matching information;The specific test piece is matched with the test data, and the test result of the specific test piece is obtained.The application realizes monitoring multiple devices, multiple batches are tested simultaneously;It improves the utilization rate of old exercise test equipment, reduces the deployment quantity of host computer, and reduces test cost.

Description

Technical Field

[0001] This invention belongs to the field of chip testing technology and relates to a method, apparatus, equipment and storage medium for monitoring aging tests. Background Technology

[0002] Currently, FPGAs (Field Programmable Gate Arrays) are widely used in various fields such as artificial intelligence, aerospace, military, and industry. Therefore, the reliability of FPGAs has become an important application indicator. Aging testing, as one of the important methods of integrated circuit reliability testing, essentially mimics the working life of a DUT (Device Under Test). It places the device in a specific aging testing device and runs it for a specific time under specified voltage and high temperature conditions. Test data is collected and analyzed to eliminate devices with defects or early failures. With the increasing variety and quantity of devices and the number of aging testing devices, existing aging testing monitoring only supports monitoring one device and one batch of tests. This leads to a significant reduction in the utilization rate and testing efficiency of aging testing devices, which can no longer meet the needs of actual production. Summary of the Invention

[0003] Based on this, the present invention provides a method, apparatus, equipment and storage medium for monitoring aging tests, which solves the problem that existing aging test monitoring only supports testing of one type of device and one batch, resulting in low utilization rate and testing efficiency of aging test equipment.

[0004] This invention provides a method for monitoring aging tests, comprising: Receive test data and verify it; Parse the validated test data from the test data to obtain the first matching information; The test device is matched based on the first matching information, and the second matching information is obtained through the test device. The specific test piece is then matched based on the second matching information. Match the specific test piece with the test data to obtain the test result of the specific test piece.

[0005] Further, the step of matching a test device using the first matching information, obtaining second matching information through the test device, and matching a specific test piece using the second matching information includes: Using the first matching information, the test data is matched to the test workpiece, and then the test equipment is matched according to the test workpiece; The second matching information is determined based on the test equipment. The specific test piece corresponding to the test equipment is obtained through the second matching information. The device type and production batch of the test piece are determined based on the specific test piece.

[0006] Further, before matching the test data to the test workpiece using the first matching information, and then matching the test equipment based on the test workpiece, the method further includes: Establish a mapping relationship between the first matching information, the test equipment, and the test workpiece.

[0007] Further, before determining the second matching information based on the testing equipment, obtaining the specific test piece corresponding to the testing equipment through the second matching information, and determining the device type and production batch of the test piece based on the specific test piece, the method further includes: Establish a mapping relationship between the device type, production batch, and testing equipment of the device to be tested; Establish a mapping relationship between the device type of the test piece, the specific test piece in the production batch, and the test workpiece.

[0008] Furthermore, after matching the specific test piece with the test data and obtaining the test result of the specific test piece, the process further includes: The test results of the specific test piece are then visualized.

[0009] Further, after matching the specific test piece with the test data and obtaining the test result of the specific test piece, the process also includes: Store the test data and test results of the specific test piece.

[0010] Furthermore, after matching the specific test piece with the test data and obtaining the test result of the specific test piece, the process further includes: The system receives the test environment parameters of the test equipment and the test workpiece. If the test environment parameters exceed the set threshold, it sends a command to the test equipment and the test workpiece to automatically power off the test equipment and the test workpiece.

[0011] The present invention also provides an apparatus for monitoring aging tests, the apparatus comprising: The receiving module is used to receive test data and perform verification. The first matching information acquisition module is used to parse the test data that has passed the verification in the test data and acquire the first matching information; The second matching information acquisition module is used to match the test device with the first matching information, acquire the second matching information through the test device, and match the specific test piece with the second matching information. The test result acquisition module is used to match the specific test piece with the test data to obtain the test result of the specific test piece.

[0012] The present invention also provides a terminal device, the terminal device comprising: Memory: Used to store computer programs; Processor: for executing the computer program to implement the method for monitoring aging tests as described in any of the preceding claims.

[0013] The present invention also provides a computer-readable storage medium having a computer program stored thereon, wherein the computer program, when executed by a processor, implements the method for monitoring aging tests as described in any of the preceding claims.

[0014] This invention provides a method for monitoring aging tests, which involves receiving and verifying test data; parsing the verified test data to obtain first matching information; matching a test device using the first matching information; obtaining second matching information through the test device; matching a specific test piece using the second matching information; and matching the specific test piece with the test data to obtain the test result for the specific test piece. This method enables simultaneous testing of multiple devices and batches; improves the utilization rate of aging test equipment; reduces the number of host computers required; and lowers testing costs. The device, equipment, and storage medium for monitoring aging tests provided by this invention can also achieve the above effects. Attached Figure Description

[0015] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0016] Figure 1 This is a structural block diagram of an aging test system provided in an embodiment of the present invention; Figure 2 A flowchart illustrating a method for monitoring aging tests provided in an embodiment of the present invention; Figure 3 This is a flowchart illustrating step S3; Figure 4 A flowchart illustrating another method for monitoring aging tests provided in an embodiment of the present invention; Figure 5 A structural block diagram of a device for monitoring aging tests provided in an embodiment of the present invention; Figure 6 This is a structural block diagram of the second matching information acquisition module; Figure 7 This is a structural block diagram of another device for monitoring aging tests provided in an embodiment of the present invention; Figure 8This is a schematic diagram of the structure of a terminal device disclosed in an embodiment of the present invention; Figure 9 This invention discloses a schematic diagram of the structure of a computer storage medium according to an embodiment of the present invention. Detailed Implementation

[0017] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains; the terminology used herein in the specification of the application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application; the terms "comprising" and "having," and any variations thereof, in the specification, claims, and foregoing drawings of this application, are intended to cover non-exclusive inclusion. The terms "first," "second," etc., in the specification, claims, or foregoing drawings of this application are used to distinguish different objects, not to describe a particular order.

[0018] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0019] To make the objectives, technical solutions, and advantages of this application clearer, the application will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application. All other embodiments obtained by those skilled in the art based on the embodiments of this invention without inventive effort are within the scope of protection of this invention.

[0020] In the following description, suffixes such as “module,” “part,” or “unit” used to denote elements are used only for the purposes of this application and have no specific meaning in themselves.

[0021] Please see Figure 1 , Figure 1This is a structural block diagram of an aging test system provided by an embodiment of the present invention. The aging test system includes: a host computer, a slave computer, an aging chamber, aging test boards, and a switch. Multiple aging test boards can be placed in the aging chamber. Each aging test board is equipped with a main control chip, on which the slave computer's main control program is programmed. The slave computer uses a serial port protocol to parse and receive aging test data and communicates with the host computer. The number of test stations on the aging test boards varies depending on the type of device. Each test station is used to place the corresponding DUT (Device Under Test). Each aging test board is equipped with an Ethernet communication interface and has an independent MAC address. The MAC address is used to distinguish which aging test board the data belongs to when uploading test data to the host computer. Test data between the aging test boards inside the chamber and between the aging chambers themselves are packetized according to the protocol and uploaded to the host computer via the Ethernet switch.

[0022] In this embodiment of the invention, the host computer can be a computer, such as a desktop computer, laptop computer, server, etc., and the computer's operating system can be a Linux operating system, a Windows operating system, or a macOS operating system, etc. The host computer includes one or more processors and a memory, and the processors and memory can be connected via a bus or other means. The processor can be one or more microprocessors or other types of control circuits, such as one or more application-specific integrated circuits. The memory, as a non-volatile computer-readable storage medium, can be used to store non-volatile software programs, non-volatile computer-executable programs, and modules, such as monitoring and aging test software.

[0023] The host computer can not only control the chip aging test process, but also receive, store and display the chip aging test results, which facilitates the review and analysis of the historical results of the chip aging test and helps to optimize and improve the chip architecture design, manufacturing process and other aspects of the chip production process.

[0024] like Figure 2 The diagram shown is a flowchart illustrating a method for monitoring aging tests according to an embodiment of the present invention. The method can be run within the monitoring aging test software and includes: Step S1: Receive test data and verify it; Figure 1After receiving the test command, the lower-level computer controls the aging chamber and aging test board to operate, test the test piece, acquire test data, and then transmit the test data to the lower-level computer. The lower-level computer combines the test data according to a preset data format protocol, and after combination, transmits the combined data to the upper-level computer. After receiving the test data, the upper-level computer verifies the test data. If the test data passes verification, step S2 is performed; if the data fails verification, it is discarded.

[0025] The preset data format can be adjusted according to actual needs. In this embodiment, preferably, the MAC address of the aging test board and the test data obtained from the test of the device under test on the aging test board are encoded and sent to the host computer after encoding. In this invention, the device under test is a chip as an example. The MAC address includes the target address and the data source address. The test data includes the number of chip test resets, whether the chip test passed, the chip identification number, whether the chip test data is normal, whether the chip is powered on normally, and the voltage and temperature of the chip test. The encoding can be implemented using the C++ programming language.

[0026] Step S2: Parse the test data that has passed the verification in the test data to obtain the first matching information; Specifically, Figure 1 The host computer shown will parse the verified test data, such as decoding the encoded test data in the above embodiment. After decoding, the first matching information will be found. In this embodiment, the MAC address of the old test board is the first matching information.

[0027] Step S3: Match the test device with the first matching information, obtain the second matching information through the test device, and match the specific test piece with the second matching information; In some embodiments, such as Figure 3 As shown, step S3 includes: Step S31: Match the test data to the test workpiece using the first matching information, and then match the test equipment according to the test workpiece; Specifically, in this embodiment, after obtaining the first matching information, the MAC address, the aging test board corresponding to the MAC address is matched according to the MAC address, and then the aging temperature chamber is matched according to the aging test board.

[0028] In some embodiments, such as Figure 3 As shown, the procedure before step S31 includes: Step S301: Establish the mapping relationship between the first matching information, the test equipment, and the test workpiece.

[0029] Specifically, before testing, a mapping relationship between the first matching information, the testing equipment, and the test workpiece can be established, that is, the mapping relationship between the MAC address, the aging chamber, and the aging test board in this embodiment. Preferably, the mapping relationship between the MAC address, the aging chamber, and the aging test board is established through a dictionary mapping model.

[0030] Furthermore, to make the whole process more convenient, the aging chamber and the aging test board can be labeled first. The MAC address, the labeled aging chamber and the aging test board are mapped through a mapping model to make them have a unique mapping relationship. After the MAC address is found, the corresponding aging test board label and aging chamber label can be found, and then the aging test board and aging chamber corresponding to the label can be found.

[0031] Step S32: Determine the second matching information based on the test equipment, obtain the specific test piece corresponding to the test equipment through the second matching information, and determine the device type and production batch of the test piece based on the specific test piece.

[0032] Specifically, in this embodiment, the second matching information is the aging test board number and the aging temperature chamber number. Based on the matched aging test board number and aging temperature chamber number, each chip tested by the aging test board is determined, and then the chip type and specific production batch are matched according to each chip.

[0033] In some embodiments, such as Figure 3 As shown, the procedure before step S32 includes: Step S302: Establish the mapping relationship between the device type, production batch and test equipment of the device to be tested; Establish a mapping relationship between the device type of the test piece, the specific test piece in the production batch, and the test workpiece.

[0034] Specifically, in this embodiment, before chip testing, the chip type, production batch, and specific chip can be labeled, establishing a unique mapping relationship between them and the labeling of the aging chamber. Then, a unique mapping relationship is established between the aging test board in the aging chamber and the chip type and specific chip labeling within the production batch. After finding the labeling of the aging test board, the labeling of the specific chip to be tested on the aging test board can be found. Based on the labeling of the chip to be tested, the chip type labeling and production batch labeling are found, thus obtaining the type and production batch of the chip to be tested.

[0035] Step S4: Match the specific test piece with the test data to obtain the test result of the specific test piece.

[0036] Specifically, by matching the device under test (DUT) with the test data, the test results of the specific DUT can be obtained, thereby achieving the monitoring of the chip test results. The chip test results include test voltage, test temperature, test duration, and whether the chip passed or failed the test.

[0037] It should be understood that the sequence number of each step in the above embodiments does not imply the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present invention.

[0038] In some embodiments, such as Figure 4 As shown, after step S4, the following is also included: Step S5: Visualize the test results of the specific test piece.

[0039] Specifically, the test results of the test piece are visualized. Users can visualize the results according to their actual needs and circumstances. For example, the test results of the test piece can be processed by visualization software to obtain a visual graphic, which is convenient for direct observation of defective products in the test piece.

[0040] In some embodiments, such as Figure 4 As shown, after step S4, the following is also included: Step S6: Store the test data and test results of the specific test piece.

[0041] Specifically, the test data and test results can be saved in a preset data format to facilitate the review of the test process of the test piece, provide a basis for analyzing and locating the reasons for the test failure of the test piece, thereby improving the quality of the test piece and facilitating the rejection of defective products.

[0042] In some embodiments, such as Figure 4 As shown, after step S4, the following is also included: Step S7: Receive the test environment parameters of the test equipment and the test workpiece. If the test environment parameters exceed the set threshold, send an instruction to the test equipment and the test workpiece to automatically power off the test equipment and the test workpiece.

[0043] Specifically, by monitoring the testing environment of the testing equipment and the test workpiece, the testing equipment and the test workpiece are automatically powered off, thereby improving the safety of the testing equipment and the test workpiece.

[0044] This invention provides a method for monitoring aging tests, which involves receiving and verifying test data; parsing the verified test data to obtain first matching information; matching a test device using the first matching information; obtaining second matching information through the test device; matching a specific test piece using the second matching information; and matching the specific test piece with the test data to obtain the test result for the specific test piece. This method enables simultaneous testing of multiple devices and batches; improves the utilization rate of aging test equipment; reduces the number of host computers required; and lowers testing costs.

[0045] like Figure 5 As shown, an embodiment of the present invention provides a device 500 for monitoring aging tests. The device 500 includes: a receiving module 501 for receiving test data and performing verification; a first matching information acquisition module 502 for parsing the verified test data in the test data and acquiring first matching information; a second matching information acquisition module 503 for matching a test device with the first matching information, acquiring second matching information through the test device, and matching a specific test piece with the second matching information; and a test result acquisition module 504 for matching the specific test piece with the test data and acquiring the test result of the specific test piece.

[0046] like Figure 6 As shown, in some embodiments, the second matching information acquisition module 503 includes: The test equipment matching module 5031 is used to match the test data to the test workpiece through the first matching information, and then match the test equipment according to the test workpiece. The test piece matching module 5032 is used to determine second matching information based on the test equipment, obtain the specific test piece corresponding to the test equipment through the second matching information, and determine the device type and production batch of the test piece based on the specific test piece.

[0047] like Figure 6 As shown, in some embodiments, the second matching information acquisition module 503 further includes: The first mapping module 5033 is used to establish the mapping relationship between the first matching information, the test equipment and the test workpiece.

[0048] like Figure 6 As shown, in some embodiments, the second matching information acquisition module 503 includes: The second mapping module 5034 is used to establish a mapping relationship between the device type, production batch and test equipment of the device to be tested; Establish a mapping relationship between the device type of the test piece, the specific test piece in the production batch, and the test workpiece.

[0049] like Figure 7 As shown, in some embodiments, the device 500 further includes: The visualization processing module 505 is used to visualize the test results of the specific test piece.

[0050] like Figure 7 As shown, in some embodiments, the device 500 further includes: Storage module 506 is used to store the test data and test results of the specific test piece.

[0051] like Figure 7 As shown, in some embodiments, the device 500 further includes: The monitoring module 507 is used to receive the test environment parameters of the test equipment and the test workpiece. If the test environment parameters exceed the set threshold, it sends an instruction to the test equipment and the test workpiece to automatically power off the test equipment and the test workpiece.

[0052] Specific limitations regarding the device for monitoring aging tests can be found in the limitations of the method for monitoring aging tests described above, and will not be repeated here. Each module in the aforementioned device for monitoring aging tests can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in or independent of the processor in a computer device in hardware form, or stored in the memory of a computer device in software form, so that the processor can call and execute the corresponding operations of each module.

[0053] like Figure 8 The diagram shown is a structural schematic of a terminal device disclosed in an embodiment of the present invention. The computer device may include: Memory 801 storing executable program code; Processor 802 connected to memory 801; The processor 802 calls the executable program code stored in the memory 801 to execute the steps in the monitoring aging test method of the present invention.

[0054] Please see Figure 9 This invention discloses a computer storage medium 901 that stores computer instructions. When these computer instructions are invoked, they are used to execute the steps in the monitoring aging test method of this invention.

[0055] A computer-readable medium can be a computer-readable signal medium or a computer-readable storage medium. A computer-readable storage medium can be, for example—but not limited to—an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination thereof. More specific examples (a non-exhaustive list) of a computer-readable storage medium include: an electrical connection having one or more wires, a portable computer disk, a hard disk, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM), or flash memory, optical fiber, portable compact disk read-only memory (CD-ROM), optical storage device, magnetic storage device, or any suitable combination thereof. In this document, a computer-readable storage medium can be any tangible medium that contains or stores a program that can be used by or in connection with an instruction execution system, apparatus, or device.

[0056] Computer-readable signal media may include data signals propagated in baseband or as part of a carrier wave, carrying computer-readable program code. Such propagated data signals may take various forms, including—but not limited to—electromagnetic signals, optical signals, or any suitable combination thereof. Computer-readable signal media may also be any computer-readable medium other than computer-readable storage media, capable of transmitting, propagating, or transmitting programs for use by or in connection with an instruction execution system, apparatus, or device.

[0057] The program code contained on a computer-readable medium may be transmitted using any suitable medium, including—but not limited to—wireless, wire, optical fiber, RF, etc., or any suitable combination thereof.

[0058] Computer program code for performing the operations of this application can be written in one or more programming languages ​​or a combination thereof, including object-oriented programming languages ​​such as Java, Smalltalk, and C++, and conventional procedural programming languages ​​such as "C" or similar programming languages. The program code can be executed entirely on the user's computer, partially on the user's computer, as a standalone software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In cases involving remote computers, the remote computer can be connected to the user's computer via any type of network—including a Local Area Network (LAN) or a Wide Area Network (WAN), or it can be connected to an external computer (e.g., via the Internet using an Internet service provider).

[0059] The terminology used in the embodiments of this invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. The singular forms used in the embodiments of this invention and the appended claims... "A," "the," and "the" are also intended to include the majority form unless the context clearly indicates otherwise.

[0060] Depending on the context, the word "if" as used here can be interpreted as "when," "when," "in response to determination," or "in response to detection." Similarly, depending on the context, the phrase "if determination" or "if detection (of the stated condition or event)" can be interpreted as "when determination," "in response to determination," "when detection (of the stated condition or event)," or "in response to detection (of the stated condition or event)."

[0061] In the embodiments provided by this invention, it should be understood that the disclosed systems, apparatuses, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be an indirect coupling or communication connection between devices or units through some interfaces, and may be electrical, mechanical, or other forms.

[0062] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A method for monitoring aging tests, characterized in that, The method includes: Receive test data and verify it; Parse the test data that passes the verification in the test data to obtain the first matching information; The test device is matched by the first matching information, and the second matching information is obtained through the test device. The specific test piece is then matched by the second matching information. Match the specific test piece with the test data to obtain the test result of the specific test piece; The process of matching a test device using the first matching information, obtaining second matching information through the test device, and matching a specific test piece using the second matching information includes: Using the first matching information, the test data is matched to the test workpiece, and then the test equipment is matched according to the test workpiece; The second matching information is determined based on the test equipment, and the specific test piece corresponding to the test equipment is obtained through the second matching information. The device type and production batch of the test piece are determined based on the specific test piece. Before matching the test data to the test workpiece using the first matching information, and then matching the test equipment based on the test workpiece, the method further includes: Establish a mapping relationship between the first matching information, the test equipment, and the test workpiece; Before determining the second matching information based on the testing equipment, obtaining the specific test piece corresponding to the testing equipment through the second matching information, and determining the device type and production batch of the test piece based on the specific test piece, the method further includes: Establish a mapping relationship between the device type, production batch, and testing equipment of the device to be tested; Establish a mapping relationship between the device type of the test piece, the specific test piece in the production batch, and the test workpiece; Wherein, the first matching information is the MAC address of the aging test board, the test workpiece is the aging test board, the test equipment is the aging chamber, and the second matching information is the label of the aging test board and the label of the aging chamber.

2. The method for monitoring aging tests according to claim 1, characterized in that, After matching the specific test piece with the test data and obtaining the test result of the specific test piece, the method further includes: The test results of the specific test piece are then visualized.

3. The method for monitoring aging tests according to claim 1, characterized in that, After matching the specific test piece with the test data and obtaining the test result of the specific test piece, the process further includes: Store the test data and test results of the specific test piece.

4. The method for monitoring aging tests according to claim 1, characterized in that, After matching the specific test piece with the test data and obtaining the test result of the specific test piece, the method further includes: The system receives the test environment parameters of the test equipment and the test workpiece. If the test environment parameters exceed the set threshold, it sends a command to the test equipment and the test workpiece to automatically power off the test equipment and the test workpiece.

5. A device for monitoring aging tests, characterized in that, The device includes: The receiving module is used to receive test data and perform verification. The first matching information acquisition module is used to parse the test data that has passed the verification in the test data and acquire the first matching information. The second matching information acquisition module is used to match the test device with the first matching information, acquire the second matching information through the test device, and match the specific test piece with the second matching information. The test result acquisition module is used to match the specific test piece with the test data and obtain the test result of the specific test piece; The process of matching a test device using the first matching information, obtaining second matching information through the test device, and matching a specific test piece using the second matching information includes: Using the first matching information, the test data is matched to the test workpiece, and then the test equipment is matched according to the test workpiece; The second matching information is determined based on the test equipment, and the specific test piece corresponding to the test equipment is obtained through the second matching information. The device type and production batch of the test piece are determined based on the specific test piece. Before matching the test data to the test workpiece using the first matching information, and then matching the test equipment based on the test workpiece, the method further includes: Establish a mapping relationship between the first matching information, the test equipment, and the test workpiece; Before determining the second matching information based on the testing equipment, obtaining the specific test piece corresponding to the testing equipment through the second matching information, and determining the device type and production batch of the test piece based on the specific test piece, the method further includes: Establish a mapping relationship between the device type, production batch, and testing equipment of the device to be tested; Establish a mapping relationship between the device type of the test piece, the specific test piece in the production batch, and the test workpiece; Wherein, the first matching information is the MAC address of the aging test board, the test workpiece is the aging test board, the test equipment is the aging chamber, and the second matching information is the label of the aging test board and the label of the aging chamber.

6. A terminal device, the terminal device comprising: Memory: Used to store computer programs; Processor: for executing the computer program to implement the method for monitoring aging tests as described in any one of claims 1-4.

7. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the method for monitoring aging tests as described in any one of claims 1-4.

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