Measurement device and image forming apparatus
Patent Information
- Application Number
- CN202111055761.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Priority Date
- 2021-05-20
- Filing Date
- 2021-09-09
- Publication Date
- 2026-09-29
- Estimated Expiration
- 2041-09-09
AI Technical Summary
[0015]根据所述第一方案,在与由电阻测定部执行的测定动作并行地执行第一物性以及第二物性的测定动作的结构中,与在第一测定部中的探测部的驱动开始后对第二测定部进行使第二测定部中的探测部的驱动开始的控制的结构相比,能够缩短直至电阻、第一物性以及第二物性的测定完成为止的测定时间。
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Figure CN115372707B_ABST
Abstract
Description
Technical Field
[0001] This disclosure relates to a measuring device and an image forming device. Background Technology
[0002] Japanese Patent Application Publication No. 2011-137774 discloses a measuring terminal for measuring the resistance of a thin film using a four-terminal method. The four measuring terminals are fixed in position such that the value obtained by dividing the measured voltage value by the current value becomes equal to the sheet resistance value of the thin film. Summary of the Invention
[0003] As a measuring device, consider the following measuring device, which includes: a resistance measuring unit for measuring the resistance of a measured object; a first measuring unit having a detection unit for detecting information indicating a first physical property other than the resistance of the measured object, and measuring the first physical property based on the detection result of the detection unit; and a second measuring unit having a detection unit for detecting information indicating the resistance of the measured object and a second physical property other than the first physical property, and measuring the second physical property based on the detection result of the detection unit, wherein the time from the start of driving the detection unit to the start of actual measurement in the second measuring unit is longer than the time in the first measuring unit.
[0004] In the measuring device, the measurement of the first physical property and the measurement of the second physical property are performed in parallel with the measurement operation performed by the resistance measuring unit, and the driving of the probe in the second measuring unit is started after the driving of the probe in the first measuring unit is started, the measurement time until the measurement of the resistance, the first physical property and the second physical property is completed can sometimes be long.
[0005] The purpose of this disclosure is to shorten the measurement time until the measurement of the first physical property and the second physical property is completed, compared with a structure that controls the second measuring unit to start driving the probe in the second measuring unit after the drive of the probe in the first measuring unit has started.
[0006] According to a first aspect of this disclosure, a measuring apparatus is provided, comprising: a resistance measuring unit for measuring the resistance of a measured object; a first measuring unit having a detection unit for detecting information indicating a first physical property other than the resistance of the measured object, and measuring the first physical property based on the detection result of the detection unit; a second measuring unit having a detection unit for detecting information indicating the resistance of the measured object and a second physical property other than the first physical property, and measuring the second physical property based on the detection result of the detection unit, wherein the time from the start of driving the detection unit to the start of actual measurement in the second measuring unit is longer than the time in the first measuring unit; and a control unit for performing a first control on the first measuring unit, wherein the first control is to perform the measurement action of the first physical property in parallel with the measurement action performed by the resistance measuring unit, and the control unit performs a second control on the second measuring unit, wherein the second control is to perform the measurement action of the second physical property in parallel with the measurement action performed by the resistance measuring unit, and to start driving the detection unit in the second measuring unit before driving the detection unit in the first measuring unit.
[0007] According to the second aspect of this disclosure, the resistance measuring unit has multiple measuring modes for actually measuring the resistance of the object being measured, and the control unit controls at least one of the first measuring unit and the second measuring unit to perform the actual measurement during a period when the resistance measuring unit stops actually measuring the resistance between the multiple measuring modes.
[0008] According to a third aspect of this disclosure, during the stop period, the control unit performs the control to perform actual measurements on the first measuring unit and the measuring unit of the second measuring unit located near the resistance measuring unit.
[0009] According to the fourth aspect of this disclosure, the control unit controls the first measurement unit to start driving the detector in the first measurement unit after the start of driving the detector in the second measurement unit and before the end of the actual measurement.
[0010] According to the fifth aspect of this disclosure, the control unit controls the first measuring unit to start driving the detector in the first measuring unit after the start of driving the detector in the second measuring unit and before the start of actual measurement.
[0011] According to the sixth aspect of this disclosure, the resistance measuring unit has a detection unit that detects information representing the resistance of the object being measured. Along the moving direction of the object being measured, the detection units of the resistance measuring unit, the first measuring unit, and the second measuring unit are arranged in sequence. The control unit has: a first mode in which the first measuring unit is subjected to first control, and the second measuring unit is subjected to second control; and a second mode in which the measuring operations of the resistance measuring unit, the first measuring unit, and the second measuring unit are executed serially according to the arrangement order of the detection units of the resistance measuring unit, the first measuring unit, and the second measuring unit along the moving direction.
[0012] According to the seventh aspect of this disclosure, the first measuring unit applies ultrasonic waves to the object to be measured in order to measure the weight of the first physical property of the object to be measured. The control unit has: a mode in which the first measuring unit is controlled in the first manner and the second measuring unit is controlled in the second manner; and another mode in which the first measuring unit is controlled to perform the measuring action of measuring the weight.
[0013] According to the eighth aspect of this disclosure, an image forming apparatus is provided, comprising: the measuring device; an image forming unit that forms an image on a recording medium, which is the object of measurement, wherein the object of measurement has its resistance, a first physical property, and a second physical property measured by the measuring device; and a control device that controls the image forming operation of the image forming unit based on the resistance, the first physical property, and the second physical property measured by the measuring device.
[0014] (Effect)
[0015] According to the first scheme, in a structure in which the measurement actions of the first physical property and the second physical property are performed in parallel with the measurement action performed by the resistance measurement unit, compared with a structure in which the drive of the probe in the first measurement unit is started and the drive of the probe in the second measurement unit is started, the measurement time until the measurement of the resistance, the first physical property and the second physical property is completed can be shortened.
[0016] According to the second scheme, compared with the structure that controls the actual measurement of both the first measuring unit and the second measuring unit during the execution of the measurement mode utilizing the resistance measuring unit, the influence of noise generated by the actual measurement of the resistance measuring unit on at least one of the first measuring unit and the second measuring unit can be reduced.
[0017] According to the third scheme, compared with the structure that performs actual measurements only on the first measuring unit and the measuring unit in the second measuring unit that is located far from the resistance measuring unit during the stop period, the influence of the resistance measuring unit can be reduced in the measuring unit that is easily affected by the noise generated by the resistance measuring unit because it is located close to the resistance measuring unit.
[0018] According to the fourth scheme, compared with the structure that controls the start of driving the detector in the first measuring unit after the actual measurement in the second measuring unit is completed, the measurement time until the measurement of resistance, the first physical property and the second physical property are completed can be shortened.
[0019] According to the fifth scheme, compared with the structure that controls the start of the drive of the probe in the first measuring unit after the actual measurement in the second measuring unit begins, the measurement time until the measurement of resistance, the first physical property and the second physical property are completed can be shortened.
[0020] According to the sixth scheme, compared with the second mode, in which the measurement operations of the resistance measuring unit, the first measuring unit, and the second measuring unit are performed sequentially according to a different arrangement order than that of the detection units of the resistance measuring unit, the first measuring unit, and the second measuring unit along the moving direction of the measured object, the measurement time until the measurement of the resistance, the first physical property, and the second physical property is completed can be shortened.
[0021] According to the seventh scheme, compared with the structure where the control unit only has a first mode, the measurement time can be shortened when only the weight needs to be measured.
[0022] According to the eighth solution, compared with a structure that performs the image forming operation of the image forming unit regardless of the resistance, first property, and second property of the recording medium, a high-quality image can be formed on the recording medium. Attached Figure Description
[0023] Figure 1 This is a block diagram illustrating the structure of the image forming apparatus of this embodiment.
[0024] Figure 2 This is a schematic diagram showing the structure of the measuring device according to this embodiment.
[0025] Figure 3 This is a diagram showing the measurement actions of each measurement unit in the parallel operation mode of this embodiment.
[0026] Figure 4 This is a diagram showing the measurement operations of each measurement unit in the serial operation mode of this embodiment.
[0027] Figure 5This is a block diagram illustrating an example of the hardware structure of the control circuit in this embodiment.
[0028] Figure 6 This is a block diagram illustrating an example of the functional structure of the processor in the control circuit of this embodiment.
[0029] Figure 7 This is a flowchart illustrating the control processing flow of this embodiment.
[0030] Figure 8 This is a flowchart illustrating the parallel operation mode of this embodiment.
[0031] Figure 9 This is a flowchart illustrating the sequence of operations in this embodiment. Detailed Implementation
[0032] Hereinafter, an example of an embodiment of the present disclosure will be described based on the accompanying drawings.
[0033] (Image forming apparatus 10)
[0034] The structure of the image forming apparatus 10 of this embodiment will be described. Figure 1 This is a block diagram illustrating the structure of the image forming apparatus 10 in this embodiment.
[0035] Figure 1 The image forming apparatus 10 shown is an image forming apparatus. Specifically, as... Figure 1 As shown, the image forming apparatus 10 includes an image forming apparatus body 11, a media receiving section 12, an image forming section 14, a conveying mechanism 15, a control device 16, and a measuring device 20. The image forming apparatus 10 can transmit and receive data with a user terminal 19. The following describes each part of the image forming apparatus 10.
[0036] (Image forming apparatus body 11)
[0037] Figure 1 The image forming apparatus body 11 shown is a part in which the various structural parts of the image forming apparatus 10 are disposed. Specifically, the image forming apparatus body 11 includes, for example, a frame formed in the shape of a box. In this embodiment, a media receiving section 12, an image forming section 14, and a conveying mechanism 15 are provided inside the image forming apparatus body 11.
[0038] (Media containment section 12)
[0039] Figure 1 The media receiving section 12 shown is the portion of the image forming apparatus 10 that houses the paper P. The paper P housed in the media receiving section 12 is supplied to the image forming section 14. Furthermore, the paper P is an example of a "recording medium".
[0040] (Image forming unit 14)
[0041] Figure 1 The image forming unit 14 shown has the function of forming an image on the paper P supplied from the media receiving unit 12. Examples of image forming units 14 include inkjet image forming units that form images on paper P using ink, and electrophotographic image forming units that form images on paper P using toner.
[0042] In an inkjet image forming unit, for example, ink droplets are ejected from the ejection section onto a piece of paper P to form an image on the paper P. Alternatively, an inkjet image forming unit may eject ink droplets from the ejection section onto a transfer body and transfer the ink droplets from the transfer body onto the paper P, thereby forming an image on the paper P.
[0043] In an electrophotographic image forming unit, for example, processes such as charging, exposure, development, transfer, and fixing are performed to form an image on paper P. Alternatively, an electrophotographic image forming unit can perform processes such as charging, exposure, development, and transfer to form an image on a transfer medium. After transferring the image from the transfer medium to paper P, the image is fixed onto paper P, thereby forming an image on paper P.
[0044] Furthermore, as an example of an image forming unit, it is not limited to the aforementioned inkjet image forming unit and the aforementioned electrophotographic image forming unit; various image forming units can be used.
[0045] (Transportation Agency 15)
[0046] Figure 1 The conveying mechanism 15 shown is a mechanism for conveying paper P. As an example, the conveying mechanism 15 conveys paper P by conveying members such as conveying rollers and conveying belts (not shown). The conveying mechanism 15 uses a pre-defined conveying path to convey paper P from the media receiving section 12 to the image forming section 14.
[0047] (Summary of user terminal 19, control device 16 and measuring device 20)
[0048] Figure 1 The user terminal 19 shown may include, for example, a smartphone, tablet, or personal computer. The user terminal 19 can communicate with the measuring device 20 and the control device 16 wirelessly or via a wired connection. Figure 1 As shown, as an example, the measuring device 20 and the control device 16 are disposed outside the image forming apparatus body 11. Furthermore, the user terminal 19 and the control device 16 are each configured with a control unit (control board), which includes a recording unit containing a memory storing programs and a processor that runs according to the programs.
[0049] In this embodiment, the user of the image forming apparatus 10 (i.e., the user) places a piece of paper P for which an image is to be formed in the measuring device 20 and issues a measurement instruction from the user terminal 19. When the measuring device 20 receives the measurement instruction from the user terminal 19, it measures the physical properties of the paper P and sends measurement value information representing the measured physical properties to the user terminal 19.
[0050] The user of the image forming apparatus 10, for example, takes a piece of paper P that has been measured by the measuring device 20 and places it into the media receiving unit 12, and issues an acquisition instruction and an image forming instruction from the user terminal 19. Alternatively, the image forming instruction can also serve as an acquisition instruction.
[0051] When the control device 16 receives an acquisition instruction from the user terminal 19, it acquires measurement value information from the user terminal 19. When the control device 16 receives an image forming instruction from the user terminal 19, it causes the image forming unit 14 and the transport mechanism 15 to perform image forming operations, and controls the operations of the image forming unit 14 and the transport mechanism 15 based on the measurement value information. Specifically, the control device 16 controls the transport speed of the paper P in the transport mechanism 15, and the transfer voltage and fixing temperature in the image forming unit 14, etc., based on the measurement value information.
[0052] Furthermore, in the aforementioned example, the control device 16 is located outside the image forming apparatus body 11, but it may also be located inside the image forming apparatus body 11. Moreover, the control device 16 acquires the measurement value information of the measuring device 20 via the user terminal 19, but it may also be a structure that directly acquires the measurement value information from the measuring device 20.
[0053] Furthermore, the measuring device 20 is located outside the image forming apparatus body 11, but it can also be located inside the image forming apparatus body 11. Specifically, the measuring device 20 can also be configured as a device for measuring physical properties in the medium receiving section 12 or the transport path of the paper P.
[0054] (Specific structure of measuring device 20)
[0055] Figure 2 This is a schematic diagram showing the structure of the measuring device 20 according to this embodiment. In the diagram, arrow UP indicates the top (vertical top) of the device, and arrow DO indicates the bottom (vertical bottom) of the device. Furthermore, arrow LH indicates the left side of the device, and arrow RH indicates the right side. Also, arrow FR indicates the front of the device, and arrow RR indicates the rear of the device. These directions are provided for ease of explanation, and the device structure is not limited to these directions. Additionally, the term "device" may sometimes be omitted in the description of the various directions of the device. That is, for example, "above the device" may sometimes be simply referred to as "above".
[0056] Furthermore, in the following explanations, "up and down direction" is sometimes used to mean "both the directions above and below" or "either the directions above and below." "Left and right direction" is sometimes used to mean "both the directions to the right and left" or "either the directions to the right and left." "Left and right direction" can also be called the horizontal direction or the lateral direction. "Front and back direction" is sometimes used to mean "both the directions to the front and back" or "either the directions to the front and back." The front and back direction can also be called the horizontal direction or the lateral direction. Moreover, the up and down, left and right, and front and back directions are intersecting directions (specifically, orthogonal directions).
[0057] Furthermore, the "×" symbol within the "○" in the diagram indicates an arrow pointing from the front of the paper towards the depths. Also, the "·" symbol within the "○" in the diagram indicates an arrow pointing from the depths of the paper towards the front.
[0058] The measuring device 20 is an apparatus for measuring the physical properties of the paper P used in the image forming apparatus 10. Specifically, the measuring device 20 measures the basis weight, resistivity, and presence or absence of a coating on the paper P. Furthermore, "measuring" refers to measuring the value (i.e., degree) of a physical property, but the value of the physical property includes the concept of 0 (zero). In other words, "measuring" includes: measuring whether the value of the physical property is 0 (zero), that is, measuring whether the physical property exists.
[0059] Specifically, such as Figure 2 As shown, the measuring device 20 includes a first frame 21, a second frame 22, a weight measuring unit 30, a resistance measuring unit 50, and a coating measuring unit 70. The following describes each part of the measuring device 20.
[0060] (First frame 21)
[0061] The first frame 21 is a portion for mounting parts of the various structural components of the measuring device 20. The first frame 21 forms the lower side portion of the measuring device 20. The first frame 21 has a facing surface 21A facing the lower surface of the paper P. The facing surface 21A is also a support surface that supports the paper P from below. Inside the first frame 21, a portion of the basis weight measuring unit 30 and a portion of the resistance measuring unit 50 are disposed.
[0062] (Second frame 22)
[0063] The second frame 22 is another part for housing the various structural parts of the measuring device 20. The second frame 22 forms the upper side of the measuring device 20. The second frame 22 has an opposing surface 22A facing the upper surface of the paper P. Inside the second frame 22, another part of the basis weight measuring unit 30, the coating measuring unit 70, and another part of the resistance measuring unit 50 are disposed. In the measuring device 20, a piece of paper P, which is an example of the object to be measured, is disposed between the first frame 21 and the second frame 22.
[0064] (Weight Measurement Section 30)
[0065] Figure 2 The basis weight measuring unit 30 shown has a method for measuring the basis weight [g / m] of paper P by vibrating it with ultrasound. 2 The function of performing measurements is described. The basis weight measuring unit 30 is an example of a "first measuring unit." The paper P is an example of a "measuring object." Basis weight is an example of a "first physical property other than electrical resistance." Specifically, as... Figure 2 As shown, the weight measuring unit 30 includes a drive circuit 31, a transmitting unit 32, a receiving unit 35, and a processing unit 36.
[0066] The transmitting unit 32 has the function of transmitting ultrasonic waves toward the paper P. The transmitting unit 32 is disposed in the second frame 22. That is, the transmitting unit 32 is disposed in a position facing one side (specifically, the upper surface) of the paper P. In addition, an opening 24 is formed on the lower side of the transmitting unit 32 in the second frame 22 to allow the ultrasonic waves from the transmitting unit 32 to pass toward the paper P.
[0067] The drive circuit 31 drives the transmitting unit 32. By driving the transmitting unit 32 through the drive circuit 31, the transmitting unit 32 imparts ultrasonic waves from the upper surface of the paper P, causing the paper P to vibrate. The vibrating paper P causes the air below the paper P to vibrate. In other words, the ultrasonic waves from the transmitting unit 32 pass through the paper P.
[0068] The receiving unit 35 has the function of receiving ultrasonic waves that have passed through the paper P. The receiving unit 35 is disposed in the first frame 21. That is, the receiving unit 35 is disposed facing the other side (specifically, the lower surface) of the paper P. The receiving unit 35 receives ultrasonic waves that have passed through the paper P, thereby generating a received signal. In addition, an opening 23 is formed on the upper side of the receiving unit 35 in the first frame 21 to allow ultrasonic waves from the paper P side to pass towards the receiving unit 35.
[0069] Thus, in the basis weight measuring unit 30, a detection unit 325 (specifically a detection sensor) is formed by a transmitting unit 32 and a receiving unit 35 to detect information indicating the basis weight of the paper P (specifically, ultrasonic waves transmitted through the paper P). A driving circuit 31 forms a circuit that drives the detection unit 325.
[0070] The processing unit 36 processes the received signal (i.e., the detection result) acquired from the receiving unit 35 by amplification and other methods to obtain a measurement value. Then, the processing unit 36 outputs measurement value information representing the obtained measurement value to the user terminal 19. As an example, the processing unit 36 includes circuitry containing amplifier circuitry and the like.
[0071] The measurement values obtained by the processing unit 36 are values related to the basis weight of the paper P. Therefore, the measurement in the basis weight measuring unit 30 includes not only measuring the basis weight of the paper P itself, but also measuring the measurement values related to the basis weight of the paper P.
[0072] Furthermore, in the basis weight measuring unit 30, the basis weight of paper P can also be calculated based on the measured value obtained by the processing unit 36. Specifically, the basis weight measuring unit 30 calculates the basis weight, for example, based on correlation data indicating the relationship between the measured value and the basis weight. As described above, in the basis weight measuring unit 30, the basis weight of paper P is measured based on the detection result of the detection unit 325.
[0073] (Coating Measurement Unit 70)
[0074] Figure 2 The coating measuring unit 70 shown has the function of measuring whether or not a coating is present on the paper P. A coating is a layer formed by applying a coating agent to the surface of the paper. In other words, the coating measuring unit 70 measures whether the paper P is coated paper (i.e., coated paper).
[0075] The coating measurement unit 70 is an example of a "second measurement unit". The presence or absence of a coating is an example of "resistance and a second property other than the first property". Specifically, as... Figure 2 As shown, the coating measurement unit 70 includes a drive circuit 71, a light irradiation unit 72, a light receiving unit 75, and a processing unit 76.
[0076] The light irradiation unit 72 has the function of irradiating light onto the paper P. The light irradiation unit 72 is disposed in the second frame 22. That is, the light irradiation unit 72 is disposed in a facing position with a gap relative to one side (specifically the upper surface) of the paper P. In addition, an opening 28 is formed on the lower side of the light irradiation unit 72 in the second frame 22 to allow light from the light irradiation unit 72 to pass through toward the paper P.
[0077] The driving circuit 71 is a circuit that drives the light irradiation unit 72. By driving the light irradiation unit 72 through the driving circuit 71, the light irradiation unit 72 irradiates light onto the paper P, and the light is reflected by the paper P.
[0078] The light-receiving portion 75 has the function of receiving reflected light reflected by the paper P. The light-receiving portion 75 is disposed in the second frame 22. That is, the light-receiving portion 75 is disposed in a facing position with a gap relative to one side (specifically the upper surface) of the paper P. The light-receiving portion 75 receives the reflected light reflected by the paper P, thereby generating a light-receiving signal. In addition, an opening 29 is formed on the lower side of the light-receiving portion 75 in the second frame 22 to allow light from the paper P side to pass through the light-receiving portion 75.
[0079] Thus, in the coating measurement unit 70, a detection unit 725 (specifically a detection sensor) is formed by a light irradiation unit 72 and a light receiving unit 75 to detect information indicating the presence or absence of a coating on the paper P (specifically, reflected light reflected by the paper P). A drive circuit 71 forms the circuit for driving the detection unit 725.
[0080] The processing unit 76 amplifies and processes the light-receiving signal (i.e., the detection signal) acquired from the light-receiving unit 75 to obtain a measurement value. Furthermore, the processing unit 76 outputs measurement value information representing the obtained measurement value to the user terminal 19. As an example, the processing unit 76 includes circuitry containing amplifier circuitry, etc.
[0081] The measurement values obtained by the processing unit 76 are values related to the presence or absence of the coating on the paper P. Therefore, the measurement in the coating measurement unit 70 includes not only measuring the presence or absence of the coating on the paper P itself, but also measuring the measurement values related to the presence or absence of the coating on the paper P.
[0082] Furthermore, in the coating measurement unit 70, the presence or absence of a coating on the paper P can also be determined based on the measurement value obtained by the processing unit 76. Specifically, the presence or absence of a coating is determined, for example, based on whether the measurement value exceeds a predetermined threshold. As described above, in the coating measurement unit 70, the presence or absence of a coating on the paper P is determined based on the detection result of the detection unit 725.
[0083] (Resistance measuring section 50)
[0084] Figure 2 The resistance measuring unit 50 shown has the function of measuring the surface resistance value [Ω] of paper P. The resistance measuring unit 50 is an example of a "resistance measuring unit". Surface resistance is an example of "resistance". Specifically, as... Figure 2 As shown, the resistance measuring unit 50 includes a circuit 51, a pair of terminals 52, a power supply 53, a pair of opposing members 54, a detection circuit 55, and a processing unit 56.
[0085] A pair of terminals 52 are disposed, for example, in the first frame 21. The pair of terminals 52, spaced apart from each other in the left-right direction, contact the lower surface of the paper P through an opening 25 formed in the first frame 21. Each pair of terminals 52 is electrically connected to a power supply 53 via a circuit 51.
[0086] A pair of opposing members 54 face each other with a piece of paper P disposed between each pair of terminals 52. Each pair of opposing members 54 contacts the upper surface of the paper P through an opening 26 formed in the second frame 22. That is, the paper P is sandwiched between each opposing member of the pair of opposing members 54 and each terminal of the pair of terminals 52. As an example, each opposing member of the pair of opposing members 54 and each terminal of the pair of terminals 52 includes a roller.
[0087] Power supply 53 applies a predetermined voltage (V) to a pair of terminals 52 via circuit 51. Consequently, a current corresponding to the surface resistance of the paper P flows between the pairs of terminals 52. Detection circuit 55 is electrically connected to the pairs of terminals 52. Detection circuit 55 generates a detection signal by detecting the current flowing between the pairs of terminals 52.
[0088] Thus, in the resistance measuring unit 50, a detection unit 525 (specifically a detection sensor) is formed by a pair of terminals 52 and a detection circuit 55 to detect information representing the surface resistance of the paper P (specifically, the current flowing through the paper P). The circuit 51 forms a circuit that drives the detection unit 525.
[0089] The processing unit 56 amplifies and processes the detection signal (i.e., the detection result) obtained from the detection circuit 55 to obtain a measured value (specifically, a current value [A]). Then, the processing unit 56 outputs the measured value information, representing the obtained measured value, to the user terminal 19. As an example, the processing unit 56 includes circuitry containing an amplification circuit or the like.
[0090] The measured value obtained by the processing unit 56 is a value related to the surface resistance value of the paper P. Therefore, the measurement in the resistance measuring unit 50 includes not only measuring the surface resistance value of the paper P itself, but also measuring the measured value related to the surface resistance value of the paper P. Furthermore, the resistance measuring unit 50 can also calculate the surface resistance value of the paper P based on the measured value obtained by the processing unit 56. As described above, the resistance measuring unit 50 measures the surface resistance value of the paper P based on the detection result of the detection unit 525.
[0091] Furthermore, the resistance measuring unit 50 employs a structure in which a predetermined voltage is applied to a pair of terminals 52, and the surface resistance value is determined by detecting the current flowing between the pair of terminals 52. However, this is not a limitation. For example, a structure could also be used in which a predetermined current value is allowed to flow through the pair of terminals 52, and the voltage between the pair of terminals 52 is detected to determine the surface resistance value.
[0092] (Configuration of the weight measuring unit 30, the resistance measuring unit 50, and the coating measuring unit 70)
[0093] Here, the configuration of the weight measuring unit 30, the resistance measuring unit 50, and the coating measuring unit 70 will be described.
[0094] like Figure 2 As shown, the weight measuring unit 30 is disposed at one end (specifically, the left end) of the first frame 21 and the second frame 22. On the other hand, the resistance measuring unit 50 is disposed at the other end (specifically, the right end) of the first frame 21 and the second frame 22.
[0095] The coating measuring unit 70 is disposed between the basis weight measuring unit 30 and the resistance measuring unit 50 in the left-right direction. Therefore, the coating measuring unit 70, along with the resistance measuring unit 50 and the basis weight measuring unit 30, is disposed within the paper size of the paper P. In this embodiment, when viewed in the front-back direction and the up-down direction, the coating measuring unit 70 is disposed between the basis weight measuring unit 30 and the resistance measuring unit 50.
[0096] Thus, in this embodiment, the basis weight measuring unit 30, the coating measuring unit 70, and the resistance measuring unit 50 are arranged in this order from left to right in the measuring device 20 (specifically, the first frame 21 and the second frame 22). Therefore, in this embodiment, the measuring unit located near the resistance measuring unit 50 among the basis weight measuring unit 30 and the coating measuring unit 70 is the coating measuring unit 70.
[0097] Furthermore, in this embodiment, the paper P, as an example of the object of measurement, moves from the left side to the right side relative to the measuring device 20 (specifically, the first frame 21 and the second frame 22) and is positioned between the first frame 21 and the second frame 22. Therefore, along the moving direction of the paper P, the detection unit 325 (specifically, the transmitting unit 32 and the receiving unit 35) of the basis weight measuring unit 30, the detection unit 725 (specifically, the light irradiation unit 72 and the light receiving unit 75) of the coating measuring unit 70, and the detection unit 525 (specifically, a pair of terminals 52) of the resistance measuring unit 50 are arranged in this order.
[0098] In addition, when the measuring device 20 is configured to measure the physical properties of paper P in the conveying path of the image forming apparatus, the measuring device 20 is configured, for example, such that paper P is conveyed from the left side to the right side in the measuring device 20 (specifically the first frame 21 and the second frame 22).
[0099] (Measuring operations in the weight measuring unit 30, resistance measuring unit 50, and coating measuring unit 70)
[0100] In each of the weight measuring unit 30, the resistance measuring unit 50, and the coating measuring unit 70, the detection unit 325, the detection unit 525, and the detection unit 725 are activated to perform actual physical property measurements (see reference). Figure 3 That is, the measuring operations of the weight measuring unit 30, the resistance measuring unit 50, and the coating measuring unit 70 are as follows: Figure 3 As shown, the operation continues from the start of the actual measurement of the material property by driving each of the detection units 325, 525, and 725 until the end of the actual measurement. Furthermore, the measurement time is the time from the start of the actual measurement of the material property by driving each of the detection units 325, 525, and 725 until the end of the actual measurement. In addition, "actual measurement" refers to the actual measurement of the material property, that is, the state of obtaining a measured value based on the detection results obtained from the detection units that detect information representing the material property.
[0101] In this embodiment, such as Figure 3 As shown, the resistance measuring unit 50 has multiple measuring modes for measuring the surface resistance value of paper P. Specifically, the resistance measuring unit 50 has a first measuring mode, a second measuring mode, and a third measuring mode. The first measuring mode, the second measuring mode, and the third measuring mode are modes in which the measurement is performed within a predetermined range of surface resistance values.
[0102] Specifically, as an example, the first measurement mode is set to measure the surface resistance value within a measurement range exceeding 11.5 [logΩ] and below 14.5 [logΩ]. As an example, the second measurement mode is set to measure within a measurement range exceeding 9 [logΩ] and below 11.5 [logΩ]. As an example, the third measurement mode is set to measure the surface resistance value within a measurement range exceeding 4 [logΩ] and below 9 [logΩ]. In each measurement mode, the voltage applied to the paper P and the magnification rate during magnification processing are set corresponding to each measurement range.
[0103] In the resistance measuring unit 50, for example, the first measuring mode, the second measuring mode, and the third measuring mode are executed in this order. However, the order in which the resistance measuring unit 50 executes the modes is not limited to the aforementioned order.
[0104] Furthermore, the resistance measuring unit 50 has a stop period between measurement modes when performing multiple measurement modes to stop the actual measurement of the surface resistance value.
[0105] Thus, the resistance measuring unit 50 executes multiple measuring modes and has a pause period between measuring modes, so the measuring time is longer than the measuring time in the basis weight measuring unit 30 and the measuring time in the coating measuring unit 70. Moreover, the measuring time in the coating measuring unit 70 is longer than the measuring time in the basis weight measuring unit 30.
[0106] Furthermore, the term "measurement operation when performing multiple measurement modes in the resistance measurement unit 50" refers to a concept that includes the stop period between each measurement mode. Therefore, the measurement time when performing multiple measurement modes in the resistance measurement unit 50 includes the stop period between each measurement mode.
[0107] Furthermore, in this embodiment, the coating measurement unit 70 begins the actual measurement of the presence or absence of a coating only after the driving of the detection unit 725 (specifically, the light irradiation unit 72 and the light receiving unit 75) has been started. In the coating measurement unit 70, it takes time until the output (i.e., the amount of light) of the light irradiation unit 72 stabilizes, so the actual measurement is performed after a predetermined time has elapsed since the driving of the detection unit 725 began.
[0108] On the other hand, in the basis weight measuring unit 30 and the resistance measuring unit 50, the actual measurement is performed simultaneously with or immediately after the start of the driving of the detector unit 325 and the detector unit 525, respectively. Therefore, the time from the start of driving of the detector unit 725 in the coating measuring unit 70 to the start of the actual measurement (hereinafter referred to as the stabilization time) is longer than the stabilization time in the basis weight measuring unit 30 and the resistance measuring unit 50. In addition, the stabilization time of the basis weight measuring unit 30 and the resistance measuring unit 50 only needs to be shorter than the stabilization time in the coating measuring unit 70, or it can be 0 (zero).
[0109] (Control circuit 80)
[0110] The control circuit 80 has a control function that controls the operation of the weight measuring unit 30, the resistance measuring unit 50, and the coating measuring unit 70. Specifically, as follows: Figure 5 As shown, the control circuit 80 has a processor 81, a memory 82, and a storage unit 83.
[0111] The term "processor" refers to processors in a broad sense. As processors 81, they include general-purpose processors (such as central processing units (CPUs)) and dedicated processors (such as graphics processing units (GPUs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), programmable logic devices, etc.).
[0112] Memory 83 stores control program 83A (see reference) Figure 6 The storage device 83 contains various programs and data. Specifically, the storage device 83 is implemented using recording devices such as hard disk drives (HDDs), solid state drives (SSDs), and flash memory.
[0113] Memory 82 is a working area for processor 81 to execute various programs. During processing, processor 81 temporarily records various programs or data. Processor 81 reads various programs, including control program 83A, from memory 83 into memory 82 and uses memory 82 as a working area to execute programs.
[0114] In the control circuit 80, the processor 81 executes the control program 83A, thereby realizing various functions. The functional structure achieved through the cooperation of the processor 81 (a hardware resource) and the control program 83A (a software resource) will be described below. Figure 6 This is a block diagram representing the functional structure of processor 81.
[0115] like Figure 6 As shown, in the control circuit 80, the processor 81 performs the functions of the acquisition unit 81A and the control unit 81B by executing the control program 83A.
[0116] The acquisition unit 81A acquires the parallel operation mode (see reference) from the user terminal 19. Figure 3 ) execution instructions and execution sequence action mode (refer to Figure 4 The execution instruction can be any one of the following: (1) (2) (3) (4) (5) (6) (7) (8) (9) (10) (11) (12) (13) (14) (15) (16) (17) (18) (19) (19) (19) (19) (19) (19) (19) (19) (19) (20 ...20) (19) (19) (1
[0117] The control unit 81B can execute both a parallel operation mode and a serial operation mode as control modes. Specifically, when the acquisition unit 81A acquires an execution instruction to execute the parallel operation mode, the control unit 81B executes the parallel operation mode. When the acquisition unit 81A acquires an execution instruction to execute the serial operation mode, the control unit 81B executes the serial operation mode. In other words, when the acquisition unit 81A does not acquire an execution instruction to execute the parallel operation mode, the control unit 81B executes the serial operation mode instead of the parallel operation mode.
[0118] Parallel action mode (see reference) Figure 3 In this process, the control unit 81B performs first control on the basis weight measuring unit 30 and second control on the coating measuring unit 70. The first control is the control that performs the measurement action of measuring basis weight in parallel with the measurement action performed by the resistance measuring unit 50.
[0119] "Parallel execution" in the first control means that at least a portion of the measurement action performed by the resistance measuring unit 50 and at least a portion of the measurement action performed by the weight measuring unit 30 are executed in time overlapping.
[0120] Furthermore, in the first control, the control unit 81B controls the starting of the driving of the detector 725 in the coating measurement unit 70 after the start of the driving of the detector 725 in the coating measurement unit 70 and before the end of the actual measurement. Specifically, in the first control, the control unit 81B controls the starting of the driving of the detector 325 in the coating measurement unit 30 after the start of the driving of the detector 725 in the coating measurement unit 70 and before the start of the actual measurement.
[0121] Furthermore, in the first control, during the pause between measurement modes in the resistance measurement unit 50, the control unit 81B controls the weight measurement unit 30 to perform actual measurements. Specifically, for example, during the pause between the first measurement mode and the second measurement mode in the resistance measurement unit 50, the control unit 81B controls the weight measurement unit 30 to perform actual measurements.
[0122] The second control is a control that performs a measurement action to determine the presence or absence of a coating in parallel with the measurement action performed by the resistance measuring unit 50, and starts the drive of the detection unit 725 in the coating measuring unit 70 before the drive of the detection unit 325 in the weight measuring unit 30 starts.
[0123] "Parallel execution" in the second control means that at least a portion of the measurement action performed by the resistance measuring unit 50 and at least a portion of the measurement action performed by the coating measuring unit 70 are executed in time overlapping.
[0124] In the second control, the control unit 81B controls the coating measurement unit 70 to perform actual measurements during the pause between measurement modes in the resistance measurement unit 50. Specifically, for example, the control unit 81B controls the coating measurement unit 70 to perform actual measurements during the pause between the second and third measurement modes in the resistance measurement unit 50. Furthermore, the coating measurement unit 70 is an example of a measurement unit "located close to the resistance measurement unit".
[0125] On the other hand, serial action mode (refer to) Figure 4 In this configuration, the control unit 81B executes the measurement operations of the resistance measuring unit 50, the basis weight measuring unit 30, and the coating measuring unit 70 sequentially according to the arrangement of the detectors 525 of the resistance measuring unit 50, the basis weight measuring unit 30, and the coating measuring unit 70 along the moving direction of the paper P. That is, in the sequential operation mode, the control unit 81B controls the execution of the measurement operations of the basis weight measuring unit 30, the coating measuring unit 70, and the resistance measuring unit 50 in that order. Furthermore, "sequential execution" means that the measurement operations are performed sequentially without overlap or deviation in time, from the beginning to the end of each measurement operation.
[0126] In this embodiment, the control circuit 80 is an example of a "control unit". Alternatively, the processor 81 or the control unit 81B can also be understood as an example of a "control unit".
[0127] (The function of this implementation method)
[0128] The following is an example illustrating the function of this embodiment. Figure 7 , Figure 8 as well as Figure 9 It is a flowchart representing the control process executed by the control circuit 80.
[0129] This process is performed by the processor 81 reading from the memory 83 and executing the control program 83A. As an example, this process begins when the processor 81 receives a measurement instruction from the user terminal 19.
[0130] like Figure 7 As shown, firstly, the processor 81 determines whether it has obtained an execution instruction indicating a parallel operation mode from the user terminal 19 as a measurement instruction (step S101). If it is determined that an execution instruction indicating a parallel operation mode has been obtained as a measurement instruction (step S101: yes), then the processor 81 executes the parallel operation mode (step S102).
[0131] On the other hand, if it is determined that no execution instruction for executing the parallel operation mode has been obtained as a measurement instruction (step S101: No), then the processor 81 executes the serial operation mode (step S103).
[0132] Furthermore, in this embodiment, the measurement instruction may be only an execution instruction of either the parallel operation mode or the serial operation mode. Therefore, "the case where the execution instruction of the parallel operation mode is not obtained as the measurement instruction" is equivalent to "the case where the execution instruction of the serial operation mode is obtained as the measurement instruction".
[0133] In the parallel action mode (step S102), such as Figure 3 as well as Figure 8 As shown, the processor 81 causes the resistance measuring unit 50 to start driving the detection unit 525 and begins actual measurement (step S201). Thus, the resistance measuring unit 50 performs measurement operations having a first measurement mode, a second measurement mode, and a third measurement mode.
[0134] Then, the processor 81 causes the coating measurement unit 70 to start driving the detection unit 725 (step S202). That is, the processor 81 starts driving the detection unit 725 in the coating measurement unit 70 before driving the detection unit 325 in the weight measurement unit 30. As a result, the coating measurement unit 70 performs the driving operation of the detection unit 725. In other words, the processor 81 performs the measurement operation of the coating measurement unit 70 in parallel with the measurement operation of the resistance measurement unit 50.
[0135] Figure 3 In the example shown, the start of driving the detector 525 in the resistance measuring unit 50 and the start of actual measurement are performed simultaneously with the start of driving the detector 725 in the coating measuring unit 70. Furthermore, the start of driving the detector 725 in the coating measuring unit 70 can be performed either before or after the start of driving the detector 525 in the resistance measuring unit 50 and the start of actual measurement.
[0136] Next, during the execution of the measurement operation of the resistance measurement unit 50 and the measurement operation of the coating measurement unit 70 (specifically, during the driving process of the detection unit 725), the processor 81 causes the weight measurement unit 30 to start driving the detection unit 325 and begins actual measurement (step S203).
[0137] That is, the processor 81 starts driving the detector 325 in the basis weight measuring unit 30 after the start of driving the detector 725 in the coating measuring unit 70 and before the end of the actual measurement. Specifically, the processor 81 starts driving the detector 325 in the basis weight measuring unit 30 after the start of driving the detector 725 in the coating measuring unit 70 and before the start of the actual measurement.
[0138] In step S203, specifically, during the pause between the first measurement mode and the second measurement mode in the resistance measurement unit 50, the processor 81 causes the basis weight measurement unit 30 to perform an actual measurement. In other words, the processor 81 executes the measurement operation of the basis weight measurement unit 30 in parallel with the measurement operations of the resistance measurement unit 50 and the coating measurement unit 70.
[0139] Next, during the pause between the second and third measurement modes in the resistance measurement unit 50, the processor 81 causes the coating measurement unit 70 to perform actual measurements (step S204). In the parallel operation mode, the execution of the measurement operation of the resistance measurement unit 50 ends, thereby ending the process.
[0140] On the other hand, in the serial operation mode (step S103), such as Figure 4 as well as Figure 9 As shown, the processor 81 first causes the basis weight measuring unit 30 to perform a measurement operation (step S301). Next, after the measurement operation of the basis weight measuring unit 30 is completed, the processor 81 causes the coating measuring unit 70 to perform a measurement operation (step S302). Next, after the measurement operation of the coating measuring unit 70 is completed, the processor 81 causes the resistance measuring unit 50 to perform a measurement operation (step S303), thus ending the process.
[0141] In this serial operation mode, the processor 81 causes the basis weight measuring unit 30, the coating measuring unit 70, and the resistance measuring unit 50 to perform measurement operations serially in the arrangement sequence of the detection units 325, 725, and 525 along the moving direction of the paper P.
[0142] As described above, in this embodiment, in a structure in which the measurement operations performed by the weight measurement unit 30 and the coating measurement unit 70 are performed in parallel with the measurement operations performed by the resistance measurement unit 50, the processor 81 starts the driving of the detection unit 725 in the coating measurement unit 70 before the driving of the detection unit 325 in the weight measurement unit 30 starts (step S201).
[0143] In this way, the coating measurement unit 70, whose stabilization time is longer than that of the basis weight measurement unit 30 and the resistance measurement unit 50, is driven first, thereby allowing the measurement results of the coating measurement unit 70 to be obtained earlier. As a result, in a structure in which the measurement actions performed by the basis weight measurement unit 30 and the coating measurement unit 70 are performed in parallel with the measurement actions performed by the resistance measurement unit 50, compared to a structure in which the drive of the detection unit 325 in the coating measurement unit 70 is started after the drive of the detection unit 325 in the basis weight measurement unit 30 is started, the measurement time until the measurement of the surface resistance value, basis weight, and presence or absence of coating of the paper P is completed is shortened.
[0144] Furthermore, in this embodiment, during the pause between multiple measurement modes in the resistance measurement unit 50, the processor 81 causes the basis weight measurement unit 30 and the coating measurement unit 70 to perform actual measurements (steps S203 and S204).
[0145] Therefore, compared to the structure (hereinafter referred to as structure A) in which the basis weight measuring unit 30 and the coating measuring unit 70 perform actual measurements during the execution of the measurement mode utilizing the resistance measuring unit 50, the influence of the actual measurement by the resistance measuring unit 50 on the noise generated by the basis weight measuring unit 30 and the coating measuring unit 70 is reduced. Specifically, according to this embodiment, compared to structure A, the influence of noise between the drive circuit 71 and the circuit 51, as well as the influence of noise between the drive circuit 31 and the circuit 51, is suppressed.
[0146] Thus, in this embodiment, the processor 81 causes the coating measurement unit 70, which is located near the resistance measurement unit 50, in the weight measurement unit 30 and the coating measurement unit 70, to perform actual measurements during the pause between multiple measurement modes in the resistance measurement unit 50 (step S204).
[0147] Therefore, compared to a structure in which the basis weight measuring unit 30 and the coating measuring unit 70 are positioned far from the resistance measuring unit 50 and the basis weight measuring unit 30 perform actual measurements during the stop period between multiple measurement modes in the resistance measuring unit 50, the influence is reduced in a measuring unit that is easily affected by noise generated by the resistance measuring unit 50 because it is positioned close to the resistance measuring unit 50.
[0148] Furthermore, in this embodiment, the processor 81 starts driving the detector 325 in the weight measurement unit 30 after the start of driving the detector 725 in the coating measurement unit 70 and before the end of the actual measurement (step S203).
[0149] Therefore, compared to the structure where the drive of the detection unit 325 in the basis weight measurement unit 30 is started after the actual measurement in the coating measurement unit 70 is completed (hereinafter referred to as structure B), the measurement results in the basis weight measurement unit 30 can be obtained earlier. Therefore, according to this embodiment, compared to structure B, the measurement time until the measurement of the surface resistivity, basis weight, and presence or absence of coating of the paper P is completed is shortened.
[0150] Specifically, in this embodiment, the processor 81 starts driving the detector 325 in the weight measurement unit 30 after the drive of the detector 725 in the coating measurement unit 70 starts and before the actual measurement starts.
[0151] Therefore, compared to the structure where the drive of the probe 325 in the basis weight measurement unit 30 is started after the actual measurement in the coating measurement unit 70 begins (hereinafter referred to as structure C), the measurement results in the basis weight measurement unit 30 can be obtained earlier. Therefore, according to this embodiment, compared to structure C, the measurement time until the measurement of the surface resistivity, basis weight, and presence or absence of coating of the paper P is completed is shortened.
[0152] Furthermore, in this embodiment, in the serial operation mode, the processor 81 causes the basis weight measuring unit 30, the coating measuring unit 70, and the resistance measuring unit 50 to perform measurement operations serially in the arrangement sequence of their detection units 325, 725, and 525 along the moving direction of the paper P. In this configuration, the paper P can be measured while it is being moved. That is, the measurement can begin before the paper P is positioned between the right end of the first frame 21 and the right end of the second frame 22.
[0153] In the structure (hereinafter referred to as structure D) in which the processor 81 serially performs the measurement operations of the basis weight measuring unit 30, the coating measuring unit 70, and the resistance measuring unit 50 in a different order than the arrangement order of the detection units 325, 725, and 525 along the moving direction of the paper P, for example, if the resistance measuring unit 50 is performed first, the measurement cannot begin until the paper P is positioned between the right end of the first frame 21 and the right end of the second frame 22. Therefore, according to this embodiment, compared with structure D, the measurement time until the measurement of the surface resistance value, basis weight, and presence or absence of coating of the paper P is completed is shortened.
[0154] Furthermore, in this embodiment, when the control device 16 receives an image forming instruction from the user terminal 19, it causes the image forming unit 14 and the conveying mechanism 15 to perform an image forming operation, and controls the operation of the image forming unit 14 and the conveying mechanism 15 based on the measured value information. Therefore, compared with a structure that performs an image forming operation regardless of the physical properties of the paper P, a high-quality image can be formed on the paper P.
[0155] (A variation of the control mode)
[0156] In this embodiment, the control unit 81B can execute a parallel operation mode and a serial operation mode as control modes, but it is not limited to these. For example, it can also be structured such that the control unit 81B can execute an image quality priority mode and a congestion suppression priority mode as control modes. Specifically, the control unit 81B executes the image quality priority mode, for example, when the acquisition unit 81A acquires an execution instruction to execute the image quality priority mode. The control unit 81B executes the congestion suppression priority mode when the acquisition unit 81A acquires an execution instruction to execute the congestion suppression priority mode. In addition, the image quality priority mode is an example of "one mode", and the congestion suppression priority mode is an example of "another mode".
[0157] In the image quality priority mode, the control unit 81B performs the same control as in the parallel operation mode. Therefore, the measuring device 20 can obtain the measurement results (i.e., measurement values) of the surface resistivity, basis weight, and presence / absence of coating on the paper P. Furthermore, the control device 16 controls the operation of the image forming unit 14 and the transport mechanism 15 based on the measurement value information. Specifically, the control device 16 controls the transport speed of the paper P in the transport mechanism 15 and the transfer voltage and fixing temperature in the image forming unit 14 based on the measurement value information. Thus, a high-quality image can be formed on the paper P.
[0158] On the other hand, in the blockage suppression priority mode, the control unit 81B controls the basis weight measuring unit 30 to perform the measurement operation of measuring the basis weight of paper P. However, it does not control the measurement of the surface resistivity of paper P or the presence or absence of a coating. That is, in the blockage suppression priority mode, the measuring device 20 only obtains the measurement result (i.e., the measured value) of the basis weight of paper P. Furthermore, the control device 16 controls, for example, the operation (e.g., the conveying speed) of the conveying mechanism 15 based on the measured value information. As a result, blockage (i.e., paper blockage) in the conveying path of paper P is suppressed.
[0159] In this modified example, compared to the structure where the control unit 81B can only execute the image quality priority mode, for example, when the user wants to prioritize suppressing clogging (i.e., only wants to measure the weight), the measurement time can be shortened by executing the clogging suppression priority mode.
[0160] (Modified Example)
[0161] In this embodiment, a recording medium is used as an example of the object to be measured, but it is not limited to this. The object to be measured may also be used for purposes other than forming images. Furthermore, in this embodiment, paper P is used as an example of the recording medium, but it is not limited to this. The recording medium may also be a sheet-like recording medium other than paper P, such as a metal or resin film.
[0162] In this embodiment, as an example of a resistance measuring unit, a resistance measuring unit 50 is used to measure the surface resistance value of paper P, but it is not limited to this. As an example of a resistance measuring unit, it may also be a measuring unit that measures other physical properties of the object being measured, such as volume resistivity. That is, as an example of resistance, it may also be a measuring unit that measures other physical properties of the object being measured, such as volume resistivity. In addition, when measuring the volume resistivity of paper P, one of the pair of terminals 52 is disposed on the upper surface side of paper P, and the other is disposed on the lower surface side of paper P, with the pair of terminals 52 clamping paper P in the vertical direction.
[0163] Furthermore, in this embodiment, as an example of the first measuring unit, the basis weight [g / m] of the paper P was used. 2 The first measuring unit 30 is used for measuring the weight, but is not limited to this. As an example of the first measuring unit, it may also be used for measuring the thickness [m] and density [g / m³] of the object being measured. 3 A measuring unit for measuring other physical properties such as thickness [m], mass [g], and stiffness (i.e., rigidity). That is, as an example of the first physical property, it can also measure the thickness [m], density [g / m³], etc. of the object being measured. 3 Other physical properties include mass [g] and stiffness (i.e., rigidity).
[0164] Furthermore, in this embodiment, as an example of the second measuring unit, a coating measuring unit 70 is used to measure the presence or absence of a coating on the paper P, but it is not limited to this. As an example of the second measuring unit, it could also be a measuring unit that measures other physical properties of the object being measured, such as moisture content. That is, as an example of the second physical property, it could also be other physical properties of the object being measured, such as moisture content. Additionally, as the second measuring unit, for example, a measuring unit that measures physical properties by light irradiation (i.e., a measuring unit having a light irradiation section and a light-receiving section) could be used.
[0165] In this embodiment, the control unit 81B may selectively execute either a parallel operation mode or a serial operation mode, but is not limited to this. For example, the control unit 81B may also be configured to execute only the parallel operation mode.
[0166] Furthermore, in the aforementioned "variation of control mode", the control unit 81B can selectively execute either the image quality priority mode or the blockage suppression priority mode, but is not limited to this. For example, the control unit 81B may also be a structure that can only execute the image quality priority mode.
[0167] In this embodiment, the measurement time of the resistance measuring unit 50 is longer than that of the weight measuring unit 30 and the coating measuring unit 70, and the measurement time of the coating measuring unit 70 is longer than that of the weight measuring unit 30, but this is not a limitation. For example, the measurement time of the coating measuring unit 70 may also be longer than that of the resistance measuring unit 50, and the relative lengths of the measurement times of the resistance measuring unit 50, the weight measuring unit 30, and the coating measuring unit 70 can be arbitrarily set.
[0168] Furthermore, in this embodiment, the processor 81 causes the weight measurement unit 30 to perform actual measurement during the stop period between the first measurement mode and the second measurement mode in the resistance measurement unit 50, but it is not limited to this. For example, the processor 81 may also cause the weight measurement unit 30 to perform actual measurement during the stop period between the second measurement mode and the third measurement mode in the resistance measurement unit 50.
[0169] Furthermore, in this embodiment, the processor 81 causes the coating measurement unit 70 to perform actual measurements during the stop period between the second and third measurement modes in the resistance measurement unit 50, but this is not a limitation. For example, the processor 81 may also cause the coating measurement unit 70 to perform actual measurements during the stop period between the first and second measurement modes in the resistance measurement unit 50. Furthermore, for example, the processor 81 may also cause the basis weight measurement unit 30 and the coating measurement unit 70 to perform actual measurements during the execution of the first, second, and third measurement modes by the resistance measurement unit 50. Moreover, the processor 81 may also cause only the basis weight measurement unit 30 and the coating measurement unit 70 located near the resistance measurement unit 50 to perform actual measurements during the stop period between multiple measurement modes in the resistance measurement unit 50. Furthermore, it may also cause only the basis weight measurement unit 30 and the coating measurement unit 70 located away from the resistance measurement unit 50 to perform actual measurements during the stop period between multiple measurement modes in the resistance measurement unit 50.
[0170] Furthermore, in this embodiment, the resistance measuring unit 50 is configured to perform multiple measurement modes, but it is not limited to this. The resistance measuring unit 50 may also be configured to perform a single measurement mode.
[0171] Furthermore, in this embodiment, the processor 81 starts driving the detector 325 in the basis weight measurement unit 30 after the start of driving the detector 725 in the coating measurement unit 70 and before the start of actual measurement, but it is not limited to this. For example, the processor 81 may start driving the detector 325 in the basis weight measurement unit 30 after the start of actual measurement in the coating measurement unit 70 and before the end of actual measurement. Moreover, the processor 81 may start driving the detector 325 in the basis weight measurement unit 30 after the end of actual measurement in the coating measurement unit 70.
[0172] Furthermore, in this embodiment, in the serial operation mode, the processor 81 causes the basis weight measuring unit 30, the coating measuring unit 70, and the resistance measuring unit 50 to perform measurement operations serially in the arrangement order of their detectors 325, 725, and 525 along the moving direction of the paper P, but this is not limited to this. For example, it is also possible for the processor 81 to cause the basis weight measuring unit 30, the coating measuring unit 70, and the resistance measuring unit 50 to perform measurement operations serially in an order different from the arrangement order of their detectors 325, 725, and 525 along the moving direction of the paper P.
[0173] This disclosure is not limited to the described embodiments, and various modifications, alterations, and improvements can be made without departing from its spirit. For example, the structures contained in the modified examples shown above can also be appropriately combined to form a configuration.
Claims
1. A measuring device, comprising: The resistance measuring unit measures the resistance of the object being measured. The first measuring unit has a detection unit that detects information about a first physical property other than the resistance of the object being measured, and measures the first physical property based on the detection result of the detection unit. The second measuring unit has a detection unit that detects information representing the resistance of the object being measured and a second property other than the first property. The second property is measured based on the detection result of the detection unit, and the time from the start of driving the detection unit to the start of actual measurement in the second measuring unit is longer than the time in the first measuring unit. as well as The control unit performs a first control on the first measuring unit, wherein the first control is to perform the measuring action of the first physical property in parallel with the measuring action performed by the resistance measuring unit, and the control unit performs a second control on the second measuring unit, wherein the second control is to perform the measuring action of the second physical property in parallel with the measuring action performed by the resistance measuring unit, and to start the driving of the probe in the second measuring unit before the driving of the probe in the first measuring unit starts.
2. The measuring device according to claim 1, wherein... The resistance measuring unit has multiple measurement modes for actually measuring the resistance of the object being measured. During the period when the resistance measurement unit stops actually measuring the resistance between the plurality of measurement modes, the control unit controls at least one of the first measurement unit and the second measurement unit to perform the actual measurement.
3. The measuring device according to claim 2, wherein... During the stop period, the control unit controls the first measuring unit and the measuring unit of the second measuring unit that is located near the resistance measuring unit to perform actual measurements.
4. The measuring apparatus according to any one of claims 1 to 3, wherein The control unit controls the first measuring unit to start driving the detector in the first measuring unit after the start of driving the detector in the second measuring unit and before the end of the actual measurement.
5. The measuring device according to claim 4, wherein... The control unit controls the first measuring unit to start driving the detector in the first measuring unit after the start of driving the detector in the second measuring unit and before the start of actual measurement.
6. The measuring apparatus according to any one of claims 1 to 3, wherein The resistance measuring unit includes a detection unit that detects information representing the resistance of the object being measured. Along the direction of movement of the moving object being measured, the detection units of the resistance measuring unit, the first measuring unit, and the second measuring unit are arranged in that order. The control unit has: In the first mode, the first control is applied to the first measuring unit, and the second control is applied to the second measuring unit; and In the second mode, the measurement operations of the resistance measuring unit, the first measuring unit, and the second measuring unit are executed sequentially according to the arrangement order of their detection units along the moving direction.
7. The measuring apparatus according to any one of claims 1 to 3, wherein The first measuring unit applies ultrasonic waves to the object being measured in order to measure the weight of the first physical property of the object being measured. The control unit has: In one mode, the first control is applied to the first measuring unit, and the second control is applied to the second measuring unit; and In another mode, the first measuring unit is controlled to perform the measurement action of measuring the weight.
8. An image forming apparatus, comprising: The measuring apparatus as described in any one of claims 1 to 7; The image forming unit forms an image on a recording medium that is the object of measurement, wherein the object of measurement is measured by the measuring device for the resistance, the first physical property, and the second physical property. as well as The control device controls the image forming operation of the image forming unit based on the resistance, the first physical property, and the second physical property measured by the measuring device.
Citation Information
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Sheet resistance measurement terminal and measuring lead employing the same
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Transfer device
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