一种安全检测方法、装置、电子设备及存储介质
By acquiring one-dimensional millimeter-wave data and motion information, and combining it with a neural network model to generate security inspection images, the problems of high cost and long scanning time of two-dimensional millimeter-wave arrays are solved, achieving low-cost and fast security inspection.
CN115375623BActive Publication Date: 2026-07-17SHANGHAI ARCHIWAVE MICROELECTRONICS CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SHANGHAI ARCHIWAVE MICROELECTRONICS CO LTD
- Filing Date
- 2022-07-19
- Publication Date
- 2026-07-17
AI Technical Summary
Technical Problem
Among existing millimeter-wave security inspection technologies, two-dimensional millimeter-wave arrays are costly and have long scanning times, which affect the speed and efficiency of security inspections.
Method used
By acquiring one-dimensional millimeter-wave data and motion information of the object to be inspected, and combining it with a neural network model, security inspection images are generated, avoiding the use of two-dimensional millimeter-wave arrays and mechanical scanning.
Benefits of technology
Without compromising image quality, costs and time were reduced, while user experience was improved.
✦ Generated by Eureka AI based on patent content.
Smart Images
Figure CN115375623B_ABST
Abstract
本发明实施例涉及毫米波成像领域，公开了一种安全检测方法、装置、电子设备及存储介质。本申请实施例中，获取待检测对象的一组一维毫米波数据；获取待检测对象的一组运动信息，运动信息与一维毫米波数据一一对应；其中，运动信息包括：待检测对象与安检设备之间的距离、待检测对象相对于安检设备的角度及待检测对象的轮廓信息；根据与一维毫米波数据对应的运动信息及一维毫米波数据，获取待检测对象的安检图像；根据安检图像完成对待检测对象的安全检测。不需要设置二维的毫米波阵列，也不需要等待一维毫米波阵列进行机械扫描，在不降低安检图像质量的前提下，成本较低，耗时较短，提升用户体验。
Need to check novelty before this filing date? Find Prior Art