光学系统衍射杂散光分析方法
By employing diffraction geometry theory and real ray tracing methods, the problem of analyzing stray light from diffraction in optical systems with thickness wedge angles and scattering conditions was solved, achieving rapid and accurate improvement in the imaging quality of optical systems.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
- Filing Date
- 2022-09-30
- Publication Date
- 2026-07-17
AI Technical Summary
Existing technologies are insufficient for accurately analyzing diffraction stray light in optical systems with thickness wedge angles and scattering conditions, and computationally intensive numerical methods are not applicable to optical systems.
By employing diffraction geometry theory and using real ray tracing methods, an optomechanical system model is established to calculate the outgoing light field of mirror, scattered, and diffracted rays. Using Fresnel's formula and the Lambert scattering model, a wedge-shaped region is divided for ray sampling, enabling rapid and accurate analysis of the optical system.
Under limited computational load, accurate analysis of diffraction stray light from optical systems was achieved, reducing the impact of stray light on imaging quality and providing effective improvement measures.
Smart Images
Figure CN115391719B_ABST