A pressure test method and device, electronic equipment and storage medium

Abstract

Embodiments of the present application disclose a pressure test method and device, electronic equipment and storage medium. The method can include: in response to a pressure test instruction, obtaining a first backlog data amount of pressure test data that is not processed by a pressure test object at each preset processing time in processing pressure test data; determining a target processing time and a processed data amount of pressure test data processed by the pressure test object within the target processing time according to each first backlog data amount and each preset processing time, and determining a data processing rate of the pressure test object according to the target processing time and the processed data amount; predicting a to-be-processed data amount of to-be-processed data to be processed by the pressure test object, and obtaining a pressure test result of the pressure test object according to the to-be-processed data amount, the data processing rate, and an acceptable delay time preset for the pressure test object in data processing. The technical solution of the embodiments of the present application can automatically implement a high-accuracy pressure test process at a lower cost.

Description

Technical Field

[0001] The present invention relates to the field of pressure testing technology, and in particular to a pressure testing method, apparatus, electronic device and storage medium. Background Technology

[0002] In the e-commerce field, some applications need to process large amounts of data during specific periods. Therefore, stress testing the application before these periods is crucial to ensuring its proper functioning during those times. Currently, this stress testing process is performed manually.

[0003] In the process of realizing this invention, the inventors discovered the following technical problems in the prior art: the cost of stress testing is high and the accuracy is difficult to guarantee. Summary of the Invention

[0004] This invention provides a pressure testing method, apparatus, electronic device, and storage medium to achieve a high-accuracy pressure testing process at a lower cost.

[0005] According to one aspect of the present invention, a stress testing method is provided, which may include:

[0006] In response to the stress test command, the first backlog of stress test data that has not been processed by the stress test object at each preset processing time during the stress test data processing process is obtained;

[0007] The target processing time and the amount of processed data of the load test object within the target processing time are determined based on the amount of backlog data and the preset processing time. The data processing rate of the load test object is determined based on the target processing time and the amount of processed data.

[0008] Predict the amount of data to be processed by the object to be stress tested, and obtain the stress test results of the object to be stress tested based on the amount of data to be processed, the data processing rate, and the acceptable delay time preset for the data processing of the object to be stress tested.

[0009] According to another aspect of the present invention, a pressure testing apparatus is provided, which may include:

[0010] The first backlog data acquisition module is used to respond to the stress test command and acquire the first backlog data of the stress test object that has not been processed by the stress test object at each preset processing time in the process of processing stress test data.

[0011] The data processing rate determination module is used to determine the target processing time and the amount of processed data of the load test object within the target processing time based on the amount of each first backlog of data and each preset processing time, and to determine the data processing rate of the load test object based on the target processing time and the amount of processed data.

[0012] The stress test result acquisition module is used to predict the amount of data to be processed by the object to be stress tested, and obtain the stress test result of the object to be stress tested based on the amount of data to be processed, the data processing rate, and the acceptable delay time preset for the data processing of the object to be stress tested.

[0013] According to another aspect of the present invention, an electronic device is provided, which may include:

[0014] At least one processor; and

[0015] A memory that is communicatively connected to at least one processor; wherein,

[0016] The memory stores a computer program that can be executed by at least one processor, such that when the at least one processor executes the program, it implements the stress testing method provided in any embodiment of the present invention.

[0017] According to another aspect of the present invention, a computer-readable storage medium is provided having computer instructions stored thereon for causing a processor to execute and implement the stress testing method provided in any embodiment of the present invention.

[0018] The technical solution in this embodiment of the invention, in response to a stress test command, acquires the first backlog of stress test data that has not been processed by the stress test object at each preset processing time during the stress test data processing process; determines the target processing time and the amount of stress test data already processed by the stress test object within the target processing time based on each first backlog of data and each preset processing time; and determines the data processing rate of the stress test object based on the processing time and the amount of data already processed, which can also reflect the speed at which the stress test object processes other data at other times; furthermore, predicts the amount of data to be processed by the stress test object, and obtains the stress test result of the stress test object based on the amount of data to be processed, the data processing rate, and the acceptable delay time preset for the data processing of the stress test object, which can indicate whether the stress test object may encounter unacceptable delays when processing the data to be processed. The above technical solution completes the stress test process of the stress test object in a fully automated manner, thereby achieving the effect of reducing the cost of stress testing and ensuring the accuracy of stress testing.

[0019] It should be understood that the description in this section is not intended to identify key or important features of the embodiments of the present invention, nor is it intended to limit the scope of the invention. Other features of the invention will become readily apparent from the following description. Attached Figure Description

[0020] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0021] Figure 1 This is a flowchart of a pressure testing method provided according to an embodiment of the present invention;

[0022] Figure 2 This is a schematic diagram of a configuration page in a stress testing method provided according to an embodiment of the present invention;

[0023] Figure 3 This is a flowchart of another pressure testing method provided according to an embodiment of the present invention;

[0024] Figure 4 This is a schematic diagram of gradient descent in another pressure testing method provided according to an embodiment of the present invention;

[0025] Figure 5 This is a schematic diagram of a pressure measurement pattern in another pressure testing method provided according to an embodiment of the present invention;

[0026] Figure 6 This is a flowchart of another pressure testing method provided according to an embodiment of the present invention;

[0027] Figure 7 This is a structural diagram of an optional example of another pressure testing method provided according to an embodiment of the present invention;

[0028] Figure 8 This is a schematic diagram of an optional example of another pressure testing method provided according to an embodiment of the present invention;

[0029] Figure 9 This is a structural block diagram of a pressure testing device according to an embodiment of the present invention;

[0030] Figure 10 This is a schematic diagram of the structure of an electronic device that implements the pressure testing method of this invention. Detailed Implementation

[0031] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of the present invention.

[0032] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that embodiments of the invention described herein can be implemented in orders other than those illustrated or described herein. The same applies to "target," "original," etc., and will not be repeated here. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0033] Figure 1 This is a flowchart of a stress testing method provided in an embodiment of the present invention. This embodiment is applicable to situations where stress testing is implemented in an automated manner. The method can be executed by the stress testing device provided in this embodiment of the present invention. This device can be implemented in software and / or hardware, and can be integrated into an electronic device, which can be various user terminals or servers.

[0034] See Figure 1 The method of this invention specifically includes the following steps:

[0035] S110. In response to the stress test command, obtain the first backlog of stress test data that has not been processed by the stress test object at each preset processing time during the stress test data processing process.

[0036] Among them, the stress test command can be a command used to perform stress test on the stress test object based on the stress test data. The stress test object can be the object to be stress tested, specifically an application, server or system, etc.; the stress test data can be any type of data, such as message queue (MQ) messages, consumption records or movement trajectories, etc., which is related to the achievable functions of the stress test object (i.e. what type of data it can handle), and no specific limitation is made here.

[0037] In response to a stress test command, the system acquires the first backlog of stress test data that has not been processed by the stress test object at each preset processing time during the stress test data processing process. This preset processing time can be a pre-defined point in time or a time period during the stress test object's data processing; no specific limitation is made here. The first backlog of data can be the amount of stress test data that has not yet been processed by the stress test object at that preset processing time; that is, it can represent how much stress test data is currently backlogged and awaiting processing by the stress test object. It should be noted that the aforementioned first backlog of data can be acquired in real-time at each preset processing time, i.e., acquired periodically during the stress test object's data processing process; or it can be acquired after the stress test object has completed processing all or most of the stress test data, such as from a target platform that records the first backlog of data at each preset processing time; etc., no specific limitation is made here.

[0038] S120. Determine the target processing time and the amount of processed data of the load test object within the target processing time based on the amount of each first backlog data and each preset processing time, and determine the data processing rate of the load test object based on the target processing time and the amount of processed data.

[0039] Specifically, the target processing time and the amount of data already processed are determined based on each preset processing time and the initial backlog of data within each preset processing time. The target processing time can represent the time period during which the load testing object processes this load testing data. Specifically, it can be the global processing time, i.e., the time period during which the load testing object processes all load testing data; it can also be the local processing time, such as the time period during which the load testing object quickly processes load testing data; etc., without specific limitations. The amount of data already processed can represent the quantity of load testing data processed by the load testing object within the target processing time, i.e., how much load testing data the load testing object processed within the target processing time. Furthermore, the data processing rate of the load testing object is determined based on the target processing time and the amount of data already processed, i.e., the rate at which the load testing object processes the load testing data within the target processing time, which also reflects the speed at which the load testing object processes other data during the remaining time.

[0040] S130. Predict the amount of data to be processed by the object to be stress tested, and obtain the stress test result of the object to be stress tested based on the amount of data to be processed, the data processing rate, and the acceptable delay time preset for the data processing of the object to be stress tested.

[0041] The amount of data to be processed can be the predicted amount of data to be processed by the object under load testing. Specifically, it can be the amount of data to be processed by the object under load testing within a future time period. Considering the application scenarios that may be involved in this embodiment of the invention, this future time period could be a future major promotional period. The acceptable delay time can represent the maximum acceptable delay that the associated object can tolerate in processing certain data. This associated object can be the user, developer, or investor of the object under load testing, etc., without specific limitations. Furthermore, the stress test results of the object under load testing can be obtained based on the amount of data to be processed, the data processing rate, and the acceptable delay time. These stress test results can indicate whether the object under load testing may experience unacceptable delays when processing the data to be processed.

[0042] It should be noted that the stress test data and the data to be processed are essentially the same, such as both being MQ messages or motion trajectories. The different names used here are only to distinguish whether the data is processed during stress testing or during normal runtime processing, and are not specific limitations on their actual meaning.

[0043] The technical solution in this embodiment of the invention, in response to a stress test command, acquires the first backlog of stress test data that has not been processed by the stress test object at each preset processing time during the stress test data processing process; determines the target processing time and the amount of stress test data already processed by the stress test object within the target processing time based on each first backlog of data and each preset processing time; and determines the data processing rate of the stress test object based on the processing time and the amount of data already processed, which can also reflect the speed at which the stress test object processes other data at other times; furthermore, predicts the amount of data to be processed by the stress test object, and obtains the stress test result of the stress test object based on the amount of data to be processed, the data processing rate, and the acceptable delay time preset for the data processing of the stress test object, which can indicate whether the stress test object may encounter unacceptable delays when processing the data to be processed. The above technical solution completes the stress test process of the stress test object in a fully automated manner, thereby achieving the effect of reducing the cost of stress testing and ensuring the accuracy of stress testing.

[0044] Based on this, an optional technical solution is provided, wherein the load test data may include MQ messages used for load testing, and the first backlog of load test data not processed by the load test object at each preset processing time during the load test data processing process is obtained, including: obtaining the first backlog of MQ messages with the same topic that were not processed by the load test object at each preset processing time during the load test message processing process; correspondingly, determining the target processing time and the amount of processed load test data processed by the load test object within the target processing time may include: determining the target processing time and the amount of processed MQ messages with the same topic processed by the load test object within the target processing time.

[0045] In this context, a topic can be a storage unit in the message queue (MQ) used for storing MQ messages. The MQ messages consumed by the test object may correspond to the same or different topics. It should be noted that MQ messages under different topics are consumed by their respective consumers, with a one-to-one correspondence between consumers and topics. Different consumers may have different MQ message consumption rates. Therefore, to obtain more targeted stress test results, i.e., stress test results specifically for each consumer, stress testing can be performed on a topic-by-topic basis. Specifically, MQ messages under different topics involved in the test object are transmitted to the test object, and then each consumer of the test object consumes the corresponding MQ messages. Furthermore, for each topic, the first backlog of MQ messages under that topic is obtained, and then the remaining steps are performed on a topic-by-topic basis with the first backlog of data. The resulting stress test results can reflect the stress test results of the consumers corresponding to that topic, making them more targeted. Considering the application scenarios that may be involved in this embodiment of the invention, the aforementioned topic may optionally be a waybill or a package, etc. Alternatively, the first backlog of MQ messages under each topic can be obtained through the following steps: periodically and at fixed points, use HTTP requests to poll the target platform for the first backlog of each topic, thereby obtaining the first backlog of each topic in sequence.

[0046] In another optional technical solution, after responding to the stress test command, the stress test method may further include: acquiring stress test configuration information and determining the stress test startup mode based on the stress test configuration information; if the stress test startup mode is the first startup mode, controlling the stress test object to stop, and controlling the stress test object to restart after a preset time interval from the start of the stress test object's stop, so that the stress test object can process the stress test data received during the stop; and / or, if the stress test startup mode is the second startup mode, using the processed data that has been processed by the stress test object in the previous time period as the stress test data, so that the stress test object can repeatedly process the stress test data.

[0047] The load testing configuration information can be pre-configured information for implementing load testing of the target object, such as information representing the target object, load testing startup method, consumer (or consumer identifier, clientid), and topic. Furthermore, the load testing startup method is determined based on the load testing configuration information. This startup method indicates how the load test is started, specifically how the load testing data is obtained, so that the load testing process can be implemented based on this data. In practical applications, optionally, the above load testing configuration information can be pre-formatted and entered through a configuration page. For example, configuration personnel can... Figure 2 The configuration page shown allows users to enter load testing configuration information such as the test object, load testing startup method, consumer identifier, and topic. After configuration, this configuration information can be stored in the database. When the load testing device responds to a load testing command, it can retrieve this configuration information from the database to determine the appropriate load testing startup method, the topic under which test object, and the MQ messages under which consumer identifier should be consumed, thereby implementing the load testing process for that test object.

[0048] The first startup mode is a type of load testing startup mode, also known as the "hold-down startup mode." Essentially, it controls the load testing object to stop processing the production data generated by the producer, thus accumulating the production data during this downtime into load testing data for centralized processing, thereby achieving load testing. Therefore, when the load testing startup mode is the first startup mode, the load testing object can be controlled to shut down (i.e., stop running), and then restarted after a preset time interval from the start of the shutdown. This allows the load testing object to process the load testing data received during the shutdown process, thereby initiating the load testing process.

[0049] The second startup method is also a type of load testing startup method, which can also be called the reset site startup method. Essentially, it achieves load testing by controlling the load testing object to centrally process a large amount of previously processed data (i.e., the processed data). Therefore, when the load testing startup method is the second startup method, the processed data from previous time periods (i.e., the time periods that have already passed) is used as the load testing data, causing the load testing object to repeatedly process this load testing data, thereby initiating the load testing process.

[0050] Figure 3This is a flowchart of another stress testing method provided in this embodiment of the invention. This embodiment is based on the above-described technical solutions and optimized. In this embodiment, optionally, determining the target processing time and the processed data volume of the stress test object within the target processing time based on each first backlog data volume and each preset processing time may include: obtaining the processing start time of the stress test object when processing the stress test data; determining the second backlog data volume of the stress test object before stress testing, and using the preset processing time corresponding to the first backlog data volume that is less than or equal to the second backlog data volume as the processing end time; determining the target processing time based on the processing start time and the processing end time; and obtaining the processed data volume of the stress test object within the target processing time based on the first backlog data volume at the preset processing time corresponding to the processing start time and the first backlog data volume at the processing end time. The explanations of terms that are the same as or corresponding to those in the above embodiments will not be repeated here.

[0051] See Figure 3 The method in this embodiment may specifically include the following steps:

[0052] S210. In response to the stress test command, obtain the first backlog of stress test data that has not been processed by the stress test object at each preset processing time during the stress test data processing process.

[0053] S220. Obtain the processing start time of the load test object when processing load test data.

[0054] The processing start time can be the time when the load test object begins processing load test data. It can be the time when it begins processing the first load test data, the time when it begins processing load test data at high speed, or the time when it begins processing load test data at low speed, etc., and no specific limitation is made here.

[0055] S230. Determine the second backlog of data for the pressure test object when no pressure test has been performed, and use the preset processing time corresponding to the first backlog of data that is less than or equal to the second backlog of data as the processing end time.

[0056] The second backlog of data can be the amount of unprocessed data that the test object did not process during normal data processing (i.e., before stress testing). Specifically, it can be the amount of unprocessed data per unit time during normal data processing, which can be set according to actual conditions, such as 1 minute, 3 minutes, or 5 minutes. Since the upstream objects of the test object are continuously producing data, it is difficult for the test object to process all the production data produced by the upstream objects. Therefore, the first backlog of data usually decreases over time, but it is difficult for it to drop to zero. Thus, to accurately determine the processing end time, the first backlog of data and the second backlog of data can be compared. When the first backlog of data is less than or equal to the second backlog of data, it indicates that the amount of unprocessed data is basically the same as under normal circumstances. At this point, the stress test can be considered complete, and the preset processing time corresponding to this first backlog of data can be taken as the processing end time. In light of the application scenarios that may be involved in the embodiments of the present invention, the processing end time can be understood as the global processing end time, that is, the time when all load test data has been processed; it can also be understood as the local processing end time, such as the time when the load test data is finished being processed at high speed; etc., without specific limitations here.

[0057] To illustrate the processing completion time more clearly, let's consider a different approach. As mentioned above, the initial backlog of data typically decreases over time. This change in the initial backlog can be understood as a decline from its peak (the largest initial backlog) to a point less than or equal to the second largest initial backlog (the trough). This is similar to... Figure 4 The gradient descent process shown can be interpreted as the processing end time being calculated based on the gradient descent idea.

[0058] S240. Determine the target processing time based on the processing start time and processing end time.

[0059] This involves using the processing start time as the starting point and the processing end time as the ending point to obtain the target processing time. Thus, we can obtain the processing start time (e.g., global processing start time or high-speed processing start time), the processing end time (e.g., global processing end time or high-speed processing end time; in practical applications, these two end times can optionally be the same), the target processing time (e.g., global processing time or high-speed processing time), the first backlog of data at the preset processing time corresponding to the processing start time, and the first backlog of data at the processing end time.

[0060] S250. Based on the first backlog of data at the preset processing time corresponding to the processing start time and the first backlog of data at the processing end time, the amount of processed data of the load test object within the target processing time is obtained.

[0061] The amount of data processed by the load test object within the target processing time can be obtained based on the two first backlog data amounts mentioned above. For example, the amount of data processed is the first backlog data at the preset processing time corresponding to the processing start time minus the amount of data processed at the processing end time.

[0062] S260. Determine the data processing rate of the test object based on the target processing time and the amount of data already processed.

[0063] S270. Predict the amount of data to be processed by the object to be stress tested, and obtain the stress test results of the object to be stress tested based on the amount of data to be processed, the data processing rate, and the acceptable delay time preset for the data processing of the object to be stress tested.

[0064] The technical solution of this invention can accurately obtain the target processing time and the amount of data processed, which is the key to accurately determining the data processing rate.

[0065] An optional technical solution for obtaining the processing start time of the load testing object when processing load testing data may include: obtaining the global processing start time of the load testing object when processing load testing data, and using the global processing start time as the processing start time; and / or, for the third and fourth backlog data quantities that are adjacent in a preset processing time among each first backlog data quantity, determining the slope based on the third and fourth backlog data quantities, and using the preset processing time of the third or fourth backlog data quantity corresponding to the slope with the largest value among the slopes as the local processing start time, and using the local processing start time as the processing start time.

[0066] The global processing start time can be the time when the load testing object begins to centrally process the load testing data, and it can also be referred to as the overall processing start time. Considering the application scenarios that may be involved in the embodiments of this invention, when the load testing startup method is a single-start method, the global processing start time can be the time when the application object is restarted; when the load testing startup method is a reset-site startup method, the global processing start time can be the time when the application object obtains all the load testing data.

[0067] Within the global processing time (which is the target processing time determined based on the global processing start time and global processing end time), the load testing object does not process the load testing data at the same data processing rate (the data processing rate obtained above is also a concept of an average rate). The local processing time used to represent the high-speed processing time is also very important in practical applications. Therefore, it is crucial to determine how to determine the local processing start time used to represent the high-speed processing start time. Since the data processing rate can be represented by the difference between two adjacent first backlog data amounts (i.e., the third backlog data amount and the fourth backlog data amount) at the preset processing time, this difference can represent how much load testing data the load testing object has processed within the preset time interval formed by these two preset processing times, or it can be represented by the slope determined by this difference. Then, the slope with the largest value can be determined from all the slopes. The slope with the largest value can represent the turning point of the data processing rate. Therefore, the preset processing time of the third backlog data amount or the fourth backlog data amount corresponding to the slope with the largest value can be taken as the local processing start time.

[0068] To illustrate the above technical solution more clearly, let's consider a different approach. The initial backlog of data at each preset processing time can be understood as data points over a period of time. By combining linear regression analysis to fit these data points, for example, we can obtain the following: Figure 5 The fitting results shown in the figure indicate that, since the lower angle is larger than the upper angle, and the angle is proportional to the slope, the slope of line BC is greater than that of line AB. Therefore, the preset processing time at point A can be understood as the global processing start time, the preset processing time at point B as the high-speed processing start time, and the preset processing time at point C as the global processing end time, which is also the high-speed processing end time. Here, "high-speed" can also be referred to as the peak, the peak processing phase. It should be noted that, on the one hand, Figure 5 The document only provides a few preset processing times, but in actual applications, the preset processing times can be longer, i.e., one every 3 minutes; on the other hand, in actual applications, the amount of backlogged data during peak promotional periods is infinitely close to... Figure 5 The stress test graphs shown in the figure make it very meaningful to determine both the high-speed processing time and the global processing time.

[0069] Optionally, the above stress testing method may further include: acquiring candidate acceleration strategies and reference factors; determining a target acceleration strategy from among the candidate acceleration strategies based on the reference factors; and displaying the target acceleration strategy. The candidate acceleration strategies include pre-set strategies for accelerating data processing speed, and the reference factors include at least one of the following: slope, processing start time, processing end time, the first backlog of data at the preset processing time corresponding to the processing start time, and the first backlog of data at the processing end time. The candidate acceleration strategies can be pre-set strategies for accelerating data processing speed, i.e., strategies that allow the stress-tested object to process data faster. Based on the reference factors, the target acceleration strategy that best matches the current data processing situation of the stress-tested object can be determined from among the candidate acceleration strategies, and this target acceleration strategy can be displayed, thereby achieving the effect of intelligently recommending a target acceleration strategy. For example, when the processing rate changes slowly (or almost unchanged) in the early stages and accelerates rapidly in the later stages, this is mainly because there may be some local caching in the processing. The data processing rate can be increased by adjusting the size and method of the local cache. As another example, if the processing rate does not have a significant slow processing stage (i.e., it is always in a high-speed processing stage) or is always unable to reach the trough (i.e., it is never able to obtain a first backlog of data less than or equal to the second backlog of data), then a corresponding target acceleration strategy can be given.

[0070] Another optional technical solution involves determining the second backlog of data for the load testing object before stress testing. This can include: acquiring historical production data volume and historical processed data volume of the load testing object during historical periods before stress testing. The historical production data volume refers to the amount of production data produced by the upstream objects of the load testing object during the historical period that needs to be processed by the load testing object. The second backlog of data for the load testing object before stress testing is determined based on the historical production data volume and the historical processed data volume. Since upstream objects do not produce data at the same rate, and the load testing object does not process data at the same rate during daily data processing (i.e., before stress testing), an averaging approach can be used to obtain the second backlog of data. Specifically, the historical production quantity of production data produced by upstream objects during the historical period that needs to be processed by the load testing object, and the historical processed data volume of the load testing object during the historical period (i.e., how much production data it processed), can be obtained. Based on these two data, the second backlog of data can be accurately determined. Based on this, the second backlog data volume obtained above can be understood as the backlog data volume within a historical time period. If the first backlog data volume is the backlog data volume within a certain unit of time, the second backlog data volume can also be converted into the backlog data volume within that unit of time. For example, assuming the historical time period is 7 days and the unit of time is 3 minutes, the second backlog data volume obtained above can be divided by 7*24*20 to obtain the backlog data volume within that 3 minutes. In practical applications, optionally, the above historical time period can be determined according to the load test start method. For example, if the load test start method is a single-point start method, the historical time period can be determined according to the downtime of the load test object. For example, the historical duration of the historical time period can be set as the downtime to obtain the historical time period; or if the load test start method is a site reset start method, the previous time period can be used as the historical time period; and so on.

[0071] Figure 6 This is a flowchart of another stress testing method provided in this embodiment of the invention. This embodiment is based on and optimized from the above-described technical solutions. In this embodiment, optionally, the stress test result of the test object is obtained according to the amount of data to be processed, the data processing rate, and the acceptable delay time preset for the test object in data processing. This includes: determining the required processing time for the test object to complete the processing of the amount of data to be processed based on the data processing rate; and obtaining the stress test result of the test object based on the required processing time and the acceptable delay time preset for the test object in data processing. The explanations of terms that are the same as or corresponding to those in the above embodiments are not repeated here.

[0072] See Figure 6 The method in this embodiment may specifically include the following steps:

[0073] S310. In response to the stress test command, obtain the first backlog of stress test data that has not been processed by the stress test object at each preset processing time during the stress test data processing process.

[0074] S320. Determine the target processing time and the amount of processed data of the load test object within the target processing time based on the amount of each first backlog of data and each preset processing time, and determine the data processing rate of the load test object based on the target processing time and the amount of processed data.

[0075] S330. Determine the required processing time for the test object to process the amount of data to be processed based on the data processing rate.

[0076] The required processing time can be the time required for the test object to process the amount of data to be processed. It can be determined based on the data processing rate, such as using the ratio between the amount of data to be processed and the data processing rate as the required processing time. It should be noted that when the data processing rate is the rate under global processing time, the required processing time represents the time required for the test object to process the data at the global data processing rate; similarly, when the data processing rate is the rate under high-speed processing time, the required processing time represents the time required for the test object to process the data at a high-speed data processing rate.

[0077] S340. Based on the required processing time and the acceptable delay time preset for data processing of the test object, the stress test results of the test object are obtained.

[0078] Since the acceptable latency time indicates the maximum acceptable delay for the associated object to process the data, the stress test result can be obtained based on the required processing time and the acceptable latency time. Specifically, the stress test result can be obtained based on the numerical relationship between the two. In practical applications, optionally, as mentioned in the previous step, the meaning of the required processing time varies depending on the meaning of the data processing rate. Therefore, the stress test result here can also be a stress test result for a specific meaning, making it more targeted.

[0079] The technical solution of this invention determines the required processing time for the test object to process the amount of data to be processed by the data processing rate, and then obtains the stress test result based on the required processing time and the acceptable delay time, thereby achieving the effect of fast and accurate determination of stress test results.

[0080] Based on this, an optional technical solution, based on the required processing time and a pre-set acceptable delay time for the data processing of the test object, obtains the stress test result of the test object. This can include: if the required processing time is greater than the pre-set acceptable delay time for the data processing of the test object, determining the difference between the required processing time and the acceptable delay time; determining the risk level based on the difference; and determining the stress test result of the test object based on the risk level. Specifically, when the required processing time is greater than the acceptable delay time, this indicates that the test object's processing capacity for the data to be processed is unacceptable to the associated objects, meaning that there is a risk in the test object processing this data in the future time period (i.e., the time period during which this data needs to be processed). To clarify the magnitude of the risk, the difference between the required processing time and the acceptable delay time can be determined, and then the risk level can be determined based on this difference. In practical applications, optionally, which difference corresponds to which risk level can be obtained based on a pre-configured risk calculation formula. Furthermore, more detailed stress test results can be obtained based on the risk level, which helps relevant personnel to provide more targeted optimization solutions.

[0081] Based on any of the above technical solutions, optionally, the amount of data to be processed includes the amount of data to be processed by the object under stress testing in a future time period. Predicting the amount of data to be processed by the object under stress testing can include: determining the amount of past production data, where the past production data is the amount of production data produced by the upstream object of the object under stress testing in a past time period that needs to be processed by the object under stress testing, and the past time period and the future time period have the same duration; obtaining a preset backlog coefficient, and obtaining the amount of data to be processed by the object under stress testing in the future time period based on the preset backlog coefficient and the past production data. Here, the past time period can be considered as a regular time period that has already occurred, and the future time period can be understood as a time period where a surge in production data has not yet occurred, such as a future major promotional period; the duration of these two time periods is the same. Since, based on past experience, it can be determined that the amount of production data in the future time period (i.e., the future production data) is usually several times that of the past time period (i.e., the preset backlog coefficient), the amount of data to be processed can be obtained based on this preset backlog coefficient and the past production data, thereby ensuring the accurate determination of the amount of data to be processed.

[0082] To better understand the above technical solutions as a whole, and considering the application scenarios that the embodiments of the present invention may involve, they are described below with specific examples. For example, see... Figure 7 and Figure 8Configuration personnel configure the load testing platform's backend (WEB) through the user interface (UI), such as the configuration page, and store the configuration results in a MySQL database. Therefore, when starting a load test, the load test can be conducted based on the configuration information obtained from the MySQL database. The specific load test startup method can be either a single-start or a reset-start method. During the load test, specifically when the test target consumes the backlog of MQ messages, the first backlog data volume at each preset processing time can be obtained from the target platform. Then, peaks and troughs can be obtained by combining slope calculations or load test graph fitting. Based on this, the peak consumption time, i.e., the peak period for MQ message consumption, can be calculated. Furthermore, the calculation results obtained during the load test (such as global consumption start time, global consumption end time, peak consumption start time, peak consumption end time, first backlog data volume at each time, data consumption rate at the global consumption time, data consumption rate at the peak consumption time, and risk level, etc.) are stored in the MySQL database. Of course, these calculation results are summarized by topic. Therefore, load testers can obtain these calculation results using the viewing and export functions provided by the load testing platform's UI, thus obtaining the load test results. As can be seen, the above technical solution provides an automated load testing platform, thereby achieving a fully automated load testing process, reducing load testing costs, and ensuring load testing accuracy.

[0083] Figure 9 This is a structural block diagram of a pressure testing apparatus provided in an embodiment of the present invention. This apparatus is used to perform the pressure testing method provided in any of the above embodiments. This apparatus and the pressure testing methods of the above embodiments belong to the same inventive concept. Details not described in detail in the embodiments of the pressure testing apparatus can be found in the embodiments of the pressure testing methods described above. See also... Figure 9 The device may specifically include: a first backlog data acquisition module 410, a data processing rate determination module 420, and a pressure test result acquisition module 430.

[0084] The first backlog data acquisition module 410 is used to respond to the stress test command and acquire the first backlog data of stress test data that has not been processed by the stress test object at each preset processing time in the process of processing stress test data.

[0085] The data processing rate determination module 420 is used to determine the target processing time and the amount of processed data of the load test object within the target processing time based on the amount of each first backlog data and each preset processing time, and to determine the data processing rate of the load test object based on the target processing time and the amount of processed data.

[0086] The stress test result acquisition module 430 is used to predict the amount of data to be processed by the object to be stress tested, and obtain the stress test result of the object to be stress tested based on the amount of data to be processed, the data processing rate, and the acceptable delay time preset for the data processing of the object to be stress tested.

[0087] Optionally, the data processing rate determination module 420 may include:

[0088] The processing start time acquisition unit is used to acquire the processing start time of the load test object when processing load test data;

[0089] The processing end time determination unit is used to determine the second backlog data volume of the pressure test object when no pressure test is performed, and to take the preset processing time corresponding to the first backlog data volume which is less than or equal to the second backlog data volume as the processing end time;

[0090] The target processing time determination unit is used to determine the target processing time based on the processing start time and processing end time.

[0091] The processed data volume acquisition unit is used to obtain the processed data volume of the stress test data processed by the stress test object within the target processing time based on the first backlog data volume at the preset processing time corresponding to the processing start time and the first backlog data volume at the processing end time.

[0092] Based on this, an optional start time acquisition unit can be used specifically for:

[0093] Obtain the global processing start time of the load test object when processing load test data, and use the global processing start time as the processing start time;

[0094] And / or,

[0095] For the third and fourth backlog data volumes that are adjacent in the preset processing time among the first backlog data volumes, the slope is determined based on the third and fourth backlog data volumes, and the preset processing time of the third or fourth backlog data volume corresponding to the slope with the largest value among all slopes is taken as the local processing start time, and the local processing start time is taken as the processing start time.

[0096] Optionally, based on the above-described apparatus, the apparatus may further include:

[0097] The target acceleration strategy display module is used to obtain candidate acceleration strategies and reference factors, determine the target acceleration strategy from each candidate acceleration strategy based on the reference factors, and display the target acceleration strategy.

[0098] Among them, the candidate acceleration strategy is a pre-set strategy to speed up the data processing rate. The reference factors include at least one of the following: slope, processing start time, processing end time, the first backlog of data at the preset processing time corresponding to the processing start time, and the first backlog of data at the processing end time.

[0099] Another optional processing end time determination unit may include:

[0100] The historical processing data acquisition subunit is used to acquire the historical production data volume and the historical processing data volume of the load test object during the historical period when no load test was performed. The historical production data volume is the amount of production data produced by the upstream object of the load test object during the historical period that needs to be processed by the load test object.

[0101] The second backlog data volume determination subunit is used to determine the second backlog data volume of the pressure test object when no pressure test has been performed, based on the historical production data volume and the historical processing data volume.

[0102] Optionally, the amount of data to be processed may include the amount of data to be processed by the object under stress testing within a future time period. The stress test result acquisition module 430 may include:

[0103] The past production data volume determination unit is used to determine the past production data volume, which is the amount of production data that the load test object needs to process, produced by the upstream object of the load test object in the past time period. The past time period and the future time period have the same duration.

[0104] The unit for obtaining the amount of data to be processed is used to acquire a preset backlog coefficient and, based on the preset backlog coefficient and the amount of past production data, obtain the amount of data to be processed for the object to be stress tested in the future time period.

[0105] Optionally, the stress test result receiving module 430 may include:

[0106] The required processing time determination unit is used to determine the required processing time for the test object to process the amount of data to be processed based on the data processing rate.

[0107] The stress test result acquisition unit is used to obtain the stress test results of the stress test object based on the required processing time and the acceptable delay time preset for data processing of the stress test object.

[0108] Based on this, optionally, the stress test results can be used to obtain a unit, which can specifically be used for:

[0109] If the required processing time is greater than the acceptable delay time preset for data processing of the load test object, then determine the difference between the required processing time and the acceptable delay time;

[0110] The risk level is determined based on the difference, and the stress test result of the pressure test object is determined based on the risk level.

[0111] Optionally, the load test data may include MQ messages used for load testing, and the first backlog data acquisition module 410 may include:

[0112] The first backlog data acquisition unit is used to acquire the first backlog data of MQ messages with the same topic that were not processed by the load test object at each preset processing time during the load test object's processing of MQ messages;

[0113] Correspondingly, the data processing rate determination module 420 may include:

[0114] The processed data volume determination unit is used to determine the target processing time and the processed data volume of MQ messages with the same topic processed by the load test object within the target processing time.

[0115] Optionally, the pressure testing device described above may further include:

[0116] The load test start mode determination module is used to obtain load test configuration information after responding to the load test command, and determine the load test start mode based on the load test configuration information;

[0117] The first load test startup module is used to control the load test object to stop if the load test startup method includes the first startup method, and to control the load test object to restart after a preset time interval from the start of the load test object's shutdown, so that the load test object can process the load test data received during the shutdown process;

[0118] And / or,

[0119] The second load test startup module is used to use the processed data that has been processed by the load test object in the past time period as load test data if the load test startup method includes the second startup method, so that the load test object can repeatedly process the load test data.

[0120] The stress testing apparatus provided in this embodiment of the invention, in response to a stress test command, acquires the first backlog of stress test data that has not been processed by the test object at each preset processing time during the stress test data processing process. A data processing rate determination module determines a target processing time and the amount of processed stress test data within the target processing time based on the first backlog of data and each preset processing time. It then determines the data processing rate of the test object based on the processing time and the amount of processed data, which also reflects the speed at which the test object processes other data at other times. Furthermore, a stress test result acquisition module predicts the amount of unprocessed data to be processed by the test object, and based on the unprocessed data amount, data processing rate, and an acceptable delay time preset for the test object in data processing, obtains the stress test result of the test object, which indicates whether unacceptable delays may occur when the test object processes the unprocessed data. This apparatus can complete the stress test process of the test object in a fully automated manner, thereby reducing the cost of stress testing and ensuring the accuracy of stress testing.

[0121] The pressure testing device provided in the embodiments of the present invention can execute the pressure testing method provided in any embodiment of the present invention, and has the corresponding functional modules and beneficial effects of the method.

[0122] It is worth noting that in the embodiments of the pressure testing device described above, the various units and modules included are only divided according to functional logic, but are not limited to the above division, as long as the corresponding functions can be achieved; in addition, the specific names of each functional unit are only for easy differentiation and are not used to limit the scope of protection of the present invention.

[0123] Figure 10 A schematic diagram of an electronic device 10 that can be used to implement embodiments of the present invention is shown. The electronic device is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device can also represent various forms of mobile devices, such as personal digital processors, cellular phones, smartphones, wearable devices (e.g., helmets, glasses, watches, etc.), and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely illustrative and are not intended to limit the implementation of the invention described and / or claimed herein.

[0124] like Figure 10As shown, the electronic device 10 includes at least one processor 11 and a memory, such as a read-only memory (ROM) 12 or a random access memory (RAM) 13, communicatively connected to the at least one processor 11. The memory stores computer programs executable by the at least one processor. The processor 11 can perform various appropriate actions and processes based on the computer program stored in the ROM 12 or loaded into the RAM 13 from storage unit 18. The RAM 13 can also store various programs and data required for the operation of the electronic device 10. The processor 11, ROM 12, and RAM 13 are interconnected via a bus 14. An input / output (I / O) interface 15 is also connected to the bus 14.

[0125] Multiple components in electronic device 10 are connected to I / O interface 15, including: input unit 16, such as keyboard, mouse, etc.; output unit 17, such as various types of displays, speakers, etc.; storage unit 18, such as disk, optical disk, etc.; and communication unit 19, such as network card, modem, wireless transceiver, etc. Communication unit 19 allows electronic device 10 to exchange information / data with other devices through computer networks such as the Internet and / or various telecommunications networks.

[0126] Processor 11 can be a variety of general-purpose and / or special-purpose processing components with processing and computing capabilities. Some examples of processor 11 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various special-purpose artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any suitable processor, controller, microcontroller, etc. Processor 11 performs the various methods and processes described above, such as stress testing methods.

[0127] In some embodiments, the stress testing method may be implemented as a computer program tangibly contained in a computer-readable storage medium, such as storage unit 18. In some embodiments, part or all of the computer program may be loaded and / or mounted on electronic device 10 via ROM 12 and / or communication unit 19. When the computer program is loaded into RAM 13 and executed by processor 11, one or more steps of the stress testing method described above may be performed. Alternatively, in other embodiments, processor 11 may be configured to perform the stress testing method by any other suitable means (e.g., by means of firmware).

[0128] Various embodiments of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field-programmable gate arrays (FPGAs), application-specific integrated circuits (ASICs), application-specific standard products (ASSPs), systems-on-a-chip (SoCs), payload-programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various embodiments may include implementations in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which may be a dedicated or general-purpose programmable processor, capable of receiving data and instructions from a storage system, at least one input device, and at least one output device, and transmitting data and instructions to the storage system, the at least one input device, and the at least one output device.

[0129] Computer programs used to implement the methods of the present invention can be written in any combination of one or more programming languages. These computer programs can be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, such that when executed by the processor, the computer programs cause the functions / operations specified in the flowcharts and / or block diagrams to be implemented. The computer programs can be executed entirely on a machine, partially on a machine, as a standalone software package partially on a machine and partially on a remote machine, or entirely on a remote machine or server.

[0130] In the context of this invention, a computer-readable storage medium can be a tangible medium that may contain or store a computer program for use by or in conjunction with an instruction execution system, apparatus, or device. A computer-readable storage medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatus, or devices, or any suitable combination thereof. Alternatively, a computer-readable storage medium may be a machine-readable signal medium. More specific examples of machine-readable storage media include electrical connections based on one or more wires, portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fibers, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination thereof.

[0131] To provide interaction with a user, the systems and techniques described herein can be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and pointing device (e.g., a mouse or trackball) through which the user provides input to the electronic device. Other types of devices can also be used to provide interaction with the user; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including sound input, voice input, or tactile input).

[0132] The systems and technologies described herein can be implemented in computing systems that include backend components (e.g., as data servers), or computing systems that include middleware components (e.g., application servers), or computing systems that include frontend components (e.g., user computers with graphical user interfaces or web browsers through which users can interact with implementations of the systems and technologies described herein), or any combination of such backend, middleware, or frontend components. The components of the system can be interconnected via digital data communication of any form or medium (e.g., communication networks). Examples of communication networks include local area networks (LANs), wide area networks (WANs), blockchain networks, and the Internet.

[0133] A computing system can include clients and servers. Clients and servers are generally located far apart and typically interact through communication networks. The client-server relationship is created by computer programs running on the respective computers and having a client-server relationship with each other. The server can be a cloud server, also known as a cloud computing server or cloud host, which is a hosting product within the cloud computing service system to address the shortcomings of traditional physical hosts and VPS services, such as high management difficulty and weak business scalability.

[0134] It should be understood that the various forms of processes shown above can be used, with steps reordered, added, or deleted. For example, the steps described in this invention can be executed in parallel, sequentially, or in different orders, as long as the desired result of the technical solution of this invention can be achieved, and this is not limited herein.

[0135] The specific embodiments described above do not constitute a limitation on the scope of protection of this invention. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this invention should be included within the scope of protection of this invention.

Claims

1. A pressure testing method, characterized in that, include: In response to a stress test command, the first backlog of stress test data that has not been processed by the stress test object at each preset processing time during the stress test data processing process is obtained; The target processing time is determined based on the first backlog data volume and the preset processing time, and the amount of processed data of the load test object within the target processing time is determined. The data processing rate of the load test object is determined based on the target processing time and the amount of processed data. The amount of data to be processed by the test object is predicted, and the stress test result of the test object is obtained based on the amount of data to be processed, the data processing rate, and the acceptable delay time preset for the test object in data processing. The stress test result indicates whether there is an unacceptable delay when the test object processes the data to be processed, and the acceptable delay time corresponds to the associated object. The step of determining the target processing time based on each of the first backlog data volumes and each of the preset processing times includes: obtaining the processing start time of the load test object when processing the load test data, and determining the second backlog data volume of the load test object when no load test is performed, and taking the preset processing time corresponding to the first backlog data volume that is less than or equal to the second backlog data volume as the processing end time; The target processing time is determined based on the processing start time and the processing end time.

2. The method according to claim 1, characterized in that, The amount of processed data of the load test object within the target processing time is determined based on the first backlog data volume and the preset processing time, including: Based on the first backlog of data at the preset processing time corresponding to the processing start time and the first backlog of data at the processing end time, the amount of processed data of the load test object within the target processing time is obtained.

3. The method according to claim 1, characterized in that, The step of obtaining the processing start time of the load test object when processing the load test data includes: Obtain the global processing start time of the load test object when processing the load test data, and use the global processing start time as the processing start time; And / or, For the third and fourth backlog data volumes that are adjacent to each first backlog data volume at the preset processing time, a slope is determined based on the third and fourth backlog data volumes, and the preset processing time of the third or fourth backlog data volume corresponding to the slope with the largest value among the slopes is taken as the local processing start time, and the local processing start time is taken as the processing start time.

4. The method according to claim 3, characterized in that, Also includes: Acquire candidate acceleration strategies and reference factors, determine the target acceleration strategy from each candidate acceleration strategy based on the reference factors, and display the target acceleration strategy; The candidate acceleration strategy is a pre-set strategy for accelerating the data processing rate. The reference factors include at least one of the slopes, the processing start time, the processing end time, the first backlog data amount at the preset processing time corresponding to the processing start time, and the first backlog data amount at the processing end time.

5. The method according to claim 1, characterized in that, Determining the second backlog of data for the pressure test object when no pressure test has been performed includes: The historical production data volume and the historical processing data volume of the load test object during the historical period when no load test was performed are obtained. The historical production data volume is the amount of production data produced by the upstream object of the load test object during the historical period that needs to be processed by the load test object. The second backlog of data for the stress test object when no stress test was performed is determined based on the historical production data volume and the historical processing data volume.

6. The method according to claim 1, characterized in that, The amount of data to be processed includes the quantity of data to be processed by the load testing object within a future time period. Therefore, the predicted amount of data to be processed by the load testing object includes: Determine the amount of past production data, wherein the amount of past production data is the amount of production data produced by the upstream object of the load test object within a past time period that needs to be processed by the load test object, and the duration of the past time period is the same as that of the future time period; Obtain a preset backlog coefficient, and based on the preset backlog coefficient and the past production data volume, obtain the amount of data to be processed from the data to be processed by the test object in the future time period.

7. The method according to claim 1, characterized in that, The step of obtaining the stress test result of the test object based on the amount of data to be processed, the data processing rate, and the acceptable delay time preset for the test object in data processing includes: The required processing time for the load test object to process the amount of data to be processed is determined based on the data processing rate. Based on the required processing time and the acceptable delay time preset for data processing of the stress test object, the stress test result of the stress test object is obtained.

8. The method according to claim 7, characterized in that, The process of obtaining the stress test results for the stress test object based on the required processing time and the pre-set acceptable delay time for data processing of the stress test object includes: If the required processing time is greater than the acceptable delay time preset for data processing of the stress test object, then the difference between the required processing time and the acceptable delay time is determined. The risk level is determined based on the difference, and the pressure test result of the pressure test object is determined based on the risk level.

9. The method according to claim 1, characterized in that, The load testing data includes MQ messages used for load testing. The step of obtaining the first backlog of load testing data that was not processed by the load testing object at each preset processing time during the load testing data processing process includes: The first backlog of MQ messages with the same topic that were not processed by the load test object at each preset processing time during the process of the load test object processing the MQ messages is obtained. Accordingly, determining the target processing time and the amount of processed data of the load test data processed by the load test object within the target processing time includes: Determine the target processing time and the amount of processed data of the MQ messages on the same topic processed by the load test object within the target processing time.

10. The method according to claim 1, characterized in that, Following the stress test command, it also includes: Obtain the load test configuration information and determine the load test startup method based on the load test configuration information; If the load test startup mode is the first startup mode, then the load test object is controlled to stop, and after a preset time interval from the start of the load test object's shutdown, the load test object is controlled to restart, so that the load test object can process the load test data received during the shutdown process; And / or, If the load test startup method is the second startup method, then the processed data that has been processed by the load test object in the past time period will be used as the load test data, so that the load test object can repeatedly process the load test data.

11. A pressure testing device, characterized in that, include: The first backlog data acquisition module is used to respond to the stress test command and acquire the first backlog data of the stress test data that has not been processed by the stress test object at each preset processing time in the process of processing stress test data. The data processing rate determination module is used to determine a target processing time and the amount of processed data of the load test object within the target processing time based on the first backlog data volume and the preset processing time, and to determine the data processing rate of the load test object based on the target processing time and the amount of processed data. The stress test result acquisition module is used to predict the amount of data to be processed by the stress test object, and obtain the stress test result of the stress test object based on the amount of data to be processed, the data processing rate, and the acceptable delay time preset for the data processing of the stress test object. The stress test result indicates whether the stress test object has an unacceptable delay situation when processing the data to be processed, and the acceptable delay time corresponds to the associated object. The data processing rate determination module includes: A processing start time acquisition unit is used to acquire the processing start time of the load test object when processing the load test data; The processing end time determination unit is used to determine the second backlog data volume of the pressure test object when no pressure test is performed, and to take the preset processing time corresponding to the first backlog data volume which is less than or equal to the second backlog data volume as the processing end time. The target processing time determination unit is used to determine the target processing time based on the processing start time and the processing end time.

12. An electronic device, characterized in that, include: At least one processor; as well as A memory communicatively connected to the at least one processor; wherein, The memory stores a computer program that can be executed by the at least one processor to cause the at least one processor to perform the stress testing method as described in any one of claims 1-10.

13. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer instructions that cause a processor to execute and implement the stress testing method as described in any one of claims 1-10.

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