一种标识位置确定方法、设备及系统

By using automated program calculations and process simulations, the optimal placement position of semiconductor dicing marks is determined, solving the problems of low efficiency and low accuracy in mark position determination, and achieving more efficient mark position control.

CN115470744BActive Publication Date: 2026-07-17CHANGXIN MEMORY TECH INC

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
CHANGXIN MEMORY TECH INC
Filing Date
2022-09-23
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

In the semiconductor manufacturing process, determining the position of the markings on the dicing track is inefficient and inaccurate. Especially in the DRAM R&D stage, manually placing the markings cannot meet the actual process requirements.

Method used

By acquiring the wafer design layout, manufacturing process information, and marking design drawings, the product is simulated based on the 3D model and manufacturing conditions to determine the optimal location point with the minimum thickness, and the marking is automatically placed. The marking position is calculated and the process is simulated using an automated program.

Benefits of technology

It improves the accuracy of the marking position on the cutting track, reduces the impact of the loading effect, and improves the efficiency of marking position determination.

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Abstract

本申请公开了一种标识位置确定方法、设备及系统。其中,标识位置确定方法包括:获取晶圆的设计版图、生产工艺信息和标识设计图;生产工艺信息包括工艺步骤,以及与工艺步骤对应的生产材料和生产条件;标识设计图包括与工艺步骤对应的工艺标识图;工艺标识图包括待添加标识和与待添加标识对应的待添加区域;基于设计版图、三维模型、目标生产材料和目标生产条件,得到与目标工艺步骤对应的制品模拟模型;基于制品模拟模型,确定在与目标待添加标识对应的目标待添加区域中的厚度最小的优选位置点;将目标待添加标识放置到设计版图中与优选位置点对应的位置。该方法能够提高切割道上的标识位置的准确度,提升标识位置确定的效率。
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