A method, system, storage medium, and terminal for testing multi-station working values.

Abstract

This invention discloses a multi-station working value testing method, system, storage medium, and terminal, belonging to the field of data testing. The method includes: setting multiple test stations and establishing mapping rules between the multiple test stations and different acquisition channels of the same data acquisition card; acquiring voltage signal data acquired by all channels in the data acquisition card; distributing the voltage signal data of different acquisition channels to the corresponding test stations in real time according to the mapping rules; each test station determining whether the received voltage signal data has a jump, and if a jump occurs, calculating the working value based on the voltage signal data acquired at the jump time point. This invention can test multiple devices under test simultaneously, improving testing efficiency. It uses the same data acquisition card for independent testing of multiple test stations, ensuring the time synchronization of the original data from different channels without increasing hardware investment, saving hardware resources and reducing system complexity.

Description

Technical Field

[0001] This invention relates to the field of data testing, and in particular to a multi-station working value testing method, system, storage medium, and terminal. Background Technology

[0002] The working value is an important performance indicator of a certain type of test component. This indicator is obtained by converting the voltage signal collected at the trigger time point when a specific signal change is detected during the movement of the test component. Therefore, ensuring that accurate analog voltage data is collected is the key to calculating this indicator.

[0003] Traditional testing methods, employing single-station testing, are inefficient, time-consuming, and yield limited and inaccurate data samples. The accuracy of the obtained working values ​​is also inconsistent, necessitating repeated testing. To address the inefficiency of single-station testing, those skilled in the art have proposed a dual-station measurement technique.

[0004] However, in traditional dual-station testing processes, the force sensor signals and trigger signal data acquisition use different hardware, resulting in insufficient time synchronization of the data and inaccurate calculation of working values. Furthermore, the use of independent hardware systems in dual-station testing leads to low utilization of hardware resources, increased hardware investment, and increased complexity of the hardware system. Summary of the Invention

[0005] The purpose of this invention is to overcome the problems of low efficiency in single-station testing and complexity in multi-station testing in the prior art, and to provide a multi-station working value testing method, system, storage medium and terminal.

[0006] The objective of this invention is achieved through the following technical solution:

[0007] In the first approach, a multi-station working value testing method is provided, the method comprising:

[0008] Set up multiple test stations and establish mapping rules between each test station and different acquisition channels of the same data acquisition card;

[0009] Acquire voltage signal data from all channels in the data acquisition card;

[0010] According to the mapping rules, voltage signal data from different acquisition channels are distributed to the corresponding test stations in real time.

[0011] Each test station determines whether the received voltage signal data has changed. If a change occurs, the working value is calculated based on the voltage signal data collected at the change time point.

[0012] In one example, a multi-station working value testing method establishes mapping rules between multiple test stations and different acquisition channels of the same data acquisition card, including:

[0013] Bind the test station to the channel number of the data acquisition card.

[0014] In one example, a multi-station operating value testing method, wherein acquiring voltage signal data from all channels of the data acquisition card includes:

[0015] The data acquisition from all channels of the data acquisition card is centralized into a single module, and multiple data push caches are established for multiple test stations.

[0016] In one example, a multi-station operating value testing method, wherein the step of distributing voltage signal data from different acquisition channels to the corresponding test stations in real time according to the mapping rule includes:

[0017] According to the mapping rules, the data of different test stations bound to the channels are compressed, encapsulated into a unified data communication format, and sent to the corresponding data push cache.

[0018] In one example, a multi-station work value testing method further includes a data failure mechanism, which includes:

[0019] A data expiration time is set. If the time elapsed after the data is sent to the corresponding data push cache exceeds the data expiration time, the corresponding data will be deleted.

[0020] In one example, a multi-station work value testing method includes compressing data from different test station bound channels, comprising:

[0021] The original data sample is divided into several intervals;

[0022] Sort the data for each interval, remove the largest and smallest samples, and calculate the mean for that interval.

[0023] In one example, a multi-station work value testing method includes a left test station and a right test station.

[0024] In the second solution, a multi-station working value testing system is provided, the system comprising:

[0025] The test station mapping module is used to set up multiple test stations and establish mapping rules between the multiple test stations and different acquisition channels of the same data acquisition card.

[0026] The data acquisition module is used to acquire voltage signal data from all channels in the data acquisition card;

[0027] The data distribution module is used to distribute voltage signal data from different acquisition channels to the corresponding test stations in real time according to the mapping rules.

[0028] The working value calculation module is used to determine whether the voltage signal data received at each test station has changed. If a change occurs, the working value is calculated based on the voltage signal data collected at the change time point.

[0029] In the third embodiment, a storage medium is provided that stores computer instructions, which, when executed, perform the steps of the working value testing method.

[0030] In the fourth embodiment, a terminal is provided, including a memory and a processor. The memory stores computer instructions that can be executed on the processor. When the processor executes the computer instructions, it performs the steps of the working value testing method.

[0031] It should be further noted that the technical features corresponding to the various options in the above system can be combined or substituted to form new technical solutions if there is no conflict.

[0032] Compared with the prior art, the beneficial effects of the present invention are:

[0033] (1) This invention establishes mapping rules between multiple test stations and different acquisition channels of the same data acquisition card, and establishes data distribution rules. According to the mapping rules, the voltage signal data of different acquisition channels are distributed to the corresponding test stations in real time. The test processes of multiple test stations are independent of each other. Multiple stations can be tested simultaneously as needed, or some stations can be flexibly selected for testing, which improves the test efficiency. Since multiple test stations share the data acquisition card, on the one hand, the time synchronization of the original data of different channels can be guaranteed, thereby ensuring the accuracy of the trigger time point and ensuring the accuracy of the working value calculation. On the other hand, no additional hardware resources are required, avoiding the increase in hardware investment and reducing the complexity of the hardware system.

[0034] (2) The present invention compresses the data of different test stations bound to the channel, encapsulates a unified data communication format, improves data processing efficiency and ensures the accuracy of test data.

[0035] (3) The present invention sets a data expiration time. When the time for sending data to the corresponding data push cache exceeds the data expiration time, the corresponding data will be deleted to ensure the validity of the test data and further ensure the accuracy of the test. Attached Figure Description

[0036] Figure 1 This is a flowchart illustrating a multi-station working value testing method according to an embodiment of the present invention;

[0037] Figure 2 This is a flowchart illustrating the dual-station working value testing method according to an embodiment of the present invention. Detailed Implementation

[0038] The technical solution of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0039] This invention primarily improves testing efficiency and ensures testing accuracy by designing the testing processes at different workstations as independent entities, while ensuring shared hardware resources.

[0040] In one exemplary embodiment, a multi-station working value testing method is provided, such as... Figure 1 As shown, the method includes:

[0041] Set up multiple test stations and establish mapping rules between each test station and different acquisition channels of the same data acquisition card;

[0042] Acquire voltage signal data from all channels in the data acquisition card;

[0043] According to the mapping rules, voltage signal data from different acquisition channels are distributed to the corresponding test stations in real time.

[0044] Each test station determines whether the received voltage signal data has changed. If a change occurs, the working value is calculated based on the voltage signal data collected at the change time point.

[0045] Specifically, in the existing logic, the same data acquisition card can only be opened once in the software, similar to a serial port. Therefore, the data acquired by different data acquisition channels are synchronized, that is, they are consistent in time. According to the general design idea, the test process of the test station using different channels must also be consistent and must be carried out simultaneously. In response to this, this method designs the test process of the test station to be independent of each other, so that different test stations can be used simultaneously, not at the same time, or selectively used as needed.

[0046] Furthermore, to ensure that different test stations use different data acquisition channels of the voltage data acquisition card, the mapping relationship between different test stations and data acquisition channels must be determined in advance. Only then can the data distribution service distribute the raw voltage data acquired by the data acquisition card to the specific test station. The number of test stations can be set to two or more according to actual needs, and is not limited here.

[0047] In one example, a multi-station working value testing method establishes mapping rules between multiple test stations and different acquisition channels of the same data acquisition card, including:

[0048] The test station is bound to the channel number of the data acquisition card. For example, one test station corresponds to channels 1-3, another test station corresponds to channels 4-6, and so on. The specific correspondence rules are designed adaptively according to actual needs.

[0049] In one example, a multi-station operating value testing method, wherein acquiring voltage signal data from all channels of the data acquisition card includes:

[0050] Data acquisition from all channels of the data acquisition card is centralized into a single module, and multiple data push caches are established for each test station. During data acquisition, continuous and uninterrupted data collection is performed in real time to ensure data continuity and accuracy when data is used on demand. Each test station corresponds to one data push cache, which is used to push the acquired data to the test station.

[0051] In one example, a multi-station operating value testing method, wherein the step of distributing voltage signal data from different acquisition channels to the corresponding test stations in real time according to the mapping rule includes:

[0052] According to the mapping rules, the data of different test stations bound to the channels are compressed, encapsulated into a unified data communication format, and sent to the corresponding data push cache.

[0053] In one example, a multi-station work value testing method further includes a data failure mechanism, which includes:

[0054] A data expiration time is set. If the time elapsed after data is sent to the corresponding data push cache exceeds this expiration time, the corresponding data will be deleted. Specifically, since the data is used on demand, it does not mean that the test process will use the data at all data collection points. By setting a data expiration time (usually less than 10ms), when the data received in the data push cache exceeds the expiration time, the data will be deleted from the data push cache, ensuring the validity of the test data and further ensuring the accuracy of the test.

[0055] In one example, a multi-station work value testing method includes compressing data from different test station bound channels, comprising:

[0056] The original data sample is divided into several intervals;

[0057] The data for each interval is sorted, the largest and smallest samples are removed, and the mean of the interval is calculated. This step is data preprocessing. Specifically, the voltage data acquisition card has a high sampling rate, which generates a large amount of raw data. However, the test process only needs one voltage value to calculate the working value. In order to improve data processing efficiency and ensure the accuracy of test data, the data needs to be compressed. The method adopted is to divide the raw data sample into several intervals, sort the data in each interval, remove the largest and smallest 50 samples, and then calculate the mean of the interval.

[0058] In one example, a dual-station working value testing method is provided, including a left test station and a right test station. For example... Figure 2 As shown, the core engine for executing the test process at the left / right workstations is responsible for data binding, test process control, and working value calculation. During data binding, the logical relationship between the left / right test workstations and the voltage signal data acquisition channel is established, and the data distribution module distributes the data according to this rule. During the test process, the left / right workstations receive the data forwarded by the data distribution service in real time and perform trigger signal detection.

[0059] During trigger signal detection, the raw data received in the corresponding test process is analyzed to determine whether the data has changed. When the force sensor voltage signal changes, the signal is the trigger signal, and the working value is calculated using the corresponding conversion formula.

[0060] Furthermore, the voltage signal data acquisition process enables real-time data acquisition from all channels of the voltage signal data acquisition card hardware. The data is then preprocessed using the aforementioned data compression method. Finally, the preprocessed data is forwarded to the corresponding left / right workstation test processes according to the distribution rules.

[0061] In the second solution, a multi-station working value testing system is provided, the system comprising:

[0062] The test station mapping module is used to set up multiple test stations and establish mapping rules between the multiple test stations and different acquisition channels of the same data acquisition card.

[0063] The data acquisition module is used to acquire voltage signal data from all channels in the data acquisition card;

[0064] The data distribution module is used to distribute voltage signal data from different acquisition channels to the corresponding test stations in real time according to the mapping rules.

[0065] The working value calculation module is used to determine whether the voltage signal data received at each test station has changed. If a change occurs, the working value is calculated based on the voltage signal data collected at the change time point.

[0066] In the third embodiment, a storage medium is provided that stores computer instructions, which, when executed, perform the steps of the working value testing method.

[0067] Based on this understanding, the technical solution of this embodiment, or the part that contributes to the prior art, or a part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods of the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0068] In the fourth embodiment, a terminal is provided, including a memory and a processor. The memory stores computer instructions that can be executed on the processor. When the processor executes the computer instructions, it performs the steps of the working value testing method.

[0069] The processor may be a single-core or multi-core central processing unit or a specific integrated circuit, or one or more integrated circuits configured to implement the present invention.

[0070] The embodiments of the subject matter and functional operation described in this specification can be implemented in: tangibly embodied computer software or firmware, computer hardware including the structures disclosed in this specification and their structural equivalents, or combinations thereof. Embodiments of the subject matter described in this specification can be implemented as one or more computer programs, i.e., one or more modules of computer program instructions encoded on a tangible, non-transitory program carrier for execution by a data processing device or for controlling the operation of a data processing device. Alternatively or additionally, the program instructions may be encoded on artificially generated propagation signals, such as machine-generated electrical, optical, or electromagnetic signals, which are generated to encode information and transmit it to a suitable receiving device for execution by the data processing device.

[0071] The processing and logic flow described in this specification can be executed by one or more programmable computers that execute one or more computer programs to perform corresponding functions by operating on input data and generating output. The processing and logic flow can also be executed by dedicated logic circuitry—such as FPGAs (Field-Programmable Gate Arrays) or ASICs (Application-Specific Integrated Circuits), and the device can also be implemented as dedicated logic circuitry.

[0072] Suitable processors for executing computer programs include, for example, general-purpose and / or special-purpose microprocessors, or any other type of central processing unit. Typically, the central processing unit receives instructions and data from read-only memory and / or random access memory. The basic components of a computer include a central processing unit for implementing or executing instructions and one or more memory devices for storing instructions and data. Typically, a computer will also include one or more mass storage devices for storing data, such as disks, magneto-optical disks, or optical disks, or the computer will be operatively coupled to such mass storage devices to receive data from or transfer data to them, or both. However, a computer is not required to have such devices. Furthermore, a computer can be embedded in another device, such as a mobile phone, a personal digital assistant (PDA), a mobile audio or video player, a game console, a global positioning system (GPS) receiver, or a portable storage device such as a universal serial bus (USB) flash drive, to name a few.

[0073] While this specification contains numerous specific implementation details, these should not be construed as limiting the scope of any invention or the scope of the claims, but rather are primarily intended to describe features of specific embodiments of a particular invention. Certain features described in the various embodiments herein may also be implemented in combination in a single embodiment. Conversely, various features described in a single embodiment may also be implemented separately in various embodiments or in any suitable sub-combination. Furthermore, while features may function in certain combinations as described above and even initially claimed in this way, one or more features from a claimed combination may be removed from that combination in some cases, and a claimed combination may refer to a sub-combination or a variation thereof.

[0074] Similarly, although the operations are depicted in a specific order in the accompanying drawings, this should not be construed as requiring these operations to be performed in the specific order shown or sequentially, or requiring all illustrated operations to be performed to achieve the desired result. In some cases, multitasking and parallel processing may be advantageous. Furthermore, the separation of various system modules and components in the above embodiments should not be construed as requiring such separation in all embodiments, and it should be understood that the described program components and systems can generally be integrated together in a single software product or packaged into multiple software products.

[0075] The above detailed embodiments are a description of the present invention. It should not be considered that the specific embodiments of the present invention are limited to these descriptions. For those skilled in the art, several simple deductions and substitutions can be made without departing from the concept of the present invention, and all of these should be considered to fall within the protection scope of the present invention.

Claims

1. A multi-site work value testing method, characterized by, The method includes: Multiple test stations are set up, and mapping rules are established between each test station and different acquisition channels of the same data acquisition card. This includes: Bind the test station to the channel number of the data acquisition card; Acquire voltage signal data from all channels of the data acquisition card; acquiring voltage signal data from all channels of the data acquisition card includes: The data acquisition from all channels in the data acquisition card is centralized into a single module, and multiple data push caches are established for multiple test stations. According to the mapping rule, voltage signal data from different acquisition channels are distributed to the corresponding test stations in real time; the process of distributing voltage signal data from different acquisition channels to the corresponding test stations in real time according to the mapping rule includes: According to the mapping rules, the data of different test stations bound to the channels are compressed, encapsulated into a unified data communication format, and sent to the corresponding data push cache. Each test station determines whether the received voltage signal data has changed. If a change occurs, the working value is calculated based on the voltage signal data collected at the change time point.

2. A multi-site work value testing method according to claim 1, wherein, It also includes a data invalidation mechanism, which includes: A data expiration time is set. If the time elapsed after the data is sent to the corresponding data push cache exceeds the data expiration time, the corresponding data will be deleted.

3. The method of claim 1, wherein, The compression of data from different test stations bound to different channels includes: The original data sample is divided into several intervals; Sort the data for each interval, remove the largest and smallest samples, and calculate the mean for that interval.

4. The multi-station working value testing method according to claim 1, characterized in that, This includes the left test station and the right test station.

5. A multi-station working value testing system, characterized in that, The system includes: The test station mapping module is used to set up multiple test stations and establish mapping rules between each test station and different acquisition channels of the same data acquisition card. This includes: Bind the test station to the channel number of the data acquisition card; The data acquisition module is used to acquire voltage signal data from all channels of the data acquisition card; acquiring voltage signal data from all channels of the data acquisition card includes: The data acquisition from all channels in the data acquisition card is centralized into a single module, and multiple data push caches are established for multiple test stations. The data distribution module is used to distribute voltage signal data from different acquisition channels to corresponding test stations in real time according to the mapping rules; the real-time distribution of voltage signal data from different acquisition channels to corresponding test stations according to the mapping rules includes: According to the mapping rules, the data of different test stations bound to the channels are compressed, encapsulated into a unified data communication format, and sent to the corresponding data push cache. The working value calculation module is used to determine whether the voltage signal data received at each test station has changed. If a change occurs, the working value is calculated based on the voltage signal data collected at the change time point.

6. A storage medium storing computer instructions thereon, characterized in that, When the computer instructions are executed, they perform the steps of the working value testing method according to any one of claims 1-4.

7. A terminal, comprising a memory and a processor, wherein the memory stores computer instructions executable by the processor, characterized in that, The processor executes the steps of the working value testing method according to any one of claims 1-4 when running computer instructions.

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