A terminal nfc automatic pressure test control device, system and method

Abstract

The application discloses a terminal NFC automatic pressure test control device, system and method, wherein the control device comprises: a storage module, which is used for storing different kinds of IC card information into a smart device with NFC card simulation function to generate an IC information list; a simulation selection module, which is used for selecting a simulation IC card for testing in the simulation IC card information list, and selecting a next kind of simulation IC card from the list for testing after the simulation IC card and the terminal to be tested inductively test a preset number of times; an information interaction module, which is used for receiving test data during the test of the smart device in the inductive area of the terminal to be tested; and an analysis and judgment module, which is used for judging the stability of the terminal to be tested in reading NFC cards according to the test data of the terminal to be tested and different simulation IC cards after the test. The application can use simulation IC cards to automatically test NFC, and solves the problem of low efficiency and large resource occupation in previous manual testing.

Description

Technical Field

[0001] This invention relates to the field of information and communication, and in particular to a terminal NFC automated stress test control device, system and method. Background Technology

[0002] For POS machine NFC near-field communication testing, current methods require testers to purchase a set of test cards suitable for various NFC usage scenarios and manually verify NFC compatibility one by one. This is simple to operate and highly repeatable. However, NFC testing has certain distance requirements, necessitating manual control of the test distance, making errors unavoidable. For NFC stress testing, to meet the industry standard requirement of 100,000 cycles, and due to the unstable speed of manual execution, a single person needs approximately four days to complete the task. Such a long and monotonous testing process may cause testers to miss certain defects due to a lack of concentration. Therefore, manually performing NFC functional testing not only requires significant manpower and time resources but is also inefficient. Summary of the Invention

[0003] The purpose of this invention is to propose an automated stress test control device, system and method for terminal NFC, which solves the problems of low efficiency and large amount of manpower and time resources required for manual testing.

[0004] Specifically, the technical solution of this application is as follows: This invention discloses a terminal NFC automated stress test control device, comprising: The storage module is used to store information of different types of IC cards into a smart device with NFC card emulation function and generate an IC information list so that the smart device can emulate different types of IC cards. The simulation selection module is used to select a simulated IC card for testing from the simulated IC card information list, and after the number of simulated IC card and terminal under test sensing tests reaches a preset number, it selects the next type of simulated IC card from the simulated IC card information list for testing; The information interaction module is used to receive test data during the testing process when the intelligent device of the transmission device moves to the sensing area of ​​the terminal under test. The analysis and judgment module is used to obtain the NFC recognition rate of the terminal under test based on the test data of the terminal under test and different simulated IC cards after the test is completed, and to judge the stability of the terminal under test in reading NFC cards based on the NFC recognition rate of the terminal under test.

[0005] In some embodiments, the terminal NFC automated stress test control device further includes: a motion control module, used to control the transmission device carrying the smart device to periodically move to the sensing area of ​​the terminal under test according to a preset number of tests and frequency, so that the terminal under test can read the analog IC card.

[0006] In some embodiments, the terminal NFC automated stress test control device further includes: a detection and adjustment module, used to detect whether the volume of the sound feedback signal is within a preset volume range; if not, to notify the terminal under test to adjust the volume during NFC sensing.

[0007] In some embodiments, the information interaction module further includes: a sensing data receiving submodule, used to receive sensing data of the corresponding analog IC card reported by the terminal under test during the test; and a sound data receiving submodule, used to receive sound feedback signals emitted by the terminal under test during the test.

[0008] In some embodiments, the analysis and judgment module further includes: a card reading judgment submodule, used to obtain the number of times the terminal under test successfully reads the simulated IC card based on the number or frequency of tests between the terminal under test and the simulated IC card, combined with sensing data and sound feedback signals; a recognition rate acquisition submodule, used to obtain the NFC recognition rate of the terminal under test based on the number of times the terminal under test successfully reads each simulated IC card; and a stability judgment submodule, used to determine whether the NFC recognition rate of the terminal under test is greater than a preset recognition rate, and if so, to determine that the stability of the terminal under test in acquiring NFC cards is good.

[0009] This invention also discloses a terminal NFC automated stress testing system, comprising: the terminal NFC automated stress testing control device, the smart device, and the transmission device and sound acquisition device as described in any of the above embodiments; wherein: The control device stores information of different types of IC cards into a smart device with NFC card emulation function and generates an IC information list; it selects a simulated IC card for testing from the IC information list, and after the simulated IC card and the terminal under test have reached a preset number of sensing tests, it selects the next type of simulated IC card from the simulated IC card information list for testing; The conveying device carries a smart device with simulated IC card function and periodically moves to the sensing area of ​​the terminal under test so that the terminal under test can sense the corresponding simulated IC card. The sound acquisition device acquires the sound feedback signal when the terminal under test senses the corresponding analog IC card, and feeds the sound feedback signal back to the control device; The control device receives test data, which includes sensor data fed back by the terminal under test and sound feedback signals collected by the sound acquisition device. After the test is completed, the control device obtains the NFC recognition rate of the terminal under test based on the test data of the terminal under test and different simulated IC cards, and judges the stability of the terminal under test in reading NFC cards based on the NFC recognition rate of the terminal under test.

[0010] In some embodiments, the conveying device includes: a ring-shaped guide rail and a platform for loading a smart device with simulated IC card function to move periodically along the ring-shaped guide rail, so that the simulated IC card can enter the sensing area through the ring-shaped guide rail for sensing testing.

[0011] In some embodiments, the sound acquisition device is a sound pressure meter.

[0012] Finally, this invention also discloses an automated stress testing method for terminal NFC, comprising: Different types of IC card information are stored in a smart device with NFC card emulation function to generate an IC information list; Select the simulated IC card for testing from the simulated IC card information list, and after the simulated IC card and the terminal under test have reached the preset number of sensing tests, select the next type of simulated IC card from the simulated IC card information list for testing; The sensor area of ​​the terminal under test is loaded with a smart device that moves periodically so that the terminal under test can read the analog IC card; During the sensing test between the terminal under test and the current analog IC, test data is received, including sensing data reported by the terminal under test and sound feedback signals emitted by the terminal under test during the sensing test. After the test, the NFC recognition rate of the terminal under test is obtained based on the test data of the terminal under test and different simulated IC cards, and the stability of the terminal under test in reading NFC cards is judged based on the NFC recognition rate of the terminal under test.

[0013] This application possesses at least one of the following technical effects: (1) This application uses software to simulate various types of IC cards. Specifically, the information of various types of IC cards is stored in the smart device to generate an IC information list. After selecting an IC card from the IC information list, the corresponding IC card information can be obtained according to the ID of the selected IC card. The smart device is controlled by a script to enable the corresponding IC card to have the function of the IC card, thus generating a simulated IC card. By performing stress tests on each type of IC card in the IC information list in sequence, the traditional manual testing method of performing 100,000 stress tests per round is eliminated, solving the problems of wasting human and time resources and low efficiency. Moreover, since simulated IC cards are used, there is no problem of physical card wear and tear.

[0014] (2) Automated simulated NFC testing uses a transmission device to periodically load smart devices and move them within the sensing area of ​​the terminal under test to perform sensing tests. This eliminates the problem of traditional manual testing, which requires manual testing at various distances within the sensing area. This not only saves manpower costs but also improves testing accuracy.

[0015] (3) Detecting the volume of the terminal under test when it senses the signal. Since the required volume varies in different environments, if the volume of the terminal under test when it senses the signal is not within the preset volume range, the terminal under test can be notified to adjust the volume according to the actual situation. For example, in noisy application scenarios, it can be set above 60 decibels, but generally it should not exceed the range acceptable to the human ear, i.e., 90 decibels. In a relatively quiet environment, the buzzer of the terminal under test can be adjusted to below 60 decibels. By detecting and adjusting the volume of the terminal under test when it senses the signal, the user experience is improved. Attached Figure Description

[0016] Figure 1 This is a structural block diagram of the terminal NFC automated stress test control device according to Embodiment 1 of the present invention; Figure 2 This is a structural block diagram of the terminal NFC automated stress test control device according to Embodiment 2 of the present invention; Figure 3 This is a structural block diagram of the terminal NFC automated stress test control device according to Embodiment 3 of the present invention; Figure 4 This is a test schematic diagram of the terminal NFC automated stress test control system according to Embodiment 7 of the present invention; Figure 5 This is a flowchart of the terminal NFC automated stress testing method according to Embodiment 8 of the present invention; Figure 6 This is a flowchart of the terminal NFC automated stress testing method according to Embodiment 9 of the present invention.

[0017] Figure label: 100 -- Storage module; 200 -- Simulation selection module; 300 -- Information interaction module; 400 -- Analysis and judgment module; 500 -- Motion control module; 600 -- Detection and adjustment module; 700 -- Reminder module; 310 -- Sensor data receiving submodule; 320 -- Sound data receiving submodule; 410 -- Card reading judgment submodule; 420 -- Recognition rate acquisition submodule; 430 -- Stability judgment submodule; 411 -- Recognition unit; 412 -- Statistics unit; 31 -- Terminal under test; 32 -- Control center; 33 -- NFC simulation device; 34 -- Sound pressure meter.

[0018] The present invention will now be described in further detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and not intended to limit it. Furthermore, it should be noted that, for ease of description, only the parts relevant to the present invention are shown in the accompanying drawings, and not all of them.

[0019] Example 1 Figure 1This is a structural framework diagram of the terminal NFC automated stress testing control device according to the first embodiment of the present invention. The terminal NFC automated stress testing control device includes: The storage module 100 is used to store information of different types of IC cards into a smart device with NFC card emulation function, generating an IC information list so that the smart device can emulate different types of IC cards. For example, transportation cards, phone cards, and ID cards can be entered simultaneously to obtain a list: 1. Transportation card + card ID, 2. Bank card + card ID, 3. ID card + card ID. Of course, the type of IC card is not limited to the cards mentioned in the examples above.

[0020] The simulation selection module 200 selects a simulated IC card for testing from the simulated IC card information list. After the simulated IC card and the terminal under test have undergone a preset number of sensing tests, the module 12 selects the next type of simulated IC card from the list for testing. The selection methods include sequential selection, reverse selection, and random selection, and any one of these three methods can be preset. For example, when the simulated card under test has reached the preset number of tests, the simulation module 12 randomly selects the next type of simulated IC card for the next test.

[0021] The information interaction module 300 is used to receive test data during the testing process when the smart device is moved from the transmission device to the sensing area of ​​the terminal under test.

[0022] The analysis and judgment module 400 is used to obtain the NFC recognition rate of the terminal under test based on the test data of the terminal under test and different simulated IC cards after the test is completed, and to judge the stability of the terminal under test in reading NFC cards based on the NFC recognition rate of the terminal under test.

[0023] Specifically, during NFC testing, various types of IC cards are first entered into the storage module 100 to generate an IC information list. Then, the simulation selection module 200 selects a simulated IC card from the IC information list for testing. After a preset number of tests, the next simulated IC card is selected from the IC information list for the next round of testing. During each round of testing, the information interaction module 300 continuously collects the test data generated by the sensing test. Finally, the analysis and judgment module 400 obtains the NFC recognition rate of the terminal under test based on the data collected by the information interaction module 300, and judges the stability of the terminal under test in reading NFC cards based on the NFC recognition rate.

[0024] This invention employs a storage module 100 to input IC card data, and a simulation selection module 200 to select a simulated IC card for a stress test. After a preset number of tests, the next simulated IC card is selected for a new stress test. During the test, an information interaction module receives the test data, and after the test, an analysis and judgment module 400 uses the test data to obtain the NFC recognition rate and thus determine the stability of the tested simulated IC card. This solves the problem of traditional NFC testing requiring multiple rounds of high-frequency stress tests manually, saving significant human and time resources. Furthermore, this embodiment uses a smart device with NFC card simulation functionality to simulate different types of IC cards for stress testing, eliminating the need for physical cards and preventing damage to the physical cards, thus avoiding the impact of physical card wear on the test.

[0025] Example 2 The terminal NFC automated stress test control device of this embodiment, such as Figure 2 As shown, based on Embodiment 1, a motion control module 500 is added to control the transmission device carrying the smart device to periodically move to the sensing area of ​​the terminal under test according to a preset number of test times and frequency, so that the terminal under test can read the analog IC card.

[0026] The mobile control module controls a transmission device equipped with a smart device to periodically move to the sensing area of ​​the terminal under test, allowing the terminal under test to repeatedly sense and read the simulated IC card of the smart device. This eliminates the need for manual transmission, greatly reducing labor costs. Furthermore, the transmission device is controlled by the mobile control module and can be adjusted according to the preset number of tests or frequency to achieve automated stress testing.

[0027] Example 3 The test data in any of the above embodiments includes the sensing data sent by the terminal under test after reading the simulated IC card. More preferably, the terminal under test will also emit a sound after reading the simulated IC card to indicate successful sensing. Therefore, as Figure 3 As shown, the information interaction module 300 in any of the above embodiments includes: The sensing data receiving submodule 310 is used to receive the sensing data of the corresponding analog IC card reported by the terminal under test during the test. The audio data receiving submodule 320 is used to receive audio feedback signals emitted by the terminal under test during the test. Specifically, the information interaction module 300 receives analog IC card sensing data reported by the terminal under test through the sensing data receiving submodule 310, and receives sound feedback signals reported by the terminal under test through the sound data receiving submodule 320. By collecting the above two types of data, the upper limit of the NFC recognition confidence of the terminal under test is increased.

[0028] In another implementation, such as Figure 3 As shown, the analysis and judgment module 400 further includes: The card reading judgment submodule 410 is used to obtain the number of times the terminal under test successfully reads the analog IC card based on the number or frequency of tests between the terminal under test and the analog IC card, combined with sensing data and sound feedback signals. The recognition rate acquisition submodule 420 is used to obtain the NFC recognition rate of the terminal under test based on the number of times the terminal under test successfully reads each simulated IC card; The stability judgment submodule 430 is used to determine whether the NFC recognition rate of the terminal under test is greater than the preset recognition rate. If so, it is determined that the stability of the terminal under test in reading the NFC card is good.

[0029] Furthermore, the aforementioned card reading judgment submodule also includes: The identification unit 411 is used to determine whether there is matching sensor test data or sound feedback signal in each test or each test cycle based on the number or frequency of tests between the terminal under test and the analog IC card, combined with the sensor test data and sound feedback signal of the terminal under test. The statistics unit 412 is used to count the number of tests in which both sensor test data and sound feedback signals exist simultaneously, and to obtain the number of times the terminal under test successfully reads the analog IC card. Specifically, after receiving the simulated IC card sensing data and sound feedback signal sent by the information interaction module 300, the analysis and judgment module 400 counts the test samples that simultaneously have sensing data and sound feedback signals in one round of testing, and sends the count to the recognition rate acquisition submodule 420. After receiving the count of test samples, the recognition rate acquisition submodule 420 divides it by the total number of tests in one round of testing to obtain the NFC recognition rate of the terminal under test, and sends the recognition rate to the stability judgment submodule 430. The stability judgment submodule 430 determines whether the NFC recognition rate of the terminal under test is greater than the preset recognition rate based on the recognition rate. If so, it determines that the stability of the terminal under test in reading the NFC card is good.

[0030] Example 4 Figure 2 This is a structural diagram of the terminal NFC automated stress test control device according to the third embodiment of the present invention, as shown below. Figure 2 As shown, the terminal NFC automated stress test control device of this embodiment further includes, based on embodiment one or two, the following: The detection and adjustment module 600 is used to detect whether the volume of the sound feedback signal collected by the terminal under test during NFC sensing meets the preset volume range after receiving the sound feedback signal. If not, it notifies the terminal under test to adjust the volume during NFC sensing.

[0031] The volume range generally does not exceed the human ear's comfort zone, i.e., 90 decibels. In noisy environments, the volume starts from 60 decibels to prevent misjudgment due to environmental influences. Since the volume varies with distance, the volume will also be different at different test distances. The detection adjustment module 26 is generally set at 10-15cm from the sound source as a standard.

[0032] Specifically, for IC cards like public transport cards, the environments of buses and subway stations are generally quite noisy, requiring the sound level of the terminal under test to be increased to over 60 decibels for noticeable human hearing. Conversely, in quiet environments such as libraries, the buzzer for student cards or library cards used to pass through gates doesn't need to be 60 decibels; 40 decibels or lower is sufficient, or even unnecessary. A softer mechanical sound, such as the friction of the gate latch and hinges opening, can be used instead, as frequent buzzing can be distracting and annoying to users in a given flow of people. In short, the volume of the sound feedback signal from various terminals should be determined based on actual needs, rather than adhering to a fixed standard.

[0033] This embodiment of the invention provides NFC test feedback to the user through the addition of a detection and adjustment module 600 and an alert module 700. When the volume of the sound feedback signal generated during the test is too loud or too soft, the volume is adjusted to a range acceptable to the human ear. More preferably, based on any of the above embodiments, the terminal NFC automated stress test control device further includes: The alert module 700 is used to provide corresponding feedback and alerts when the NFC function of the terminal under test malfunctions. For example, it emits a distinct "buzzing" sound, different from a buzzer. This timely audible feedback for NFC malfunctions solves the problem of auditory fatigue and reduced testing accuracy caused by the inability to adjust the buzzer volume in traditional NFC testing.

[0034] Example 5 This embodiment discloses a terminal NFC automated stress test control system, specifically including: the terminal NFC automated stress test control device, smart device, transmission device, and sound acquisition device as described in any of the above embodiments of this application; wherein: The control device stores different types of IC card information into a smart device with NFC card emulation function, generating an IC information list; it then selects a simulated IC card from the IC information list to enable the smart device to have the corresponding simulated IC card function. The conveying device carries a smart device with simulated IC card function and periodically moves to the sensing area of ​​the terminal under test so that the terminal under test can sense the corresponding simulated IC card. The sound acquisition device collects the sound feedback signal when the terminal under test senses the corresponding analog IC card, and feeds the sound feedback signal back to the control device; The control device receives the sensor test data fed back by the terminal under test and the sound feedback signal collected by the sound acquisition device; and determines the number of times the terminal under test and the corresponding analog IC card simultaneously have sensor test data and sound feedback signal, and whether the sound feedback signal meets the preset volume range, based on the sensor test data and / or sound feedback signal. After the test is completed, the control device obtains the NFC recognition rate of the terminal under test based on the test data of the terminal under test and different simulated IC cards, and judges the stability of the terminal under test in reading NFC cards based on the NFC recognition rate of the terminal under test.

[0035] Example 6 The terminal NFC automated stress testing system provided in this embodiment, based on the above embodiment five, specifically includes the following: The device consists of a circular guide rail and a stage. The circular guide rail is located within the sensing area of ​​the terminal under test. The stage carries a smart device with simulated IC card functionality and moves it periodically along the circular guide rail so that the simulated IC card can pass through the circular guide rail into the sensing area for sensing testing. The sound feedback signal will form a regular data peak according to the movement of the stage. If this peak is not formed, the NFC communication of the terminal under test may be abnormal.

[0036] In a preferred embodiment of the present invention, the annular guide rail is completely outside the sensing area of ​​the terminal under test. An extension arm is added to connect the rollers in the guide rail to the stage, so that the stage can extend out of the annular guide rail through the extension arm. This ensures that the annular guide rail is not within the sensing area of ​​the terminal under test, thus avoiding static electricity generated by friction between the rollers and the annular guide rail, which would cause electromagnetic interference to the sensing.

[0037] In another preferred embodiment of the present invention, the mobile control module in the control device controls the transmission device to periodically move to the sensing area of ​​the terminal under test, so that the simulated IC card can automatically perform NFC sensing tests with the terminal under test according to the set number of tests and frequency. In addition, during the NFC test, the test data fed back by the terminal under test presents a curve that fits the characteristics related to its own displacement, which solves the problem of wasting human resources by requiring manual NFC testing at different distances in traditional NFC testing. Moreover, based on this curve that fits the characteristics related to displacement, it is determined whether the fitted curve matches the preset curve characteristics, thereby increasing the reliability of the identification judgment.

[0038] Example 7 Specifically, Figure 4 This is a flowchart of the terminal NFC automated stress testing system according to Embodiment 7 of the present invention, as follows: Figure 4The diagram illustrates the automated stress testing process of the specific terminal NFC automated stress testing system.

[0039] The terminal NFC automated stress testing system includes a terminal under test 31, a transmission device, an NFC simulation device 33 (equivalent to a smart device simulating an IC card in the above embodiment), a sound pressure meter (an implementation of a sound acquisition device), and a control center 32.

[0040] The terminal under test (DUT) has a buzzer that sounds upon sensing a signal from a smart device. The transmission device is as described in Example 2. After setting up the test environment, the DUT is placed on the test platform, initially powered on. Go to Settings -> Connections -> NFC and turn on the NFC switch. Then go to Settings -> System -> Developer Options and turn on the USB debugging switch, connecting it to the control device via a debugging cable. Record the entire status of the DUT using the adb command (adb logcat -b all) for analysis in case of problems. Power on a smart device with NFC card emulation capabilities (such as a mobile phone) and grant root access. Go to Settings -> Connections -> NFC and turn on the NFC switch. Then go to Settings -> System -> Developer Options and turn on the USB debugging switch, connecting it to the control device via a debugging cable. Start the software program and place different types of IC cards in the NFC location of the smart device. After successful recognition, save the card information automatically, creating a card information list. At this point, the smart device has become an NFC emulation device and is placed on the auxiliary test platform. The sound pressure meter is placed 10-15cm away from the buzzer of the terminal under test (DUT), and fast mode is enabled. The control device is connected, and the program is started to record sound data. Preparation is now complete. Next, the transmission device button on the auxiliary test platform is activated, causing the NFC simulator to run at a constant speed within the NFC standard range. The DUT detects the NFC simulator within its radio frequency range, initiates communication, and reads data from the simulator. The control device automatically counts the number of times and the content of the read data. The DUT's buzzer will sound a communication alert during each communication. This information is recorded by the sound pressure meter and transmitted to the control device. This forms a sequence of actions: "Simulated data from simulator - entering the DUT's radio frequency range - DUT initiates communication - issues communication alert - sound pressure meter records alert - data is transmitted back to the control device." After a fixed period (the exact duration depends on NFC performance), the control device sends a command, and the DUT disables its NFC switch.

[0041] If the following anomalies occur during the control device's log analysis procedure, you can request R&D intervention for repair: 1) If the sound pressure level (SPL) data analysis does not show regular data peaks, the NFC communication of the device under test may be abnormal. Pay attention to exception information in the log, such as "android.os.DeadObjectException," to find the component causing the NFC exception.

[0042] 2) If the sound pressure level reading is too high, exceeding 90 dB, the subjective experience will be unpleasant during prolonged use, and the buzzer volume needs to be adjusted.

[0043] 3) If the number of NFC interaction (ID data, to realize the function of the corresponding ID and return business data) communications counts by the control device does not match the counts of the sound pressure meter, then the difference needs to be checked through the log.

[0044] This embodiment details the operation process of the NFC automatic testing system in automatically collecting test data and logs, and provides a diagnostic method when an anomaly is detected during testing. It solves the problem of low efficiency caused by the need for manual data collection and inference of abnormal results in traditional NFC testing.

[0045] Example 8 Figure 5 This is a flowchart of the terminal NFC automated stress testing method according to the eighth embodiment of the present invention, as follows: Figure 5 As shown, the terminal NFC automated stress testing method includes: Step 41: Store the information of different types of IC cards into a smart device with NFC card emulation function to generate an IC information list so that the smart device can emulate different types of IC cards.

[0046] Step 42: Select the simulated IC card to be tested from the simulated IC card information list, and after the simulated IC card and the terminal under test have reached the preset number of sensing tests, select the next type of simulated IC card from the simulated IC card information list for testing.

[0047] Step 43: The loaded smart device is periodically moved to the sensing area of ​​the terminal under test so that the terminal under test can read the analog IC card.

[0048] Step 44: During the sensing test between the terminal under test and each analog IC card, receive test data; the test data includes the sensing data reported by the terminal under test and the sound feedback signal emitted by the terminal under test during the sensing test.

[0049] Step 45: By collecting the sound feedback signal and / or the feedback sensing test data, count the number of tests in which both sound feedback signal and feedback sensing test data exist simultaneously, and obtain the number of times the terminal under test successfully reads the simulated IC card.

[0050] Step 46: Determine if there are any untested simulated IC cards in the IC information list. If so, proceed to step 42; otherwise, proceed to step 47.

[0051] Step 47: Based on the test data of the terminal under test and different simulated IC cards, obtain the NFC recognition rate of the terminal under test, and judge the stability of the terminal under test in reading NFC cards based on the NFC recognition rate of the terminal under test.

[0052] This invention provides a process for automated stress testing of terminal NFC, including pre-test preparations, information collection during testing, and test result analysis. It presents a complete automated testing method that solves the problem of traditional NFC testing requiring entirely manual operation, thus freeing up human labor.

[0053] Example 9 Figure 6 This is a flowchart of the terminal NFC automated stress testing method according to the ninth embodiment of the present invention, as follows: Figure 6 As shown, the terminal NFC automated stress testing method includes: Step 510: Store the information of different types of IC cards into a smart device with NFC card emulation function to generate an IC information list. For example, simultaneously enter transportation cards, phone cards, ID cards, etc., to obtain a list: 1. Transportation card + card ID, 2. Bank card + card ID, 3. ID card + card ID. Of course, the IC card type is not limited to the cards mentioned in the above examples.

[0054] Step 520: Select the simulated IC card to be tested from the simulated IC card information list.

[0055] Step 530: The loaded smart device is periodically moved to the sensing area of ​​the terminal under test so that the terminal under test can read the analog IC card.

[0056] Step 540: Collect the sound feedback signal emitted by the terminal under test (DUT) during sensing, and receive the sensing test data fed back by the DUT. The reason why the smart device needs to move is that the radio frequency of the DUT is fixed. This allows the collected sound feedback signal to reflect whether it conforms to the theoretical relationship with the distance between the smart device and the DUT, increasing the confidence level of judging whether the test results are consistent.

[0057] Step 550: Determine whether both audio feedback signal and feedback data are present simultaneously in each test. If yes, proceed to step S560; otherwise, the NFC function of the terminal under test is considered abnormal in this test, and proceed to step S562, determining that this test is unqualified. Specifically, when there is only an audio feedback signal but no feedback data, it can be considered that the signal interaction module is faulty and is not feeding back data; when there is only feedback data but no audio feedback signal, it can be considered that the buzzer of the terminal under test is faulty and is not emitting noise after receiving the signal. Both of these situations are considered as unqualified for this test. Under normal NFC function of the terminal under test, both audio feedback signal and feedback data should be present simultaneously during the test.

[0058] Step 560: Determine whether the sound feedback signal conforms to preset characteristics. If it does not, it means that the feedback data does not match the theoretical data, and the NFC function of the terminal under test is considered abnormal. Proceed to step S562 and the test is deemed unqualified. Conversely, if it does, the NFC function of the terminal under test is considered normal, and the test is deemed qualified. Generally, if the sound feedback data collected by the sound pressure meter does not form regular data peaks, the NFC communication of the terminal under test may be abnormal.

[0059] Step 570: Determine if there are any untested simulated IC cards in the IC information list. If so, proceed to step 520; otherwise, proceed to step 580.

[0060] Step 580: Based on the test data of the terminal under test and different simulated IC cards, obtain the NFC recognition rate of the terminal under test, and judge the stability of the terminal under test in reading NFC cards based on the NFC recognition rate of the terminal under test.

[0061] Specifically, first, input the information of the IC card group to be tested to generate an IC information list in the format of IC card ID - IC card type name, such as 6222 - The format can be reversed to ICBC card-6222. The process involves iterating through the IC card information list, selecting the current IC card, and recording it into the smart device for simulated sensing testing. After the current IC card completes the test, it is removed from the current IC information list and replaced with another IC card from the list for testing, until all IC cards have been tested. Then, the IC card under test is periodically moved within the sensing area. The sound feedback signal emitted by the IC card during sensing and the data fed back by the terminal under test are collected. Due to its periodic movement characteristics, the volume data of the sound feedback signal from the terminal under test will also show related mapping characteristics. A judgment is then made on whether the sampling point simultaneously contains both sound feedback signal and feedback data. If the sound feedback signal is missing, the buzzer of the terminal under test is faulty; if the feedback data is missing, the information interaction module is faulty. Both of these will cause the current simulated IC card test to fail. Based on the above conditions being met, it is determined whether the sound feedback signal forms a regular data peak. If this peak is not formed, the NFC communication of the terminal under test may be abnormal, and the current simulated IC card test will still fail.

[0062] In a preferred embodiment of the present invention, the testing process of each simulated IC card is logged. When a test failure is reported, manual intervention can be used to eliminate system misjudgment points or discover unpredictable reasons for test failure.

[0063] This invention analyzes the sound feedback signals and data at the sampling points during testing to obtain different test results: If a sampling point is found to have a missing sound feedback signal, the buzzer of the terminal under test is considered faulty; if a sampling point is found to have a missing feedback data, the information interaction module is considered faulty; if a sampling point is found to have both a missing sound feedback signal and missing feedback data; if the sound feedback signal volume data cannot be fitted to a mapping curve related to the displacement characteristics of the smart device, the feedback data is considered inconsistent with theoretical data. These four preset results solve the problem of requiring manual judgment of test results in traditional NFC testing methods. Now, the judgment and feedback can be automatically performed based on preset results, improving testing efficiency.

[0064] Note that the above description is merely a preferred embodiment of the present invention and the technical principles employed. Those skilled in the art will understand that the present invention is not limited to the specific embodiments described herein, and various obvious changes, readjustments, and substitutions can be made without departing from the scope of protection of the present invention. Therefore, although the present invention has been described in detail through the above embodiments, the present invention is not limited to the above embodiments, and may include many other equivalent embodiments without departing from the concept of the present invention, the scope of which is determined by the scope of the appended claims.

Claims

1. A terminal NFC automated stress test control device, characterized in that, include: The storage module is used to store information of different types of IC cards into a smart device with NFC card emulation function, and generate a list of simulated IC card information so that the smart device can emulate different types of IC cards. The simulation selection module is used to select a simulated IC card for testing from the simulated IC card information list, and after the number of times the simulated IC card and the terminal under test are sensed and tested reaches a preset number, select the next type of simulated IC card from the simulated IC card information list for testing; The information interaction module is used to receive test data during the periodic movement of the smart device loaded on the transmission device to the sensing area of ​​the terminal under test for testing. The test data includes the sensing data reported by the terminal under test and the sound feedback signal emitted by the terminal under test during the sensing test. The analysis and judgment module is used to determine whether the sensing data and the sound feedback signal exist simultaneously in each test. If not, the recognition is determined to be a failure. If there is only the sound feedback signal but no sensing data, the information interaction module is determined to be faulty. If there is only the sensing data but no sound feedback signal, the buzzer of the terminal under test is determined to be faulty. The analysis and judgment module is also used to determine whether the sound feedback signal has a mapping feature that matches the periodic motion. If it does not, the recognition is determined to be a failure and the NFC function of the terminal under test is abnormal. The analysis and judgment module is also used to obtain the NFC recognition rate of the terminal under test based on the test data of the terminal under test and different simulated IC cards after the test is completed, and to judge the stability of the terminal under test in reading NFC cards based on the NFC recognition rate of the terminal under test.

2. The terminal NFC automated stress test control device according to claim 1, characterized in that, Also includes: The mobile control module is used to control the transmission device carrying the smart device to periodically move to the sensing area of ​​the terminal under test according to the preset number of tests and frequency, so that the terminal under test can read the analog IC card.

3. A terminal NFC automated stress test control device according to claim 1 or 2, characterized in that, The information interaction module specifically includes: The sensing data receiving submodule is used to receive the sensing data of the corresponding simulated IC card reported by the terminal under test during the test; The audio data receiving submodule is used to receive audio feedback signals emitted by the terminal under test during the test.

4. The terminal NFC automated stress test control device according to claim 3, characterized in that, The analysis and judgment module specifically includes: The card reading judgment submodule is used to obtain the number of times the terminal under test successfully reads the simulated IC card based on the number or frequency of tests between the terminal under test and the simulated IC card, combined with the sensing data and sound feedback signal; The recognition rate acquisition submodule is used to obtain the NFC recognition rate of the terminal under test based on the number of times the terminal under test successfully reads each simulated IC card; The stability judgment submodule is used to determine whether the NFC recognition rate of the terminal under test is greater than the preset recognition rate. If so, it is determined that the stability of the terminal under test in reading the NFC card is good.

5. The terminal NFC automated stress test control device according to claim 4, characterized in that, The card reading judgment submodule specifically includes: The identification unit is used to determine whether there is matching sensor test data and sound feedback signal in each test or each test cycle based on the number or frequency of tests between the terminal under test and the simulated IC card, combined with the sensor test data of the terminal under test and the sound feedback signal. The statistics unit is used to count the number of tests in which both sensor test data and sound feedback signals exist simultaneously, and to obtain the number of times the terminal under test successfully reads the simulated IC card.

6. The terminal NFC automated stress test control device according to claim 3, characterized in that, Also includes: The detection and adjustment module is used to detect whether the volume of the sound feedback signal is within a preset volume range. If not, it notifies the terminal under test to adjust the volume when NFC sensing is performed.

7. A terminal NFC automated stress testing system, characterized in that, include: A terminal NFC automated stress test control device, a smart device, a transmission device, and a sound acquisition device as described in any one of claims 1-6; wherein: The control device stores information of different types of IC cards into a smart device with NFC card emulation function, and generates a list of simulated IC card information so that the smart device can emulate different types of IC cards. The control device selects a simulated IC card for testing from the simulated IC card information list, and after the simulated IC card and the terminal under test have reached a preset number of sensing tests, it selects the next type of simulated IC card from the simulated IC card information list for testing. The transmission device carries the smart device and periodically moves it to the sensing area of ​​the terminal under test so that the terminal under test can read the analog IC card. The sound acquisition device acquires the sound feedback signal emitted by the terminal under test during the sensing test, and feeds the sound feedback signal back to the control device. The control device receives test data, which includes the sensing data fed back by the terminal under test and the sound feedback signal collected by the sound acquisition device. After the test is completed, the control device obtains the NFC recognition rate of the terminal under test based on the test data of the terminal under test and different simulated IC cards, and judges the stability of the terminal under test in reading NFC cards based on the NFC recognition rate of the terminal under test.

8. The terminal NFC automated stress testing system according to claim 7, characterized in that, The conveying device includes: A circular guide rail is provided, on which a platform is provided for loading the smart device to move periodically along the circular guide rail, so that the analog IC card can enter the sensing area of ​​the terminal under test through the circular guide rail for sensing test.

9. The terminal NFC automated stress testing system according to claim 7, characterized in that, The sound acquisition device is a sound pressure meter.

10. A terminal NFC automated stress testing method, based on the terminal NFC automated stress testing control device according to any one of claims 1-6, characterized in that, include: Different types of IC card information are stored in a smart device with NFC card emulation function to generate a list of simulated IC card information, so that the smart device can emulate different types of IC cards; Select a simulated IC card for testing from the simulated IC card information list, and after the simulated IC card and the terminal under test have reached a preset number of sensing tests, select the next type of simulated IC card from the simulated IC card information list for testing; The smart device periodically moves to the sensing area of ​​the terminal under test so that the terminal under test can read the analog IC card; During the sensing test between the terminal under test and each analog IC card, test data is received; the test data includes the sensing data reported by the terminal under test and the sound feedback signal emitted by the terminal under test during the sensing test. Determine whether the sensing data and the sound feedback signal exist simultaneously in each test. If not, the recognition is determined to be a failure. If only the sound feedback signal is present but the sensing data is absent, the information interaction module is determined to be faulty. If only the sensing data is present but the sound feedback signal is absent, the buzzer of the terminal under test is determined to be faulty. Determine whether the sound feedback signal has a mapping feature that matches the periodic motion. If it does not, the identification is deemed to have failed and the NFC function of the terminal under test is abnormal. After the test, based on the test data of the terminal under test and different simulated IC cards, the NFC recognition rate of the terminal under test is obtained, and the stability of the terminal under test in reading NFC cards is judged based on the NFC recognition rate of the terminal under test.

Images