Jitter offset determination method, image calibration method, device, system and medium

Abstract

The present application provides a jitter offset determination method, an image calibration method, a device, a system and a storage medium, and relates to the field of medical device technology. The jitter offset determination method includes acquiring a plurality of phantom projection images at given angles, wherein the phantom projection images at given angles are images captured by the detector when the calibration phantom is in a mechanical isocenter position and the rack angle is the given angle; coordinate identification is performed on a preset reference position on the calibration phantom in the phantom projection image to obtain the calibration coordinates of the given angle; based on the calibration coordinates of the given angle and the reference coordinates corresponding to the preset reference position, the calibration jitter offset of the detector at the given angle is determined. The present application can accurately determine the jitter offset of the detector to improve image quality and positioning accuracy.

Description

Technical Field

[0001] The present invention relates to the field of medical device technology, and in particular to a jitter offset determination method, an image calibration method, a device, a system and a medium. Background Art

[0002] With the technological development of tumor radiology and material science, as an important means of overall treatment evaluation, tumor radiotherapy must achieve four precisions, namely: precise positioning, precise planning, and precise positioning.

[0003] Image-guided radiation therapy (IGRT) technology is an important means to improve the accuracy of radiotherapy and ensure and control the quality of radiotherapy. The coincidence of the mechanical rotation isocenter and the treatment isocenter is an important manifestation of radiotherapy quality assurance.

[0004] However, for radiotherapy equipment using IGRT technology, cone beam CT (CBCT) imaging technology is usually used. The detector used for imaging is usually fixed on the frame. When the frame rotates, the detector will also rotate with it. The detector will shake during the rotation process. If the image collected by the detector is shaken, there may be large artifacts, which will affect the accuracy of IGRT positioning and treatment. Therefore, it is particularly important to determine the jitter offset of the detector for image calibration (or correction). Summary of the invention

[0005] The purpose of the present invention is to provide a jitter offset determination method, image calibration method, device, system and medium to accurately determine the jitter offset of the detector, thereby ensuring the quality of the image collected by the detector and improving the positioning accuracy.

[0006] To achieve the above purpose, the technical solution adopted by the embodiment of the present invention is as follows:

[0007] In a first aspect, an embodiment of the present invention provides a method for determining a detector jitter offset, comprising:

[0008] Acquire a plurality of phantom projection images at given angles, wherein the phantom projection images at given angles are images acquired by the detector when the calibration phantom is at a mechanical isocenter position and the rack angle is the given angle;

[0009] Performing coordinate recognition on a preset reference position on the calibration phantom in the phantom projection image to obtain the calibration coordinates of the given angle;

[0010] The calibrated jitter offset of the detector at the given angle is determined according to the calibrated coordinates at the given angle and the reference coordinates corresponding to the preset reference position.

[0011] Optionally, the preset reference position in the calibration phantom has a preset reference object; and the step of performing coordinate recognition on the preset reference position on the calibration phantom in the phantom projection image to obtain the calibration coordinates of the given angle includes:

[0012] The preset reference object in the phantom projection image is subjected to coordinate recognition to obtain the calibration coordinate of the given angle.

[0013] Optionally, the performing coordinate recognition on the preset reference object in the phantom projection image to obtain the calibration coordinates of the given angle includes:

[0014] Using a preset image processing algorithm to perform coordinate recognition on the preset reference object in the phantom projection image to obtain the calibration coordinates of the given angle; or,

[0015] In response to a selection operation on the preset reference object on the phantom projection image, coordinate recognition is performed on an action position of the selection operation in the phantom projection image to obtain a calibration coordinate of the given angle.

[0016] Optionally, determining the calibration jitter offset of the detector at the given angle according to the calibration coordinates at the given angle and the reference coordinates corresponding to the preset reference position includes:

[0017] The calibrated jitter offset of the detector at the given angle is calculated according to the calibrated coordinates at the given angle, the reference coordinates corresponding to the preset reference position, and the resolution of the detector.

[0018] Optionally, acquiring a plurality of phantom projection images at given angles includes:

[0019] In at least one gantry mode, acquiring a plurality of phantom projection images at the given angles;

[0020] The step of performing coordinate recognition on a preset reference position on the calibration phantom in the phantom projection image to obtain the calibration coordinates of the given angle includes:

[0021] Performing coordinate recognition on a preset reference position on the calibration phantom in the phantom projection image at the given angle in each gantry mode to obtain the calibration coordinates of the given angle in each gantry mode;

[0022] Determining the calibration jitter offset of the detector at the given angle according to the calibration coordinates at the given angle and the reference coordinates corresponding to the preset reference position includes:

[0023] According to the calibration coordinates of the given angle in each rack mode and the reference coordinates corresponding to the preset reference position, the calibration jitter offset of the detector at the given angle in each rack mode is determined.

[0024] Optionally, the at least one rack mode includes at least one of the following: full-wild mode, half-wild mode, and real-time mode.

[0025] In a second aspect, an embodiment of the present invention provides an image calibration method, including:

[0026] Acquire the image to be calibrated collected by the detector at the target angle;

[0027] According to the target angle and the pre-acquired calibrated jitter offsets of the detector at multiple given angles, the actual jitter offset of the target angle is determined; wherein the target angle and the given angle are both rack angles; wherein the calibrated jitter offset is a calibrated jitter offset obtained by any method in the first aspect above;

[0028] The image to be calibrated is calibrated according to the actual jitter offset.

[0029] Optionally, determining the actual jitter offset of the target angle according to the target angle and pre-acquired calibrated jitter offsets of the detector at multiple given angles includes:

[0030] Determine, according to the plurality of given angles, a target given angle interval in which the target angle is located;

[0031] The actual jitter offset is determined according to the target angle and the calibrated jitter offsets of two boundary angles of the target given angle interval.

[0032] Optionally, among the multiple given angles, the angle difference between two adjacent given angles is a preset angle interval; and determining the target given angle interval in which the target angle is located according to the multiple given angles includes:

[0033] According to the preset angle interval, performing a division and rounding operation on the target angle to obtain a target interval index corresponding to the target angle;

[0034] According to the target interval index, from the correspondence between the preset interval index and the given angle interval, the given angle interval corresponding to the target interval index is determined as the target given angle interval.

[0035] Optionally, determining the actual jitter offset according to the target angle and the calibrated jitter offsets of two boundary angles of the target given angle interval includes:

[0036] Determining a proportional factor of the target angle in the target given angle interval according to the target angle and the two boundary angles;

[0037] The actual jitter offset is determined according to the scale factor and the calibrated jitter offsets of the two boundary angles.

[0038] Optionally, before determining the actual jitter offset of the target angle according to the target angle and the pre-acquired calibrated jitter offsets of the detector at multiple given angles, the method further includes:

[0039] Determining, according to a current gantry mode of the detector when acquiring the image to be calibrated, calibration jitter offsets of the multiple given angles in at least one gantry mode;

[0040] Determining the actual jitter offset of the target angle according to the target angle and the pre-acquired calibrated jitter offset of the detector at multiple given angles includes:

[0041] The actual jitter offset of the target angle is determined according to the target angle and the calibrated jitter offsets of the plurality of given angles in the current rack mode.

[0042] In a third aspect, an embodiment of the present application further provides a detector jitter offset determination device, comprising: a memory and a processor, wherein the memory stores a computer program executable by the processor, and when the processor executes the computer program, it implements any detector jitter offset determination method provided in the first aspect above.

[0043] In a fourth aspect, an embodiment of the present application further provides an image calibration device, comprising: a memory and a processor, wherein the memory stores a computer program executable by the processor, and when the processor executes the computer program, it implements any image calibration method provided in the second aspect above.

[0044] In a fifth aspect, an embodiment of the present application further provides a detector jitter offset determination system, comprising:

[0045] Rotating carrier;

[0046] A ball tube is arranged on a rotating carrier;

[0047] A phantom with a marker at the center, the center of the marker is located at the intersection of the imaging center axis of the tube and the rotation axis, and the imaging center axis of the tube is perpendicular to the detector;

[0048] A detector is arranged on the rotating carrier opposite to the tube, receives the imaging beam emitted by the tube after passing through the phantom, and generates a projection phantom image;

[0049] The processor acquires the projection phantom image and executes any one of the detector jitter offset determination methods described in the first aspect.

[0050] In a sixth aspect, an embodiment of the present application further provides a non-volatile storage medium having a computer program stored thereon. When the computer program is read and executed, it implements any detector jitter offset determination provided in the first aspect above, or any image calibration method provided in the second aspect above.

[0051] The beneficial effects of this application are:

[0052] In the jitter offset determination method, image calibration method, device, system and medium provided in the present application, the calibration coordinates of the given angle can be obtained by performing coordinate identification on a preset reference position on a calibration phantom in the phantom projection images at multiple given angles collected by the detector, and the calibration jitter offset of the detector at the given angle can be determined based on the calibration coordinates of the given angle and the reference coordinates corresponding to the preset reference position, thereby achieving accurate determination of the jitter offset of the detector at multiple given angles, so as to calibrate the images collected by the detector, thereby ensuring the quality of the images collected by the detector and improving the positioning accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0053] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for use in the embodiments are briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without creative work.

[0054] Figure 1 A schematic diagram of a radiotherapy calibration system provided in an embodiment of the present application;

[0055] Figure 2 A schematic diagram of a flow chart of a method for determining a detector jitter offset provided in an embodiment of the present application;

[0056] Figure 3 A schematic diagram of a calibration phantom used in an embodiment of the present application;

[0057] Figure 4 A schematic flow chart of another method for determining detector jitter offset provided in an embodiment of the present application;

[0058] Figure 5A schematic diagram of a flow chart of an image calibration method provided in an embodiment of the present application;

[0059] Figure 6 A flow chart of a method for determining an actual jitter offset in an image calibration method provided in an embodiment of the present application;

[0060] Figure 7 A flow chart of a method for determining a given angle interval of a target in an image calibration method provided in an embodiment of the present application;

[0061] Figure 8 A flow chart of another method for determining an actual jitter offset in an image calibration method provided in an embodiment of the present application;

[0062] Fig. 9 A schematic diagram of a target angle within a target given angle range provided in an embodiment of the present application;

[0063] Fig.10 A corresponding relationship diagram between the jitter offset and the angle in a coordinate direction provided by an embodiment of the present application;

[0064] Fig.11 A schematic diagram of a detector jitter offset determination device provided in an embodiment of the present application;

[0065] Fig.12 A schematic diagram of an image calibration device provided in an embodiment of the present application;

[0066] Fig.13 A schematic diagram of a computer device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0067] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments.

[0068] As a high-precision treatment technology, IGRT technology requires the use of images collected by the imaging device to determine the position of the treatment object on the treatment bed during the actual radiotherapy application based on the radiotherapy equipment. The accuracy of the positioning directly affects the accuracy and effectiveness of radiotherapy. Therefore, before radiotherapy application, the imaging device of the radiotherapy equipment needs to be geometrically calibrated to obtain the geometric offset of the imaging device in the radiotherapy equipment, so that the placement of the treatment object can be accurately positioned based on the calibrated geometric offset.

[0069] To achieve radiotherapy calibration, the embodiment of the present application may also provide a radiotherapy calibration system. Figure 1Schematic diagram of a radiotherapy calibration system provided in an embodiment of the present application. Figure 1 As shown, the radiotherapy calibration system may include: an imaging device 1 and a rotating carrier 2. The imaging device 1 is fixedly arranged on the rotating carrier 2, and is used to collect images of a target object on a treatment bed 3 during the rotation of the rotating carrier 2.

[0070] The rotating carrier 2 may be a rotating frame, which may be a roller, a C-shaped arm or other structures. Figure 1 The rotating carrier 2 in the figure is a drum as an example. The imaging device 1 may include a tube 11 disposed on the rotating carrier 2 and a detector 12 disposed on the rotating carrier 2 at a position relative to the tube 11. In this way, the detector 12 can receive the imaging beam emitted by the tube 11 after passing through the phantom, and generate a projection image of the target object. The tube 11 is a ray emission source, also known as a ray tube, or an imaging source, which emits an imaging beam such as a KV-level X-ray, and the detector 12 can receive the rays emitted by the tube 11, for example, it can be a flat panel detector, also known as a flat panel, or a curved surface detector.

[0071] In the process of imaging the phantom 4, the tube 11 can emit an imaging beam to illuminate the phantom, the detector 12 receives the imaging beam passing through the target object and generates projection data, the image system of the radiotherapy equipment obtains the projection data, and the image system can generate a projection image of the phantom according to the projection data. It should be noted that in the radiotherapy application process, the target object on the treatment bed 3 can be the radiotherapy object, and in the calibration process, the target object can be the phantom. For example, Figure 1 The phantom 4 is taken as an example, a marker is set at the center of the phantom 4, and the center of the marker is located at the intersection of the imaging center axis of the tube 11 and the rotation axis. The imaging center axis of the tube 11 is perpendicular to the detector 12.

[0072] The treatment bed 3 can move the target object thereon, that is, by moving the treatment bed 3, the target object can be moved to a predetermined position, such as the mechanical isocenter of the radiotherapy equipment or a virtual isocenter having a preset position relationship with the mechanical isocenter.

[0073] Before executing the radiotherapy calibration method of the present application, the target object on the treatment bed 3 can be moved to a preset position by moving the treatment bed 3, and the rotating carrier 2 can be controlled to rotate according to multiple given angles, and multiple phantom projection images collected by the detector 12 at multiple given angles can be obtained at the same time. The multiple given angles are multiple real angles of the rotating carrier 2, that is, the gantry, for one rotation. The multiple given angles are determined by the rotation configuration file of the rotating carrier 2.

[0074] The radiotherapy calibration system may further include: a calibration device, Figure 1In practical applications, the calibration device may be a computer device, an image processing device in an image system of a radiotherapy device, such as an image server, a lower computer arranged in a control cabinet of the radiotherapy device, or an upper computer arranged outside the control cabinet of the radiotherapy device and communicating with the control cabinet and interacting with the user, or any processing device capable of executing software processing operations.

[0075] No matter how the calibration device is configured, it is also connected to the detector for communication to obtain the phantom projection image captured by the detector, and then execute the detector jitter offset determination method provided in the following embodiments of the present application.

[0076] Based on any of the radiotherapy calibration systems shown above, the embodiments of the present application may also provide multiple implementations of obtaining calibration jitter offsets. The detector jitter offset determination method provided by the present application is illustrated by multiple examples as follows. Figure 2 This is a flow chart of a method for determining a detector jitter offset provided in an embodiment of the present application. The method can be implemented by a calibration device that is communicatively connected to the detector through software and / or hardware. Figure 2 As shown, the method may include:

[0077] S201, obtaining a plurality of phantom projection images at given angles.

[0078] The phantom projection image at a given angle is an image captured by the detector when the calibration phantom is at the mechanical isocenter position and the frame angle is a given angle.

[0079] In a possible implementation, the jitter state of the detector may be detected with the help of a preset calibration phantom. Therefore, it is necessary to first obtain the phantom projection images of the calibration phantom captured by the detector at the multiple given angles.

[0080] The calibration phantom may be, for example, a calibration square phantom or a phantom of other shapes. Using a square as the calibration phantom can ensure the stability of the phantom on the treatment bed. Of course, if a phantom of other shapes is used, a corresponding fixed installation portion may be provided on the treatment bed, and the stability of the phantom during the movement of the treatment bed may also be achieved.

[0081] Before detecting the shaking state of the detector, the calibration phantom may be fixedly set on the treatment bed, and the movement of the treatment bed may be controlled so that the treatment bed sends the calibration phantom to the center position of the machine.

[0082] Regardless of the shape of the calibration phantom, the calibration phantom may have a preset reference position, which may be provided with a specific reference object, or may be marked on the calibration phantom without providing a reference object. The preset reference position may be, for example, the center position of the calibration phantom.

[0083] If a reference object is provided at the preset reference position of the calibration phantom, the calibration phantom and the reference object may be made of different materials, respectively, so as to facilitate coordinate recognition of the preset reference position based on the phantom projection image.

[0084] For example, Figure 3 Schematic diagram of the calibration phantom used in the embodiment of the present application. In the calibration process of the detector jitter offset determination method provided in the embodiment of the present application, the calibration phantom used can be, for example, Figure 3 The calibration square mold 30 shown has a reference object 31 disposed at the center of the calibration square mold 30. In this example, the reference object 31 is a spherical reference object. It should be understood that in practical applications, the reference object 31 may also be in other shapes. The spherical reference object may be, for example, an aluminum ball.

[0085] In this embodiment, a spherical reference object is used, which not only facilitates the coordinate identification of the subsequent preset reference position, but also has a more convenient design.

[0086] S202 , performing coordinate recognition on a preset reference position on the calibration phantom in the phantom projection image to obtain calibration coordinates of a given angle.

[0087] For example, if there is a preset reference object at the preset reference position in the calibration phantom, the calibration coordinates of a given angle can be obtained by identifying the coordinates of the preset reference object in the phantom projection image. The coordinate identification of the preset reference object can be, for example, identifying the coordinates of the central pixel of the preset reference object.

[0088] The coordinate recognition of the preset reference object can be performed, for example, by automatic recognition or manual recognition. If the automatic recognition is adopted, a preset image processing algorithm can be used to perform coordinate recognition of the preset reference object in the phantom projection image to obtain the calibration coordinates of a given angle.

[0089] If the manual recognition method is adopted, the phantom projection image can be displayed so that the user can select the preset reference object on the phantom projection image, that is, input a selection operation acting on the preset reference object on the phantom projection image to realize the selection of the preset reference object. In the manual recognition method, in response to the selection operation acting on the preset reference object on the phantom projection image, the coordinates of the action position of the selection operation in the phantom projection image can be recognized to obtain the calibration coordinates of the given angle.

[0090] S203 , determining a calibration jitter offset of the detector at a given angle according to the calibration coordinates at a given angle and the reference coordinates corresponding to a preset reference position.

[0091] The identified calibration coordinates of the given angle can be expressed as P(xi ,y i ), where i = 0, 1, ..., N-1, and N is the number of given angles. Assuming that the preset reference position is the center position of the calibration phantom, the reference coordinates corresponding to the preset reference position can be represented as CenterPointO (x0, y0), for example. The reference coordinates corresponding to the preset reference position can be, for example, the rack angle when the rack is not rotated, that is, the coordinates of the preset reference position when the rack is at 0°.

[0092] In a possible example, the calibrated jitter offset at the given angle may be determined according to the difference between the calibrated coordinates at the given angle and the reference coordinates corresponding to the preset reference position.

[0093] In a possible implementation, the calibration jitter offset of the detector at a given angle may be determined according to the calibration coordinates of the given angle, the reference coordinates corresponding to the preset reference position, and the resolution of the detector.

[0094] In this implementation, the difference between the calibration coordinates at the given angle and the reference coordinates may be determined, and then the calibration jitter offset of the detector at the given angle may be determined based on the difference and the resolution of the imaging device.

[0095] For example, based on the calibration coordinates of a given angle, the reference coordinates corresponding to a preset reference position, and the resolution of the imaging device, the calibration jitter offset of the given angle in two coordinate directions can be determined using the following formula (1) and the following formula (2), respectively, to obtain the calibration jitter offset of the detector at the given angle.

[0096] U i =R*(x i -x0)......Formula (1)

[0097] V i =R*(y i -y0)...Formula (2)

[0098] Where R is the resolution of the detector, (U i , V i ) can represent a given angle Angle i The calibrated jitter offset of , i = 0, 1, ..., N-1, N is the number of given angles.

[0099] Thus, for the following 12 given angles: 0°, 30°, 60°, 90°, 120°, 150°, 180°, 210°, 240°, 270°, 300°, 330°, 360°, we can get (U0, V0), (U1, V1)...(U 11 , V 12 ).

[0100] The method for determining the detector jitter offset provided in this embodiment can perform coordinate identification on a preset reference position in the model projection image at multiple given angles collected by the detector, and determine the calibrated jitter offset of the detector at the given angle based on the identified calibration coordinates and the reference coordinates corresponding to the preset reference position, thereby realizing the detection of the jitter state of the detector at multiple given angles, and obtaining the jitter offset at multiple given angles, namely the calibrated jitter offset, thereby ensuring the accurate acquisition of the calibrated jitter offset, thereby ensuring that the compensation of the jitter offset is more accurate in actual application, ensuring the quality of the image collected by the detector, and improving the positioning accuracy.

[0101] Based on the above detector jitter offset determination method, the embodiment of the present application may further provide a possible implementation example of the detector jitter offset determination method. Figure 4 A flow chart of another method for determining detector jitter offset provided in an embodiment of the present application. Figure 4 As shown, obtaining the phantom projection images at multiple given angles in the above S201 may include:

[0102] S401. In at least one gantry mode, a plurality of phantom projection images at the given angle are acquired.

[0103] For example, in each of the at least one gantry mode, a plurality of phantom projection images at the given angle are acquired respectively. The at least one gantry mode may include, for example, at least one of the following: full field mode, half field mode, and real-time mode.

[0104] As shown in S202 above, the coordinate recognition of the preset reference position on the calibration phantom in the phantom projection image to obtain the calibration coordinates of a given angle may include:

[0105] S402 , performing coordinate recognition on a preset reference position on the calibration phantom in the phantom projection image at the given angle in each gantry mode to obtain calibration coordinates of the given angle in each gantry mode.

[0106] As shown in S203 above, determining the calibration jitter offset of the detector at the given angle according to the calibration coordinates of the given angle and the reference coordinates corresponding to the preset reference position may include:

[0107] S403: Determine a calibrated jitter offset of the detector at the given angle in each rack mode according to the calibrated coordinates of the given angle in each rack mode and the reference coordinates corresponding to the preset reference position.

[0108] The detector jitter offset determination method provided in this embodiment differs from the above-mentioned detector jitter offset determination method in that the acquisition of the phantom projection image, the coordinate identification of the preset reference position, and the determination of the calibration jitter offset are performed for each rack mode respectively, and the specific execution process is similar to that described above and will not be repeated here.

[0109] By executing the method provided in this embodiment, a calibrated jitter offset corresponding to at least one rack mode can be obtained, and the calibrated jitter offset corresponding to each rack mode can include: the calibrated jitter offset of the detector at multiple given angles of each rack mode. In this way, the calibrated jitter offset can be more comprehensive and complete, and better cover the actual application requirements, thereby ensuring that the compensation of the jitter offset is more accurate in the actual application process, ensuring the quality of the image collected by the detector, and improving the positioning accuracy.

[0110] Based on the detector jitter offset determination method provided by the above embodiments, the calibrated jitter offset of the detector at multiple given angles is obtained, and the embodiments of the present application can also provide multiple methods for applying the calibrated jitter offset to perform image calibration. In the actual application process of image calibration, based on the calibrated jitter offsets of multiple given angles obtained in advance, the actual jitter offset of the target angle during the rack rotation process is obtained. In the image calibration process, the offset can be compensated based on the actual jitter offset of the target angle, thereby realizing image calibration and improving image quality, thereby effectively ensuring the positioning accuracy of the radiotherapy equipment.

[0111] Figure 5 The flowchart of the image calibration method provided in the embodiment of the present application can be implemented by an image calibration device connected to the detector in communication with the detector through software and / or hardware. In practical applications, the image calibration device and the calibration device can be the same device or different devices. Figure 5 As shown, the method may include:

[0112] S501 : Acquire an image to be calibrated collected by the detector at a target angle.

[0113] The target angle is the rack angle at which the rack rotates under the action of the preset rotation control program. The number of target angles for one rotation of the rack and the angle value of each target angle can be determined by the configuration file of the preset rotation control program.

[0114] The image to be calibrated at the target angle is an actual image captured by the detector of the target object on the treatment bed at the corresponding target angle during the rotation of the gantry, and may also be a reference image of the detector at the target angle.

[0115] S502: Determine an actual jitter offset of the target angle according to the target angle and pre-acquired calibrated jitter offsets of the detector at multiple given angles.

[0116] The target angle and the given angle are both rack angles.

[0117] The calibrated jitter offsets of the multiple given angles can be, for example, Figure 1 or Figure 4 The calibrated jitter offset is obtained by any of the detector jitter offset determination methods provided in .

[0118] In actual applications, the target angle may be the same as or different from the given angle, and the number of the target angles may be the same as or different from the given angle. Therefore, in a possible implementation, for each target angle, it can be determined whether there is an identical angle among the multiple given angles. If so, the calibrated jitter offset of the identical given angle is directly determined as the actual jitter offset of the real angle.

[0119] If not, at least one given angle closest to the target angle may be determined, and the actual jitter offset of the target angle may be calculated based on the calibrated jitter offset of the at least one given angle.

[0120] S503: Calibrate the image to be calibrated according to the actual jitter offset.

[0121] For example, the jitter offset of the image to be calibrated may be compensated according to the actual jitter offset, so as to achieve calibration of the image to be calibrated.

[0122] If the image to be calibrated is an actual image captured by the detector, and there are multiple images, which are images captured at multiple target angles, then three-dimensional reconstruction can be performed based on the actual jitter offset of the multiple target angles after compensation to obtain a three-dimensional image. The reconstruction effect of the three-dimensional image can be used to verify the preset geometric calibration parameters of the detector, that is, the reconstruction effect can be used to verify whether the geometric calibration parameters of the detector are correct.

[0123] After acquiring the three-dimensional image, the three-dimensional image can be compared with the target object's computed tomography (CT) image, and the positioning accuracy of the imaging device can be determined based on the comparison result. The smaller the positioning accuracy, the higher the treatment accuracy for the treatment object; conversely, the larger the positioning accuracy, the lower the treatment accuracy for the treatment object, which is difficult to guarantee.

[0124] In the image calibration method provided in this embodiment, when obtaining the image to be calibrated captured by the detector at the target angle, the actual jitter offset of the target angle can be obtained according to the target angle and the calibrated jitter offset of the detector at multiple given angles obtained in advance. Then, according to the actual jitter offset of the target angle, the image to be calibrated is calibrated, thereby achieving compensation for the image offset, improving image quality, and effectively ensuring the positioning accuracy of the radiotherapy equipment.

[0125] Optional, in the above Figure 5 Based on the image calibration method shown, the embodiment of the present application can also provide a possible implementation method for determining the actual jitter offset, which is illustrated as follows. Figure 6 This is a flow chart of a method for determining an actual jitter offset in an image calibration method provided in an embodiment of the present application. Figure 6 As shown, in S502 shown above, determining the actual jitter offset of the target angle according to the target angle and the pre-acquired calibrated jitter offsets of the detector at multiple given angles may include:

[0126] S601. Determine a target given angle interval in which a target angle is located according to multiple given angles.

[0127] Among the multiple given angles, every two adjacent given angles constitute a given angle interval. For N given angles, there are N-1 given angle intervals.

[0128] In a possible implementation, if the multiple given angles are non-uniformly distributed given angles, the target angle can be compared with the multiple given angles to determine that the given angle interval covered by the two given angles closest to the target angle is the target given angle interval.

[0129] In another possible implementation, if the multiple given angles are uniformly distributed given angles, the target given angle interval in which the target angle is located can be determined according to a preset angle interval.

[0130] S602: Determine an actual jitter offset of the target angle according to the target angle and the calibrated jitter offsets of two boundary angles of the target given angle interval.

[0131] For example, the angle difference between the target angle and any one of the two boundary angles can be determined respectively, and the position of the target angle in the target given angle interval can be determined based on the angle difference and the angle difference of the target given angle interval. Then, the actual jitter offset of the target angle can be determined based on the position and the calibrated jitter offsets of the two boundary angles.

[0132] The method provided in this embodiment can determine the target given angle interval in which the target angle is located, and determine the actual jitter offset of the target angle according to the calibrated jitter offsets of the two boundary angles of the target given angle interval. This can improve the efficiency of determining the actual jitter offset while ensuring the accuracy of the actual jitter offset of the target angle.

[0133] In some possible implementations, if the multiple given angles are uniformly distributed given angles, that is, among the multiple given angles, the angle difference between two adjacent given angles is a preset angle interval, then the embodiment of the present application also provides an implementation example for determining the target given angle interval. Figure 7 This is a flow chart of a method for determining a given angle interval of a target in an image calibration method provided in an embodiment of the present application. Figure 7 As shown, in S601 shown above, determining the target given angle interval where the target angle is located according to the multiple given angles may include:

[0134] S701. Perform a division and rounding operation on the target angle according to a preset angle interval to obtain a target interval index corresponding to the target angle.

[0135] For example, the target angle may be divided and rounded using the following formula (3) to obtain the target interval index.

[0136] index=int(RealAngle / A)…………Formula (3)

[0137] Wherein, index may represent the target interval index, RealAngle represents the target angle, and A represents the preset angle interval, such as 30°.

[0138] Taking 30° as an example, the given angles of one rotation of the rack may be, for example, 0°, 30°, 60°, 90°, 120°, 150°, 180°, 210°, 240°, 270°, 300°, 330°, and 360°.

[0139] Among them, every two adjacent given angles can constitute a given angle interval. Therefore, the multiple given angles can constitute 11 given angle intervals, which are: 0°~30°, 30°~60°, 60°~90°, 90°~120°, 120°~150°, 150°~180°, 180°~210°, 210°~240°, 240°~270°, 270°~300°, 300°~330°, 330°~360°.

[0140] Among them, the interval index of 0°~30° is index=0, the interval index of 30°~60° is index=1, ..., the interval index of 300°~330° is index=10, and the interval index of 330°~360° is index=11.

[0141] S702: According to the target interval index, from the correspondence between the preset interval index and the given angle interval, determine that the given angle interval corresponding to the target interval index is the target given angle interval.

[0142] For N given angles, there are N-1 given angle intervals, and the corresponding relationship includes given angle intervals corresponding to N-1 interval indices, wherein the given angle interval corresponding to each interval index is an angle interval formed by two adjacent given angles.

[0143] For example, if the target angle is 50°, by calculating according to formula (3), it can be obtained that the target interval index is 1, and it can be determined that the target given angle interval is the given angle interval corresponding to the target interval index 1, that is, 30° to 60°.

[0144] In the method provided in this embodiment, the target angle can be divided and rounded according to the preset angle interval to obtain the target interval index corresponding to the target angle, and the given angle interval corresponding to the target interval index is determined as the target given angle interval, which can improve the efficiency of determining the target given angle interval, thereby effectively improving the efficiency of determining the actual jitter offset.

[0145] In the above Figure 7 Based on what is shown, the embodiment of the present application may also provide a possible implementation method for determining the actual jitter offset. Figure 8 This is another flow chart of a method for determining an actual jitter offset in an image calibration method provided in an embodiment of the present application. Figure 8 As shown, determining the actual jitter offset of the target angle according to the target angle and the calibrated jitter offsets of the two boundary angles of the target given angle interval in the above S602 may include:

[0146] S801. Determine a proportional factor of the target angle in the target given angle interval according to the target angle and the two boundary angles.

[0147] The scale factor may be used to indicate how close the target angle is to the two boundary angles.

[0148] For example, the angle difference between the target angle and any boundary angle of the two boundary angles may be determined, and the proportional factor may be determined according to the angle difference and the angle difference of the target given angle interval.

[0149] Fig. 9This is a schematic diagram of the target angle provided in the embodiment of the present application within the target given angle range. Fig. 9 As shown, the two boundary angles of the target given angle interval are Angle1 and Angle2, and the target angle is RealAngle. The angle difference between the two boundary angles is L, and the angle difference between the target angle and Angle1 is L'. Among them, the angle of Angle1 is smaller than the angle of Angle2.

[0150] For example, the proportional factor can be calculated using the following method (4).

[0151]

[0152] S802: Determine the actual jitter offset according to the scale factor and the calibrated jitter offsets of the two boundary angles.

[0153] The calibrated jitter offsets of each given angle obtained in advance may be calibrated jitter offsets of each given angle in two preset coordinate directions in a preset radiotherapy coordinate system. The preset radiotherapy coordinate system may be, for example, an IEC coordinate system, and the two preset coordinate directions may be, for example, an X-coordinate direction and a Y-coordinate direction of the preset radiotherapy coordinate system. The Y-coordinate direction is the direction in which the treatment bed moves toward the radiotherapy device, and the X-coordinate direction is perpendicular to the Y-coordinate direction and is a coordinate direction on a preset horizontal plane.

[0154] The multiple given angles may be, for example, Angle0 to AngleN, where Angle i It can represent the i-th given angle, i = 0, 1..., any integer in N-1. i The calibrated jitter offset can be expressed as (U i ,V i ), where U i Angle i The calibrated jitter offset in the X-coordinate direction, V i Angle i The nominal jitter offset in the Y coordinate direction.

[0155] With reference to the accompanying drawings, examples are explained. Fig.10 A diagram showing the corresponding relationship between the jitter offset and the angle in a coordinate direction provided by an embodiment of the present application. Fig.10 It can be known that the jitter offset of Angle1 in the X-coordinate direction may be U1, the jitter offset of Angle2 in the X-coordinate direction may be U2, and the jitter offset of the target angle RealAngle in the X-coordinate direction may be U.

[0156] Based on the above Fig. 9It can be seen that the angle difference between the given angle interval of Angle1 and Angle2 is L=Angle2-Angle1, and the angle difference between RealAngle and the previous given angle, that is, Angle1, is L'=RealAngle-Angle1. Therefore, based on Fig.10 The trigonometric relationship shown in the figure gives the following formula (5).

[0157]

[0158] By transforming formula (5), the following formula (6) can be obtained.

[0159] U=U1+Scale*(U2-U1)......Formula (6)

[0160] Combining the above (5) with the equation (6) can give the following equation (7).

[0161]

[0162] Thus, by solving formula (7), the actual jitter offset U of RealAngle in the X coordinate direction can be obtained.

[0163] Similarly, the actual jitter offset V of RealAngle in the Y coordinate direction can be obtained by using the following formula (8).

[0164]

[0165] In the method provided in this embodiment, the scale factor of the target angle in the target given angle range can be determined; the actual jitter offset can be determined based on the scale factor and the calibrated jitter offsets of the two boundary angles, which can effectively ensure that the actual jitter offset of the target angle determined is more accurate, thereby ensuring the image calibration quality and improving the positioning accuracy.

[0166] In some other possible implementations, before determining the actual jitter offset of the target angle according to the target angle and the pre-acquired calibrated jitter offsets of the detector at multiple given angles in S502 as shown above, the method may further include:

[0167] According to the current rack mode of the detector when acquiring the image to be calibrated, the calibration jitter offsets of multiple given angles in the current rack mode are determined from the calibration jitter offsets of multiple given angles in at least one rack mode.

[0168] The position of the detector will change in different rack modes. Therefore, during the calibration process, the above process of obtaining the calibration jitter offset can be performed for each rack mode to obtain the calibration jitter offsets of multiple given angles in each rack mode.

[0169] In a specific application, it is necessary to first find the calibrated jitter offsets of multiple given angles in the current rack mode according to the current rack mode. The at least one rack mode includes at least one of the following: full-field mode, half-field mode, and real-time mode.

[0170] Accordingly, in the above S502, determining the actual jitter offset of the target angle according to the target angle and the pre-acquired calibrated jitter offsets of the detector at multiple given angles may include:

[0171] According to the target angle and the calibrated jitter offsets of the plurality of given angles in the current rack mode, an actual jitter offset of the target angle is determined.

[0172] Based on the calibrated jitter offsets of the multiple given angles in the current rack mode, the accuracy of the actual jitter offsets of the determined target angles can be effectively guaranteed, making the compensation based on the actual jitter offsets more accurate, improving the image calibration quality, and improving the positioning accuracy.

[0173] The following describes the apparatus, device, storage medium, etc. used to execute the detector jitter offset determination method and image calibration method provided in the present application. The specific implementation process and technical effects are as mentioned above and will not be repeated below.

[0174] Fig.11 A schematic diagram of a detector jitter offset determination device provided in an embodiment of the present application is shown in FIG. Fig.11 As shown, the detector jitter offset determination device 1100 may include:

[0175] The first acquisition module 1101 is used to acquire a plurality of phantom projection images at given angles, wherein the phantom projection images at given angles are images acquired by the detector when the calibration phantom is at a mechanical isocenter position and the rack angle is the given angle.

[0176] The coordinate recognition module 1102 is used to perform coordinate recognition on a preset reference position on the calibration phantom in the phantom projection image to obtain the calibration coordinate of the given angle.

[0177] The first determination module 1103 is used to determine the calibration jitter offset of the detector at the given angle according to the calibration coordinates of the given angle and the reference coordinates corresponding to the preset reference position.

[0178] Optionally, the preset reference position in the calibration phantom has a preset reference object.

[0179] The coordinate recognition module 1102 is specifically used to perform coordinate recognition on the preset reference object in the phantom projection image to obtain the calibration coordinates of the given angle.

[0180] Optionally, the coordinate identification module 1102 is specifically used to use a preset image processing algorithm to perform coordinate identification on the preset reference object in the phantom projection image to obtain the calibrated coordinates of the given angle; or, in response to a selection operation on the preset reference object on the phantom projection image, perform coordinate identification on the action position of the selection operation in the phantom projection image to obtain the calibrated coordinates of the given angle.

[0181] Optionally, the first determination module 1103 is specifically configured to calculate a calibrated jitter offset of the detector at the given angle according to the calibrated coordinates of the given angle, the reference coordinates corresponding to the preset reference position, and the resolution of the detector.

[0182] Optionally, the first acquisition module 1101 is specifically configured to acquire a plurality of phantom projection images at the given angle in at least one gantry mode.

[0183] The coordinate recognition module 1102 is specifically used to perform coordinate recognition on a preset reference position on the calibration phantom in the phantom projection image of the given angle in each gantry mode to obtain the calibration coordinates of the given angle in each gantry mode.

[0184] The first determination module 1103 is specifically configured to determine a calibrated jitter offset of the detector at the given angle in each rack mode according to the calibrated coordinates of the given angle in each rack mode and the reference coordinates corresponding to the preset reference position.

[0185] Optionally, at least one rack mode includes at least one of the following: full-wild mode, half-wild mode, and real-time mode.

[0186] The above-mentioned device is used to execute the detector jitter offset determination method provided in the above-mentioned embodiment. Its implementation principle and technical effect are similar and will not be described in detail here.

[0187] Fig.12 A schematic diagram of an image calibration device provided in an embodiment of the present application is shown in FIG. Fig.12 As shown, the image calibration device 1200 may include:

[0188] The second acquisition module 1201 is used to acquire the image to be calibrated collected by the detector at a target angle.

[0189] The second determination module 1202 is used to determine the actual jitter offset of the target angle according to the target angle and the calibrated jitter offset of the detector at multiple given angles obtained in advance; wherein the target angle and the given angle are both rack angles; wherein the calibrated jitter offset is a calibrated jitter offset obtained by any method.

[0190] The calibration module 1203 is used to calibrate the image to be calibrated according to the actual jitter offset.

[0191] Optionally, the second determination module 1202 is specifically used to determine the target given angle interval in which the target angle is located based on the multiple given angles; and determine the actual jitter offset based on the calibrated jitter offsets of the target angle and two boundary angles of the target given angle interval.

[0192] Optionally, among multiple given angles, the angle difference between two adjacent given angles is a preset angle interval; the second determination module 1202 is specifically used to perform division and integer operation on the target angle according to the preset angle interval to obtain a target interval index corresponding to the target angle; according to the target interval index, from the correspondence between the preset interval index and the given angle interval, determine that the given angle interval corresponding to the target interval index is the target given angle interval.

[0193] Optionally, the second determination module 1202 is specifically configured to determine a proportional factor of the target angle in a given target angle interval according to the target angle and two boundary angles; and determine an actual jitter offset according to the proportional factor and calibrated jitter offsets of the two boundary angles.

[0194] Optionally, the second determination module 1202 is further configured to determine, according to a current rack mode of the detector when acquiring the image to be calibrated, calibration jitter offsets at multiple given angles in the current rack mode from calibration jitter offsets at multiple given angles in at least one rack mode.

[0195] The second determination module 1202 is specifically configured to determine an actual jitter offset of the target angle according to the target angle and calibrated jitter offsets of a plurality of given angles in the current rack mode.

[0196] Optionally, the at least one rack mode includes at least one of the following rack modes: full-wild mode, half-wild mode, and real-time mode.

[0197] The above-mentioned device is used to execute the image calibration method provided by the above-mentioned embodiment. Its implementation principle and technical effect are similar and will not be described in detail here.

[0198] The above modules may be one or more integrated circuits configured to implement the above methods, such as one or more application specific integrated circuits (ASIC), or one or more digital singnal processors (DSP), or one or more field programmable gate arrays (FPGA). For another example, when a module is implemented in the form of a processing element scheduling program code, the processing element may be a general-purpose processor, such as a central processing unit (CPU) or other processor that can call program code. For another example, these modules may be integrated together and implemented in the form of a system-on-a-chip (SOC).

[0199] Fig.13 A schematic diagram of a computer device provided in an embodiment of the present application. The computer device may be integrated into a device or a chip of the device. The computer device may be a device with computing and processing functions. It may be a detector jitter offset determination device or an image calibration device.

[0200] The computer device 1300 includes: a memory 1301 and a processor 1302. The memory 1301 and the processor 1302 are connected via a bus.

[0201] The memory 1301 is used to store programs, and the processor 1302 calls the programs stored in the memory 1301 to execute the above method embodiment. The specific implementation method and technical effect are similar and will not be repeated here.

[0202] If the computer device is a detector jitter offset determination device, the processor 1302 may call the program stored in the memory 1301 to execute the above-mentioned detector jitter offset determination method embodiment; if the computer device is an image calibration device, the processor 1302 may call the program stored in the memory 1301 to execute the above-mentioned image calibration device embodiment.

[0203] Optionally, the present invention also provides a program product, such as a computer-readable storage medium, which may be a non-volatile storage medium, which may include a program, which is used to execute the above method embodiment when executed by a processor.

[0204] In the several embodiments provided by the present invention, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are only schematic. For example, the division of the units is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0205] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0206] In addition, each functional unit in each embodiment of the present invention may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of hardware plus software functional units.

[0207] The above-mentioned integrated unit implemented in the form of a software functional unit can be stored in a computer-readable storage medium. The above-mentioned software functional unit is stored in a storage medium, including a number of instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) or a processor (English: processor) to perform some steps of the method described in each embodiment of the present invention. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (English: Read-Only Memory, abbreviated: ROM), random access memory (English: Random Access Memory, abbreviated: RAM), disk or optical disk and other media that can store program codes.

[0208] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any technician familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

Claims

1. A method for determining a detector jitter offset, characterized in that: include: Acquire a plurality of phantom projection images at given angles, wherein the phantom projection images at given angles are images acquired by the detector when the calibration phantom is at a mechanical isocenter position and the rack angle is the given angle; Performing coordinate recognition on a preset reference position on the calibration phantom in the phantom projection image to obtain the calibration coordinates of the given angle; According to the calibrated coordinates of the given angle and the reference coordinates corresponding to the preset reference position, the calibrated jitter offset of the detector at the given angle is determined; wherein the reference coordinates corresponding to the preset reference position are the coordinates of the preset reference position when the frame is not rotated, and the jitter offsets at multiple given angles are used to determine the actual jitter offsets of the detector at the target angle, and the jitter offset of the image to be corrected collected by the detector at the target angle is compensated according to the actual jitter offset, so as to calibrate the image to be corrected.

2. The method according to claim 1, characterized in that The preset reference position in the calibration phantom has a preset reference object; the coordinate recognition of the preset reference position on the calibration phantom in the phantom projection image to obtain the calibration coordinate of the given angle includes: The preset reference object in the phantom projection image is subjected to coordinate recognition to obtain the calibration coordinate of the given angle.

3. The method according to claim 2, characterized in that The step of performing coordinate recognition on the preset reference object in the phantom projection image to obtain the calibration coordinates of the given angle includes: Using a preset image processing algorithm to perform coordinate recognition on the preset reference object in the phantom projection image to obtain the calibration coordinates of the given angle; or, In response to a selection operation on the preset reference object on the phantom projection image, coordinate recognition is performed on an action position of the selection operation in the phantom projection image to obtain a calibration coordinate of the given angle.

4. The method according to claim 1, characterized in that: Determining the calibration jitter offset of the detector at the given angle according to the calibration coordinates at the given angle and the reference coordinates corresponding to the preset reference position includes: The calibrated jitter offset of the detector at the given angle is calculated according to the calibrated coordinates at the given angle, the reference coordinates corresponding to the preset reference position, and the resolution of the detector.

5. The method according to any one of claims 1 to 4, characterized in that: The step of acquiring a plurality of phantom projection images at given angles comprises: In at least one gantry mode, acquiring a plurality of phantom projection images at the given angles; The step of performing coordinate recognition on a preset reference position on the calibration phantom in the phantom projection image to obtain the calibration coordinates of the given angle includes: Performing coordinate recognition on a preset reference position on the calibration phantom in the phantom projection image at the given angle in each gantry mode to obtain the calibration coordinates of the given angle in each gantry mode; Determining the calibration jitter offset of the detector at the given angle according to the calibration coordinates at the given angle and the reference coordinates corresponding to the preset reference position includes: According to the calibration coordinates of the given angle in each rack mode and the reference coordinates corresponding to the preset reference position, the calibration jitter offset of the detector at the given angle in each rack mode is determined.

6. The method according to claim 5, characterized in that The at least one rack mode includes at least one of the following: full-wild mode, half-wild mode, and real-time mode.

7. An image calibration method, characterized in that: include: Acquire the image to be calibrated collected by the detector at the target angle; According to the target angle and the pre-acquired calibrated jitter offsets of the detector at multiple given angles, the actual jitter offset of the target angle is determined; wherein the target angle and the given angle are both rack angles; wherein the calibrated jitter offset is a calibrated jitter offset obtained by any of the methods in claims 1 to 6 above; The jitter offset of the image to be calibrated collected by the detector at the target angle is compensated according to the actual jitter offset, so as to calibrate the image to be calibrated.

8. The method according to claim 7, characterized in that Determining the actual jitter offset of the target angle according to the target angle and the pre-acquired calibrated jitter offset of the detector at multiple given angles includes: Determine, according to the plurality of given angles, a target given angle interval in which the target angle is located; The actual jitter offset is determined according to the target angle and the calibrated jitter offsets of two boundary angles of the target given angle interval.

9. The method according to claim 8, characterized in that Among the multiple given angles, the angle difference between two adjacent given angles is a preset angle interval; and determining the target given angle interval where the target angle is located according to the multiple given angles includes: According to the preset angle interval, performing a division and rounding operation on the target angle to obtain a target interval index corresponding to the target angle; According to the target interval index, from the correspondence between the preset interval index and the given angle interval, the given angle interval corresponding to the target interval index is determined as the target given angle interval.

10. The method according to claim 8, characterized in that The determining the actual jitter offset according to the target angle and the calibrated jitter offset of two boundary angles of the target given angle interval includes: Determining a proportional factor of the target angle in the target given angle interval according to the target angle and the two boundary angles; The actual jitter offset is determined according to the scale factor and the calibrated jitter offsets of the two boundary angles.

11. The method according to any one of claims 7 to 10, characterized in that: Before determining the actual jitter offset of the target angle according to the target angle and the pre-acquired calibrated jitter offsets of the detector at multiple given angles, the method further includes: Determining, according to a current gantry mode of the detector when acquiring the image to be calibrated, calibration jitter offsets of the multiple given angles in at least one gantry mode; Determining the actual jitter offset of the target angle according to the target angle and the pre-acquired calibrated jitter offset of the detector at multiple given angles includes: The actual jitter offset of the target angle is determined according to the target angle and the calibrated jitter offsets of the multiple given angles in the current rack mode.

12. A detector jitter offset determination device, characterized in that: include: A memory and a processor, wherein the memory stores a computer program executable by the processor, and when the processor executes the computer program, the method for determining the detector jitter offset according to any one of claims 1 to 6 is implemented.

13. An image calibration device, characterized in that: include: A memory and a processor, wherein the memory stores a computer program executable by the processor, and the processor implements the image calibration method described in any one of claims 7 to 11 when executing the computer program.

14. A detector jitter offset determination system, characterized in that: include: Rotating carrier; A ball tube is arranged on a rotating carrier; A phantom with a marker at the center, the center of the marker is located at the intersection of the imaging center axis of the tube and the rotation axis, and the imaging center axis of the tube is perpendicular to the detector; A detector is arranged on the rotating carrier opposite to the tube, receives the imaging beam emitted by the tube after passing through the phantom, and generates a projection image of the phantom; The processor acquires the phantom projection image and executes the detector jitter offset determination method described in any one of claims 1 to 6.

15. A non-volatile storage medium, characterized in that: The storage medium stores a computer program, and when the computer program is read and executed, the method for determining the detector jitter offset described in any one of claims 1 to 6, or the image calibration method described in any one of claims 7 to 11 is implemented.

Images