双位校正非球面检验

By employing a dual-position correction method for aspherical mirror testing, which utilizes conjugate points and lens groups to correct spherical aberration in aspherical mirrors, the problem of testing large-aperture and large relative-aperture aspherical mirrors has been solved, achieving high-precision testing results.

CN115541190BActive Publication Date: 2026-07-17SHANGHAI INSTITUTE OF TECHNICAL PHYSICS CHINESE ACADEMY OF SCIENCES
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
SHANGHAI INSTITUTE OF TECHNICAL PHYSICS CHINESE ACADEMY OF SCIENCES
Filing Date
2022-10-09
Publication Date
2026-07-17

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Abstract

本发明公开了一种双位校正非球面检验。待检非球面有两个不消球差互为物像关系的前共轭点和后共轭点，检测原理为由有限远或无限远发出的光线，经校正透镜会聚到待检非球面的一个前共轭物点或后共轭物点，再经待检非球面反射会聚到另一个后共轭像点或前共轭像点，后经内自准校正透镜自准原路返回。前后双位校正非球面检验中的非球面球差分别由前共轭点和后共轭点承担，由校正透镜和内自准校正透镜进行校正补偿。前后共轭点将光轴分成相关的三个区间，补偿透镜布局灵活，且光线两次通过待检非球面，像差校正能力更显著。双位校正非球面检验可实现大口径、大相对孔径甚至超大口径、超大相对孔径的的非球面检验。
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