Signal processing system and microelectromechanical acceleration measurement device

Abstract

This invention provides a signal processing system and a microelectromechanical acceleration measurement device. The system includes: an ADC interface module, a filtering test module, a filter module, a gain adjustment module, a temperature compensation test module, a temperature compensation module, a register module, and an input / output interface module. The input terminal of the ADC interface module is connected to the output terminal of the accelerometer. The output terminal of the ADC interface module is connected to the input terminal of the filter module through the filtering test module. The output terminal of the filter module is connected to the input terminal of the gain adjustment module. The output terminal of the gain adjustment module is connected to the input terminal of the temperature compensation module through the temperature compensation test module. The output terminal of the temperature compensation module is connected to the register module. The output terminal of the register module outputs a signal through the input / output interface module. This invention can detect and process acceleration signals in three directions, reduce the power consumption of the signal processing system, and reduce the size of the signal processing system.

Description

Technical Field

[0001] This invention relates to the field of signal processing technology, and in particular to a signal processing system and a microelectromechanical acceleration measurement device. Background Technology

[0002] Micro-Electro-Mechanical System (MEMS) accelerometers have advantages such as large range, small size, low power consumption, light weight and low cost. Furthermore, MEMS accelerometers are easy to mass-produce, and therefore, they are widely used in many fields such as precision navigation, automotive electronics, and consumer electronics.

[0003] As various devices continue to evolve towards miniaturization, higher requirements are placed on the integration of triaxial MEMS accelerometers, evolving from three single-axis MEMS accelerometers to a single-chip triaxial accelerometer. However, the signal processing of existing accelerometers is still based on single-axis acceleration signals, resulting in high power consumption and a large system size. There is an urgent need to realize the detection and processing of acceleration signals in three directions on a single chip. Summary of the Invention

[0004] This invention provides a signal processing system and a microelectromechanical acceleration measurement device to solve the problems of high power consumption and large size of single-chip triaxial accelerometer signal detection and processing systems.

[0005] In a first aspect, embodiments of the present invention provide a signal processing system for processing acceleration signals from a single-chip triaxial accelerometer. The signal processing system includes an ADC interface module, a filtering test module, a filter module, a gain adjustment module, a temperature compensation test module, a temperature compensation module, a register module, and an input / output interface module.

[0006] The input terminal of the ADC interface module is used to connect to the output terminal of the single-chip triaxial accelerometer to receive the three acceleration signals output by the single-chip triaxial accelerometer; the output terminal of the ADC interface module is connected to the input terminal of the filter module through the filter test module. The ADC interface module is used to adjust the received acceleration signals to obtain three first-processed signals, and then transmit them to the filter module through the filter test module.

[0007] The output of the filter module is connected to the input of the gain adjustment module. The filter module is used to filter the received first processing signals to obtain three second processing signals, and then transmit the three second processing signals to the gain adjustment module.

[0008] The output of the gain adjustment module is connected to the input of the temperature compensation module through the temperature compensation test module. The gain adjustment module is used to perform gain processing on the received second processing signals to obtain three third processing signals, which are then transmitted to the temperature compensation module through the temperature compensation test module.

[0009] The output of the temperature compensation module is connected to the input of the register module. The temperature compensation module is used to perform temperature compensation on each of the received third processing signals in sequence to obtain three fourth processing signals, and then transmit the three fourth processing signals to the register module.

[0010] The output of the register module is connected to the input of the input / output interface module, and is used to output the received three fourth processing signals through the input / output interface module;

[0011] The input terminal of the register module is also connected to the output terminal of the input / output interface to receive control signals transmitted from the outside through the input / output interface module; the output terminal of the register module is also connected to the input terminal of the ADC interface module, the input terminal of the filter test module, the input terminal of the filter module, the input terminal of the gain adjustment module, the input terminal of the temperature compensation test module, and the input terminal of the temperature compensation module, respectively, to transmit the corresponding control signals.

[0012] In one possible implementation, the ADC interface module includes an X-axis ADC interface unit, a Y-axis ADC interface unit, and a Z-axis ADC interface unit.

[0013] The input terminal of the X-axis ADC interface unit is connected to the output terminal of the X-axis acceleration module of the single-chip triaxial accelerometer to receive the X-axis acceleration signal output by the X-axis acceleration module; the input terminal of the X-axis ADC interface unit is connected to the output terminal of the register module to receive the first interface control signal sent by the register module; the output terminal of the X-axis ADC interface unit is connected to the input terminal of the filter module through the filter test module. The X-axis ADC interface unit is used to adjust the X-axis acceleration signal to obtain the first X-axis processed signal, and transmits it to the filter module through the filter test module.

[0014] The input terminal of the Y-axis ADC interface unit is connected to the output terminal of the Y-axis acceleration module of the single-chip triaxial accelerometer to receive the Y-axis acceleration signal output by the Y-axis acceleration module; the input terminal of the Y-axis ADC interface unit is connected to the output terminal of the register module to receive the second interface control signal sent by the register module; the output terminal of the Y-axis ADC interface unit is connected to the input terminal of the filter module through the filter test module. The Y-axis ADC interface unit is used to adjust the Y-axis acceleration signal to obtain the first Y-axis processed signal, and transmits it to the filter module through the filter test module.

[0015] The input terminal of the Z-axis ADC interface unit is connected to the output terminal of the Z-axis acceleration module of the single-chip triaxial accelerometer to receive the Z-axis acceleration signal output by the Z-axis acceleration module; the input terminal of the Z-axis ADC interface unit is connected to the output terminal of the register module to receive the third interface control signal sent by the register module; the output terminal of the Z-axis ADC interface unit is connected to the input terminal of the filter module through the filter test module. The Z-axis ADC interface unit is used to adjust the Z-axis acceleration signal to obtain the first Z-axis processed signal, and transmits it to the filter module through the filter test module.

[0016] In one possible implementation, any one of the X-axis ADC interface units, Y-axis ADC interface units, and Z-axis ADC interface units includes a signal conversion element, a CDS adjustment element, a first selector, a chopper adjustment element, a second selector, a zero-position adjustment element, and a gain adjustment element.

[0017] The input terminal of the signal conversion element is used to connect to the output terminal corresponding to the single-chip triaxial accelerometer; the output terminal of the signal conversion element is connected to the input terminal of the CDS adjustment element and the input terminal of the first selector, respectively.

[0018] The CDS regulating element is also connected to the output of the register module; the output of the CDS regulating element is connected to the input of the first selector.

[0019] The input of the first selector is also connected to the output of the register module; the output of the first selector is connected to the input of the chopper adjustment element and the input of the second selector, respectively.

[0020] The input terminal of the chopper adjustment element is also connected to the output terminal of the register module; the output terminal of the chopper adjustment element is connected to the input terminal of the second selector.

[0021] The input of the second selector is also connected to the output of the register module; the output of the second selector is connected to the input of the zero-position adjustment element.

[0022] The input terminal of the zero-position adjustment element is also connected to the output terminal of the register module; the output terminal of the zero-position adjustment element is connected to the input terminal of the gain adjustment element.

[0023] The input of the gain adjustment element is also connected to the output of the register module; the output of the gain adjustment element serves as the output of the X-axis ADC interface unit, Y-axis ADC interface unit, or Z-axis ADC interface unit.

[0024] In one possible implementation, the filtering test module includes an X-axis filtering test unit, a Y-axis filtering test unit, and a Z-axis filtering test unit.

[0025] The input of the X-axis filtering test unit is connected to the output of the X-axis ADC interface unit to receive the first X-axis processing signal; the input of the X-axis filtering test unit is connected to the output of the register module to configure the X-axis filtering test unit according to the first test control signal transmitted by the register module; the output of the X-axis filtering test unit is connected to the input of the filter module to transmit the first X-axis processing signal to the filter module.

[0026] The input of the Y-axis filtering test unit is connected to the output of the Y-axis ADC interface unit to receive the first Y-axis processing signal; the input of the Y-axis filtering test unit is connected to the output of the register module to configure the Y-axis filtering test unit according to the second test control signal transmitted by the register module; the output of the Y-axis filtering test unit is connected to the input of the filter module to transmit the first Y-axis processing signal to the filter module.

[0027] The input of the Z-axis filtering test unit is connected to the output of the Z-axis ADC interface unit to receive the first Z-axis processing signal; the input of the Z-axis filtering test unit is connected to the output of the register module to configure the Z-axis filtering test unit according to the third test control signal transmitted by the register module; the output of the Z-axis filtering test unit is connected to the input of the filter module to transmit the first Z-axis processing signal to the filter module.

[0028] In one possible implementation, each of the X-axis filtering test unit, Y-axis filtering test unit, and Z-axis filtering test unit includes a signal selection element and a random signal generation element.

[0029] The input terminal of the random signal generation element is connected to the output terminal of the register module; the output terminal of the random signal generation element is connected to the input terminal of the signal selection element.

[0030] The input terminal of the signal selection element is connected to the output terminal of the register module; the input terminal of the signal selection element is connected to the corresponding output terminal of the ADC interface module; the output terminal of the signal selection element serves as the output terminal of the X-axis filtering test unit, Y-axis filtering test unit, or Z-axis filtering test unit.

[0031] In one possible implementation, the filter module includes an X-axis filter unit, a Y-axis filter unit, and a Z-axis filter unit;

[0032] The input terminal of the X-axis filter unit is connected to the output terminal of the X-axis filter test unit to receive the first X-axis processed signal; the input terminal of the X-axis filter unit is connected to the register module to receive the first filter control signal transmitted by the register module; the output terminal of the X-axis filter unit is connected to the input terminal of the gain adjustment module. The X-axis filter unit is used to filter the first X-axis processed signal according to the first filter control signal to obtain the second X-axis processed signal, and then transmit the second X-axis processed signal to the gain adjustment module.

[0033] The input of the Y-axis filter unit is connected to the output of the Y-axis filter test unit to receive the first Y-axis processed signal; the input of the Y-axis filter unit is connected to the register module to receive the second filter control signal transmitted by the register module; the output of the Y-axis filter unit is connected to the input of the gain adjustment module. The Y-axis filter unit is used to filter the first Y-axis processed signal according to the second filter control signal to obtain the second Y-axis processed signal, and then transmits the second Y-axis processed signal to the gain adjustment module.

[0034] The input of the Z-axis filter unit is connected to the output of the Z-axis filter test unit to receive the first Z-axis processed signal; the input of the Z-axis filter unit is connected to the register module to receive the third filter control signal transmitted by the register module; the output of the Z-axis filter unit is connected to the input of the gain adjustment module. The Z-axis filter unit is used to filter the first Z-axis processed signal according to the third filter control signal to obtain the second Z-axis processed signal, and then transmits the second Z-axis processed signal to the gain adjustment module.

[0035] In one possible implementation, each of the X-axis filter unit, Y-axis filter unit, and Z-axis filter unit includes a CIC filter element, an IIR filter element, a third selector, and an output rate adjustment element.

[0036] The input terminal of the CIC filter element is connected to the corresponding output terminal of the filter test module; the input terminal of the CIC filter element is connected to the output terminal of the register module; the output terminal of the CIC filter element is connected to the input terminal of the IIR filter element and the input terminal of the third selector, respectively.

[0037] The input of the IIR filter is also connected to the output of the register module; the output of the IIR filter element is connected to the input of the third selector.

[0038] The input of the third selector is also connected to the output of the register module; the output of the third selector is connected to the input of the output rate adjustment element.

[0039] The input terminal of the output rate adjustment element is also connected to the output terminal of the register module; the output terminal of the output rate adjustment element serves as the output terminal of the X-axis filter unit, Y-axis filter unit, or Z-axis filter unit.

[0040] In one possible implementation, the gain adjustment module includes an X-axis gain adjustment unit, a Y-axis gain adjustment unit, and a Z-axis gain adjustment unit;

[0041] The input of the X-axis gain adjustment unit is connected to the X-axis filter unit to receive the second X-axis processing signal; the input of the X-axis gain adjustment unit is connected to the output of the register module to receive the first gain control signal transmitted by the register module; the output of the X-axis gain adjustment unit is connected to the input of the temperature compensation module through the temperature compensation test module. The X-axis gain adjustment unit is used to perform gain processing on the second X-axis processing signal according to the first gain control signal, obtain the third X-axis processing signal, and then transmit it to the temperature compensation module through the temperature compensation test module.

[0042] The input of the Y-axis gain adjustment unit is connected to the Y-axis filter unit to receive the second Y-axis processing signal; the input of the Y-axis gain adjustment unit is connected to the output of the register module to receive the second gain control signal transmitted by the register module; the output of the Y-axis gain adjustment unit is connected to the input of the temperature compensation module through the temperature compensation test module. The Y-axis gain adjustment unit is used to perform gain processing on the second Y-axis processing signal according to the second gain control signal, and after obtaining the third Y-axis processing signal, it is transmitted to the temperature compensation module through the temperature compensation test module.

[0043] The input of the Z-axis gain adjustment unit is connected to the Z-axis filter unit to receive the second Z-axis processing signal; the input of the Z-axis gain adjustment unit is connected to the output of the register module to receive the third gain control signal transmitted by the register module; the output of the Z-axis gain adjustment unit is connected to the input of the temperature compensation module through the temperature compensation test module. The Z-axis gain adjustment unit is used to perform gain processing on the second Z-axis processing signal according to the third gain control signal, and after obtaining the third Z-axis processing signal, it is transmitted to the temperature compensation module through the temperature compensation test module.

[0044] In one possible implementation, the temperature compensation module includes a temperature compensation parameter calculation unit, a temperature compensation data calculation unit, and a temperature compensation control unit;

[0045] The input terminal of the temperature compensation control unit is connected to the output terminal of the register module, and the output terminal of the temperature compensation control unit is connected to the input terminal of the temperature compensation parameter calculation unit.

[0046] The output of the temperature compensation parameter calculation unit is connected to the input of the temperature compensation data calculation unit and the input of the temperature compensation control unit, respectively.

[0047] The input terminal of the temperature compensation data calculation unit is connected to the output terminal of the temperature compensation test module and the output terminal of the temperature compensation control unit, respectively; the output terminal of the temperature compensation data calculation unit is connected to the input terminal of the temperature compensation control unit.

[0048] The output of the temperature compensation control unit is connected to the input of the register module.

[0049] In a second aspect, embodiments of the present invention provide a microelectromechanical acceleration measurement device, including a single-chip triaxial accelerometer and a signal processing system of the first aspect or any possible implementation thereof.

[0050] This invention provides a signal processing system. Under the control of a register module, an ADC interface module adjusts three acceleration signals received from a single-chip triaxial accelerometer to obtain three first processed signals, which are then sent to a filter module via a filtering test module. The filter module filters the three first processed signals to remove out-of-band noise, obtaining three second processed signals, which are then transmitted to a gain adjustment module. The gain adjustment module performs gain processing on the received three second processed signals to obtain three third processed signals, which are then transmitted to a temperature compensation module via a temperature compensation test module. The temperature compensation module performs temperature compensation on each of the three third processed signals to obtain... The three fourth-processed signals are transmitted to the register module; the register module then outputs them outward through the input / output interface module; the three acceleration signals of the single-chip triaxial accelerometer pass sequentially through the ADC interface module, the filtering test module, the filter module, the gain adjustment module, the temperature compensation test module, and the temperature compensation module, which can process the three acceleration signals simultaneously to obtain the three fourth-processed signals. There is no need to set up a separate signal processing system for the acceleration signal of each axis of the accelerometer, which can reduce the size of the accelerometer's signal processing system and reduce the power consumption of the signal processing system, while processing the acceleration signals of the single-chip triaxial accelerometer quickly and accurately. Attached Figure Description

[0051] To more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0052] Figure 1 This is a first structural schematic diagram of the signal processing system provided in an embodiment of the present invention;

[0053] Figure 2This is a schematic diagram of the second structure of the signal processing system provided in an embodiment of the present invention;

[0054] Figure 3 This is a schematic diagram of the structure of the ADC interface unit provided in an embodiment of the present invention;

[0055] Figure 4 This is a schematic diagram of the structure of the filtering test unit provided in an embodiment of the present invention;

[0056] Figure 5 This is a schematic diagram of the first structure of the filter unit provided in an embodiment of the present invention;

[0057] Figure 6 This is a schematic diagram of the second structure of the filter unit provided in an embodiment of the present invention;

[0058] Figure 7 This is a schematic diagram of the structure of a first-order IIR filter element provided in an embodiment of the present invention;

[0059] Figure 8 This is a schematic diagram of the structure of a second-order IIR filter element provided in an embodiment of the present invention;

[0060] Figure 9 This is a schematic diagram of the temperature compensation module provided in an embodiment of the present invention;

[0061] Figure 10 This is a schematic diagram of the input / output interface module provided in an embodiment of the present invention;

[0062] Figure 11 This is a schematic diagram of the microelectromechanical acceleration measurement device provided in an embodiment of the present invention. Detailed Implementation

[0063] In the following description, specific details such as particular system architectures and techniques are set forth for illustrative purposes and not for limitation, in order to provide a thorough understanding of the embodiments of the invention. However, those skilled in the art will understand that the invention can be implemented in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, apparatuses, circuits, and methods are omitted so as not to obscure the description of the invention with unnecessary detail.

[0064] To make the objectives, technical solutions, and advantages of the present invention clearer, specific embodiments will be described below in conjunction with the accompanying drawings.

[0065] Figure 1 A first structural schematic diagram of the signal processing system provided in an embodiment of the present invention is described in detail below:

[0066] The signal processing system is used to process the acceleration signal of a single-chip triaxial accelerometer. The signal processing system includes an ADC interface module 1, a filter test module 2, a filter module 3, a gain adjustment module 4, a temperature compensation test module 5, a temperature compensation module 6, a register module 7, and an input / output interface module 8.

[0067] The input terminal of ADC interface module 1 is used to connect to the output terminal of the single-chip triaxial accelerometer to receive the three acceleration signals output by the single-chip triaxial accelerometer; the output terminal of ADC interface module 1 is connected to the input terminal of filter module 3 through filter test module 2. ADC interface module 1 is used to adjust the received acceleration signals to obtain three first processed signals, and transmit them to filter module 3 through filter test module 2.

[0068] In this embodiment, the ADC interface module 1 is used to receive three acceleration signals output by a single-chip triaxial accelerometer and simultaneously adjust each acceleration signal to obtain three first processed signals. These signals are then transmitted to the filter module 3 through the filter test module 2. This allows the three acceleration signals to be acquired and preliminarily processed, adjusting the acceleration signals to a form that can be processed by subsequent modules.

[0069] The output of filter module 3 is connected to the input of gain adjustment module 4. Filter module 3 is used to filter the received first processing signals to obtain three second processing signals, and then transmit the three second processing signals to gain adjustment module 4.

[0070] In this embodiment, the filter module 3 filters the received first processing signals, which can filter out noise outside the working bandwidth of the single-chip triaxial accelerometer and reduce noise interference.

[0071] The output of the gain adjustment module 4 is connected to the input of the temperature compensation module 6 through the temperature compensation test module 5. The gain adjustment module 4 is used to perform gain processing on the received second processing signals to obtain three third processing signals, which are then transmitted to the temperature compensation module 6 through the temperature compensation test module 5.

[0072] In this embodiment, the gain adjustment module 4 performs gain processing on each of the second processing signals, which can adjust the amplification factor of each of the second processing signals, thereby facilitating further processing by the temperature compensation module.

[0073] The output of temperature compensation module 6 is connected to the input of register module 7. Temperature compensation module 6 is used to perform temperature compensation on each of the received third processing signals in sequence to obtain three fourth processing signals, and then transmit the three fourth processing signals to register module 7.

[0074] In this embodiment, the temperature compensation module 6 performs temperature compensation on each of the third processing signals, which can correct the drift of the zero point and scale factor of the single-chip triaxial accelerometer with temperature, thereby obtaining accurate three signals, namely three fourth processing signals.

[0075] The output of register module 7 is connected to the input of input / output interface module 8, and is used to output the received three fourth processing signals through input / output interface module 8. The input of register module 7 is also connected to the output of input / output interface 8, and is used to receive control signals transmitted from outside through input / output interface module 8. The output of register module 7 is also connected to the input of ADC interface module 1, the input of filter test module 2, the input of filter module 3, the input of gain adjustment module 4, the input of temperature compensation test module 5, and the input of temperature compensation module 6, respectively, and is used to transmit the corresponding control signals.

[0076] In this embodiment, register module 7 receives three fourth processing signals and outputs them; register module 7 also receives external control commands through input / output interface module 8, and sends corresponding control commands to ADC interface module 1, filter test module 2, filter module 3, gain adjustment module 4, temperature compensation test module 5 and temperature compensation module 6 according to the control commands, so that each module can process the received acceleration signal according to the control commands.

[0077] In this embodiment of the invention, under the control of the register module, the ADC interface module adjusts the three acceleration signals received from the single-chip triaxial accelerometer to obtain three first processed signals, which are then sent to the filter module via the filtering test module. The filter module filters the three first processed signals to remove noise, obtaining three second processed signals, which are then transmitted to the gain adjustment module. The gain adjustment module performs gain processing on the received three second processed signals to obtain three third processed signals, which are then transmitted to the temperature compensation module via the temperature compensation test module. The temperature compensation module performs temperature compensation on each of the three third processed signals. The system obtains three fourth-processed signals and transmits them to the register module. The register module then outputs the signals through the input / output interface module. The three acceleration signals from the single-chip triaxial accelerometer pass through the ADC interface module, filter test module, filter module, gain adjustment module, temperature compensation test module, and temperature compensation module in sequence. This allows for simultaneous processing of the three acceleration signals to obtain three fourth-processed signals. This eliminates the need for separate signal processing systems for each axis of the accelerometer, reducing the size of the accelerometer's signal processing system while enabling fast and accurate processing of the acceleration signals from the single-chip triaxial accelerometer.

[0078] See Figure 2The diagram shows the second structure of the signal processing system. The signal processing system is used to process the acceleration signal of the single-chip triaxial accelerometer 9. The single-chip triaxial accelerometer 9 includes an X-axis acceleration module 91, a Y-axis acceleration module 92 and a Z-axis acceleration module 93.

[0079] In one possible implementation, the ADC interface module 1 includes an X-axis ADC interface unit 11, a Y-axis ADC interface unit 12, and a Z-axis ADC interface unit 13.

[0080] The input terminal of the X-axis ADC interface unit 11 is connected to the output terminal of the X-axis acceleration module 91 of the single-chip triaxial accelerometer 9 to receive the X-axis acceleration signal output by the X-axis acceleration module 91; the input terminal of the X-axis ADC interface unit 11 is connected to the output terminal of the register module 7 to receive the first interface control signal sent by the register module 7; the output terminal of the X-axis ADC interface unit 11 is connected to the input terminal of the filter module 3 through the filter test module 2, and the X-axis ADC interface unit 11 is used to adjust the X-axis acceleration signal to obtain the first X-axis processed signal, and transmit it to the filter module 3 through the filter test module 2.

[0081] The input terminal of the Y-axis ADC interface unit 12 is connected to the output terminal of the Y-axis acceleration module 92 of the single-chip triaxial accelerometer 9 to receive the Y-axis acceleration signal output by the Y-axis acceleration module 92; the input terminal of the Y-axis ADC interface unit 12 is connected to the output terminal of the register module 7 to receive the second interface control signal sent by the register module 7; the output terminal of the Y-axis ADC interface unit 12 is connected to the input terminal of the filter module 3 through the filter test module 2, and the Y-axis ADC interface unit 12 is used to adjust the Y-axis acceleration signal to obtain the first Y-axis processed signal, and transmit it to the filter module 3 through the filter test module 2.

[0082] The input terminal of the Z-axis ADC interface unit 13 is connected to the output terminal of the Z-axis acceleration module 93 of the single-chip triaxial accelerometer 9 to receive the Z-axis acceleration signal output by the Z-axis acceleration module 93; the input terminal of the Z-axis ADC interface unit 13 is connected to the output terminal of the register module 7 to receive the third interface control signal sent by the register module 7; the output terminal of the Z-axis ADC interface unit 13 is connected to the input terminal of the filter module 3 through the filter test module 2. The Z-axis ADC interface unit 13 is used to adjust the Z-axis acceleration signal to obtain the first Z-axis processed signal, and transmit it to the filter module 3 through the filter test module 2.

[0083] In this embodiment, the X-axis ADC interface unit 11 is used to receive the X-axis acceleration signal from the X-axis acceleration module 91 of the single-chip triaxial accelerometer 9, and adjust the X-axis acceleration signal to obtain the first X-axis processed signal; the Y-axis ADC interface unit 12 is used to receive the Y-axis acceleration signal from the Y-axis acceleration module 92 of the single-chip triaxial accelerometer 9, and adjust the Y-axis acceleration signal to obtain the first Y-axis processed signal; the Z-axis ADC interface unit 13 is used to receive the Z-axis acceleration signal from the Z-axis acceleration module 93 of the single-chip triaxial accelerometer 9, and adjust the Z-axis acceleration signal to obtain the first Z-axis processed signal; the ADC interface module 1 is actually composed of the X-axis ADC interface unit 11, the Y-axis ADC interface unit 12 and the Z-axis ADC interface unit 13. The ADC interface module 1 can process three acceleration signals simultaneously, and the integration of the X-axis ADC interface unit 11, the Y-axis ADC interface unit 12 and the Z-axis ADC interface unit 13 can reduce the size of the ADC interface module 1.

[0084] In one possible implementation, see Figure 3 The schematic diagram of the ADC interface unit shown shows that any one of the X-axis ADC interface unit 11, Y-axis ADC interface unit 12 and Z-axis ADC interface unit 13 includes a signal conversion element 101, a CDS adjustment element 102, a first selector 103, a chopper adjustment element 104, a second selector 105, a zero-position adjustment element 106 and a gain adjustment element 107.

[0085] The input terminal of the signal conversion element 101 is used to connect to the corresponding output terminal of the single-chip triaxial accelerometer 9; the output terminal of the signal conversion element 101 is connected to the input terminal of the CDS adjustment element 102 and the input terminal of the first selector 103, respectively.

[0086] In this embodiment, the signal conversion element 101 is used to receive the acceleration signal output by the corresponding acceleration module. For example, the signal conversion element of the X-axis ADC interface unit 11 is used to receive the X-axis acceleration signal output by the X-axis acceleration module. The signal conversion element 101 also performs signal format conversion on the received acceleration signal, converting the acceleration signal into a signal format that can be processed by the CDS adjustment element 102 or the first selector 103, for example, using binary two's complement to perform signal format conversion.

[0087] The input terminal of CDS adjustment element 102 is also connected to the output terminal of register module 7; register module 7 transmits corresponding control signals to CDS adjustment element 102 to turn CDS adjustment element 102 on or off, and to configure CDS adjustment element 102 to avoid over-adjustment of acceleration signal, and to reduce system power consumption when CDS adjustment element 102 is not needed; the output terminal of CDS adjustment element 102 is connected to the input terminal of first selector 103; CDS adjustment element 102 reduces noise in signal by subtracting the data of acceleration signal at the current moment from the data of acceleration signal at the previous moment, and can reduce 1 / f noise in low frequency part of signal, 1 / f noise is a low frequency noise whose noise power is inversely proportional to frequency.

[0088] The input terminal of the first selector 103 is also connected to the output terminal of the register module 7; the output terminal of the first selector 103 is connected to the input terminal of the chopper adjustment element 104 and the input terminal of the second selector 105 respectively; the register module 7 transmits a corresponding control signal to the first selector 103, so that the first selector 103 selects the acceleration signal transmitted by the signal conversion element 101 or the acceleration signal transmitted by the CDS adjustment element 102 for further processing.

[0089] The input terminal of the chopper adjustment element 104 is also connected to the output terminal of the register module 7; the register module 7 transmits corresponding control signals to the chopper adjustment element 104 to turn the chopper adjustment element 104 on or off, and to configure the chopper adjustment element 104; the CDS adjustment element 102 and the chopper adjustment element 104 process the acceleration signal simultaneously, which is more effective than using the CDS adjustment element 102 or the chopper adjustment element 104 alone to perform low-frequency noise reduction processing on the acceleration signal. However, in order to avoid over-adjustment of the acceleration signal, the chopper adjustment element 104 can also be turned off, which can also reduce the power consumption of the system when the CDS adjustment element 102 is not needed.

[0090] Specifically, when the corresponding acceleration module has a chopper circuit in the C / V design, the output signal of the X-axis ADC is modulated to a high frequency. At this time, it is necessary to turn on the chopper adjustment element 104 to modulate the output signal back to the baseband before proceeding with subsequent signal processing. Otherwise, it is not necessary to turn on the chopper adjustment element 104 and it can be turned off.

[0091] The output terminal of the chopper adjustment element 104 is connected to the input terminal of the second selector 105; the chopper adjustment element 104 realizes the callback of the chopper output signal by sequentially selecting the data of the current acceleration signal and the opposite number of the data of the next acceleration signal.

[0092] The input terminal of the second selector 105 is also connected to the output terminal of the register module 7; the output terminal of the second selector 105 is connected to the input terminal of the zero-position adjustment element 106. The register module 7 transmits a corresponding control signal to the second selector 105, causing the second selector 105 to select either the acceleration signal transmitted by the first selector 103 or the acceleration signal transmitted by the chopper adjustment element 104 for further processing.

[0093] The input terminal of the zero-position adjustment element 106 is also connected to the output terminal of the register module 7; the register module 7 transmits the corresponding control signal to the zero-position adjustment element 106 to configure the static zero-position value in the zero-position adjustment element 106; the output terminal of the zero-position adjustment element 106 is connected to the input terminal of the gain adjustment element 107, and the zero-position adjustment element 106 subtracts the corresponding static zero-position value of the received acceleration signal. For example, the zero-position adjustment element of the X-axis ADC interface unit 11 will subtract the static zero-position value of the X-axis direction of the received X-axis acceleration signal.

[0094] The input terminal of the gain adjustment element 107 is also connected to the output terminal of the register module 7. The register module 7 transmits the corresponding control signal to the gain adjustment element 107 to configure the sensitivity information of the gain adjustment element 107. The gain adjustment element 107 can adjust the sensitivity of the corresponding acceleration signal according to the sensitivity information transmitted by the register module 7, thereby obtaining the first processing signal of the corresponding axis. For example, the gain adjustment element of the X-axis ADC interface unit 11 will adjust the sensitivity of the received X-axis acceleration signal to obtain the first X-axis processing signal. The output terminal of the gain adjustment element 107 serves as the output terminal of the X-axis ADC interface unit 11, the Y-axis ADC interface unit 12, or the Z-axis ADC interface unit 13.

[0095] In one possible implementation, see Figure 2 The second structural diagram of the signal processing system shown includes a filtering test module 2 comprising an X-axis filtering test unit 21, a Y-axis filtering test unit 22, and a Z-axis filtering test unit 23.

[0096] The input terminal of the X-axis filtering test unit 21 is connected to the output terminal of the X-axis ADC interface unit 11 to receive the first X-axis processing signal; the input terminal of the X-axis filtering test unit 21 is connected to the output terminal of the register module 7 to configure the X-axis filtering test unit 21 according to the first test control signal transmitted by the register module 7; the output terminal of the X-axis filtering test unit 21 is connected to the input terminal of the filter module 3 to transmit the first X-axis processing signal to the filter module 3.

[0097] The input terminal of the Y-axis filtering test unit 22 is connected to the output terminal of the Y-axis ADC interface unit 12 to receive the first Y-axis processing signal; the input terminal of the Y-axis filtering test unit 22 is connected to the output terminal of the register module 7 to configure the Y-axis filtering test unit 22 according to the second test control signal transmitted by the register module 7; the output terminal of the Y-axis filtering test unit 22 is connected to the input terminal of the filter module 3 to transmit the first Y-axis processing signal to the filter module 3.

[0098] The input terminal of the Z-axis filtering test unit 23 is connected to the output terminal of the Z-axis ADC interface unit 13 to receive the first Z-axis processing signal; the input terminal of the Z-axis filtering test unit 23 is connected to the output terminal of the register module 7 to configure the Z-axis filtering test unit 23 according to the third test control signal transmitted by the register module 7; the output terminal of the Z-axis filtering test unit 23 is connected to the input terminal of the filter module 3 to transmit the first Z-axis processing signal to the filter module 3.

[0099] In this embodiment, the X-axis filtering test unit 21 is used to receive the X-axis first processed signal and transmit the X-axis first processed signal to the filter module 3; the Y-axis filtering test unit 22 is used to receive the Y-axis first processed signal and transmit the Y-axis first processed signal to the filter module 3; the Z-axis filtering test unit 23 is used to receive the Z-axis first processed signal and transmit the Z-axis first processed signal to the filter module 3; the filtering test module 2 is actually integrated by the X-axis filtering test unit 21, the Y-axis filtering test unit 22 and the Z-axis filtering test unit 23, which can process three first processed signals at the same time and can also reduce the size of the filtering test module 2.

[0100] In addition, the filter test module 2 is configured according to the corresponding control signal transmitted by the register module 7. When there is significant noise in the final fourth processed signal, it indicates that there is a problem with the configuration of the filter module 3, and the filter module 3 needs to be tested by the filter test module 2. Specifically, the filter test module 2 generates a corresponding filter test signal according to the corresponding control signal transmitted by the register module 7 and transmits it to the filter module 3. For example, if there is significant noise in the fourth processed signal of the X-axis, the register module 7 will transmit a first test control signal to the X-axis filter test unit 21. The X-axis filter test unit 21 generates an X-axis filter test signal according to the first test control signal and transmits the X-axis filter test signal to the filter module 3, thereby determining the working mode of the filter module 3.

[0101] In one possible implementation, see Figure 4The schematic diagram of the filter test unit shown shows that any of the filter test units in the X-axis filter test unit 21, Y-axis filter test unit 22 and Z-axis filter test unit 23 includes a signal selection element 201 and a random signal generation element 202.

[0102] The input terminal of the random signal generating element 202 is connected to the output terminal of the register module 7, and is used to receive the corresponding control signal transmitted by the register module 9. The random signal generating element 202 generates the corresponding filter test signal according to the corresponding control signal. The output terminal of the random signal generating element 202 is connected to the input terminal of the signal selection element 201, and is used to transmit the generated filter test signal to the signal selection element 201.

[0103] The input terminal of the signal selection element 201 is connected to the output terminal of the register module 7; the input terminal of the signal selection element 201 is connected to the corresponding output terminal of the ADC interface module 1; the output terminal of the signal selection element 201 serves as the output terminal of the X-axis filtering test unit 21, the Y-axis filtering test unit 22, or the Z-axis filtering test unit 23.

[0104] In this embodiment, the signal selection element 201 receives the corresponding first processing signal transmitted by the ADC interface module 1 and transmits it to the filter module; the signal selection element 201 also receives the control signal sent by the register module 7. During testing, it transmits the corresponding filter test signal transmitted by the received random signal generation element 202 to the filter module 3 to perform testing and determine the working mode of the filter.

[0105] In one possible implementation, the filter module 3 includes an X-axis filter unit 31, a Y-axis filter unit 32, and a Z-axis filter unit 33.

[0106] The input terminal of the X-axis filter unit 31 is connected to the output terminal of the X-axis filter test unit 21 to receive the first X-axis processed signal; the input terminal of the X-axis filter unit 31 is connected to the register module 7 to receive the first filter control signal transmitted by the register module 7; the output terminal of the X-axis filter unit 31 is connected to the input terminal of the gain adjustment module 4. The X-axis filter unit 31 is used to filter the first X-axis processed signal according to the first filter control signal, obtain the second X-axis processed signal, and then transmit the second X-axis processed signal to the gain adjustment module 4.

[0107] The input terminal of the Y-axis filter unit 32 is connected to the output terminal of the Y-axis filter test unit 22 to receive the first Y-axis processed signal; the input terminal of the Y-axis filter unit 32 is connected to the register module 7 to receive the second filter control signal transmitted by the register module 7; the output terminal of the Y-axis filter unit 32 is connected to the input terminal of the gain adjustment module 4. The Y-axis filter unit 32 is used to filter the first Y-axis processed signal according to the second filter control signal to obtain the second Y-axis processed signal, and then transmit the second Y-axis processed signal to the gain adjustment module 4.

[0108] The input terminal of the Z-axis filter unit 33 is connected to the output terminal of the Z-axis filter test unit 23 to receive the first Z-axis processing signal; the input terminal of the Z-axis filter unit 33 is connected to the register module 7 to receive the third filter control signal transmitted by the register module 7; the output terminal of the Z-axis filter unit 33 is connected to the input terminal of the gain adjustment module 4. The Z-axis filter unit 33 is used to filter the first Z-axis processing signal according to the third filter control signal to obtain the second Z-axis processing signal, and then transmit the second Z-axis processing signal to the gain adjustment module 4.

[0109] In this embodiment, under the control of the register, the X-axis filter unit 31 receives the first X-axis processing signal, filters it to obtain the second X-axis processing signal, and transmits it to the gain adjustment module 4; the Y-axis filter unit 32 receives the first Y-axis processing signal, filters it to obtain the second Y-axis processing signal, and transmits it to the gain adjustment module 4; the Z-axis filter unit 33 receives the first Z-axis processing signal, filters it to obtain the second Z-axis processing signal, and transmits it to the gain adjustment module 4; furthermore, the filter module 3 is an integration of the X-axis filter unit 31, the Y-axis filter unit 32, and the Z-axis filter unit 33, which reduces the size of the filter module 3 and allows for simultaneous filtering of the three first processing signals, while simultaneously sending the three filtered second processing signals to the gain module 4.

[0110] In one possible implementation, see Figure 5 The first structural schematic diagram of the filter unit shown includes any of the X-axis filter unit 31, Y-axis filter unit 32 and Z-axis filter unit 33, which includes a CIC filter element 301, an IIR filter element 302, a third selector 303 and an output rate adjustment element 304.

[0111] The input terminal of CIC filter element 301 is connected to the corresponding output terminal of filter test module 2; the output terminal of CIC filter element 301 is connected to the input terminal of IIR filter element 302 and the input terminal of third selector 303 respectively; CIC filter element 301 is used to acquire the corresponding first processing signal sent by filter test module 2 and the corresponding filter test signal sent by filter test module 2. For example, the CIC filter element of X-axis filter unit 31 is used to receive the X-axis first processing signal sent by X-axis filter test unit 21 and perform filtering, and during testing, it receives the X-axis filter test signal sent by X-axis filter test unit 21 and performs testing; the input terminal of CIC filter element 301 is connected to the output terminal of register module 7 and is used to receive the corresponding control signal transmitted by register module 7, thereby configuring the order of CIC filter element 301; CIC filter element 301 performs smoothing and decimation processing on the received corresponding first processing signal according to the configured order.

[0112] Furthermore, the order of the configuration can be 4, 8, 16, 32, 64, or 128.

[0113] Smoothing the first processed signal can perform preliminary filtering, which facilitates accurate subsequent analysis. Extracting the first processed signal can extract the corresponding data at fixed time intervals to obtain the extracted signal, which can reduce the data density in the signal, reduce the complexity of subsequent analysis, and process the acceleration signal more quickly and accurately.

[0114] The input terminal of IIR filter element 302 is also connected to the output terminal of the register module; the output terminal of IIR filter element 302 is connected to the input terminal of the third selector 303. IIR filter element 302 is turned on or off according to the corresponding control signal sent by the register module to further filter the first processed signal; at the same time, in order to avoid over-filtering of the acceleration signal, IIR filter element 302 can also be turned off, which can also reduce the power consumption of the system when IIR filter element 302 is not needed.

[0115] The input of the third selector 303 is also connected to the output of the register module 7; the output of the third selector 303 is connected to the input of the output rate adjustment element 304.

[0116] In this embodiment, the third selector 303 receives the first processing signal transmitted after processing by the CIC filter element 301 and the first processing signal transmitted after processing by the IIR filter element 302, respectively. The third selector 303 selects according to the corresponding control signal transmitted by the register module 7 and transmits the selected first processing signal to the output rate adjustment element 304.

[0117] The input terminal of the output rate adjustment element 304 is also connected to the output terminal of the register module 7; the output terminal of the output rate adjustment element 304 serves as the output terminal of the X-axis filter unit 31, the Y-axis filter unit 32, or the Z-axis filter unit 33.

[0118] The output rate adjustment element 304 receives the corresponding control signal transmitted by the register module 7, determines the signal output rate according to the control signal, and adjusts the received first processing signal according to the signal output rate to obtain the corresponding second processing signal, thereby outputting it.

[0119] Furthermore, the filter unit may include multiple IIR filter elements, such as two or three IIR filter elements. The following description uses three IIR filter elements.

[0120] See Figure 6 The second structural schematic diagram of the filter unit shown also includes a second IIR filter element 305, a fourth selector 306, a third IIR filter element 307, and a fifth selector 308.

[0121] The input terminal of the second IIR filter element 305 is connected to the output terminal of the third selector 303; the output terminal of the second IIR filter element 305 is connected to the input terminal of the fourth selector 306; the input terminal of the fourth selector 306 is also connected to the output terminal of the third selector 303; the output terminal of the fourth selector 306 is connected to the input terminal of the third IIR filter element 307 and the input terminal of the fifth selector 308 respectively; the output terminal of the third IIR filter element 307 is connected to the input terminal of the fifth selector 308; the output terminal of the fifth selector 308 is connected to the input terminal of the output rate adjustment unit 304; the input terminals of the second IIR filter element 305, the fourth selector 306, the third IIR filter element 307, and the fifth selector 308 are all connected to the output terminal of the register module 7.

[0122] The control commands sent by register module 7 determine whether one or more of the IIR filter element 302, the second IIR filter element 305 and the third IIR filter element 307 are turned on or off, and determine which signal to pass through the third selector 303, the fourth selector 306 and the fifth selector 308 respectively. The specific selection method is the same as the selection method of the third selector 303 in the above embodiment.

[0123] Furthermore, IIR filter element 302, second IIR filter element 305, and third IIR filter element 307 can be either first-order or second-order filters. For specific configurations of the IIR filter elements, please refer to [reference needed]. Figure 7 The schematic diagram of the first-order IIR filter element shown is as follows: Figure 8 The diagram shows the structure of the second-order IIR filter element.

[0124] Preferably, the IIR filter element 302 can be a first-order IIR filter. Taking a sampling rate of 3662Hz (system clock / 128) as an example, the bandwidth is approximately 114.2Hz and the delay is approximately 1.38ms. The second IIR filter element 305 can be a second-order IIR filter. Taking a sampling rate of 3662Hz as an example, the bandwidth is approximately 114.4Hz and the delay is approximately 1.99ms. The third IIR filter element 307 can be a first-order IIR filter. Taking a sampling rate of 3662Hz as an example, the bandwidth is approximately 5.8Hz and the delay is approximately 26.3ms. The first-order IIR filter used in the third IIR filter element 307 can be an extremely low bandwidth filter.

[0125] The coefficients corresponding to IIR filter element 302 are shown in Table 1:

[0126] Table 1. Coefficients of IIR Filter Component 302

[0127] s(1) 0.089660604585669837 a(2)(1) -0.82067879082866035

[0128] The coefficients corresponding to the second IIR filter element 305 are shown in Table 2:

[0129] Table 2. Coefficients of the Second IIR Filter Element 305

[0130] s(1) 0.0084426929290799483 a(2)(1) -1.7237761727625094 a(3)(1) 0.75754694447882898 b(2)(1) 2

[0131] The coefficients corresponding to the third IIR filter element 307 are shown in Table 3:

[0132] Table 3. Coefficients of the third IIR filter element 307

[0133] s(1) 0.005001068115234375 a(2)(1) -0.989990234375

[0134] When the filter unit contains IIR filter element 302, second IIR filter element 305, and third IIR filter element 307, it is possible to selectively turn on IIR filter element 302 and second IIR filter element 305 to filter the received first processed signal. This can achieve the best signal-to-noise ratio while ensuring signal bandwidth. It is also possible to select to turn on IIR filter element 302 to achieve the best system delay. It is also possible to select to turn on second IIR filter element 305 to achieve the best in-band flatness. Alternatively, it is possible to select to turn on IIR filter element 302, second IIR filter element 305, and third IIR filter 307 to achieve extremely low bandwidth.

[0135] Therefore, by transmitting corresponding control signals to the filter module 3, the register module 7 can configure the order of the CIC filter element 301, determine the on and off states of the IIR filter element 302, the second IIR filter element 305, and the third IIR filter 307, determine the signals selected by the third selector 303, the fourth selector 306, and the fifth selector 308, and configure the signal output rate of the output rate adjustment element 304, thereby filtering the three first processing signals to obtain the three second processing signals.

[0136] In one possible implementation, the gain adjustment module 4 includes an X-axis gain adjustment unit 41, a Y-axis gain adjustment unit 42, and a Z-axis gain adjustment unit 43.

[0137] The input terminal of the X-axis gain adjustment unit 41 is connected to the X-axis filter unit 31 to receive the second X-axis processing signal; the input terminal of the X-axis gain adjustment unit 41 is connected to the output terminal of the register module 7 to receive the first gain control signal transmitted by the register module 7; the output terminal of the X-axis gain adjustment unit 41 is connected to the input terminal of the temperature compensation module 6 through the temperature compensation test module 5. The X-axis gain adjustment unit 41 is used to perform gain processing on the second X-axis processing signal according to the first gain control signal, and after obtaining the third X-axis processing signal, it is transmitted to the temperature compensation module 6 through the temperature compensation test module 5.

[0138] The input terminal of the Y-axis gain adjustment unit 42 is connected to the Y-axis filter unit 32 to receive the second Y-axis processing signal; the input terminal of the Y-axis gain adjustment unit 42 is connected to the output terminal of the register module 7 to receive the second gain control signal transmitted by the register module 7; the output terminal of the Y-axis gain adjustment unit 42 is connected to the input terminal of the temperature compensation module 6 through the temperature compensation test module 5. The Y-axis gain adjustment unit 42 is used to perform gain processing on the second Y-axis processing signal according to the second gain control signal, and after obtaining the third Y-axis processing signal, it is transmitted to the temperature compensation module 6 through the temperature compensation test module 5.

[0139] The input terminal of the Z-axis gain adjustment unit 43 is connected to the Z-axis filter unit 33 to receive the second Z-axis processing signal; the input terminal of the Z-axis gain adjustment unit 43 is connected to the output terminal of the register module 7 to receive the third gain control signal transmitted by the register module 7; the output terminal of the Z-axis gain adjustment unit 43 is connected to the input terminal of the temperature compensation module 6 through the temperature compensation test module 5. The Z-axis gain adjustment unit 43 is used to perform gain processing on the second Z-axis processing signal according to the third gain control signal, and after obtaining the third Z-axis processing signal, it is transmitted to the temperature compensation module 6 through the temperature compensation test module 5.

[0140] In this embodiment, the register module 7 transmits a corresponding control signal to the gain adjustment module 4. The gain adjustment module 4 determines the gain parameter according to the corresponding control signal and performs gain processing on the signal. Specifically, the X-axis gain adjustment unit 41 is used to receive the second X-axis processing signal and perform gain processing on the second X-axis processing to obtain the third X-axis processing signal, which is then transmitted to the temperature compensation module 6 after passing through the temperature compensation test module 5. The Y-axis gain adjustment unit 42 is used to receive the second Y-axis processing signal and perform gain processing on the second Y-axis processing to obtain the third Y-axis processing signal, which is then transmitted to the temperature compensation module 6 after passing through the temperature compensation test module 5. The Z-axis gain adjustment unit 43 is used to receive the second Z-axis processing signal and perform gain processing on the second Z-axis processing to obtain the third Z-axis processing signal, which is then transmitted to the temperature compensation module 6 after passing through the temperature compensation test module 5.

[0141] In addition, the gain adjustment module 4 is also integrated by the X-axis gain adjustment unit 41, the Y-axis gain adjustment unit 42 and the Z-axis gain adjustment unit 43, which can reduce the size of the gain adjustment module 4, and can also perform gain processing on the three second processing signals at the same time, and send the obtained three third processing signals to the temperature compensation test module 5 at the same time.

[0142] In one possible implementation, the temperature compensation test module 5 can also test the temperature compensation module 6. When the final fourth processing signal shows signal drift with temperature, it indicates a problem with the configuration of the temperature compensation module 6, and the temperature compensation module 6 needs to be tested by the temperature compensation test module 5. Specifically, the temperature compensation test module 5 generates a corresponding temperature compensation test signal based on the corresponding control signal transmitted by the register module 7, and transmits it to the temperature compensation module 6. For example, if the fourth X-axis processing signal shows signal drift with temperature, the register module 7 will transmit a fourth test control signal to the temperature compensation test module 5. The temperature compensation test module 5 generates an X-axis temperature compensation test signal based on the fourth test control signal and transmits the X-axis temperature compensation test signal to the temperature compensation module 6, thereby determining the working mode of the temperature compensation module 6 in processing the third X-axis processing signal.

[0143] In one possible implementation, see Figure 9 The schematic diagram of the temperature compensation module shown shows that the temperature compensation module 6 includes a temperature compensation parameter calculation unit 61, a temperature compensation data calculation unit 62, and a temperature compensation control unit 63.

[0144] The input terminal of the temperature compensation control unit 63 is connected to the output terminal of the register module 7, and the output terminal of the temperature compensation control unit 63 is connected to the input terminal of the temperature compensation parameter calculation unit 61. The temperature compensation control unit 63 receives the corresponding control signal transmitted by the register module 7, determines the third processing signal that needs to be temperature compensated according to the signal, and determines the temperature compensation coefficient, and sends the temperature compensation coefficient to the temperature compensation parameter calculation unit 61.

[0145] The output of the temperature compensation parameter calculation unit 61 is connected to the input of the temperature compensation data calculation unit 62 and the input of the temperature compensation control unit 63, respectively. The temperature compensation parameter calculation unit 61 calculates the temperature compensation parameters based on the temperature compensation coefficient and the temperature it acquires, and transmits the temperature compensation parameters to the temperature compensation data calculation unit 62 and stores them in the register module through the temperature compensation control unit 63.

[0146] Furthermore, the input terminal of the temperature compensation parameter calculation unit 61 can also be connected to the output terminal of an external temperature sensor to receive temperature information sent by the temperature sensor and determine the temperature compensation parameters based on the temperature information. The temperature compensation parameter calculation unit 61 can select between a high-precision compensation mode and a large-range compensation mode based on the zero-point temperature coefficient and scale factor temperature coefficient of the single-chip triaxial accelerometer.

[0147] The input terminal of the temperature compensation data calculation unit 62 is connected to the output terminal of the temperature compensation test module 5 and the output terminal of the temperature compensation control unit 63, respectively; the output terminal of the temperature compensation data calculation unit 62 is connected to the input terminal of the temperature compensation control unit 63; the temperature compensation data calculation unit 62 receives the information of the third processing signal that needs to be temperature compensated transmitted by the temperature compensation control unit 63, and performs temperature compensation on the three third processing signals transmitted by the temperature compensation test module 5 in sequence according to the information and the temperature compensation parameters transmitted by the temperature compensation parameter calculation unit 61, corrects the drift of the three third processing signals with temperature, obtains three fourth processing signals, and sends them to the temperature compensation control unit 63.

[0148] Specifically, the temperature compensation data calculation unit 62 processes the three third processing signals sequentially, eliminating the need for separate processing modules for each of the three signals. Processing the three third processing signals as needed reduces the power consumption and size of the temperature compensation module 6.

[0149] The output of the temperature compensation control unit 63 is connected to the input of the register module 7, and the temperature compensation control unit 63 sends the received three fourth processing signals to the register module 7.

[0150] Furthermore, the zero-bias temperature compensation can be determined using a fourth-order polynomial fitting temperature compensation algorithm, based on... Calculate temperature compensation; where Acc in The output signal of the temperature compensation test module is the uncompensated signal; K 0T To fit the zero-point value, K 1T To fit the scale value, Acc out This is the output signal of the accelerometer after temperature compensation.

[0151] The formula for calculating the fitted null value is:

[0152] K 0T =K0+A K0 (TT ref )+B K0 (TT ref ) 2 +C K0 (TT ref ) 3 +D K0 (TT ref ) 4

[0153] The formula for calculating the fit scale value is:

[0154] K 1T =K1+A K1 (TT ref )+B K1 (TT ref ) 2 +C K1 (TT ref ) 3 +D K1 (TT ref ) 4

[0155] Among them, T ref The reference temperature can be selected as room temperature. K0 is the zero bias of the single-chip accelerometer at the reference temperature, K1 is the scaling factor at the reference temperature, and A... K0 B K0 C K0 and D K0 All are coefficients of the zero-biased fourth-order polynomial fitting of the accelerometer, A K1 B K1 C K1 and D K1 All of these are coefficients of the fourth-order polynomial fitting of the accelerometer scaling factor.

[0156] Within the operating temperature range of the single-chip triaxial accelerometer, zero bias and scaling factor data are collected every 10°C (including the extreme operating temperature). The collected data are then fitted with a fourth-order polynomial to obtain the fourth-order polynomial fitting coefficients. The coefficients have the same number of digits in both high-precision compensation and large-range compensation modes, but the fractional parts differ, as shown in Table 4.

[0157] Table 4. Mode bit depth table for high-precision compensation and large-range compensation

[0158] A K0 ]]> (1,30,20) (1,30,35) <![CDATA[B K0 ]]> (1,20,32) (1,20,43) <![CDATA[C K0 ]]> (1,20,53) (1,20,56) <![CDATA[D K0 ]]> (1,19,73) (1,19,76) <![CDATA[A K1 ]]> (1,30,46) (1,30,52) <![CDATA[B K1 ]]> (1,21,55) (1,21,56) <![CDATA[C K1 ]]> (1,20,72) (1,20,76) <![CDATA[D K1 ]]> (1,19,92) (1,19,96)

[0159] In one possible implementation, see Figure 10 The schematic diagram of the input / output interface module shown is shown. The input / output interface module 8 includes a decoding unit 81 and a control unit 82.

[0160] The input terminal of the decoding unit 81 is used to acquire the input instruction; the output terminal of the decoding unit 81 is connected to the input terminal of the control unit 82, and the decoding unit 81 converts the acquired instruction into a control signal and sends it to the control unit 82.

[0161] The output terminal of the control unit 82 is connected to the input terminal of the register module 7. The control unit 82 sends the received control signals to the register module 7. The input terminal of the control unit 82 is connected to the output terminal of the register module 7. The output terminal of the control unit 82 is connected to the input terminal of the decoding unit 81. The control unit 82 is used to receive the three fourth processing signals output by the register module 7 and output the three fourth processing signals.

[0162] Furthermore, instructions may include reading register data, writing register data, reading acceleration signals, reading temperature signals, reading status words, etc.

[0163] Preferably, the input / output module can also be connected to a data acquisition device, allowing for instruction input and the output of three fourth-channel processing signals. When the data acquisition device is not in operation, the stored signals of the register module can be updated.

[0164] In this embodiment of the invention, under the control of the register module, the X-axis ADC interface unit, Y-axis ADC interface unit, and Z-axis ADC interface unit in the ADC interface module respectively adjust the three acceleration signals received from the single-chip triaxial accelerometer. Each acceleration signal sequentially passes through a signal conversion element, a CDS adjustment element, a first selector, a chopper adjustment element, a second selector, a zero-position adjustment element, and a gain adjustment element, processing the acceleration signal into a format that can be processed by subsequent units or elements, initially reducing noise in the acceleration signal, obtaining three first processed signals, and sending them to the filter module through the filter test module; the filter module... The X-axis, Y-axis, and Z-axis filter units filter the three first-processed signals respectively. Each signal sequentially passes through a CIC filter element, an IIR filter element, a third selector, and an output rate adjustment element to filter out noise in each first-processed signal and adjust the signal output rate, resulting in three second-processed signals, which are then transmitted to the gain adjustment module. The X-axis gain adjustment unit, Y-axis gain adjustment unit, and Z-axis gain adjustment unit of the gain adjustment module perform gain processing on the received three second-processed signals, resulting in three third-processed signals, which are then transmitted to the temperature compensation module through the temperature compensation test module. In the temperature compensation module, the temperature compensation parameter calculation unit, temperature compensation data calculation unit, and temperature compensation control unit sequentially perform temperature compensation on the three third-processed signals, determine whether each third-processed signal needs temperature compensation, and calculate the temperature compensation parameters for each third-processed signal to obtain three fourth-processed signals. These three fourth-processed signals are then transmitted to the register module; the register module then outputs the signals through the input / output interface module. The three acceleration signals from the single-chip triaxial accelerometer sequentially pass through the ADC interface module, filter test module, filter module, gain adjustment module, temperature compensation test module, and temperature compensation module. The ADC interface module and filter test module... The filter module, gain adjustment module, and temperature compensation test module are each equipped with units for the X, Y, and Z axes, respectively, enabling simultaneous processing of three acceleration signals. The temperature compensation module can process the three signals sequentially based on selection, thus obtaining three fourth processed signals. This eliminates the need for separate signal processing systems for each axis of the accelerometer. By integrating units for the X, Y, and Z axes into the modules and using only one temperature compensation module to process the three signals sequentially, the size of the accelerometer's signal processing system can be reduced, while simultaneously enabling fast and accurate processing of acceleration signals from a single-chip triaxial accelerometer.

[0165] It should be understood that the sequence number of each step in the above embodiments does not imply the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present invention.

[0166] The following are device embodiments of the present invention. For details not described in detail, please refer to the corresponding system embodiments described above.

[0167] Figure 11 A schematic diagram of the microelectromechanical acceleration measuring device provided in an embodiment of the present invention is shown. For ease of explanation, only the parts related to the embodiment of the present invention are shown, and are described in detail below:

[0168] The microelectromechanical acceleration measurement device 11 includes a single-chip triaxial accelerometer 1101 and a signal processing system 1102; the signal processing system 1102 adopts the signal processing system as described in any of the above embodiments.

[0169] The above embodiments are only used to illustrate the technical solutions of the present invention, and are not intended to limit it. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention, and should all be included within the protection scope of the present invention.

Claims

1. A signal processing system, wherein the signal processing system is used to process acceleration signals from a single-chip triaxial accelerometer, characterized in that, The signal processing system includes an ADC interface module, a filter testing module, a filter module, a gain adjustment module, a temperature compensation testing module, a temperature compensation module, a register module, and an input / output interface module. The input terminal of the ADC interface module is used to connect to the output terminal of the single-chip triaxial accelerometer to receive the three acceleration signals output by the single-chip triaxial accelerometer. The output of the ADC interface module is connected to the input of the filter module through the filter test module. The ADC interface module is used to adjust the received acceleration signals to obtain three first processing signals, which are then transmitted to the filter module through the filter test module. The output of the filter module is connected to the input of the gain adjustment module. The filter module is used to filter the received first processing signals to obtain three second processing signals, and then transmit the three second processing signals to the gain adjustment module. The output of the gain adjustment module is connected to the input of the temperature compensation module through the temperature compensation test module. The gain adjustment module is used to perform gain processing on the received second processing signals to obtain three third processing signals, which are then transmitted to the temperature compensation module through the temperature compensation test module. The output of the temperature compensation module is connected to the input of the register module. The temperature compensation module is used to perform temperature compensation on each of the received third processing signals in sequence to obtain three fourth processing signals, and then transmit the three fourth processing signals to the register module. The output of the register module is connected to the input of the input / output interface module, and is used to output the received three fourth processing signals through the input / output interface module. The input terminal of the register module is also connected to the output terminal of the input / output interface for receiving control signals transmitted externally through the input / output interface module; the output terminal of the register module is also connected to the input terminal of the ADC interface module, the input terminal of the filter test module, the input terminal of the filter module, the input terminal of the gain adjustment module, the input terminal of the temperature compensation test module, and the input terminal of the temperature compensation module, respectively, for transmitting corresponding control signals. The ADC interface module includes an X-axis ADC interface unit, a Y-axis ADC interface unit, and a Z-axis ADC interface unit. The input terminal of the X-axis ADC interface unit is connected to the output terminal of the X-axis acceleration module of the single-chip triaxial accelerometer to receive the X-axis acceleration signal output by the X-axis acceleration module; the input terminal of the X-axis ADC interface unit is connected to the output terminal of the register module to receive the first interface control signal sent by the register module; the output terminal of the X-axis ADC interface unit is connected to the input terminal of the filter module through the filter test module, and the X-axis ADC interface unit is used to adjust the X-axis acceleration signal to obtain the first X-axis processed signal, which is then transmitted to the filter module through the filter test module. The input terminal of the Y-axis ADC interface unit is connected to the output terminal of the Y-axis acceleration module of the single-chip triaxial accelerometer to receive the Y-axis acceleration signal output by the Y-axis acceleration module; the input terminal of the Y-axis ADC interface unit is connected to the output terminal of the register module to receive the second interface control signal sent by the register module; the output terminal of the Y-axis ADC interface unit is connected to the input terminal of the filter module through the filter test module, and the Y-axis ADC interface unit is used to adjust the Y-axis acceleration signal to obtain the first Y-axis processed signal, which is then transmitted to the filter module through the filter test module. The input terminal of the Z-axis ADC interface unit is connected to the output terminal of the Z-axis acceleration module of the single-chip triaxial accelerometer to receive the Z-axis acceleration signal output by the Z-axis acceleration module; the input terminal of the Z-axis ADC interface unit is connected to the output terminal of the register module to receive the third interface control signal sent by the register module; the output terminal of the Z-axis ADC interface unit is connected to the input terminal of the filter module through the filter test module, and the Z-axis ADC interface unit is used to adjust the Z-axis acceleration signal to obtain the first Z-axis processed signal, which is then transmitted to the filter module through the filter test module. Each of the X-axis ADC interface unit, Y-axis ADC interface unit, and Z-axis ADC interface unit includes a signal conversion element, a CDS adjustment element, a first selector, a chopper adjustment element, a second selector, a zero-position adjustment element, and a gain adjustment element. The input terminal of the signal conversion element is used to connect to the output terminal corresponding to the single-chip triaxial accelerometer; the output terminal of the signal conversion element is connected to the input terminal of the CDS adjustment element and the input terminal of the first selector, respectively. The CDS adjustment element is also connected to the output of the register module; the output of the CDS adjustment element is connected to the input of the first selector. The input terminal of the first selector is also connected to the output terminal of the register module; the output terminal of the first selector is connected to the input terminal of the chopper adjustment element and the input terminal of the second selector, respectively. The input terminal of the chopper adjustment element is also connected to the output terminal of the register module; the output terminal of the chopper adjustment element is connected to the input terminal of the second selector. The input terminal of the second selector is also connected to the output terminal of the register module; the output terminal of the second selector is connected to the input terminal of the zero-position adjustment element. The input terminal of the zero-position adjustment element is also connected to the output terminal of the register module; the output terminal of the zero-position adjustment element is connected to the input terminal of the gain adjustment element. The input terminal of the gain adjustment element is also connected to the output terminal of the register module; the output terminal of the gain adjustment element serves as the output terminal of the X-axis ADC interface unit, Y-axis ADC interface unit, or Z-axis ADC interface unit.

2. The signal processing system according to claim 1, characterized in that, The filtering test module includes an X-axis filtering test unit, a Y-axis filtering test unit, and a Z-axis filtering test unit. The input terminal of the X-axis filtering test unit is connected to the output terminal of the X-axis ADC interface unit to receive the X-axis first processing signal; the input terminal of the X-axis filtering test unit is connected to the output terminal of the register module to configure the X-axis filtering test unit according to the first test control signal transmitted by the register module; the output terminal of the X-axis filtering test unit is connected to the input terminal of the filter module to transmit the X-axis first processing signal to the filter module. The input terminal of the Y-axis filtering test unit is connected to the output terminal of the Y-axis ADC interface unit, and is used to receive the first Y-axis processed signal; The input terminal of the Y-axis filtering test unit is connected to the output terminal of the register module, and is used to configure the Y-axis filtering test unit according to the second test control signal transmitted by the register module; The output of the Y-axis filtering test unit is connected to the input of the filter module, and is used to transmit the first Y-axis processed signal to the filter module. The input terminal of the Z-axis filtering test unit is connected to the output terminal of the Z-axis ADC interface unit, and is used to receive the Z-axis first processed signal; The input terminal of the Z-axis filtering test unit is connected to the output terminal of the register module, and is used to configure the Z-axis filtering test unit according to the third test control signal transmitted by the register module; the output terminal of the Z-axis filtering test unit is connected to the input terminal of the filter module, and is used to transmit the Z-axis first processing signal to the filter module.

3. The signal processing system according to claim 2, characterized in that, Each of the X-axis filtering test unit, the Y-axis filtering test unit, and the Z-axis filtering test unit includes a signal selection element and a random signal generation element; The input terminal of the random signal generation element is connected to the output terminal of the register module; the output terminal of the random signal generation element is connected to the input terminal of the signal selection element. The input terminal of the signal selection element is connected to the output terminal of the register module; the input terminal of the signal selection element is connected to the corresponding output terminal of the ADC interface module; the output terminal of the signal selection element serves as the output terminal of the X-axis filtering test unit, the Y-axis filtering test unit, or the Z-axis filtering test unit.

4. The signal processing system according to claim 2, characterized in that, The filter module includes an X-axis filter unit, a Y-axis filter unit, and a Z-axis filter unit; The input terminal of the X-axis filter unit is connected to the output terminal of the X-axis filter test unit to receive the first X-axis processed signal; the input terminal of the X-axis filter unit is connected to the register module to receive the first filter control signal transmitted by the register module; the output terminal of the X-axis filter unit is connected to the input terminal of the gain adjustment module. The X-axis filter unit is used to filter the first X-axis processed signal according to the first filter control signal to obtain the second X-axis processed signal, and then transmit the second X-axis processed signal to the gain adjustment module. The input terminal of the Y-axis filter unit is connected to the output terminal of the Y-axis filter test unit to receive the first Y-axis processed signal; the input terminal of the Y-axis filter unit is connected to the register module to receive the second filter control signal transmitted by the register module; the output terminal of the Y-axis filter unit is connected to the input terminal of the gain adjustment module. The Y-axis filter unit is used to filter the first Y-axis processed signal according to the second filter control signal to obtain the second Y-axis processed signal, and then transmit the second Y-axis processed signal to the gain adjustment module. The input terminal of the Z-axis filter unit is connected to the output terminal of the Z-axis filter test unit to receive the first Z-axis processed signal; the input terminal of the Z-axis filter unit is connected to the register module to receive the third filter control signal transmitted by the register module; the output terminal of the Z-axis filter unit is connected to the input terminal of the gain adjustment module. The Z-axis filter unit is used to filter the first Z-axis processed signal according to the third filter control signal to obtain the second Z-axis processed signal, and then transmit the second Z-axis processed signal to the gain adjustment module.

5. The signal processing system according to claim 4, characterized in that, Each of the X-axis filter unit, the Y-axis filter unit, and the Z-axis filter unit includes a CIC filter element, an IIR filter element, a third selector, and an output rate adjustment element. The input terminal of the CIC filter element is connected to the corresponding output terminal of the filter test module; the input terminal of the CIC filter element is connected to the output terminal of the register module; the output terminal of the CIC filter element is connected to the input terminal of the IIR filter element and the input terminal of the third selector, respectively. The input terminal of the IIR filter is also connected to the output terminal of the register module; the output terminal of the IIR filter element is connected to the input terminal of the third selector. The input terminal of the third selector is also connected to the output terminal of the register module; the output terminal of the third selector is connected to the input terminal of the output rate adjustment element. The input terminal of the output rate adjustment element is also connected to the output terminal of the register module; the output terminal of the output rate adjustment element serves as the output terminal of the X-axis filter unit, the Y-axis filter unit, or the Z-axis filter unit.

6. The signal processing system according to claim 4, characterized in that, The gain adjustment module includes an X-axis gain adjustment unit, a Y-axis gain adjustment unit, and a Z-axis gain adjustment unit. The input terminal of the X-axis gain adjustment unit is connected to the X-axis filter unit to receive the second X-axis processing signal; the input terminal of the X-axis gain adjustment unit is connected to the output terminal of the register module to receive the first gain control signal transmitted by the register module; the output terminal of the X-axis gain adjustment unit is connected to the input terminal of the temperature compensation module through the temperature compensation test module; the X-axis gain adjustment unit is used to perform gain processing on the second X-axis processing signal according to the first gain control signal to obtain the third X-axis processing signal, and then transmits it to the temperature compensation module through the temperature compensation test module. The input terminal of the Y-axis gain adjustment unit is connected to the Y-axis filter unit to receive the second Y-axis processing signal; the input terminal of the Y-axis gain adjustment unit is connected to the output terminal of the register module to receive the second gain control signal transmitted by the register module; the output terminal of the Y-axis gain adjustment unit is connected to the input terminal of the temperature compensation module through the temperature compensation test module; the Y-axis gain adjustment unit is used to perform gain processing on the second Y-axis processing signal according to the second gain control signal to obtain the third Y-axis processing signal, and then transmits it to the temperature compensation module through the temperature compensation test module. The input terminal of the Z-axis gain adjustment unit is connected to the Z-axis filter unit to receive the second Z-axis processing signal; the input terminal of the Z-axis gain adjustment unit is connected to the output terminal of the register module to receive the third gain control signal transmitted by the register module; the output terminal of the Z-axis gain adjustment unit is connected to the input terminal of the temperature compensation module through the temperature compensation test module. The Z-axis gain adjustment unit is used to perform gain processing on the second Z-axis processing signal according to the third gain control signal to obtain the third Z-axis processing signal, and then transmits it to the temperature compensation module through the temperature compensation test module.

7. The signal processing system according to claim 1, characterized in that, The temperature compensation module includes a temperature compensation parameter calculation unit, a temperature compensation data calculation unit, and a temperature compensation control unit; The input terminal of the temperature compensation control unit is connected to the output terminal of the register module, and the output terminal of the temperature compensation control unit is connected to the input terminal of the temperature compensation parameter calculation unit. The output terminal of the temperature compensation parameter calculation unit is connected to the input terminal of the temperature compensation data calculation unit and the input terminal of the temperature compensation control unit, respectively. The input terminal of the temperature compensation data calculation unit is connected to the output terminal of the temperature compensation test module and the output terminal of the temperature compensation control unit, respectively; the output terminal of the temperature compensation data calculation unit is connected to the input terminal of the temperature compensation control unit. The output terminal of the temperature compensation control unit is connected to the input terminal of the register module.

8. A microelectromechanical acceleration measurement device, comprising a single-chip triaxial accelerometer and a signal processing system as described in any one of claims 1-7.

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