Analog-to-digital converter (ADC) calibration method, apparatus, device, and storage medium

CN115642913BActive Publication Date: 2026-07-14BEIJING ESWIN COMPUTING TECH CO LTD +1

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
BEIJING ESWIN COMPUTING TECH CO LTD
Filing Date
2022-10-13
Publication Date
2026-07-14

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Abstract

Embodiments of the present application provide an analog-to-digital converter (ADC) calibration method, device, equipment and storage medium. The method comprises: obtaining a plurality of sample signal sets of the ADC at a first working temperature; the sample signal set comprises an input signal of the ADC and an output signal of the ADC corresponding to the input signal; determining an output-input curve corresponding to the ADC at the first working temperature according to a first target model and the input signal and the output signal in the plurality of sample signal sets; the first target model is determined based on a third-order equation; and calibrating the ADC according to the output-input curve corresponding to the ADC at the first working temperature and an output voltage of the ADC measured at the first working temperature. The method of the embodiments of the present application realizes calibration and elimination of errors caused by high-order harmonics, and improves the calibration effect of the ADC.
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