Methods of incorporating arrester devices into capacitor configurations to reduce cell interference and capacitor configurations incorporating arrester devices

By introducing a leakage current device into the memory array, the problem of data instability caused by leakage of dielectric material in the memory device is solved, and the memory cell achieves high efficiency, reliability and low power consumption operation.

CN115700034BActive Publication Date: 2026-06-12MICRON TECHNOLOGY INC

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
MICRON TECHNOLOGY INC
Filing Date
2021-06-30
Publication Date
2026-06-12

AI Technical Summary

Technical Problem

As the density of memory devices increases, leakage problems in dielectric materials lead to data storage instability and power waste, especially in ferroelectric RAM where the cell interference mechanism caused by the potential accumulation at the bottom node of the cell is difficult to control.

Method used

By introducing a leakage current device into the memory array and coupling the bottom electrode to the conductive plate, the leakage current device material prevents charge from accumulating in the capacitor insulation material, enabling discharge from the bottom electrode and reducing unwanted charge leakage.

🎯Benefits of technology

It effectively reduces interference between memory cells, improves the reliability and power efficiency of data storage, and prevents data loss caused by charge accumulation.

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Abstract

Some embodiments include an integrated assembly having rows of electrically conductive pillars. The electrically conductive pillars are spaced apart from one another by gaps. Leaker device material extends within at least some of the gaps. Insulating material along sidewalls of the electrically conductive pillars. Electrically conductive structures over the electrically conductive pillars. The electrically conductive structures have downward protrusions that extend into at least some of the gaps. The leaker device material is configured to follow segments of sides of the downward protrusions and extend from the sides into one or more of the electrically conductive pillars. Some embodiments include methods of forming integrated assemblies.
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