Saturation reactor core aging performance test method, reflection method and device

Abstract

The present application relates to material aging life detection technical field, disclose a kind of saturated reactor core aging performance test method, reflecting method and device.The detection result of electrical parameter and core loss of the saturated reactor core sample meeting preset detection requirement in the present application is used as target saturated reactor core;Aging test temperature is set, and the target saturated reactor core is placed in the preset aging test circuit to carry out the aging test at the aging test temperature;The real-time electrical parameter and core loss of target saturated reactor core are detected after each test cycle;According to the aging test temperature, the acceleration aging factor is calculated, to calculate the aging test equivalent time of target saturated reactor core in each test cycle;According to the aging test equivalent time obtained by calculation and the obtained all electrical parameter and core loss, the aging performance test report of target saturated reactor core is obtained.The present application can effectively realize the aging performance test of saturated reactor core.

Description

Technical Field

[0001] This invention relates to the field of material aging life testing technology, and in particular to a test method, reaction method and apparatus for the aging performance of saturated reactor cores. Background Technology

[0002] Saturated reactors are key components of converter valves in DC transmission core equipment. Their lifespan is determined by the iron core and epoxy resin, with the iron core being one of the main sources of loss in saturated reactors.

[0003] Currently, the average service life of saturated reactors is generally predicted based on the thermal accelerated life test of epoxy resin, and there are very few studies on the aging life of saturated reactor cores. Summary of the Invention

[0004] This invention provides a method, reaction method, and apparatus for testing the aging performance of saturated reactor cores, solving the technical problem of how to conduct aging performance tests on saturated reactor cores.

[0005] The first aspect of this invention provides a method for testing the aging performance of a saturated reactor core, characterized in that it includes:

[0006] The electrical parameters and core loss of saturated reactor core samples are tested, and saturated reactor core samples whose test results meet the preset test requirements are used as target saturated reactor cores.

[0007] Set the aging test temperature, and place the target saturated reactor core in the preset aging test circuit to carry out the aging test at the aging test temperature;

[0008] After each test cycle, the real-time electrical parameters and core losses of the target saturated reactor core are detected.

[0009] The accelerated aging factor is calculated based on the aging test temperature, and the equivalent aging test time of the target saturated reactor core for each test cycle is calculated based on the accelerated aging factor.

[0010] Based on the calculated equivalent aging test time and all the obtained electrical parameters and core losses, an aging performance test report for the target saturated reactor core is obtained.

[0011] According to one achievable method of the first aspect of the invention, the electrical parameters include winding DC resistance, power frequency inductive reactance, voltage-time area, power frequency withstand voltage, and partial discharge.

[0012] According to one achievable method of the first aspect of the present invention, setting the aging test temperature includes:

[0013] The aging test temperature was set to 100°C.

[0014] According to a method achievable according to a first aspect of the present invention, the calculation of the accelerated aging factor based on the aging test temperature includes:

[0015] The accelerated aging factor was calculated based on the Arrhenius equation.

[0016] A second aspect of the present invention provides a method for reflecting the aging performance of a saturated reactor core, comprising:

[0017] Obtain the initial electrical parameters and core losses of the target saturated reactor core;

[0018] Acquire aging test data when the target saturated reactor core is placed in a preset aging test circuit for aging test; the aging test data includes the corresponding aging test temperature and the real-time electrical parameters and core loss of the target saturated reactor core detected after each test cycle.

[0019] The accelerated aging factor is calculated based on the aging test temperature, and the equivalent aging test time of the target saturated reactor core for each test cycle is calculated based on the accelerated aging factor.

[0020] Based on the calculated equivalent aging test time and all obtained electrical parameters and core losses, an aging performance test report for the target saturated reactor core is generated.

[0021] According to one achievable embodiment of the second aspect of the invention, the method further includes:

[0022] Based on the calculated equivalent time of the aging test and all the obtained electrical parameters and core losses, the aging characteristic curve of the target saturated reactor core is constructed.

[0023] According to one achievable method of the second aspect of the present invention, constructing the aging characteristic curve of the target saturated reactor core includes:

[0024] Construct a first aging characteristic curve that characterizes the relationship between electrical parameters and the equivalent time of aging tests;

[0025] A second aging characteristic curve is constructed to characterize the relationship between core loss and the equivalent time of aging test.

[0026] A third aspect of the present invention provides a device for reflecting the aging performance of a saturated reactor core, comprising:

[0027] The first acquisition module is used to acquire the initial electrical parameters and core loss of the target saturated reactor core.

[0028] The second acquisition module is used to acquire aging test data obtained when the target saturated reactor core is placed in a preset aging test circuit for aging test; the aging test data includes the corresponding aging test temperature and the real-time electrical parameters and core loss of the target saturated reactor core detected after each test cycle.

[0029] The calculation module is used to calculate the accelerated aging factor based on the aging test temperature, and to calculate the equivalent aging test time of the target saturated reactor core for each test cycle based on the accelerated aging factor.

[0030] The generation module is used to generate an aging performance test report for the target saturated reactor core based on the calculated equivalent aging test time, all electrical parameters, and core losses.

[0031] According to one embodiment of the third aspect of the invention, the apparatus further includes:

[0032] A construction module is used to construct the aging characteristic curve of the target saturated reactor core based on the calculated equivalent time of the aging test and all the obtained electrical parameters and core losses.

[0033] According to one achievable method of the third aspect of the present invention, the building module comprises:

[0034] The first building unit is used to construct the first aging characteristic curve that characterizes the relationship between electrical parameters and the equivalent time of aging tests.

[0035] The second building block is used to construct a second aging characteristic curve that characterizes the relationship between core loss and the equivalent time of aging test.

[0036] A fourth aspect of the present invention provides a device for testing the aging performance of a saturated reactor core, comprising:

[0037] A memory for storing instructions; wherein the instructions are for implementing the aging performance test method for saturated reactor core as described in any of the second aspects of the present invention.

[0038] A processor for executing instructions in the memory.

[0039] The fifth aspect of the present invention provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the aging performance test method for saturated reactor cores as described in any of the second aspects of the present invention.

[0040] A third aspect of the present invention provides a device for testing the aging performance of a saturated reactor core, comprising:

[0041] A memory for storing instructions; wherein the instructions are used to implement the aging performance test method for saturated reactor core as described in any of the above-mentioned ways;

[0042] A processor for executing instructions in the memory.

[0043] The fourth aspect of the present invention provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the aging performance test method for a saturated reactor core as described in any of the above embodiments.

[0044] As can be seen from the above technical solutions, the present invention has the following advantages:

[0045] This invention detects the electrical parameters and core losses of saturated reactor core samples. Saturated reactor core samples whose test results meet preset test requirements are used as target saturated reactor cores. An aging test temperature is set, and the target saturated reactor core is placed in a preset aging test circuit for aging tests at that temperature. After each test cycle, the real-time electrical parameters and core losses of the target saturated reactor core are detected. An accelerated aging factor is calculated based on the aging test temperature to calculate the equivalent aging test time for the target saturated reactor core in each test cycle. Based on the calculated equivalent aging test time and all obtained electrical parameters and core losses, an aging performance test report for the target saturated reactor core is obtained. This invention effectively realizes the aging performance test of saturated reactor cores, clarifies the correspondence between electrical parameters and core losses and the equivalent aging test time, and provides a basis for the life assessment of saturated reactor cores and saturated reactors. The method is relatively simple to operate and easy to implement. Attached Figure Description

[0046] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0047] Figure 1 A flowchart of an optional embodiment of the present invention is provided for a method for testing the aging performance of a saturated reactor core;

[0048] Figure 2 A flowchart of a method for testing the aging performance of a saturated reactor core, provided as another optional embodiment of the present invention;

[0049] Figure 3The diagram below shows the structural connection of a saturated reactor core aging performance testing device, which is provided as an optional embodiment of the present invention.

[0050] Figure label:

[0051] 1-First acquisition module; 2-Second acquisition module; 3-Calculation module; 4-Generation module. Detailed Implementation

[0052] This invention provides a method, reaction method, and apparatus for testing the aging performance of saturated reactor cores, which solves the technical problem of how to conduct aging performance tests on saturated reactor cores.

[0053] To make the objectives, features, and advantages of this invention more apparent and understandable, the technical solutions of the embodiments of this invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the embodiments described below are only some embodiments of this invention, and not all embodiments. Based on the embodiments of this invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this invention.

[0054] The first aspect of this invention provides a method for testing the aging performance of a saturated reactor core.

[0055] Please see Figure 1 , Figure 1 A flowchart of a method for testing the aging performance of a saturated reactor core provided by an embodiment of the present invention is shown.

[0056] The present invention provides a method for testing the aging performance of a saturated reactor core, comprising steps S1-S5.

[0057] Step S1: Detect the electrical parameters and core loss of the saturated reactor core sample, and take the saturated reactor core sample whose test results meet the preset test requirements as the target saturated reactor core.

[0058] The target saturated reactor core is the saturated reactor core that needs to undergo aging performance testing. In this embodiment, the saturated reactor core sample whose test results meet the preset test requirements is used as the target saturated reactor core. This can avoid the saturated reactor core whose performance does not meet the requirements from affecting the test results. Moreover, the detected electrical parameters and core loss can be used as basic data for comparison with subsequent test data.

[0059] The electrical parameters to be tested can be determined based on actual conditions, serving as technical indicators for evaluating the aging performance of the target saturated reactor core. In one feasible implementation, the electrical parameters include winding DC resistance, power frequency inductive reactance, voltage-time area, power frequency withstand voltage, and partial discharge.

[0060] When testing the initial electrical parameters of the target saturated reactor core, numerical requirements can be determined for each electrical parameter as preset testing requirements. For specific implementation methods, the corresponding numerical requirements can be found in Table 1.

[0061] Table 1:

[0062]

[0063]

[0064] As a specific implementation method, the corresponding detection methods and test criteria for detecting winding DC resistance, power frequency inductive reactance, voltage-time area, power frequency withstand voltage, and partial discharge are as follows:

[0065] (1) Measurement of DC resistance of windings:

[0066] Record the temperature of the tested winding and the resistance between the winding terminals, and the measurement should be performed using DC.

[0067] Test criterion: The resistance of the primary winding is within the specified range;

[0068] (2) Power frequency inductive reactance measurement:

[0069] The power frequency inductive reactance is the ratio of the applied voltage to the measured current (root mean square value); a 20 Arms power frequency current is applied to the converter valve saturated reactor, and the voltage between its terminals is measured.

[0070] The power frequency current can be adjusted within the range of 20×(1±2%)Arms, and the voltage Ueff between terminals should satisfy Ueff=4.1±0.5V;

[0071] Test criterion: Under a specified current, the voltage between the terminals of the converter valve saturated reactor is within the specified range;

[0072] (3) Voltage-time-area measurement:

[0073] This test should be conducted before the impulse voltage withstand test. After the impulse voltage withstand test is completed, the test should be repeated, and the waveforms of the two tests should be basically the same.

[0074] The reverse non-repeating peak voltage satisfies: 58×(1+3%)kV peak;

[0075] The voltage-time area satisfies: 150 × (1 + 15%) mVs;

[0076] Test criterion: Under the specified test voltage, the voltage-time area of ​​the saturated reactor meets the requirements;

[0077] (5) Impulse voltage withstand test:

[0078] Apply impulse voltages of ±50kV, ±60kV, ±70kV, and ±80kV to both ends of the saturated reactor core sample;

[0079] Number of applications: 3 times per voltage level per polarity;

[0080] Wave head time: 0.5–2.5 μs;

[0081] Test criteria: No breakdown, no short circuit, no flashover, and no abnormal waveforms;

[0082] (6) Power frequency withstand voltage and partial discharge measurement:

[0083] Application point: Primary coil to ground;

[0084] Uac1: 32kVrms;

[0085] Frequency f: 50Hz; Duration: 1min;

[0086] The power frequency withstand voltage test method shall comply with the provisions of Chapter 6 of GB 16927.1-2011;

[0087] Test criteria: There should be no abnormal phenomena such as breakdown, short circuit, or flashover;

[0088] Uac2: 25.5kVrms

[0089] Frequency f: 50Hz; Duration: 10min;

[0090] Test criteria: No breakdown, no short circuit, no flashover or other abnormal phenomena;

[0091] During the test, the voltage is increased from zero to Uac1 and held for 1 minute; then gradually decreased to the partial discharge voltage Uac2 and held for 10 minutes; during the 10-minute test, partial discharge is measured, and the partial discharge is required to be no more than 15 pC; after the test, the voltage is reduced to zero; if any abnormality is found, it is checked and dealt with before the test is repeated.

[0092] Step S2: Set the aging test temperature and place the target saturated reactor core in a preset aging test circuit to conduct an aging test at the set aging test temperature.

[0093] Step S3: After each test cycle, detect the real-time electrical parameters and core loss of the target saturated reactor core.

[0094] The detection method is the same as that used for detecting saturated reactor core samples. Existing detection methods can be used to detect core losses; this embodiment does not impose any limitations on this method.

[0095] In one feasible manner, setting the aging test temperature includes:

[0096] The aging test temperature was set to 100°C.

[0097] When a saturated reactor is in operation for a long time, the temperature of the cross-linked polyethylene in the winding sheath is less than 50°C. The stable temperature of cross-linked polyethylene during long-term operation is 90°C. When the temperature exceeds 110°C, aging accelerates. Therefore, the high-temperature aging test temperature is set at 100°C.

[0098] The test period can be set according to the actual situation. As a specific implementation method, the test period is set to 15 days.

[0099] Step S4: Calculate the accelerated aging factor based on the aging test temperature, and calculate the equivalent aging test time of the target saturated reactor core for each test cycle based on the accelerated aging factor.

[0100] In one feasible manner, calculating the accelerated aging factor based on the aging test temperature includes:

[0101] The accelerated aging factor was calculated based on the Arrhenius equation.

[0102] As a specific implementation method, the Arrhenius equation is as follows:

[0103]

[0104] In the formula, T AF This represents the aging acceleration factor, Ea is the activation energy, k is the Boltzmann constant, and T is the activation energy. use Temperature under normal operating conditions; T stress Temperature under accelerated conditions.

[0105] In this embodiment, the Arrhenius equation only considers the temperature factor. It should be noted that in other embodiments, existing Arrhenius equations that comprehensively consider both temperature and humidity factors, or other existing and applicable improved Arrhenius equations, can also be used.

[0106] Step S5: Based on the calculated equivalent time of the aging test and all the obtained electrical parameters and core losses, obtain the aging performance test report of the target saturated reactor core.

[0107] When obtaining the aging performance test report based on the calculated equivalent aging test time and all obtained electrical parameters and core losses, the periodic electrical parameters, core losses, and corresponding equivalent aging test times for each test can be described in tabular or graphical form. In other embodiments, the changes in electrical parameters, core losses, and corresponding changes in equivalent aging test times can also be described in tabular or graphical form to better demonstrate the aging characteristics of the saturated reactor core.

[0108] The second aspect of the present invention provides a method for reflecting the aging performance of a saturated reactor core, which can be automatically executed by devices such as servers and terminals.

[0109] Please see Figure 2 , Figure 2 A flowchart of a method for testing the aging performance of a saturated reactor core provided by an embodiment of the present invention is shown.

[0110] The present invention provides a method for testing the aging performance of a saturated reactor core, comprising steps S10-S40.

[0111] Step S10: Obtain the initial electrical parameters and core loss of the target saturated reactor core.

[0112] Step S20: Obtain aging test data when the target saturated reactor core is placed in a preset aging test circuit for aging test; the aging test data includes the corresponding aging test temperature and the real-time electrical parameters and core loss of the target saturated reactor core detected after each test cycle.

[0113] The aging test data can be obtained using the aging performance test method for saturated reactor cores according to any embodiment of the first aspect of the present invention.

[0114] Step S30: Calculate the accelerated aging factor based on the aging test temperature, and calculate the equivalent aging test time of the target saturated reactor core for each test cycle based on the accelerated aging factor.

[0115] The corresponding calculation formula can be found in step S4 above.

[0116] Step S40: Based on the calculated equivalent time of the aging test and all the obtained electrical parameters and core losses, generate an aging performance test report for the target saturated reactor core.

[0117] In one feasible implementation, the method further includes:

[0118] Based on the calculated equivalent time of the aging test and all the obtained electrical parameters and core losses, the aging characteristic curve of the target saturated reactor core is constructed.

[0119] In one feasible manner, constructing the aging characteristic curve of the target saturated reactor core includes:

[0120] Construct a first aging characteristic curve that characterizes the relationship between electrical parameters and the equivalent time of aging tests;

[0121] A second aging characteristic curve is constructed to characterize the relationship between core loss and the equivalent time of aging test.

[0122] A third aspect of the present invention provides a device for reflecting the aging performance of a saturated reactor core.

[0123] Please see Figure 3 , Figure 3 The diagram shows a structural connection block diagram of a saturated reactor core aging performance testing device provided in an embodiment of the present invention.

[0124] An embodiment of the present invention provides a saturated reactor core aging performance testing device, comprising:

[0125] The first acquisition module 1 is used to acquire the initial electrical parameters and core loss of the target saturated reactor core;

[0126] The second acquisition module 2 is used to acquire aging test data obtained when the target saturated reactor core is placed in a preset aging test circuit for aging test; the aging test data includes the corresponding aging test temperature and the real-time electrical parameters and core loss of the target saturated reactor core detected after each test cycle.

[0127] Calculation module 3 is used to calculate the accelerated aging factor based on the aging test temperature, and to calculate the equivalent aging test time of the target saturated reactor core for each test cycle based on the accelerated aging factor.

[0128] The generation module 4 is used to generate an aging performance test report of the target saturated reactor core based on the calculated aging test equivalent time and all electrical parameters and core losses.

[0129] In one feasible embodiment, the device further includes:

[0130] A construction module is used to construct the aging characteristic curve of the target saturated reactor core based on the calculated equivalent time of the aging test and all the obtained electrical parameters and core losses.

[0131] In one feasible manner, the building module includes:

[0132] The first building unit is used to construct the first aging characteristic curve that characterizes the relationship between electrical parameters and the equivalent time of aging tests.

[0133] The second building block is used to construct a second aging characteristic curve that characterizes the relationship between core loss and the equivalent time of aging test.

[0134] A fourth aspect of the present invention provides a device for testing the aging performance of a saturated reactor core, comprising:

[0135] A memory for storing instructions; wherein the instructions are used to implement the aging performance test method for saturated reactor cores as described in any embodiment of the second aspect of the present invention;

[0136] A processor for executing instructions in the memory.

[0137] The fifth aspect of the present invention provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the aging performance test method for saturated reactor cores as described in any embodiment of the second aspect of the present invention.

[0138] The above embodiments of the present invention can effectively realize the aging performance test of saturated reactor core, clarify the correspondence between electrical parameters and core loss and aging test equivalent time, and provide a basis for the life assessment of saturated reactor core and saturated reactor. The method is relatively simple to operate and easy to implement.

[0139] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working processes of the devices, modules, and units described above can be referred to the corresponding processes in the corresponding method embodiments, and the specific beneficial effects of the devices, modules, and units described above can be referred to the corresponding beneficial effects in the corresponding method embodiments, and will not be repeated here.

[0140] In the several embodiments provided in this application, it should be understood that the disclosed apparatus and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative. For instance, the division of modules is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple modules or components may be combined or integrated into another device, or some features may be ignored or not executed.

[0141] The modules described as separate components may or may not be physically separate. The components shown as modules may or may not be physical modules; that is, they may be located in one place or distributed across multiple network modules. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs.

[0142] Furthermore, the functional modules in the various embodiments of the present invention can be integrated into one processing module, or each module can exist physically separately, or two or more modules can be integrated into one module. The integrated modules described above can be implemented in hardware or as software functional modules.

[0143] If the integrated module is implemented as a software functional module and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0144] The above-described embodiments are only used to illustrate the technical solutions of the present invention, and are not intended to limit it. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A test method for the aging performance of a saturated reactor core, characterized in that, include: The electrical parameters and core loss of saturated reactor core samples are tested, and saturated reactor core samples whose test results meet the preset test requirements are used as target saturated reactor cores. Set the aging test temperature, and place the target saturated reactor core in the preset aging test circuit to carry out the aging test at the aging test temperature; After each test cycle, the real-time electrical parameters and core losses of the target saturated reactor core are detected. The accelerated aging factor is calculated based on the aging test temperature, and the equivalent aging test time of the target saturated reactor core for each test cycle is calculated based on the accelerated aging factor. Based on the calculated equivalent aging test time and all the obtained electrical parameters and core losses, an aging performance test report for the target saturated reactor core is obtained.

2. The method for testing the aging performance of a saturated reactor core according to claim 1, characterized in that, The electrical parameters include winding DC resistance, power frequency inductive reactance, voltage-time-area, power frequency withstand voltage, and partial discharge.

3. The method for testing the aging performance of a saturated reactor core according to claim 1, characterized in that, Setting the aging test temperature includes: The aging test temperature was set to 100°C.

4. The method for testing the aging performance of a saturated reactor core according to claim 1, characterized in that, The calculation of the accelerated aging factor based on the aging test temperature includes: The accelerated aging factor was calculated based on the Arrhenius equation.

5. A method for reflecting the aging performance of a saturated reactor core, characterized in that, include: Obtain the initial electrical parameters and core losses of the target saturated reactor core; Acquire aging test data when the target saturated reactor core is placed in a preset aging test circuit for aging test; the aging test data includes the corresponding aging test temperature and the real-time electrical parameters and core loss of the target saturated reactor core detected after each test cycle. The accelerated aging factor is calculated based on the aging test temperature, and the equivalent aging test time of the target saturated reactor core for each test cycle is calculated based on the accelerated aging factor. Based on the calculated equivalent aging test time and all obtained electrical parameters and core losses, an aging performance test report for the target saturated reactor core is generated.

6. The method for reflecting the aging performance of a saturated reactor core according to claim 5, characterized in that, The method further includes: Based on the calculated equivalent time of the aging test and all the obtained electrical parameters and core losses, the aging characteristic curve of the target saturated reactor core is constructed.

7. The method for reflecting the aging performance of a saturated reactor core according to claim 6, characterized in that, The aging characteristic curve of the target saturated reactor core is constructed as follows: Construct a first aging characteristic curve that characterizes the relationship between electrical parameters and the equivalent time of aging tests; A second aging characteristic curve is constructed to characterize the relationship between core loss and the equivalent time of aging test.

8. A device for reflecting the aging performance of a saturated reactor core, characterized in that, include: The first acquisition module is used to acquire the initial electrical parameters and core loss of the target saturated reactor core. The second acquisition module is used to acquire aging test data obtained when the target saturated reactor core is placed in a preset aging test circuit for aging test; the aging test data includes the corresponding aging test temperature and the real-time electrical parameters and core loss of the target saturated reactor core detected after each test cycle. The calculation module is used to calculate the accelerated aging factor based on the aging test temperature, and to calculate the equivalent aging test time of the target saturated reactor core for each test cycle based on the accelerated aging factor. The generation module is used to generate an aging performance test report for the target saturated reactor core based on the calculated equivalent aging test time, all electrical parameters, and core losses.

9. A device for testing the aging performance of a saturated reactor core, characterized in that, include: A memory for storing instructions; wherein the instructions are used to implement the method for reflecting the aging performance of a saturated reactor core as described in any one of claims 5-7; A processor for executing instructions in the memory.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when executed by a processor, implements the method for reflecting the aging performance of a saturated reactor core as described in any one of claims 5-7.

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